TWI693760B - Connecting device and method of manufacturing same - Google Patents
Connecting device and method of manufacturing same Download PDFInfo
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- TWI693760B TWI693760B TW108117869A TW108117869A TWI693760B TW I693760 B TWI693760 B TW I693760B TW 108117869 A TW108117869 A TW 108117869A TW 108117869 A TW108117869 A TW 108117869A TW I693760 B TWI693760 B TW I693760B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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Abstract
Description
本發明係關於一種使用於被檢查體之特性之檢查的連接裝置。 The present invention relates to a connecting device for inspection of characteristics of an object to be inspected.
使用矽光子(Silicon Photonics)技術,將具有傳遞電性號之電氣電路與傳遞光信號之光電路的半導體元件(以下稱「光元件(device)」)形成於矽基板等。為了在晶圓狀態下檢查光元件的特性,光纖等被用來作為連接光元件與檢查裝置的光連接器(optical connector)來使用。 Using silicon photonics (Silicon Photonics) technology, a semiconductor device (hereinafter referred to as a "device") having an electrical circuit that transmits electrical signals and an optical circuit that transmits optical signals is formed on a silicon substrate, etc. In order to check the characteristics of the optical element in the wafer state, optical fibers and the like are used as optical connectors that connect the optical element and the inspection device.
例如,已揭示一種使保持於探針本體之光纖的前端接近以取得檢查對象之光元件之特性的方法(參照專利文獻1)。 For example, a method has been disclosed in which the tip of the optical fiber held in the probe body is approached to obtain the characteristics of the optical element to be inspected (refer to Patent Document 1).
專利文獻1:美國專利申請公開第2006/0008226A1號說明書 Patent Document 1: US Patent Application Publication No. 2006/0008226A1
在光元件的檢查中,係以使用將傳遞電信號的電連接器連接於光元件並且將傳遞光信號的光連接器連接於光元件的連接裝置,來連接光元件與檢查裝置之方式為有效。然而,此種連接裝置的開發並未獲得進展。 In the inspection of optical elements, it is effective to connect the optical element and the inspection device by using a connecting device that connects an electrical connector that transmits electrical signals to the optical element and an optical connector that transmits optical signals to the optical element . However, no progress has been made in the development of such connection devices.
本發明之目的為提供一種可將傳遞電信號的電連接器與傳遞光信號的光連接器雙方連接於光元件的連接裝置及其製造方法。 An object of the present invention is to provide a connection device and a manufacturing method thereof that can connect both an electrical connector transmitting electrical signals and an optical connector transmitting optical signals to optical elements.
依據本發明的一態樣,係提供一種連接裝置,該連接裝置係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查,該連接裝置係具備:光連接器,係與光信號端子光學性連接;及電連接器,係與電信號端子電性連接。 According to one aspect of the present invention, there is provided a connection device for inspection of a semiconductor device having an electrical signal terminal transmitting an electrical signal and an optical signal terminal transmitting an optical signal. The connection device includes: optical connection The connector is optically connected to the optical signal terminal; and the electrical connector is electrically connected to the electrical signal terminal.
依據本發明之另一態樣,係提供一種連接裝置的製造方法,該連接裝置係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查上,該連接裝置的製造方法係包含下列步驟:在使與光信號端子光學性連接之光連接器的光學性連接端部露出於塊體(block)之主面的狀態下,將光連接器固定於塊體的步驟;以塊體的主面成為露出之狀態之方式將塊體安裝於電路基板的步驟;及參照光學性連接端部的位置資訊,以電連接器的電性連接端部配置於預定的位置之方式,將電連接器設置於電路基板的步驟。 According to another aspect of the present invention, there is provided a method of manufacturing a connection device for inspection of a semiconductor device having an electrical signal terminal for transmitting electrical signals and an optical signal terminal for transmitting optical signals. The manufacturing method includes the following steps: fixing the optical connector to the block in a state where the optical connection end of the optical connector optically connected to the optical signal terminal is exposed on the main surface of the block Steps of mounting the block on the circuit board in such a way that the main surface of the block is exposed; and referring to the position information of the optical connection end, the electrical connection end of the electrical connector is arranged at a predetermined position The step of providing the electrical connector on the circuit board.
