201118714 六、發明說明： 【發明所屬之技術領域】 [0001] 本發明係有關於記憶體，尤| m^ 具更有關於熱插拔記憶體。 [先前技術] [0002] ❹ 目前許多測試記憶體之技術皆已移轉至個人電腦上，並 以-般市售之電齡機板來進行職。然而，無論是要 進行記憶體之賴，妓正f使驗㈣，測試者或使 用者皆需注意記憶體之置換方式，以免造成電腦之當機 狀況。 [0003] 時L體-般並不具備熱插拔之功能，若強行於電腦開機 之插入或拔除，可能直接或間接地影響電腦瑚機記憶體 作動，進而造成系統之當機。下面將以測試記憶體之 換t舉例說明請參閱第—圖，為先前技術的記憶體置 、以程圖。首先’必需先關閉一電腦之電源（步驟S10)， 著，在該電腦之電源關閉之狀態下，再置換一待測之 〇 己隐體（步驟S12) 〇於該待測記憶體覃換完畢後，重新開 啟該電腦之電源(步驟S14)，並且，於該電腦開機時，透 Λ電版之一基本輸出入系統（Basic Input/Output System，BIOS) ’對該待測之記憶體進行初始化（步驟 Sl6) °藉以，於該電腦開啟後，該待測記憶體可被該電 腦所正常使用，因而得以進行測試該待測記憶體之動作 〇 [0004] 接著’確定該電腦是否在該步驟S16中發生當機之狀況（ 步驟S18) ’若是’則表示該待測記憶體無法用來開機。 因此回到該步驟Si〇，重新置換其他待測之記憶體。若於 098140825 單蝙號A0101 第3頁/共23頁 0982070092-0 201118714 該步驟S18中，若否，則該電腦載入一作業系統 (Operating System，0S)(步驟S20)。接著，載入一 用來測試該待測記憶體之測試程式（步驟S22 )，藉以對該 待測記憶體進行測試動作（步驟S24)。最後，於測試結束 後記錄測試之結果（步驟S26)，然後回到該步驟S10，置 換並測試其他待測之記憶體。 [0005] 唯，上述之方法係需於測試過程中，測試者係需不斷地 重新啟動該電腦，該電腦則需重新載入B0IS、該作業系 統及該測試程式，因而每次測試皆需耗費相當長的時間 。再者，為能安全開機，該電腦之BIOS係會於每次開機 時，對該置換的待測記憶體進行標準之檢查，因此若該 待測記憶體為不良品，則可能導致BIOS無法順利被啟動 ，令該電腦無法開機。如此一來，即無法使用該測試程 式來進行測試，也就無法測得該待測記憶體之不良部位 在哪裡了。 [0006] 值得一提的是，目前市面上已提出許多技術，係從硬體 方面來進行改良，令記憶體可在電腦開機之狀態下進行 置換之動作。唯，記憶體於實體之置換後，仍然需要經 過初始化，令該電腦可正常使用，才算是完整的熱插拔 動作。然而現今電腦的架構愈來愈複雜，欲透過自行撰 寫之程式來對置換之記憶體進行初始化，係相當困難。 再者，現在電腦硬體的更新速度愈來愈快，對於初始化 程式之撰寫者而言，係需不斷地因應硬體之更新而進行 初始化程式之改寫，實非常地不便，並且需花費相當可 觀之時間成本。 098140825 表單編號A0101 第4頁/共23頁 0982070092-0 201118714 [0007] 有鑑於上述缺點，本發明人仍潛心研究，提出一種新穎 之記憶體熱插拔方法，係令記憶體於實體插入或置換後 ，得以依照電腦原有之規則進行初始化，不但不需要另 外撰寫初始化程式，且運作速度亦相當之迅速。 【發明内容】 [0008] 本發明之主要目的，在於提供一種記憶體的熱插拔方法 ，係可於電腦在開機狀態下，對記憶體進行實體插入或 置換之動作，並且對所置換之記憶體進行初始化動作， _ 藉以，不必將電腦重新開機即可正常使用所置換之記憶 Ο 體。 [0009] 為達上述目的，本發明係於將待置換之記憶體實體插入 或置換至電腦中之後，再將電腦於高級配置與電源介面 的S3模式中喚醒，或者，將電腦之中央處理單元進行重 置動作，如此一來，即可於正常之喚醒流程或重置流程 中，藉由一基本輸出入系統自動對所置換之記憶體進行 初始化。 0 [0010] 本發明比照先前技術所能得到之功效在於，於電腦從高 級配置與電源介面的S3模式中被喚醒，或於電腦的中央 處理單元重置時，基本輸出入系統皆會依照標準的處理 流程，自動對某些必要元件進行檢查及初始化，因此只 要令基本輸出入系統於處理流程中，對置換之記憶體執 行如同開機時所執行之初始化動作即可，不必另外撰寫 複雜之初始化程式，並且因為是透過基本輸出入系統來 進行初始化，所以執行速度上亦相當迅速。 【實施方式】 098140825 表單編號A0101 第5頁/共23頁 0982070092-0 201118714 [0011] 茲就本發明之一較佳實施例，配合圖式’詳細說明如後 0 [0012] 本發明主要係於該電腦保持開機之狀態下，實體插入或 置換之一置換記憶體，並藉由一般個人電腦所使用之標 準規則，對該置換δ己憶體進行初始化。藉以，該電腦不 需額外載入初始化程式，即可對該置換記憶體初始化後 ，進行使用或測試。 [0013] 首請參閱第二圖，為本發明之一較佳具體實施例之流程 圖，於此實施例中’係透過一般電腦的高級配置與電源 介面（Advanced .Canfiguration and.Power Interface ， ACPI) 標準下的一 S3 模式， 來對所插入或置換之 該置換記憶體執行初始化之動作。ACPI的該S3模式，係 為一種掛到内部記憶體（Suspend to RAM)的睡眠 (Sleep)狀態。於該S3模式之下，該電腦中幾乎只剩兮己 憶體仍然有電源供給，而其他元件，包括中央處理單元 (’Central Processing Unit，CPU)及硬碟等皆斷電 。該電腦之一間機記憶體仍有電源供給，因此該電腦之 作業系統、應用程式及已開啟之文件檔案等不可損毁之 資料，皆於進入該S3模式前儲存至該開機記憶體中。待 該電腦自該S3模式中被喚醒時，再從該開機記憶體中讀 出該些資料，藉以’該電腦得以於被喚醒後，回復進入 S3模式前之狀態。 [0014] 首先，係令該電腦中之該開機記憶體進入間置狀態（步驟 S30)，接著，於該步驟S30之後，再將該置換記憶體實體 插入或實體置換至該電腦之主機板上（步驟S32)。該步驟 098140825 表單編號A0101 第6頁/共23頁 〇q89 201118714 Ο [0015]201118714 VI. Description of the Invention: [Technical Field to Which the Invention Is Applicable] [0001] The present invention relates to a memory, and more particularly to a hot-swappable memory. [Prior Art] [0002] ❹ Many of the techniques for testing memory have been transferred to personal computers and are used in the general-purpose electronic age board. However, whether it is to carry out the memory, the tester or the user should pay attention to the replacement of the memory, so as not to cause the computer to crash. [0003] The L-body does not have the function of hot plugging. If it is forcibly inserted or removed from the computer, it may directly or indirectly affect the computer's memory operation, which may cause the system to crash. In the following, the