JPS6459169A - Characteristic measuring apparatus of superconductive material - Google Patents
Characteristic measuring apparatus of superconductive materialInfo
- Publication number
- JPS6459169A JPS6459169A JP62217004A JP21700487A JPS6459169A JP S6459169 A JPS6459169 A JP S6459169A JP 62217004 A JP62217004 A JP 62217004A JP 21700487 A JP21700487 A JP 21700487A JP S6459169 A JPS6459169 A JP S6459169A
- Authority
- JP
- Japan
- Prior art keywords
- superconductive material
- electrodes
- superconductive
- resistivity
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 title abstract 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 2
- 239000002826 coolant Substances 0.000 abstract 2
- 238000001816 cooling Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 229910052757 nitrogen Inorganic materials 0.000 abstract 1
Landscapes
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To measure the critical temperatures of a superconductive material in various forms easily and correctly, by continuously changing the temperature of the superconductive material by the cooling effect with the use of a cooling medium and a heater, and measuring the resistivity by pin-shaped electrodes. CONSTITUTION:A superconductive material 3 is supported by a holding member 4. Resistance measuring electrodes 6 and current electrodes 7 both in pin-shaped configuration are secured to a supporting member 8 in such manner that they are point-contacted with the superconductive material 3. Then, the holding member 4 and the supporting member 8 are inserted into a cooler filled with liquid nitrogen. The resistivity of the superconductive material 3 is measured from the fall of the voltage between the electrodes 6 when the temperature of the material are continuously controlled by a heater 5 and the cooling medium, with the current flowing in the electrodes 7. Accordingly, the critical temperatures of the superconductive material 3 can be detected based on the relation between the temperatures of the superconductive material 3 indicated by a thermometer 10 and the resistivity thereof detected by the electrodes 6. Furthermore, since the electrodes 6 and 7 are pin-shaped, it can be applied to the case of superconductive materials in a variety of forms. Thus, the critical temperature of a superconductive material in various forms can be easily and correctly detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62217004A JPS6459169A (en) | 1987-08-31 | 1987-08-31 | Characteristic measuring apparatus of superconductive material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62217004A JPS6459169A (en) | 1987-08-31 | 1987-08-31 | Characteristic measuring apparatus of superconductive material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6459169A true JPS6459169A (en) | 1989-03-06 |
Family
ID=16697313
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62217004A Pending JPS6459169A (en) | 1987-08-31 | 1987-08-31 | Characteristic measuring apparatus of superconductive material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6459169A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5065087A (en) * | 1988-10-04 | 1991-11-12 | Sharp Kabushiki Kaisha | Apparatus for observing a superconductive phenomenon in a superconductor |
| US5218296A (en) * | 1992-02-07 | 1993-06-08 | International Business Machines Corporation | Method and apparatus for determining at least one characteristic of a superconductive film |
| US5223798A (en) * | 1990-10-31 | 1993-06-29 | The United States Of America As Represented By The Secretary Of The Navy | Method for measuring the resistive transition and critical current in superconductors using pulsed current |
| JP2009244038A (en) * | 2008-03-31 | 2009-10-22 | Railway Technical Res Inst | Energization characteristic testing apparatus for evaluation sample |
| CN104007402A (en) * | 2014-06-06 | 2014-08-27 | 泉州师范学院 | Nanovolt-order superconductor resistance critical temperature measurement system |
| JP2016024152A (en) * | 2014-07-24 | 2016-02-08 | 住友電気工業株式会社 | Critical current measuring device for superconductive wire material |
| CN109374975A (en) * | 2018-11-26 | 2019-02-22 | 华中科技大学 | The resistivity test device and method of thin polymer film under a kind of high field intensity |
| WO2020050925A1 (en) * | 2018-09-04 | 2020-03-12 | Northrop Grumman Systems Corporation | Superconductor critical temperature measurement |
-
1987
- 1987-08-31 JP JP62217004A patent/JPS6459169A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5065087A (en) * | 1988-10-04 | 1991-11-12 | Sharp Kabushiki Kaisha | Apparatus for observing a superconductive phenomenon in a superconductor |
| US5126655A (en) * | 1988-10-04 | 1992-06-30 | Sharp Kabushiki Kaisha | Apparatus for observing a superconductive phenomenon in a superconductor |
| US5223798A (en) * | 1990-10-31 | 1993-06-29 | The United States Of America As Represented By The Secretary Of The Navy | Method for measuring the resistive transition and critical current in superconductors using pulsed current |
| US5218296A (en) * | 1992-02-07 | 1993-06-08 | International Business Machines Corporation | Method and apparatus for determining at least one characteristic of a superconductive film |
| JP2009244038A (en) * | 2008-03-31 | 2009-10-22 | Railway Technical Res Inst | Energization characteristic testing apparatus for evaluation sample |
| CN104007402A (en) * | 2014-06-06 | 2014-08-27 | 泉州师范学院 | Nanovolt-order superconductor resistance critical temperature measurement system |
| JP2016024152A (en) * | 2014-07-24 | 2016-02-08 | 住友電気工業株式会社 | Critical current measuring device for superconductive wire material |
| WO2020050925A1 (en) * | 2018-09-04 | 2020-03-12 | Northrop Grumman Systems Corporation | Superconductor critical temperature measurement |
| AU2019336595B2 (en) * | 2018-09-04 | 2021-12-09 | Northrop Grumman Systems Corporation | Superconductor critical temperature measurement |
| JP2021535603A (en) * | 2018-09-04 | 2021-12-16 | ノースロップ グラマン システムズ コーポレーション | Superconducting critical temperature measurement |
| CN109374975A (en) * | 2018-11-26 | 2019-02-22 | 华中科技大学 | The resistivity test device and method of thin polymer film under a kind of high field intensity |
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