KR101881376B1 - An dressing apparatus - Google Patents
An dressing apparatus Download PDFInfo
- Publication number
- KR101881376B1 KR101881376B1 KR1020160000966A KR20160000966A KR101881376B1 KR 101881376 B1 KR101881376 B1 KR 101881376B1 KR 1020160000966 A KR1020160000966 A KR 1020160000966A KR 20160000966 A KR20160000966 A KR 20160000966A KR 101881376 B1 KR101881376 B1 KR 101881376B1
- Authority
- KR
- South Korea
- Prior art keywords
- dressing
- connection
- support portion
- polishing
- support
- Prior art date
Links
- 238000005498 polishing Methods 0.000 claims description 35
- 230000008878 coupling Effects 0.000 claims description 21
- 238000010168 coupling process Methods 0.000 claims description 21
- 238000005859 coupling reaction Methods 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 11
- 239000002245 particle Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000007517 polishing process Methods 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 230000000454 anti-cipatory effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/095—Cooling or lubricating during dressing operation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
An embodiment includes a body having a hollow and having a gear formed on an outer circumferential surface thereof, a dressing portion spaced from an inner circumferential surface of the body, disposed in the hollow, and a connecting portion connecting the dressing portion and the body, The rotational force or the frictional force of the body and the dressing portion is reduced.
Description
An embodiment relates to a dressing apparatus of a wafer polishing apparatus.
Generally, a pad (PAD) and a slurry are used for the wafer polishing process, and the distribution of the abrasive particles over the pad may be one of the important factors determining the quality of the polishing. The fibrous or small pores located on the pad can support the abrasive particles because they provide sufficient frictional force to inhibit abrasive particles from falling off due to centrifugal forces.
For the desired polishing quality it is necessary to manage the pad top surface. For example, it is necessary to keep the upper surface of the pad flexible, to keep the fibers upright, and to ensure that there are abundant open pores.
A device for combing or cutting a pad surface to maintain the surface of the pad in this state is called a pad dressing device.
The embodiment provides a dressing apparatus capable of dressing a desired area of an anticipatory half or a lower half.
A dressing apparatus according to an embodiment includes a body having a hollow and having a gear formed on an outer circumferential surface thereof; A dressing portion spaced from an inner circumferential surface of the body and disposed in the hollow; And a connection portion connecting the dressing portion and the body, wherein the connection portion reduces a rotational force or a frictional force between the body and the dressing portion when the body rotates.
The connection portion includes a first end connected to the dressing portion; A second end connected to an inner circumferential surface of the body; And a bearing disposed between the first end and the second end.
The connection portion being disposed in the hollow portion, the supporting portion being engaged with the dressing portion; And a bearing disposed between the support portion and the inner circumferential surface of the body.
The support may be in the form of a line or a rod aligned with a reference line, and the reference line may be a straight line passing through two points of the inner circumferential surface of the body facing each other and a hollow center of the body.
The dressing portion is detachable to the support portion, and the dressing portion can be coupled to the support portion at a different bonding position.
A first connecting part having a ring shape and having one end connected to an inner circumferential surface of the body; A ring-shaped second connection portion located inside the first connection portion and surrounding the other end of the first connection portion; A bearing ball disposed between the first connection portion and the second connection portion; And a support portion coupled to the first points of the inner circumferential surface of the second connection portion facing each other and coupled with the dressing portion.
Or the connection part has a ring-shaped first connection part, one end of which is connected to the inner circumferential surface of the body; And a ring-shaped second connection portion located inside the first connection portion and surrounding the other end of the first connection portion; And a support portion coupled to the dressing portion, wherein the first connection portion and the second connection portion are formed of a magnetic material having the same polarity.
The dressing portion may be divided into a first dressing block disposed on the upper surface of the support portion and a second dressing block disposed on the lower surface of the support portion.
The polishing apparatus according to any one of claims 1 to 3, wherein the polishing surface of each of the first and second dressing blocks is provided with a groove, and the supporting portion may include a plurality of engaging grooves spaced from each other, the dressing portion being inserted into a groove provided in the polishing surface, And may further include a coupling hole for coupling with any one of the coupling grooves.
The dressing apparatus may further include at least one auxiliary connection unit connecting the body and the dressing block.
