JPWO2019225441A1 - Probe pin - Google Patents

Abstract

The probe pin includes a first contact spring portion and a second contact spring portion, and an intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion. The buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, which is the arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion with respect to the intermediate portion. The first contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction that intersects the intermediate portion in the first direction and the second direction.

Description

The present disclosure relates to probe pins that can be placed in connectors that can be connected to the object to be connected.

In electronic component modules such as USB devices, continuity inspection, operation characteristic inspection, and the like are generally performed in the manufacturing process. These inspections are performed by connecting the inspection device and the electronic component module with a connector.

As such a connector, there is one described in Patent Document 1. This connector has a base that can be placed on the board, a fitting that extends parallel to the top of the board from the top of the base and can be fitted to the electronic component module, and multiple contacts attached to the base. It is equipped with a member. In the connector, the movement restricting portion provided in the base portion and the movement restricting portion provided in the fitting portion are engaged with each other with a gap, and the fitting portion is the base within the range of the gap. It is movable relative to the part. As a result, even when the electronic component modules are connected in an oblique direction with respect to the fitting direction, the electronic component modules can be smoothly fitted and connected.

Japanese Unexamined Patent Publication No. 2015-158990

However, in the connector, since the movement restricting portions are provided at both ends of the base portion and the fitting portion in the longitudinal direction, each member of the base portion and the fitting portion must be formed with high accuracy. It may be difficult to move the mating part as designed. In this case, when the electronic component module is connected in an oblique direction with respect to the fitting direction, stress is applied to the contact member in the direction intersecting the planned contact direction, and the contact member is damaged. There is a possibility that it will be done.

It is an object of the present disclosure to provide a probe pin that is not easily damaged even when stress is applied in a direction intersecting the planned contact direction.

The probe pin of the example of the present disclosure is
A probe pin that can be placed on a connector that can be connected to an object to be connected.
The first contact spring part and the second contact spring part,
An intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion are provided.
In the intermediate portion, both ends in the first direction are connected to the first contact spring portion and the buffer spring portion, respectively.
In the buffer spring portion, both ends in the first direction are connected to the intermediate portion and the second contact spring portion, respectively, and the first contact spring portion, the intermediate portion, and the intermediate portion are connected to the intermediate portion. It is configured to be elastically deformable in the second direction intersecting the first direction, which is the arrangement direction of the buffer spring portion and the second contact spring portion.
The first contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion.

According to the probe pin, the probe pin includes a first contact spring portion and a second contact spring portion, and an intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion. The buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, which is the arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion with respect to the intermediate portion. The first contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the intermediate portion in the first direction and the second direction. With such a configuration, even if a stress in a direction intersecting the planned contact direction is applied, the stress can be dispersed by the buffer spring portion to reduce damage to the probe pin. As a result, a probe pin that is not easily damaged can be realized.

The perspective view which shows the connector of 1st Embodiment of this disclosure. Sectional view taken along line II-II of FIG. FIG. 3 is a cross-sectional view taken along the line III-III of FIG. The side view of the connector of FIG. 1 on the 1st terminal connection part side. The perspective view which shows the 1st terminal connection part of the connector of FIG. FIG. 5 is a cross-sectional view taken along the line VI-VI of FIG. The perspective view which shows the probe pin of the connector of FIG. Sectional drawing taken along the line VIII-VIII of FIG. The perspective view which shows the 1st modification of the connector of FIG. FIG. 5 is a side view of the first terminal connection portion side in a state where the connector housing of the connector of FIG. 9 is removed. The perspective view which shows the 2nd modification of the connector of FIG. FIG. 3 is a perspective view of a first terminal connection portion showing a third modification of the connector of FIG. FIG. 2 is a cross-sectional view taken along the line II-II of FIG. 1 showing a fourth modification of the connector of FIG. FIG. 5 is a plan view showing a state before the first contact spring portion of the probe pin of FIG. 7 is elastically deformed. FIG. 5 is a plan view showing a state after the first contact spring portion of the probe pin of FIG. 7 is elastically deformed. The perspective view which shows the 5th modification of the connector of FIG. The perspective view which shows the 1st modification of the probe pin of FIG. The perspective view which shows the 2nd modification of the probe pin of FIG. The perspective view which shows the 3rd modification of the probe pin of FIG. The perspective view which shows the 4th modification of the probe pin of FIG. The perspective view which shows the 5th modification of the probe pin of FIG. The perspective view which shows the 6th modification of the probe pin of FIG. The perspective view which shows the 7th modification of the probe pin of FIG. The perspective view which shows the 8th modification of the probe pin of FIG. The perspective view which shows the 9th modification of the probe pin of FIG. FIG. 5 is a plan view showing a state before the first contact spring portion and the second contact spring portion of the probe pin of FIG. 25 are elastically deformed. FIG. 5 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe pin of FIG. 25 are elastically deformed. The perspective view which shows the probe pin of the 2nd Embodiment of this disclosure. FIG. 28 is a plan view showing a state before the first contact spring portion of the probe pin of FIG. 28 is elastically deformed. FIG. 28 is a plan view showing a state after the first contact spring portion of the probe pin of FIG. 28 is elastically deformed. The perspective view which shows the modification of the probe pin of FIG. 28. FIG. 31 is a plan view showing a state before the first contact spring portion and the second contact spring portion of the probe pin of FIG. 31 are elastically deformed. FIG. 3 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe pin of FIG. 32 are elastically deformed.

Hereinafter, an example of the present disclosure will be described with reference to the accompanying drawings. In the following description, terms indicating a specific direction or position (for example, terms including "top", "bottom", "right", and "left") are used as necessary, but the use of these terms is used. Is for facilitating the understanding of the present disclosure with reference to the drawings, and the meaning of those terms does not limit the technical scope of the present disclosure. In addition, the following description is merely an example and is not intended to limit the present disclosure, its application, or its use. Furthermore, the drawings are schematic, and the ratio of each dimension and the like do not always match the actual ones.

(First Embodiment)
The connector 1 of the first embodiment of the present disclosure is configured to be connectable to an inspection device 100 and an inspection target 200 of an example of a connection object (see FIG. 3), and as shown in FIG. 1, the connector housing 10 and the connector housing 10 thereof. The connector housing 10 is provided with a first terminal connection portion 20 (an example of the housing of the connector 1) that is swingably supported. As shown in FIG. 2, an urging portion 30 is provided inside the connector housing 10.

