KR101522128B1 - 5원 화합물 반도체 cztsse의 제조 방법, 및 박막 태양광 전지 - Google Patents
5원 화합물 반도체 cztsse의 제조 방법, 및 박막 태양광 전지 Download PDFInfo
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 66
- 150000001875 compounds Chemical class 0.000 title claims abstract description 64
- 239000010409 thin film Substances 0.000 title claims abstract description 42
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 26
- 239000011669 selenium Substances 0.000 claims abstract description 153
- 229910052717 sulfur Inorganic materials 0.000 claims abstract description 129
- 239000002243 precursor Substances 0.000 claims abstract description 107
- 238000000034 method Methods 0.000 claims abstract description 98
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 92
- 239000011593 sulfur Substances 0.000 claims abstract description 91
- 239000010949 copper Substances 0.000 claims abstract description 89
- 229910052711 selenium Inorganic materials 0.000 claims abstract description 78
- 239000011701 zinc Substances 0.000 claims abstract description 69
- 239000011135 tin Substances 0.000 claims abstract description 67
- 230000008569 process Effects 0.000 claims abstract description 66
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 53
- 229910052802 copper Inorganic materials 0.000 claims abstract description 48
- 229910052718 tin Inorganic materials 0.000 claims abstract description 47
- 229910052798 chalcogen Inorganic materials 0.000 claims abstract description 43
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims abstract description 38
- 150000001787 chalcogens Chemical class 0.000 claims abstract description 38
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 36
- 238000000151 deposition Methods 0.000 claims abstract description 30
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 22
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims abstract description 22
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 20
- -1 selenium chalcogen Chemical class 0.000 claims abstract description 8
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims abstract 3
- 239000007789 gas Substances 0.000 claims description 82
- 230000008021 deposition Effects 0.000 claims description 20
- 230000007423 decrease Effects 0.000 claims description 14
- 239000011358 absorbing material Substances 0.000 claims description 3
- 238000007669 thermal treatment Methods 0.000 claims description 3
- 239000006096 absorbing agent Substances 0.000 abstract description 23
- 238000010438 heat treatment Methods 0.000 description 30
- 239000000758 substrate Substances 0.000 description 25
- 229910007610 Zn—Sn Inorganic materials 0.000 description 21
- 238000012545 processing Methods 0.000 description 15
- 239000000203 mixture Substances 0.000 description 13
- 150000002739 metals Chemical class 0.000 description 11
- 239000000463 material Substances 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 8
- 239000013078 crystal Substances 0.000 description 8
- KYRUBSWVBPYWEF-UHFFFAOYSA-N copper;iron;sulfane;tin Chemical compound S.S.S.S.[Fe].[Cu].[Cu].[Sn] KYRUBSWVBPYWEF-UHFFFAOYSA-N 0.000 description 7
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- 238000005240 physical vapour deposition Methods 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 6
- 239000002019 doping agent Substances 0.000 description 5
- 229910052733 gallium Inorganic materials 0.000 description 5
- 229910052738 indium Inorganic materials 0.000 description 5
- 239000011261 inert gas Substances 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000002250 absorbent Substances 0.000 description 4
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- 238000002207 thermal evaporation Methods 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
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- 229910052750 molybdenum Inorganic materials 0.000 description 3
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- 230000036961 partial effect Effects 0.000 description 3
- 239000012071 phase Substances 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 206010010957 Copper deficiency Diseases 0.000 description 2
- 229910017518 Cu Zn Inorganic materials 0.000 description 2
- 229910017755 Cu-Sn Inorganic materials 0.000 description 2
- 229910017752 Cu-Zn Inorganic materials 0.000 description 2
- 229910017927 Cu—Sn Inorganic materials 0.000 description 2
- 229910017943 Cu—Zn Inorganic materials 0.000 description 2
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical compound S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000008033 biological extinction Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 2
- TVZPLCNGKSPOJA-UHFFFAOYSA-N copper zinc Chemical compound [Cu].[Zn] TVZPLCNGKSPOJA-UHFFFAOYSA-N 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
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- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 230000008092 positive effect Effects 0.000 description 2
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 238000001771 vacuum deposition Methods 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- BWGNESOTFCXPMA-UHFFFAOYSA-N Dihydrogen disulfide Chemical compound SS BWGNESOTFCXPMA-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 206010048259 Zinc deficiency Diseases 0.000 description 1
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- 230000006978 adaptation Effects 0.000 description 1
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- 238000001354 calcination Methods 0.000 description 1
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical compound [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 description 1
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- 208000024234 coloboma, osteopetrosis, microphthalmia, macrocephaly, albinism, and deafness Diseases 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 description 1
- BWFPGXWASODCHM-UHFFFAOYSA-N copper monosulfide Chemical compound [Cu]=S BWFPGXWASODCHM-UHFFFAOYSA-N 0.000 description 1
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- 239000001257 hydrogen Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
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- IRPLSAGFWHCJIQ-UHFFFAOYSA-N selanylidenecopper Chemical compound [Se]=[Cu] IRPLSAGFWHCJIQ-UHFFFAOYSA-N 0.000 description 1
- 125000003748 selenium group Chemical group *[Se]* 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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- H01L21/02104—Forming layers
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- H01L21/02518—Deposited layers
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- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/128—Active materials comprising only Group I-II-IV-VI kesterite materials, e.g. Cu2ZnSnSe4 or Cu2ZnSnS4
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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Abstract
Description
도 1은 화합물 반도체 CZTSSe로 이루어진 박막 태양광 전지의 흡광체를 제조하기 위한 일반적 방법을 예시한 단면도이다.
도 2 내지 도 4는 5원 화합물 반도체 CZTSSe를 제조하기 위한 구체적인 절차를 예시한 단면도이다.
3: 기판 4: 후방 전극 층
5: 제1 전구체 층 6: 제2 전구체 층
7: 층 구조물 8: 화살표
9: 표면 10: 계면
11: 전구체 층 스택 12: 본체
13: 공정 챔버
Claims (10)
- Cu2ZnSn(S,Se)4 유형의 5원 케스테라이트/스태나이트로 구성된 화합물 반도체의 제조 방법이며,
- 제1 스테이지에서, 본체(12) 상으로의 구리, 아연 및 주석 금속의 침착에 의해 제조된 제1 전구체 층(5)과, 제2 스테이지에서, 제1 전구체 층(5) 상으로의 황 및 셀렌 칼코겐 중 하나 이상의 침착에 의해 제조된 제2 전구체 층(6)으로 이루어진 적어도 하나의 전구체 층 스택(11)을 제조하는 단계,
- 제1 전구체 층(5)의 금속 및 제2 전구체 층(6)의 적어도 하나의 칼코겐이 화합물 반도체(2)로 반응적으로 변환되도록 공정 챔버(13) 내에서 적어도 하나의 전구체 층 스택(11)을 열 처리하는 단계,
- 적어도 하나의 전구체 층 스택(11)의 열 처리 동안 적어도 하나의 공정 가스를 공정 챔버(13) 내로 공급하는 단계를 포함하고,
황 및 셀렌으로부터 선택된 칼코겐이 제2 전구체 층(6) 내에 함유되는 경우, 각각의 다른 칼코겐 및 각각의 다른 칼코겐을 함유하는 화합물 중 하나 이상이 공정 가스 내에 함유되거나, 또는 황 및 셀렌의 두 칼코겐이 제2 전구체 층(6) 내에 함유되는 경우, 황, 셀렌, 황 함유 화합물 및 셀렌 함유 화합물 중 하나 이상이 공정 가스 내에 함유되는 방법. - 제1항에 있어서,
- 황 함량이 표면(9) 상에서 최댓값을 갖고, 계면(10)을 향해 감소하고, 계면(10) 상에서 최솟값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 최솟값을 갖고, 계면(10)을 향해 증가하고, 계면(10) 상에서 최댓값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 제1 최댓값을 갖고, 계면(10)을 향해 최솟값으로 감소한 후 다시 증가하고, 계면(10) 상에서 제2 최댓값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 제1 최솟값을 갖고, 계면(10)을 향해 최댓값으로 증가한 후 다시 감소하고, 계면(10) 상에서 제2 최솟값을 갖도록
화합물 반도체(2)의 표면(9)으로부터 본체(12)와의 계면(10)까지 황 깊이 프로파일을 구현하는 방법. - 제2항에 있어서, 황 함량의 상대 변동률이 깊이 프로파일의 적어도 일부에 걸쳐 10% 이상이 되도록 황 깊이 프로파일을 구현하는 방법.
