13074氣。c 九、發明說明： 【發明所屬之技術領域】 ^本發明係關於一種用於檢查背光單元的裝置，且更特 定D之，係關於—種自動偵測用於一影像顯示裝置之背光 單元之缺陷的檢查裝置。 【先前技術】 ，者光單元（BLU)是位於液晶面板之背面上且用於投 射光之設備。藉由堆疊-反射片、-導光板（light guide H、一擴散片（diffusing sheet)、一稜鏡片（prism she，）、-保護片（pr〇tective sheet)及其類似物來製造背 光單元。自光源細至背光單元之仏躲導歧之側面 t或入射於反射片與擴散片之間。發光二極體（LED)或 =極螢紐（CCFL)可闕統。#具有上述結構之背 光早二之堆疊板或片中存在缺陷時，會破壞投射至液晶面 反之光的均勻性，藉此導致影像品質劣化。 一圖1A之圖說明用於手動檢查背光單元之習知裝置 且圖1B之流程®說明藉由使用習知裝置手動檢查背 光早元的檢查背光單元過程。 參看圖1A與1B ’當經由輸送機n〇將背光單元13〇 收〜至’、中疋位控制為的工作場所（S100)日夺，控制器 j 連接至電源供應裝置鄉⑽)且點亮 =早兀130 (S120)。此處，電源供應裝置m包含一電 反相器。接著’控制器執行—外觀檢查（si3〇)。 导元成外觀檢查時，控制器關媳f光單元l3Q(si4〇) 13〇7侧· 自電源供應裝置120分離背光單元( Si5〇)。 圖2A之圖說明用於自動檢查背光單元之習知裝置， 圖2B之流程圖說明藉由使用習知裝置自動檢查背光單元 的檢查背光單元過程，且圖2C之示意圖說明用於自動檢 查背光單元之習知裝置。 —參看圖2A至2C，當經由輸送機21〇將背光單元23〇_2 輸送至其中定位一控制器的工作場所（S2〇〇)時，控制器 將背光單元230-2連接至輸送機21〇中所提供之電源供應 裝置220且點亮背光單元23〇_2 (S21〇)。經由輪送機⑽ 將被點亮的背光單元23〇_2輸送至相機謂之影像拍攝區 域（imagepickup area) (S22〇)。相機24〇拍攝進入影像拍 攝區域内之被點亮背光單元23G_2之相片且獲得其一影像 像處理系統25G處理相機24G所拍攝之ΐ像 二之缺陷(S240)。當完成缺陷偵測過程時， 且自電源供應裝置22°分離背 偵測缺陷之自動化在用於檢查背光單元之習知震 1而’將背光單元自動連接至電源供應裝置I 私極八_。麵地，在檢錢 光單元之前將昔η &〜 〜料、應衣置分離背 由㈣-it 連接至電源供應裝置之工作僅可藉 “ j手動執行。另外，用於檢查背光單元 】 二 ::點亮背光單元的情況下移動背光單元之特^ 單元ΐ需之光單元的情況下在輸送機上輸送背光 斤而之电源供應裝置具有結構複雜及成本高的問題。 ⑧ 7 13〇7 爆 $外’，電源供應裝置具有應整體替換現有檢查線 完成了 使得難以自動化檢查f光單元之裝置且即使 動化’亦會減少自動化的優點。 起外:檢=題:點5背光單元之後’背光單元之不會引 單元之問題。、J；度^變化引起自動檢查被點亮的背光 全亮产，早元之後約20秒時背光單元具有 同於此，調適亮度變化時人眼可偵測到缺陷。不 或最小穩定亮度時獲得有效影像。相應地，二:：， 元中’在拍攝背光單元之= 後’ f知裝置應等待約1G至 者減少了自動化之優點。 v稭此顯 其他方面’當改變背光單元之種 地改變反相器之容量或連搂 —Μ 了相應 檢查目標之背光單元對:為 =應=:=作包含機械方案之系統的實體結 在迄今為止已知的自動檢查背光單 ==相機檢查而無需解決自動化中二= =背光單元的情況下仍存在應等待預定時 間之問^ ’因此未獲取足夠的自動化優點。 ^背光單元被點亮的情況下制顧之上述自動檢查 二^出於對成本的考慮使得自動化之優點相當少。因 4要祕在未點亮背光單元的情況下檢查背光單元之 130 觸 f.doc 裝置。然而，歸因於物件之結構差異，藉由使用反射照明 ' 檢查一檢查目標而無需點亮該檢查目標之裝置（諸如液晶 、 面板檢查裝置）不能用於檢查背光單元。 圖3之圖5兒明在一反射照明糸統（re£[ectiVe lighting system)中之習知液晶面板檢查裝置。 參看圖3，使用反射照明系統之習知液晶面板檢查裝 置300包含光源320、相機330以及影像處理設備340。光 源320位於檢查目標310之正面上方且用於將光輻射至檢 鲁 查目標310。相機330俘獲檢查目標310所反射之光並拍 攝其影像。影像處理設備340處理相機330所拍攝之影像 並债測檢查目標310之缺陷。 使用反射照明系統之上述習知液晶面板檢查裝置300 僅可偵測檢查目標310表面上之外部缺陷且不能偵測内部 缺陷。另外，由於發射自光源320之光自檢查目標310反 射且入射至相機330上的光徑中存在之灰塵是濃厚的且經 常在相機330所拍攝之影像中是突出的，因此難以準確偵 φ 測缺陷。此外，在諸如液晶面板之檢查目標具有透射性質 之狀況下，可使用一其中有一光源位於檢查目標之背面上 的透射照明系統，但由於背光單元並非為具有透射性質之 • 檢查目標，因此後方透射照明系統（rear transmissive lighting system )不能用於背光單元。 ' 【發明内容】 設計本發明以解決上述問題。本發明之一目的為提供 檢查背光單元之裝置，其中可檢查該背光單元而無需經由 13074 孤 ^ 一反相器將該背光單元連接至一電源。 - 根據本發明之一態樣，提供一檢查背光單元之裝置， 該裝置包含：一安裝單元，其上安裝一背光單元；一照明 單元，其輻射均勻光，該均句光具有進入該背光單元且經 由該背光單元内之一光徑穿過該背光單元之一薄膜而至該 背光單元的強度，且該照明單元允許該背光單元具有對應 於點亮狀態之一狀態；一影像拍攝單元，其拍攝該背光單 元之表面上的一檢查區域之照片，其中該檢查區域具有對 • 應於由輻射自照明單元之光所造成的點亮狀態之狀態，且 該影像拍攝單元獲得一檢查目標影像；以及一影像處理單 元，其基於輸入自該影像拍攝单元之檢查目標影像彳貞測該 背光單元之一缺陷。 【實施方式】 下文中，將參看所附圖示詳細描述本發明之例示性實 施例。 圖4之圖說明根據本發明之例示性實施例的檢查背光 φ 單元之裝置。 參看圖4，根據本發明的檢查背光單元之裝置400包 含安裝單元410、照明單元420、影像拍攝單元430，以及 . 影像處理單元440。 在安裝單元410上安裝背光單元450。應視背光單元 ' 450之尺寸而配置的背光單元450之位置標記於安裝單元 410上，或突出安裝單元410之一部分以使得準確定位背 光單元450。 ⑧ 10 I3074^ifdoc 照明單元420發射均勻光，該均勻光具有進入背光單 - 元450且經由背光單元450内之光徑穿過背光單元450之 薄膜的強度。相應地，照明單元420包含至少一光源。當 光具有更優良的直線傳播性質時，當光源與背光單元450 之表面間的距離更小時，以及當自光源至背光單元450之 光輻射線路更接近垂直線時，光傳輸效率得到進一步地增 強。藉由使用光纖或高功率LED可獲得具有優良的直線傳 播性質之光。或者，藉由將一柱面透鏡或一球面反射片選 • 擇性地定位於光徑中，可獲得具有優良的直線傳播性質之 光。藉由將外部發射自照明單元420之具有優良的直線傳 播性質之光輻射至背光單元450之頂面，可允許背光單元 450具有類似於點亮狀態之狀態。將照明單元420配置於 影像拍攝單元430周圍且向背光單元450輻射均勻光。此 時，不會形成使發射自照明單元420之光直接或經由背光 單元450之反射入射於影像拍攝單元430上的該種光徑。 影像拍攝單元430偵測發射自照明單元420、進入背 ^ 光單元450、經由背光單元450内之一光徑穿過構成背光 單元450之多數個薄膜且接著發射至背光單元450以外的 光，藉此獲得背光單元450之一影像。影像拍攝單元430 . 包含一相機，其具有將所偵測之光轉換為電訊號之光電轉 換元件（photoelectric transformation element)。 • 影像處理單元440基於輸入自影像拍攝單元430之影 像偵測背光單元450之缺陷。影像處理單元440計算輸入 影像之平均亮度值。當影像中暗區之亮度值比平均亮度值 I3〇7483^ifdoc 低一預定參考值時’影像處理單元440判定背光單元45〇 之相關區域中存在缺陷或粒子。由於熟習此項技術者可理 解影像拍攝單元440之組態及操作，因此省略其詳細描述。13074 gas. c IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a device for inspecting a backlight unit, and more particularly to a method for automatically detecting a backlight unit for an image display device Defect inspection device. [Prior Art] A light unit (BLU) is a device that is located on the back surface of a liquid crystal panel and that is used to project light. The backlight unit is fabricated by a stack-reflecting sheet, a light guide H, a diffusing sheet, a prism she, a pr〇tective sheet, and the like. The light source is thin to the side of the backlight unit, or is incident between the reflection sheet and the diffusion sheet. The light-emitting diode (LED) or the IGBT (CCFL) can be used. When there is a defect in the stacking plate or sheet in the second day, the uniformity of the light projected onto the liquid crystal surface and vice versa is destroyed, thereby causing deterioration of image quality. Figure 1A illustrates a conventional device for manually inspecting the backlight unit and Figure 1B Process ® illustrates the process of checking the backlight unit by manually checking the backlight element by using a conventional device. Referring to FIGS. 1A and 1B 'When the backlight unit 13 is clamped to the 'by the conveyor n〇, the middle clamp is controlled to work. At the place (S100), the controller j is connected to the power supply unit (10) and is lit = early 130 (S120). Here, the power supply device m includes an electric inverter. Then 'controller execution - visual inspection (si3〇). When the guide element is visually inspected, the controller closes the f-light unit l3Q (si4〇) 13〇7 side. The backlight unit (Si5〇) is separated from the power supply device 120. 