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TWI393854B - The method of the optical system to measure the actual contact area of ​​the - Google Patents

The method of the optical system to measure the actual contact area of ​​the Download PDF

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Publication number
TWI393854B
TWI393854B TW97133428A TW97133428A TWI393854B TW I393854 B TWI393854 B TW I393854B TW 97133428 A TW97133428 A TW 97133428A TW 97133428 A TW97133428 A TW 97133428A TW I393854 B TWI393854 B TW I393854B
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Taiwan
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contact area
tested
actual contact
glass plate
optical
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TW97133428A
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Chinese (zh)
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TW201011253A (en
Inventor
Li Ming Chu
Hsiang Chen Hsu
Sun Lon Jen
Shen Li Fu
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Univ Ishou
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Description

以光學系統量測實際接觸面積之方法Method for measuring actual contact area by optical system

本發明是有關於一種量測方法,特別是指一種利用控制施力條件並結合光學干涉原理及影像分析技術,以精確量測施力後之實際接觸面積的方法。The invention relates to a measuring method, in particular to a method for accurately measuring the actual contact area after applying a force by using a controlled force applying condition combined with an optical interference principle and an image analyzing technique.

物體表面無論是研磨的多麼光滑,若在顯微鏡下觀察仍會看到其表面為凹凸不平。以現代之加工技術而言,即使採用高精密度的研磨機械,金屬表面的粗糙度仍有0.1um左右,因此若以肉眼觀察,可看成是整個表面全部接觸,但實際上僅是極少數的尖峰彼此相互接觸。參閱圖1,為一具有一表面的元件9,該表面具有複數個粗糙部91,外視接觸面積為該表面的面積,相對於該外視接觸面積,該等粗糙部91與外界的接觸面積之和即為實際接觸面積,一般而言,實際接觸面積僅為外視接觸面積的百分之一到萬分之一,並隨負荷的大小而有所變化。No matter how smooth the surface of the object is, if it is observed under a microscope, the surface will be uneven. In terms of modern processing technology, even with high-precision grinding machinery, the roughness of the metal surface is still about 0.1um. Therefore, if it is observed by the naked eye, it can be seen that the entire surface is in full contact, but in reality it is only a very small number. The spikes touch each other. Referring to Fig. 1, an element 9 having a surface having a plurality of rough portions 91, the external contact area is the area of the surface, and the contact area of the rough portions 91 with the outside relative to the external contact area The sum is the actual contact area. In general, the actual contact area is only one to one ten thousandth of the external contact area, and varies with the size of the load.

在如此微小面積承受全部負荷,其單位面積上的壓力非常大,接觸點將產生塑性變形,接觸點之尖峰被壓潰,使接觸面更為接近,同時由於分子力作用,以致接觸點發生黏著。當兩接觸面做相對運動時,黏著部分將被剪斷,此剪斷所需之作用力,即為摩擦力。因此摩擦力之大小決定於實際接觸面積。In such a small area to withstand the full load, the pressure per unit area is very large, the contact point will be plastically deformed, the peak of the contact point is crushed, the contact surface is closer, and the contact point is adhered due to the molecular force. When the two contact surfaces move relative to each other, the adhesive portion will be sheared, and the force required for the shearing is friction. Therefore, the amount of friction is determined by the actual contact area.

而一般以電阻法量測實際接觸面積,僅能量測一具有粗糙表面的物件在不同負荷條件下,實際接觸面積與外觀面積 之比例,並無法得知實際接觸面積分佈之情況,且以電阻法進行量測時,不導電之物質即無法量測。Generally, the actual contact area is measured by the electric resistance method, and only the energy of a workpiece having a rough surface under different load conditions, the actual contact area and the appearance area are measured. The ratio of the actual contact area distribution is not known, and when measured by the electric resistance method, the non-conductive substance cannot be measured.

因此如何尋求一不僅可量測金屬材料,非金屬材料表面的實際接觸面積,且在該量測過程中不需破壞待測物,進而降低量測成本及改善量測之可重複性,則是在該領域者所欲解決的課題之一。Therefore, how to find a not only measurable metal material, the actual contact area of the surface of the non-metallic material, and without destroying the object to be tested in the measurement process, thereby reducing the measurement cost and improving the repeatability of the measurement, One of the topics that the field is trying to solve.

因此,本發明之目的,即在提供一種以光學系統量測實際接觸面積之方法。Accordingly, it is an object of the present invention to provide a method of measuring an actual contact area with an optical system.

於是,本發明以光學系統量測實際接觸面積之方法,可用來量測並計算一個具有粗糙表面的待測物其表面粗糙部的實際接觸面積,該方法包含:一準備步驟、一推進步驟、一影像擷取步驟,及一數據處理步驟。Therefore, the method for measuring the actual contact area by the optical system of the present invention can be used for measuring and calculating the actual contact area of the rough surface of the object to be tested having a rough surface, the method comprising: a preparation step, a step of advancing, An image capture step and a data processing step.

該準備步驟是先準備一待測物,將該待測物以該粗糙表面朝向觀測物鏡方向,置放於光學顯微鏡的載物台上,並設置一光學玻璃平板於該待測物及觀測物鏡之間。該推進步驟是由該載物台下方施加一垂直於該載物台的正向推力,使該載物台向該光學顯微鏡觀測物鏡方向靠近,至該待測物的表面粗糙部實際接觸該光學玻璃平板至設定程度。該影像擷取步驟是以一影像擷取裝置擷取該待測物與該光學玻璃平板接觸停止後的實際接觸區的圖像。該數據處理步驟是以一影像數據處理裝置自該影像擷取裝置擷取的圖像中,計算該實際接觸區所佔的畫素數,再將該畫素數乘以每單位畫素之校正數值,即可求得該待測物的粗糙表面實質接觸該光學玻璃平 板時的接觸面積。The preparation step is to prepare a test object, the test object is placed on the stage of the optical microscope with the rough surface facing the observation objective lens, and an optical glass plate is disposed on the object to be tested and the observation objective lens. between. The advancing step is to apply a positive thrust perpendicular to the stage under the stage, so that the stage approaches the objective lens of the optical microscope, and the surface roughness of the object to be tested actually contacts the optical Glass plate to the set level. The image capturing step is an image capturing operation of the actual contact area after the object to be tested is stopped in contact with the optical glass plate by an image capturing device. The data processing step is to calculate the number of pixels occupied by the actual contact area in an image captured by the image data processing device from the image capturing device, and multiply the pixel number by the correction per unit pixel. Numerically, the rough surface of the object to be tested is substantially in contact with the optical glass The contact area of the board.

本發明之功效在於:經由一正向推力,使待測物與該光學玻璃平板接觸,並持續施以該正向推力,當正向推力為不大於使該粗糙部產生塑性變形後,再經由影像擷取及數據處理後即可得到該待測物的粗糙部之實際面積,並可經由擷取之影像同時獲得該粗糙部的實際分布情形。The effect of the invention is that the object to be tested is brought into contact with the optical glass plate via a positive thrust, and the forward thrust is continuously applied, and when the forward thrust is not greater than plastically deforming the rough portion, After the image capturing and data processing, the actual area of the rough portion of the object to be tested can be obtained, and the actual distribution of the roughness can be obtained simultaneously through the captured image.

有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之一個較佳實施例的詳細說明中,將可清楚的呈現。The above and other technical contents, features and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments.

參閱圖2,實施本發明以光學系統量測實際接觸面積之方法時,需先準備一光學量測系統1。Referring to Fig. 2, when implementing the method of measuring the actual contact area by the optical system of the present invention, an optical measuring system 1 is first prepared.

該光學量測系統1包括一光學顯微鏡11、一光源裝置12、一影像擷取裝置13、一推進裝置14,及一數據處理裝置15。The optical measuring system 1 includes an optical microscope 11, a light source device 12, an image capturing device 13, a propulsion device 14, and a data processing device 15.

該光學顯微鏡11包括一置物台111、一觀測物鏡112、一介於該置物台111及該觀測物鏡112之間的固定部113,及一固設於該固定部113的光學玻璃平板114。The optical microscope 11 includes a stage 111, an observation objective 112, a fixing portion 113 interposed between the stage 111 and the observation objective 112, and an optical glass plate 114 fixed to the fixing portion 113.

該光源裝置12,具有一光源121、一偏極鏡122、一空間濾波器(Spacial Filter)123、一透鏡組124,及一光纖軟管125,在本較佳實施例中,該光源121可為氦氖雷射(He-Ne Laser)或白光,光源121可經由該偏極鏡122至該空間濾波器123進行濾除雜波、降低斑點等程序,再經過該透鏡組124,進入該光纖軟管125中。The light source device 12 has a light source 121, a polarizing mirror 122, a spatial filter 123, a lens group 124, and a fiber optic hose 125. In the preferred embodiment, the light source 121 can be For the He-Ne Laser or the white light, the light source 121 can perform a process of filtering out clutter, reducing spots, and the like through the polarizer 122 to the spatial filter 123, and then entering the fiber through the lens group 124. In the hose 125.