- 제1항 내지 제3항 중 어느 한 항에 있어서,
- 구리, 아연 및 주석 금속의 개별 층들로 이루어진 층 스택을 연속해서 수 회 침착시키고/시키거나,
- 황 및 셀렌 칼코겐의 개별 층들로 이루어진 층 스택을 연속해서 수 회 침착시키는 방법. - 제1항 내지 제3항 중 어느 한 항에 있어서, 전구체 층 스택(11)을 연속하여 수 회 침착시키는 방법.
- 제1항 내지 제3항 중 어느 한 항에 있어서, 하나 또는 복수의 제2 시간 간격 동안 적어도 하나의 공정 가스를 공급하되, 제2 시간 간격은 각각의 경우에, 열 처리를 수행하는 제1 시간 간격보다 더 짧은 방법.
- 제1항 내지 제3항 중 어느 한 항에 있어서,
- 구리 함량이 아연 및 주석의 합계 함량보다 적고,
- 아연 함량이 주석 함량보다 크도록
제1 전구체 층(5)을 구현하는 방법. - 제1항 내지 제3항 중 어느 한 항에 있어서, 칼코겐의 총 함량 대 금속의 총 함량의 비가 1 이상이 되도록 2개의 전구체 층(5, 6)을 구현하는 방법.
- 본체(12) 상에 배치된 Cu2ZnSn(S,Se)4 유형의 5원 케스테라이트/스태나이트로 이루어진 화합물 반도체로 구성된 흡광체(2)를 갖는 박막 태양광 전지이며,
화합물 반도체(2)는 화합물 반도체(2)의 표면(9)으로부터 본체(12)와의 계면(10)을 향해 사전 정의가능한 황 깊이 프로파일을 가지며, 황 깊이 프로파일은
- 황 함량이 표면(9) 상에서 최댓값을 갖고, 계면(10)을 향해 감소하고, 계면(10) 상에서 최솟값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 최솟값을 갖고, 계면(10)을 향해 증가하고, 계면(10) 상에서 최댓값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 제1 최댓값을 갖고, 계면(10)을 향해 최솟값으로 감소한 후 다시 증가하고, 계면(10) 상에서 제2 최댓값을 갖거나; 또는
- 황 함량이 표면(9) 상에서 제1 최솟값을 갖고, 계면(10)을 향해 최댓값으로 증가한 후 다시 감소하고, 계면(10) 상에서 제2 최솟값을 갖도록 구현된 것인 박막 태양광 전지. - 제1항 내지 제3항 중 어느 한 항에 있어서, 박막 태양광 전지 또는 박막 태양광 모듈의 흡광체(2)를 제조하는데 사용되는 방법.