2A illustrates a conventional apparatus for automatically inspecting a backlight unit, and FIG. 2B is a flowchart illustrating a process of automatically inspecting a backlight unit of a backlight unit by using a conventional apparatus, and FIG. 2C is a schematic diagram for automatically checking a backlight unit. A conventional device. - Referring to Figures 2A to 2C, when the backlight unit 23〇_2 is transported to the workplace (S2〇〇) in which a controller is positioned via the conveyor 21, the controller connects the backlight unit 230-2 to the conveyor 21 The power supply device 220 provided in the 且 illuminates the backlight unit 23 〇 2 (S21 〇). The illuminated backlight unit 23〇_2 is conveyed to the camera imagepickup area via the wheeler (10) (S22〇). The camera 24 captures a photo of the lit backlight unit 23G_2 entering the image capturing area and obtains a defect of the image captured by the image processing system 25G by the image processing system 25G (S240). When the defect detection process is completed, the automation of the back detection defect from the power supply unit 22° is used to check the backlight unit 1 and the backlight unit is automatically connected to the power supply unit I. In the face, before the money-checking unit, the work of connecting the η &~ material, the clothing to the back, and the (four)-it connection to the power supply device can only be performed manually by "j. In addition, for checking the backlight unit] Two: When the backlight unit is turned on, the power supply device that transports the backlight on the conveyor in the case of the light unit that is required to move the backlight unit has a complicated structure and high cost. 8 7 13〇 7 Explosion $ outside, the power supply unit has the advantage of replacing the existing inspection line as a whole, making it difficult to automate the inspection of the f-light unit and even if it is dynamic, it will reduce the advantages of automation. From the outside: inspection = title: point 5 backlight unit After that, the backlight unit will not cause the problem of the unit. J; degree change causes the backlight to be automatically illuminated and the backlight is fully illuminated. The backlight unit has the same illumination time after about 20 seconds, and the human eye is adjusted when the brightness changes. A defect can be detected. A valid image is obtained when the brightness is not stabilized at the minimum. Correspondingly, the second::, the medium is 'after shooting the backlight unit = after the 'f know that the device should wait for about 1G to reduce the automation. Point. v straw shows other aspects 'when changing the backlight unit to change the capacity of the inverter or the connection—the backlight unit pair corresponding to the inspection target: ===== as the entity of the system containing the mechanical scheme In the case of the automatic inspection backlights known to date == camera inspection without the need to solve the problem of waiting for the predetermined time in the case of the automation = 2 = = backlight unit ^ 'Therefore, sufficient automation advantages are not obtained. ^ Backlight unit is In the case of lighting, the automatic inspection described above is made. The cost advantage is relatively small because of the consideration of cost. Because of the fact that the backlight unit is not illuminated, the 130 touch f.doc device of the backlight unit is checked. However, due to the structural difference of the object, a device (such as a liquid crystal, panel inspection device) that does not need to illuminate the inspection target by using a reflective illumination 'inspecting an inspection target cannot be used to inspect the backlight unit. FIG. A conventional liquid crystal panel inspection device in a reflective lighting system (re£[ectiVe lighting system]. Referring to Figure 3, a conventional liquid crystal panel inspection using a reflective illumination system The device 300 includes a light source 320, a camera 330, and an image processing device 340. The light source 320 is located above the front side of the inspection target 310 and is used to radiate light to the inspection target 310. The camera 330 captures the light reflected by the inspection target 310 and captures an image thereof. The image processing device 340 processes the image captured by the camera 330 and the defect of the inspection target 310. The above-described conventional liquid crystal panel inspection device 300 using the reflective illumination system can only detect external defects on the surface of the inspection target 310 and cannot detect Internal defects. In addition, since the light emitted from the light source 320 is reflected from the inspection target 310 and the dust present in the optical path incident on the camera 330 is thick and is often prominent in the image captured by the camera 330, it is difficult to be accurate Detect φ to measure defects. Further, in a case where the inspection target such as the liquid crystal panel has a transmissive property, a transmissive illumination system in which one of the light sources is located on the back surface of the inspection target can be used, but since the backlight unit is not a transmission target, the rear transmission is A rear transmissive lighting system cannot be used for a backlight unit. SUMMARY OF THE INVENTION The present invention has been devised to solve the above problems. SUMMARY OF THE INVENTION One object of the present invention is to provide an apparatus for inspecting a backlight unit in which the backlight unit can be inspected without connecting the backlight unit to a power source via a 13074 inverter. - according to an aspect of the present invention, a device for inspecting a backlight unit is provided, the device comprising: a mounting unit on which a backlight unit is mounted; an illumination unit that radiates uniform light, the uniform light having access to the backlight unit And passing an optical path of the backlight unit through a film of the backlight unit to the intensity of the backlight unit, and the illumination unit allows the backlight unit to have a state corresponding to a lighting state; an image capturing unit Taking a picture of an inspection area on the surface of the backlight unit, wherein the inspection area has a state of being illuminated by the light radiated from the illumination unit, and the image capturing unit obtains an inspection target image; And an image processing unit that detects a defect of the backlight unit based on the inspection target image input from the image capturing unit. [Embodiment] Hereinafter, an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings. 4 is a diagram illustrating an apparatus for inspecting a backlight φ unit, according to an exemplary embodiment of the present invention. Referring to Fig. 4, an apparatus 400 for inspecting a backlight unit according to the present invention includes a mounting unit 410, a lighting unit 420, an image capturing unit 430, and an image processing unit 440. The backlight unit 450 is mounted on the mounting unit 410. The position of the backlight unit 450, which is configured in accordance with the size of the backlight unit '450, is marked on the mounting unit 410, or a portion of the mounting unit 410 is protruded so as to accurately position the backlight unit 450. 8 10 I3074^ifdoc The illumination unit 420 emits uniform light having a intensity that enters the backlight unit 450 and passes through the film of the backlight unit 450 via the optical path in the backlight unit 450. Accordingly, the illumination unit 420 includes at least one light source. When the light has more excellent linear propagation properties, the light transmission efficiency is further enhanced when the distance between the light source and the surface of the backlight unit 450 is smaller, and when the light radiation line from the light source to the backlight unit 450 is closer to the vertical line . Light having excellent linear propagation properties can be obtained by using an optical fiber or a high power LED. Alternatively, by selectively positioning a cylindrical lens or a spherical reflecting sheet in the optical path, light having excellent linear propagation properties can be obtained. By radiating light having an excellent linear propagation property externally emitted from the illumination unit 420 to the top surface of the backlight unit 450, the backlight unit 450 can be allowed to have a state similar to the lighting state. The illumination unit 420 is disposed around the image capturing unit 430 and radiates uniform light to the backlight unit 450. At this time, the light path that causes the light emitted from the illumination unit 420 to be incident on the image capturing unit 430 directly or through the reflection of the backlight unit 450 is not formed. The image capturing unit 430 detects the light emitted from the illumination unit 420, enters the backlight unit 450, passes through a light path of the backlight unit 450, and then emits light to the backlight unit 450, and then emits light to the backlight unit 450. This obtains an image of the backlight unit 450. The image capturing unit 430. includes a camera having a photoelectric transformation element that converts the detected light into an electrical signal. • The image processing unit 440 detects defects of the backlight unit 450 based on the image input from the image capturing unit 430. Image processing unit 440 calculates an average brightness value of the input image. When the luminance value of the dark region in the image is lower than the average luminance value I3〇7483^ifdoc by a predetermined reference value, the image processing unit 440 determines that there is a defect or a particle in the relevant region of the backlight unit 45A. Since the person skilled in the art can understand the configuration and operation of the image capturing unit 440, a detailed description thereof will be omitted.