As shown in FIG. 1, the connector housing 10 has a substantially rectangular box shape, and is composed of an upper housing 11 and a lower housing 12 stacked in the thickness direction (that is, the vertical direction in FIG. 1). There is. The connector housing 10 has an opening surface 13 on one of the side surfaces facing the longitudinal direction (that is, the first direction X), and the opening surface 13 is provided with a substantially elliptical opening 14. ..

As shown in FIG. 3, inside the connector housing 10, a substrate 40 and a second terminal connecting portion 50 that can be connected to the inspection device 100 are provided. The substrate 40 is electrically connected to the first terminal connection portion 20 and the second terminal connection portion 50 via connection terminals 41 (shown in FIG. 6) provided at both ends of the first direction X on the plate surface. Has been done. The second terminal connecting portion 50 is arranged on the opposite side of the first terminal connecting portion 20 in the first direction X with respect to the substrate 40.

As shown in FIG. 3, in the first terminal connection portion 20, the first end portion 201, which is one end portion of the first direction X intersecting (for example, orthogonal to) the opening surface 13, is located inside the connector housing 10. The second end 202, which is the other end of the first direction X, is exposed to the outside of the connector housing 10 so that the inspection target 200 can be connected. The inspection target 200 is, for example, an electronic component module having a USB connector or an HDMI connector.

Further, as shown in FIG. 4, in the first terminal connection portion 20, a gap 15 is arranged at the reference position P in the opening 14 and between the first terminal connection portion 20 and the edge portion of the opening 14, and is shown on the opening surface 13. It is supported by the connector housing 10 in a state where it can swing in any direction up, down, left, and right of 4. In this embodiment, the gap 15 is provided at the reference position P over the entire circumference of the first terminal connecting portion 20 around the first direction X (that is, the paper surface penetrating direction in FIG. 2).

Specifically, as shown in FIG. 3, the first terminal connecting portion 20 has a plate-shaped probe pin 60 and a second direction Y (for example, orthogonal) extending in the first direction X and intersecting the first direction X (for example, orthogonally). (Shown in FIG. 4) has a connection housing 21 provided with a first accommodating portion 22 capable of accommodating the probe pins 60 so that the plate surfaces face each other. In this embodiment, the first terminal connection portion 20 has a plurality of probe pins 60 as shown in FIG. 2, and a plurality of probe pins 60 are arranged in the connection housing 21 at intervals along the second direction Y. A pair of first accommodating portions 22 is provided, and probe pins 60 are accommodating in each of the first accommodating portions 22. As a result, the first accommodating portion 22 of each pair intersects (for example, orthogonally) the first direction X and the second direction Y of the first terminal connecting portion 20 when viewed from the first direction X. They are arranged symmetrically with respect to the center line L1 and are electrically independent of each other. That is, the probe pins 60 housed in the first accommodating portion 22 of each pair can sandwich the inspection target 200 from the third direction Z by the first contact spring portion 61 described later, and the second contact spring portion described later. The substrate 40 is configured to be able to be sandwiched from the third direction Z by 62.

As shown in FIG. 3, at the end of the connection housing 21 on the first end 201 side, a support portion 211 for supporting the urging member (that is, the coil spring 31) of the urging portion 30 described later is provided. At the end of the connection housing 21 on the second end 202 side, a recess 23 that opens in the first direction X and can accommodate the inspection target 200 from the first direction X and a confirmation window 24 are provided. .. Inside the recess 23, a first contact spring portion 61, which will be described later, of each probe pin 60 is arranged. That is, the inspection target 200 is connected to the first terminal connection portion 20 along the first direction X. Further, the confirmation window 24 communicates with the first accommodating portion 22 and the outside of the connection housing 21, so that the first contact spring portion 61 of each probe pin 60 can be confirmed from the outside of the connection housing 21.

Further, as shown in FIG. 5, the first terminal connecting portion 20 covers the outer surface of the connecting housing 21 and has a conductive outer shell portion 25 provided with a ground terminal 26 arranged inside the connector housing 10. Have. In this embodiment, the outer shell portion 25 is made of a metal such as iron and covers a region of the outer surface of the connection housing 21 excluding the second end portion 202 in a state of being electrically independent of each probe pin 60. There is. With this configuration, when a connection object such as the inspection target 200 is connected to the first terminal connection portion 20, the connection object such as the inspection target 200 does not come into contact with the outer shell portion 25. Damage to the connection target such as the inspection target 200 at the time of connection to the 1-terminal connection portion 20 can be reduced. Further, a pair of ground terminals 26 are provided at both ends of the outer shell portion 25 in the second direction Y.

As shown in FIG. 3, the outer surface of the connection housing 21 is provided with a recess 212 capable of accommodating the outer shell portion 25. In the recess 212, the outer surface of the housed outer shell portion 25 is relative to the outer surface of the portion of the connection housing 21 where the recess 212 is not provided (for example, the end 213 on the second end 202 side of the connection housing 21). It is configured to be located on the same plane.

As shown in FIG. 6, the pair of ground terminals 26 are arranged so as to face the third direction Z, and are configured to be in contact with the substrate 40 connection terminal 41 in a state of being elastically deformed in the third direction Z. ing.

As shown in FIG. 2, the urging portion 30 is arranged inside the connector housing 10 and urges the first terminal connecting portion 20 with respect to the connector housing 10 toward the reference position P. Specifically, the urging portion 30 is composed of a plurality of urging members (in this embodiment, four coil springs 31), and the four coil springs 31 are virtual straight lines orthogonal to the first direction X (for example, a first direction). The 1-terminal connection portion 20 is arranged symmetrically with respect to the center line L1) in the third direction Z.

Each coil spring 31 is provided in each of the substantially cylindrical recess 214 provided in the support portion 211 of the connection housing 21 and the upper housing 11 and the lower housing 12 so as to face each other in the recess 214 of the connection housing 21. It is housed in a coil spring accommodating portion 16 composed of substantially columnar recesses 111 and 121 arranged in. By using the coil spring 31 as the urging member, the first terminal connecting portion 20 can be added to an arbitrary direction on the opening surface 13 and can be swung in the first direction X.