依據本發明,可提供一種可將傳遞電信號的電連接器與傳遞光信號的光連接器雙方連接於光元件的連接裝置及其製造方法。 According to the present invention, it is possible to provide a connection device capable of connecting both an electrical connector transmitting an electrical signal and an optical connector transmitting an optical signal to an optical element, and a manufacturing method thereof.
10‧‧‧塊體 10‧‧‧ block
11‧‧‧空洞 11‧‧‧Empty
12‧‧‧嵌入孔 12‧‧‧Embedded hole
15‧‧‧毛細管 15‧‧‧Capillary
16‧‧‧固定用柱材 16‧‧‧Fixed column
20‧‧‧電路基板 20‧‧‧ circuit board
21‧‧‧接合墊 21‧‧‧joint pad
22‧‧‧對準標記 22‧‧‧Alignment mark
23‧‧‧連接端子 23‧‧‧Connecting terminal
30‧‧‧補強件 30‧‧‧Reinforcement
40‧‧‧位置調整機構 40‧‧‧Position adjustment mechanism
41‧‧‧拉簧 41‧‧‧tension spring
42‧‧‧按壓彈簧 42‧‧‧Press spring
51‧‧‧第一螺栓 51‧‧‧First bolt
52‧‧‧第二螺栓 52‧‧‧Second bolt
60‧‧‧導板 60‧‧‧Guide plate
70‧‧‧導銷 70‧‧‧Guide pin
100‧‧‧光連接器 100‧‧‧Optical connector
101‧‧‧光學性連接端部 101‧‧‧Optical connection end
150‧‧‧貫通孔 150‧‧‧Through hole
151‧‧‧溝 151‧‧‧Ditch
152‧‧‧基準孔 152‧‧‧Datum hole
200‧‧‧電連接器 200‧‧‧Electrical connector
201‧‧‧電性連接端部 201‧‧‧Electrical connection end
300‧‧‧開口部 300‧‧‧Opening
A‧‧‧區域 A‧‧‧Region
F1‧‧‧拉動力 F1‧‧‧pull power
F2‧‧‧按壓力 F2‧‧‧Pressing force
NA‧‧‧開口數 NA‧‧‧Number of openings
第1圖係顯示本發明之實施型態之連接裝置之構成的示意圖。 FIG. 1 is a schematic diagram showing the structure of a connection device according to an embodiment of the present invention.
第2圖係顯示本發明之實施型態之連接裝置之位置調整機構之例的示意立體圖。 FIG. 2 is a schematic perspective view showing an example of the position adjustment mechanism of the connection device of the embodiment of the present invention.
第3圖係用以說明本發明之實施型態之連接裝置之製造方法的示意圖(其一)。 FIG. 3 is a schematic diagram (No. 1) for explaining the manufacturing method of the connection device of the embodiment of the present invention.
第4圖係用以說明本發明之實施型態之連接裝置之製造方法的示意圖(其二)。 FIG. 4 is a schematic diagram (No. 2) for explaining the manufacturing method of the connection device of the embodiment of the present invention.
第5圖係顯示本發明之實施型態之連接裝置之光連接器與電連接器之配置之例的示意俯視圖。 FIG. 5 is a schematic plan view showing an example of the arrangement of optical connectors and electrical connectors of a connection device according to an embodiment of the present invention.
第6圖係顯示本發明之實施型態之連接裝置之補強件(stiffener)之構造之例的示意立體圖。 FIG. 6 is a schematic perspective view showing an example of the structure of a stiffener of a connecting device according to an embodiment of the present invention.
第7圖係顯示本發明之實施型態之連接裝置之構成的立體圖。 FIG. 7 is a perspective view showing the configuration of the connection device of the embodiment of the present invention.
第8圖係顯示本發明之實施型態之連接裝置之塊體與毛細管(capillary)固定之構成例的示意立體圖。 FIG. 8 is a schematic perspective view showing a configuration example of a block and a capillary of a connecting device according to an embodiment of the present invention.
第9圖係顯示第8圖之區域A的俯視圖。 FIG. 9 is a plan view showing the area A of FIG. 8.
第10圖係顯示第8圖所示之構成例之固定用柱材之形狀的立體圖。 Fig. 10 is a perspective view showing the shape of the fixing column material in the configuration example shown in Fig. 8.
第11圖係顯示第8圖所示之構成例之塊體之形狀的俯視圖。 FIG. 11 is a plan view showing the shape of the block of the configuration example shown in FIG. 8.
