Nothing Special   »   [go: up one dir, main page]

JPS61209339A - Optical measuring apparatus - Google Patents

Optical measuring apparatus

Info

Publication number
JPS61209339A
JPS61209339A JP4995085A JP4995085A JPS61209339A JP S61209339 A JPS61209339 A JP S61209339A JP 4995085 A JP4995085 A JP 4995085A JP 4995085 A JP4995085 A JP 4995085A JP S61209339 A JPS61209339 A JP S61209339A
Authority
JP
Japan
Prior art keywords
light
signal
measured
filter
wavelengths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4995085A
Other languages
Japanese (ja)
Other versions
JPH0531732B2 (en
Inventor
Isao Hishikari
功 菱刈
Takao Shimizu
孝雄 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP4995085A priority Critical patent/JPS61209339A/en
Publication of JPS61209339A publication Critical patent/JPS61209339A/en
Publication of JPH0531732B2 publication Critical patent/JPH0531732B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To enable optical measurement with high accuracy, by simple constitution such that the operation of a ratio is performed by using a signal containing comparing wavelengths obtained by using a filter for passing two comparing wavelengths together. CONSTITUTION:The titled apparatus is equipped with a filter 51 for passing a measuring wavelength lambda2 and a filter 52 for together passing two comparing wavelengths lambda1, lambda3 of both sides of the measuring wavelength lambda2 and provided with a rotary sector 5 rotated by a motor M. The light of a light source 1 is projected to an object 3 to be measured by a projection lens 2 and the transmitted light or reflected light of said projected light is incident to a detection element 6 through a condensing lens 4 and the rotary sector 5 to be amplified by an amplifier 7 and a first signal e1 corresponding to the component of the measuring wavelength lambda2 and a second signal e2 containing both components of the comparing wavelengths lambda1, lambda3 being the outputs of said amplifier 7 enter sample hold circuits 82, 81 and, subsequently, the operation of a ratio is performed by a divider circuit 10 and the properties of the object 1 to be measured are measured to output a measuring signal eo.

Description

【発明の詳細な説明】 [産業上の利用分野1 この発明は、被測定対象の性状を光学的に測定する装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention relates to an apparatus for optically measuring the properties of an object to be measured.

[従来の技術] 従来、光を利用して、被測定対象の厚み、水分、色あい
等を測定する装置が知られている。たとえば、水分を吸
収する波長帯の光と、水分を吸収しない波長帯の光との
比率から、水分率等の被測定対象の性状を測定している
[Prior Art] Conventionally, devices are known that use light to measure the thickness, moisture content, color tone, etc. of an object to be measured. For example, the properties of the object to be measured, such as moisture content, are measured from the ratio of light in a wavelength band that absorbs moisture to light in a wavelength band that does not absorb moisture.

[この発明が解決しようとする問題点]しかしながら、
被測定対象に着色物やその他の物が混入すると、第2図
で示すように、分光特性に傾きを生じる場合がある。こ
のため、測定波長の両側に2つの比較波長帯を設け、こ
の比較波長帯の2つの成分の平均を用いて比率をとる方
法が考えられる。
[Problems to be solved by this invention] However,
If colored substances or other substances are mixed into the object to be measured, the spectral characteristics may be tilted as shown in FIG. For this reason, a method can be considered in which two comparison wavelength bands are provided on both sides of the measurement wavelength and the ratio is calculated using the average of the two components of the comparison wavelength bands.

ところが、このように、測定波長、比較波長を増加させ
て行くと、必要波長の数に応じたフィルタ、検出素子を
必要とし、また、演算要素も多くなり、複雑、高価なも
のとなる問題点があった。
However, as the number of measurement wavelengths and comparison wavelengths increases, filters and detection elements corresponding to the number of required wavelengths are required, and the number of calculation elements increases, resulting in a problem that becomes complicated and expensive. was there.

この発明の目的は、以上の点に鑑み、比較波長の2つの
成分を同時に得るようにし、測定系の簡素化、高精度化
を図った光学的測定装置を提供することである。
In view of the above points, it is an object of the present invention to provide an optical measuring device that simultaneously obtains two components of a comparison wavelength, and has a simplified measurement system and improved accuracy.