test memory is replaced by an example. Please refer to the first figure for the memory of the prior art. First of all, it is necessary to first turn off the power of a computer (step S10), and then, in the state where the power of the computer is turned off, replace a hidden object to be tested (step S12), and the memory to be tested is replaced. After that, the power of the computer is restarted (step S14), and when the computer is turned on, the memory of the memory to be tested is initialized through one of the basic input/output system (BIOS). (Step S16) °, after the computer is turned on, the memory to be tested can be normally used by the computer, so that the action of the memory to be tested can be tested. [0004] Next, 'determine whether the computer is at this step. The situation of the occurrence of the crash in S16 (step S18) 'if yes' indicates that the memory to be tested cannot be used for booting. So go back to this step, and replace the other memory to be tested. If at 098140825 single bat number A0101 page 3 / 23 page 0982070092-0 201118714 In step S18, if not, the computer is loaded into an operating system (Operating System, OS) (step S20). Next, a test program for testing the memory to be tested is loaded (step S22), thereby performing a test operation on the memory to be tested (step S24). Finally, the result of the test is recorded after the end of the test (step S26), and then returned to the step S10 to replace and test the other memory to be tested. [0005] However, the above method is required during the test, the tester needs to continuously restart the computer, and the computer needs to reload the B0IS, the operating system and the test program, so each test needs to be spent. Quite a long time. Furthermore, in order to be able to boot safely, the BIOS of the computer will perform a standard check on the memory to be tested each time the device is turned on. Therefore, if the memory to be tested is a defective product, the BIOS may not be smooth. Was started, making the computer unable to boot. In this way, the test procedure cannot be used to test, and it is impossible to measure where the defective portion of the memory to be tested is. [0006] It is worth mentioning that many technologies have been proposed on the market, which are improved from the hardware side, so that the memory can be replaced when the computer is turned on. Only after the replacement of the memory in the entity still needs to be initialized, so that the computer can be used normally, it is a complete hot plug action. However, the architecture of today's computers is becoming more and more complicated. It is quite difficult to initialize the memory of the replacement through a self-written program. Moreover, the update speed of computer hardware is getting faster and faster. For the author of the initialization program, it is necessary to constantly rewrite the initialization program according to the hardware update, which is very inconvenient and costly. Time cost. 098140825 Form No. A0101 Page 4 / Total 23 Page 0992070092-0 201118714 [0007] In view of the above shortcomings, the inventors have also painstakingly studied and proposed a novel method of memory hot plugging, which is to insert or replace a memory into a solid. After that, it can be initialized according to the original rules of the computer. Not only does it need to write an initialization program, but the operation speed is