As shown in FIG. 7, each probe pin 60 has a plate shape, and is first between the first contact spring portion 61 and the second contact spring portion 62 and the first contact spring portion 61 and the second contact spring portion 62. It includes an intermediate portion 63 and a buffer spring portion 64 arranged in series along the direction X. That is, the first contact spring portion 61, the intermediate portion 63, the buffer spring portion 64, and the second contact spring portion 62 are arranged along the first direction X. Further, each probe pin 60 is formed by, for example, an electroforming method, and a first contact spring portion 61, an intermediate portion 63, a buffer spring portion 64, and a second contact spring portion 62 are integrally formed.

Each of the first contact spring portion 61 and the second contact spring portion 62 has a meandering shape when viewed from the second direction Y, and is configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63. .. Further, the first contact spring portion 61 is composed of a plurality of elastic pieces (in this embodiment, as an example, two strip-shaped elastic pieces 611 and 612) arranged with a gap 65 between them. As an example, the first contact spring portion 61 has a wavy shape or a meandering shape bent at two points in the first direction X. The elastic pieces 611 and 612 are connected to each other at an end portion of the first contact spring portion 61 far from the intermediate portion 63 in the extending direction (that is, the first direction X). That is, the gap 65 is surrounded by the elastic pieces 611, 612 and the intermediate portion 63, and extends from one end to the other end of the first contact spring portion 61 in the extending direction. In the first direction X of the first contact spring portion 61, in the vicinity of the bent portion far from the intermediate portion 63, the inspection target 200 housed in the recess 23 can be contacted from the third direction Z via the opening 14. A contact portion 66 is provided (see FIG. 3). The contact portion 66 contacts the inspection target 200 in addition to the third direction Z in a state where the force in the third direction Z is applied by the inspection target 200 connected to the connector 1 (see FIGS. 14 and 15). It is configured so that the gap 65 is narrowed by elastically deforming in the direction of expanding the area. That is, in a state where the force in the third direction Z is applied by the inspection target 200 connected to the connector 1, the area of the first contact spring portion 61 that comes into contact with the inspection target 200 increases in addition to the third direction Z. It is configured to be elastically deformable in the direction, and is configured so that the gap 65 between adjacent elastic pieces among the plurality of elastic pieces 611 and 612 is narrowed. With such a configuration, the first contact spring portion 61 can be elastically deformed more smoothly, and the durability of the first contact spring portion 61 can be improved. Further, since the first contact spring portion 61 is elastically deformed more smoothly, damage to the inspection target 200 due to the contact of the first contact spring portion 61 can be more reliably reduced. In this embodiment, the first contact spring portion 61 that comes into contact with the inspection target 200, which is inserted and removed from the connector 1 more frequently than the substrate 40, is composed of a plurality of elastic pieces 611 and 612.

The second contact spring portion 62 has the same configuration as the first contact spring portion 61, except that it is composed of one elastic piece. That is, the second contact spring portion 62 has a wavy shape or a meandering shape that is bent at two points in the first direction X, and the substrate 40 is located in the vicinity of the bent portion farther from the buffer spring portion 64 in the first direction X. A contact portion 68 that can be contacted from the third direction Z is provided (see FIG. 3).

The intermediate portion 63 has a substantially rectangular shape, and both ends of the first direction X are connected to the first contact spring portion 61 and the buffer spring portion 64, respectively. At the end of the intermediate portion 63 on the buffer spring portion 64 side, the direction X of the probe pin 60 when it is accommodated in the first accommodating portion 22 of the connection housing 21 and the direction toward the second contact spring portion 62. A first positioning unit 631 is provided to regulate the movement of the spring. The first positioning portion 631 is formed of a plane extending in a direction away from the buffer spring portion 64 in the third direction Z.

The buffer spring portion 64 has a substantially rectangular frame shape protruding from the intermediate portion 63 in the third direction Z, and both ends of the first direction X are connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and are intermediate. It is configured to be elastically deformable in the second direction Y (that is, in the plate thickness direction) with respect to the portion 63. At the end of the buffer spring portion 64 on the intermediate portion 63 side, the probe pin 60 is accommodated in the first accommodating portion 22 of the connection housing 21 in the first direction X and in the direction toward the first contact spring portion 61. A second positioning unit 641 that regulates movement is provided. The second positioning portion 641 is configured by a plane extending in the third direction Z away from the buffer spring portion 64 and in the direction opposite to the first positioning portion 631 of the intermediate portion 63.

Further, at the end of the second positioning portion 641 in the third direction Z far from the intermediate portion 63, a protrusion extending from the second positioning portion 641 along the first direction X toward the first contact spring portion 61. 642 is provided. As shown in FIG. 3, the protrusion 642 is provided in the support portion 211 of the connection housing 21 in the third direction Z, and is housed in the recess 215 arranged between the coil spring 31 and the intermediate portion 63. There is.

As shown in FIG. 3, each of the second contact spring portion 62 and the cushioning spring portion 64 is located outside the connection housing 21 and inside the connector housing 10. The buffer spring portion 64 is housed in a second accommodating portion 17 provided inside the connector housing 10, and the second contact spring portion 62 is accommodated in a third accommodating portion 18 provided inside the connector housing 10. There is.

Further, as shown in FIG. 8, the shortest distance D1 between the plate surface of the intermediate portion 63 in the second direction Y and the first accommodating portion 22 is the plate surface of the buffer spring portion 64 in the second direction Y and the second. It is smaller than the shortest distance D2 from the accommodating portion 17. Further, the plate thickness W1 of each probe pin 60 is configured to be 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. Although not shown, the shortest distance between the plate surface of the second contact spring portion 62 and the third accommodating portion 18 in the second direction Y is the plate surface of the intermediate portion 63 and the first in the second direction Y. It is substantially the same as the shortest distance D1 between the accommodating portion 22 and the accommodating portion 22.

In the connector 1, the connector 1 is arranged at a reference position P in which a gap 15 is provided between the connector housing 10 having the opening surface 13 provided with the opening 14 and the edge portion of the opening 14 in the opening 14. The first terminal connecting portion 20 supported by the connector housing 10 in a swingable state on the opening surface 13 and the urging portion 30 for urging the first terminal connecting portion 20 toward the reference position P. I have. With such a configuration, even when the inspection target 200 is connected from the direction intersecting the connection direction to the first terminal connection portion 20 (that is, the first direction X), the urging portion 30 is attached. After the first terminal connecting portion 20 is temporarily displaced from the reference position P against the force, the first terminal connecting portion 20 can be returned to the reference position P by the urging force of the urging portion 30. Therefore, since the first terminal connection portion 20 can be self-aligned with respect to the inspection target 200, the connector 1 that can be connected without damaging the connection target such as the inspection target 200 can be realized.

