Nothing Special   »   [go: up one dir, main page]

KR20070080895A - Semiconductor chip package deposit apparatus and method using fluorinated ketone - Google Patents

Semiconductor chip package deposit apparatus and method using fluorinated ketone Download PDF

Info

Publication number
KR20070080895A
KR20070080895A KR1020060012377A KR20060012377A KR20070080895A KR 20070080895 A KR20070080895 A KR 20070080895A KR 1020060012377 A KR1020060012377 A KR 1020060012377A KR 20060012377 A KR20060012377 A KR 20060012377A KR 20070080895 A KR20070080895 A KR 20070080895A
Authority
KR
South Korea
Prior art keywords
semiconductor chip
chip package
fluorinated ketone
room
oven
Prior art date
Application number
KR1020060012377A
Other languages
Korean (ko)
Inventor
나민옥
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR1020060012377A priority Critical patent/KR20070080895A/en
Publication of KR20070080895A publication Critical patent/KR20070080895A/en

Links

Images

Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21VFUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V23/00Arrangement of electric circuit elements in or on lighting devices
    • F21V23/04Arrangement of electric circuit elements in or on lighting devices the elements being switches
    • F21V23/0414Arrangement of electric circuit elements in or on lighting devices the elements being switches specially adapted to be used with portable lighting devices
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21LLIGHTING DEVICES OR SYSTEMS THEREOF, BEING PORTABLE OR SPECIALLY ADAPTED FOR TRANSPORTATION
    • F21L4/00Electric lighting devices with self-contained electric batteries or cells
    • F21L4/04Electric lighting devices with self-contained electric batteries or cells characterised by the provision of a light source housing portion adjustably fixed to the remainder of the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/35Mechanical effects
    • H01L2924/351Thermal stress
    • H01L2924/3511Warping

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

An apparatus for storing a semiconductor chip package using fluorinated ketone is provided to vaporize residual fluorinated ketone liquid by making a semiconductor chip package soak into fluorinated ketone liquid while the semiconductor chip package is stagnated between fabricating processes and by performing a bake process. A fluorinated ketone room(20) includes a loading part(10) and at least one solution bath. A semiconductor chip package is loaded into the loading part. Fluorinated ketone liquid into which the semiconductor chip package inserted into the loading part is soaked is put into the at least one solution bath. An oven(30) vaporizes the fluorinated ketone liquid remaining on the semiconductor chip package taken out from the fluorinated ketone room. A transfer unit(40) transfers the semiconductor chip package from the loading part to the fluorinated ketone room and from the fluorinated ketone room to the oven. The loading part, the fluorinated ketone room and the oven are interconnected and intercepted by a mask window. An oven for baking the semiconductor chip package can be installed in the loading part.

Description

플루오르화 케톤을 이용한 반도체 칩 패키지 보관 장치 및 보관 방법{SEMICONDUCTOR CHIP PACKAGE DEPOSIT APPARATUS AND METHOD USING FLUORINATED KETONE}Semiconductor chip package storage device and storage method using fluorinated ketone {SEMICONDUCTOR CHIP PACKAGE DEPOSIT APPARATUS AND METHOD USING FLUORINATED KETONE}

도 1은 일반적인 반도체 칩 패키지의 제조 공정 중에 불량이 발생된 상태를 나타낸 단면도.1 is a cross-sectional view showing a state in which a failure occurs during the manufacturing process of a general semiconductor chip package.

도 2는 본 발명에 따른 반도체 칩 패키지 보관 장치를 개략적으로 나타낸 블록도.Figure 2 is a block diagram schematically showing a semiconductor chip package storage device according to the present invention.

도 3은 본 발명에 따른 반도체 칩 패키지 보관 방법을 나타낸 순서도.Figure 3 is a flow chart illustrating a semiconductor chip package storage method according to the present invention.

*도면의 주요 부분에 대한 설명** Description of the main parts of the drawings *

100; 반도체 칩 패키지 보관 장치.100; Semiconductor chip package storage device.

10; 로딩부10; Loading section

20; 플루오르화 케톤 룸(fluorinated ketone room)20; Fluorinated ketone room

30; 오븐(oven)30; Oven

40; 이송 장치(picker)40; Picker

50a,50b; 진공 흡입 장치50a, 50b; Vacuum suction device

201; 반도체 칩(semiconductor)201; Semiconductor chip

202; 배선 기판(circuit board)202; Circuit board

205; 반도체 칩 패키지(semiconductor chip package)205; Semiconductor chip package

본 발명은 반도체 칩 패키지 제조 장치와 제조 방법에 관한 것으로서, 더욱 상세하게는 반도체 칩 패키지의 제조 공정에서 반도체 칩 패키지가 공정간 정체될 때 반도체 칩 패키지의 흡습을 방지할 수 있는 반도체 칩 패키지 보관 장치와 보관 방법에 관한 것이다.The present invention relates to a semiconductor chip package manufacturing apparatus and a manufacturing method, and more particularly, a semiconductor chip package storage device that can prevent the moisture absorption of the semiconductor chip package when the semiconductor chip package is stagnant in the manufacturing process of the semiconductor chip package. And storage method.

반도체 칩 패키지의 제조 공정에서 전처리 공정을 진행한 뒤 배출된 반도체 칩 패키지가 공정 상의 이유로 후처리 공정으로 바로 투입되지 못하고 공정간 정체되는 경우가 있다. 이와 같이, 반도체 칩 패키지가 공정간 정체되는 경우, 반도체 칩 패키지는 공기중의 수분을 흡수하게 된다.The semiconductor chip package discharged after the pretreatment process in the manufacturing process of the semiconductor chip package may not be immediately introduced into the post-treatment process for the reasons of the process, and may be stagnant between processes. As such, when the semiconductor chip package is stagnant between processes, the semiconductor chip package absorbs moisture in the air.

도 1은 일반적인 반도체 칩 패키지의 제조 공정 중에 불량이 발생된 상태를 나타낸 단면도이다.1 is a cross-sectional view illustrating a state in which a defect occurs during a manufacturing process of a general semiconductor chip package.

일반적인 반도체 칩 패키지의 제조 공정에서 반도체 칩 패키지(205)가 공정간 정체되는 경우가 있는데, 이러한 반도체 칩 패키지(205)는 전처리 공정에서 열을 받은 상태로서 어느 정도의 휨(warpage)이 발생된 상태이거나 휨이 발생될 가능성이 있는 상태이다. 그런데, 이러한 반도체 칩 패키지(205)는 정체되는 동안 공기중의 수분을 흡수하여, 도 1에 도시된 바와 같이 휨 정도가 커지거나 휨이 발생될 가능성이 커진다. 고분자 물질을 포함하고 있는 접착제(adhesive), 수지 봉지부 (encapsulation; 201), 배선 기판(202)이 수분을 흡수하면 수분이 가소제(plasticizer) 역할을 하여, 흡수된 수분의 양에 따라 그들의 팽창 계수(modulus)나 강도(strength)와 같은 물성을 변화시키기 때문이다. 이러한 물성 변화로 인한 반도체 칩 패키지(205)의 휨은 외관 불량과 평탄도(coplanarity) 불량을 야기한다.In the manufacturing process of a general semiconductor chip package, the semiconductor chip package 205 may be stagnant between processes. The semiconductor chip package 205 is a state in which a warpage is generated to some extent as it is heated in a pretreatment process. Or a state in which warpage may occur. However, the semiconductor chip package 205 absorbs moisture in the air during stagnation, so that the degree of warpage may increase or the warpage may increase as shown in FIG. 1. When the adhesive, the resin encapsulation 201, and the wiring board 202 containing the polymer material absorb moisture, the moisture acts as a plasticizer, and their expansion coefficient depends on the amount of moisture absorbed. This is because they change physical properties such as modulus and strength. The warpage of the semiconductor chip package 205 due to the change in physical properties causes poor appearance and poor coplanarity.

그리고 수분을 흡수한 반도체 칩 패키지는 리플로우(reflow) 설비에서 솔더 볼 어태치(solder ball attach) 공정이나 기판 실장 공정이 진행될 때, 고온으로 인해 반도체 칩 패키지가 흡수한 수분이 패키지 내부에서 수증기로 변하게 된다. 이로 인해, 반도체 칩 패키지에는 팽창(swelling)이나 팝콘 크랙(popcorn crack)이 발생된다.In the case of a semiconductor chip package that absorbs moisture, the moisture absorbed by the semiconductor chip package due to high temperature is converted into water vapor inside the package when a solder ball attach process or a board mounting process is performed in a reflow facility. Will change. As a result, swelling or popcorn cracks occur in the semiconductor chip package.

한편, 전술한 문제의 발생을 방지하기 위하여, 반도체 칩 패키지 제조 공정에서 반도체 칩 패키지가 공정간 정체되는 경우, 반도체 칩 패키지를 125℃ 정도의 온도에서 일정 시간 베이크(bake)하여 탈습시키는 방법이 있다. 그러나, 고온이 가해진 반도체 칩 패키지는 베이크 이전과는 물성이 바뀐 상태가 되어, 베이크 이후에 반도체 칩 패키지의 휨이 다시 유발될 수 있다. 그리고 일정 시간, 예컨대 4 시간 정도 베이크를 진행하여야 하므로 공정시간이 길어지는 문제가 있다.On the other hand, in order to prevent the above-mentioned problem, when the semiconductor chip package is stagnant in the semiconductor chip package manufacturing process, there is a method to bake and dehumidify the semiconductor chip package at a temperature of about 125 ℃ for a certain time. . However, the semiconductor chip package subjected to high temperature is in a state where physical properties are changed from before the baking, and the bending of the semiconductor chip package may be caused again after baking. And there is a problem that the process time is long because the baking process for a certain time, for example about 4 hours.

따라서, 본 발명의 목적은 반도체 칩 패키지의 제조 공정에서 반도체 칩 패키지가 공정간 정체되는 경우, 수분을 흡수하는 것을 방지하는 반도체 칩 패키지 보관 장치와 보관 방법을 제공하는 데 있다.Accordingly, an object of the present invention is to provide a semiconductor chip package storage device and a storage method for preventing the absorption of moisture when the semiconductor chip package is stagnant in the manufacturing process of the semiconductor chip package.

