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TW201315549A - Rolled copper foil - Google Patents

Rolled copper foil Download PDF

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Publication number
TW201315549A
TW201315549A TW101132232A TW101132232A TW201315549A TW 201315549 A TW201315549 A TW 201315549A TW 101132232 A TW101132232 A TW 101132232A TW 101132232 A TW101132232 A TW 101132232A TW 201315549 A TW201315549 A TW 201315549A
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Taiwan
Prior art keywords
copper foil
rolling
final
cold rolling
rolled copper
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TW101132232A
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Chinese (zh)
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TWI462787B (en
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Kaichiro Nakamuro
Yoshihiro Chiba
Mitsuhiro Ookubo
Daisuke Samejima
Kazuki Kammuri
Kazutaka AOSHIMA
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Jx Nippon Mining & Metals Corp
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Publication of TW201315549A publication Critical patent/TW201315549A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B1/00Metal-rolling methods or mills for making semi-finished products of solid or profiled cross-section; Sequence of operations in milling trains; Layout of rolling-mill plant, e.g. grouping of stands; Succession of passes or of sectional pass alternations
    • B21B1/40Metal-rolling methods or mills for making semi-finished products of solid or profiled cross-section; Sequence of operations in milling trains; Layout of rolling-mill plant, e.g. grouping of stands; Succession of passes or of sectional pass alternations for rolling foils which present special problems, e.g. because of thinness
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/08Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B3/00Rolling materials of special alloys so far as the composition of the alloy requires or permits special rolling methods or sequences ; Rolling of aluminium, copper, zinc or other non-ferrous metals
    • B21B2003/005Copper or its alloys

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Metal Rolling (AREA)

Abstract

To provide a rolled copper foil for which ease of handling is improved by moderately roughening the surface of the copper foil, and which has excellent flexibility and good surface etching characteristics. For this rolled copper foil: in a state in which the rolled copper foil has a 60 DEG gloss (G60RD) at the surface, as measured parallel to the rolling direction, of 100 to 300, and is thermally refined to a recrystallized structure by heating for 30 minutes at 200 DEG C, the (200) plane diffraction intensity, obtained according to X-ray diffraction of the rolled surface, with respect to the (200) plane diffraction intensity (I0) obtained by X-ray diffraction of fine copper powder is 20 <= I/I0 <= 40; on three straight lines that are 175 mum long in the direction parallel to the rolling direction, and are at least 50 mum apart from each other in a direction perpendicular to the rolling direction, at the surface of the copper foil, the ratio (d/t) of the average value (d) of the difference between the minimum height and the maximum height of each straight line in the thickness direction, which corresponds to the maximum depth of an oil pit, and the thickness (t) of the copper foil, is not more than 0.1; and the ratio (G60RD/G60TD) between the 60 DEG gloss (G60RD) at the surface, as measured parallel to the rolling direction, and a 60 DEG gloss (G60TD) at the surface, as measured perpendicular to the rolling direction, is less than 0.8.

Description

壓延銅箔 Calendered copper foil

本發明係關於一種可較佳地使用於要求彎曲性之FPC之壓延銅箔。 The present invention relates to a rolled copper foil which can be preferably used for FPC requiring flexibility.

用於彎曲用FPC(可撓性印刷電路基板)之銅箔要求高彎曲性。用以對銅箔賦予彎曲性之方法,眾所周知有提高銅箔壓延面之(200)面之結晶方位的取向度技術(專利文獻1)、使貫通銅箔板厚方向之晶粒比例增多之技術(專利文獻2)、將銅箔之相當於油坑(oil pit)深度之表面粗糙度Ry(最大高度)降低至2.0μm以下之技術(專利文獻3)。 Copper foil for FPC (flexible printed circuit board) for bending requires high flexibility. A method for imparting flexibility to a copper foil by a method of improving the crystal orientation of the (200) plane of the rolled surface of the copper foil (Patent Document 1) and a technique for increasing the crystal grain ratio in the thickness direction of the copper foil (Patent Document 2) A technique in which the surface roughness Ry (maximum height) corresponding to the depth of the oil pit of the copper foil is reduced to 2.0 μm or less (Patent Document 3).

通常之FPC製造步驟係如以下所示。首先,將銅箔與樹脂膜接合。接合方法有藉由對塗佈於銅箔上之清漆施加熱處理而使其醯亞胺化之方法、或使附有接著劑之樹脂膜與銅箔疊合而進行積層之方法。藉由該等步驟而接合之附有樹脂膜之銅箔稱作CCL(覆銅積層板)。藉由該CCL製造步驟中之熱處理,而使銅箔再結晶。 The usual FPC manufacturing steps are as follows. First, a copper foil is bonded to a resin film. The joining method includes a method of imidating ytterbium by applying heat treatment to a varnish applied to a copper foil, or a method of laminating a resin film with an adhesive attached to a copper foil. The copper foil with a resin film joined by these steps is called CCL (Copper Cladding Laminate). The copper foil is recrystallized by the heat treatment in the CCL manufacturing step.

然而,於使用銅箔製造FPC時,若為了提高與被覆膜之密合性而蝕刻銅箔表面,則於表面產生直徑數10μm左右之凹陷(碟型下陷),特別是容易產生高彎曲銅箔。認為其原因在於,為了賦予高彎曲性,以再結晶退火後立方體組織擴展之方式控制銅箔之結晶方位。即,認為其係因為:即便進行了上述之控制,所有的結晶方位也不會一致,於均勻之組織中局部地存在結晶方位不同的晶粒。此時,因 為被蝕刻之結晶面其蝕刻速度不同,該晶粒於局部被蝕刻地較周圍較深,而產生凹陷。該凹陷成為使電路之蝕刻性下降、於檢查外觀時判定為不良並使良率下降的原因。 However, when FPC is produced using a copper foil, if the surface of the copper foil is etched in order to improve the adhesion to the coating film, a depression having a diameter of about 10 μm is formed on the surface (disc type sinking), and in particular, high bending copper is likely to be generated. Foil. The reason for this is considered to be that the crystal orientation of the copper foil is controlled so as to expand the cubic structure after recrystallization annealing in order to impart high flexibility. In other words, it is considered that even if the above control is performed, all the crystal orientations do not coincide, and crystal grains having different crystal orientations are locally present in the uniform structure. At this time, because The etch rate is different for the crystal face to be etched, and the grain is partially etched to be deeper than the periphery to cause a depression. This depression is a cause of lowering the etching property of the circuit, determining that the appearance is poor when the appearance is inspected, and lowering the yield.

又,根據蝕刻液,而有立方體組織與隨機組織相比其蝕刻速度變快之情形及蝕刻速度變慢之情形。因此,當再結晶退火後之立方體組織過度擴展,若此立方體組織之蝕刻速度變慢,則生產性降低,或電路形成時於電路間殘存銅而使蝕刻性劣化。另一方面,若此立方體組織之蝕刻速度變快,則變得容易被蝕刻至電路部,蝕刻性勢必劣化。 Further, depending on the etching liquid, there is a case where the etching speed of the cubic structure is faster than that of the random structure and the etching rate is slow. Therefore, when the cubic structure after the recrystallization annealing is excessively expanded, if the etching speed of the cubic structure is slow, the productivity is lowered, or copper remains between the circuits at the time of circuit formation, and the etching property is deteriorated. On the other hand, if the etching speed of the cubic structure becomes fast, it becomes easy to be etched to the circuit portion, and the etching property tends to deteriorate.

減少上述凹陷之方法,報告有如下之技術(專利文獻4):於壓延前或壓延後,對銅箔表面進行機械研磨以賦予成為加工變質層之應變後,進行再結晶。若根據該技術,藉由加工變質層而於再結晶後使不均勻之晶粒成簇於表面,使得結晶方位不同之晶粒不會單獨地存在。 In the method of reducing the above-described depression, there is reported the following technique (Patent Document 4): before the rolling or after rolling, the surface of the copper foil is mechanically polished to impart strain to the work-affected layer, and then recrystallized. According to this technique, by processing the metamorphic layer, the uneven crystal grains are clustered on the surface after recrystallization, so that crystal grains having different crystal orientations are not separately present.