Further, the first terminal connection portion 20 has a conductive outer shell portion 25 that covers the outer surface thereof and is provided with a ground terminal 26 arranged inside the connector housing 10. The outer shell portion 25 can reduce the loss of signals in the high frequency region flowing through the connector.

Further, a substrate 40 electrically connected to the first terminal connection portion 20 is provided inside the connector housing 10, and the ground terminal 26 comes into contact with the connection terminal 41 of the substrate 40 in an elastically deformed state. It is configured to be possible. With such a configuration, the contact pressure of the ground terminal 26 with respect to the connection terminal 41 of the substrate 40 can be increased, and the contact reliability between the ground terminal 26 and the connection terminal 41 can be improved.

Further, the urging portion 30 is composed of a plurality of urging members (for example, coil springs 31), and the plurality of urging members are arranged symmetrically with respect to a virtual straight line L1 orthogonal to the first direction X. ing. With such a configuration, it is possible to reduce the variation in the urging force with respect to the first terminal connection portion 20 and more reliably swing the first terminal connection portion 20 as designed. As a result, the first terminal connection portion 20 can be more reliably self-aligned with respect to a connection object such as the inspection target 200.

Further, the first terminal connecting portion 20 has a plate-shaped probe pin 60 and a first accommodating portion 22 capable of accommodating the probe pin 60 so as to extend in the first direction X and face the plate surfaces in the second direction Y. It has a connection housing 21 provided, and the probe pin 60 has a first direction between the first contact spring portion 61 and the second contact spring portion 62 and the first contact spring portion 61 and the second contact spring portion 62. It includes an intermediate portion 63 and a buffer spring portion 64 arranged in series along X. The first contact spring portion 61 and the second contact spring portion 62 are configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63, and both ends of the intermediate portion 63 are in first contact with each other in the first direction X. It is connected to the spring portion 61 and the buffer spring portion 64, and the buffer spring portion 64 has both ends of the first direction X connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and with respect to the intermediate portion 63. It is configured to be elastically deformable in the second direction Y. The second contact spring portion 62 and the buffer spring portion 64 are located outside the connection housing 21 and inside the connector housing 10, and the connector housing 10 can accommodate the buffer spring portion 64 extending in the first direction X. A second housing unit 17 is provided. Then, the shortest distance D1 between the plate surface of the intermediate portion 63 and the first accommodating portion 22 in the second direction Y is between the plate surface of the buffer spring portion 64 and the second accommodating portion 17 in the second direction Y. It is smaller than the shortest distance D2. With such a configuration, the direction in which the inspection target 200 is connected to the first terminal connection portion 20 from the direction intersecting the contact direction (that is, the first direction X) and intersects the probe pin 60 in the planned contact direction. Even if a stress (for example, the second direction Y) is applied, the stress can be dispersed by the buffer spring portion 64 to reduce damage to the probe pin 60. That is, even when a connection object such as the inspection target 200 is connected to the first terminal connection portion 20 from a direction intersecting the contact direction, the probe pin 60 that is not easily damaged can be realized.

Further, the connection housing 21 communicates with the first accommodating portion 22 and the outside of the connection housing 21, and has a confirmation window 24 in which the first contact spring portion 61 can be confirmed from the outside of the connection housing 21. With this confirmation window 24, the accommodation state of the first contact spring portion 61 of the probe pin 60 accommodated in the first accommodation portion 22 can be easily confirmed.

Further, the first terminal connecting portion 20 has a plurality of probe pins 60 and a plurality of first accommodating portions 22 arranged at intervals in the second direction Y and accommodating each probe pin 60. The plate thickness W1 of each probe pin 60 is ½ or less of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. With such a configuration, the insulating property of each probe pin 60 can be surely secured.

Further, the probe pin 60 is provided between the first contact spring portion 61 and the second contact spring portion 62, and is in the first direction X with respect to the first terminal connection portion 20 when the probe pin 60 is accommodated in the first accommodating portion 22. Further, positioning units 631 and 641 for determining the position are provided. The positioning portions 631 and 641 can reduce the dropping of the probe pin 60 from the first accommodating portion 22.

Further, the positioning portion is provided on one side of the third direction Z of the intermediate portion 63, and the first positioning portion regulates the movement toward one side of the first direction X (for example, the direction toward the second contact spring portion 62). A second positioning unit provided on the other side of the buffer spring portion 64 and the third direction Z of the buffer spring portion 64 and restricting the movement of the first direction X toward the other side (for example, the direction toward the first contact spring portion 61). It has 641 and. With such a configuration, it is possible to further reduce the dropout of the probe pin 60 from the first accommodating portion 22.

In the connector 1, the connector housing 10 is composed of an upper housing 11 and a lower housing 12 laminated in the third direction Z, but the present invention is not limited to this. For example, as shown in FIG. 9, the left housing 71 and the right housing 72 laminated in the second direction Y may be formed. In this case, as shown in FIG. 10, the four coil springs 31 of the urging portion 30 are in the second direction of the first terminal connecting portion 20 when viewed from the first direction X (that is, the paper surface penetrating direction in FIG. 10). It can be arranged symmetrically with respect to the center line L2 of Y.

Further, the shortest distance D1 between the plate surface of the intermediate portion 63 of the probe pin 60 accommodated in the first accommodating portion 22 and the first accommodating portion 22 is the plate surface of the buffer spring portion 64 of the probe pin 60 and the first. 2 It is configured to be smaller than the shortest distance D2 between the accommodating portion 17, but the present invention is not limited to this, and for example, the shortest distance D1 and the shortest distance D2 may be configured to be the same.

The outer shell portion 25 is not limited to the case where it is configured to cover a part of the connection housing 21, and may be configured to cover the entire connection housing 21 as shown in FIG. 9, for example. If it is not necessary to consider the signal loss in the high frequency region so much, it can be omitted.