이와 같은 목적을 달성하기 위하여, 본 발명은 반도체 칩 패키지가 로딩되는 로딩부; 로딩부에서 투입된 반도체 칩 패키지가 침지(沈漬)되는 플루오르화 케톤(fluorinated ketone) 액이 담긴 적어도 하나 이상의 용액조를 포함하는 플루오르화 케톤 룸; 플루오르화 케톤 룸에서 배출된 반도체 칩 패키지에 잔류된 플루오르화 케톤 액을 기화시키는 오븐; 반도체 칩 패키지를 로딩부에서 플루오르화 케톤 룸으로, 플루오르화 케톤 룸에서 오븐으로 이송시키는 이송 수단; 및 로딩부, 플루오르화 케톤 룸 및 오븐을 연결 및 차단시키는 차폐창을 포함하는 반도체 칩 패키지 보관 장치를 제공한다.In order to achieve the above object, the present invention is a loading unit for loading a semiconductor chip package; A fluorinated ketone room including at least one solution bath containing a fluorinated ketone liquid in which the semiconductor chip package introduced from the loading unit is immersed; An oven to vaporize the fluorinated ketone liquid remaining in the semiconductor chip package discharged from the fluorinated ketone room; Transfer means for transferring the semiconductor chip package from the loading section to the fluorinated ketone room and from the fluorinated ketone room to the oven; And a shielding window connecting and blocking the loading unit, the fluorinated ketone room, and the oven.

본 발명에 따른 반도체 칩 패키지 보관 장치에 있어서, 로딩부와 오븐에는 플루오르화 케톤 룸에서 유입된 플루오르화 케톤 기체를 플루오르화 케톤 룸으로 회수시키는 진공 흡입 장치가 각각 설치된다.In the semiconductor chip package storage device according to the present invention, a vacuum suction device for recovering the fluorinated ketone gas introduced from the fluorinated ketone room to the fluorinated ketone room is provided in the loading unit and the oven, respectively.

본 발명에 따른 반도체 칩 패키지 보관 장치에 있어서, 반도체 칩 패키지 제조 장치는 반도체 칩 패키지가 트레이에 수납되어 복수 개의 트레이로 이루어진 랏 단위로 이송되고, 용액조들에 랏 단위의 반도체 칩 패키지가 각각 침지된다.In the semiconductor chip package storage device according to the present invention, in the semiconductor chip package manufacturing apparatus, the semiconductor chip package is accommodated in a tray and transferred to a lot unit consisting of a plurality of trays, and the semiconductor chip package of a lot unit is immersed in solution baths, respectively. do.

본 발명에 따른 반도체 칩 패키지 보관 장치에 있어서, 로딩부에 반도체 칩 패키지를 베이크하는 오븐이 설치될 수 있다.In the semiconductor chip package storage device according to the present invention, an oven for baking the semiconductor chip package may be installed in the loading portion.

본 발명에 따른 반도체 칩 패키지 보관 방법은, ⒜반도체 칩 패키지를 로딩하는 단계; ⒝반도체 칩 패키지를 플루오르화 케톤 액에 침지하는 단계; 및 ⒞플루오르화 케톤 액에서 반도체 칩 패키지를 꺼내어, 반도체 칩 패키지에 잔류된 플루오르화 케톤 액을 기화시키는 단계를 포함한다.The semiconductor chip package storage method according to the present invention comprises the following steps: loading a semiconductor chip package; Immersing the semiconductor chip package in a fluorinated ketone liquid; And removing the semiconductor chip package from the fluorinated ketone liquid to vaporize the fluorinated ketone liquid remaining in the semiconductor chip package.

본 발명에 따른 반도체 칩 패키지 보관 방법에 있어서, ⒜단계는 반도체 칩 패키지를 베이크하는 단계를 포함할 수 있다.In the semiconductor chip package storage method according to the present invention, the step (B) may include baking the semiconductor chip package.

본 발명에 따른 반도체 칩 패키지 보관 방법에 있어서, ⒜단계는 반도체 칩 패키지를 트레이에 수납하여 복수 개의 트레이로 이루어진 랏 단위로 이송하고, 랏 단위의 반도체 칩 패키지를 플루오르화 케톤 액에 침지하기 전에 그 랏의 아이디를 저장 수단에 저장하는 단계를 포함하며, ⒝단계를 진행하기 전에 제어 수단이 플루오르화 케톤 액이 담긴 복수 개의 용액조 중에서 그 랏 단위의 반도체 칩 패키지를 침지할 위치를 지정하는 단계를 포함하고, ⒞단계는 사용자의 랏 아이디 요구에 따라 선택적으로 랏 단위의 반도체 칩 패키지를 꺼낸 뒤, 반도체 칩 패키지에 잔류된 플루오르화 케톤 액의 기화를 진행한다.In the method for storing a semiconductor chip package according to the present invention, the step (b) includes storing the semiconductor chip package in a tray and transferring the lot into a lot unit consisting of a plurality of trays, and before immersing the semiconductor chip package in a lot unit in a fluorinated ketone solution. And storing the ID of the lot in a storage means, and before the step iii, the control means designates a position to immerse the semiconductor chip package of the lot unit among a plurality of solution tanks containing a fluorinated ketone solution. In the step S, the semiconductor chip package of the lot unit is selectively taken out according to the lot ID request of the user, and the fluorinated ketone liquid remaining in the semiconductor chip package is vaporized.

본 발명에 따른 반도체 칩 패키지 보관 방법에 있어서, ⒞단계는 49 ~ 100℃의 열을 1 ~ 5분 동안 가하여 반도체 칩 패키지에 잔류된 플루오르화 케톤 액의 기화를 진행한다.In the semiconductor chip package storage method according to the present invention, the step (f) is performed by applying heat of 49 to 100 ° C. for 1 to 5 minutes to vaporize the fluorinated ketone liquid remaining in the semiconductor chip package.