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EP11157718 | 2011-03-10 | ||
EP11157718.5 | 2011-03-10 | ||
PCT/EP2012/052993 WO2012119857A1 (de) | 2011-03-10 | 2012-02-22 | Verfahren zur herstellung des pentanären verbindungshalbleiters cztsse, sowie dünnschichtsolarzelle |
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US (1) | US9087954B2 (ko) |
EP (1) | EP2684212A1 (ko) |
JP (1) | JP2014513413A (ko) |
KR (1) | KR101522128B1 (ko) |
CN (1) | CN103403851A (ko) |
BR (1) | BR112013018999A2 (ko) |
WO (1) | WO2012119857A1 (ko) |
ZA (1) | ZA201305821B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102075633B1 (ko) | 2018-11-08 | 2020-02-10 | 재단법인대구경북과학기술원 | CZTSSe계 박막 제조방법 및 이를 이용한 박막 태양전지 제조방법 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2842169A1 (en) * | 2012-04-27 | 2015-03-04 | Saint-Gobain Glass France | Method for producing the pentanary compound semiconductor cztsse doped with sodium |
CN103094422A (zh) * | 2013-01-29 | 2013-05-08 | 电子科技大学 | 铜锌锡硫硒薄膜制备中的掺杂工艺 |
JP6061765B2 (ja) * | 2013-04-16 | 2017-01-18 | ソーラーフロンティア株式会社 | 太陽電池の製造方法 |
EP2800146A1 (en) * | 2013-05-03 | 2014-11-05 | Saint-Gobain Glass France | Back contact substrate for a photovoltaic cell or module |
CN104701394B (zh) * | 2013-12-09 | 2017-02-15 | 北京有色金属研究总院 | 一种具有择优取向的Cu2ZnSn(S1‑xSex)4薄膜 |
US9240501B2 (en) * | 2014-02-12 | 2016-01-19 | Solar Frontier K.K. | Compound-based thin film solar cell |
EP2947682A1 (en) * | 2014-05-20 | 2015-11-25 | IMEC vzw | Method for forming chalcogenide layers |
KR101656842B1 (ko) * | 2014-08-18 | 2016-09-13 | 재단법인대구경북과학기술원 | 태양전지용 CZTS/CZTSe계 박막 및 제조방법 및 그 방법에 의해 제조된 CZTS/CZTSe계 박막 |
US9530908B2 (en) | 2014-11-13 | 2016-12-27 | International Business Machines Corporation | Hybrid vapor phase-solution phase growth techniques for improved CZT(S,Se) photovoltaic device performance |
KR101733438B1 (ko) | 2015-02-11 | 2017-05-11 | 한국과학기술연구원 | 경사조성형 칼코제나이드 박막 및 그 제조방법 |
CN104979429B (zh) * | 2015-06-11 | 2016-10-05 | 岭南师范学院 | 一种微米级球形铜锌锡硫硒单晶颗粒的制备方法 |
KR102284740B1 (ko) | 2018-11-23 | 2021-08-03 | 재단법인대구경북과학기술원 | CZTSSe계 광흡수층의 제조방법 및 이를 포함하는 태양전지의 제조방법 |
KR101978110B1 (ko) | 2019-02-01 | 2019-05-13 | 재단법인대구경북과학기술원 | 화합물 광흡수층의 제조방법 및 이를 포함하는 태양전지의 제조방법 |
CN112899652A (zh) * | 2019-11-19 | 2021-06-04 | 中国科学院微电子研究所 | 一种原子层沉积制备薄膜材料的装置和方法 |
KR102420408B1 (ko) * | 2020-07-31 | 2022-07-13 | 전남대학교산학협력단 | 무기박막태양전지용 p형 화합물 반도체층 제조방법 및 상기 방법으로 제조된 p형 화합물 반도체층을 포함하는 무기박막태양전지 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060121701A1 (en) * | 2004-03-15 | 2006-06-08 | Solopower, Inc. | Technique and apparatus for depositing layers of semiconductors for solar cell and module fabrication |
US20090148669A1 (en) * | 2007-12-10 | 2009-06-11 | Basol Bulent M | Methods structures and apparatus to provide group via and ia materials for solar cell absorber formation |
JP2009537997A (ja) * | 2006-05-24 | 2009-10-29 | アトーテヒ ドイッチュラント ゲゼルシャフト ミット ベシュレンクテル ハフツング | 薄膜太陽電池を製造するのに適した銅−亜鉛−錫析出のための金属メッキ組成及び方法 |
JP2010225829A (ja) * | 2009-03-24 | 2010-10-07 | Honda Motor Co Ltd | 薄膜太陽電池の光吸収層の形成方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19956735B4 (de) | 1999-11-25 | 2008-08-21 | Shell Erneuerbare Energien Gmbh | Dünnfilmsolarzelle mit einer Chalkopyritverbindung und einer Titan und Sauerstoff enthaltenden Verbindung |
JP4394366B2 (ja) * | 2003-03-26 | 2010-01-06 | 時夫 中田 | 両面受光太陽電池 |
US20070111367A1 (en) * | 2005-10-19 | 2007-05-17 | Basol Bulent M | Method and apparatus for converting precursor layers into photovoltaic absorbers |
US7854963B2 (en) * | 2006-10-13 | 2010-12-21 | Solopower, Inc. | Method and apparatus for controlling composition profile of copper indium gallium chalcogenide layers |
CN101578707B (zh) * | 2006-11-10 | 2012-08-22 | 索罗能源公司 | 用于形成太阳能电池吸收体的前驱物膜的卷对卷反应 |
KR20100073717A (ko) * | 2008-12-23 | 2010-07-01 | 삼성전자주식회사 | 태양전지 및 그 제조 방법 |
CN102459063A (zh) * | 2009-05-26 | 2012-05-16 | 珀杜研究基金会 | 包含Cu、Zn、Sn、S和Se的多元硫族元素化物纳米粒子的合成 |
EP2474044A4 (en) * | 2009-09-02 | 2014-01-15 | Brent Bollman | METHOD AND DEVICES FOR PROCESSING A PRECURSORY LAYER IN A GROUP WITH THE AID OF THEIR ENVIRONMENT |
-
2012
- 2012-02-22 KR KR1020137023495A patent/KR101522128B1/ko not_active IP Right Cessation
- 2012-02-22 JP JP2013557035A patent/JP2014513413A/ja not_active Ceased
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- 2012-02-22 WO PCT/EP2012/052993 patent/WO2012119857A1/de active Application Filing
- 2012-02-22 CN CN2012800123015A patent/CN103403851A/zh active Pending
-
2013
- 2013-08-01 ZA ZA2013/05821A patent/ZA201305821B/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060121701A1 (en) * | 2004-03-15 | 2006-06-08 | Solopower, Inc. | Technique and apparatus for depositing layers of semiconductors for solar cell and module fabrication |
JP2009537997A (ja) * | 2006-05-24 | 2009-10-29 | アトーテヒ ドイッチュラント ゲゼルシャフト ミット ベシュレンクテル ハフツング | 薄膜太陽電池を製造するのに適した銅−亜鉛−錫析出のための金属メッキ組成及び方法 |
US20090148669A1 (en) * | 2007-12-10 | 2009-06-11 | Basol Bulent M | Methods structures and apparatus to provide group via and ia materials for solar cell absorber formation |
JP2010225829A (ja) * | 2009-03-24 | 2010-10-07 | Honda Motor Co Ltd | 薄膜太陽電池の光吸収層の形成方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102075633B1 (ko) | 2018-11-08 | 2020-02-10 | 재단법인대구경북과학기술원 | CZTSSe계 박막 제조방법 및 이를 이용한 박막 태양전지 제조방법 |
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CN103403851A (zh) | 2013-11-20 |
JP2014513413A (ja) | 2014-05-29 |
KR20130143109A (ko) | 2013-12-30 |
BR112013018999A2 (pt) | 2017-01-31 |
WO2012119857A1 (de) | 2012-09-13 |
EP2684212A1 (de) | 2014-01-15 |
US9087954B2 (en) | 2015-07-21 |
US20140053896A1 (en) | 2014-02-27 |
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