在上述根據本發明之檢查背光單元的裝置中，發射自 配置於檢查目標上方的光源之光進入檢查目標内部，穿過 檢查目標内之光徑，且接著返回至檢查目標以外。根據本 發明之檢查背光單元之裝置用相機俘獲返回至檢查目標以 外的光且彳貞測背光單元之缺陷。此時，需防止光自光源直 接進入相機或在經背光單元反射之後進入相機。即，在根 據本發明之檢查背光單元之裝置中，不同於習知裝置中用 於檢查背光單元之照明系統，光應輻射至檢查區域（即， =幾之影像拍攝區域）之周邊。照明系統可稱為前方透射 、、月糸、’先（front transmissive lighting system )’ 使得其可區 別於習知反射照明系統及透射照明系統（即，後 明系統）。 、 圖5八與5B之圖說明背光單元之結構。參看圖5A與 可粗略將背光單元分為兩類。一類為如所示的側 ^具ί光社f光單元。在雜狀況下，發射自配置於側 办之f源的光經由導光板擴散至背光單元之整個表面上， 3諸如配置於導光板上方之擴散片及稜鏡片的光學片， 再次自背光單蚊頂面返回。另—類為如圖沾所 詈於，面具有光源之背光單元。在該種狀況下，發射自配 元二面上之光源的光經由反射片及擴散片擴散至背光單 正固表面上，穿過諸如配置於擴散片上之稜鏡的光學 13 Ο 743 反 if d〇c 片’且接著再次自f光單元之頂面返回。 圖6之圖說明發射自根據本發 置的光源之光傳輸至背光單元内的光徑仏查方先早兀料 參看圖6，發射自光源之均勾且 ，杯 經由導光板61〇擴散，且接 達=板 背光單元具有一類似 :::回頂面。相應地’ + 月亢早几之點冗狀態的發光狀態。 一 g H I光自光源直接人射於相機上或在被背光 射於相機上之光徑與自光源至檢查目標的光 像可受碰而使得不能清晰顯示粒子。 圖=示不期望雜散光（而非經發射的光）自檢查目標進 入相機之狀況。即’當背光單元中存在缺陷時，背光單元 ”粒子阻擔反射自背光單元之光，藉此顯示相應暗 區。,、、'、而’如目7所示，粒子反射或散射之後進入相機之 雜散光使得粒子看上去較亮，藉此損壞了檢查裝置之缺陷 H文月匕。相應地’為實施一有效系統，應阻擋光自光源 直接進5相機或在被背《單元或粒子反射之後進入相機的 光^。藉由使用具有優良的直線傳播性質之光源，雜散光 不能到達粒子。不同於一般照明系統，應將光輕射至待檢 查目標之周邊。 *圖8展示之方法允許具有微弱的直線傳播性質或擴散 性質之光源展現出類似於具有較強的直線傳播性質之光源 的效應。即，藉由在相機820位於光源810兩側中的情況 下在側長1供光屏ft薄膜（light-shielding film) 830，可 阻擒雜散光直接自光源81〇進入相機82〇或在被背光單元In the above apparatus for inspecting a backlight unit according to the present invention, light emitted from a light source disposed above the inspection target enters the inside of the inspection target, passes through the optical path in the inspection target, and then returns to the outside of the inspection target. The apparatus for inspecting the backlight unit according to the present invention captures light returned to the outside of the inspection target with a camera and detects defects of the backlight unit. In this case, it is necessary to prevent light from entering the camera directly from the light source or after being reflected by the backlight unit. Namely, in the apparatus for inspecting the backlight unit according to the present invention, unlike the illumination system for inspecting the backlight unit in the conventional apparatus, the light should be radiated to the periphery of the inspection area (i.e., the image capturing area of several). The illumination system may be referred to as a front transmissive lighting system, such that it may be distinguished from conventional reflective illumination systems and transmissive illumination systems (i.e., backlight systems). 5 and 5B illustrate the structure of the backlight unit. Referring to Fig. 5A, the backlight units can be roughly classified into two categories. One type is the side as shown in the figure. In a miscellaneous condition, light emitted from the f source disposed on the side is diffused to the entire surface of the backlight unit via the light guide plate, 3 such as a diffusion sheet disposed above the light guide plate and an optical sheet of the cymbal, again from the backlight single mosquito The top surface returns. Another type is a backlight unit with a light source on the surface. In this case, the light emitted from the light source on both sides of the cell is diffused onto the backlight single positive surface via the reflection sheet and the diffusion sheet, and passes through an optical 13 743 743 such as a crucible disposed on the diffusion sheet. 〇c slice' and then return again from the top surface of the f-light unit. Figure 6 is a diagram illustrating the optical path transmitted from the light source according to the present invention to the backlight unit. Referring to Figure 6, the light is emitted from the light source, and the cup is diffused through the light guide plate 61. And the access = board backlight unit has a similar::: back to the top surface. Correspondingly, the light-emitting state of the verbose state is a few points earlier. A g H I light is directly incident on the camera from the light source or the light path that is reflected by the backlight on the camera and the light image from the light source to the inspection target can be touched so that the particles cannot be clearly displayed. Figure = shows the situation where unwanted light (not emitted light) enters the camera from the inspection target. That is, when there is a defect in the backlight unit, the backlight unit "particles resist light reflected from the backlight unit, thereby displaying the corresponding dark