The ground terminal 26 is not limited to the case where it is configured to come into contact with the connection terminal 41 of the substrate 40 in an elastically deformed state, but is configured to come into contact with the connection terminal 41 of the substrate 40 in a state where it is not elastically deformed. You may. In this case, for example, the ground terminal 26 may be connected to the connection terminal 41 of the substrate 40 by soldering or the like to improve the contact reliability.

The urging portion 30 is not limited to the case where it is composed of four coil springs 31, and may be composed of, for example, 1 to 3 coil springs 31 or 5 or more coil springs 31. .. Further, the urging portion 30 is not limited to the case where the plurality of coil springs 31 are arranged above and below the third direction Z, and the plurality of coil springs 31 are added above and below the third direction Z to the left and right of the second direction Y. It may be placed in one or both.

The urging member is not limited to the coil spring 31, and may be composed of, for example, a leaf spring 32 as shown in FIG. In FIG. 12, two leaf springs 32 are arranged above and below the third direction Z (only three leaf springs 32 are shown in FIG. 12), and leaf springs 32 are arranged on both the left and right sides of the second direction Y, respectively. Two are arranged.

The configuration of the terminal connection portion can be appropriately changed according to the design of the connector 1 and the like.

For example, the probe pin of the first terminal connection portion 20 is not limited to the probe pin 60, and a probe pin having another configuration can be used. For example, as the probe pin of the first terminal connecting portion 20, a probe pin formed by a method other than the electroforming method can be used, or a probe pin not provided with the positioning portions 631 and 641 can be used.

Further, the connection housing 21 is not limited to the case where it has a plurality of pairs of first accommodating portions 22 arranged at intervals along the second direction Y, for example, as shown in FIG. 13, in the third direction Z. A plurality of first accommodating portions 22 may be provided only on one side with respect to the center line L1 (in FIG. 13, the upper housing 11 side of the center line L1 in the third direction Z). In this case, the ground terminal 26 of the outer shell portion 25 may be provided only on one side of the center line L1 in the third direction Z.

Further, in the plurality of probe pins 60 of the first terminal connection portion 20, as shown in FIG. 5, the tip portions of the first contact spring portion 61 and the second contact spring portion 62 are aligned along the second direction Y. Although they are arranged side by side (in FIG. 5, only the second contact spring portion 62 is shown), the present invention is not limited to this. For example, a plurality of probe pins 60 may be arranged in a staggered pattern in which the tips of the first contact spring portion 61 and the second contact spring portion 62 are alternately displaced in the first direction X.

Further, as shown in FIG. 16, the confirmation window 24 may be omitted.

Further, the plate thickness W1 of each probe pin 60 is not limited to the case where the plate thickness W1 is configured to be 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. The plate thickness W1 of each probe pin 60 can be configured to be larger than 1/2 of the shortest distance W2 between the plate surfaces of adjacent probe pins 60.

The probe pin 60 is an intermediate portion 63 and a buffer spring portion 64 arranged in series between the first contact spring portion 61 and the second contact spring portion 62 and the first contact spring portion 61 and the second contact spring portion 62. The buffer spring portion 64 is elastically deformable in the second direction Y with respect to the intermediate portion 63, and each of the first contact spring portion 61 and the second contact spring portion 62 is a third with respect to the intermediate portion 63. Any configuration can be adopted as long as it can be elastically deformed in the direction Z.

For example, as shown in FIG. 17, the first contact spring portion 61 can be composed of one elastic piece, and the second contact spring portion 62 can be composed of a plurality of elastic pieces. In the probe pin 60 of FIG. 17, the second contact spring portion 62 is composed of two elastic pieces 621 and 622 arranged with a gap 67 from each other.

Further, as shown in FIG. 18, each of the first contact spring portion 61 and the second contact spring portion 62 can be composed of a plurality of elastic pieces. In the probe pin 60 of FIG. 18, the first contact spring portion 61 is composed of three elastic pieces 611, 612, and 613 arranged with a gap 65 between them, and the second contact spring portion 62 has a gap between them. It is composed of three elastic pieces 621, 622, and 623 arranged with 67 apart.

The buffer spring portion 64 is not limited to a frame shape, and any configuration can be adopted as long as it can be elastically deformed in the second direction Y with respect to the intermediate portion 63. For example, as shown in FIG. 19, the buffer spring portion 64 includes a first connection portion 643 connected to the intermediate portion 63, a second connection portion 644 connected to the second contact spring portion 62, and a first connection portion. It can consist of 643 and a wavy or meandering third connection 645 that is connected to the second connection 644 and extends in the first direction X. As shown in FIG. 20, the third connecting portion 645 may have a rod shape extending in the first direction X.

Further, as shown in FIGS. 21 and 22, the buffer spring portion 64 may have a rib 647 for partitioning a through hole 646 penetrating the buffer spring portion 64 in the second direction Y. The probe pin 60 of FIG. 21 is provided with one rib 647 that divides the through hole 646 into two in the third direction Z. The probe pin 60 of FIG. 22 is provided with two ribs 647 that partition the through hole 646 into three in the first direction X.

As shown in FIG. 23, the protrusion 642 of the buffer spring portion 64 can be omitted. Further, as shown in FIG. 24, protrusions 648 for press fitting may be provided on both sides of the protrusion 642 in the third direction Z. The protrusions 648 project from the intermediate portion 63 toward the second contact spring portion 62 in the first direction X and in the direction away from each other in the third direction Z.

As shown in FIG. 25, a protruding portion 649 may be provided at the end of the buffer spring portion 64 on the second contact spring portion 62 side in the first direction X. The protrusion 649 is arranged at one end of the third direction Z on the side surface to which the second contact spring portion 62 of the first direction X of the buffer spring portion 64 is connected. Further, the protruding portion 649 is configured so that the tip thereof can come into contact with the inner surface of the connector housing 10 while being housed in the connector housing 10. A second contact spring portion 62 is connected to the other end of the third direction Z on the side surface of the buffer spring portion 64 provided with the protruding portion 649. Further, in the probe pin 60 of FIG. 25, two elastic pieces 611 and 612 are integrated at the tip 614 farther from the intermediate portion 63 in the first direction X of the first contact spring portion 61.