[專利文獻1]日本專利第3009383號公報 [Patent Document 1] Japanese Patent No. 3009383

[專利文獻2]日本特開2006-117977號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2006-117977

[專利文獻3]日本特開2001-058203號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2001-058203

[專利文獻4]日本特開2009-280855號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2009-280855

然而,於專利文獻4記載之技術之情形時,存在因不均勻之晶粒較多,銅箔表面之結晶未取向於(100)面,故彎曲性降低之問題。 However, in the case of the technique described in Patent Document 4, there are many problems in that the crystal grains on the surface of the copper foil are not oriented on the (100) plane because the crystal grains are not uniform, and the bendability is lowered.

另一方面,明白了:雖然為確保銅箔於製造時與輥之密合性,或者使銅箔製品之操作變得容易,而進行將最終 冷壓延時之輥粗糙度增大從而使銅箔表面變得粗糙之處理,但若使銅箔表面變得粗糙,則銅箔表面之結晶之取向度降低,導致彎曲性變差或者容易產生碟型下陷。 On the other hand, it is understood that although it is necessary to ensure the adhesion of the copper foil to the roll at the time of manufacture, or to facilitate the operation of the copper foil product, the finalization will be carried out. The cold rolling delay increases the roughness of the roll to roughen the surface of the copper foil. However, if the surface of the copper foil is roughened, the degree of orientation of the crystal on the surface of the copper foil is lowered, resulting in poor bendability or easy to produce a dish. Type subsidence.

即,本發明係為解決上述問題而完成者,其目的在於提供一種使銅箔表面適度地變得粗糙而提高操作性,進一步彎曲性優異,並且表面蝕刻特性良好之壓延銅箔。 In other words, the present invention has been made to solve the above problems, and an object of the invention is to provide a rolled copper foil which has a surface roughness of a copper foil which is moderately roughened to improve workability, is further excellent in flexibility, and has excellent surface etching characteristics.

本發明人等經過各種研討,結果發現:於最終冷壓延之最終道次之前,不使銅箔之表面變得粗糙,而於最終冷壓延之最終道次中,使銅箔之表面變得粗糙,藉此,可使最終之銅箔表面變得粗糙,並使剪切變形帶變少,且可維持彎曲性,碟型下陷亦較少,且蝕刻液所導致的蝕刻速度差異變小,因此成為蝕刻性優異銅箔。 The inventors of the present invention have conducted various studies and found that the surface of the copper foil is not roughened before the final pass of the final cold rolling, and the surface of the copper foil is roughened in the final pass of the final cold rolling. Thereby, the surface of the final copper foil can be roughened, the shear deformation zone can be reduced, the bendability can be maintained, the dish shape is less depressed, and the difference in etching speed caused by the etching liquid becomes small, so It is an excellent copper foil for etching.

為達成上述之目的,本發明之壓延銅箔於壓延平行方向測得之表面之根據JIS-Z8741的60度光澤度G60RD為100以上300以下,於200℃加熱30分鐘而調質為再結晶組織之狀態下,由壓延面之X射線繞射求得之200繞射強度(I)相對於由微粉末銅之X射線繞射求得之200繞射強度(I0)為20≦I/I0≦40,在銅箔表面於壓延平行方向長度為175μm,且於壓延直角方向分別相隔50μm以上之3條直線上,相當於油坑最大深度之各直線之厚度方向的最大高度與最小高度之差的平均值d與上述銅箔之厚度t之比率d/t為0.1以下,於壓延平行方向測得之表面之60度光澤度G60RD與於壓延直角方向測得之表面之根據JIS-Z8741的60度光澤度G60TD之比率G60RD/G60TD未達0.8。 In order to achieve the above object, the rolled copper foil of the present invention has a 60-degree gloss G60 RD of 100 or more and 300 or less according to JIS-Z8741, and is heated at 200 ° C for 30 minutes to be recrystallized. In the state of the structure, the diffraction intensity (I) of 200 obtained by X-ray diffraction of the calendering surface is 20 ≦I/ with respect to the diffraction intensity (I 0 ) of X-ray diffraction by the micro-powder copper. I 0 ≦40, the length of the copper foil in the direction parallel to the rolling parallel direction is 175 μm, and on the three straight lines separated by 50 μm or more in the direction perpendicular to the rolling direction, the maximum height and the minimum height in the thickness direction of each straight line corresponding to the maximum depth of the oil pit The ratio d/t of the average value d of the difference to the thickness t of the copper foil is 0.1 or less, and the 60 degree gloss G60 RD of the surface measured in the parallel direction of rolling and the surface measured in the direction perpendicular to the rolling direction are based on JIS- The ratio of 60 degree gloss G60 TD of Z8741 G60 RD /G60 TD is less than 0.8.

上述200℃×30分鐘熱處理後之銅箔表面於電解研磨後利用EBSD進行觀察時,較佳為壓延面之結晶方位與[100]方位之角度差在15度以上之晶粒的面積率為30~70%。 When the surface of the copper foil after the heat treatment at 200 ° C for 30 minutes is observed by EBSD after electrolytic polishing, it is preferable that the area ratio of the crystal grain of the rolling surface to the angle of [100] is 15 degrees or more. ~70%.

將鑄塊於熱壓延後,反覆進行冷壓延與退火,最後進行最終冷壓延而製造,於該最終冷壓延步驟中,較佳為於最終道次之前1道次的階段,於壓延平行方向測得之表面之60度光澤度G60RD超過300。 After the ingot is hot rolled, it is repeatedly subjected to cold rolling and annealing, and finally to final cold rolling. In the final cold rolling step, preferably in the first pass before the final pass, in the parallel direction of rolling. The measured 60 degree gloss of the surface G60 RD exceeded 300.

根據本發明,可獲得使銅箔表面適度地變得粗糙而提高操作性,彎曲性優異,且表面蝕刻特性良好之壓延銅箔。 According to the present invention, it is possible to obtain a rolled copper foil in which the surface of the copper foil is appropriately roughened to improve workability, excellent in flexibility, and excellent in surface etching characteristics.

以下,對本發明之實施形態之壓延銅箔進行說明。再者,於本發明中所謂%只要未特別限定則表示質量%。 Hereinafter, the rolled copper foil according to the embodiment of the present invention will be described. In addition, in the present invention, the % means a mass % unless otherwise specified.

首先,對本發明之技術思想進行說明。若使最終冷壓延中之輥粗糙度變大,使銅箔表面變得粗糙,則雖然銅箔之操作性提高,但變得易產生碟型下陷,蝕刻性降低。可認為其原因在於,藉由最終冷壓延中粗糙之輥,而於銅箔之厚度方向產生剪切變形帶,進而持續進行壓延,剪切變形帶擴長。 First, the technical idea of the present invention will be described. When the roughness of the roll in the final cold rolling is increased and the surface of the copper foil is roughened, the handleability of the copper foil is improved, but the dishing is liable to occur, and the etching property is lowered. The reason for this is considered to be that a shear deformation band is generated in the thickness direction of the copper foil by finally cold rolling the rough roll, and the rolling deformation is continued, and the shear deformation band is elongated.

另一方面,為獲得銅箔之彎曲性而提高光澤度(表面粗糙度)之方法自先前已為眾所周知。可認為此方法在於藉由利用粗糙度低之輥進行最終冷壓延,而使剪切變形帶不易於銅箔之厚度方向產生。然而,若提高銅箔之光澤度(使表面粗糙度變小),則銅箔之操作性降低。 On the other hand, a method of improving the gloss (surface roughness) in order to obtain the bendability of the copper foil has been known from the prior art. It is considered that this method consists in that the final cold rolling is performed by using a roll having a low roughness, so that the shear deformation band is not easily generated in the thickness direction of the copper foil. However, if the gloss of the copper foil is increased (the surface roughness is made small), the handleability of the copper foil is lowered.