area.,,, and, as shown in item 7, the particles are reflected or scattered into the camera. The stray light makes the particles appear brighter, thereby damaging the defect of the inspection device. Accordingly, in order to implement an effective system, light should be blocked from the light source directly into the 5 camera or reflected in the back unit or particle. After entering the light of the camera ^. By using a light source with excellent linear propagation properties, stray light cannot reach the particle. Unlike the general lighting system, the light should be lightly shot to the periphery of the object to be inspected. * The method shown in Figure 8 allows A light source having weak linear propagation properties or diffusion properties exhibits an effect similar to a light source having a strong linear propagation property, that is, by providing a light panel on the side length 1 in the case where the camera 820 is located on both sides of the light source 810. A light-shielding film 830 that blocks stray light directly from the light source 81〇 into the camera 82〇 or in the backlight unit
13 I307436ifd〇c 反射之後進入相機。當使用具有較強的直線傳播性質 源時亦可使用該光屏蔽薄膜830,使得可 = 背光單元反射之後進入相機820。 欣尤在破 當歸因於微弱的照明而不能均勾地點亮背光單元之敕 時，可藉由使用線性相機來有效地獲㈣胁“ 狀恶之影像。® 9展示使用線性相機檢查f光單元 參看圖9,檢查背光單元之農置_包含 910、光源、線性相機93〇以及影像處理單元兒:室 在行動平：ϋ 910上安裝背光單元95〇。控制 a 移動速度’使其為線性相機93〇可獲得背光單元‘ ί:=ΐ度。在線性相機930之兩側上配置光請， : 光早凡950之末端不會關熄照明。然而，在該種 狀=，由於僅在背光單元95〇之末端將發射自—光源伽 5射至背光單元950 ’因此進入線性相機93〇之光 =可自至二半V然而’藉由使用影像處理工作執行= 末知偵測缺陷。線性相機93Θ位於轉移平臺91〇 =於供應藉由拍攝背光單元95〇獲得 早心5。具有類似於影像處理單心。之點亮狀I =影像處理單元刚處理該影像且偵測—缺陷。心 質之辆由使用具有優良的均勻性及直線傳播性 之裝置Q 補由—統檢查f光單元 置。由於Γ0 於檢查f光單元之僅具有—光源之裝 所yΐ所不之裝置的其他元件類似於參看圖4及9 所私迷之裝置料件，因此省略其描述。參看圖Η)，ί在 ⑧ 14 I307434ifd〇c 相機】020之 <則上配置光源1〇1〇。此時，半反射鏡面（碰 酬t置於光源1GIG下方域面胸配置於相 3 士坐U上而與光源1G1G相對。配置於光源1010 面麵朝向鏡面1G4G反射發射自光源 、4分，其中鏡面1040配置於相機1020之一 相對。相應地，可獲得與將具有較強的 生貝之光源配置於相機職兩側之狀況相同的 置之背光&的裝 參看圖1〗Λ , 刺生產線中之檢查過程。 乡0 人11Β’藉由輪送機11忉之移動將付於仏 送機上之背光單元輸 光源H20沿背光單幻14〇之輸 「fsmo)。 之上游侧及下游側。發射自光源112G之°光傳輪至!^ L130 :〇穿過f光單元114〇内之光徑，且接著發射 ^场。相機_拍攝輸送至檢查位置之f ^早 _之影像(S1110)。視相機 機1110之移動速度設定得不同。^_113^，字輪送 相機時，輪送機1110以對應於相機n 光學 之週期重複該停止及輸送。當相 1办像拍攝區域 輸送機⑴。之速度控制蝴^ _之-影像的速度處。影像處理單元（未月光早兀 難攝光單 =相 根據檢查背光單元之裝置及方法，由於在引^ 130743^>ifd〇c ======= 另-方面，應控制影響影像拍攝之各種因素，使得相 機所拍攝之影像可保持足夠的均勾品質，以便即使當改變 作為檢查目標之背光單元之種類時亦偵測到缺陷。在影塑 影像拍攝之各種因素中，影響影像亮度之因素尤其重要， 諸如，強度、相機增盈、透鏡光圈之曝光量及其類似物。 鲁具體5之，光強度之調節最為重要，其允許控制影像亮度 而不會衫響諸如聚焦深度或影像雜訊之其他因素。 圖12之圖說明檢查背光單元之裝置，其中可視背光單 元之種類來調節輻射自光源之光的強度。 一參看圖12,根據本發明之檢查背光單元之裝置12〇〇 包含安裝單元1210、照明單元122〇、影像拍攝單元123〇、 影像處理單元1240，以及光強度調節單元（_池咖办 adjusting unit) 1250，該裝置中可調節光之強度。光強度 參 5周節單元1250基於對應於外部所供應之背光單元1260之 類別資訊的照明值’調節自照明單元122〇輻射至背光單元 1260之光的強度，其中該照明值在各種背光單元126〇之 照明值之中。各種背光單元1260之照明值儲存於光強度調 節單元1250中。預先量測各種背光單元126〇之照明值且 將其儲存於光強度調節單元1250中。為獲得各種背光單元 1260之照明值，在確定了影響影像拍攝單元1230所拍攝 之影像的品質之各種因素（例如相機增益、光圈曝光量及 1307434 if.doc 其類似物）的情況下，執行各種背光單元之影像分析。即， 將背光單元1260之照明值設定為屬於如下範圍之照明 值，可確定在該範圍中影像之平均亮度於改變作為檢查目 標之背光單元1260之種類時是相等的。表格1展示各種背 光單元之照明標準值及測試條件。此處，照明標準值為調 節照明之調節器值。 表格1 類別 背光單元種 類 照明標準 平均亮度值 監視器 17" 5.55 156 Lux 19" 7.5 150 Lux 20" 6.1 157 Lux 電視 20"寬 5.8 156 Lux 32" 8.5 150 Lux 項目 測試條件 光源 具有高亮度之LED線光源 光源方向 垂直於背先單元之頂面 光源南度 23 mm 光源與相機 之間的距離 39 mm 相機高度 693 mm 相機視野 271 mm 相機 DALSA 公司製造之 DALSAPrianha2 24k 影像拍攝元 件之尺寸 7 μιη 相機增益 7.0 透鏡 2.8D 光圈 4 17 I3074^if.doc 另—方面’在影響影像拍攝之因素中除了可簡易控制 复之強度以外’藉由改變影響影像拍攝之諸如相機增益之 因素’可應對背光單元1260之種類及類型之變化且保 =办像冗度及類似均勻性。由於檢查裝置12〇〇之啟用該功 犯之結構及設定過程類似於在照明調節實例中所描述之光 強度，節單元之結構及設定過程，因此省略該描述。 上^改變作為檢查目標之背光單元1260之種類，則光強 節單元1250讀出儲存於其中之類別的照明值且基於 所碩出之照明值改變照明單元122〇之照明。由控制哭 關於作為檢查目標之背光單元丨之類別資訊。其他方 面^當在用於檢查作為檢查目標之背光單元的裝置1200 二中提供一可自諸如條碼及RFID (無線射頻識別碼）之資訊 記錄構件（未圖示）獲得資料之讀取設備時，可自動化所 有檢查過程。此處’檢查背光單元i之襄置12⑽獲得 條碼、RHD及其類似物’其附著至作為檢查目標之背光單 兀1260且其上記錄有類別資訊。根據此組態，即使當改變 作為檢查目標之背光單元丨之類別時，亦可最小化 1200之實體結構或重設的變化，藉此可簡易應對種類^改 變。由於除了光強度調節單元⑽之外的元件類似於參看 圖4所描述之檢查背光單元的裝置之相關元件 其詳細描述。 圖13A與13B之圖分別說明在藉由使用習知 背光單元㈣況下用相機拍_f光單元之 由使用根據本發日狀妓切背光單元減-類似ί = 1307434 if. doc 狀態的情況下用相機所拍攝的背光單元之影像。如圖13八 與13B所示，根據本發明拍攝之影像幾乎類似於在點 光單元之情況下所拍攝之影像。 在上述根據本發明之檢查背光單元之裝置中，由於益 需點亮背光單元便能檢查背光單元之缺陷，因麟習知系、 、统相比可簡化自動檢查系統。另外，由於無需經由反柄 手動將背光單元之連接器連接至電源，因此可簡易實施生 產線。此外，由於無需等待對於自動檢查經點亮的背 ’且可簡易應對作為檢 查目之月光早兀之類型改變，因此進—步增 ，之自動^優點。此外，由於可將自動檢查裝置引入^ 此可簡易製造在線自動檢查裝置。’、、、而问成本）中，因 亦可將本發明實施為電腦 程式碼。電腦可讀記錄媒體為任電:可讀 存此後藉由電腦系統讀取之㈣。:可儲 ‘==，隨機存取記憶體(她)、緊 载波（諸如經由網= 1資料儲存設備及 亦可分佈於_電:=:，。！腦可讀記_^ 式執行電腦可讀程式碼=、、，上，使仔儲存並以分散模 限定本發較佳實施例揭露如上，然其並非用以 和範圍内，當可^:習此技藝者，在不脫離本發明之精神 作』許之更動與濁饰，因此本發明之保護 19 13074^“·— 粑圍當視後附之申請專利範圍所界定者。 【圖式簡單說明】 ^ 藉由彡看所賴鱗細描財發 本發明之上述及其他特徵以及優點能更明顯易懂 圖1A圖說明手動檢查背光單元之習知裝置。，、中. 里-ΐ二Ϊ流程圖說明藉由使用習知裝置手動檢查背光 早7〇的檢查背光單元過程。 —月尤 圖2Α之圖說明自動檢查背光單元之習知裝置。 罝-Ξ ^之流程圖說明藉由使用習知裝置自動檢查背光 早兀的k查背光單元過程。 圖2C之示意圖說明自動檢查背光單元之習知襄置。 知裝^之圖說明使用反射照明系統之檢查背光單^的習 單元ϋΐ圖說明根據本發明之例示性實施例的檢查背光 圖5Α與5Β之圖說明背光單元之結構。 圖6之圖說明發射自光源之光經 本發背光單元的裝置中之背光單St根據 _圖7之圖說明自照明區直接入射於相機上或 ::以=:之雜散光_，該雜散光作 ，=圖說明檢查背光單元之裝置，其中提供光屏蔽 ^ 、以允泎具有擴散性質之光展現出與具有直線傳播 之光相同的效應。 、 (S： 20 13 Ο743爲if doc 圖9之圖說明根據本發明之實施例的檢查具有線性相 機（linear camera)之背光單元的裝置。 圖10之圖說明根據本發明之實施例的檢查具有一照 明之背光單元的裝置。 圖11A之圖說明具有根據本發明之檢查背光單元的裝 置之生產線。 圖11B之流程圖說明具有根據本發明之檢查背光單元 的裝置之生產線中的檢查過程。 