し問題点を解決するための手段] この発明は、被測定対象からの透過光または反射光のう
ち測定波長帯の成分の第1の信号と、被測定対象からの
透過光または反射光のうち測定波長帯の両側の2つの比
較波長帯の2つの成分を含む第2の信号との比率から被
測定対象の性状を測定するようにした光学的測定装置で
ある。
[Means for Solving Problems] This invention provides a first signal of a component in the measurement wavelength band of the transmitted light or reflected light from the object to be measured, and a first signal of the component of the transmitted light or reflected light from the object to be measured. This is an optical measuring device that measures the properties of an object to be measured from the ratio of a measurement wavelength band to a second signal containing two components in two comparison wavelength bands on both sides.

[実施例] 第1図は、この発明の一実施例を示す構成説明図である
[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention.

図において、1は、投光用の光源で、この光源1の光は
、投光レンズ2で被測定対象3に投光され、その透過光
または反射光は集光レンズ4で集光され、モータMによ
り回転する回転セクタ5に設けられた第2図の測定波長
λ2を通過させるフィルタ51、測定波長λ2の両側の
2つの比較波長λ1、λ3をともに通過させるフィルタ
52を介して検出素子6に入射する。この検出素子6の
検出信号は増幅器7により増幅され、測定波長帯の測定
波長λ2の成分に対応した第1の信号e1、および比較
波長帯の比較波長λ1、λ3の両方の成分を含む第2の
信号e2が、回転セクタ5に設けられた同期信号発生器
9の同期信号により、第1、第2のサンプルホールド回
路81.82にホールドされる。イして、割鋒回路10
により第1、第2のサンプルホールド回路81.82の
第1、第2の信号el、e2の比率e1/e 2をとり
、被測定対象3の水分率その他の性状の測定信@eOを
取り出すことができる。これら、サンプルホールド回路
81,82、側御回路1oの機能をメモリを含むマイク
ロコンピュータ、パーソナルコンピュータ等の演棹手段
により実現してもよい。
In the figure, 1 is a light source for projecting light, the light from this light source 1 is projected onto the object to be measured 3 by a projecting lens 2, and its transmitted light or reflected light is collected by a condensing lens 4. The detection element 6 is passed through a filter 51 provided on the rotating sector 5 rotated by the motor M, which allows the measurement wavelength λ2 shown in FIG. incident on . The detection signal of this detection element 6 is amplified by an amplifier 7, and a first signal e1 corresponding to the component of the measurement wavelength λ2 in the measurement wavelength band and a second signal e1 containing components of both comparison wavelengths λ1 and λ3 of the comparison wavelength band are generated. The signal e2 is held in the first and second sample and hold circuits 81 and 82 by a synchronizing signal from a synchronizing signal generator 9 provided in the rotating sector 5. Then, Waribeng circuit 10
Take the ratio e1/e2 of the first and second signals el and e2 of the first and second sample-and-hold circuits 81 and 82, and take out the measurement signal @eO of the moisture content and other properties of the object to be measured 3. be able to. The functions of these sample and hold circuits 81 and 82 and the side control circuit 1o may be realized by a calculation means such as a microcomputer or a personal computer including a memory.

つまり、回転セクタ5の分光手段としてフィルタ51は
、第3図へで示すような波長λ2の単一のピークの透過
率特性をもち、フィルタ52は、第3図Bで示すように
、波長λ1、λ3のダブルビークの透過率特性をもつ。
That is, the filter 51 as a spectroscopic means for the rotating sector 5 has a transmittance characteristic of a single peak at the wavelength λ2 as shown in FIG. , has a double-beak transmittance characteristic of λ3.

このフィルタ52を用いることにより、第2図の測定波
長22の両側の比較波長λ1、λ3の成分の和に相当す
るものが得られ、結局、傾きに起因する比較波長λ1成
分の増加分と比較波長λ3の減少分とは相殺され、常に
正しい測定が可能となる。
By using this filter 52, a value corresponding to the sum of the components of comparison wavelengths λ1 and λ3 on both sides of the measurement wavelength 22 in FIG. This cancels out the decrease in the wavelength λ3, making it possible to always perform accurate measurements.