also quite fast. SUMMARY OF THE INVENTION [0008] The main purpose of the present invention is to provide a method for hot plugging a memory, which can perform physical insertion or replacement of a memory in a computer when the computer is turned on, and the memory of the replacement. The body performs the initialization action, _ so that the replaced memory body can be used normally without restarting the computer. [0009] In order to achieve the above object, the present invention is to insert or replace a memory entity to be replaced into a computer, and then wake up the computer in the S3 mode of the advanced configuration and the power interface, or the central processing unit of the computer. The reset operation is performed, so that the replaced memory can be automatically initialized by a basic input/output system in a normal wake-up process or a reset process. [0010] The present invention achieves the same effect as the prior art in that the computer is awakened from the S3 mode of the advanced configuration and power interface, or when the central processing unit of the computer is reset, the basic input and output systems are in accordance with the standard. The processing flow automatically checks and initializes some necessary components, so as long as the basic output is put into the system in the processing flow, the memory of the replacement is executed as the initialization action performed at the time of power-on, and it is not necessary to write a complicated initialization. The program, and because it is initialized through the basic input and output system, the execution speed is also quite fast. [Embodiment] 098140825 Form No. A0101 Page 5 / Total 23 Page 0992070092-0 201118714 [0011] In the preferred embodiment of the present invention, the detailed description of the present invention is as follows [0012] The present invention is mainly based on When the computer is turned on, one of the physical insertion or replacement replaces the memory, and the replacement δ mnemony is initialized by a standard rule used by a general personal computer. Therefore, the computer can be used or tested after the replacement memory is initialized without additional loading of the initialization program. [0013] Please refer to the second figure, which is a flowchart of a preferred embodiment of the present invention. In this embodiment, the system is configured through an advanced configuration and power interface of an ordinary computer (Advanced.Canfiguration and.Power Interface, ACPI). An S3 mode under the standard to perform an initialization action on the replacement memory inserted or replaced. The S3 mode of ACPI is a sleep state that hangs into internal memory (Suspend to RAM). Under the S3 mode, almost all of the remaining memory in the computer still has power supply, while other components, including the central processing unit (CPU) and the hard disk, are powered off. The memory of one of the computers in the computer still has a power supply, so the non-destructible data of the computer's operating system, applications, and opened file files are stored in the boot memory before entering the S3 mode. When the computer is awakened from the S3 mode, the data is read from the boot memory, so that the computer can be awake and return to the state before the S3 mode. [0014] First, the boot memory in the computer is brought into an intervening state (step S30), and then, after the step S30, the replacement memory entity is inserted or physically replaced onto the motherboard of the computer. (Step S32). This step 098140825 Form No. A0101 Page 6 of 23 〇q89 201118714 Ο [0015]
