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JPS62125711A - Semiconductor device - Google Patents

Semiconductor device

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Publication number
JPS62125711A
JPS62125711A JP60266408A JP26640885A JPS62125711A JP S62125711 A JPS62125711 A JP S62125711A JP 60266408 A JP60266408 A JP 60266408A JP 26640885 A JP26640885 A JP 26640885A JP S62125711 A JPS62125711 A JP S62125711A
Authority
JP
Japan
Prior art keywords
terminal
misfet
electrode
signal
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60266408A
Other languages
Japanese (ja)
Other versions
JPH0622320B2 (en
Inventor
Hiroyuki Obata
弘之 小畑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60266408A priority Critical patent/JPH0622320B2/en
Publication of JPS62125711A publication Critical patent/JPS62125711A/en
Publication of JPH0622320B2 publication Critical patent/JPH0622320B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To form a peripheral circuit with a small occupied area by supplying a load current via a conduction channel type MISFET operated at a high current amplification factor without any back gate bias supplied. CONSTITUTION:In outputting the 1st power voltage VPP fed to the input terminal 1 from an output terminal 3, a low voltage is fed to a MISFET Q3 from the 3rd signal terminal 6, the MISFET Q3 is conducted and the input terminal 1 and the output terminal 3 are conducted electrically. A high voltage boosted by a charge pump or the like from the 1st signal terminal 4 is fed to a MISFET Q1, which is conducted. A low voltage is fed to a MISFET Q3 from the 2nd signal terminal 5, the FET Q2 is conducted and a base electrode of the FET Q3 goes to a potential equal to the 1st power voltage VPP. Since the MISFET Q3 is of P-channel type, no back gate bias is fed and the FET Q3 is operated at a high current amplification factor, then the occupied area of the MISFET Q3 is very small.

Description

【発明の詳細な説明】 r産業上の利用分野] 本発明は半導体装置に関し、特に相補型MISF E、
 T″′C″′C″構成力及び電源の兼用端子周辺の半
導体装置に関する。
[Detailed Description of the Invention] r Industrial Application Field] The present invention relates to a semiconductor device, and particularly to a complementary MISF E,
T'''C'''C'' This relates to a semiconductor device around a terminal that is also used as a power source and a power source.

〔従来の技術〕[Conventional technology]

従来、入力及び電源の兼用端子周辺の半導体装置は、第
3図に示すように、入力信号か、又は入力信号よりも高
電位の第1の電源電圧Vppが印加される入力端子]と
、入力信号を受信するための入力回路2と、第1の電源
電圧Vppを出力する出力端子3と、ドレイン電極が入
力端子1に接′f1されゲート電極が第1の信号端子4
に接続されソース電極が出力端子3に接続され基板電極
が接地端子に接続されるNチャネル・エンハンストメン
ト〜型のM T 5FETQ、とを含んで構成される。
Conventionally, as shown in FIG. 3, a semiconductor device around a dual-purpose input and power supply terminal has an input terminal to which an input signal or a first power supply voltage Vpp having a higher potential than the input signal is applied; An input circuit 2 for receiving a signal, an output terminal 3 for outputting a first power supply voltage Vpp, a drain electrode connected to the input terminal 1'f1, and a gate electrode connected to the first signal terminal 4.
, an N-channel enhancement type M T 5FETQ whose source electrode is connected to the output terminal 3 and whose substrate electrode is connected to the ground terminal.

第3図において、入力端子1に入力信号が印加された場
合は、入力回路2で入力信号を受信すると共に信号端子
4から低電位がM I S F E T Q 1に供給
されてMISFETQ+が非導通状態となり、入力端″
F1と出力端子3とが電気的に遮断され、一方、入力端
子1に第1の電、Ig、電圧Vppが印加された場合に
は、信号端子4からチャージポンプ等で昇圧された高電
圧がM L S F E T Q 1に印加されてM 
I S F E T Q 1が導通状態となり、入力端
子1と出力端子3とが電気的に接続され、出力端子3か
ら第1の電源電圧Vppが出力される。
In FIG. 3, when an input signal is applied to input terminal 1, input circuit 2 receives the input signal, and a low potential is supplied from signal terminal 4 to MISFETQ1, making MISFETQ+ non-active. It becomes conductive and the input terminal
When F1 and the output terminal 3 are electrically cut off, and on the other hand, the first voltage, Ig, and the voltage Vpp are applied to the input terminal 1, a high voltage boosted by a charge pump or the like is output from the signal terminal 4. M L S F E T Q 1 is applied to M
I S F E T Q 1 becomes conductive, the input terminal 1 and the output terminal 3 are electrically connected, and the first power supply voltage Vpp is output from the output terminal 3.