第12圖係為顯示第8圖所示之構成例之毛細管之形狀之與厚度方向垂直的剖面圖。 FIG. 12 is a cross-sectional view showing the shape of the capillary shown in FIG. 8 perpendicular to the thickness direction.
接著參照圖式來說明本發明的實施型態。在以下之圖式的記載中,對於相同或類似的部分係賦予了相同或類似的符號。然而,圖式僅係示意性者,應注意各部之厚度的比率等與實際情形有所不同。此外,在圖式相互間當然亦包含有彼此之尺寸的關係或比率不同的部分。以下所示的實施型態,係例示用以將本發明之技術思想予以具體化的裝置或方法,本發明之實施型態,並未將構成零件的材質、形狀、構造、配置等限定於下述各者。 Next, an embodiment of the present invention will be described with reference to the drawings. In the description of the following drawings, the same or similar symbols are given to the same or similar parts. However, the drawings are only schematics, and it should be noted that the thickness ratio of each part is different from the actual situation. In addition, of course, the drawings also include parts having different dimensional relationships or ratios. The embodiments shown below are examples of devices or methods for embodying the technical idea of the present invention. The embodiments of the present invention do not limit the materials, shapes, structures, arrangements, etc. of the constituent parts to the following Describe each.
第1圖所示之本發明之實施型態之連接裝置,係使用在具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之光元件的檢查上。以光元件而言,雖未特別限定,但可假設矽光子(Silicon Photonics)晶片、VCSEL(Vertical-Cavity Surface-Emitting Laser,垂直腔面發射雷射)等。第1圖所示之連接裝置係具備:光連接器100,係與光元件之光信號端子光學性連接;及電連接器200,係與光元件之電信號端子電性連接。光連接器100與電連接器200係以使其接近1個光元件之光信號端子與電信號端子之距離所對應之位置之方式配置。當光連接器100與光信號端子光學性連接時,在光信號端子與光連接器100之間傳遞光信號。通常,光信號端子與光連接器100,係在彼此接近之非接觸的狀態下光學性連接。光連接器100與光信號端子連接的時間點,及電連接器200與電信號 端子連接的時間點,係可同時亦可有產生時間差。總之,只要光連接器100與電連接器200雙方可同時與光元件連接即可。 The connection device according to the embodiment of the present invention shown in FIG. 1 is used for inspection of optical elements having electrical signal terminals for transmitting electrical signals and optical signal terminals for transmitting optical signals. In terms of optical devices, although not particularly limited, silicon photonics (Silicon Photonics) chips, VCSEL (Vertical-Cavity Surface-Emitting Laser, vertical cavity surface emitting laser), etc. can be assumed. The connection device shown in FIG. 1 includes: an
連接裝置係作為將檢查裝置與檢查對象之光元件連接之探針卡而發揮作用。檢查對象的光元件係省略了圖示,但係在將形成有光信號端子與電信號端子(以下統稱為「信號端子」)的表面,以於第1圖中朝向下方的狀態與連接裝置相對向地配置。在測量光元件時,將光連接器100的光學性連接端部101與光元件的光信號端子光學性連接,而電連接器200的電性連接端部201與光元件的電信號端子電性連接。藉此,例如,從電連接器200的電性連接端部201輸入電信號於光元件,並且將從光元件所輸出的光信號輸入於光連接器100的光學性連接端部101,且藉由未圖示之測試器(tester)等的測量裝置而偵測光信號。 The connection device functions as a probe card that connects the inspection device and the optical element to be inspected. The optical element to be inspected is not shown, but it is on the surface on which the optical signal terminal and the electrical signal terminal (hereinafter collectively referred to as "signal terminal") are formed, facing the connection device in the downward direction in FIG. 1 To the ground configuration. When measuring an optical element, the
