KR102086391B1 - Apparatus for inspecting circuit suing the same - Google Patents

Abstract

The present invention relates to an apparatus for inspecting a circuit. More specifically, provided is the apparatus for inspecting a circuit used for conduction inspection and operation characteristic inspection in a manufacturing process of electronic components. The apparatus for inspecting a circuit comprises: an accommodating jig (700) in which a plurality of accommodating grooves (710) are formed by being arranged in a line on an upper part thereof; a plurality of probe pins (1) mounted on the plurality of accommodating grooves (710); and a body unit (800) coupled to the accommodating jig (700) and including an opening portion (810) corresponding to the plurality of accommodating grooves (710) such that at least some of the probe pins (1) are exposed upward.

Description

Apparatus for inspecting circuit suing the same}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit inspection apparatus, and more particularly, to a circuit inspection apparatus used for conduction inspection and operation characteristic inspection in a manufacturing process of an electronic component.

In an electronic component module such as a camera or a liquid crystal panel, conduction inspection and operation characteristic inspection are performed in the manufacturing process thereof. In order to perform such inspection, a probe pin is used to connect with a main board installed in the electronic component module. The inspection unit and an electrode unit such as an FPC contact electrode or a mounted board-to-board connector.

That is, in connecting the electrode unit and the inspection apparatus in the electronic component module, the electrode pin and the inspection apparatus can be electrically connected by using a probe pin, wherein the probe pin is connected between the electrode terminal of the electronic component module and the inspection apparatus. The contact can be made stable through an appropriate contact pressure.

On the other hand, in the circuit inspection apparatus using the probe pin, the pogo pin including a spring was used in the past, in this case, the conduction path between the inspection object and the inspection apparatus is increased to increase the electrical resistance and thus high power is required. There is a problem.

In addition, the circuit inspection apparatus using a conventional probe pin is modular and manufactured and shipped with the probe pin or the pogo pin coupled to the inside of the socket, and thus, if some probe pins or the pogo pins are defective or damaged, the entire module needs to be replaced. There is a problem.

SUMMARY OF THE INVENTION In order to solve the problems of the present invention as described above, a circuit capable of easily replacing a part of a plurality of probe pins and a plurality of probe pins with low contact resistance while having high contact reliability between an inspection object and an inspection device. To provide an inspection apparatus.

The present invention has been created to achieve the object of the present invention as described above, the present invention, the receiving jig 700 is formed by arranging a plurality of receiving grooves 710 in the upper portion; A plurality of probe pins (1) mounted in the plurality of receiving grooves (710); The main body 800 is coupled to the accommodation jig 700 and has openings 810 corresponding to the plurality of accommodation grooves 710 so that at least a portion of the probe pin 1 is exposed upward. A circuit inspection apparatus is disclosed.

It may be installed to be movable in the vertical direction from the upper side of the main body portion 800, may include a cover portion 900 for exposing at least a portion of the probe pin (1) to the upper side through the shandong through pressure.

The cover part 900 includes a cover plate 910 in which a plurality of opening grooves 911 are formed corresponding to the plurality of receiving grooves 710, the cover plate 910, and the main body part 800. It is provided between the plurality of elastic bodies 920 to move the cover plate 910 up and down through compression and restoring force.

The accommodation jig 700 includes a base 720 in which a through groove 721 is formed through which at least a portion of the probe pin 1 is exposed downward, and the plurality of accommodation in which the plurality of probe pins 1 are mounted. It may include a receiving portion 730 provided on the upper surface of the base 720 so that the groove 710 is formed.

Circuit inspection apparatus according to the present invention, through the coupling structure between the receiving jig for receiving the probe pin and the main body portion, if at least some of the plurality of probe pins used is defective or damaged, it is possible to replace only some of the probe pins There is an advantage.

That is, the circuit inspection apparatus according to the present invention has an advantage in that assembly is excellent in a compact structure, and that at least some of the plurality of probe pins used can be easily replaced.

In addition, the circuit inspection apparatus according to the present invention has an advantage of high contact reliability by maintaining a stable contact even in various environments between the inspection device and the inspection object because the probe pin includes an elastic portion that is stretchable in the longitudinal direction.