し発明が解決しようとする問題点〕 上述した従来の半導体装置は、バックゲートバイアスが
印加されたMISFETを介して出力端子に接続された
負荷に電流を供給し、しからこのMISFETでの電圧
降下をできるだけ小さくするために、M I S F 
E Tのチャネル幅分非常に大きく設定する必要があり
、占有面積が大きくなるという問題点があり、更に、M
 I S F E Tのゲート電位を昇圧するためのチ
ャージポンプも非常に大きな占有面積を占めるという問
題点がある。
[Problems to be Solved by the Invention] The conventional semiconductor device described above supplies current to the load connected to the output terminal via the MISFET to which a back gate bias is applied, and then the voltage drop across the MISFET is In order to make M I S F as small as possible,
It is necessary to set the channel width of ET to be very large, which causes the problem of increasing the occupied area.
The charge pump for boosting the gate potential of the ISFET also has a problem in that it occupies a very large area.

本発明の目的は、入力及び電源兼用端子の周辺回路を小
さな占有面積で形成できる半導体装置を提供することに
ある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor device in which a peripheral circuit including an input terminal and a power supply terminal can be formed in a small area.

〔問題点を解決するための手段」 本革1の発明の半導体装置は、入力信号又は該入力信号
とは異なる電位の第1の電源電圧のいずれか一方が印加
される入力端子と、前記入力信号を受信する入力回路と
、前記第1の電源電圧を出力する出力端子と、ドレイン
電極が前記入力端子に接続されデーl−電極が第1の信
号端子に接続され基板電極が接地端子に接続される一導
電型のチャネルを有するエンハンストメント型の第1の
MISFETと、ドレイン電極が第2の電源電圧供給端
子に接続されグー1〜電極が第2の信号端子に接続され
ソース電極が前記第1のM I S F E T”のソ
ース電極に接続され基板電極が接地端子に接続される前
記第1のM[5FETと同一導電型のチャネルを有する
デプレション型の第2のM I S FE Tと、ドレ
イン電極が前記出力端子に接続されゲー1へ電極が前記
第2の電源電圧供給端子か前記第2の信号端子か若くは
第3の信号端子のいずれか1つに接続されソース電極が
前記入力端子に接続され基板電極が前記第1のMISF
ETのソース電極に接続される前記第1のMISFET
と逆導電型のチャネルを有する少くとも1個のエンハン
ストメントへ型の第3のMISFETとを含んで構成さ
れる。
[Means for Solving the Problems] The semiconductor device of the invention of Genuine Leather 1 has an input terminal to which either an input signal or a first power supply voltage having a potential different from that of the input signal is applied; an input circuit for receiving a signal, an output terminal for outputting the first power supply voltage, a drain electrode connected to the input terminal, a drain electrode connected to the first signal terminal, and a substrate electrode connected to a ground terminal. an enhancement type first MISFET having a channel of one conductivity type, the drain electrode is connected to the second power supply voltage supply terminal, the goo electrode is connected to the second signal terminal, and the source electrode is connected to the second signal terminal; a depletion type second M I S FE having a channel of the same conductivity type as the first M FET, which is connected to the source electrode of the M T, a drain electrode connected to the output terminal, a gate electrode connected to either the second power supply voltage supply terminal, the second signal terminal, or at least the third signal terminal, and a source electrode; is connected to the input terminal and the substrate electrode is connected to the first MISF.
the first MISFET connected to the source electrode of the ET;
and at least one enhancement type third MISFET having a channel of opposite conductivity type.