該影像擷取裝置13具有一高速攝影機131,將進入該光纖軟管125的雷射導入該高速攝影機131內可作為觀測光源。The image capturing device 13 has a high speed camera 131 into which a laser entering the fiber optic hose 125 is introduced into the high speed camera 131 as an observation light source.

該推進裝置14包括一擠壓單元141,及一量測單元142。該擠壓單元141具有一槓桿143,槓桿143一端連接於該置物台111底部,另一端具有一載重部144,於該槓桿143的兩端之間具有一支點145,可在載重部144放置荷重w,以槓桿方式施加荷重,帶動連接於該置物台111底部的一端,而使該置物台111向觀測物鏡112方向擠壓。於本較佳實施例中,該槓桿143施加荷重端與該待測物受力端之桿長比為5:1,該載重部144至該支點145的距離為175mm,而支點145至該連接於該置物台111底部端的距離為35mm; 該量測系統142具有一負荷計146及一渦電流位移計147(eddy current displacement transducer),可準確量測該擠壓單元141所施加的動態負荷,其施力方向係垂直於置物台111方向,該渦電流位移計147可以監控起始擠壓位置;也可精準的量測到擠壓時的單位時間位移變化量,而推斷出擠壓速度。The propulsion device 14 includes a pressing unit 141 and a measuring unit 142. The pressing unit 141 has a lever 143. One end of the lever 143 is connected to the bottom of the storage table 111, and the other end has a load portion 144. A pair of points 145 are disposed between the two ends of the lever 143 to place a load on the load portion 144. w, the load is applied in a lever manner, and the end connected to the bottom of the stage 111 is driven to press the stage 111 in the direction of the observation objective lens 112. In the preferred embodiment, the ratio of the length of the load applied to the load end of the lever 143 is 5:1, the distance from the load portion 144 to the fulcrum 145 is 175 mm, and the fulcrum 145 is connected to the connection. The distance from the bottom end of the stage 111 is 35 mm; The measuring system 142 has a load meter 146 and an eddy current displacement transducer 147, which can accurately measure the dynamic load applied by the pressing unit 141, and the direction of the force applied is perpendicular to the stage 111. The eddy current displacement meter 147 can monitor the initial pressing position; it can also accurately measure the amount of displacement per unit time during extrusion, and infer the extrusion speed.

參閱圖2、圖3,本發明以光學系統量測實際接觸面積之方法的較佳實施例,是包含了一準備步驟51、一推進步驟52、一影像擷取步驟53,及一數據處理步驟54。Referring to FIG. 2 and FIG. 3, a preferred embodiment of the method for measuring an actual contact area by using an optical system includes a preparation step 51, a step of advancing 52, an image capturing step 53, and a data processing step. 54.

首先,進行該準備步驟51,準備一表面具有複數粗糙部的待測物2,並將該待測物2事先以超音波震盪清洗後擦乾。將該待測物2的表面粗糙部朝向光學玻璃平板114的方向, 並置於該置物台111上。First, the preparation step 51 is performed to prepare a sample 2 having a plurality of rough portions on the surface, and the object to be tested 2 is ultrasonically shaken and washed in advance. The surface roughness of the object 2 to be tested is oriented in the direction of the optical glass plate 114, And placed on the stage 111.

接著,進行該推進步驟52,經由連接於該置物台111底部的推進裝置14施予一正向推力,該推進裝置14可藉由調整擠壓位置與擠壓速度控制該正向推力,將該載有待測物2的置物台111向該光學玻璃平板114推擠靠抵,直到該正向推力為不大於使該粗糙部產生塑性變形為止,因而產生一由該等粗糙部與該光學玻璃平板114實際接觸的實際接觸區。Then, the advancing step 52 is performed, and a forward thrust is applied via the propulsion device 14 connected to the bottom of the stage 111. The propulsion device 14 can control the forward thrust by adjusting the pressing position and the pressing speed. The stage 111 carrying the object to be tested 2 pushes against the optical glass plate 114 until the forward thrust is not greater than plastically deforming the roughness, thereby generating a rough portion and the optical glass. The actual contact area that the plate 114 actually contacts.