圖12之圖說明檢查背光單元之裝置，其中可視背光單 元之類別來調節輻射自光源之光的強度。 圖13A與13B之圖分別說明藉由習知方法獲得的背光 單元之影像，及藉由根據本發明之方法獲得的背光單元之 影像。 【主要元件符號說明】 110 輸送機 120 電源供應裝置 130 背光單元 210 輸送機 220 電源供應裝置 230-2 背光單元 240 相機 250 影像處理系統 300 液晶面板檢查裝置 310 檢查目標 21 I30743^iif.d〇c 320光源 330相機 340影像處理設備 400檢查背光單元的裝置 410安裝單元 420照明單元 430影像拍攝單元 440影像處理單元13 I307436ifd〇c Enter the camera after reflection. The light-shielding film 830 can also be used when a source having a strong linear propagation property is used so that the backlight unit can be reflected into the camera 820. Xinyu can effectively obtain (4) threatening images by using a linear camera when it is due to weak illumination and cannot illuminate the backlight unit. The 9 shows the use of a linear camera to check the f-light unit. Referring to FIG. 9, the backlight unit is inspected _including 910, the light source, the linear camera 93〇, and the image processing unit: the chamber is mounted on the action plane: 910, and the backlight unit 95 is mounted. Control a moving speed to make it a linear camera. 93〇 available backlight unit ' ί:=ΐ. The light is arranged on both sides of the linear camera 930, : The light will not turn off the illumination at the end of the 950. However, in this species =, because only in the backlight The end of unit 95 将 will emit from the source gamma 5 to the backlight unit 950 'so the light entering the linear camera 93 = = can be from the second half V. However 'by performing image processing work execution = the last known detection defect. Linear The camera 93 is located at the transfer platform 91 〇 = is supplied with the backlight unit 95 to obtain the early heart 5. There is a lighting similar to the image processing single heart. I = the image processing unit has just processed the image and detected - defect. Quality vehicle Use the device Q with excellent uniformity and linear propagation to check the f-light unit. Since Γ0 is used to check the f-light unit, there are only other components of the device that are not equipped with the light source. 4 and 9 private device parts, so the description is omitted. See Figure Η), ί in 8 14 I307434ifd〇c camera 020 < then configure the light source 1 〇 1 〇. At this time, the semi-reflective mirror ( The surface of the light source 1GIG is placed on the lower side of the light source 1G and is opposite to the light source 1G1G. The surface of the light source 1010 is reflected toward the mirror surface 1G4G and emitted from the light source, 4 minutes, wherein the mirror 1040 is disposed on the camera 1020. Correspondingly, it is possible to obtain a backlight & which is the same as the one in which the light source having a strong raw shell is disposed on both sides of the camera, and the inspection process in the thorn production line. 11Β'The movement of the backlight unit 11 by the transfer machine 11 will be applied to the backlight unit. The light source H20 is “fsmo” along the backlight. The upstream side and the downstream side are emitted from the light source 112G. Passing to! ^ L130 : 〇 through the f-light unit 114〇 The light path inside, and then the field is emitted. The camera _ photographs the image sent to the inspection position f ^ early _ (S1110). The moving speed of the camera 1110 is set differently. ^_113^, when the character is sent to the camera, The wheeler 1110 repeats the stopping and conveying in a period corresponding to the optical direction of the camera n. When the phase 1 is in the image capturing area conveyor (1), the speed control is at the speed of the image. The image processing unit (not moonlight early) Difficult to take light single = phase according to the device and method for checking the backlight unit, because in the introduction of 130743^>ifd〇c ======= another aspect, the various factors affecting image shooting should be controlled so that the camera shoots The image can maintain sufficient hook quality to detect defects even when changing the type of backlight unit to be inspected. Among the various factors of image capture, factors affecting image brightness are particularly important, such as intensity, camera gain, lens aperture exposure, and the like. Lu specifically 5, the adjustment of light intensity is the most important, which allows to control the brightness of the image without ringing other factors such as depth of focus or image noise. Figure 12 is a diagram illustrating the apparatus for inspecting a backlight unit in which the intensity of light radiated from the light source is adjusted depending on the type of the backlight unit. Referring to FIG. 12, a device 12 for inspecting a backlight unit according to the present invention includes a mounting unit 1210, an illumination unit 122A, an image capturing unit 123A, an image processing unit 1240, and a light intensity adjusting unit (_pooling adjustment unit) ) 1250, the intensity of the light can be adjusted in the device. The