S30，主要係 許撓動或雜/防止该置換記憶體於實體置換時所產生些 成該電腦之:抱干擾該開機記憶體之讀寫動作，進而造 ，確保該電〃因此，需於實體置換該置換記憶體時 記憶體處在^CPU與該開機記憶體間沒有互動，該開機 -提的是 w寫動作之_㈣（Idle)。然而值得 ，可藉U今的電腦大部分皆已採用雙通道之主機板 、乙之圮憶體插槽，隔離該開機記憶體與該 直換圮憶體。*去 钟 者，亦有廠商提出一種硬體電路，係可 機記憶體體及該置換記㈣之間，11以將該開 λ罝換圮愧體隔灕開來。如此一來，若該雷 腦已於硬體；而L λ ^Qqn ^曲上達成該步驟S30欲達成之目的，則該步 驟S 3 0不一定要 而定，^ 破執行，故，需視該電腦之硬體配備為何 疋不可加以限制。而其中該開機記憶體及該置換記 憶體’皆係為隨機存取記憶體（―ACcess Memory ，RAM)，但不加以限定。 1 ν驟S3G中’令該開機記德體閒置之主要方法，係將該 電腦之CPU於纪麵間置時所執行的執行程序及資料轉 移至該一快取記憶體上執行。再者，亦可將該電腦之CPU 於β己憶體間置時所執行的執行程序及資料，以原地執行 (execution in piace，χιρ)之方式來實現，即，於 外部之一附件卡（Add-on Card)上的唯讀記憶體（R〇M) 、可抹除可規劃唯讀記憶體（EPROM)、快閃記憶體 (Flash Memory)或隨機存取記憶體（RAM)等記憶體上來 進行。如此一來，則不一定要執行轉移執行程序及資料 之動作。再者，亦可令該電腦之CPU進入待機（Standby) 098140825 表單編號A0101 第7頁/共23頁 0982070092-0 201118714 之狀態，例如ACPI之S1模式，藉以，令該電腦之CPU與 記憶體之間沒有互動，該開機記憶體處在一廣義之閒置 狀態。 [0016] 該步驟S32後，係令該電腦之作業系統進入ACPI的該S3 模式（步驟S34)。此時除了該電腦之記憶體外，其餘元件 皆斷電，該電腦處在於一種變相的關機狀態。不同於正 常關機動作的是，該電腦被喚醒之動作非常迅速，並且 可於被喚醒後，回復該電腦進入該S3模式前之所有狀態 〇 [0017] 於該步驟S34之後，隨即將該電腦自該S3模式中喚醒（步 驟S36)。因為除了該開機記憶體之外，其餘元件幾乎都 是於斷電後再重新啟動，因此於嗔醒時，該電腦之BIOS 會如同開機時一樣，對某些預定元件進行檢查及初始化 等動作。而該BIOS會對哪些元件進行檢查及初始化，係 按照該電腦之標準喚醒流程來進行，因此，本發明即於 該電腦被喚醒時，令該BIOS對該置換記憶體執行初始化 動作（步驟S38)。然而，有部分的電腦規定於該S3模式中 被喚醒時，BIOS需對該置換記憶體進行初始化。當該 BIOS不對該置換記憶體進行初始化時，亦只需與該些電 腦之廠商合作，透過簡單之客製化，修改該BIOS之喚醒 流程，令該BIOS於該電腦被唤醒時，對該置換記憶體執 行例如開機時之初始化即可。 [0018] 值得一提的是，喚醒該電腦之方法有很多種，例如按壓 該電腦之鍵盤按鍵或電源按鈕、移動滑鼠、網路喚醒或 鬧鈐等，不加以限定。並且，為能快速自該S3模式中將 098140825 表單編號A0101 第8 1/共23頁 0982070092-0 201118714 [0019] Ο [0020] ❹ [0021] 098140825 該電腦喚醒， 系Bl〇s係不會對該置換記憶體進行深度之 —、喊省嗔醒時間。因此’即使該置換記憶體為 不良品*仍執ς'ρ 〜了於該電腦的開機狀態下被使用，例如， 可使用程式來對《換記憶體進行測試。 最後㈣電觸被喚醒，且該BIOS對該置換記憶體完成 初始化後’令糾⑽交出控制權（步驟S40)。例如，若 該置換》己It體為—待測記憶體，且該電腦使用該測試程 式來進仃測&時’係於該步驟S4G後，由該BIGS將程式執 行之控制權乂給該測試程式，藉以該測試程式得以測 試該置換t待剛魏體。其中，該開機記憶體及該置換 Alt體之數量係不以一為限，該電腦係、可使用複數之該 開機°己隐體，以及置換或測試複數之該置換記憶體。 上述只施例中’該步驟S3Q主要係令該開機記憶體處於一 種λ有"f寫動作的廣義閒置狀態，進而不使該置換記憶 體之置換動作造成該電腦當機。唯，當該電狀作業系 統進入ACPI的該S3模式時，因該電腦孓cpu已斷電，不 會與該開機記憶體有任何交互:讀寫之動作，該開機記憶 體即為間置狀態。因此，亦可透過下述之另一實施例來 加以實現。 請參閱第二圖，為本發明之另一較佳具體實施例之流程 圖。首先，係直接令該電腦之作業系統進入Acpl之該S3 模式（步驟S50)，藉以’令該開機記憶體處於沒有讀寫動 作的間置狀‘4。接著，進行實想插人或置換該置換記憶 體之動作（步驟S52) ’如此一來，該步驟S52的動作將不 會使得該電腦產生當機之現象。該步驟S52之後 ’將該電 表單編號AGHH 第9以23頁 〇982〇 201118714 腦自該S3模式中喚醒（步驟S54)，並於喚醒時，令該電腦 之BIOS對該置換記憶體執行初始化動作（步驟S56)。最 後，於該BIOS對該置換記憶體完成初始化後，令該BIOS 交出程式執行之控制權（步驟S58)。 [0022] 本發明之該記憶體熱插拔方法，主要係可於測試記憶體 時使用，如第四圖所示，為本發明之一較佳具體實施例 之測試流程圖。首先，係如該步驟S30或該步驟S50中所 示，令該開機記憶體進入閒置狀態，或令該電腦作業系 統進入ACPI之該S3模式，藉以，能夠實體插入或置換該 待測的置換記憶體至該電腦主機板（步驟S70)。接著，如 該步驟S38或該步驟S56所示，將該電腦自該S3模式中喚 醒，並且令該BIOS對該置換記憶體執行初始化（步驟 S72)。接著，如該步驟S40或該步驟S58中所示，於初始 化完成後，令該BIOS將程式執行之控制權交給該電腦中 ，用來測試該置換記憶體之該測試程式。藉以，測試者 可使用該測試程式，檢測該置換記憶體之不良部位在哪 裡（步驟S74)，並且，於測試完成後記錄測試之結果（步 驟S76)。 [0023] 值得一提的是，該步驟S76之記錄動作係可為程式記錄或 人工記錄，因而，進行記錄之時間點係會有所不同，不 應加以限定。例如，若係以程式來進行記錄，則可於測 試結束後，到開始測試下一個置換記憶體間的任何時間 點内進行。再例如，若係以人工來進行記錄，則可於測 試動作結束後，將測試結果顯示於該電腦之一顯示螢幕 。藉以，於該步驟S30後，該顯示螢幕上仍保有上一回的 098140825 表單編號A0101 第10頁/共23頁 0982070092-0 201118714 測試結果，測試者ι ^ Ρ可於該步驟S32中將該置換記憶體拔 除後，將不良之部私工' 1 立予以標示，再插入下一個待測之該 \隐體又例如，於該步驟S50後，該顯示螢幕上不 回的測試結果（因進人該S3模^，故該電腦之 顯不卡已停止輪出動作）’因此該電腦可於該步驟S74後 透過轉換私式將測試結果輸出至一外部裝置上予以 保留及顯示。藉以’測試者可於該步驟聊中將該置換記 憶體拔除後’參考該外料置上顯示之測試結果，將不 Ο 良之4位予以標示。最後，再插上下—個待測之該置換 s己憶體，進行下一回之測試及記錄。唯，以上所述僅為 本發明之較佳具體實施例’並非用來限制本發明之申請 專利範圍》 [0024] 〇 本發明主要係藉由修改該電腦之標準流程，對該置換記 憶體進行初始化動作，因此，除了 ACp|的該幻模式之外 ，亦可透過其他方法，例如以重置（Resetf)之方式來實現 。請參閱第五圖，為本發明之又一較佳具艎實施例之流 程圖°首先’令該電辑中之該;開機記憶體進入間置狀態（ !