第4図は、他の実施例を示す構成説明図で、光源1の光
は、光ファイバー11により被測定対象3に投光され、
その宇射光は再び光ファイバー11により伝送され、ハ
ーフミラ−12により分離され、ハーフミラ−12を反
射した光は、測定波長λ2を透過させるフィルタ51を
介して検出素子61に入射し、ハーフミラ−12を透過
した光は比較波長λ1、λ3の両方を透過させるフィル
タ52を介して検出素子62に入射し、検出素子61.
62の出力e1、e2は測定手段13で比率がとられ、
測定信号eoを取り出すことができる。
FIG. 4 is a configuration explanatory diagram showing another embodiment, in which the light from the light source 1 is projected onto the object to be measured 3 through the optical fiber 11,
The emitted light is again transmitted by the optical fiber 11 and separated by the half mirror 12. The light reflected by the half mirror 12 enters the detection element 61 via the filter 51 that transmits the measurement wavelength λ2, and is transmitted through the half mirror 12. The light enters the detection element 62 via the filter 52 that transmits both comparison wavelengths λ1 and λ3, and is transmitted to the detection element 61 .
The outputs e1 and e2 of 62 are ratioed by the measuring means 13,
A measurement signal eo can be extracted.

第5図は、他の実施例を示し、被測定対象3からの光は
、分光手段としての分光ミラー14により分離され、分
光ミラー14は波長λ1、λ3の両方の光を透過させて
検出素子62に入射させ、分光ミラー14を反射した光
は、波長λ1、λ3を除いた光なので、波長λ2の光を
透過するフィルタ51を介して検出素子61に入射する
。これら検出素子61.62の出力e1、e2の比を測
定手段13でとり、測定出力eOが取り出せる。
FIG. 5 shows another embodiment, in which the light from the object to be measured 3 is separated by a spectroscopic mirror 14 as a spectroscopic means, and the spectroscopic mirror 14 transmits light of both wavelengths λ1 and λ3 to the detection element. Since the light incident on the spectroscopic mirror 62 and reflected by the spectroscopic mirror 14 excludes wavelengths λ1 and λ3, it enters the detection element 61 via the filter 51 that transmits the light with the wavelength λ2. The ratio of the outputs e1 and e2 of these detection elements 61 and 62 is taken by the measuring means 13 to obtain the measured output eO.

第6図は、他の実施例を示し、光源1の光は、測定波長
λ2を透過するフィルタ51、比較波長λ1)λ3を透
過するフィルタ52を有する回転セクタ5を介して被測
定対象3に投光され、その透過光または反射光は検出素
子6により検出され、測定手段13により前述と同様な
比率演算がなされ、被測定対象3の性状の測定が行われ
る。
FIG. 6 shows another embodiment in which the light from the light source 1 is transmitted to the object to be measured 3 via a rotating sector 5 having a filter 51 that transmits the measurement wavelength λ2 and a filter 52 that transmits the comparison wavelength λ1) λ3. The transmitted light or reflected light is detected by the detection element 6, and the measuring means 13 performs the same ratio calculation as described above to measure the properties of the object to be measured 3.

〔発明の効果] 以上述べたように、この発明は、2つの比較波長をとも
に通過させるフィルタ、ミラー等の分光手段を用いて得
られた2つの比較波長を含む信号を用いて比率演算を行
っているので、装置が簡単で、しかも高精度の光学測定
が可能となる。
[Effects of the Invention] As described above, the present invention performs a ratio calculation using a signal containing two comparative wavelengths obtained using a spectroscopic means such as a filter or mirror that passes both comparative wavelengths. This makes it possible to use a simple device and perform highly accurate optical measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図、第3図、第4図、第5図、第6図は、
この発明の一実施例を示す説明図である。 1・・−光源、 2・・・投光レンズ、 3・・・被測
定対象、4・・・集光レンズ、 5・・・回転セクタ、
 51.52・・・フィルタ、 6.61.62・・・
検出素子、 7・・・増幅器、 81.82・・・サン
プルホールド回路、9・・・同期信号発生器、 10・
・・割算器、 11・・・光ファイバー、 12・・・
ハーフミラ−113・・・測定手段、 14・・・分光
ミラー 特許出願人  株式会社 千野製作所 年60
Figures 1, 2, 3, 4, 5, and 6 are
FIG. 1 is an explanatory diagram showing one embodiment of the present invention. DESCRIPTION OF SYMBOLS 1...-Light source, 2... Light projection lens, 3... Measured object, 4... Condensing lens, 5... Rotating sector,
51.52...filter, 6.61.62...
Detection element, 7... Amplifier, 81.82... Sample hold circuit, 9... Synchronization signal generator, 10.
...Divider, 11...Optical fiber, 12...
Half mirror 113... Measuring means, 14... Spectroscopic mirror Patent applicant Chino Seisakusho Co., Ltd. Year 60

Claims (1)

【特許請求の範囲】 1、被測定対象からの透過光または反射光のうち測定波
長帯の成分の第1の信号と、被測定対象からの透過光ま
たは反射光のうち測定波長帯の両側の2つの比較波長帯
の2つの成分を含む第2の信号との比率から被測定対象
の性状を測定することを特徴とする光学的測定装置。 2、前記第2の信号を、2つの比較波長帯の2つの波長
成分の両方を透過させる分光手段を用いて得るようにし
たことを特徴とする特許請求の範囲第1項記載の光学的
測定装置。
[Claims] 1. A first signal of a component in the measurement wavelength band of the transmitted light or reflected light from the object to be measured, and a first signal of the component of the measurement wavelength band of the transmitted light or reflected light from the object to be measured. 1. An optical measurement device that measures the properties of an object to be measured based on the ratio between the signal and a second signal that includes two components in two comparative wavelength bands. 2. The optical measurement according to claim 1, wherein the second signal is obtained using a spectroscopic means that transmits both of the two wavelength components of the two comparative wavelength bands. Device.
JP4995085A 1985-03-13 1985-03-13 Optical measuring apparatus Granted JPS61209339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4995085A JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4995085A JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP15486486A Division JPS6211128A (en) 1986-07-01 1986-07-01 Optical measuring apparatus

Publications (2)

Publication Number Publication Date
JPS61209339A true JPS61209339A (en) 1986-09-17
JPH0531732B2 JPH0531732B2 (en) 1993-05-13

Family

ID=12845309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4995085A Granted JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Country Status (1)

Country Link
JP (1) JPS61209339A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0256742A2 (en) * 1986-08-04 1988-02-24 Jujo Paper Co., Ltd. Method for measuring concentration of adhesive of coating layer surface
JPH0743302A (en) * 1993-07-30 1995-02-14 Anatsuku:Kk Method and device for measuring coloring level

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127156A (en) * 1974-07-02 1976-03-06 Fuoodasu Ltd KONGOSOCHI
JPS5425436A (en) * 1977-07-27 1979-02-26 Shin Kobe Electric Machinery Lead storage battery

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127156A (en) * 1974-07-02 1976-03-06 Fuoodasu Ltd KONGOSOCHI
JPS5425436A (en) * 1977-07-27 1979-02-26 Shin Kobe Electric Machinery Lead storage battery

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0256742A2 (en) * 1986-08-04 1988-02-24 Jujo Paper Co., Ltd. Method for measuring concentration of adhesive of coating layer surface
JPH0743302A (en) * 1993-07-30 1995-02-14 Anatsuku:Kk Method and device for measuring coloring level

Also Published As

Publication number Publication date
JPH0531732B2 (en) 1993-05-13

Similar Documents

Publication Publication Date Title
FI96450C (en) Single-channel gas concentration measurement method and equipment
JP3526652B2 (en) Optical measuring method and optical measuring device
JPS6049847B2 (en) Method and spectrometer for measuring light intensity
US4540281A (en) Double-beam spectrophotometer
US5013153A (en) Interferometric gas component measuring apparatus for small gas molecules
EP0176826A2 (en) Method and apparatus for dual-beam spectral transmission measurements
US4383181A (en) Method and apparatus for analyzing a gaseous mixture
JPS61209339A (en) Optical measuring apparatus
JPH0566155A (en) Polarization interferometer
JPS5985918A (en) Direct ratio type spectrophotometer
JPH0854264A (en) Optical measuring apparatus
JPS6211128A (en) Optical measuring apparatus
JPH11101739A (en) Ellipsometry apparatus
JP2581464Y2 (en) Filter evaluation device
JPS61209340A (en) Optical measuring apparatus
JPH0718962Y2 (en) Optical film thickness meter
JPH0750703Y2 (en) Gas analyzer
JPH05249032A (en) Semiconductor spectroscopic detector
JPH04326026A (en) Spectrophotometer
JPH0359443A (en) Device for spectrochemical analysis
JPH02141630A (en) Spectral photometric device
JPS6166139A (en) Filter-film examining device
JPS59229698A (en) Optical measuring apparatus
JPH03180743A (en) Infrared spectrophotometer
JPS63163105A (en) Light interference type film thickness measuring apparatus

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term