然後,進行該影像擷取步驟53,將該實際接觸區以影像擷取裝置13的高速攝影機131進行影像擷取,即可得到一實際接觸區的靜止圖像。Then, the image capturing step 53 is performed, and the actual contact area is image-captured by the high-speed camera 131 of the image capturing device 13 to obtain a still image of an actual contact area.

最後,再進行該數據處理步驟54,將實際接觸區的圖像經由影像數據處理裝置13,量測計算實際接觸面積分佈之情況,即可得到該等粗糙部的實際面積。在本較佳實施例中,是將該待測物2與該光學玻璃平板114在靜止接觸時之實際接觸區的圖像,藉由該影像擷取裝置13擷取,再經由影像分析軟體獲得在實際接觸區所佔的畫素數,然後乘以每單位畫素之實際尺寸的校正數值,最後即可求得接觸面積。其中,該校正數值可由拍攝一已知尺寸的校正物體,再以該準備步驟、該推進步驟及該影像擷取步驟,分析該校正物體所佔的畫素數大小,即可從而得知每個畫素數所代表之實際尺寸,並推算出該校正數值。Finally, the data processing step 54 is performed, and the actual area of the rough portions is obtained by measuring the actual contact area distribution by the image of the actual contact area via the image data processing device 13. In the preferred embodiment, an image of the actual contact area of the object 2 to be in contact with the optical glass plate 114 is captured by the image capturing device 13 and then obtained by the image analysis software. The number of pixels in the actual contact area is then multiplied by the corrected value of the actual size of each unit of the pixel, and finally the contact area can be obtained. The correction value can be obtained by capturing a corrected object of a known size, and then using the preparation step, the advancing step and the image capturing step to analyze the pixel size occupied by the corrected object, thereby obtaining each The actual size represented by the prime number is plotted and the correction value is derived.

在此,應注意的是,當正向推力過大,會使該等粗糙部與該光學玻璃平板114的接觸點產生塑性變形,而使得接觸點的尖峰被壓潰,進而導致量測的接觸面積接近於該粗糙部 的全面積而使量測結果失真,因此,較佳地,該正向力應為不大於該待測物2產生塑性變形的作用力。Here, it should be noted that when the forward thrust is too large, the contact points of the rough portions with the optical glass plate 114 are plastically deformed, so that the peak of the contact point is crushed, thereby causing the measured contact area. Close to the roughness The entire area is distorted by the measurement result. Therefore, preferably, the positive force should be a force not greater than the plastic deformation of the object 2 to be tested.

在本較佳實施例中,還可控制不同的正向推力,利用該負荷計146準確量測該擠壓單元141所施加的動態負荷,並使用該渦電流位移計147監控起始擠壓位置,精準的量測到擠壓時的單位時間位移變化量,而推斷出擠壓速度,不僅可以控制該待測物2緩慢接近該光學玻璃平板114,避免衝撞效應產生,更可藉此不同的正向推力獲得不同的實際接觸面積,再使用統計法及curve fitting法進而獲得正向推力與實際接觸面積之關係式。In the preferred embodiment, different forward thrusts can also be controlled, the dynamic load applied by the pressing unit 141 is accurately measured by the load meter 146, and the initial crushing position is monitored using the eddy current displacement meter 147. Accurately measuring the amount of change in displacement per unit time during extrusion, and inferring the extrusion speed, not only can control the object to be tested 2 to slowly approach the optical glass plate 114, thereby avoiding the collision effect, and thereby different The positive thrust obtains different actual contact areas, and then the statistical method and the curve fitting method are used to obtain the relationship between the forward thrust and the actual contact area.

綜上所述,本發明以光學量測實際接觸面積之方法藉由一正向推力,讓待測物2的粗糙部與該光學玻璃平板114逐漸接觸,並控制該正向推力,在正向推力不大於粗糙部產生塑性變形的條件下,即可量測該粗糙部與該光學玻璃平板114的接觸面積;量測方法簡單,不僅金屬材料,非金屬材料亦可使用,且在該量測過程中不需破壞待測物2,進而降低量測成本及改善量測之可重複性。另外,亦可於量測時同時得到該粗糙部的實際分佈情形故確實能達成本發明之目的。In summary, the present invention uses a positive thrust to gradually contact the rough portion of the object 2 with the optical glass plate 114 by a method of optically measuring the actual contact area, and controls the forward thrust in the forward direction. The contact area of the rough portion and the optical glass plate 114 can be measured under the condition that the thrust is not greater than the plastic deformation of the rough portion; the measuring method is simple, and not only the metal material but also the non-metal material can be used, and the measurement is performed. There is no need to destroy the test object 2 during the process, thereby reducing the measurement cost and improving the repeatability of the measurement. In addition, the actual distribution of the roughness can be obtained simultaneously at the time of measurement, so that the object of the present invention can be achieved.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent.