이하, 첨부 도면을 참조하여 본 발명의 바람직한 실시예를 보다 상세하게 설명하도록 한다. 첨부 도면에 있어서 일부 구성요소는 도면의 명확한 이해를 돕기 위해 다소 과장되거나 개략적으로 도시되거나 또는 생략되었으며, 각 구성요소의 실제 크기가 전적으로 반영된 것은 아니다. Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the accompanying drawings, some of the components are somewhat exaggerated, schematically illustrated or omitted to facilitate a clear understanding of the drawings, and the actual size of each component is not entirely reflected.

실시예Example

도 2는 본 발명에 따른 반도체 칩 패키지 보관 장치를 개략적으로 나타낸 블 록도이다.Figure 2 is a block diagram schematically showing a semiconductor chip package storage device according to the present invention.

도 2를 참조하면, 본 발명에 따른 반도체 칩 패키지 보관 장치(100)는 로딩부(10), 플루오르화 케톤 룸(fluorinated ketone;20), 오븐(oven;30) 및 이송 수단(40)을 포함한다. 플루오르화 케톤 룸(20)에는 플루오르화 케톤 액이 담긴 복수 개의 용액조가 형성되고, 그 용액조에 반도체 칩 패키지가 침지되는 것을 특징으로 한다.2, the semiconductor chip package storage device 100 according to the present invention includes a loading unit 10, a fluorinated ketone 20, an oven 30, and a transfer means 40. do. The fluorinated ketone room 20 is characterized in that a plurality of solution tanks containing the fluorinated ketone liquid are formed, and the semiconductor chip package is immersed in the solution bath.

로딩부(10)에는 반도체 칩 패키지 제조 공정에서 공정간 정체되는 반도체 칩 패키지가 로딩된다. 여기서, 반도체 칩 패키지는 트레이에 수납되어 복수 개의 트레이로 이루어진 랏(lot) 단위로 로딩부(10)에 투입된다. 로딩부(10)에는 진공 흡입 장치(50a)가 설치된다. 진공 흡입 장치(50a)는 로딩부(10)와 플루오르화 케톤 룸(20) 사이의 차폐창이 개방될 때 로딩부(10)로 유입된 플루오르화 케톤 기체를 흡입하여 플루오르화 케톤 룸(20)에 회수한다. 그리고 로딩부(10)에는 오븐(oven)이 설치될 수 있다. 로딩된 반도체 칩 패키지 중에서는 플립 칩 패키지(flip chip package)와 같이 구조의 특성상 제조 공정 진행 중에 수분 침투에 취약한 패키지가 있다. 이러한 반도체 칩 패키지의 경우, 먼저 반도체 칩 패키지에 흡수된 수분의 제거를 위하여 베이크를 진행하기 위해서이다. The loading unit 10 is loaded with a semiconductor chip package stagnated between processes in the semiconductor chip package manufacturing process. Here, the semiconductor chip package is accommodated in a tray and inserted into the loading unit 10 in a unit of a lot consisting of a plurality of trays. The vacuum suction device 50a is installed in the loading unit 10. The vacuum suction device 50a sucks the fluorinated ketone gas introduced into the loading unit 10 when the shielding window between the loading unit 10 and the fluorinated ketone room 20 is opened, and enters the fluorinated ketone room 20. Recover. In addition, an oven may be installed in the loading unit 10. Among the loaded semiconductor chip packages, there is a package that is vulnerable to moisture penetration during the manufacturing process due to the characteristics of the structure, such as a flip chip package. In the case of such a semiconductor chip package, first, baking is performed to remove moisture absorbed into the semiconductor chip package.

플루오르화 케톤 룸(20)은 로딩부(10)와 연결되어 설치되고, 이들 사이에는 플루오르화 케톤 룸(20)을 외부와 차단시키는 차폐창이 설치된다. 플루오르화 케톤 룸(20)에는 복수 개의 용액조가 형성된다. 용액조는 랏 단위의 반도체 칩 패키지가 침지되어 보관되는 플루오르화 케톤 액이 담겨져 있다. 플루오르화 케톤은 케톤의 분자에서 수소 원자를 불소로 치완해 인위적으로 만든 물질로서, CF3CF2(O)CF(CF3)2라는 분자식을 갖는다. 불소는 안정된 성질을 가지고 있어서, 플루오르화 케톤은 전기가 통하지 않고, 접촉한 물질과 산화 등의 반응을 일으키지 않는다. 그리고 플루오르화 케톤의 끓는점은 49℃로서 물보다 훨씬 낮아, 이 물질에 넣어다 꺼낸 물건은 금방 마른다.The fluorinated ketone room 20 is installed in connection with the loading unit 10, and a shielding window for blocking the fluorinated ketone room 20 from the outside is installed therebetween. A plurality of solution tanks are formed in the fluorinated ketone room 20. The solution tank contains a fluorinated ketone liquid in which the semiconductor chip package of the lot unit is immersed and stored. Fluorinated ketones are artificially made from the ketone molecules by hydrogen fluorine, which has a molecular formula of CF 3 CF 2 (O) CF (CF 3 ) 2 . Fluorine has a stable property, so fluorinated ketones do not conduct electricity and do not cause a reaction such as oxidation with a contacted substance. The boiling point of the ketone fluoride is 49 ° C, much lower than that of water, so that it is quickly dried.