本革2の発明の半導体装置は、入力信号又は該入力信号
とは異なる電位の第1の電源電圧のいずれか一方が印加
される入力端子と、前記入力信号を受信する入力回路と
、前記第1の電源電圧を出力する出力端子と、ドレ、イ
ン電極が前記入力端子に接続されゲート電極が第1の信
号端子に接続され基板電極が接地端子に接続される一導
電型のナヤイ・ルを有するエンハンストメント型の第1
のMISFETと、ドレイン電極が第2の電源電圧供給
端子に接続されゲート電極が第2の信号端子に接続され
ソース電極が前記第1のMISFETのソース電極に接
続され基板電極が接地端子に接続される前記第1のM 
I S F E ’T’と同一導電型のチャネルを有す
るデプレション型の第2のMISFETと、ドレイン電
極が前記出力端子に接続されゲート電極が前記第2の電
源電圧供給端子か前記第2の信号端子か若くは第3の信
号端子のいずれか1つに接続されソース電極が前記入力
端子に接続され基板電極が前記第1のMISFETのソ
ース電極に接続される前記第1のMISFETと逆導電
型のチャネルを有する少くとも1個のエンハンス1〜メ
ント型の第3のMISFETと、ドレイン電極が前記第
2の電源電圧供給端子に接続されゲート電極が前記第2
の信号端子に接続されソース電極が前記出力端子に接続
され基板電極が接地端子に接続される前記第1のMIS
FETと同一導電型のチャネルを有するデプレション型
の第4のMISFETとを含んで構成される。
The semiconductor device according to the invention of Genuine Leather 2 includes an input terminal to which either an input signal or a first power supply voltage having a potential different from that of the input signal is applied, an input circuit that receives the input signal, and the first power supply voltage. an output terminal for outputting a power supply voltage of 1, a drain electrode, an in electrode connected to the input terminal, a gate electrode connected to the first signal terminal, and a substrate electrode connected to the ground terminal. The first enhancement type with
MISFET, a drain electrode is connected to a second power supply voltage supply terminal, a gate electrode is connected to a second signal terminal, a source electrode is connected to the source electrode of the first MISFET, and a substrate electrode is connected to a ground terminal. said first M
A depletion type second MISFET having a channel of the same conductivity type as I S F E 'T', a drain electrode connected to the output terminal and a gate electrode connected to the second power supply voltage supply terminal or the second MISFET; conductivity opposite to the first MISFET, which is connected to either one of the signal terminal or at least a third signal terminal, whose source electrode is connected to the input terminal, and whose substrate electrode is connected to the source electrode of the first MISFET. at least one enhancement type third MISFET having a type channel, a drain electrode connected to the second power supply voltage supply terminal and a gate electrode connected to the second enhancement type MISFET;
The first MIS is connected to a signal terminal of the first MIS, a source electrode is connected to the output terminal, and a substrate electrode is connected to the ground terminal.
It is configured to include a depletion type fourth MISFET having a channel of the same conductivity type as the FET.

〔実施例〕〔Example〕

次に、本発明の実11!、例について図面を参照して説
明する。
Next, fruit 11 of the present invention! , an example will be explained with reference to the drawings.

第1図は本革1の発明の一実施例を示す回路図である。FIG. 1 is a circuit diagram showing an embodiment of the invention of genuine leather 1.

第1図に示すように、半導体装置は入力信号又は入力信
号よりも高電位の第1の電源電圧Vppのいずれか一方
が印加される入力端子1と、入力信号を受信するための
入力回路2と、第1の電源電圧■pPを出力する出力端
子3と、ドレイン電極が入力端子1に接続されゲート電
極が第1の信号端子4に接続され基板電極が接地端子に
接続されるNチャネル・エンハンス1〜メント型の第1
のMIS F E T Q 1と、ドレイン電極が第2
の電源電圧十V CCの供給端子に接続されゲート電極
が第2の信号端子5に接続されソース電極がMISFE
TQ 、のソース電極に接続され基板電極が接地端子に
接続されるNチャネル・デプレション型の第2のMIS
FE”rQ2と、ドレイン電極が出力端子3に接続され
ゲート電極が第3の信号端子6に接続されソース電極が
入力端子1に接続され基板電極がMISFETQlのソ
ース電極に接続されるPチャネル・エンハンストメント
型の第3のMIS F E T Q 3とを含んで構成
される。
As shown in FIG. 1, the semiconductor device includes an input terminal 1 to which either an input signal or a first power supply voltage Vpp having a higher potential than the input signal is applied, and an input circuit 2 for receiving the input signal. , an output terminal 3 that outputs a first power supply voltage pP, an N-channel transistor whose drain electrode is connected to the input terminal 1, whose gate electrode is connected to the first signal terminal 4, and whose substrate electrode is connected to the ground terminal. Enhancement 1 - Mento type 1
MIS FET Q1 and the drain electrode is the second
The power supply voltage is 10V, the gate electrode is connected to the second signal terminal 5, and the source electrode is MISFE.
A second N-channel depletion type MIS connected to the source electrode of TQ and whose substrate electrode is connected to the ground terminal.
FE"rQ2 and a P-channel enhanced transistor whose drain electrode is connected to the output terminal 3, whose gate electrode is connected to the third signal terminal 6, whose source electrode is connected to the input terminal 1, and whose substrate electrode is connected to the source electrode of MISFETQl. and a third MIS FET Q 3 of the men-type type.

第1図において、入力端子1に入力信号が印加されてい
る場合、入力回Fl@ 2で入力信号を受信すると共に
、第3の信号端子6から高電位がMISF E T Q
 3に印加され、MISFETQ3が非導通状態になり
入力端子1と出力端子3とが電気的に遮断される。又、
第1の信号端子4がら低電位がM I S F E T
 Q rに印加され、MISFETQ、が非導通状態に
なると共に、第2の信号端子5からM E S F E
 T Q 2に高電位が印加されて、M I S F 
E T Q 2が導通状態となりM I S F E 
TQ3の基板電極が第2の電源電圧+VCCと等しい電
位となり、接地電位と第2の電源電圧十Vccの間で変
化する入力信号が入力端子1に印加されてもMISFE
TQ3のソース電極(P+拡散N)が順方向バイアスさ
れることはない。
In FIG. 1, when an input signal is applied to the input terminal 1, the input signal is received at the input circuit Fl@2, and a high potential is applied from the third signal terminal 6 to MISFETQ.
3, the MISFET Q3 becomes non-conductive, and the input terminal 1 and the output terminal 3 are electrically cut off. or,
The low potential from the first signal terminal 4 is M I S F E T
is applied to Qr, the MISFET Q becomes non-conductive, and the signal from the second signal terminal 5 to M E S F E
A high potential is applied to TQ2, and M I S F
E T Q 2 becomes conductive and M I S F E
Even if the substrate electrode of TQ3 has a potential equal to the second power supply voltage +VCC and an input signal varying between the ground potential and the second power supply voltage +Vcc is applied to the input terminal 1, the MISFE
The source electrode (P+diffusion N) of TQ3 is never forward biased.

次に、出力端子3がら入力端子1に印加された第1の電
Jg、電圧Vppを出力する場合は、第3の信号端子6
から低電位がMISFETQ3に印加され、MISFE
TQ3が導通状態となり入力端子1と出力端子3とが電
気的に接続されると共に、第1の信号端子4からチャー
ジボンア等で昇圧された高電圧がM I S F E 
T Q lに印加されてMIS F E T Q lが
導通状態となり、第2の信号端子5から低電位がM I
 S F ETQ2に印加され、MISFETQ2が非
導通状態となりMISFETQ3の基板電極が第1の電
源電圧Vppと等しい電位になる。
Next, when outputting the first voltage Jg and voltage Vpp applied to the input terminal 1 from the output terminal 3, the third signal terminal 6
A low potential is applied to MISFETQ3 from
TQ3 becomes conductive, the input terminal 1 and the output terminal 3 are electrically connected, and a high voltage boosted by a charge bomber or the like is transferred from the first signal terminal 4 to M I S F E
MISFETQl is applied to TQl, and MISFETQl becomes conductive, and a low potential is applied from the second signal terminal 5 to MISFETQl.
The voltage is applied to SFETQ2, causing MISFETQ2 to become non-conductive and the substrate electrode of MISFETQ3 to have a potential equal to the first power supply voltage Vpp.

ここで、M T S F E T Q 3はPチャネル
型であるためバ・・ツクゲートバイアスら印加されず高
い電流増幅率で動作するためM I S F E TQ
3の占める占有面積は非常に小さくなる。
Here, since M T S F E T Q 3 is a P-channel type, no gate bias is applied and it operates at a high current amplification factor.
3 occupies a very small area.

更に、バ・ツクゲートバイアスが印加されるtlS l
’ E TQ +を介して負荷電流を供給する必要がな
いためM T S F E T Q 、の占める占有面
積も非常に小さくすることができると共に、MISFE
′「Q、のゲート電位を昇圧するためのチャーシボシア
ら小さな占有面積で形成できる。
Furthermore, tlS l to which back gate bias is applied
' Since there is no need to supply load current through ETQ +, the area occupied by MTSFETQ can be made very small, and the
``A capacitor for boosting the gate potential of Q can be formed with a small occupied area.

第2図は本節2の発明の一実施例を示す回路図である。FIG. 2 is a circuit diagram showing an embodiment of the invention of Section 2.

第2図に示す実施例は、上述した第1の発明の半導体装
置にドレイン電極が第2の電源電圧+Vccの供給端子
に接続されデーl−電極が第2の信号端子5に接続され
ソース電極が出力端子3に接続され基板′、′を極が接
地端子に接続されるNチャネルデプレション型の第4の
M T S F E T Q 4を追加を追加接続した
回路である。
In the embodiment shown in FIG. 2, in the semiconductor device of the first invention described above, the drain electrode is connected to the supply terminal of the second power supply voltage +Vcc, the D- electrode is connected to the second signal terminal 5, and the source electrode is connected to the second signal terminal 5. is connected to the output terminal 3, and a fourth N-channel depletion type MTS FET Q 4 whose poles are connected to the ground terminal on the substrates ',' is additionally connected.

第2図に示すように、MISFETQ4を追加すること
により、入力端子1に入力信号が印加されている期間、
第2の信号端子5から高電位がMISFETQ4に印加
されMISFETQ、、が導通状態となるため、入力端
子1と出力端子3とを電気的に遮断すると共に出力端子
3から第2の電源電圧+VCCを出力することができる
As shown in FIG. 2, by adding MISFET Q4, the period when the input signal is applied to input terminal 1,
A high potential is applied from the second signal terminal 5 to the MISFET Q4, and the MISFETQ becomes conductive, so that the input terminal 1 and the output terminal 3 are electrically cut off, and the second power supply voltage +VCC is applied from the output terminal 3. It can be output.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明の半導体装置は、入力及び電
源兼用端子の周辺回路において、負荷電流をバックゲー
トバイアスが印加されず高い電流増幅率で動作する導電
チャネル型のMISF、ETを介して供給することによ
り、周辺回路を小さな占有面積で形成できるという効果
がある。
As explained above, in the semiconductor device of the present invention, in the peripheral circuit of the input and power supply terminal, the load current is supplied through the conductive channel type MISF and ET that operate at a high current amplification factor without applying a back gate bias. This has the effect that the peripheral circuit can be formed with a small occupied area.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本節1の発明の一実施例の回路図、第2図は本
節2の発明の一実施例の回路図、第3図は従来の半導体
装置の一例の回路図である。 1・・・入力端子、2・・・入力回路、3・・・出力端
子、4.5.6・・・信号端子。 髪l 図 早2 凹
FIG. 1 is a circuit diagram of an embodiment of the invention of Section 1, FIG. 2 is a circuit diagram of an embodiment of the invention of Section 2, and FIG. 3 is a circuit diagram of an example of a conventional semiconductor device. 1... Input terminal, 2... Input circuit, 3... Output terminal, 4.5.6... Signal terminal. Hair l diagram early 2 concave

Claims (2)

【特許請求の範囲】[Claims] (1)入力信号又は該入力信号とは異なる電位の第1の
電源電圧のいずれか一方が印加される入力端子と、前記
入力信号を受信する入力回路と、前記第1の電源電圧を
出力する出力端子と、ドレイン電極が前記入力端子に接
続されゲート電極が第1の信号端子に接続され基板電極
が接地端子に接続される一導電型のチャネルを有するエ
ンハンストメント型の第1のMISFETと、ドレイン
電極が第2の電源電圧供給端子に接続されゲート電極が
第2の信号端子に接続されソース電極が前記第1のMI
SFETのソース電極に接続され基板電極が接地端子に
接続される前記第1のMISFETと同一導電型のチャ
ネルを有するデプレション型の第2のMISFETと、
ドレイン電極が前記出力端子に接続されゲート電極が前
記第2の電源電圧供給端子か前記第2の信号端子か若く
は第3の信号端子のいずれか1つに接続されソース電極
が前記入力端子に接続され基板電極が前記第1のMIS
FETのソース電極に接続される前記第1のMISFE
Tと逆導電型のチャネルを有する少くとも1個のエンハ
ンストメント型の第3のMISFETとを含むことを特
徴とする半導体装置。
(1) An input terminal to which either an input signal or a first power supply voltage having a potential different from that of the input signal is applied, an input circuit that receives the input signal, and outputs the first power supply voltage. an enhancement type first MISFET having an output terminal and a channel of one conductivity type, the drain electrode being connected to the input terminal, the gate electrode being connected to the first signal terminal, and the substrate electrode being connected to the ground terminal; A drain electrode is connected to the second power supply voltage supply terminal, a gate electrode is connected to the second signal terminal, and a source electrode is connected to the first MI
a depletion-type second MISFET having a channel of the same conductivity type as the first MISFET, which is connected to the source electrode of the SFET and whose substrate electrode is connected to a ground terminal;
A drain electrode is connected to the output terminal, a gate electrode is connected to one of the second power supply voltage supply terminal, the second signal terminal, or at least the third signal terminal, and the source electrode is connected to the input terminal. The connected substrate electrode is connected to the first MIS.
the first MISFE connected to the source electrode of the FET;
A semiconductor device comprising at least one enhancement type third MISFET having a channel of a conductivity type opposite to T.
(2)入力信号又は該入力信号とは異なる電位の第1の
電源電圧のいずれか一方が印加される入力端子と、前記
入力信号を受信する入力回路と、前記第1の電源電圧を
出力する出力端子と、ドレイン電極が前記入力端子に接
続されゲート電極が第1の信号端子に接続され基板電極
が接地端子に接続される一導電型のチャネルを有するエ
ンハンストメント型の第1のMISFETと、ドレイン
電極が第2の電源電圧供給端子に接続されゲート電極が
第2の信号端子に接続されソース電極が前記第1のMI
SFETのソース電極に接続され基板電極が接地端子に
接続される前記第1のMISFETと同一導電型のチャ
ネルを有するデプレション型の第2のMISFETと、
ドレイン電極が前記出力端子に接続されゲート電極が前
記第2の電源電圧供給端子か前記第2の信号端子か若く
は第3の信号端子のいずれか1つに接続されソース電極
が前記入力端子に接続され基板電極が前記第1のMIS
FETのソース電極に接続される前記第1のMISFE
Tと逆導電型のチャネルを有する少くとも1個のエンハ
ンストメント型の第3のMISFETと、ドレイン電極
が前記第2の電源電圧供給端子に接続されゲート電極が
前記第2の信号端子に接続されソース電極が前記出力端
子に接続され基板電極が接地端子に接続される前記第1
のMISFETと同一導電型のチャネルを有するデプレ
ション型の第4のMISFETとを含むことを特徴とす
る半導体装置。
(2) an input terminal to which either an input signal or a first power supply voltage having a potential different from that of the input signal is applied; an input circuit that receives the input signal; and an input circuit that outputs the first power supply voltage. an enhancement type first MISFET having an output terminal and a channel of one conductivity type, the drain electrode being connected to the input terminal, the gate electrode being connected to the first signal terminal, and the substrate electrode being connected to the ground terminal; A drain electrode is connected to the second power supply voltage supply terminal, a gate electrode is connected to the second signal terminal, and a source electrode is connected to the first MI
a depletion-type second MISFET having a channel of the same conductivity type as the first MISFET, which is connected to the source electrode of the SFET and whose substrate electrode is connected to a ground terminal;
A drain electrode is connected to the output terminal, a gate electrode is connected to one of the second power supply voltage supply terminal, the second signal terminal, or at least the third signal terminal, and the source electrode is connected to the input terminal. The connected substrate electrode is connected to the first MIS.
the first MISFE connected to the source electrode of the FET;
at least one enhancement type third MISFET having a channel of a conductivity type opposite to T, a drain electrode connected to the second power supply voltage supply terminal, and a gate electrode connected to the second signal terminal; The first electrode has a source electrode connected to the output terminal and a substrate electrode connected to the ground terminal.
A semiconductor device comprising a depletion type fourth MISFET having a channel of the same conductivity type as the MISFET.
JP60266408A 1985-11-26 1985-11-26 Semiconductor device Expired - Lifetime JPH0622320B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60266408A JPH0622320B2 (en) 1985-11-26 1985-11-26 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60266408A JPH0622320B2 (en) 1985-11-26 1985-11-26 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS62125711A true JPS62125711A (en) 1987-06-08
JPH0622320B2 JPH0622320B2 (en) 1994-03-23

Family

ID=17430516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60266408A Expired - Lifetime JPH0622320B2 (en) 1985-11-26 1985-11-26 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH0622320B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5508654A (en) * 1993-09-16 1996-04-16 Nec Corporation Transistor circuits with a terminal for receiving high voltages and signals
CN102460281A (en) * 2009-06-03 2012-05-16 夏普株式会社 Display device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5508654A (en) * 1993-09-16 1996-04-16 Nec Corporation Transistor circuits with a terminal for receiving high voltages and signals
CN102460281A (en) * 2009-06-03 2012-05-16 夏普株式会社 Display device
CN102460281B (en) * 2009-06-03 2014-08-27 夏普株式会社 Display device

Also Published As

Publication number Publication date
JPH0622320B2 (en) 1994-03-23

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