As shown in FIGS. 26 and 27, in the probe pin 60 of FIG. 25, the contact portion 66 of the first contact spring portion 61 is subjected to a force in the third direction Z by the inspection target 200 connected to the connector 1. In the state, in addition to the third direction Z, the gap 65 is configured to be narrowed by elastically deforming in the direction in which the area in contact with the inspection target 200 is widened. Further, the contact portion 68 of the second contact spring portion 62 is elastic in the direction in which the area in contact with the substrate 40 expands in addition to the third direction Z in a state where the force in the third direction Z is applied by the substrate 40. It is configured to be deformed so that the gap 67 becomes narrower.

Each of the first contact spring portion 61 and the second contact spring portion 62 is not limited to the case where each of the first contact spring portion 61 and the second contact spring portion 62 has a wavy shape or a meandering shape bent at two points in the first direction X, for example, 1 in the first direction X. It may be substantially L-shaped or substantially J-shaped bent at a portion.

(Second Embodiment)
As shown in FIG. 28, the probe pin 60 of the second embodiment of the present disclosure is different from the probe pin 60 of the first embodiment in that it does not include the buffer spring portion 64. In the second embodiment, the same parts as those in the first embodiment are designated by the same reference numbers, the description thereof will be omitted, and the points different from those in the first embodiment will be described.

As shown in FIG. 28, in the probe pin 60 of the second embodiment, the intermediate portion 63 is composed of an intermediate portion main body 163 and an auxiliary intermediate portion 164. The intermediate portion main body 163 has the same shape and configuration as the intermediate portion 63 of the probe pin 60 of FIG. The auxiliary intermediate portion 164 has the same shape and configuration as the buffer spring portion 64 of the probe pin 60 of FIG. 7, except that the through hole 646 is not provided. That is, the auxiliary intermediate portion 164 has a higher rigidity than the buffer spring portion 64, and is configured so as not to be elastically deformed in the second direction Y with respect to the intermediate portion main body 163 as compared with the buffer spring portion 64.

As shown in FIGS. 29 and 30, the probe pin 60 of FIG. 28 also has the contact portion 66 of the first contact spring portion 61 connected to the connector 1 by the inspection target 200, similarly to the probe pin 60 of FIG. In a state where the force in the three directions Z is applied, the gap 65 is configured to be narrowed by elastically deforming in the direction in which the area in contact with the inspection target 200 increases in addition to the third direction Z.

Like the probe pin 60 of the first embodiment, the probe pin 60 of the second embodiment is configured to be dispositionable to the connector 1 in a state where the first contact spring portion 61 can contact the inspection target 200 (FIG. 6). 3). In this way, the probe pin 60 is arranged on the connector 1 in a state where the first contact spring portion 61 can come into contact with the inspection target 200, and a continuity inspection, an operating characteristic inspection, or the like is performed. In such an inspection, the frequency of repeating connection and disconnection to the connector 1 of the inspection target 200 is determined by the inspection device 100 and the substrate 40 that is electrically connected to the inspection device 100 and the second terminal connection portion 50 that can be connected to the inspection device 100. (That is, the inspection device 100 and the substrate 40 are examples of the first connection object, and the inspection target 200 is an example of the second connection object).

By the way, the probe pin for inspection is generally required to have durability because it is frequently repeatedly connected to and disconnected from the object to be connected. If the probe pin is formed of a hard material such as a nickel alloy or a titanium alloy in order to ensure durability, the object to be connected may be damaged. On the contrary, if the probe pin is formed of a material having a low hardness such as beryllium steel or phosphor bronze, the probe pin cannot have sufficient durability, and the sliding wear due to repeated connection and disconnection to the connection object. The contact portion may be deteriorated due to this.

According to the probe pin 60 of the second embodiment, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the contact of the first contact spring portion 61 causes the contact. Damage to the connected object can be reduced more reliably. That is, the life of the connector 1 in which the probe pin 60 is arranged can be extended.

By forming the probe pin 60 from a material having a high hardness such as nickel alloy or titanium alloy and reducing the plate thickness of the first contact spring portion 61, the contact portion 66 in contact with the inspection target 200 becomes more flexible. By displacement, the first contact spring portion 61 can be elastically deformed more smoothly. Further, the strength of the first contact spring portion 61 is obtained by connecting the tips of the elastic pieces 611 and 612 of the first contact spring portion 61 to each other and surrounding the gap 65 with the elastic pieces 611, 612 and the intermediate portion 63. The durability of the first contact spring portion 61 can be further enhanced. Further, since the first contact spring portion 61 is composed of a plurality of elastic pieces 611 and 612, a plurality of electrical paths from the contact portion with the inspection target 200 to the intermediate portion 63 are formed, and electricity of the probe pin 60 is formed. Resistance can be reduced.

In the probe pin 60 shown in FIG. 28, each of the first contact spring portion 61 and the second contact spring portion 62 extends along the first direction X, but is not limited to this case. For example, the second contact spring portion 62 may be arranged so as to extend along the second direction Y. The second contact spring portion 62 may be configured to be elastically deformable in a direction intersecting the extending direction and the second direction Y.

Further, as shown in FIG. 31, in the probe pin 60 of FIG. 28, the second contact spring portion 62 may be composed of a plurality of elastic pieces. In the probe pin 60 of FIG. 31, the second contact spring portion 62 is composed of two elastic pieces 621 and 622.

As shown in FIGS. 32 and 33, the probe pin 60 of FIG. 31 also has the contact portion 66 of the first contact spring portion 61 connected to the connector 1 by the inspection target 200, similarly to the probe pin 60 of FIG. 25. In a state where the force in the three directions Z is applied, the gap 65 is configured to be narrowed by elastically deforming in the direction in which the area in contact with the inspection target 200 increases in addition to the third direction Z. Further, in a state where the contact portion 68 of the second contact spring portion 62 is subjected to the force in the third direction Z by the substrate 40, the contact portion 68 is elastically deformed not only in the third direction but also in the direction in which the area in contact with the substrate 40 increases. Therefore, the gap 67 is configured to be narrowed.

The various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various aspects of the present disclosure will be described. In the following description, a reference reference numeral is also provided as an example.