오븐(30)은 플루오르화 케톤 룸(20)과 연결되어 설치되고, 이들 사이에는 플루오르화 케톤 룸(20)을 외부와 차단시키는 차폐창이 설치된다. 오븐(30)은 플루오르화 케톤 액에 침지되었던 반도체 칩 패키지에 잔류된 플루오르화 케톤 액을 기화시킨다. 오븐(30)은 플루오르화 케톤 액의 끓는점과 물의 끓는점 사이의 온도, 즉 49 ~ 100℃의 온도에서 짧은 시간, 예컨대 1 ~ 5 분 동안 반도체 칩 패키지를 베이크한다. 오븐(30)에는 진공 흡입 장치(50b)가 설치된다. 진공 흡입 장치(50b)는 오븐(30)과 플루오르화 케톤 룸(20) 사이의 차폐창이 개방될 때 오븐(30)으로 유입된 플루오르화 케톤 기체를 흡입하여 플루오르화 케톤 룸(20)에 회수한다.The oven 30 is installed in connection with the fluorinated ketone room 20, and between them, a shielding window is provided to block the fluorinated ketone room 20 from the outside. The oven 30 vaporizes the fluorinated ketone liquid remaining in the semiconductor chip package that was immersed in the fluorinated ketone liquid. The oven 30 bakes the semiconductor chip package for a short time, such as 1 to 5 minutes, at a temperature between the boiling point of the fluorinated ketone liquid and the boiling point of water, that is, 49 to 100 ° C. The oven 30 is provided with a vacuum suction device 50b. The vacuum suction device 50b sucks the fluorinated ketone gas introduced into the oven 30 and recovers it to the fluorinated ketone room 20 when the shielding window between the oven 30 and the fluorinated ketone room 20 is opened. .

이송 수단(40)은 로딩부(10)에서 플루오르화 케톤 룸(20)으로, 플루오르화 케톤 룸(20)에서 오븐(30)으로 이동하면서, 랏 단위의 반도체 칩 패키지를 이송한다. 이송 수단(40)은 랏 단위의 반도체 칩 패키지를 진공 흡입과 같은 방법으로 이송하는 피커(picker)이다.The transfer means 40 transfers the semiconductor chip package in units of lots while moving from the loading unit 10 to the fluorinated ketone room 20 and from the fluorinated ketone room 20 to the oven 30. The transfer means 40 is a picker for transferring the semiconductor chip package in units of lots in a manner such as vacuum suction.

본 실시예에 따른 반도체 칩 패키지 보관 장치는 반도체 칩 패키지의 설비 간 이동 경로에 설치되어, 공정간 정체된 반도체 칩 패키지가 보관될 수 있다. 이 러한 경우로는 예를 들어, 반도체 칩 패키지의 조립 공정에서 반도체 칩 패키지의 포스트 큐어(post cure) 설비와 솔더 볼 어태치 설비 사이에 설치될 수 있다. 그리고 반도체 칩 패키지의 실장 공정에서 진공 포장 개봉 설비와 리플로우 설비 사이에 설치될 수 있고, 또한 플립 칩 패키지에서 플럭스(flux) 제거 후 투입되는 베이크 설비와 언더필(underfill) 설비 사이에 설치될 수 있다.The semiconductor chip package storage apparatus according to the present exemplary embodiment may be installed in a movement path between facilities of the semiconductor chip package so that the semiconductor chip package stagnated between processes may be stored. In this case, for example, the semiconductor chip package may be installed between a post cure facility and a solder ball attach facility of the semiconductor chip package. In addition, the semiconductor chip package may be installed between the vacuum packaging opening equipment and the reflow equipment in the mounting process of the semiconductor chip package, and may be installed between the baking equipment and the underfill equipment that are added after removing the flux from the flip chip package. .

본 실시예에 따른 반도체 칩 패키지 보관 장치는 반도체 칩 패키지 제조 공정 중에서 반도체 칩 패키지가 공정간 정체되는 경우, 반도체 칩 패키지를 플루오르화 케톤 액에 침지시킨 뒤, 패키지에 잔류된 플루오르화 케톤 액이 기화되도록 베이크한다. 플루오르화 케톤 액은 안정된 상태이고, 반도체 칩 패키지의 흡습이 방지되도록 외부와 차단시켜주므로 공정간 정체되는 동안 패키지의 흡습이 방지된다. 이와 같은 본 실시예에 따른 반도체 칩 패키지의 보관 방법에 대해 이하에서 설명한다.In the semiconductor chip package storage device according to the present embodiment, when the semiconductor chip package is stagnant during the semiconductor chip package manufacturing process, the semiconductor chip package is immersed in the fluorinated ketone liquid, and the fluorinated ketone liquid remaining in the package is vaporized. Bake as much as possible. The fluorinated ketone liquid is in a stable state and is blocked from the outside to prevent moisture absorption of the semiconductor chip package, thereby preventing moisture absorption of the package during stagnation between processes. The storage method of the semiconductor chip package according to the present embodiment will be described below.

도 3은 본 발명에 따른 반도체 칩 패키지 보관 방법을 나타낸 순서도이다.3 is a flowchart illustrating a method of storing a semiconductor chip package according to the present invention.

도 3을 참조하면, 먼저, 반도체 칩 패키지를 로딩부에 투입한다(61). 반도체 칩 패키지는 공정간 정체되는 패키지로서, 트레이에 수납되어 복수 개의 트레이로 이루어진 랏 단위로 로딩부에 투입한다. 여기서, 랏 아이디(ID)가 저장 수단에 저장된다. 플립 칩 패키지와 같이 수분 침투에 취약한 패키지의 수분 제거를 위하여, 로딩부에 투입된 반도체 칩 패키지에 베이크를 진행할 수 있다.Referring to FIG. 3, first, a semiconductor chip package is put into a loading unit (61). The semiconductor chip package is a package that is stagnant between processes and is stored in a tray and put into a loading unit in a lot unit consisting of a plurality of trays. Here, a lot ID is stored in the storage means. In order to remove moisture of a package vulnerable to moisture penetration, such as a flip chip package, baking may be performed on the semiconductor chip package introduced into the loading unit.