： I · 'p- I r. t ^ f f , 气. 步驟S80) ’接著’實體插入或置換該置換記憶體至該電 腦（步驟S82)。於置換完成後，令該電腦之CPU及一記憶 體控制器進行重置（步驟S84)。其中，該記憶體控制器可 能設置於該CPU内’亦可能為分開之元件，需視該電腦 之硬體配置而定，不加以限制》 接著，於重置時，令該電腦之BIOS對該置換記憶體執行 初始化（步驟S86)，並且於初始化結束之後，令該BIOS 交出程式執行之控制權（步驟S88)。例如，若於重置前， 098140825 表單編號A0101 第11頁/共23頁 0982070092-0 [0025] 201118714 使用該測試程式來進行記憶體之測試，則於該步驟S88中 ，係令該BIOS將程式執行之控制權轉移給該測試程式。 藉以，該測試程式得以測試該置換記憶體，並得進一步 記錄測試結果。其中，亦需與該電腦之廠商合作，透過 簡單之客製化修改重置流程，令該Bi〇S於該電腦之Cpu被 重置時，對該置換記憶體執行初始化。並且，需令該 BIOS於重置完成後，將程式執行之控制權轉移回該測試 程式。 [0026] [0027] [0028] [0029] 本實施例中之重置動作，係僅對該cpu及該記憶體控制器 0 進行，並非指一般電腦之重新開機。而該CPU及該記憶體 控制器重置時，不像進入ACPI的該S3模式時需要斷電及 喚醒之緩衝時間，故執行速度上會比第二圖及第三圖中 所述之實施例來得快。再者，若本實施例完全以XIP之 方式來實現，即，將該測試程式於外部之該附件卡上的 _、EPROM、Flash Mempry或RAM等記憶體上來執行時 ，則更可省略該開機記憶體。如此一來，該電腦内部僅 具有該置換記憶體，因此，更不會因為實體置換該置換 0 S己憶體之動作，而造成該電腦之當機現象。 以上所述僅為本發明之較佳具體實例，非因此即侷限本 發明之專利範圍’故舉凡運用本發明内容所為之等效變 化，均同理皆包含於本發明之範圍内，合予陳明。 【圖式簡單說明】 第一圖係先前技術之記憶體置換流程圖。 第二圖係本發明之一較佳具體實施例之流程圖。 098140825 表單編號A0101 第12頁/共23頁 0982070092-0 201118714 [0030] 第三圖係本發明之另一較佳具體實施例之流程圖。 [0031] 第四圖係本發明之一較佳具體實施例之測試流程圖。 [0032] 第五圖係本發明之又一較佳具體實施例之流程圖。 【主要元件符號說明】 [〇〇33]〈習知> [0034] S10-S26 …步驟 [0035] 〈本發明> 〇 [0036] S30~S40、S50~S58、S70〜S76、S80〜S88…步驟S30, mainly for swaying or miscellaneous/preventing the replacement memory to be generated by the computer when the physical replacement is performed: the interference with the read and write operations of the boot memory, and then ensuring that the electrical device is required to be in the entity When the replacement memory is replaced, there is no interaction between the CPU and the boot memory, and the boot-up is the _ (four) (Idle) of the w write action. However, it is worthwhile. Most of the computers that can be borrowed from U have used the dual-channel motherboard and the B-shaped memory slot to isolate the boot memory and the direct-change memory. *Where to the clock, some manufacturers have proposed a hardware circuit, which is between the machine memory body and the replacement record (4), 11 to separate the open λ罝 for the body. In this way, if the thunder brain is already on the hardware; and L λ ^Qqn ^ has reached the goal of the step S30, the step S 3 0 does not have to be determined, and the execution is broken. Why is the hardware of the computer not limited? The boot memory and the replacement memory are both random access memory (RAM), but are not limited. 1 ν S3G The main method of making the power-on body idle is to transfer the execution program and data executed by the CPU of the computer to the cache memory. Furthermore, the execution program and data executed by the CPU of the computer when interspersed with the β-memory can be implemented in the form of execution in piace (χιρ), that is, an external accessory card. Read-only memory (R〇M) on (Add-on Card), erasable memory such as programmable read-only memory (EPROM), flash memory (RAM memory) or random access memory (RAM) Physically. In this way, it is not necessary to perform the actions of transferring the execution program and the data. In addition, the CPU of the computer can also enter the state of standby (Standby) 098140825 Form No. A0101, page 7 / 23 pages 0992070092-0 201118714, such as the SPI mode of ACPI, so that the CPU and memory of the computer There is no interaction between the boot memory and the boot memory is in a generalized idle state. [0016] After the step S32, the operating system of the computer is caused to enter the S3 mode of the ACPI (step S34). At this time, except