The other end of the first connection portion may have a protrusion protruding in the vertical direction, and the second connection portion may surround the protrusion of the first connection portion.
The first dressing block includes a first seating portion on which the upper end of the support portion is seated and a second seating portion on the opposite side of the polishing surface of the second dressing block on which the lower end portion of the support portion is seated. And the opposite surface of the polishing surface of the first dressing block and the surface opposite to the polishing surface of the second dressing block may be in contact with each other.
The embodiment can control the area to be dressed in the half or half of the supposition by dressing the desired area of the supposition half or the bottom half.
1 is a perspective view of a pad dressing apparatus according to an embodiment.
2 is a plan view of the pad dressing apparatus shown in Fig.
Fig. 3 shows a sectional view of the pad dressing apparatus shown in Fig. 2 in the AB direction.
4 is a sectional view of the dressing portion in the CD direction.
5 shows a cross-sectional view of a dressing apparatus according to another embodiment.
6 shows a top view of a dressing apparatus according to another embodiment.
Fig. 7 shows a perspective view of a wafer polishing apparatus including a dressing apparatus according to an embodiment.
8 shows the movement trajectory of the dressing apparatus during the dressing process.
BRIEF DESCRIPTION OF THE DRAWINGS The above and other features and advantages of the present invention will become more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which: FIG. In the description of the embodiments, it is to be understood that each layer (film), region, pattern or structure may be referred to as being "on" or "under" a substrate, each layer It is to be understood that the terms " on "and " under" include both " directly "or" indirectly " do. In addition, the criteria for the top / bottom or bottom / bottom of each layer are described with reference to the drawings. The same reference numerals denote the same elements throughout the description of the drawings.
FIG. 1 is a perspective view of a
Referring to FIGS. 1 to 4, the
The
The
The
The
The
For example, the
The
The
The
For example, the
The
The other end of the
The
The
For example, pressure is applied to the
The
The
For example, the
The
For example, the dressing
The center of the dressing
The coupling position of the dressing
For example, the dressing
The dressing
The
The
The
The
A
The first and second coupling means 127a and 127b coupled with the
The
The
The
For example, each of the first and
4, a
For example, the upper end portion of the
Since the second surface 122-1 of the
In another embodiment, the
3) may be omitted, and the
5 shows a cross-sectional view of a
The same reference numerals as those in FIG. 3 denote the same components, and the same components are simply described or omitted.
Referring to FIG. 5, the embodiment shown in FIG. 5 may be the same as the embodiment of FIG. 3 except for the connecting portion 130 '.
The connection portion 130 'includes a
For example, the
The magnetic body portion 136 'includes a ring-shaped first
For example, each of the first and second
For example, the first
The connecting portion according to another embodiment may further include a bearing ball (not shown) positioned between the first
6 shows a top view of a
6, the
Each of the
The support portions of the
The first and
FIG. 7 shows a perspective view of a
In the polishing process of the wafer, the carrier accommodating the wafer is disposed on the
In FIG. 7, one
The
8 shows the movement trajectory of the
8, the
According to the position where the
The features, structures, effects and the like described in the embodiments are included in at least one embodiment of the present invention and are not necessarily limited to one embodiment. Further, the features, structures, effects, and the like illustrated in the embodiments can be combined and modified by other persons having ordinary skill in the art to which the embodiments belong. Therefore, it should be understood that the present invention is not limited to these combinations and modifications.
110: body 120: dressing part
130: connection part 132: support part
136a:
136c: bearing
136b ': second magnetic body.
Claims (12)
A dressing unit disposed in the hollow so as to be spaced apart from an inner circumferential surface of the body and dressing the surface plate; And
A first connection part having a ring shape and having one end connected to the inner circumferential surface of the body, a ring-shaped second connection part rotating around the other end of the first connection part, and a second connection part connected to the second connection part to support the dressing part in the hollow And a connecting portion having a supporting portion,
Wherein the connection portion is rotatably coupled to the inner circumferential surface of the body so that the dressing portion is not rotated by reducing the rotational force or the frictional force between the body and the dressing portion when the body rotates.
The support portion is in the shape of a line or a rod aligned with the reference line,
Wherein the baseline is a straight line passing through two opposing points on an inner circumferential surface of the body and a hollow center of the body.
Wherein the dressing portion is detachable to the support portion,
Wherein the dressing portion is attachable to the support portion at a different position.