相對於此,本發明人發現可藉由於最終冷壓延之最終 道次之前不使銅箔之表面變得粗糙(例如,利用粗糙度低之輥進行壓延),且於最終冷壓延之最終道次使銅箔之表面變得粗糙(例如,利用粗糙之輥進行壓延),而使最終之銅箔之表面變得粗糙,並且減少剪切變形帶,且使彎曲性提高,表面蝕刻特性變得良好。 In contrast, the inventors discovered that the final cold rolling can be achieved. The surface of the copper foil is not roughened before the pass (for example, rolling with a roll having a low roughness), and the surface of the copper foil is roughened in the final pass of the final cold rolling (for example, using a rough roll) Calendering), the surface of the final copper foil is roughened, and the shear deformation zone is reduced, and the bendability is improved, and the surface etching property is improved.

即,先前係認為銅箔之取向性單純依存於銅箔表面之粗糙度,但實際可知材料內部之剪切變形帶之規模會對蝕刻性及取向度(及碟型下陷)產生影響。而且,於最終冷壓延中,若於最終道次以前之道次中可充分地抑制剪切帶之擴展,則即便於最終道次中將銅箔表面精加工成較為粗糙,亦可獲得使蝕刻性良好之取向度。 That is, it has been previously considered that the orientation of the copper foil is purely dependent on the roughness of the surface of the copper foil, but it is actually known that the scale of the shear deformation zone inside the material affects the etching property and the degree of orientation (and dishing). Moreover, in the final cold rolling, if the expansion of the shear band can be sufficiently suppressed in the pass before the final pass, even if the surface of the copper foil is finished to be rough in the final pass, etching can be obtained. Good degree of orientation.

然而,上述剪切帶之擴展度無法僅由先前一直使用之光澤度值明確地得知。即,可認為若使最終銅箔之表面變得粗糙,並減少剪切變形帶,則油坑較淺且具有某種程度之寬度,進而油坑之產生頻率變少(參照圖1(a)),其係難以於與油坑方向垂直之壓延平行方向RD之光澤度中表現。另一方面,若自壓延直角方向TD觀察,則油坑具有某程度之寬度,故而,相較於平行方向,易得知油坑之形狀或頻率之變化。 However, the degree of expansion of the above shear band cannot be clearly known only from the gloss value that has been used before. That is, it is considered that if the surface of the final copper foil is roughened and the shear deformation zone is reduced, the oil pit is shallow and has a certain width, and the frequency of occurrence of the oil pit is reduced (refer to Fig. 1 (a) It is difficult to express in the gloss of the rolling parallel direction RD perpendicular to the sump direction. On the other hand, if the crater has a certain width from the TD in the right angle direction, it is easy to know the change in the shape or frequency of the sump compared to the parallel direction.

參照圖1而對上述油坑與光澤度之關係進行說明。 The relationship between the above oil pit and glossiness will be described with reference to Fig. 1 .

首先,圖1(a)係表示本發明例之油坑與光澤度之關係之圖,若沿著壓延平行方向RD測定光澤度GRD,則於油坑中反射光之方向產生改變而未被檢測出,光澤度降低。另一方面,於沿著壓延直角方向TD測定光澤度GTD之情形 時,由於油坑延著TD延伸,因此於油坑中即便反射光之方向朝橫向(RD方向)偏移仍可被檢測出,光澤度提高。亦即,與GRD相比,GTD相對地提高,若測定後述之60度光澤度,則滿足G60RD/G60TD<0.8之關係。 First, Fig. 1(a) is a view showing the relationship between the oil sump and the glossiness of the example of the present invention. If the gloss G RD is measured along the rolling parallel direction RD , the direction of the reflected light in the oil sump is changed without being It was detected that the gloss was lowered. On the other hand, when the gloss G TD is measured along the right angle direction TD, since the oil sump extends along the TD, even if the direction of the reflected light is shifted toward the lateral direction (RD direction) in the sump, it can be detected. Out, the gloss is improved. That is, G TD is relatively higher than G RD , and when 60 degree gloss is described later, the relationship of G60 RD /G60 TD <0.8 is satisfied.

接著,圖1(b)係表示銅箔表面粗糙之情形的先前例之油坑與光澤度之關係之圖,銅箔表面變得過度粗糙,油坑之深度與長度(產生頻率)增加,即便延著壓延平行方向RD及壓延直角方向TD之任一方向來測定光澤度,於油坑中亦因反射光之方向產生改變而未能被檢測出,光澤度降低。於此情形時,與GRD相比,GTD相對地變低,若測定後述之60度光澤度,則滿足G60RD/G60TD>1之關係。 Next, Fig. 1(b) is a view showing the relationship between the oil pit and the glossiness of the prior art in the case where the surface of the copper foil is rough, the surface of the copper foil becomes excessively rough, and the depth and length (generation frequency) of the oil pit are increased even if The gloss was measured in either of the rolling parallel direction RD and the rolling orthogonal direction TD, and the oil crater was not detected due to the change in the direction of the reflected light, and the gloss was lowered. In this case, G TD is relatively lower than G RD , and when the 60-degree glossiness described later is measured, the relationship of G60 RD /G60 TD >1 is satisfied.

另一方面,圖1(c)係表示銅箔表面平滑之情形的先前例之油坑與光澤度之關係之圖,由於銅箔表面變得過於平滑,油坑變得過淺,故即便沿著壓延平行方向RD測定光澤度GRD,於油坑中亦因反射光之方向變得不易改變,光澤度提高。即,與GTD相比,GRD相對地變高,故若測定後述之60度光澤度,則G60RD/G60TD之關係接近1(即,RD與TD之異向性變小)。然而,如銅箔表面粗糙之情形的先前例圖1(b)所示,由於銅箔表面並不粗糙,故而成為G60RD/G60TD<1。 On the other hand, Fig. 1(c) is a view showing the relationship between the oil pit and the glossiness of the prior art in the case where the surface of the copper foil is smooth, since the surface of the copper foil becomes too smooth, the oil pit becomes too shallow, so even along the parallel with the rolling direction RD RD G gloss was measured, also because the pit in the direction of the reflected light oil that it becomes easy to change, enhance gloss. In other words, G RD is relatively higher than G TD . Therefore, when the 60-degree gloss degree described later is measured, the relationship of G60 RD /G60 TD is close to 1 (that is, the anisotropy of RD and TD becomes small). However, as shown in Fig. 1(b) of the previous example in which the surface of the copper foil is rough, since the surface of the copper foil is not rough, G60 RD / G60 TD <1 is obtained.

接著,對本發明之壓延銅箔之規定及組成進行說明。 Next, the specification and composition of the rolled copper foil of the present invention will be described.

(1)光澤度G60RD (1) Gloss G60 RD

使於壓延平行方向RD測得之表面之60°光澤度G60RD為100以上300以下。若G60RD超過300,則銅箔表面變得 過於平滑而銅箔之製造時之與輥之密合性降低,或者銅箔製品之操作具有難度。另一方面,若G60RD成為未達100,則銅箔表面變得過於粗糙,於材料內部,剪切變形帶擴展而變得易產生碟型下陷,蝕刻性下降。 The 60° gloss G60 RD of the surface measured in the rolling parallel direction RD is 100 or more and 300 or less. When the G60 RD exceeds 300, the surface of the copper foil becomes too smooth, and the adhesion to the roll at the time of manufacture of the copper foil is lowered, or the operation of the copper foil product is difficult. On the other hand, when the G60 RD is less than 100, the surface of the copper foil becomes too rough, and the shear deformation band spreads inside the material, which tends to cause dishing, and the etching property is lowered.

(2)G60RD/G60TD (2) G60 RD / G60 TD

如上所述,藉由於最終冷壓延之最終道次之前,不使銅箔之表面變得粗糙,且於最終冷壓延之最終道次中使銅箔之表面變得粗糙,而使最終銅箔之表面變粗,並且減少剪切變形帶,且維持彎曲性,碟型下陷減少。而且,藉由本發明人等之實驗(後述之實施例)而獲悉如此之剪切變形帶較少之表面成為G60RD/G60TD<0.8。因此,將於壓延平行方向測得之表面之60°光澤度G60RD與於壓延直角方向測得之表面之60°光澤度G60TD之比率G60RD/G60TD規定為未達0.8。再者,採用比率係為了抵消整體之光澤度之影響。 As described above, the surface of the copper foil is not roughened by the final pass of the final cold rolling, and the surface of the copper foil is roughened in the final pass of the final cold rolling, so that the final copper foil is The surface becomes thicker, and the shear deformation zone is reduced, and the bending property is maintained, and the dish type is reduced. Further, it has been found by the experiment of the present inventors (the examples described later) that the surface having such a small shear deformation band becomes G60 RD /G60 TD <0.8. Therefore, the ratio G60 RD /G60 TD of the 60° gloss G60 RD of the surface measured in the direction of the rolling parallel direction and the 60° gloss G60 TD of the surface measured in the direction perpendicular to the rolling direction is set to be less than 0.8. Furthermore, the ratio is used to offset the effects of overall gloss.

若成為G60RD/G60TD≧0.8,則如上述之圖1(b)所述,銅箔表面變得過於平滑,導致銅箔之製造時之與輥的密合性降低,或者銅箔製品之操作有困難。又,若如上述之圖1(c)所述,若成為G60RD/G60TD>1,則銅箔表面變得過於粗糙,導致剪切變形帶擴展,使彎曲性降低,或者變得易產生碟型下陷。 When G60 RD /G60 TD ≧0.8 is used, as described above with reference to Fig. 1(b), the surface of the copper foil becomes too smooth, resulting in a decrease in adhesion to the roll during the production of the copper foil, or a copper foil product. Operation is difficult. Further, as described in FIG. 1(c) above, when G60 RD /G60 TD >1, the surface of the copper foil becomes too rough, and the shear deformation band expands, and the bendability is lowered or becomes easy to occur. The dish is sunken.

再者,達到G60RD/G60TD<0.8之方法係於上述之最終冷壓延中,於最終道次以前之道次抑制剪切帶之擴展,即於最終冷壓延之最終道次以前之道次中,使用粗糙度(表 面粗糙度Ra例如為0.05μm以下)較小之輥進行壓延即可。另一方面,於最終冷壓延之最終道次中,使用粗糙度(表面粗糙度Ra例如為0.06μm以上)較大之輥進行壓延,使最終獲得之銅箔表面變得粗糙即可。 Furthermore, the method of achieving G60 RD /G60 TD <0.8 is in the final cold rolling described above, and the expansion of the shear band is inhibited before the final pass, that is, before the final pass of the final cold rolling. In the meantime, rolling may be performed using a roll having a small roughness (surface roughness Ra, for example, 0.05 μm or less). On the other hand, in the final pass of the final cold rolling, rolling is performed using a roll having a large roughness (surface roughness Ra, for example, 0.06 μm or more), and the surface of the finally obtained copper foil may be roughened.

此處,於最終冷壓延中,若使在最終道次之前1道次之階段於壓延平行方向測得之表面之光澤度G60RD超過300,則最終冷壓延之最終道次以前之道次中,銅箔表面變得相對平滑,剪切變形帶變得不易被導入,故而較佳。 Here, in the final cold rolling, if the gloss G60 RD of the surface measured in the parallel direction of the rolling in the first pass before the final pass exceeds 300, the final pass of the final cold rolling is in the last pass. Since the surface of the copper foil becomes relatively smooth, the shear deformation band becomes difficult to be introduced, which is preferable.

(3)d/t (3)d/t

若銅箔之厚度t變薄,則即便相同之表面粗糙度,銅箔厚度中所占之表面凹凸之比例變大,故存在上述之G60RD/G60TD之銅箔表面之評價無法充分進行之情形。因此,於本發明中,可藉由規定d/t≦0.1,而不依靠銅箔之厚度來進行銅箔表面之評價。 When the thickness t of the copper foil is reduced, even if the same surface roughness is used, the ratio of the surface unevenness in the thickness of the copper foil becomes large, so that the evaluation of the surface of the copper foil of the above-mentioned G60 RD /G60 TD cannot be sufficiently performed. situation. Therefore, in the present invention, the evaluation of the surface of the copper foil can be carried out by specifying d/t ≦ 0.1 without depending on the thickness of the copper foil.

此處,d係如圖2所示在銅箔表面於壓延平行方向RD長度為175μm,且於壓延直角方向TD分別相隔50μm以上之3條直線L1~L3上,相當於油坑之最大深度之各直線L1~L3之厚度方向之最大高度HM與最小高度Hs之差di之平均值。具體而言,利用接觸式粗糙度,測定L1~L3上之厚度方向之分佈,求得最大高度HM與最小高度Hs,且將各直線L1~L3之di加以平均即可。 Here, d is as shown in FIG. 2, and the length of the copper foil in the rolling parallel direction RD is 175 μm, and the straight line direction TD is separated by three lines L 1 to L 3 of 50 μm or more, which corresponds to the maximum of the oil pit. The average of the difference di between the maximum height H M and the minimum height Hs in the thickness direction of each of the straight lines L 1 to L 3 of the depth. Specifically, the distribution in the thickness direction on L 1 to L 3 is measured by the contact roughness, and the maximum height H M and the minimum height Hs are obtained, and the di of the straight lines L 1 to L 3 may be averaged.

銅箔(或銅合金箔)之厚度並不無特別限制,例如可較佳地使用5~50μm者。 The thickness of the copper foil (or copper alloy foil) is not particularly limited, and for example, 5 to 50 μm can be preferably used.

(4)I/I0 (4) I/I 0

為了對本發明之銅箔賦予高彎曲性,於以200℃加熱30分鐘調質為再結晶組織之狀態下,由壓延面之X射線繞射求得之200繞射強度(I),規定為相對於由微粉末銅之X射線繞射求得之200繞射強度(I0)為20≦I/I0≦40。藉此,(200)面之取向度成為適當的值,可得到彎曲性及蝕刻性之平衡優異的銅箔。於此情形時,因為具有(200)面之結晶方位的再結晶織構不會過度擴展,故(200)面以外之方位的組織某程度地分散,因該組織被局部地蝕刻所導致之碟型下陷亦變小。又,為了對本發明之銅箔賦予更高的彎曲性,於以200℃加熱30分鐘調質為再結晶組織之狀態下,較佳為設為25≦I/I0≦40。 In order to impart high flexibility to the copper foil of the present invention, the 200-ray diffraction intensity (I) obtained by X-ray diffraction of the rolling surface is determined to be relative in a state where the copper foil is heated to 200 ° C for 30 minutes to be recrystallized. The diffraction intensity (I 0 ) of 200 obtained by X-ray diffraction of fine powder copper is 20 ≦ I / I 0 ≦ 40. Thereby, the degree of orientation of the (200) plane is an appropriate value, and a copper foil excellent in balance between flexibility and etching property can be obtained. In this case, since the recrystallized texture having the crystal orientation of the (200) plane does not excessively expand, the tissue in the orientation other than the (200) plane is dispersed to some extent, and the disc is partially etched by the tissue. The type of subsidence also becomes smaller. Moreover, in order to impart higher flexibility to the copper foil of the present invention, it is preferably 25 ≦I/I 0 ≦40 in a state where it is heated to 200 ° C for 30 minutes to be a recrystallized structure.

若為I/I0<20,則(200)面之取向度減少,彎曲性下降。若為40<I/I0,則雖然具有(200)面之結晶方位的組織增加而彎曲性變得良好,但(200)面之再結晶織構過度擴展,其結果導致(200)面以外之方位的組織於部分集中生成而使該組織被較激烈蝕刻,從而變得易產生碟型下陷,蝕刻性變差。又,亦會因為於(200)面與該面以外之方位其蝕刻速度有較大地不同而導致蝕刻性下降。 When I/I 0 <20, the degree of orientation of the (200) plane is reduced, and the flexibility is lowered. When 40<I/I 0 , the structure having a crystal orientation of the (200) plane increases, and the bendability is good, but the recrystallization texture of the (200) plane is excessively expanded, and as a result, the (200) plane is caused. The organization of the orientation is generated in a concentrated manner, and the tissue is etched more intensely, so that dishing is easily generated, and etching property is deteriorated. Further, the etching rate is greatly deteriorated because the etching speed is largely different between the (200) plane and the plane other than the surface.

上述200℃ 30分鐘之退火係模仿CCL製造步驟中賦予銅箔之溫度歷程。 The above annealing at 200 ° C for 30 minutes mimics the temperature history of the copper foil imparted in the CCL manufacturing step.