for the memory of the computer, the other components are powered off, and the computer is in a disguised shutdown state. Different from the normal shutdown action, the computer is awakened very quickly, and after waking up, it can reply to all the states before the computer enters the S3 mode. [0017] After the step S34, the computer is automatically Wake up in the S3 mode (step S36). Because all the components except the boot memory are restarted after the power is turned off, the BIOS of the computer will check and initialize certain predetermined components as if it were turned on. The BIOS checks and initializes the components according to the standard wake-up procedure of the computer. Therefore, when the computer is woken up, the BIOS causes the BIOS to perform an initialization operation on the replacement memory (step S38). . However, when some computer programs are awakened in the S3 mode, the BIOS needs to initialize the replacement memory. When the BIOS does not initialize the replacement memory, it only needs to cooperate with the manufacturers of the computers to modify the wakeup process of the BIOS through simple customization, so that the BIOS can be replaced when the computer is woken up. The memory can be initialized, for example, at boot time. [0018] It is worth mentioning that there are many ways to wake up the computer, such as pressing the keyboard button or power button of the computer, moving the mouse, waking up the network or noisy, etc., without limitation. And, in order to be able to quickly get from the S3 mode, 098140825 form number A0101 8 1 / 23 pages 0992070092-0 201118714 [0019] Ο [0020] ❹ [0021] 098140825 The computer wakes up, the BlBs system will not The replacement memory performs depth--calling and waking up time. Therefore, even if the replacement memory is a defective product, it is still used when the computer is turned on. For example, the program can be used to test the memory. Finally, (4) the electrical touch is awakened, and the BIOS returns control to the replacement memory after the initialization is completed (step S40). For example, if the replacement "It is the memory to be tested, and the computer uses the test program to perform the test &" after the step S4G, the BIGS will control the execution of the program to the The test program, by which the test program can test the replacement t to be a rigid body. The number of the boot memory and the replacement Alt body is not limited to one. The computer system can use a plurality of the boot memory, and replace or test the plurality of replacement memory. In the above embodiment, the step S3Q mainly causes the boot memory to be in a generalized idle state in which the λ has &#f write operation, so that the replacement operation of the replacement memory does not cause the computer to crash. Only when the electrical operating system enters the S3 mode of the ACPI, since the computer 孓cpu has been powered off, there is no interaction with the boot memory: the read/write action, the boot memory is the interlaced state . Therefore, it can also be realized by another embodiment described below. Please refer to the second figure, which is a flow chart of another preferred embodiment of the present invention. First, the operating system of the computer is directly brought into the S3 mode of Acpl (step S50), so that the boot memory is in an inter-level "4" without reading and writing. Next, an