JPS5299847A - Thickness measurement using ultrasonic waves - Google Patents
Thickness measurement using ultrasonic wavesInfo
- Publication number
- JPS5299847A JPS5299847A JP1682576A JP1682576A JPS5299847A JP S5299847 A JPS5299847 A JP S5299847A JP 1682576 A JP1682576 A JP 1682576A JP 1682576 A JP1682576 A JP 1682576A JP S5299847 A JPS5299847 A JP S5299847A
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic waves
- thickness measurement
- thickness
- accomplish
- conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Abstract
PURPOSE: To accomplish the correct measurement of the thickness of an insulating layer on a conductor in a cooling water bath immediately after the production of a wire or cable by taking a mean value among several measured values excepting abnormal values.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1682576A JPS5299847A (en) | 1976-02-17 | 1976-02-17 | Thickness measurement using ultrasonic waves |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1682576A JPS5299847A (en) | 1976-02-17 | 1976-02-17 | Thickness measurement using ultrasonic waves |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5299847A true JPS5299847A (en) | 1977-08-22 |
Family
ID=11926945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1682576A Pending JPS5299847A (en) | 1976-02-17 | 1976-02-17 | Thickness measurement using ultrasonic waves |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5299847A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62206410A (en) * | 1986-03-06 | 1987-09-10 | Mimasu Handotai Kogyo Kk | Method and apparatus of measuring wafer thickness |
US5098185A (en) * | 1988-06-15 | 1992-03-24 | Japan Industrial Land Development Co., Ltd. | Automatic tracking type measuring apparatus |
JP2014232031A (en) * | 2013-05-29 | 2014-12-11 | 株式会社クボタ | Thickness measuring method |
-
1976
- 1976-02-17 JP JP1682576A patent/JPS5299847A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62206410A (en) * | 1986-03-06 | 1987-09-10 | Mimasu Handotai Kogyo Kk | Method and apparatus of measuring wafer thickness |
US5098185A (en) * | 1988-06-15 | 1992-03-24 | Japan Industrial Land Development Co., Ltd. | Automatic tracking type measuring apparatus |
JP2014232031A (en) * | 2013-05-29 | 2014-12-11 | 株式会社クボタ | Thickness measuring method |
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