再者,若使銅箔中含有合計30~300wtppm之選自Ag、Sn、In、Au、Pd及Mg之群中之1種或2種以上,則因為易於管理為20≦I/I0≦40故而較理想。 In addition, when the copper foil contains one or two or more selected from the group consisting of Ag, Sn, In, Au, Pd, and Mg in a total amount of 30 to 300 wtppm, it is easy to manage as 20≦I/I 0 ≦ 40 is therefore more ideal.

作為管理為20≦I/I0≦40之方法,例如可:重複進行 冷壓延及退火,於最終退火中使平均結晶粒徑成為10~20μm,之後於對製品之板厚進行壓延時,將總加工度設為90~96%,於最終冷壓延之最終道次以前的道次抑制剪切帶之擴展。於此情形時,於最終冷壓延之最終道次以前之道次中可使用粗糙度相對較小之輥(表面粗糙度Ra例如為0.05μm以下)而進行壓延。 As a method of managing 20 ≦I/I 0 ≦40, for example, cold rolling and annealing may be repeated, and the average crystal grain size may be 10 to 20 μm in the final annealing, and then the thickness of the product may be delayed. The total workability is set to 90 to 96%, and the pass of the passband is inhibited before the final pass of the final cold rolling. In this case, calendering can be carried out using a roll having a relatively small roughness (surface roughness Ra is, for example, 0.05 μm or less) in the pass before the final pass of the final cold rolling.

(5)EBSD之方位差 (5) Azimuth difference of EBSD

如上所述,碟型下陷係:於「因使銅箔與樹脂膜進行接合時之熱處理,而導致於已再結晶之均勻的組織中結晶方位不同之晶粒單獨地存在之比例較多」之情形時,在進行蝕刻時此單獨晶粒與周圍相比被蝕刻地較深而產生之凹陷。因此,作為上述熱處理,係以「模仿CCL製造步驟中賦予銅箔之溫度歷程」之熱處理條件(於200℃、30分鐘)來加熱銅箔而調質為再結晶組織。而且,該狀態之結晶方位,於電解研磨後利用EBSD觀察銅箔表面時,較佳為壓延面之結晶方位與[100]方位之角度差為15度以上之晶粒之面積率為30~70%。 As described above, the dish-type sinking system is used in the case where the copper foil is bonded to the resin film for heat treatment, and the crystal grains having different crystal orientations in the recrystallized uniform structure are present in a relatively large proportion. In the case, the individual crystal grains are etched deeper than the surroundings when etching is performed. Therefore, as the heat treatment, the copper foil is heated to a recrystallized structure by heat treatment conditions (at 200 ° C for 30 minutes) simulating the temperature history of the copper foil in the CCL production step. Further, in the crystal orientation of the state, when the surface of the copper foil is observed by EBSD after electrolytic polishing, it is preferable that the grain area ratio of the crystal orientation of the rolling surface to the [100] orientation is 15 degrees or more, and the area ratio of the crystal grains is 30 to 70. %.

若於以EBSD進行觀察之情形時上述面積率為30~70%,則可得到彎曲性及蝕刻性皆優異之銅箔。若上述面積率未達30%,則有蝕刻性惡化之情形,若超過70%,則有彎曲性下降之情形。再者,於利用EBSD進行觀察之情形時為使上述面積率成為30~70%,較理想為可如上述般於最終冷壓延中使用下述輥來進行壓延,該輥係:在最終道次以前之道次中抑制剪切帶之擴展,即,於最終冷壓延之最 終道次以前之道次中粗糙度(表面粗糙度Ra例如為0.05μm以下)相對較小之輥。又,若使銅箔中含有合計30~300wtppm之選自Ag、Sn、In、Au、Pd及Mg之群中之1種或2種以上,則因為易於將上述面積率管理為30~70%故而較理想。 When the area ratio is 30 to 70% when observed by EBSD, a copper foil excellent in both bendability and etching property can be obtained. When the area ratio is less than 30%, the etching property may be deteriorated, and if it exceeds 70%, the bendability may be lowered. Further, in the case of observation by EBSD, in order to make the area ratio 30 to 70%, it is preferable to carry out calendering using the following rolls in the final cold rolling as described above, in the final pass. In the previous pass, the expansion of the shear band was inhibited, that is, at the end of the final cold rolling A roller having a relatively small roughness (surface roughness Ra, for example, 0.05 μm or less) in the previous pass. In addition, when the copper foil contains one or two or more selected from the group consisting of Ag, Sn, In, Au, Pd, and Mg in a total amount of 30 to 300 wtppm, it is easy to manage the area ratio as 30 to 70%. Therefore, it is ideal.

再者,對於已經歷熱歷程而成為CCL之銅箔,亦可以200℃加熱30分鐘。因經熱處理直至再結晶一次為止之銅箔之組織,即便進一步加熱亦幾乎不會變化,故於以EBSD之觀察時,並不區分接受熱歷程之銅箔與未接受熱歷程之銅箔,均以200℃加熱30分鐘。 Further, the copper foil which has been subjected to the thermal history and becomes CCL may be heated at 200 ° C for 30 minutes. The structure of the copper foil which has been subjected to heat treatment until recrystallization is hardly changed even if it is further heated. Therefore, in the observation of EBSD, the copper foil which receives the heat history and the copper foil which does not receive the heat history are not distinguished. Heat at 200 ° C for 30 minutes.

(6)組成 (6) Composition

銅箔,可使用純度99.9wt%以上之精銅(tough pitch copper)、無氧銅、電氣銅,進而,較理想為含有合計30~300wtppm之選自Ag、Sn、In、Au、Pd及Mg之群中之1種或2種以上。無氧銅係規格設為JIS-H3510(合金編號C1011)及JIS-H3100(合金編號C1020),且精銅係規格設為JIS-H3100(合金編號C1100)。 As the copper foil, a tough pitch copper having a purity of 99.9 wt% or more, oxygen-free copper, and electric copper can be used. Further, it is preferable to contain a total of 30 to 300 wtppm selected from Ag, Sn, In, Au, Pd, and Mg. One or two or more of the group. The oxygen-free copper system specifications are JIS-H3510 (alloy No. C1011) and JIS-H3100 (alloy No. C1020), and the fine copper-based specifications are JIS-H3100 (alloy No. C1100).

接著,對本發明之壓延銅箔之製造方法之一例進行說明。首先,將由銅及必要之合金元素甚至是不可避免之雜質構成之鑄塊熱壓延後,反覆進行冷壓延與退火,最後於最終冷壓延精加工成特定厚度。 Next, an example of a method for producing a rolled copper foil of the present invention will be described. First, the ingot consisting of copper and necessary alloying elements or even unavoidable impurities is hot rolled, then subjected to cold rolling and annealing, and finally to a specific thickness by final cold rolling.

此處,如上所述,藉由於最終冷壓延之最終道次之前,不使銅箔之表面變得較粗糙,且於最終冷壓延之最終道次中使銅箔之表面變得較粗糙,而使最終之銅箔之表面變得 粗糙,並且使剪切變形帶變少,使彎曲性提高,碟型下陷減少。而且,如此之剪切變形帶少的表面成為G60RD/G60TD<0.8。 Here, as described above, the surface of the copper foil is not roughened by the final pass of the final cold rolling, and the surface of the copper foil is roughened in the final pass of the final cold rolling. The surface of the final copper foil is roughened, and the shear deformation zone is reduced, the bendability is improved, and the dish form is reduced. Moreover, the surface with such a small shear deformation band becomes G60 RD /G60 TD <0.8.

因此,於最終冷壓延之最終道次之前,以使銅箔之表面不變得粗糙之方式,使用粗糙度(表面粗糙度Ra例如為0.05μm以下)相對較小之輥進行壓延,或者將最終冷壓延中之1道次加工度變大進行壓延即可。另一方面,於最終冷壓延之最終道次中,使用粗糙度(表面粗糙度Ra例如為0.06μm以上)相對較大之輥進行壓延,或者使用黏度較高之壓延油進行壓延,使最終所得之銅箔表面變得粗糙。 Therefore, before the final pass of the final cold rolling, the surface of the copper foil is not roughened, and the roll having a relatively small roughness (surface roughness Ra, for example, 0.05 μm or less) is used for calendering, or the final The degree of processing in one pass of the cold rolling becomes large and the rolling can be performed. On the other hand, in the final pass of the final cold rolling, a roll having a relatively large roughness (surface roughness Ra, for example, 0.06 μm or more) is used, or a rolling oil having a high viscosity is used for rolling, and the final result is obtained. The surface of the copper foil becomes rough.