light intensity reference 5th day unit 1250 adjusts the intensity of light radiated from the illumination unit 122 to the backlight unit 1260 based on the illumination value corresponding to the category information of the externally supplied backlight unit 1260, wherein the illumination value is at the various backlight units 126. Among the lighting values. The illumination values of the various backlight units 1260 are stored in the light intensity adjustment unit 1250. The illumination values of the various backlight units 126 are measured in advance and stored in the light intensity adjustment unit 1250. In order to obtain the illumination values of the various backlight units 1260, various factors (such as camera gain, aperture exposure, and 1307434 if.doc analogous) that affect the quality of the image captured by the image capturing unit 1230 are determined. Image analysis of the backlight unit. That is, the illumination value of the backlight unit 1260 is set to an illumination value belonging to the range in which it is determined that the average brightness of the image in the range is equal when the type of the backlight unit 1260 as the inspection target is changed. Table 1 shows the lighting standard values and test conditions for various backlight units. Here, the illumination standard value is the regulator value that adjusts the illumination. Table 1 Category Backlight Unit Type Lighting Standard Average Brightness Value Monitor 17" 5.55 156 Lux 19" 7.5 150 Lux 20" 6.1 Lux Lux TV 20" Width 5.8 156 Lux 32" 8.5 150 Lux Item Test Condition Light Source High Brightness LED Line The direction of the light source is perpendicular to the top surface of the front unit. The light source is 23 mm south. The distance between the light source and the camera is 39 mm. The camera height is 693 mm. The camera field is 271 mm. The camera DALSA company produces DALSAPrianha2. The size of the 24k image capturing unit is 7 μιη. Lens 2.8D Aperture 4 17 I3074^if.doc In other aspects, in addition to the ability to easily control the complexness of the image capturing, 'by changing the factors affecting image capturing such as camera gain' can cope with the backlight unit 1260 Changes in type and type and guarantee = redundancy and similar uniformity. Since the structure and setting process of the inspection device 12 is similar to the light intensity described in the illumination adjustment example, the structure of the node unit and the setting process, the description is omitted. When the type of the backlight unit 1260 as the inspection target is changed, the light intensity unit 1250 reads out the illumination value of the category stored therein and changes the illumination of the illumination unit 122 based on the master illumination value. By the control, crying about the category information of the backlight unit as the inspection target. In other respects, when a reading apparatus for obtaining data from an information recording member (not shown) such as a bar code and an RFID (Radio Frequency Identification Code) is provided in the apparatus 1200 for checking a backlight unit as an inspection target, All inspection processes can be automated. Here, the device 12 (10) for inspecting the backlight unit i obtains a bar code, an RHD, and the like, which is attached to the backlight unit 1260 as an inspection target and has category information recorded thereon. According to this configuration, even when the category of the backlight unit 作为 as the inspection target is changed, the physical structure of 1200 or the change of the reset can be minimized, whereby the type change can be easily handled. Since the elements other than the light intensity adjusting unit (10) are similar to the related elements of the apparatus for inspecting the backlight unit described with reference to Fig. 4, a detailed description thereof will be given. 13A and 13B respectively illustrate the use of the camera to shoot the _f light unit by using the conventional backlight unit (4), and the use of the backlight unit according to the present invention is similar to the ί = 1307434 if. doc state. The image of the backlight unit taken with the camera. As shown in Figs. 13 and 13B, the image taken according to the present invention is almost similar to the image taken in the case of the spot light unit. In the above apparatus for inspecting the backlight unit according to the present invention, since it is necessary to illuminate the backlight unit to check the defects of the backlight unit, the automatic inspection system can be simplified as compared with the conventional system. In addition, since it is not necessary to manually connect the connector of the backlight unit to the power supply via the reverse handle, the production line can be easily implemented. In addition, since there is no need to wait for the automatic inspection of the illuminated back and the type change of the moonlight as the inspection object can be easily dealt with, the step is increased, and the advantage is automatic. In addition, since the automatic inspection device can be introduced, the online automatic inspection device can be easily manufactured. In the case of ',, and cost, the present invention can also be implemented as a computer code. The computer readable recording medium is any power: it can be read and then read by the computer system (4). : can store '==, random access memory (her), tight carrier (such as via network = 1 data storage device and can also be distributed in _ electricity: =:,!! brain readable _^ executable computer can Read the code =,,, and so on, and store it in a decentralized mode. The preferred embodiment is disclosed above, but it is not intended to be used in the scope of the present invention, without departing from the invention. The spirit is made by Xu Zhizhi and the turbidity, so the protection of the present invention 19 13074^“·· 粑 当 当 当 当 当 。 。 。 。 。 。 。 。 【 【 【 【 【 【 【 【 【 【 【 【 【 【 ^ ^ ^ ^ ^ ^ The above and other features and advantages of the present invention are more apparent and easy to understand. Figure 1A illustrates a conventional device for manually inspecting a backlight unit. The process description of the middle-in-one is described by using a conventional device. The process of checking the backlight unit is 7 inches early. The picture of the moon is shown in Fig. 2 illustrates the conventional device for automatically checking the backlight unit. 流程图-Ξ ^ The flow chart shows that the backlight of the backlight is automatically checked by using a conventional device. Unit process. Figure 2C is a schematic diagram illustrating automatic inspection of the backlight unit BRIEF DESCRIPTION OF THE DRAWINGS The diagram of a backlight unit using a reflective illumination system illustrates the structure of a backlight unit according to an exemplary embodiment of the present invention. FIG. 6 illustrates the structure of a backlight unit. The figure illustrates that the backlight single St in the device that emits light from the light source through the backlight unit of the present invention is directly incident on the camera from the illumination region according to the diagram of FIG. 7 or:: stray light with =:, the stray light, = Figure illustrates a device for inspecting a backlight unit in which a light shield is provided to allow light having a diffusing property to exhibit the same effect as light having a straight line of propagation. (S: 20 13 Ο 743 is if doc Figure 9 is a diagram illustrating A device for inspecting a backlight unit having a linear camera according to an embodiment of the present invention. Figure 10 is a diagram illustrating a device for inspecting a backlight unit having an illumination according to an embodiment of the present invention. A production line of the apparatus for inspecting a backlight unit of the present invention. The flow chart of Fig. 11B illustrates an inspection process in a production line having a device for inspecting a backlight unit according to the present invention. The figure illustrates a device for inspecting a backlight unit in which the intensity of light radiated from the light source is adjusted according to the type of the backlight unit. Figures 13A and 13B respectively illustrate images of the backlight unit obtained by a conventional method, and by Image of backlight unit obtained by the method of the invention. [Description of main component symbols] 110 Conveyor 120 Power supply device 130 Backlight unit 210 Conveyor 220 Power supply device 230-2 Backlight unit 240 Camera 250 Image processing system 300 Liquid crystal panel inspection device 310 Inspection target 21 I30743^iif.d〇 320 light source 330 camera 340 image processing device 400 device for inspecting backlight unit 410 mounting unit 420 lighting unit 430 image capturing unit 440 image processing unit
450背光單元 610導光板 810光源 820相機 830光屏蔽薄膜 900檢查背光單元的裝置 910轉移平臺/行動平臺 920光源 930線性相機 940影像處理單元 950背光單元 1010光源 1020相機 1030半反射鏡面 1040鏡面 1110輸送機 22 I30743^)ifd〇c 1120光源 - 1130相機 1140背光單元 1200檢查背光單元的裝置 1210安裝單元 1220照明單元 1230影像拍攝單元 1240影像處理單元 • 1250光強度調節單元 1260背光單元450 backlight unit 610 light guide plate 810 light source 820 camera 830 light shielding film 900 device for checking backlight unit 910 transfer platform / mobile platform 920 light source 930 linear camera 940 image processing unit 950 backlight unit 1010 light source 1020 camera 1030 semi-reflective surface 1040 mirror 1110 transport Machine 22 I30743^)ifd〇c 1120 light source - 1130 camera 1140 backlight unit 1200 device for inspecting backlight unit 1210 mounting unit 1220 lighting unit 1230 image capturing unit 1240 image processing unit • 1250 light intensity adjusting unit 1260 backlight unit
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