1‧‧‧光學量測系統1‧‧‧Optical measurement system

11‧‧‧光學顯微鏡11‧‧‧Light microscope

111‧‧‧置物台111‧‧‧Stores

112‧‧‧觀測物鏡112‧‧‧ Observation objective

113‧‧‧固定部113‧‧‧ fixed department

114‧‧‧光學玻璃平板114‧‧‧Optical glass plate

12‧‧‧光源裝置12‧‧‧Light source device

121‧‧‧光源121‧‧‧Light source

122‧‧‧偏極鏡122‧‧‧polar mirror

123‧‧‧空間濾波器123‧‧‧ Spatial Filter

124‧‧‧透鏡組124‧‧‧ lens group

125‧‧‧光纖軟管125‧‧‧Fiber hose

13‧‧‧影像擷取裝置13‧‧‧Image capture device

131‧‧‧高速攝影機131‧‧‧High speed camera

14‧‧‧推進裝置14‧‧‧Protection device

141‧‧‧擠壓單元141‧‧‧Extrusion unit

142‧‧‧量測單元142‧‧‧Measurement unit

143‧‧‧槓桿143‧‧‧Leverage

144‧‧‧載重部144‧‧‧Loading Department

145‧‧‧支點145‧‧ fulcrum

146‧‧‧負荷計146‧‧‧ load meter

147‧‧‧渦電流位移計147‧‧‧ eddy current displacement meter

15‧‧‧影像數據處理裝置15‧‧‧Image data processing device

2‧‧‧待測物2‧‧‧Test object

51‧‧‧步驟51‧‧‧Steps

52‧‧‧步驟52‧‧‧Steps

53‧‧‧步驟53‧‧‧Steps

54‧‧‧步驟54‧‧‧Steps

圖1是一示意圖,說明一表面具有複數個粗糙部的物體;圖2是一示意圖,說明本發明以光學系統量測實際接觸面積之方法中的一光學量測系統;及圖3是一流程圖,說明實施本發明以光學系統量測實際接觸面積之方法的一較佳實施例。1 is a schematic view showing an object having a plurality of rough portions on a surface; FIG. 2 is a schematic view showing an optical measuring system in the method for measuring an actual contact area by an optical system of the present invention; and FIG. 3 is a flow BRIEF DESCRIPTION OF THE DRAWINGS A preferred embodiment of a method of measuring an actual contact area by an optical system in accordance with the present invention is illustrated.

步驟51‧‧‧準備一具有粗糙表面的待測物,將該粗糙表面朝向觀測物鏡方向,置放於載物台上,並將該光學玻璃平板設置於該光學顯微鏡與該待測物之間Step 51‧‧‧ Prepare a test object having a rough surface, place the rough surface toward the objective lens, place it on the stage, and place the optical glass plate between the optical microscope and the object to be tested

步驟52‧‧‧由一推進裝置自該載物台下方施加一垂直於該載物台的正向推力,使該載物台向該觀測物鏡方向靠近,至該待測物的表面粗糙部實際接觸該光學玻璃平板,且該正向推力為不大於使該粗糙部產生塑性變形Step 52‧‧‧ A positive thrust perpendicular to the stage is applied from the underside of the stage by a propulsion device to bring the stage closer to the objective lens to the surface roughness of the object to be tested Contacting the optical glass plate, and the forward thrust is not greater than plastically deforming the roughness

步驟53‧‧‧以影像擷取裝置自該光學顯微鏡之觀測物鏡擷取該待測物與該光學玻璃平板接觸停止後實際接觸的圖像Step 53 ‧ ‧ an image capturing device picks up an image of the object to be tested from the observation lens of the optical microscope and contacts the optical glass plate to stop contact

步驟54‧‧‧以影像數據處理裝置自該影像擷取裝置擷取的圖像中,計算該實際接觸區所佔的畫素數,該畫素數再乘以每單位畫素數之校正數值,即可求得該待測物的粗糙表面實質接觸該光學玻璃平板時的接觸面積,其中,該校正數值可由拍攝一已知尺寸的校正物體,再以再以該準備步驟、該推進步驟及該影像擷取步驟,分析該校正物體所佔的畫素數大小,即可從而得知每個畫素數所代表之實際尺寸,並推算出該校正數值Step 54‧‧‧ Calculate the number of pixels occupied by the actual contact area from the image captured by the image capturing device by the image data processing device, and multiply the number of pixels by the corrected value of the prime number per unit pixel The contact area of the rough surface of the object to be tested substantially in contact with the optical glass plate can be obtained, wherein the correction value can be obtained by taking a correction object of a known size, and then using the preparation step, the step of advancing and The image capturing step analyzes the size of the pixel occupied by the corrected object, thereby obtaining the actual size represented by each pixel number, and deducing the corrected value.

Claims (4)

一種以光學系統量測實際接觸面積之方法,可用來量測並計算一個具有粗糙表面的待測物其表面粗糙部的實際面積,該方法包含:一準備步驟,將該待測物置放於一光學顯微鏡的載物台上,並將一光學玻璃平板設置於該光學顯微鏡與該待測物之間,並將該待測物粗糙表面朝向該光學玻璃平板方向;一推進步驟,由一推進裝置自該載物台下方施加一垂直於該載物台的正向推力,使該載物台向該光學顯微鏡觀測物鏡方向靠近,至該待測物的表面粗糙部實際接觸該光學玻璃平板,且該正向推力為不大於使該粗糙部產生塑性變形;一影像擷取步驟,以一影像擷取裝置自該光學顯微鏡之觀測物鏡擷取該待測物與該光學玻璃平板接觸停止後之一實際接觸的圖像;及一數據處理步驟,以一影像數據處理裝置自該影像擷取裝置擷取的圖像中,計算該實際接觸區所佔的畫素數,該畫素數再乘以每單位畫素數之校正數值,即可求得該待測物的粗糙表面實質接觸該光學玻璃平板時的接觸面積,其中,該校正數值可由拍攝一已知尺寸的校正物體,再以該準備步驟、該推進步驟及該影像擷取步驟,分析該校正物體所佔的畫素數大小,即可從而得知每個畫素數所代表之實際尺寸,並推算出該校正數值。 A method for measuring an actual contact area by an optical system, which can be used for measuring and calculating a real area of a rough surface of a test object having a rough surface, the method comprising: a preparation step of placing the test object in a An optical microscope plate is disposed between the optical microscope and the object to be tested, and the rough surface of the object to be tested is oriented toward the optical glass plate; a propulsion step is performed by a propulsion device Applying a positive thrust perpendicular to the stage from below the stage, causing the stage to approach the objective lens of the optical microscope, until the surface roughness of the object to be tested actually contacts the optical glass plate, and The forward thrust is not greater than plastic deformation of the rough portion; an image capturing step is performed by an image capturing device that picks up the object to be tested from the optical microscope and stops the contact with the optical glass plate. An image of the actual contact area; and a data processing step of calculating an actual contact area by an image data processing device from the image captured by the image capturing device The prime number is obtained by multiplying the prime number by the correction value per unit of the prime number, and the contact area of the rough surface of the object to be tested substantially in contact with the optical glass plate can be obtained, wherein the correction value can be taken by shooting The correction object of a known size is further analyzed by the preparation step, the advancing step and the image capturing step to analyze the pixel size occupied by the corrected object, thereby obtaining the actual size represented by each pixel number. And calculate the correction value. 依據申請專利範圍第1項所述以光學系統量測實際接觸面積之方法,其中,該影像擷取裝置具有一光源,可選自白光或氦-氖雷射。 The method for measuring an actual contact area by an optical system according to the first aspect of the patent application, wherein the image capturing device has a light source selected from a white light or a krypton-helium laser. 依據申請專利範圍第1項所述以光學系統量測實際接觸面積之方法,其中,該推進裝置是以槓桿方式施加正向推力,在槓桿一端放置荷重,而迫使被測物件向該光學玻璃平板擠壓。 A method for measuring an actual contact area by an optical system according to the first aspect of the patent application, wherein the propulsion device applies a forward thrust in a lever manner, and places a load on one end of the lever to force the object to be tested to the optical glass plate. extrusion. 依據申請專利範圍第3項所述以光學系統量測實際接觸面積的之方法,其中,該槓桿施加荷重端與該待測物受力端之桿長比為5:1,且該待測物載物台設置有一施力方向垂直於該光學玻璃平板之負荷計。 A method for measuring an actual contact area by an optical system according to the third aspect of the patent application, wherein a ratio of a rod end of the lever application load end to a force end of the object to be tested is 5:1, and the object to be tested The stage is provided with a load meter whose direction of force is perpendicular to the optical glass plate.
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