在光連接器100中,較佳為使用光纖等。例如,從光元件的光信號端子,將光信號射入至配置於光信號端子之附近之光纖的端面。然而,不限定於光纖,亦可將具有光波導的光學零件使用於光連接器100。光纖等光波導係均以具有與光元件同等的折射率之方式形成。例如,為了使之與矽光子元件對應,探針卡(probe card)側的光連接器亦以配合矽之折射率的材料來形成。 In the
電連接器200較佳為使用由導電性材料所構成的探針等。例如,將懸臂(cantilever)型的探針使用於電連接器200。然而,可使用於電連接器200之探針的型態,不限定於懸臂式,可使用任意型態的探針。 The
如第1圖所示,連接裝置係具備:塊體10,係在使光連接器100的光學性連接端部101露出於主面(第一主面)的狀態下固定光連接 器100;及電路基板20,係安裝有塊體10。在電路基板20中,形成有與電連接器200電性連接的電氣電路。電路基板20較佳為使用印刷基板(PCB基板)等。電連接器200係與設於電路基板20的接合墊21電性連接,且設置於電路基板20。 As shown in FIG. 1, the connection device includes: a
接合墊21係經由形成於電路基板20之未圖示的電氣電路,而與配置於電路基板20的連接端子23連接。連接端子23係配置在與電路基板20之供電連接器200設置之主面相反側的主面上。連接端子23係與檢查裝置電性連接。 The
此外,以光波導與光學性連接端部101進行光耦合之光連接器100的另一方的端部,係與檢查裝置連接。光連接器100係例如經由光連接器(connector)等的零件而連接於檢查裝置。此時,可配合檢查裝置的規格,將光信號轉換為電信號,亦可將光信號直接輸入於檢查裝置。 In addition, the other end of the
光連接器100與電連接器200係以預定的位置精確度設置於連接裝置,以於檢查時正確地連接於檢查對象之光元件的信號端子。亦即,光連接器100的光學性連接端部101與電連接器200的電性連接端部201之相對的位置關係位於預定的範圍,在將連接裝置與光元件進行對位時,光連接器100與電連接器200與光元件的信號端子正確地連接。在此,所謂「正確地連接」係指以能獲得預定的測量精確度之方式,光連接器100及電連接器200與檢查對象之光元件的信號端子連接。 The
關於電連接器200與光連接器100的位置,在與光元件的信號端子連接而獲得預定之測量精確度的位置(以下稱為「最佳位置」)上具有容許範圍。最佳位置的容許範圍係指若電連接器200或光連接器100 位於該範圍,就能以所期望的精確度或強度取得信號的範圍。此容許範圍係依據檢查所要求的精確度或連接器之性能等而適當設定。例如,當使用光纖於光連接器100時,光連接器100之位置的容許範圍依據光纖的開口數NA等而設定。 Regarding the positions of the
光連接器100之最佳位置的容許範圍,較電連接器200之最佳位置的容許範圍更窄。在第1圖所示之連接裝置的製造中,如後所述,係在進行了容許範圍較小之光連接器100的對位之後,依據該光連接器100的位置,而進行電連接器200的對位。 The allowable range of the optimal position of the
在第1圖所示之連接裝置中,係將在使光連接器100貫通的狀態下固定該光連接器100的毛細管15嵌入於塊體10,藉此將光連接器100固定於塊體10。換言之,以所需的位置精確度形成貫通孔於毛細管15,且將插入於此貫通孔的光連接器100予以固定。藉此,即能以預定的位置精確度將光連接器100設置於塊體10。 In the connection device shown in FIG. 1, the capillary 15 that fixes the
形成於毛細管15之貫通孔的數量係任意。例如,當一個光元件所具有的光信號端子為4個時,依每一光元件準備形成有4個貫通孔的毛細管15。或者,亦可當1個光元件所具有的光信號端子為一個時,準備依4個光元件形成有4個貫通孔的毛細管15。 The number of through holes formed in the capillary 15 is arbitrary. For example, when there are four optical signal terminals included in one optical element, a capillary 15 formed with four through holes is prepared for each optical element. Alternatively, when one optical element has one optical signal terminal, a capillary 15 having four through holes formed on four optical elements may be prepared.
另外,若能以所需的位置精確度將光連接器100配置於塊體10,則亦可不使用毛細管15。例如,將塊體10分割為2個部分,且於所分割之部分之對接面分別形成用以配置光連接器100的V字形溝。V字形溝係在對接面形成有開口部,且以在將分割後之部分予以重疊時開口部會一致之方式形成。在光連接器100配置於V字形溝的狀態下將2個部分重疊,藉 此可將光連接器100固定於塊體10的內部。V字形溝的加工較形成貫通孔更容易,而且可提高尺寸精確度。另外,亦可僅在所分割之塊體10之一方的部分形成V字形溝。 In addition, if the
在電路基板20中,係固定有剛性較電路基板20更高的補強件30。補強件30係確保連接裝置之機械性強度以使電路基板20不會撓曲,並且被作為用以將連接裝置之構成零件的各者予以固定的支撐體來使用。 The
此外,在塊體10的第一主面,配置有供光連接器100貫通的導板(guide plate)60。在設於導板60的貫通孔,插入有固定於補強件30的導銷(guide pin)70。藉此,劃定導板60的位置。在導板60中係設有開口區域,俾可目視形成於電路基板20的對準標記(alignment mark)22。藉由將導板60配置於塊體10的第一主面,即可易於確認在將塊體10設置於電路基板20時所使用之對準標記22的位置。 In addition, a
在第1圖所示之連接裝置中,塊體10係以可沿著與第一主面垂直之方向(以下稱「厚度方向」)移動之方式安裝於電路基板20。換言之,塊體10未固定於電路基板20。再者,在導板60與電路基板20之間,係設有間隙。因此,塊體10係可相對於補強件30及被固定於補強件30的電路基板20,朝厚度方向移動。此外,藉由在導板60與電路基板20之間設置間隙,即可當電路基板20的表面不平坦時,抑制其會對於導板60造成影響。 In the connection device shown in FIG. 1, the
第1圖所示之連接裝置,係具備調整塊體10相對於電路基板20之相對位置的位置調整機構40。此位置調整機構40係構成為包括:板 狀的拉簧41,係朝向厚度方向的一方拉動塊體10;及板狀的按壓彈簧42,係朝與拉簧41之拉動方向的相反方向按壓塊體10。再者,藉由源自拉簧41的拉動力F1與按壓彈簧42的按壓力F2的平衡,規定塊體10之厚度方向的位置。為了使塊體10在預定的位置穩定,預先設定了拉簧41與按壓彈簧42的彈力。 The connection device shown in FIG. 1 includes a
如第1圖所示,拉簧41的中央部被固定於相對向於第一主面之塊體10的第二主面,拉簧41的兩端被按壓於補強件30而彈性地接觸。更具體而言,如第2圖所示,第一螺栓(bolt)51貫通拉簧41的中央部而固定於塊體10的第二主面。 As shown in FIG. 1, the central portion of the
另一方面,如第2圖所示,按壓彈簧42之一方的端部藉由第二螺栓52而固定於補強件30,另一方之端部被按壓於塊體10的第二主面而彈性地接觸。拉簧41及按壓彈簧42係經由補強件30而固定於電路基板20。 On the other hand, as shown in FIG. 2, one end of the
另外,例如使第二螺栓52螺合於補強件30,且調整螺釘的緊固方式,藉此亦可微調整塊體10之厚度方向的位置。如此,拉簧41與按壓彈簧42的組合,係作為使塊體10相對於補強件30及電路基板20相對地移動的位置調整機構而發揮作用。 In addition, for example, by screwing the
以下說明第1圖所示之連接裝置的製造方法。以下例示性說明將光纖使用於光連接器100,且將懸臂型探針使用於電連接器200的情形。 The method of manufacturing the connection device shown in FIG. 1 will be described below. The following exemplarily describes a case where an optical fiber is used for the
首先,準備已針對端部進行過終端處理的光纖作為光連接器100。所謂「終端處理」係指作為光學性連接端部101之端部的透鏡加工或研磨、包覆層剝除加工或將光連接器裝設於另一方之端部的處理等。 First, as the
再者,如第3圖所示,以光學性連接端部101露出於塊體10之第一主面之方式,將光連接器100設置於塊體10。例如,將貫通光連接器100的毛細管15固定於塊體10。此時,以光學性連接端部101以預定的高度從塊體10的第一主面露出之方式調整光連接器100的突出量,確認光連接器100已被設置於預定的位置,而固定毛細管15。 Furthermore, as shown in FIG. 3, the
接著,將導板60安裝於塊體10的第一主面。再者,將塊體10安裝於電路基板20之預定的位置。例如,在形成於電路基板20之預定之位置的空洞,插入塊體10。此時,以形成於電路基板20的對準標記22作為記號進行對位,同時將塊體10安裝於電路基板20。將設有使對準標記22露出之開口區域的導板60配置於塊體10,藉此即可易於進行塊體10與電路基板20的對位。 Next, the
再者,將補強件30固定於電路基板20。此時,如第4圖所示,藉由固定於補強件30的導銷70而設定導板60的位置。 Furthermore, the
接著,如第2圖所示,將拉簧41與按壓彈簧42安裝於塊體10與補強件30。再者,固定拉簧41與按壓彈簧42的位置。此時,不僅進行厚度方向之位置的調整,亦進行與厚度方向垂直之平行之方向的調整。位置之調整的基準係電路基板20的主面。 Next, as shown in FIG. 2, the
接著,將電連接器200設置於電路基板20。此時,如以下之方式參照光連接器100的位置資訊,進行電連接器200的定位。 Next, the
首先,解析光連接器100的位置資訊,針對光學性連接端部101的位置,檢測出從預先設定的設定位置偏離的量(以下簡稱「偏離量」)。再者,參照光學性連接端部101之位置的偏離量,算出電連接器200之電性連接端部201的最佳位置。 First, the position information of the
例如,比較關於光連接器100之光學性連接端部101之預定的設定座標,與實際上設置於塊體10之光連接器100之光學性連接端部101的座標,而檢測出光學性連接端部101之位置的偏離量。再者,以關於電性連接端部201之從預定之設定座標之位置偏離的量,會與光學性連接端部101之位置之偏離量相同之方式,決定電性連接端部201之位置的座標。 For example, the predetermined set coordinates of the
此時,亦能以統計方式處理偏離量,而決定電連接器200之電性連接端部201的位置。例如,作成偏離量之參差不齊的柱狀圖(histogram),算出偏離量之平均值或參差不齊(偏差)等。再者,以相對於光連接器100之光學性連接端部101成為預定之相對位置之方式,算出電連接器200之電性連接端部201的位置。 At this time, the deviation amount can also be statistically processed to determine the position of the electrical connection end 201 of the
之後,以電性連接端部201配置於所算出之位置之方式,將電連接器200接合於電路基板20的接合墊21。藉由以上方式,完成第1圖所示的連接裝置。 After that, the
第5圖係顯示光連接器100之光學性連接端部101與電連接器200之電性連接端部201的位置之例。在第5圖所示之例中,係以與4個光連接器100之光學性連接端部101的各者成對之方式,配置有4個電連接 器200的電性連接端部201。藉此,即可針對例如以一個電信號端子與一個光信號端子成對具有之光元件,連續地或同時檢查4個光元件。 FIG. 5 shows an example of the positions of the
如此,即可對應形成有複數個光元件之晶圓的檢查,同時針對二個以上的光元件提供具有連接於信號端子的光連接器100與電連接器200的連接裝置。或者,可使用具有四個光連接器100與四個電連接器200來檢查具有四個光信號端子與四個電信號端子的光元件。藉此,即可總括性地擷取複數個光元件的光信號進行測量,因此可提升檢查的效率,且可縮短檢查時間。 In this way, corresponding to the inspection of the wafer on which a plurality of optical elements are formed, a connection device having the
如上所述參照光連接器100的位置資訊而將電連接器200設置於電路基板20,藉此即可將光學性連接端部101與電性連接端部201之相對的位置關係控制在所期望之位置精確度的範圍。藉此,即可將光連接器100與電連接器200同時以高精確度連接於光元件的信號端子。結果,即可進行光元件之正確的測量。 As described above, the
另外,接合墊21與對準標記22,較佳為在形成電路基板20時以相同的製程步驟同時形成。藉此,即可依據製程步驟之製造的精確度而提高接合墊21與對準標記22之相對之位置的精確度。結果,在使用對準標記22進行對位時,即可針對接合墊21亦高精確度地進行對位。 In addition, the
為了獲得連接裝置的機械性強度,補強件30係以具有一定程度之厚度之方式形成。另一方面,當增厚塊體10時,將難以配置光連接器100。因此,例如第6圖所示,在補強件30形成要配置塊體10的凹部。在第6圖中,係顯示在形成於補強件30的一個凹部的內部形成有分別配置塊體10的四個開口部300之例。第7圖係顯示將分別配置有導板60的四個 塊體10,配置於固定於補強件30之電路基板20之例。在第7圖中,係省略了光連接器100或電連接器200,配置於電路基板20之上面之連接端子23等零件的圖示。 In order to obtain the mechanical strength of the connection device, the reinforcing
補強件30之各者之凹部的尺寸或配置於其內部之塊體10的個數,係可依據補強件30所要求之機械性強度或塊體10的尺寸而任意設定。藉由將複數個塊體10固定於補強件30,即可同時檢查複數個光元件,或檢查大面積的光元件。 The size of the concave portion of each of the reinforcing
