USD426785S - Wafer level burn-in tester - Google Patents
Wafer level burn-in tester Download PDFInfo
- Publication number
- USD426785S USD426785S US29/114,645 US11464599F USD426785S US D426785 S USD426785 S US D426785S US 11464599 F US11464599 F US 11464599F US D426785 S USD426785 S US D426785S
- Authority
- US
- United States
- Prior art keywords
- tester
- wafer level
- level burn
- burn
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a perspective view of the top, front and right side of a wafer level burn-in tester showing our new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a front view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a rear view thereof.
Claims (1)
- The ornamental design for a wafer level burn-in tester, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11-18323 | 1999-07-09 | ||
| JP1832399 | 1999-07-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD426785S true USD426785S (en) | 2000-06-20 |
Family
ID=71730482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/114,645 Expired - Lifetime USD426785S (en) | 1999-07-09 | 1999-11-29 | Wafer level burn-in tester |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD426785S (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD743285S1 (en) * | 2014-02-14 | 2015-11-17 | Checkpoint Systems, Inc. | Deactivator |
| USD751936S1 (en) * | 2014-02-14 | 2016-03-22 | Checkpoint Systems, Inc. | Deactivator |
| USD751935S1 (en) * | 2014-02-14 | 2016-03-22 | Checkpoint Systems, Inc. | Deactivator |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
| USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
| USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
| US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
| US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
-
1999
- 1999-11-29 US US29/114,645 patent/USD426785S/en not_active Expired - Lifetime
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD333144S (en) * | 1990-10-03 | 1993-02-09 | Canon Kabushiki Kaisha | Chamber for semiconductor fabricating machine |
| USD352911S (en) * | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
| USD365584S (en) * | 1993-12-15 | 1995-12-26 | Tokyo Electron Kabushiki Kaisha | Semiconductor manufacturing device |
| US5929651A (en) * | 1995-08-09 | 1999-07-27 | International Business Machines Corporation | Semiconductor wafer test and burn-in |
| US5851143A (en) * | 1996-05-10 | 1998-12-22 | Thermal Industries | Disk drive test chamber |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD743285S1 (en) * | 2014-02-14 | 2015-11-17 | Checkpoint Systems, Inc. | Deactivator |
| USD751936S1 (en) * | 2014-02-14 | 2016-03-22 | Checkpoint Systems, Inc. | Deactivator |
| USD751935S1 (en) * | 2014-02-14 | 2016-03-22 | Checkpoint Systems, Inc. | Deactivator |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
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