再者,為使最終之銅箔之表面變得粗糙,並且使剪切變形帶變少,而必需於最終冷壓延之最終2道次、或最終道次中,使用上述之較粗糙輥,或者使用黏度較高之壓延油進行壓延,但就便於調整之方面而言,較佳為調整最終道次中之壓延條件。另一方面,若自最終冷壓延之最終3道次之前將輥之粗糙度變得粗糙,則剪切變形帶擴展。 Furthermore, in order to roughen the surface of the final copper foil and to reduce the shear deformation zone, it is necessary to use the above-mentioned rougher roller in the final 2 passes of the final cold rolling, or in the final pass, or The calendering oil having a higher viscosity is used for calendering, but in terms of ease of adjustment, it is preferred to adjust the calendering conditions in the final pass. On the other hand, if the roughness of the roll is roughed before the final 3 passes of the final cold rolling, the shear deformation band expands.

再者,以使利用最終冷壓延之前之退火所得之再結晶粒之平均粒徑成為10~20μm之方式,調整退火條件即可。又,將最終冷壓延中之壓延加工度設為92~99%即可。 Further, the annealing conditions may be adjusted so that the average particle diameter of the recrystallized grains obtained by the annealing before the final cold rolling is 10 to 20 μm. Further, the degree of rolling work in the final cold rolling may be 92 to 99%.

[實施例] [Examples]

於電氣銅添加表1所記載之元素,分別於大氣中(實施例1~3、5)及還原環境中(N2及CO之混合氣體)(實施例4、6、7~14)鑄造鑄錠。再者,比較例1~5係於氬環境中鑄造鑄錠。於大氣中鑄造而成者含有氧150~ 300ppm,於還原環境中鑄造而成者含有與無氧銅(C1020)同程度之氧。將製成之鑄錠於800℃以上進行熱壓延直至厚度達到10mm,對表面之氧化皮進行平面切削後,重複進行冷壓延與退火之後,於分別形成為0.24mm(實施例1~12)、0.12mm(實施例13)、0.36mm(實施例14)、1.2mm(比較例1~5)之厚度後進行退火,從而平均結晶粒徑成為13μm。進一步,於最終冷壓延中精加工成厚度0.012mm(實施例1~12、比較例1~5)、0.006mm(實施例13)、0.018mm(實施例14)。再者,實施例1~14之最終冷壓延的加工度成為95%,比較例1~5之最終冷壓延的加工度成為99%。 The elements described in Table 1 were added to the electrical copper, and cast in the atmosphere (Examples 1-3, 5) and the reducing environment (mixed gas of N 2 and CO) (Examples 4, 6, 7 to 14). ingot. Further, Comparative Examples 1 to 5 were cast ingots in an argon atmosphere. Casting in the atmosphere contains oxygen of 150 to 300 ppm, and is cast in a reducing environment containing oxygen of the same degree as oxygen-free copper (C1020). The produced ingot is hot rolled at 800 ° C or higher until the thickness reaches 10 mm, and the surface scale is subjected to planar cutting, and after repeated cold rolling and annealing, it is formed to be 0.24 mm (Examples 1 to 12). After the thicknesses of 0.12 mm (Example 13), 0.36 mm (Example 14), and 1.2 mm (Comparative Examples 1 to 5) were annealed, the average crystal grain size was 13 μm. Further, it was finished into a final thickness of 0.012 mm (Examples 1 to 12, Comparative Examples 1 to 5), 0.006 mm (Example 13), and 0.018 mm (Example 14) in the final cold rolling. Further, the degree of processing of the final cold rolling of Examples 1 to 14 was 95%, and the degree of processing of the final cold rolling of Comparative Examples 1 to 5 was 99%.

再者,最終冷壓延係以5~15道次進行,且如表1所示,改變直至最終道次前之輥之表面粗糙度、及最終道次之輥之表面粗糙度而進行壓延。自最終壓延之第1道次直至最終道次前之輥之表面粗糙度全部相同。 Further, the final cold rolling was carried out in 5 to 15 passes, and as shown in Table 1, the surface roughness of the roll before the final pass and the surface roughness of the roll of the final pass were changed to be calendered. The surface roughness of the rolls from the first pass of the final calendering until the final pass is the same.

對以此方式獲得之各銅箔試樣,進行各特性之評價。 Each of the copper foil samples obtained in this manner was evaluated for each characteristic.

(1)光澤度 (1) Glossiness

分別沿著壓延平行方向RD、及壓延直角方向TD,依據JIS-Z8741,測定銅箔表面之光澤度G60RD、G60TDThe glosses G60 RD and G60 TD of the copper foil surface were measured in accordance with JIS-Z8741 along the rolling parallel direction RD and the rolling orthogonal direction TD, respectively.

(2)立方體集合組織 (2) Cube collection organization

將試樣於200℃加熱30分鐘後,求出由壓延面之X射線繞射求得之200繞射強度之積分值(I)。將該值除以藉由預先測得之微粉末銅(325mesh,於氫氣流中在300℃加熱1小時後使用)之X射線繞射所求得200繞射強度之積分值 (I0),算出I/I0值。 After heating the sample at 200 ° C for 30 minutes, an integral value (I) of the diffraction intensity of 200 obtained by X-ray diffraction of the rolled surface was obtained. The value is divided by the X-ray diffraction of the micro-powder copper (325 mesh, which is used after heating at 300 ° C for 1 hour in a hydrogen stream) to obtain an integral value (I 0 ) of the diffraction intensity of 200. Calculate the I/I 0 value.

(3)油坑之最大深度(平均值d) (3) Maximum depth of the oil pit (average d)

使用接觸式粗糙度計(小阪研究所製造SE-3400),如圖2所示,分別求得在銅箔表面於壓延平行方向RD長度175μm,且於壓延直角方向TD分別求得相隔50μm以上之3根直線L1~L3上之最大高度HM與最小高度HS之差di。將各直線L1~L3之di加以平均作為d。再者,設為d(mm)/t(mm)。 Using a contact-type roughness meter (SE-3400 manufactured by Kosei Research Institute), as shown in Fig. 2, the length of the copper foil surface in the rolling parallel direction RD was 175 μm, and the circumferential direction of the rolling was determined to be 50 μm or more. The difference di between the maximum height H M and the minimum height H S of the three straight lines L 1 to L 3 . The di of each of the straight lines L 1 to L 3 is averaged as d. Furthermore, it is set to d (mm) / t (mm).

(4)EBSD之方位差 (4) Azimuth difference of EBSD

對於(2)中於200℃加熱30分鐘後之試樣表面進行電解研磨後利用EBSD(電子背散射繞射裝置,日本電子股份有限公司JXA8500F、加速電壓20kV、電流2e-8A、測定範圍1000μm×1000μm、階寬5μm)觀察。利用影像分析求得自[100]方位之角度差為15度以上之晶粒之面積率。進而,以目視計量試樣表面1mm見方之觀察範圍內結晶粒徑超過20μm者之個數。 The surface of the sample after heating at 200 ° C for 30 minutes in (2) was subjected to electrolytic polishing using EBSD (Electronic Backscatter Diffraction Device, JEOL 8500F, Acceleration Voltage 20kV, Current 2e-8A, Measurement Range 1000 μm × 1000 μm, step width 5 μm) was observed. The area ratio of the crystal grains having an angular difference of 15 degrees or more from the [100] orientation was obtained by image analysis. Further, the number of crystal grains having a crystal grain size exceeding 20 μm in the observation range of 1 mm square on the surface of the sample was visually measured.

(5)蝕刻性 (5) Etchability

蝕刻性係以如下所示方式進行評價。首先,對試樣表面,使用蝕刻液(分別為ADEKATEC CL-8(ADEKA股份有限公司製造)與DP-200(荏原優吉萊特製造)液)於常溫進行2分鐘蝕刻,將利用光學顯微鏡拍攝蝕刻後之1mm見方之觀察範圍之表面所得之影像明暗二值化,從而算出明暗比例。具有[100]方位之組織由於成為與銅箔表面平行之面故會觀察到較亮,於其他方位由於在表面生成較細的 凹凸故產生亂反射,而會觀察到較暗。 The etching property was evaluated in the following manner. First, the surface of the sample was etched at room temperature for 2 minutes using an etchant (ADEKATEC CL-8 (manufactured by Adeka Co., Ltd.) and DP-200 (manufactured by Ebara Ujilite)), and the image was observed by an optical microscope. The brightness of the image obtained by the surface of the observation range of 1 mm square is binarized, thereby calculating the ratio of light and dark. The tissue with [100] orientation will be brighter due to being parallel to the surface of the copper foil, and will be finer in other directions due to the surface. The bumps cause chaotic reflections and are observed to be darker.

繼而,將上述亮部與暗部之中比例未達50%者視為面積率較少者之組織。由於面積率較小者的組織被面積率較多者的組織所包圍而存在,因此面積率較小者的組織近似於多角形,並計算此多角形之外接圓的最小直徑超過50μm的部位之個數。無論使用ADEKATEC CL-8或DP-200任一液體於觀察範圍內該部位皆為10個以下,且將「於最終冷壓延後以200℃加熱30分鐘之加熱前的蝕刻量,與於最終冷壓延後以200℃加熱30分鐘之加熱後的蝕刻量之差在±10%以內」者設為蝕刻性良好(○),將上述個數比10個多或上述蝕刻量之差為超過±10%者設為蝕刻性不良(×)。 Then, the proportion of the above-mentioned bright and dark parts is less than 50%, and is regarded as an organization with a smaller area ratio. Since the tissue having a smaller area ratio is surrounded by the tissue having a larger area ratio, the tissue having a smaller area ratio is approximated to a polygonal shape, and the portion having the smallest diameter of the circumscribed circle of the polygonal shape exceeding 50 μm is calculated. Number. Regardless of whether any liquid of ADEKATEC CL-8 or DP-200 is used, the part is less than 10 in the observation range, and the amount of etching before heating is heated at 200 ° C for 30 minutes after the final cold rolling, and finally cooled. The difference between the etching amount after heating at 200 ° C for 30 minutes after rolling is within ±10% is good (○), and the difference between the number of the above-mentioned numbers and the amount of etching is more than ±10. % is set as poor etching property (×).

此處,蝕刻量係以(蝕刻前之銅箔重量-蝕刻後之銅箔重量)來算出,若上述蝕刻量之差在±10%以內,無論最終冷壓延後有無再結晶,蝕刻量均難以變化,認定其蝕刻性優異。 Here, the etching amount is calculated by (the weight of the copper foil before etching - the weight of the copper foil after etching), and if the difference in the etching amount is within ±10%, the amount of etching is difficult regardless of whether or not recrystallization is performed after the final cold rolling. The change was confirmed to be excellent in etching property.

再者,於銅箔表面之中,比起混合存在明亮面與暗面,明亮面或暗面之任一者變得較多者有蝕刻性變得良好之傾向。 In addition, in the surface of the copper foil, the bright surface and the dark surface are mixed, and the bright surface or the dark surface tends to have a good etching property.

(6)表面之傷痕 (6) Surface scars

對各試樣之表面進行目測觀察,將於壓延方向具有10mm以上之長度之傷痕以5部位/m2以上存在之情形設為×。 The surface of each sample was visually observed, and the case where the flaw having a length of 10 mm or more in the rolling direction was present at 5 parts/m 2 or more was set as ×.

(7)彎曲性 (7) Flexibility

將試樣於200℃加熱30分鐘使其再結晶後,於聚醯亞 胺膜(商品名:Kapton(註冊商標)EN)之一面(與銅箔接合之面)塗布熱塑性PI接著劑2μm後進行乾燥,而形成27μm厚之樹脂層。將此樹脂層之接著劑面積層於銅箔而進行真空熱壓接,製作覆銅積層體。藉由圖3所示之彎曲試驗裝置,進行覆銅積層體之彎曲疲勞壽命之測定。該裝置為於振盪驅動體4結合有振動傳遞構件3之構造而成,被試驗銅箔1係於箭線表示之螺釘2之部分與3之前端部之共計4處固定於裝置。若將振動部3進行上下驅動,則銅箔1之中間部以特定之曲率半徑r彎曲為迴管狀。本試驗係求出以下之條件下反覆彎曲時直至斷裂為止之次數。 The sample was heated at 200 ° C for 30 minutes to recrystallize it. One side of the amine film (trade name: Kapton (registered trademark) EN) (surface joined to copper foil) was coated with a thermoplastic PI adhesive at 2 μm, and then dried to form a 27 μm thick resin layer. The adhesive layer area of the resin layer was layered on a copper foil, and vacuum thermocompression bonding was performed to prepare a copper clad laminate. The bending fatigue life of the copper clad laminate was measured by the bending test apparatus shown in Fig. 3 . This device is a structure in which the vibration transmitting member 3 is coupled to the oscillation transmitting member 3, and the test copper foil 1 is fixed to the device by a total of four portions of the screw 2 and the front end portion of the third portion indicated by the arrow. When the vibrating portion 3 is driven up and down, the intermediate portion of the copper foil 1 is bent at a specific radius of curvature r into a tubular shape. This test is to determine the number of times from the time of repeated bending to the time of breaking under the following conditions.

再者,試驗條件為以下所述:試驗片寬度:12.7mm,試驗片長度:200mm,試驗片採取方向:以試驗片之長度方向成為與壓延方向平行之方式採取,曲率半徑r:2.5mm,振動衝程:25mm,振動速度:1500次/分鐘。再者,於彎曲疲勞壽命為50萬次以上之情形時,判斷為具有優異之彎曲性。若彎曲疲勞壽命為50萬次以上,則即便於摺疊式行動電話之摺疊可動部等之嚴格彎曲時亦具有耐受性良好之彎曲性。 Further, the test conditions were as follows: test piece width: 12.7 mm, test piece length: 200 mm, test piece taking direction: taken in such a manner that the longitudinal direction of the test piece became parallel to the rolling direction, and the radius of curvature r: 2.5 mm, Vibration stroke: 25 mm, vibration speed: 1500 times / minute. In addition, when the bending fatigue life was 500,000 times or more, it was judged to have excellent flexibility. When the bending fatigue life is 500,000 times or more, the bending property of the foldable movable portion of the foldable mobile phone or the like is excellent.

所得結果示於表1。 The results obtained are shown in Table 1.

由表1可知,於G60RD為100以上300以下、20≦I/I0≦40,且d/t為0.1以下,G60RD/G60TD未達0.8之各發明例之情形時,蝕刻性優異,進而銅箔表面無傷痕,彎曲性亦良好。 As is clear from Table 1, when G60 RD is 100 or more and 300 or less, 20≦I/I 0 ≦40, and d/t is 0.1 or less, and G60 RD /G60 TD is less than 0.8, the etching property is excellent. Further, the surface of the copper foil is free from scratches and the bending property is also good.

另一方面,於最終冷壓延中,直至最終道次之前之輥之表面粗糙度,及最終道次之輥之表面粗糙度均為Ra=0.05μm以下之比較例1之情形時,銅箔表面之G60RD超過300,銅箔表面劃有傷痕,操作性變差。 On the other hand, in the case of the final cold rolling, the surface roughness of the roll before the final pass, and the surface roughness of the roll of the final pass are both Ra = 0.05 μm or less, the surface of the copper foil The G60 RD exceeds 300, and the surface of the copper foil is scratched, and the operability is deteriorated.