Wherein the connection portion includes a bearing ball disposed between the first connection portion and the second connection portion; The dressing device further comprising:
Wherein the first connecting portion and the second connecting portion are magnetic bodies having the same polarity.
A first dressing block disposed on an upper surface of the support portion, and a second dressing block disposed on a lower surface of the support portion.
Wherein grooves are formed in the polishing surfaces of each of the first and second dressing blocks, and the supporting portions include a plurality of engaging grooves spaced from each other,
The dressing unit includes:
And a coupling hole inserted in the groove provided in the polishing surface and coupled with any one of the plurality of coupling grooves.
Further comprising auxiliary connections connecting the body and the dressing blocks.
And the other end of the first connection portion has a protrusion protruding in a vertical direction,
And the second connection portion surrounds the periphery of the protrusion of the first connection portion.
The first dressing block includes a first seating portion on which the upper end of the support portion is seated and a second seating portion on the opposite side of the polishing surface of the second dressing block on which the lower end portion of the support portion is seated. And,
Wherein an opposite surface of the polishing surface of the first dressing block and an opposite surface of the polishing surface of the second dressing block are in contact with each other.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020160000966A KR101881376B1 (en) | 2016-01-05 | 2016-01-05 | An dressing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020160000966A KR101881376B1 (en) | 2016-01-05 | 2016-01-05 | An dressing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20170081928A KR20170081928A (en) | 2017-07-13 |
KR101881376B1 true KR101881376B1 (en) | 2018-07-24 |
Family
ID=59352552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020160000966A KR101881376B1 (en) | 2016-01-05 | 2016-01-05 | An dressing apparatus |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101881376B1 (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001179600A (en) * | 1999-12-20 | 2001-07-03 | Speedfam Co Ltd | Dresser |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20110106014A (en) * | 2010-03-22 | 2011-09-28 | 주식회사 엘지실트론 | Dresser and double side polishing apparatus of wafer including the same |
KR101285923B1 (en) * | 2011-12-27 | 2013-07-12 | 주식회사 엘지실트론 | Grinding apparatus and dressing gear for the same |
-
2016
- 2016-01-05 KR KR1020160000966A patent/KR101881376B1/en active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001179600A (en) * | 1999-12-20 | 2001-07-03 | Speedfam Co Ltd | Dresser |
Also Published As
Publication number | Publication date |
---|---|
KR20170081928A (en) | 2017-07-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6390901B1 (en) | Polishing apparatus | |
KR102208160B1 (en) | Substrate holder, polishing apparatus, polishing method, and retaining ring | |
TW201136708A (en) | Retaining ring with shaped surface | |
EP1676672A4 (en) | Wafer-retaining carrier, double side-grinding device using the same, and double side-grinding method for wafer | |
CN113118968B (en) | Tilt adjusting mechanism | |
TWI638705B (en) | Dressing device, chemical mechanical polishing device with dressing device, and dresser plate for dressing device | |
KR101881376B1 (en) | An dressing apparatus | |
JP2006524922A (en) | Wafer carrier pivot mechanism | |
JP4013187B2 (en) | Waxless mount polishing machine | |
KR100807046B1 (en) | Chemical mechanical polishing apparatus | |
TW202222489A (en) | Polishing head, chemical mechanical polishing apparatus and method | |
JP2010023122A (en) | Holding device and polishing apparatus | |
CN108015668B (en) | Substrate holding device, elastic film, polishing device, and method for replacing elastic film | |
JP7517910B2 (en) | Processing Equipment | |
KR100338404B1 (en) | cup-wheel-shaped grindstone and plane grinding machine having the same | |
KR102128772B1 (en) | Conditioning device for cmp equipment | |
KR102665604B1 (en) | Apparatus for conditioning polishing pad | |
KR100899637B1 (en) | Wafer doubleside polishing device | |
JP4176343B2 (en) | Polisher retainer mechanism | |
US20070197144A1 (en) | Wafer polishing apparatus | |
JP3875528B2 (en) | Polishing equipment | |
TWI859394B (en) | Tilt adjustment mechanism | |
KR200288678Y1 (en) | Locking apparatus of wheel with waper polishing machine | |
US6641468B2 (en) | Slurry distributor | |
KR102128780B1 (en) | Disc assembly of conditioner for cmp equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant |