WO2009041032A1 - 蛍光検出方法 - Google Patents
蛍光検出方法 Download PDFInfo
- Publication number
- WO2009041032A1 WO2009041032A1 PCT/JP2008/002642 JP2008002642W WO2009041032A1 WO 2009041032 A1 WO2009041032 A1 WO 2009041032A1 JP 2008002642 W JP2008002642 W JP 2008002642W WO 2009041032 A1 WO2009041032 A1 WO 2009041032A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- fluorescence intensity
- microchip
- living specimen
- supplied
- fluorescence
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/447—Systems using electrophoresis
- G01N27/44704—Details; Accessories
- G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
- G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
- G01N27/44726—Arrangements for investigating the separated zones, e.g. localising zones by optical means using specific dyes, markers or binding molecules
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0346—Capillary cells; Microcells
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Molecular Biology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Electrochemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
【課題】マイクロチップ自体の蛍光強度がバックグラウンドとして作用しても、高精度かつ短時間に蛍光標識された生体試料の蛍光強度を検出する蛍光検出方法を図る。 【解決手段】蛍光標識された生体試料(R)が供給されたマイクロチップ(10)と同等のマイクロチップ(11)自体から発生する蛍光(Lk0)の蛍光強度(Ur0)を励起光(Le)の照射開始から蛍光強度(Ur0)が十分に減衰するまで検出し、蛍光強度(Ur0)の経時変化を記憶する。マイクロチップ(10)に励起光(Le)を照射すると共に、マイクロチップ(10)自体からの蛍光強度(Ur0)が十分に減衰する前に、生体試料(R)を供給し、発生する蛍光強度(Ur)を励起光(Le)の照射開始から生体試料(R)が供給された後まで検出する。生体試料(R)が供給されたマイクロチップ(10)から検出された蛍光強度(Ur)から、記憶された蛍光強度(Ur0)の経時変化の値を減算して、生体試料(R)から発生した蛍光(Lk)の蛍光強度(Uc)を検出する。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08833299.4A EP2194372B1 (en) | 2007-09-28 | 2008-09-24 | Fluorescence detection method |
US12/680,106 US8283640B2 (en) | 2007-09-28 | 2008-09-24 | Fluorescence detection method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-255403 | 2007-09-28 | ||
JP2007255403A JP4993494B2 (ja) | 2007-09-28 | 2007-09-28 | 蛍光検出方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009041032A1 true WO2009041032A1 (ja) | 2009-04-02 |
Family
ID=40510937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/002642 WO2009041032A1 (ja) | 2007-09-28 | 2008-09-24 | 蛍光検出方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8283640B2 (ja) |
EP (1) | EP2194372B1 (ja) |
JP (1) | JP4993494B2 (ja) |
WO (1) | WO2009041032A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103018218A (zh) * | 2011-11-10 | 2013-04-03 | 浙江理工大学 | 一种用于洗涤剂洗涤效果检测和评价的荧光分析方法 |
EP3433017A4 (en) * | 2016-03-25 | 2020-01-01 | Bioceryx Inc. | DEVICES AND METHODS FOR EVALUATING TARGET SEQUENCES |
CN107748148A (zh) * | 2017-09-04 | 2018-03-02 | 江苏大学 | 基于石墨烯氧化物双氨基固定多t序列检测汞离子的方法 |
JP7282307B2 (ja) * | 2019-05-20 | 2023-05-29 | 株式会社島津製作所 | 応力発光データ処理装置、応力発光データ処理方法、応力発光測定装置および応力発光試験システム |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002181708A (ja) | 2000-12-14 | 2002-06-26 | Asahi Techno Glass Corp | マイクロアレイチップの読取方法及びその装置 |
JP2003084002A (ja) | 2001-06-27 | 2003-03-19 | Fuji Photo Film Co Ltd | 蛍光検出におけるバックグラウンドの低減方法 |
JP2006226803A (ja) * | 2005-02-17 | 2006-08-31 | Matsushita Electric Ind Co Ltd | 蛍光測定装置 |
JP2007278984A (ja) * | 2006-04-11 | 2007-10-25 | Hamamatsu Photonics Kk | 光測定装置、光測定方法、及び光測定プログラム |
JP2008122297A (ja) * | 2006-11-14 | 2008-05-29 | Fujitsu Ltd | 蛍光検出装置および蛍光検出方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6485625B1 (en) * | 1995-05-09 | 2002-11-26 | Curagen Corporation | Apparatus and method for the generation, separation, detection, and recognition of biopolymer fragments |
US6333501B1 (en) * | 2000-01-27 | 2001-12-25 | Perkin-Elmer Corporation | Methods, apparatus, and articles of manufacture for performing spectral calibration |
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2007
- 2007-09-28 JP JP2007255403A patent/JP4993494B2/ja active Active
-
2008
- 2008-09-24 WO PCT/JP2008/002642 patent/WO2009041032A1/ja active Application Filing
- 2008-09-24 US US12/680,106 patent/US8283640B2/en active Active
- 2008-09-24 EP EP08833299.4A patent/EP2194372B1/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002181708A (ja) | 2000-12-14 | 2002-06-26 | Asahi Techno Glass Corp | マイクロアレイチップの読取方法及びその装置 |
JP2003084002A (ja) | 2001-06-27 | 2003-03-19 | Fuji Photo Film Co Ltd | 蛍光検出におけるバックグラウンドの低減方法 |
JP2006226803A (ja) * | 2005-02-17 | 2006-08-31 | Matsushita Electric Ind Co Ltd | 蛍光測定装置 |
JP2007278984A (ja) * | 2006-04-11 | 2007-10-25 | Hamamatsu Photonics Kk | 光測定装置、光測定方法、及び光測定プログラム |
JP2008122297A (ja) * | 2006-11-14 | 2008-05-29 | Fujitsu Ltd | 蛍光検出装置および蛍光検出方法 |
Non-Patent Citations (1)
Title |
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See also references of EP2194372A4 * |
Also Published As
Publication number | Publication date |
---|---|
JP2009085756A (ja) | 2009-04-23 |
EP2194372A4 (en) | 2013-01-09 |
JP4993494B2 (ja) | 2012-08-08 |
US8283640B2 (en) | 2012-10-09 |
EP2194372A1 (en) | 2010-06-09 |
US20100258740A1 (en) | 2010-10-14 |
EP2194372B1 (en) | 2013-11-06 |
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