於最終冷壓延中,使直至最終道次之前之輥之表面粗糙度變粗為Ra=0.06μm以上,且使最終道次之輥之表面粗糙度為Ra=0.05μm以下之比較例2之情形時,成為I/I0>40,碟型下陷之個數增加,蝕刻性下降,又,銅箔表面之G60RD超過300,銅箔表面劃有傷痕,操作性變差。 In the final cold rolling, the surface roughness of the roll before the final pass was increased to Ra = 0.06 μm or more, and the surface roughness of the roll of the final pass was Ra = 0.05 μm or less. In the case of I/I 0 >40, the number of dishings is increased, the etching property is lowered, and the G60 RD of the surface of the copper foil exceeds 300, and the surface of the copper foil is scratched, and the workability is deteriorated.

於最終冷壓延中,使直至最終道次之前之輥之表面粗糙度、及最終道次之輥之表面粗糙度均變粗達到Ra=0.06μm以上之比較例3、4、5之情形時,成為I/I0>40,碟型下陷之個數增加,蝕刻性下降。 In the final cold rolling, in the case of Comparative Examples 3, 4, and 5 in which the surface roughness of the roll before the final pass and the surface roughness of the final pass roll were both coarsened to Ra=0.06 μm or more, When I/I 0 >40, the number of dish sag increases, and the etchability decreases.

再者,於比較例3、4之情形時,由於使最終冷壓延之所有道次之輥表面粗糙度變粗,故於材料內部剪切變形帶擴展,銅箔表面之結晶之取向度下降,成為I/I0>40。 Further, in the case of Comparative Examples 3 and 4, since the surface roughness of all the rolls of the final cold rolling was made coarse, the shear deformation band spread inside the material, and the degree of orientation of the crystal on the surface of the copper foil was lowered. Become I/I 0 >40.

另一方面,於比較例5之情形時,由於使直至最終道次之前之輥之粗糙度比比較例3、4平滑,故光澤度亦成為高於比較例3、4之值,但剪切帶之抑制依然不充分,成為I/I0>40,碟型下陷之個數增加,蝕刻性下降。再者,可 認為於使直至最終道次之前之輥粗糙度成為0.07μm之狀態下,為了抑制剪切帶,而存在使通板速度下降等之方法,但於此情形時光澤度超過300,故表面傷痕判定為×。 On the other hand, in the case of Comparative Example 5, since the roughness of the roll up to the final pass was smoother than Comparative Examples 3 and 4, the gloss was also higher than the values of Comparative Examples 3 and 4, but shearing The suppression of the tape is still insufficient, and I/I 0 >40, the number of dish-type sags increases, and the etching property decreases. In addition, in the state in which the roll roughness before the final pass is 0.07 μm, in order to suppress the shear band, there is a method of lowering the speed of the plate, and the like, in this case, the gloss exceeds 300. Therefore, the surface flaw is judged as ×.

1‧‧‧銅箔 1‧‧‧ copper foil

2‧‧‧螺釘 2‧‧‧ screws

3‧‧‧振動傳遞構件 3‧‧‧Vibration transfer member

4‧‧‧振盪驅動體 4‧‧‧Oscillation driver

RD‧‧‧壓延平行方向 RD‧‧‧Rolling parallel direction

TD‧‧‧壓延直角方向 TD‧‧‧Rolling right angle

GRD、GTD、G60RD、G60TD‧‧‧光澤度 G RD , G TD , G60 RD , G60 TD ‧ ‧ gloss

L1~L3‧‧‧直線 L 1 ~L 3 ‧‧‧ Straight line

HM‧‧‧最大高度 H M ‧‧‧Maximum height

HS‧‧‧最小高度 H S ‧‧‧minimum height

di‧‧‧最大高度與最小高度之差 Di‧‧‧The difference between the maximum height and the minimum height

r‧‧‧曲率半徑 R‧‧‧ radius of curvature

圖1係表示油坑與光澤度之關係之圖。 Figure 1 is a graph showing the relationship between oil pits and gloss.

圖2係表示相當於油坑最大深度之平均值d之測定法之圖。 Fig. 2 is a view showing a measurement method corresponding to the average value d of the maximum depth of the oil pit.

圖3係表示藉由彎曲試驗裝置來進行彎曲疲勞壽命之測定之方法之圖。 Fig. 3 is a view showing a method of measuring the bending fatigue life by a bending test device.

RD‧‧‧壓延平行方向 RD‧‧‧Rolling parallel direction

TD‧‧‧壓延直角方向 TD‧‧‧Rolling right angle

GTD‧‧‧光澤度 G TD ‧‧‧Gloss

GRD‧‧‧光澤度 G RD ‧‧‧Gloss

Claims (5)

一種壓延銅箔,於壓延平行方向測得之表面之根據JIS-Z8741的60度光澤度G60RD為100以上300以下,於200℃加熱30分鐘而調質為再結晶組織之狀態下,由壓延面之X射線繞射求得之200繞射強度(I)相對於由微粉末銅之X射線繞射求得之200繞射強度(I0)為20≦I/I0≦40,在銅箔表面於壓延平行方向長度為175μm,且於壓延直角方向分別相隔50μm以上之3條直線上,相當於油坑最大深度之各直線之厚度方向的最大高度與最小高度之差的平均值d與該銅箔之厚度t之比率d/t為0.1以下,於壓延平行方向測得之表面之60度光澤度G60RD與於壓延直角方向測得之表面之根據JIS-Z8741的60度光澤度G60TD之比率G60RD/G60TD未達0.8。 A rolled copper foil obtained by calendering in a direction parallel to the direction of rolling in which the 60-degree gloss G60 RD according to JIS-Z8741 is 100 or more and 300 or less, and is heated at 200 ° C for 30 minutes to be recrystallized into a recrystallized structure. The diffraction intensity of the 200-ray diffraction obtained by the X-ray diffraction of the surface (I) is 200 绕I/I 0 ≦40 with respect to the diffraction intensity (I 0 ) obtained by the X-ray diffraction of the fine powder copper. The length of the foil surface in the parallel direction of the rolling is 175 μm, and on the three straight lines separated by 50 μm or more in the direction perpendicular to the rolling direction, the average value d of the difference between the maximum height and the minimum height in the thickness direction of each straight line corresponding to the maximum depth of the oil pit is The ratio t/t of the thickness t of the copper foil is 0.1 or less, and the 60 degree gloss G60 RD of the surface measured in the parallel direction of the rolling and the 60 degree gloss G60 according to JIS-Z8741 of the surface measured in the direction perpendicular to the rolling direction. The ratio of TD to G60 RD /G60 TD is less than 0.8. 如申請專利範圍第1項之壓延銅箔,其中,該200℃×30分鐘熱處理後之銅箔表面於電解研磨後利用EBSD進行觀察時,壓延面之結晶方位與[100]方位之角度差在15度以上之晶粒的面積率為30~70%。 The rolled copper foil according to claim 1, wherein the surface of the copper foil after heat treatment at 200 ° C for 30 minutes is observed by EBSD after electrolytic polishing, and the difference between the crystal orientation of the calendering surface and the [100] orientation is The area ratio of crystal grains of 15 degrees or more is 30 to 70%. 如申請專利範圍第1或2項之壓延銅箔,其中,將鑄塊於熱壓延後,反覆進行冷壓延與退火,最後進行最終冷壓延而製造,於該最終冷壓延步驟中,於最終道次之前1道次的階段,於壓延平行方向測得之表面的60度光澤度G60RD超過300。 The rolled copper foil according to claim 1 or 2, wherein the ingot is subjected to hot rolling, followed by cold rolling and annealing, and finally to final cold rolling, in the final cold rolling step, in the final In the first pass of the pass, the 60-degree gloss G60 RD of the surface measured in the direction parallel to the calendering exceeds 300. 如申請專利範圍第1或2項之壓延銅箔,其含有合計 30~300wtppm之選自Ag、Sn、In、Au、Pd及Mg之群中1種或2種以上的元素。 For example, the rolled copper foil of claim 1 or 2 contains the total 30 to 300 wtppm of one or more elements selected from the group consisting of Ag, Sn, In, Au, Pd, and Mg. 如申請專利範圍第3項之壓延銅箔,其含有合計30~300wtppm之選自Ag、Sn、In、Au、Pd及Mg之群中1種或2種以上的元素。 The rolled copper foil according to the third aspect of the invention, which contains a total of 30 to 300 wtppm of one or more elements selected from the group consisting of Ag, Sn, In, Au, Pd, and Mg.
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