The probe pin 60 of the first aspect of the present disclosure is
A probe pin 60 that can be arranged in the connector 1 that can be connected to the connection objects 100 and 200.
The first contact spring portion 61 and the second contact spring portion 62,
An intermediate portion 63 and a buffer spring portion 64 arranged in series between the first contact spring portion 61 and the second contact spring portion 62 are provided.
The intermediate portion 63 has both ends of the first direction X, which is the arrangement direction of the first contact spring portion 61, the intermediate portion 63, the buffer spring portion 64, and the second contact spring portion 62 with respect to the intermediate portion 63. The portions are connected to the first contact spring portion 61 and the buffer spring portion 64, respectively.
The buffer spring portion 64 has both ends of the first direction X connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and is elastic in the second direction Y intersecting the first direction X. Deformablely configured,
The first contact spring portion 61 and the second contact spring portion 62 are elastically deformable in a third direction Z intersecting the first direction X and the second direction Y with respect to the intermediate portion 63. There is.

According to the probe pin 60 of the first aspect, even if a stress in a direction intersecting the planned contact direction is applied, the stress can be dispersed by the buffer spring portion 64 to reduce damage to the probe pin 60. .. As a result, a probe pin 60 that is not easily damaged can be realized.

The probe pin 60 of the second aspect of the present disclosure is
A positioning portion 631, which is provided between the first contact spring portion 61 and the second contact spring portion 62 and determines the position of the first direction X with respect to the housing 10 when housed in the housing 10 of the connector 1. 641 is further provided.

According to the probe pin 60 of the second aspect, the positioning portions 631 and 641 can reduce the dropout of the probe pin 60 from the first accommodating portion 22.

The probe pin 60 of the third aspect of the present disclosure is
The positioning unit
A first positioning portion 631 provided on one side of the third direction Z of the intermediate portion 63 and restricting movement of the first direction X to one side,
It has a second positioning portion 641 provided on the other side of the third direction Z of the buffer spring portion 64 and restricting the movement of the first direction X to the other side.

According to the probe pin 60 of the third aspect, it is possible to further reduce the dropout of the probe pin 60 from the first accommodating portion 22.

The probe pin 60 of the fourth aspect of the present disclosure is
At least one of the first contact spring portion 61 and the second contact spring portion 62 is composed of a plurality of elastic pieces 611 and 612 arranged with a gap 65 from each other.

The probe pin 60 of the fifth aspect of the present disclosure is
The first contact spring portion 61 is elastically deformed in a direction in which the area in contact with the connection object 200 is expanded in a state where a force in the third direction Z is applied by the contact of the connected object 200. It is configured to be possible.

The probe pin 60 of the sixth aspect of the present disclosure is
When the first contact spring portion 61 is in a state where a force in the third direction Z is applied by the contact of the connected object 200, between the adjacent elastic pieces of the plurality of elastic pieces 611 and 612. The gap 65 is configured to be narrow.

According to the probe pins 60 of the fourth to sixth aspects, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring portion 61 Damage to the connected object due to contact can be reduced more reliably.

The probe pin 60 of the seventh aspect of the present disclosure is
A probe pin 60 that can be arranged in the connector 1 that can be connected to the connection objects 100 and 200.
A plate-shaped first contact spring portion 61 extending along the first direction X,
The plate-shaped second contact spring portion 62 and
An intermediate portion 63 arranged between the first contact spring portion 61 and the second contact spring portion 62 is provided.
The first contact spring portion 61 has a third direction that intersects the first direction X and the second direction Y, which is the thickness direction of each of the first contact spring portion 61 and the second contact spring portion 62. It is composed of a plurality of elastic pieces 611 and 612 that are elastically deformable to Z and are arranged with a gap 65 between them.
The second contact spring portion 62 is configured to be elastically deformable in a direction Z intersecting the extending direction of the second contact spring portion and the second direction.
Each of the plurality of elastic pieces 611 and 612 has an end portion far from the intermediate portion in the first direction connected to each other.

According to the probe pin 60 of the seventh aspect, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring portion 61 is connected by contact. Damage to the object can be reduced more reliably.

The probe pin 60 of the eighth aspect of the present disclosure is
The connection objects 100 and 200 include a first connection object 100 and a second connection object 200 having a higher frequency of connection and disconnection to the connector 1 than the first connection object 100.
The first contact spring portion 61 is configured to be displaceable in the connector 1 in a state in which the first contact spring portion 61 can come into contact with the second connection object 200.

According to the probe pin 60 of the eighth aspect, the first contact spring portion 61 is configured so as to be able to contact the second connection object 200 which is connected to and disconnected from the connector 1 more frequently. The life of the connector 1 can be extended.

The probe pin 60 of the ninth aspect of the present disclosure is
When the first contact spring portion 61 is in a state where a force in the third direction Z is applied by the contact of the connected object 200, between the adjacent elastic pieces of the plurality of elastic pieces 611 and 612. The gap 65 is configured to be narrow.

The probe pin 60 of the tenth aspect of the present disclosure is
The first contact spring portion 61 is elastically deformed in a direction in which the area in contact with the connection object 200 is expanded in a state where a force in the third direction Z is applied by the contact of the connected object 200. It is configured to be possible.

According to the probe pins 60 of the ninth aspect and the tenth aspect, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring portion 61 Damage to the connected object due to contact with the spring can be reduced more reliably.

The inspection method of the eleventh aspect of the present disclosure is
A probe pin 60 that can be arranged in the connector 1 that can be connected to the connection objects 100 and 200.
A plate-shaped first contact spring portion 61 extending along the first direction X,
The plate-shaped second contact spring portion 62 and
An intermediate portion 63 arranged between the first contact spring portion 61 and the second contact spring portion 62 is provided.
The first contact spring portion 61 has a third direction that intersects the first direction X and the second direction Y, which is the thickness direction of each of the first contact spring portion 61 and the second contact spring portion 62. It is composed of a plurality of elastic pieces 611 and 612 that are elastically deformable to Z and are arranged with a gap 65 between them.
The second contact spring portion 62 is configured to be elastically deformable in a direction intersecting the extending direction of the second contact spring portion 62 and the second direction Y.
Each of the plurality of elastic pieces 611 and 612 is an inspection method using a probe pin 60 in which an end portion far from the intermediate portion 63 in the first direction X is connected to each other.
The connection objects 100 and 200 include a first connection object 100 and a second connection object 200 having a higher frequency of connection and disconnection to the connector 1 than the first connection object 100.
The probe pin 60 is arranged in the connector 1 in a state where the first contact spring portion 61 can contact the second connection object 200.

According to the inspection method of the eleventh aspect, the probe pin is such that the highly durable first contact spring portion 61 comes into contact with the second connection object 200, which is frequently connected and disconnected from the connector 1. 60 is arranged on the connector 1. With such a configuration, the life of the connector 1 can be extended.

By appropriately combining any of the various embodiments or modifications, the effects of each can be achieved. In addition, it is possible to combine embodiments or examples, or between embodiments and examples, and it is also possible to combine features in different embodiments or examples.

Although the present disclosure has been fully described in connection with preferred embodiments with reference to the accompanying drawings, various modifications and modifications are obvious to those skilled in the art. It should be understood that such modifications and amendments are included within the scope of this disclosure by the appended claims.

The probe pins of the present disclosure can be applied to, for example, a connector used for inspecting a USB device or an HDMI device.

1 Connector 10 Connector housing 11 Upper housing 111 Recessed 12 Lower housing 121 Recessed 13 Opening surface 14 Opening 15 Gap 16 Coil spring accommodating 17 Second accommodating 18 Third accommodating 20 First terminal connection 201 First end 202 2nd end 21 Connection housing 211 Support part 212 Recession 213 End part 214, 215 Recession 22 1st housing part 23 Recession 24 Confirmation window 25 Outer shell part 26 Ground terminal 30 Bounce part 31 Coil spring 32 Leaf spring 40 Board 50 2nd terminal connection part 60 Probe pin 61 1st contact spring part 611, 612, 613 Elastic piece 614
62 Second contact spring part 621, 622, 623 Elastic piece 63 Intermediate part 163 Intermediate part Main body 164 Auxiliary intermediate part 631 First positioning part 64 Buffer spring part 641 Second positioning part 642 Protrusion part 643 First connection part 644 Second connection Part 645 Third connection part 646 Through hole 647 Rib 648 Protrusion 649 Protruding part 65, 67 Gap 66, 68 Contact part 71 Left housing 72 Right housing 100 Inspection device 200 Inspection target L1, L2 Center line P Reference position X First direction Y 2nd direction Z 3rd direction D1, D2 Shortest distance W1 Plate thickness W2 Shortest distance

Claims (11)

A probe pin that can be placed on a connector that can be connected to an object to be connected.
The first contact spring part and the second contact spring part,
An intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion are provided.
In the intermediate portion, both ends of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion in the first direction, which are the arrangement directions of the intermediate portion, are in first contact with each other. Connected to the spring part and the buffer spring part,
The buffer spring portion is configured so that both ends of the first direction are connected to the intermediate portion and the second contact spring portion, respectively, and elastically deformable in the second direction intersecting the first direction.
The probe pin is configured such that the first contact spring portion and the second contact spring portion are elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion. The first contact spring portion and the second contact spring portion are further provided with a positioning portion provided between the first contact spring portion and the second contact spring portion to determine a position in the first direction with respect to the housing when the connector is housed in the housing. Probe pin. The positioning unit
A first positioning portion provided on one side of the intermediate portion in the third direction and restricting movement to one side in the first direction, and a first positioning portion.
The probe pin according to claim 2, further comprising a second positioning portion provided on the other side of the buffer spring portion in the third direction and restricting movement of the buffer spring portion to the other side in the first direction. The probe pin according to any one of claims 1 to 3, wherein at least one of the first contact spring portion and the second contact spring portion is composed of a plurality of elastic pieces arranged with a gap from each other. The first contact spring portion is configured to be elastically deformable in a direction in which the area in contact with the connection object is expanded in a state where a force in the third direction is applied by the contact of the connected object to be connected. The probe pin of claim 4. When the first contact spring portion is in a state where a force in the third direction is applied by the contact of the connected object to be connected, the gap between the adjacent elastic pieces among the plurality of elastic pieces is narrowed. The probe pin of claim 4 or 5, which is configured as such. A probe pin that can be placed on a connector that can be connected to an object to be connected.
A plate-shaped first contact spring portion extending along the first direction,
Plate-shaped second contact spring part and
It is provided with an intermediate portion arranged between the first contact spring portion and the second contact spring portion.
The first contact spring portion can be elastically deformed in a third direction intersecting the first direction and the second direction which is the thickness direction of each of the first contact spring portion and the second contact spring portion. At the same time, it is composed of multiple elastic pieces arranged with a gap between them.
The second contact spring portion is configured to be elastically deformable in a direction intersecting the extending direction of the second contact spring portion and the second direction.
Each of the plurality of elastic pieces is a probe pin to which an end far from the intermediate portion in the first direction is connected to each other. The connection target includes a first connection target and a second connection target in which connection and disconnection to and from the connector are repeated more frequently than the first connection target.
The probe pin according to claim 7, wherein the first contact spring portion is configured to be dispositionable to the connector in a state where the first contact spring portion can contact the second connection object. When the first contact spring portion is in a state where a force in the third direction is applied by the contact of the connected object to be connected, the gap between the adjacent elastic pieces among the plurality of elastic pieces is narrowed. 7. The probe pin according to claim 7 or 8. The first contact spring portion is configured to be elastically deformable in a direction in which the area in contact with the connection object is expanded in a state where a force in the third direction is applied by the contact of the connected object to be connected. The probe pin according to any one of claims 7 to 9. A probe pin that can be placed on a connector that can be connected to an object to be connected.
A plate-shaped first contact spring portion extending along the first direction,
Plate-shaped second contact spring part and
It is provided with an intermediate portion arranged between the first contact spring portion and the second contact spring portion.
The first contact spring portion can be elastically deformed in a third direction intersecting the first direction and the second direction which is the thickness direction of each of the first contact spring portion and the second contact spring portion. At the same time, it is composed of multiple elastic pieces arranged with a gap between them.
The second contact spring portion is configured to be elastically deformable in a direction intersecting the extending direction of the second contact spring portion and the second direction.
Each of the plurality of elastic pieces is an inspection method using a probe pin in which an end portion far from the intermediate portion in the first direction is connected to each other.
The connection target includes a first connection target and a second connection target in which connection and disconnection to and from the connector are repeated more frequently than the first connection target.
An inspection method in which the probe pin is arranged on the connector with the first contact spring portion in contact with the second connection object.

Images