다음으로, 로딩부와 플루오르화 케톤 룸 사이의 차폐창을 개방하여 이송 수단으로 반도체 칩 패키지를 플루오르화 케톤 룸에 투입하고, 반도체 칩 패키지를 플루오르화 케톤 액에 침지시킨다(62). 플루오르화 케톤 룸으로 랏 단위의 반도체 칩 패키지를 이송하면, 제어 수단이 플루오르화 케톤 액이 담긴 복수 개의 용액조 중에서 이 반도체 칩 패키지를 침지할 위치를 지정한다. 제어 수단이 지정한 위치에 랏 단위의 반도체 칩 패키지를 침지한다.Next, the shielding window between the loading section and the fluorinated ketone room is opened, the semiconductor chip package is introduced into the fluorinated ketone room by the transfer means, and the semiconductor chip package is immersed in the fluorinated ketone liquid (62). When the semiconductor chip package in units of lots is transferred to the fluorinated ketone room, the control means designates a position at which the semiconductor chip package is to be immersed among a plurality of solution tanks containing the fluorinated ketone liquid. The control means immerses a semiconductor chip package in units of lots at a designated position.

그 후에, 차폐창을 폐쇄하여 플루오르화 케톤 룸을 외부와 차단시키고, 로딩부로 유입된 플루오르화 케톤 기체를 진공 흡입 장치로 흡입하여 플루오르화 케톤 룸에 회수한다(63).Thereafter, the shielding window is closed to block the fluorinated ketone room from the outside, and the fluorinated ketone gas introduced into the loading unit is sucked into the vacuum suction device and recovered to the fluorinated ketone room (63).

다음으로, 사용자의 랏 아이디 요구에 따라 반도체 칩 패키지를 플루오르화 케톤 액에서 꺼내어, 오븐에 투입한다(64). 오븐에 투입된 반도체 칩 패키지는 1 ~ 5분 동안 가해지는 49 ~ 100℃의 열에 의하여 잔류된 플루오르화 케톤 액이 기화된다.Next, the semiconductor chip package is taken out of the fluorinated ketone liquid and put into the oven according to the lot ID request of the user (64). In the semiconductor chip package put into the oven, the remaining fluorinated ketone liquid is vaporized by 49 to 100 ° C. heat applied for 1 to 5 minutes.

그리고 플루오르화 케톤 룸을 외부와 차단시키고, 오븐으로 유입된 플루오르화 케톤 기체를 진공 흡입장치로 흡입하여 플루오르화 케톤 룸에 회수한 뒤(63), 반도체 칩 패키지를 배출한다.Then, the fluorinated ketone room is shut off from the outside, and the fluorinated ketone gas introduced into the oven is sucked by a vacuum suction device and recovered to the fluorinated ketone room (63), and then the semiconductor chip package is discharged.

한편, 본 실시예에 따른 반도체 칩 패키지 보관 장치는 반도체 칩 패키지의 설비 간 이동 경로에 설치되어, 반도체 칩 패키지의 보관 방법이 진행되는 것에 한정되는 것은 아니다. 반도체 칩 패키지의 제조 공정에서 정체되는 반도체 칩 패키지가 투입되어 반도체 칩 패키지가 공기중의 수분을 흡수하는 문제를 방지할 수 있다.On the other hand, the semiconductor chip package storage device according to the present embodiment is installed in the movement path between the facilities of the semiconductor chip package, it is not limited to the progress of the storage method of the semiconductor chip package. The semiconductor chip package, which is stagnant in the manufacturing process of the semiconductor chip package, may be introduced to prevent the semiconductor chip package from absorbing moisture in the air.

이상과 같은 본 발명에 따른 반도체 칩 패키지 보관 장치와 보관 방법에 의하면, 제조 공정 진행 중에 정체되는 반도체 칩 패키지를 공정간 정체되는 동안 플루오르화 케톤 액에 침지시킨 뒤, 베이크하여 잔류되는 플루오르화 케톤 액을 기화시킨다. 따라서, 플루오르화 케톤 액은 안정된 상태이고, 반도체 칩 패키지의 흡습이 방지되도록 외부와 차단시켜주므로 반도체 칩 패키지의 흡습이 방지된다.According to the semiconductor chip package storage device and storage method according to the present invention as described above, the fluorinated ketone liquid remaining by immersing the semiconductor chip package stagnated during the manufacturing process in the fluorinated ketone liquid during the process stagnation, and then baked Vaporize. Therefore, the fluorinated ketone liquid is in a stable state and is blocked from the outside so as to prevent moisture absorption of the semiconductor chip package, thereby preventing moisture absorption of the semiconductor chip package.

또한, 공정간 정체되는 반도체 칩 패키지뿐만이 아니라, 전처리 공정 설비와 후처리 공정 설비 사이에 본 발명에 따른 반도체 칩 패키지 보관 장치가 설치되어, 공정간 이동되는 반도체 칩 패키지의 흡습도 방지할 수 있다.In addition, the semiconductor chip package storage device according to the present invention may be installed between the pretreatment process facility and the posttreatment process facility as well as the semiconductor chip package that is stagnant between processes, thereby preventing moisture absorption of the semiconductor chip package that is moved between processes.