action of actually inserting or replacing the replacement memory is performed (step S52). Thus, the action of the step S52 will not cause the computer to crash. After the step S52, the electric form number AGHH is awake from the S3 mode (step S54), and when the computer wakes up, the BIOS of the computer performs an initialization operation on the replacement memory. (Step S56). Finally, after the BIOS completes the initialization of the replacement memory, the BIOS is given control over the execution of the program (step S58). [0022] The memory hot plugging method of the present invention is mainly used when testing a memory, as shown in the fourth figure, which is a test flow chart of a preferred embodiment of the present invention. First, as shown in the step S30 or the step S50, the boot memory is put into an idle state, or the computer operating system is entered into the S3 mode of the ACPI, so that the replacement memory to be tested can be physically inserted or replaced. The body is to the computer motherboard (step S70). Next, as shown in the step S38 or the step S56, the computer is woken up from the S3 mode, and the BIOS is caused to perform initialization on the replacement memory (step S72). Then, as shown in the step S40 or the step S58, after the initialization is completed, the BIOS is given control of the execution of the program to the computer for testing the test program of the replacement memory. Therefore, the tester can use the test program to detect where the defective portion of the replacement memory is located (step S74), and record the result of the test after the test is completed (step S76). It should be noted that the recording operation of the step S76 can be a program recording or a manual recording. Therefore, the timing of recording is different and should not be limited. For example, if the program is used for recording, it can be performed at any point in time between the end of the test and the start of testing the next replacement memory. For example, if the recording is performed manually, the test result can be displayed on one of the display screens of the computer after the test operation is completed. Therefore, after the step S30, the display screen still retains the last 098140825 form number A0101 page 10 / 23 page 0992070092-0 201118714 test result, the tester ι ^ Ρ can be replaced in the step S32 After the memory is removed, the defective private worker '1' is marked, and then the next one to be tested is added. For example, after the step S50, the test result is not returned on the screen (because of entering the person) The S3 module is so that the display of the computer has stopped the rotation.) Therefore, the computer can output and display the test result to an external device through the conversion private after the step S74 to be retained and displayed. Therefore, the tester can remove the replacement memory in the step and then refer to the test result displayed on the external material, and mark the four digits that are not good. Finally, insert the upper and lower ones to be tested, and then perform the next test and record. The above description is only a preferred embodiment of the present invention, which is not intended to limit the scope of the invention. [0024] The present invention mainly performs the replacement memory by modifying the standard flow of the computer. The initialization action is therefore implemented in addition to the phantom mode of ACp| by other methods, such as resetting. Please refer to the fifth figure, which is a flow chart of still another preferred embodiment of the present invention. First, 'the one in the battery is set; the boot memory enters the intervening state (!: I · 'p- I r. t ^ ff , gas. Step S80) 'Next' the entity inserts or replaces the replacement memory to the computer (step S82). After the replacement is completed, the CPU of the computer and a memory controller are reset (step S84). Wherein, the memory controller may be disposed in the CPU 'may also be a separate component, depending on the hardware configuration of the computer, without limitation. Then, at the time of resetting, the BIOS of the computer is The replacement memory performs initialization (step S86), and after the initialization is completed, causes the BIOS to hand over control of execution of the program (step S88). For example, if it is reset, 098140825 Form No. A0101 Page 11 / Total 23 Page 0992070092-0 [0025] 201118714 Using the test program for memory testing, in step S88, the BIOS is programmed Control of execution is transferred to the test program. Therefore, the test program can test the replacement memory and further record the test results. In addition, it is also necessary to cooperate with the manufacturer of the computer to modify the reset process through simple customization, so that the Bi〇S initializes the replacement memory when the CPU of the computer is reset. Also, the BIOS needs to transfer control of program execution back to the test program after the reset is completed. [0028] [0029] The reset action in this embodiment is performed only on the CPU and the memory controller 0, and does not refer to a reboot of a general computer. When the CPU and the memory controller are reset, unlike the S3 mode of the ACPI, the buffering time of power-off and wake-up is required, so the execution speed is higher than that of the embodiment described in the second and third figures. Come fast. Furthermore, if the embodiment is implemented entirely by XIP, that is, when the test program is executed on a memory such as _, EPROM, Flash Mempry or RAM on the external accessory card, the booting may be omitted. Memory. In this way, the computer only has the replacement memory inside, and therefore, the operation of the replacement 0S memory is not caused by the entity, which causes the computer to crash. The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the invention. It is intended that the equivalents of the present invention are included in the scope of the present invention. Bright. [Simple Description of the Drawings] The first figure is a flow chart of memory replacement in the prior art. The second drawing is a flow chart of a preferred embodiment of the present invention. 098140825 Form No. A0101 Page 12 of 23 0982070092-0 201118714 [0030] The third drawing is a flow chart of another preferred embodiment of the present invention. [0031] The fourth figure is a test flow diagram of a preferred embodiment of the present invention. [0032] The fifth drawing is a flow chart of still another preferred embodiment of the present invention. [Description of main component symbols] [〇〇33] <知知> [0034] S10-S26 Steps [0035] <The present invention> 〇[0036] S30~S40, S50~S58, S70~S76, S80~ S88...step
098140825 表單編號A0101 第13頁/共23頁 0982070092^0098140825 Form No. A0101 Page 13 of 23 0982070092^0