此外,毛細管15係例如第8圖至第9圖所示,藉由插入於塊體10與毛細管15之間的固定用柱材16而被壓抵於塊體10而固定。第9圖係第8圖之區域A的俯視圖。如第10圖所示,固定用柱材16係圓柱狀,將要嵌入固定用柱材16的嵌入孔形成於塊體10。嵌入孔係與供毛細管15嵌入的空洞平行地朝塊體10的厚度方向延伸。亦即,如第11圖所示,將供毛細管15嵌入之空洞11的周圍,於塊體10形成與空洞11平行延伸的嵌入孔12。嵌入孔12係沿著空洞11的長度方向連續地形成,而嵌入於空洞11的毛細管15會與嵌入於嵌入孔12之固定用柱材16的側面接觸。 In addition, the capillary 15 is, for example, as shown in FIGS. 8 to 9, and is fixed by being pressed against the
第12圖係顯示與毛細管15之厚度方向垂直的剖面圖。在毛細管15中,係形成供光學性連接端部101貫通的貫通孔150,並且在側面朝厚度方向形成有與固定用柱材16嵌合的溝151。在將毛細管15嵌入於空洞11之後,將固定用柱材16嵌入於嵌入孔12,藉此使毛細管15固定於塊體10。在上述中,係顯示藉由三個固定用柱材16而將毛細管15固定於塊體10之例。 FIG. 12 is a cross-sectional view perpendicular to the thickness direction of the capillary 15. In the
毛細管15與塊體10的對位,係例如以下列方式進行。在預先設計成使塊體10的外形與形成於毛細管15的基準孔152控制於預定精確度的輔助具上設置毛細管15與塊體10。此時,在安裝於輔助具的基準銷上插入基準孔152而設置毛細管15。之後,以光連接器100的位置與塊體10的外形落在設計上之容許範圍之方式,使毛細管15旋轉進行調整。當完成調整塊體10的外形與光連接器100的位置,就插入固定用柱材16而固定毛細管15。之後,從輔助具拆除固定有毛細管15的塊體10。 The alignment of the capillary 15 and the
(其他實施型態) (Other implementations)
如上所述,本發明雖依據實施型態記載,但不應理解為構成該揭示之一部分的論述及圖式係限定本發明者。本發明所屬技術領域中具有通常知識者應可明瞭從該揭示可進行各種替代實施型態、實施例及運用技術。亦即,本發明當然亦包含在此未記載之各種實施型態等。 As described above, although the present invention is described based on the implementation type, it should not be construed that the discussion and drawings constituting a part of this disclosure limit the present inventor. Those with ordinary knowledge in the technical field to which the present invention belongs should understand that various alternative implementation types, embodiments, and application techniques can be made from the disclosure. That is, the present invention naturally includes various embodiments and the like not described herein.
10‧‧‧塊體 10‧‧‧ block
15‧‧‧毛細管 15‧‧‧Capillary
20‧‧‧電路基板 20‧‧‧ circuit board
21‧‧‧接合墊 21‧‧‧joint pad
22‧‧‧對準標記 22‧‧‧Alignment mark
23‧‧‧連接端子 23‧‧‧Connecting terminal
30‧‧‧補強件 30‧‧‧Reinforcement
40‧‧‧位置調整機構 40‧‧‧Position adjustment mechanism
41‧‧‧拉簧 41‧‧‧tension spring
42‧‧‧按壓彈簧 42‧‧‧Press spring
51‧‧‧第一螺栓 51‧‧‧First bolt
60‧‧‧導板 60‧‧‧Guide plate
70‧‧‧導銷 70‧‧‧Guide pin
100‧‧‧光連接器 100‧‧‧Optical connector
101‧‧‧光學性連接端部 101‧‧‧Optical connection end
200‧‧‧電連接器 200‧‧‧Electrical connector
201‧‧‧電性連接端部 201‧‧‧Electrical connection end
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TW202005209A (en) | 2020-01-16 |
JP2019211265A (en) | 2019-12-12 |
JP2023033607A (en) | 2023-03-10 |
JP7441478B2 (en) | 2024-03-01 |
WO2019230410A1 (en) | 2019-12-05 |
JP7261404B2 (en) | 2023-04-20 |
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