Claims (8)

반도체 칩 패키지가 로딩되는 로딩부;A loading unit in which a semiconductor chip package is loaded; 상기 로딩부에서 투입된 상기 반도체 칩 패키지가 침지(沈漬)되는 플루오르화 케톤(fluorinated ketone) 액이 담긴 적어도 하나 이상의 용액조를 포함하는 플루오르화 케톤 룸;A fluorinated ketone room including at least one solution tank containing a fluorinated ketone liquid in which the semiconductor chip package introduced from the loading unit is immersed; 상기 플루오르화 케톤 룸에서 배출된 상기 반도체 칩 패키지에 잔류된 상기 플루오르화 케톤 액을 기화시키는 오븐;An oven to vaporize the fluorinated ketone liquid remaining in the semiconductor chip package discharged from the fluorinated ketone room; 상기 반도체 칩 패키지를 상기 로딩부에서 상기 플루오르화 케톤 룸으로, 상기 플루오르화 케톤 룸에서 상기 오븐으로 이송시키는 이송 수단; 및Transfer means for transferring said semiconductor chip package from said loading portion to said fluorinated ketone room and from said fluorinated ketone room to said oven; And 상기 로딩부, 플루오르화 케톤 룸 및 오븐을 연결 및 차단시키는 차폐창을 포함하는 것을 특징으로 하는 반도체 칩 패키지 보관 장치.And a shielding window connecting and blocking the loading unit, the fluorinated ketone room, and the oven. 제1 항에 있어서,According to claim 1, 상기 로딩부와 오븐에는 상기 플루오르화 케톤 룸에서 유입된 플루오르화 케톤 기체를 상기 플루오르화 케톤 룸으로 회수시키는 진공 흡입 장치가 각각 설치된 것을 특징으로 하는 반도체 칩 패키지 보관 장치.And a vacuum suction device for recovering the fluorinated ketone gas introduced from the fluorinated ketone room to the fluorinated ketone room is installed in the loading unit and the oven, respectively. 제1 항에 있어서,According to claim 1, 상기 반도체 칩 패키지 제조 장치는 상기 반도체 칩 패키지가 트레이에 수납 되어 복수 개의 트레이로 이루어진 랏(lot) 단위로 이송되고, 상기 용액조들에 상기 랏 단위의 반도체 칩 패키지가 각각 침지되는 것을 특징으로 하는 반도체 칩 패키지 보관 장치.The semiconductor chip package manufacturing apparatus is characterized in that the semiconductor chip package is accommodated in a tray and transferred in a lot unit consisting of a plurality of trays, the semiconductor chip package of the lot unit is immersed in the solution bath, respectively. Semiconductor chip package storage device. 제1 항에 있어서,According to claim 1, 상기 로딩부에 상기 반도체 칩 패키지를 베이크(bake)하는 오븐이 설치된 것을 특징으로 하는 반도체 칩 패키지 보관 장치.The semiconductor chip package storage device, characterized in that the oven for baking the semiconductor chip package (baking) is installed in the loading portion. ⒜반도체 칩 패키지를 로딩하는 단계;⒜loading the semiconductor chip package; ⒝상기 반도체 칩 패키지를 플루오르화 케톤 액에 침지하는 단계; 및Immersing the semiconductor chip package in a fluorinated ketone solution; And ⒞상기 플루오르화 케톤 액에서 상기 반도체 칩 패키지를 꺼내어, 상기 반도체 칩 패키지에 잔류된 상기 플루오르화 케톤 액을 기화시키는 단계를 포함하는 것을 특징으로 하는 반도체 칩 패키지 보관 방법.(B) removing the semiconductor chip package from the fluorinated ketone liquid, and vaporizing the fluorinated ketone liquid remaining in the semiconductor chip package. 제5 항에 있어서,The method of claim 5, 상기 ⒜단계는 상기 반도체 칩 패키지를 베이크하는 단계를 포함하는 것을 특징으로 하는 반도체 칩 패키지 보관 방법.And the step (b) comprises baking the semiconductor chip package. 제5 항에 있어서,The method of claim 5, 상기 ⒜단계는 상기 반도체 칩 패키지를 트레이에 수납하여 복수 개의 트레 이로 이루어진 랏 단위로 이송하고, 상기 랏 단위의 반도체 칩 패키지를 상기 플루오르화 케톤 액에 침지하기 전에 상기 랏의 아이디(ID)를 저장 수단에 저장하는 단계를 포함하며, 상기 ⒝단계를 진행하기 전에 제어 수단이 상기 플루오르화 케톤 액이 담긴 복수 개의 용액조 중에서 상기 랏 단위의 반도체 칩 패키지를 침지할 위치를 지정하는 단계를 포함하고, 상기 ⒞단계는 사용자의 랏 아이디 요구에 따라 선택적으로 상기 랏 단위의 반도체 칩 패키지를 꺼낸 뒤, 상기 반도체 칩 패키지에 잔류된 상기 플루오르화 케톤 액의 기화를 진행하는 것을 특징으로 하는 반도체 칩 패키지 보관 방법.In step ⒜, the semiconductor chip package is stored in a tray and transferred to a lot unit consisting of a plurality of trays, and the ID of the lot is stored before the semiconductor chip package of the lot unit is immersed in the fluorinated ketone liquid. And storing, in a means, a position for immersing the semiconductor chip package of the lot unit in a plurality of solution tanks containing the fluorinated ketone liquid before proceeding to the step iii. In the step (i), the semiconductor chip package storage method may include selectively removing the semiconductor chip package of the lot unit according to a lot ID request of a user, and then vaporizing the fluorinated ketone liquid remaining in the semiconductor chip package. . 제5 항에 있어서,The method of claim 5, 상기 ⒞단계는 49 ~ 100℃의 열을 1 ~ 5분 동안 가하여 상기 반도체 칩 패키지에 잔류된 상기 플루오르화 케톤 액의 기화를 진행하는 것을 특징으로 하는 반도체 칩 패키지 보관 방법.The step (V) is a semiconductor chip package storage method, characterized in that the vaporization of the fluorinated ketone liquid remaining in the semiconductor chip package by applying a heat of 49 ~ 100 ℃ for 1 to 5 minutes.
KR1020060012377A 2006-02-09 2006-02-09 Semiconductor chip package deposit apparatus and method using fluorinated ketone KR20070080895A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020060012377A KR20070080895A (en) 2006-02-09 2006-02-09 Semiconductor chip package deposit apparatus and method using fluorinated ketone

