KR19990081141A - Parts cleaning device of semiconductor cleaning equipment - Google Patents
Parts cleaning device of semiconductor cleaning equipment Download PDFInfo
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- KR19990081141A KR19990081141A KR1019980014920A KR19980014920A KR19990081141A KR 19990081141 A KR19990081141 A KR 19990081141A KR 1019980014920 A KR1019980014920 A KR 1019980014920A KR 19980014920 A KR19980014920 A KR 19980014920A KR 19990081141 A KR19990081141 A KR 19990081141A
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Abstract
본 발명은 반도체 세정장비의 부품세척장치에 관한 것으로, 순환라인(13)의 입구부와 출구부에 순수공급라인(20)과 순수배출라인(30)을 설치하고, 그 순수공급라인(20)과 순수배출라인(30)에 각각 개,폐밸브(21)(31)와 체크밸브(22)(32)를 설치하며, 그 반대측의 순환라인(13)에도 개,폐밸브(23)(33)를 설치하여, 순환라인(13) 상에 설치된 부품의 교체시 순수공급라인(20)으로 순수를 공급하고, 그 공급된 순수가 순환라인(13) 및 부품에 존재하는 케미컬과 함께 순수배출라인(30)으로 배출되어 세정되도록 한 다음 부품을 교체함으로써, 종래와 같이 세정시와 마찬가지로 내조에 순수를 넣고 순환시키는 경우보다 부품의 세척이 용이한 효과가 있다.The present invention relates to a component washing apparatus for a semiconductor cleaning equipment, wherein a pure water supply line (20) and a pure water discharge line (30) are installed at an inlet and an outlet of a circulation line (13), and the pure water supply line (20). And the open and closed valves 21 and 31 and the check valves 22 and 32 are respectively installed in the pure water discharge line 30 and the open and closed valves 23 and 33 in the circulation line 13 on the opposite side thereof. ) To supply pure water to the pure water supply line 20 when the parts installed on the circulation line 13 are replaced, and the supplied pure water is pure water discharge line together with the chemicals present in the circulation line 13 and the components. By discharging to 30 and replacing the parts, there is an effect that the parts are easier to clean than when the pure water is put into the inner tank and circulated as in the conventional cleaning.
Description
본 발명은 반도체 세정장비의 부품세척장치에 관한 것으로, 특히 부품의 교체시에 용이하게 순환라인의 케미컬을 제거할 수 있도록 하는데 적합한 반도체 세정장비의 부품세척장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a component cleaning apparatus for semiconductor cleaning equipment, and more particularly, to a component cleaning apparatus for semiconductor cleaning equipment suitable for making it possible to easily remove chemicals from circulation lines when replacing components.
일반적으로 반도체 웨이퍼의 습식식각 및 이물질제거가 이루어지는 세정장비가 도 1데 도시되어 있는 바, 이를 간단히 설명하면 다음과 같다.In general, a cleaning apparatus for wet etching and removing foreign substances of a semiconductor wafer is illustrated in FIG. 1, which is briefly described as follows.
도 1은 종래 반도체 세정장비의 구조를 보인 배관도로서, 도시된 바와 같이, 종래 반도체 세정장비는 케미컬이 수납될 수 있도록 상측이 개구된 박스체의 내조(INNER BATH)(1)와, 그 내조(1)의 양 외측에 설치되며 내조(1)에서 오버 플로우(OVER FLOW)된 케미컬이 넘칠 수 있는 외조(OUTER BATH)(2)와, 그 외조(2)와 내조(1)가 연결되어 케미컬이 순환할 수 있도록 설치되는 순환라인(3) 및 내조(1)의 하측에 설치되는 드레인 라인(4)으로 구성되어 있다.1 is a piping diagram showing the structure of a conventional semiconductor cleaning equipment, as shown in the conventional semiconductor cleaning equipment, the inner tank (INNER BATH) (1) of the upper side is opened so that the chemical can be accommodated, and the inner tank ( It is installed on both outer sides of 1) and the outer bath (2), which overflows from the inner tank (1), can overflow, and the outer tank (2) and the inner tank (1) are connected to the chemical It consists of the circulation line 3 provided so that it can circulate, and the drain line 4 provided below the inner tank 1. As shown in FIG.
그리고, 상기 순환라인(3) 상에는 케미컬을 펌핑하기 위한 펌프(5), 케미컬의 흐르는 맥동을 제어하기 위한 댐퍼(DAMPER)(6), 케미컬 중의 미립자를 제거하기 위한 필터(FILTER)(7), 케미컬의 온도를 조절하기 위한 온도조절기(HEATER)(8)가 설치되어 있다.And, on the circulation line (3), a pump (5) for pumping the chemical, a damper (DAMPER) (6) for controlling the flowing pulsation of the chemical, a filter (FILTER) (7) for removing particulates in the chemical, A temperature controller (HEATER) 8 is provided for controlling the temperature of the chemical.
상기와 같이 구성되어 있는 종래 반도체 세정장비는 내조(1)의 내측에 케미컬을 수납한 상태에서 내조(1)의 내측에 웨이퍼들을 로딩한다. 그런 다음, 펌프(5)로 펌핑을 하면 케미컬이 내조(1)에서 외조(2)로 오버 플로우되고, 그 오버 플로우된 케미컬이 순환라인(3) 라인 상을 흐르며 이물질들이 제거된 상태로 적정온도로 조절되어 다시 내조(1)로 공급되며 일정시간 케미컬이 순환되면서 웨이퍼에 부착되어 있는 이물질의 제거 및 식각이 진행된다.The conventional semiconductor cleaning equipment configured as described above loads wafers into the inner tank 1 in a state in which the chemical is stored in the inner tank 1. Then, when pumping with the pump (5), the chemical overflows from the inner tank (1) to the outer tank (2), the overflowed chemical flows on the circulation line (3) line and the appropriate temperature with the foreign matters removed It is controlled to be supplied to the inner tank (1) again and the chemical is circulated for a certain time to remove and etch the foreign matter attached to the wafer.
그리고, 장기간 사용으로 순환라인(3) 상의 부품을 교체시에는 드레인 라인(4)으로 케미컬을 배출한 다음, 내조(1)에 순수를 넣고, 펌프(5)로 펌핑하여 순환라인(3)의 내측에 존재하는 케미컬의 잔량을 완전히 제거한 다음, 드레인 라인(4)으로 순수를 배출하고, 부품을 교체한다.When the components on the circulation line 3 are replaced by long-term use, the chemicals are discharged to the drain line 4, and then pure water is introduced into the inner tank 1 and pumped by the pump 5 to After completely removing the residual amount of chemical present inside, the pure water is discharged to the drain line 4, and the parts are replaced.
그러나, 상기와 같이 장비의 장기간 사용으로 순환라인(3) 상에 설치된 부품의 교체시 세정작업시와 마찬가지로 장비 전체에 순수를 순환시키며 순환라인(3)에 존재하는 케미컬들을 제거하여야 하므로 상당히 번거로운 문제점이 있었다.However, as long as the use of the equipment as described above, when replacing the parts installed on the circulation line (3) as in the cleaning operation, the pure water is circulated throughout the equipment and the chemicals present in the circulation line (3) must be removed, which is a very cumbersome problem. There was this.
상기와 같은 문제점을 감안하여 안출한 본 발명의 목적은 순환라인 상에 설치된 부품의 교체시 순환라인의 내부에 존재하는 케미컬을 용이하게 제거할 수 있도록 하는데 적합한 반도체 세정장비의 부품세척장치를 제공함에 있다.SUMMARY OF THE INVENTION An object of the present invention devised in view of the above problems is to provide a component washing apparatus of a semiconductor cleaning equipment suitable for easily removing chemicals present in the circulation line when replacing a component installed on the circulation line. have.
도 1은 종래 반도체 세정장비의 구조를 보인 배관도.1 is a piping diagram showing the structure of a conventional semiconductor cleaning equipment.
도 2는 본 발명 부품세척장치가 설치된 세정장비의 구성을 보인 배관도.Figure 2 is a piping diagram showing the configuration of the cleaning equipment equipped with the present invention parts cleaning apparatus.
* 도면의 주요 부분에 대한 부호의 설명 *Explanation of symbols on the main parts of the drawings
11 : 내조 12 : 외조11: inner tide 12: outer tide
13 : 순환라인 14 : 펌프13 circulation line 14 pump
15 : 댐퍼 16 : 필터15 damper 16 filter
17 : 온도조절기 20 : 순수공급라인17: temperature controller 20: pure water supply line
21,31 : 개,폐밸브22,32 : 체크밸브21,31: open / close valve 22,32: check valve
23,33 : 개,폐밸브30 : 순수배출밸브23,33: open / close valve 30: pure water discharge valve
상기와 같은 본 발명의 목적을 달성하기 위하여 외조와 내조가 순환라인으로 연결되어 있고, 그 순환라인 상에 펌프, 댐퍼, 필터, 온도조절기가 설치되어 있는 반도체 세정장비에 있어서, 상기 순환라인의 입구부에 분지하여 순수공급라인을 연결설치하고, 출구부에 분지하여 순수배출라인을 설치하며, 상기 순수공급라인과 순수배출라인에 각각 개,폐밸브 및 체크밸브를 설치하고, 상기 순수공급라인과 순수배출라인의 반대측 순환라인 상에 개,폐밸브를 설치하여서 구성되는 것을 특징으로 하는 반도체 세정장비의 부품세척장치가 제공된다.In order to achieve the object of the present invention as described above, the outer tank and the inner tank is connected to the circulation line, the pump, damper, filter, temperature controller is installed on the circulation line in the semiconductor cleaning equipment, the inlet of the circulation line Branched to the pure water supply line, and installed in the outlet portion to install the pure water discharge line, the open and close valves and check valves respectively installed in the pure water supply line and the pure water discharge line, and the pure water supply line and There is provided a component washing apparatus for semiconductor cleaning equipment, characterized in that an open / close valve is installed on a circulation line opposite to the pure water discharge line.
이하, 상기와 같이 구성되는 본 발명 반도체 세정장비의 부품세척장치를 첨부된 도면의 실시예를 참고하여 보다 상세히 설명하면 다음과 같다.Hereinafter, with reference to the embodiment of the accompanying drawings, the component washing apparatus of the present invention semiconductor cleaning equipment configured as described above in more detail as follows.
도 2는 본 발명 부품세척장치가 설치된 세정장비의 구성을 보인 배관도로서, 도시된 바와 같이, 내조(11)의 외측에 외조(12)가 설치되어 있고, 그 내조(11)와 외조(12)는 순환라인(13)으로 연결되어 있으며, 그 순환라인(13) 상에는 펌프(14), 댐퍼(15), 필터(16), 온도조절기(17)가 설치되어 있다.Figure 2 is a piping diagram showing the configuration of the cleaning equipment is installed parts cleaning device of the present invention, as shown, the outer tank 12 is provided on the outside of the inner tank 11, the inner tank 11 and the outer tank 12 Is connected to the circulation line 13, the pump 14, the damper 15, the filter 16, the temperature controller 17 is installed on the circulation line (13).
그리고, 부품세척장치로서 상기 순환라인(13)의 입구부에 분지하여 순수공급라인(20)을 연결설치하고, 출구부에 분지하여 순수배출라인(30)을 설치하며, 상기 순수공급라인(20)과 순수배출라인(30)에 각각 개,폐밸브(21)(31) 및 체크밸브(22)(32)를 설치하고, 상기 순수공급라인(20)과 순수배출라인(30)의 반대측 순환라인(13) 상에 개,폐밸브(23)(33)를 설치하여서 구성된다.In addition, as a component washing device, the inlet portion of the circulation line 13 is branched and connected to the pure water supply line 20, and the outlet portion is branched to install the pure water discharge line 30, and the pure water supply line 20 ), And the open and close valves 21 and 31 and the check valves 22 and 32 are respectively installed in the pure water discharge line 30 and the opposite side of the pure water supply line 20 and the pure water discharge line 30. The opening and closing valves 23 and 33 are provided on the line 13.
도면중 미설명부호 18은 드레인 밸브이다.In the figure, reference numeral 18 denotes a drain valve.
상기와 같이 구성되어 있는 부품세척장치가 설치된 세정장비는 내조(11)의 내측에 케미컬이 수납된 상태에서 웨이퍼들을 내조의 내측에 로딩하여 식각 및 세정을 실시하며, 펌프(14)로 펌핑하여 내조(11)의 케미컬이 외조(12)로 오버 플로우되고, 순환라인(13)으로 순환되면서 이물질이 제거되고 적정온도로 조절되어 다시 내조로 공급되게 된다.The cleaning equipment provided with the component cleaning device configured as described above is loaded with wafers inside the inner tank to be etched and cleaned in a state where the chemical is stored inside the inner tank 11, and pumped by the pump 14 to the inner tank. Chemical of (11) is overflowed to the outer tank 12, the foreign matter is removed while being circulated in the circulation line 13 is adjusted to the appropriate temperature is supplied to the inner tank again.
그리고, 장기간 사용으로 인하여 순환라인(13) 상의 부품을 교체시에는 순환라인(13)에 설치되어 있는 개.폐밸브(23)(33)을 닫고, 순수공급라인(20)과 순수배출라인(30) 상에 설치된 개,폐밸브(21)(31)를 열은 다음, 순수공급라인(20)으로 순수를 공급하면 순환라인(13)의 내측에 존재하는 케미컬이 순수와 함께 순수배출라인(30)을 통하여 외부로 배출된다. 이와 같은 케미컬 제거작업을 일정시간 실시하여 순환라인(13) 및 순환라인(13) 상에 설치된 부품(펌프(14), 댐퍼(15), 필터(16), 온도조절기(17))들에 존재하는 케미컬들이 완전히 제거되면 개,폐밸브(21)(31)를 닫고 부품을 교환한다.When the parts on the circulation line 13 are replaced due to long term use, the opening / closing valves 23 and 33 installed in the circulation line 13 are closed, and the pure water supply line 20 and the pure water discharge line ( Opening the open / close valves 21 and 31 installed on the 30 and then supplying pure water to the pure water supply line 20, the chemical present inside the circulation line 13 is a pure discharge line with the pure water ( It is discharged to the outside through 30). Such chemical removal is carried out for a certain time and is present in the circulation line 13 and the components (pump 14, damper 15, filter 16, temperature controller 17) installed on the circulation line 13. When the chemicals are completely removed, close the open and close valves 21 and 31 and replace the parts.
그런 다음, 다시 순환라인(13) 상에 설치되어 있는 개,폐밸브(23)(33)를 열고, 내조(11)에 케미컬을 수납한 다음, 웨이퍼의 세정작업을 재개한다.Then, the open / close valves 23 and 33 provided on the circulation line 13 are opened again, the chemical is stored in the inner tank 11, and the cleaning operation of the wafer is resumed.
이상에서 상세히 설명한 바와 같이, 본 발명 반도체 세정장비의 부품세척장치는 순환라인의 입구부와 출구부에 순수공급라인과 순수배출라인을 설치하고, 그 순수공급라인과 배출라인에 각각 개,폐밸브와 체크밸브를 설치하며, 그 반대측의 순환라인에도 개,폐밸브를 설치하여, 순환라인 상에 설치된 부품의 교체시 순수공급라인으로 순수를 공급하고, 그 공급된 순수가 순환라인 및 부품에 존재하는 케미컬과 함께 순수배출라인으로 배출되어 세정되도록 한 다음 부품을 교체함으로써, 종래와 같이 세정시와 마찬가지로 내조에 순수를 넣고 순환시키는 경우보다 부품의 세척이 용이한 효과가 있다.As described above in detail, the component washing apparatus of the present invention for semiconductor cleaning equipment is provided with a pure water supply line and a pure water discharge line at the inlet and outlet of the circulation line, and open and close valves at the pure water supply line and the discharge line, respectively. And check valves are installed, and open / close valves are installed in the circulation line on the opposite side to supply pure water to the pure water supply line when replacing parts installed on the circulation line, and the supplied pure water exists in the circulation line and parts. It is discharged to the pure water discharge line with the chemical to be cleaned, and then replace the parts, as in the case of the conventional cleaning, there is an effect that the parts are easier to wash than when the pure water in the inner tank circulating.
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KR102504552B1 (en) * | 2021-09-10 | 2023-03-02 | (주)디바이스이엔지 | Flushing condition setting apparatus and flushing condition setting method of semiconductor manufacturing parts |
KR102520592B1 (en) | 2023-01-16 | 2023-04-11 | 주식회사 에스이아이 | Semiconductor parts cleaning device |
US11967491B2 (en) | 2020-02-18 | 2024-04-23 | Semes Co., Ltd. | Method and apparatus for parts cleaning |
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1998
- 1998-04-27 KR KR1019980014920A patent/KR19990081141A/en not_active Application Discontinuation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US11967491B2 (en) | 2020-02-18 | 2024-04-23 | Semes Co., Ltd. | Method and apparatus for parts cleaning |
KR102504552B1 (en) * | 2021-09-10 | 2023-03-02 | (주)디바이스이엔지 | Flushing condition setting apparatus and flushing condition setting method of semiconductor manufacturing parts |
KR102520592B1 (en) | 2023-01-16 | 2023-04-11 | 주식회사 에스이아이 | Semiconductor parts cleaning device |
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