In addition, the circuit inspection apparatus according to the present invention, since the probe pin includes an elastic portion that can be stretched in the longitudinal direction, it can be applied to a variety of inspection objects has the advantage of excellent versatility.

In addition, the circuit inspection apparatus according to the present invention has the advantage that the contact pin is high while the contact reliability is high by maintaining the contact path at the shortest distance in the contact situation between the inspection device and the inspection object.

In addition, the circuit inspection device according to the present invention, the probe pin has a superior durability compared to the conventionally used pogo pin, more specifically, the spring elastic force is reduced when the conventional pogo pin is subjected to compression and expansion of 100,000 to 150,000 times Although the durability is lowered, the probe pin according to the present invention has the advantage that durability is maintained even after repeated compression and expansion of 800,000 to 1.2 million times using the elastic portion.

1 is a perspective view showing a state of a test apparatus provided with a probe pin according to the present invention.
FIG. 2 is an exploded perspective view showing the configuration of the inspection device of FIG. 1. FIG.
3 is a cross-sectional view showing a state of the inspection device of FIG. 1.
4 is a side view showing a first embodiment of a probe pin used in the inspection device of FIG.
FIG. 5 is a side view showing a second embodiment of a probe pin used in the inspection apparatus of FIG. 1. FIG.
FIG. 6 is a side view showing a third embodiment of a probe pin used in the inspection apparatus of FIG. 1. FIG.
FIG. 7 is a side view showing a fourth embodiment of a probe pin used in the inspection apparatus of FIG. 1. FIG.

Hereinafter, a probe pin and a circuit inspection apparatus having the same according to the present invention will be described with reference to the accompanying drawings.

Circuit inspection apparatus according to the present invention, as shown in Figures 1 to 3, the socket portion 700 formed by arranging a plurality of receiving grooves 710 in the upper portion; A plurality of probe pins (1) mounted in the plurality of receiving grooves (710); The main body 800 is coupled to the socket part 700, and an opening 810 corresponding to the plurality of receiving grooves 710 is formed to expose at least a portion of the probe pin 1 upward. do.

In addition, the circuit inspection apparatus according to the present invention is coupled to the upper portion of the main body 800 so as to be movable in the vertical direction, the cover portion for exposing at least a portion of the probe pin (1) upward through the shandong through pressure 900 may be included.

In addition, the circuit inspection apparatus according to the present invention is provided to be detachable on the lower side of the socket portion 700, and may further include a substrate for contacting one end of the probe pin (1) to inspect the inspection object.

The inspection object according to the present invention may have any configuration as long as it is an electronic component used through electrical contact.

For example, the inspection object may be used for inspection of a camera module used in a flexible printed circuit (FPC), a flexible, flat cable (FFC), a mobile, an LCD, an OLED, a B2B connector, and the like.

The socket portion 700 is a configuration in which a plurality of accommodation grooves 710 are arranged in a line at the top, and various configurations are possible.

For example, as shown in FIG. 2, the socket part 700 includes a base 720 having a through hole 721 through which at least a portion of the probe pin 1 is exposed downward, and a plurality of probes. It may include a receiving portion 730 provided on the upper surface of the base 720 so that the plurality of receiving grooves 710 on which the pins 1 are mounted.

That is, the socket part 700 may be mounted with a plurality of probe pins 1 and may be detachable from the main body part 800, so that some of the plurality of probe pins 1 may be defective or damaged. Some or all of the probe pins 1 may be replaced by detaching from 800.

The base 720 is a configuration in which a through groove 721 through which at least a portion of the probe pin 1 is exposed downward is formed, and various configurations are possible.

For example, the base 720 is a plate-shaped plate, formed to correspond to the probe pins 1 on which the through grooves 721 are mounted, and the second contact portion 300 of the probe pin 1 to be described later. Can be exposed downward.

Through this, the base 720 may be in electrical contact with the substrate for inspection, that is, the PCB provided on the lower side.

On the other hand, the base 720, at least one, preferably four base bolt holes 722 are formed in the corner, it can be coupled through the bolt coupling with the main body portion 800 to be described later.

The accommodating part 730 is configured to be provided on the upper surface of the base 720 so that a plurality of accommodating grooves 710 on which the plurality of probe pins 1 are mounted may be formed.

For example, the accommodating part 730 is formed to protrude upward from the upper surface of the base 720, and a plurality of accommodating grooves formed in a row so as to be mounted on the plurality of probe pins 1 ( 710.

On the other hand, the receiving portion 730 may be formed on the bottom surface of the receiving groove 710, the support surface 731 is supported by the second straight portion 510 of the probe pin 1 to be described in surface contact. .

In addition, the accommodating part 730 includes a plurality of accommodating grooves 710 such that a pair of probe pins 1 are symmetrically inserted into each other in a direction perpendicular to an arrangement direction of the accommodating grooves 710 arranged in a line. It may include a blocking portion 732 provided across the receiving groove 710 in the arrangement direction of the.

The main body 800 is coupled to the upper side of the socket 700, the opening 810 corresponding to the plurality of receiving grooves 710 is formed so that at least a portion of the probe pin 1 is exposed upward. As the configuration to be made, various configurations are possible.

For example, the body part 800 may include a body part 820 having an opening 810 corresponding to the plurality of receiving grooves 710 of the socket part 700, and a lower part of the body part 820. The first step portion 830 is formed to be inserted into the base 720 on the side, and the second step portion 840 is extended to the first step portion 830 is formed so that the receiving portion 730 is inserted. Can be.

That is, the body portion 800 is coupled to the upper side of the socket portion 700, the body portion corresponding to the plurality of receiving grooves 710 arranged in a line to form an opening 810 of the rectangular shape on the plane 820, and the second step portion 840 and the first step portion 830 corresponding to each of the receiving portion 730 and the base 720 may be formed on the lower surface thereof. .

The body portion 820 is configured to be coupled to the socket portion 700 from above, and various configurations are possible.

The body 820 may have an opening 810 having a size corresponding to the plurality of receiving grooves 710 of the socket 700, the socket 700, and more specifically, the base 720. ) And a body bolt hole 821 for bolting may be formed at a position corresponding to the base bolt hole 722.

Through this, the body portion 820 may be coupled to the base 720 through bolt coupling, and may be easily detached from the bar socket portion 700 coupled through the bolt.

The first stepped part 830 is configured to insert the base 720 on the lower surface of the body part 820, and various configurations are possible.

For example, the first step portion 830 may have a lower surface of the body portion 820 so as to correspond to a thickness of the base 720 so that the bottom surface of the base 720 and the bottom surface of the body portion 820 are horizontal. It may be formed in, so that when the base 720 is inserted and combined with the main body 800, the bottom surface may be horizontal.

The second stepped portion 840 is configured to extend to the first stepped portion 830 to be inserted into the accommodation portion 730, and may be configured in various ways.

For example, the second stepped part 840 is formed to have a size corresponding to the receiving part 730 protruding upward from the socket part 700, so that the first step is inserted into the receiving part 730. It may be formed to extend to the portion 830.

In addition, the second step portion 840 may be supported by surface contact with the upper surface of the first straight portion 410 to be described later by inserting the receiving portion 730 in the state where the probe pin 1 is mounted. have.

The cover portion 900 is installed to be movable in the vertical direction from the upper side of the main body portion 800, and is configured to expose at least a portion of the probe pin 1 to the upper side through the shandong through pressure, various configurations This is possible.

For example, the cover part 900 includes a cover plate 910 in which a plurality of opening grooves 911 are formed corresponding to the plurality of receiving grooves 710, the cover plate 910, and the main body part 800. ) May be provided between the plurality of elastic bodies 920 to move the cover plate 910 up and down through compression and restoring force.

The cover plate 910 is formed with a plurality of opening grooves 911 corresponding to the plurality of receiving grooves 710, and a plurality of probes mounted and installed in the plurality of receiving grooves 710 in Shanghai. As a configuration for exposing a portion of the upper side of the pin 1, various configurations are possible.

The cover plate 910 is a configuration in which the test object is positioned on the upper side, and moves downward to pressurize according to the position of the test object, so that a part of the upper side of the exposed probe pin 1 contacts the electrode part of the test object. Can be.

Therefore, the cover plate 910 may be provided with an insulating material, which is accompanied by contact with the inspection object.

In addition, the cover plate 910 may include a cover bolt hole 912 formed to penetrate the bolt 930 is bolted to the main body portion 800.

That is, the cover plate 910, the bolt 930 penetrates through the cover bolt hole 912 and is coupled to the main body 800, so that the cover bolt hole 912 is a bolt 930 so as to be movable. It may be formed larger than the diameter of.

The plurality of elastic bodies 920 are provided between the cover plate 910 and the main body 800 so that the cover plate 910 can be moved, and various configurations are possible.

For example, the plurality of elastic bodies 920 may be partially inserted into at least one of an upper surface of the main body 800 or a lower surface of the cover plate 910, and may depend on the weight of the inspection object or the pressure of the user. When the cover plate 910 moves downward, the cover plate 910 may be compressed, and when the external force is removed, the cover plate 910 may be moved upward according to the restoring force.

Meanwhile, the plurality of elastic bodies 920 may be provided at edges of the cover plate 910 and the main body 800 having a rectangular shape.

Meanwhile, in the circuit inspection apparatus according to the present invention, as shown in FIG. 1, a plurality of socket parts 700 and a cover part 900 may be coupled to one main body 800, wherein each socket The height of the receiving part 730 of the part 700 may be applied to one main body 800 formed with a step.

The plurality of probe pins 1 are mounted in the plurality of receiving grooves 710, and are electrically contacted with the electrode part of the inspection object from the upper side, and contacted with the substrate and the PCB for inspection from the lower side. Configuration is possible.

As shown in FIGS. 4 to 7, the probe pin according to the present invention includes an elastic portion 100 that stretches along the longitudinal direction and a first contact portion 200 formed at one end in the longitudinal direction of the elastic portion 100. )Wow; And a second contact portion 300 formed at the other end in the longitudinal direction of the elastic portion 100.

The elastic portion 100 is configured to stretch along the longitudinal direction, it is possible to various configurations.

For example, the elastic part 100 extends in the direction crossing the first contact part 200 with respect to the longitudinal direction connecting the first contact part 200 and the second contact part 300, and the first contact part. A first elastic part 400 formed in a direction spaced apart from the 200, a second elastic part 400 extending in a direction crossing the longitudinal direction, and formed in a direction spaced apart from the first contact part 200; The second elastic part 500 and the first elastic part 400 and the second elastic part 500 may include a third elastic part 600 formed in a direction approaching the first contact part 200. .

The first elastic part 400 extends in the direction crossing the first contact part 200 with respect to the longitudinal direction connecting the first contact part 200 and the second contact part 300, and the first contact part 200. As the configuration formed in the direction away from the), various configurations are possible.

For example, the first elastic portion 400 is connected to the first straight portion 410 and one end thereof extending in a direction orthogonal to the first contact portion 200 in the longitudinal direction. The other end may include an arc-shaped first curved portion 420 connected to one end of the third elastic portion 600.

In addition, the first elastic portion 400 may further include a protrusion 430 formed to protrude downward from the bottom of the first straight portion 410.

The first straight portion 410 is configured to extend in a direction orthogonal to the first contact portion 200 in the longitudinal direction, and various configurations are possible.

For example, the first straight portion 410 may be bent at the lower end of the first contact portion 200 to be formed in a horizontal direction, through which the upper surface may be installed in surface contact with the main body portion 800. Can be.

The first straight portion 410 may be formed of an elastic material, and when pressurized to the lower side of the first contact portion 200, one end connected to the first contact portion 200 descends downward, and the first By maintaining the other end connected to the curved portion 420 it can be made to stretch in the longitudinal direction as a whole.

On the other hand, the first straight portion 410 may be connected such that the connection surface is parallel to the first contact portion 200 in the longitudinal direction, as another example so that the connection surface orthogonal to the first contact portion 200 in the longitudinal direction It may be connected, or the connection surface may be connected to cross the first contact portion 200 inclined in the longitudinal direction.

The first curved portion 420 is an arc-shaped configuration in which one end is connected to the first straight portion 410 and the other end is connected to one end of the third elastic portion 600, and various configurations are possible.

For example, the first curved portion 420 extends from the other end of the one end connected to the first contact portion 200 of the first straight portion 410, and the virtual center thereof is the first straight portion 410. It may be formed in an arc shape so as to be located below.

In this case, the first curved portion 420 may be formed to be inclined advantageously when the first straight portion 410 is deformed due to pressure, for stretching in the overall longitudinal direction of the elastic portion 100. The central angle may be 180 degrees or more with respect to the virtual center.

The protrusion 430 is configured to protrude downward from the bottom of the first straight portion 410, and may have various configurations.

For example, the protruding portion 430 may include a first protruding surface 431 formed on the bottom of the first linear portion 410 with a relatively gentle inclination at a short distance from the first contact portion 200, and a first projection surface 431. It may include a second protruding surface 432 extending from the protruding surface 431 and formed with a relatively large inclination.

That is, the protrusion 430, as shown in Figure 6, the first protruding surface 431 and the first protruding surface protruding toward the lower side toward the first contact portion 200 side on the side toward the first projection ( It may include a second protruding surface 432 extending from the 431 and restored toward the first straight portion 410 toward the direction spaced apart from the first contact portion 200 side.

At this time, the first projection surface 431 may have a relatively large angle with respect to the imaginary line parallel to the longitudinal direction, and the second projection surface 432 is relative to the imaginary line parallel to the longitudinal direction. Can have a small angle.

That is, the first protrusion 431 may have a relatively gentle slope, and the second protrusion 432 may be formed to have a relatively large slope.

The second elastic part 500 extends in a direction crossing the second contact part 300 in the longitudinal direction and is formed in a direction spaced apart from the first contact part 200, and various configurations are possible.

For example, the second elastic portion 500 includes a second straight portion 510 extending in a direction orthogonal to the second contact portion 300 in a longitudinal direction, and one end thereof connected to the second straight portion 510. And the other end thereof may include an arc-shaped second curved portion 520 connected to the other end of the third elastic portion 600.

In addition, the second elastic portion 500 is a configuration corresponding to the above-described protrusion 430, and a protrusion formed upward from the upper surface of the second straight portion 510 toward the third elastic portion 600. It may further include (not shown).

The second straight portion 510 extends in a direction orthogonal to the second contact portion 300 in the longitudinal direction, and various configurations are possible.

The second straight portion 510 may extend in the same direction as the first straight portion 410 with respect to the longitudinal direction, and may be formed on the support surface 731 of the receiving portion 730 of the socket portion 700. It may be seated in surface contact.

The second straight portion 510 is a structure that is supported for stretching when the first contact portion 200 is pressed, and may be a stretchable material, but may be a hard material.

That is, the second straight portion 510 is supported by the support surface 731 of the receiving portion 730 to support one side such that the first elastic portion 400 and the third elastic portion 600 stretch in the longitudinal direction. It may be a configuration.

On the other hand, the second straight portion 510, like the first straight portion 410 may be connected so that the connection surface with the second contact portion 300 is parallel to the longitudinal direction, as another example, the connection surface is the second The contact portion 300 may be connected to cross at an orthogonal or inclined length direction.

The second curved portion 520 is an arc-like configuration, one end of which is connected to the second straight portion 510 and the other end of which is connected to the other end of the third elastic portion 600, and various configurations are possible.

For example, the second curved portion 520 extends from the other end of the one end connected to the second contact portion 300 of the second straight portion 510, and the virtual center thereof is the second straight portion 510. It may be formed in an arc shape so as to be located below.

In this case, the second curved portion 520 may be formed so that the second connecting portion 620, which will be described later, is inclined when deformed due to pressure for expansion and contraction in the overall longitudinal direction of the elastic portion 100. For this reason, the center angle of the virtual center may be 180 degrees or more.

The third elastic portion 600 is formed in a direction approaching the first contact portion 200 between the first elastic portion 400 and the second elastic portion 500, it is possible to have a variety of configurations.

For example, the third elastic portion 600 may extend from the first elastic portion 400 in a direction crossing the longitudinal direction and be connected to the first connection portion 610 and the second elastic portion 500. It may include a second connecting portion 620 connected in a direction crossing the direction, and an arc-shaped third curved portion 630 connected between the first connecting portion 610 and the second connecting portion 620.

The first connection portion 610 is configured to extend from the first elastic portion 400 in a direction crossing the longitudinal direction, and various configurations are possible.

For example, the first connecting portion 610 may be formed such that one end is connected to the third curved portion 630 and the other end is connected to the first curved portion 420, and has an inclination in a direction crossing the longitudinal direction. Can be.

More specifically, as illustrated in FIGS. 4 to 7, the first connection portion 610 may have an inclination that rises upward from the first curved portion 420 to the third curved portion 630.

That is, the first connection part 610 may be formed to extend in a direction from the first elastic part 400 toward the first contact part 200.

Through this, the first connecting portion 610, the third curved portion 630 is in contact with the first linear portion 410 and the second linear portion 510 during compression of the elastic portion 100, the overall electrical resistance Can be reduced.

The second connection portion 620 is a configuration in which the second elastic portion 500 extends in a direction crossing the longitudinal direction and is connected, and various configurations are possible.

For example, the second connection portion 620 may be formed such that one end thereof is connected to the third curved portion 630 and the other end thereof is connected to the first curved portion 420 and has an inclination in a direction crossing the longitudinal direction. Can be.

More specifically, the second connector 620 may have an inclination downward toward the third curved portion 630 from the second curved portion 520.

That is, the second connection part 620 may be formed to extend in a direction from the second elastic part 500 toward the second contact part 300.

As a result, the second connecting portion 620 may reduce the electrical resistance by making the third curved portion 630 contact with the second straight portion 510 when the elastic portion 100 is compressed.

The third curved portion 630 is an arc-shaped configuration that is connected between the first connection portion 610 and the second connection portion 620, and can be configured in various ways.

For example, the third curved portion 630 may be formed in an arc shape between the first connecting portion 610 and the second connecting portion 620, and the center angle is formed to be 180 degrees or more based on the virtual center. Can be.

On the other hand, the elastic portion 100 may be formed of a pair of elastic pieces (110, 120) in the shape of a band disposed with a gap between each other.

In addition, the elastic part 100 may further include at least one bridge 130 that connects the pair of elastic pieces 110 and 120 in a band shape with a gap therebetween.

The pair of elastic pieces 110 and 120 are configured to form the elastic portion 100 in a band shape with a gap therebetween, and various configurations are possible.

The pair of elastic pieces (110, 120), as a stretchable material, may be arranged with a gap from each other to increase the stretch in the longitudinal direction.

The bridge 130 is configured to connect across a pair of elastic pieces (110, 120), various configurations are possible.

For example, the bridge 130 may be connected to each other across a pair of elastic pieces (110, 120) arranged with a gap between each other, through which a pair of elastic pieces (110, 120) The gap formed in between can be blocked.

The bridge 130 may be formed in plural, and more specifically, as shown in FIG. 6, the bridge 130 may be formed in the first straight portion 410 and the second connection portion 620, respectively.

Through this, it is possible to shorten the contact path between the inspection object and the substrate for inspection to reduce the electrical resistance.

The first contact portion 200 is formed at one end in the longitudinal direction of the elastic portion 100, various configurations are possible.

In particular, the first contact portion 200 may be in contact with the electrode portion of the inspection object positioned on the upper side of the first contact portion 200 by being exposed to the upper side of the cover portion 900 to be energized.

The first contact part 200 is formed at the end of the first connection part 210 and the first connection part 210 which extends upward from one end of the elastic part 100 to the electrode part of the test object. The first contact surface 220 may be included.

The first connection portion 210 may be formed to extend upward from one end of the elastic portion 100, more specifically, the first straight portion 410.

In this case, the first connecting portion 210 may be formed in a band shape having at least a portion of the gap.

The first contact surface 220 is formed at the end of the first connection portion 210 to be in contact with the electrode portion of the inspection object, various configurations are possible.

For example, the first contact surface 220 may be formed to have a groove having a 'U' shape, thereby inducing stable contact with the electrode part of the inspection object.

On the other hand, as another example, the first contact surface 220 may be formed to have a slope on the side, it may be formed in a convex shape of the center.

The second contact portion 300 is formed at the other end in the longitudinal direction of the elastic portion 100, various configurations are possible.

In particular, the second contact portion 300 may be exposed to the lower side of the socket portion 700, so that the second contact portion 300 is in contact with the substrate or PCB for inspection located on the lower side to be energized.

The second contact part 300 may include a second connection part 310 extending downward from the other end of the elastic part 100 and a second contact part 310 formed at an end of the second connection part 310 to be in contact with the substrate or the PCB. The contact surface 320 may be included.

In addition, the second contact part 300 may further include an extension part 330 extending to the opposite side of the second straight part 510 based on the second connection part 310.

The second connection portion 310 may be formed extending from the other end of the elastic portion 100, more specifically, from the second straight portion 510.

The second contact surface 320 is formed at the end of the second connector 310 to be in contact with the substrate for inspection, and various configurations are possible.

For example, the second contact surface 320 may be formed to have a groove having a 'U' shape, thereby inducing stable contact with the electrode part of the inspection object.

On the other hand, as another example, the second contact surface 320 may be formed to have a slope on the side, it may be formed in a convex shape of the center.

Since the above has just been described with respect to some of the preferred embodiments that can be implemented by the present invention, as is well known the scope of the present invention should not be construed as limited to the above embodiments, the present invention described above It will be said that both the technical idea and the technical idea which together with the base are included in the scope of the present invention.

100: elastic portion 200: first contact portion
300: second contact portion 400: first elastic portion
500: second elastic portion 600: third elastic portion
700: socket portion 800: main body portion
900: cover part

Claims (4)

A receiving jig 700 formed with a plurality of receiving grooves 710 arranged in a line at an upper portion thereof;
A plurality of probe pins (1) mounted in the plurality of receiving grooves (710);
The main body 800 is coupled to the accommodation jig 700 and has openings 810 corresponding to the plurality of accommodation grooves 710 so that at least a portion of the probe pin 1 is exposed upward. ,
The probe pin 1 is,
An elastic portion 100 stretched along the longitudinal direction;
A first contact portion 200 formed at one end in the longitudinal direction of the elastic portion 100;
It includes a second contact portion 300 formed at the other end in the longitudinal direction of the elastic portion 100,
The elastic portion 100,
A first elastic portion 400 extending in a direction crossing the first contact portion 200 and the length direction and spaced apart from the first contact portion 200, the second contact portion 300, and the Between the second elastic portion 500 and the first elastic portion 400 and the second elastic portion 500 extending in a direction crossing the longitudinal direction and formed in a direction spaced apart from the first contact portion 200. A third elastic part 600 formed in a direction approaching the first contact part 200,
The first elastic portion 400,
It includes a first straight portion 410 extending in a direction perpendicular to the first contact portion 200 and the longitudinal direction,
The first elastic portion 400,
It includes a protrusion 430 formed to protrude downward on the bottom of the first straight portion 410,
The protrusion 430,
The first protruding surface 431 protruding downward toward the side spaced apart from the side of the first contact portion 200 on the side surface, and extending from the first protruding surface 431 to be spaced apart from the first contact portion 200 side. The second projection surface 432 is restored to the first linear portion 410 toward the direction and the angle between the first contact portion 200 is larger than the first projection surface 431 is characterized in that it comprises a Circuit inspection equipment. The method according to claim 1,
It is installed to be movable in the vertical direction from the upper side of the main body portion 800, characterized in that it comprises a cover portion 900 for exposing at least a portion of the probe pin (1) to the upper side through the shandong through pressure Circuit inspection equipment. The method according to claim 2,
The cover unit 900,
A cover plate 910 in which a plurality of opening grooves 911 are formed corresponding to the plurality of receiving grooves 710, and is provided between the cover plate 910 and the main body 800 to provide compression and restoring force. Circuit inspection apparatus comprising a plurality of elastic bodies (920) to move the cover plate (910) up and down through. The method according to claim 1,
The accommodation jig 700,
The base 720 is formed so that at least a portion of the probe pin 1 is exposed downward, and the plurality of receiving grooves 710 on which the plurality of probe pins 1 are formed are formed. Circuit inspection apparatus comprising a receiving portion (730) provided on the upper surface of the base (720).

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