USD447967S1 - Measuring apparatus for measuring a particle size distribution - Google Patents
Measuring apparatus for measuring a particle size distribution Download PDFInfo
- Publication number
- USD447967S1 USD447967S1 US29/132,403 US13240300F USD447967S US D447967 S1 USD447967 S1 US D447967S1 US 13240300 F US13240300 F US 13240300F US D447967 S USD447967 S US D447967S
- Authority
- US
- United States
- Prior art keywords
- measuring
- particle size
- size distribution
- measuring apparatus
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front view of a measuring apparatus for measuring a particle size distribution showing our new design;
FIG. 2 is a rear view thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan view thereof.
Claims (1)
- The ornamental design for a measuring apparatus for measuring a particle size distribution, as shown and described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/132,403 USD447967S1 (en) | 2000-11-08 | 2000-11-08 | Measuring apparatus for measuring a particle size distribution |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/132,403 USD447967S1 (en) | 2000-11-08 | 2000-11-08 | Measuring apparatus for measuring a particle size distribution |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD447967S1 true USD447967S1 (en) | 2001-09-18 |
Family
ID=22453890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/132,403 Expired - Lifetime USD447967S1 (en) | 2000-11-08 | 2000-11-08 | Measuring apparatus for measuring a particle size distribution |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD447967S1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD637098S1 (en) * | 2009-10-30 | 2011-05-03 | Hitachi High-Technologies Corporation | Semiconductor testing machine |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6191853B1 (en) | 1998-09-29 | 2001-02-20 | Horiba, Ltd. | Apparatus for measuring particle size distribution and method for analyzing particle size distribution |
-
2000
- 2000-11-08 US US29/132,403 patent/USD447967S1/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6191853B1 (en) | 1998-09-29 | 2001-02-20 | Horiba, Ltd. | Apparatus for measuring particle size distribution and method for analyzing particle size distribution |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD637098S1 (en) * | 2009-10-30 | 2011-05-03 | Hitachi High-Technologies Corporation | Semiconductor testing machine |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
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