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060012377A KR20070080895A (en) 2006-02-09 2006-02-09 Semiconductor chip package deposit apparatus and method using fluorinated ketone

Publications (1)

Publication Number Publication Date
KR20070080895A true KR20070080895A (en) 2007-08-14

Family

ID=38601124

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060012377A KR20070080895A (en) 2006-02-09 2006-02-09 Semiconductor chip package deposit apparatus and method using fluorinated ketone

Country Status (1)

Country Link
KR (1) KR20070080895A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8680421B2 (en) 2009-06-12 2014-03-25 Abb Technology Ag Encapsulated switchgear
US8709303B2 (en) 2010-12-14 2014-04-29 Abb Research Ltd. Dielectric insulation medium
US8822870B2 (en) 2010-12-14 2014-09-02 Abb Technology Ltd. Dielectric insulation medium
US8916059B2 (en) 2009-06-17 2014-12-23 Abb Technology Ag Fluorinated ketones as high-voltage insulating medium
US9172221B2 (en) 2011-12-13 2015-10-27 Abb Technology Ag Converter building
US9257213B2 (en) 2010-12-16 2016-02-09 Abb Technology Ag Dielectric insulation medium

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8680421B2 (en) 2009-06-12 2014-03-25 Abb Technology Ag Encapsulated switchgear
US8704095B2 (en) 2009-06-12 2014-04-22 Abb Technology Ag Dielectric insulation medium
US9196431B2 (en) 2009-06-12 2015-11-24 Abb Technology Ag Encapsulated switchgear
US9928973B2 (en) 2009-06-12 2018-03-27 Abb Technology Ag Dielectric insulation medium
US8916059B2 (en) 2009-06-17 2014-12-23 Abb Technology Ag Fluorinated ketones as high-voltage insulating medium
US8709303B2 (en) 2010-12-14 2014-04-29 Abb Research Ltd. Dielectric insulation medium
US8822870B2 (en) 2010-12-14 2014-09-02 Abb Technology Ltd. Dielectric insulation medium
US9257213B2 (en) 2010-12-16 2016-02-09 Abb Technology Ag Dielectric insulation medium
US9172221B2 (en) 2011-12-13 2015-10-27 Abb Technology Ag Converter building

Similar Documents

Publication Publication Date Title
KR20070080895A (en) Semiconductor chip package deposit apparatus and method using fluorinated ketone
JP6839206B2 (en) Covering with ALD to reduce metal whiskers
TW200939325A (en) Substrate treating apparatus and substrate treating method
TW201831068A (en) Method for manufacturing a printed circuit board
KR20150062545A (en) Bake Apparatus
US7588968B1 (en) Linked chip attach and underfill
JP6894289B2 (en) Wiring board and its manufacturing method
KR20120017967A (en) Method of manufacturing a printed circuit board
US3755890A (en) Vacuum-heat treatment of printed circuit boards
KR101231309B1 (en) Substrate treatment apparatus, substrate treatment method and recording medium having program recorded
KR101255958B1 (en) Method for manufacturing of circuit board
US20060112973A1 (en) Method and apparatus for substrate processing
US10319612B2 (en) Method for the rapid processing of polymer layers in support of imidization processes and fan out wafer level packaging including effiecient drying of precursor layers
Pietrikova et al. Moisture Absorption of Glass-Epoxy Sandwich Structure
CN102074487B (en) Semiconductor assembly structure and forming method thereof
JP2009252869A (en) Method of manufacturing semiconductor device, and semiconductor device manufactured by the method
RU2812158C1 (en) Method for vacuum soldering solder balls to leading platforms of ceramic metal cases of matrix type
KR102530371B1 (en) Method for coating a substrate
JP2016004975A (en) Method of manufacturing laminated circuit board
JP7518881B2 (en) Board Protection
US8450148B2 (en) Molding compound adhesion for map-molded flip-chip
JP3805674B2 (en) Non-woven fabric for electrical insulation and manufacturing method thereof, prepreg, laminated board and printed wiring board
KR101067429B1 (en) Process for manufacturing semiconductor device and semiconductor device manufactured by such process
Ko et al. Humidity and Corrosion Analysis and Design
Liu et al. Moisture induced interface delamination for EMI shielding package

Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination