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JPS55136943A - Inspection apparatus for surface condition - Google Patents

Inspection apparatus for surface condition

Info

Publication number
JPS55136943A
JPS55136943A JP4498579A JP4498579A JPS55136943A JP S55136943 A JPS55136943 A JP S55136943A JP 4498579 A JP4498579 A JP 4498579A JP 4498579 A JP4498579 A JP 4498579A JP S55136943 A JPS55136943 A JP S55136943A
Authority
JP
Japan
Prior art keywords
signal
defect
signals
gentle
surface condition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4498579A
Other languages
Japanese (ja)
Other versions
JPS6217696B2 (en
Inventor
Masaomi Kondo
Masaru Watanabe
Minoru Todokoro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KEISOKU GIJUTSU KENKYUSHO
KEISOKU GIJUTSU KENKYUSHO KK
Hitachi Cable Ltd
Original Assignee
KEISOKU GIJUTSU KENKYUSHO
KEISOKU GIJUTSU KENKYUSHO KK
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KEISOKU GIJUTSU KENKYUSHO, KEISOKU GIJUTSU KENKYUSHO KK, Hitachi Cable Ltd filed Critical KEISOKU GIJUTSU KENKYUSHO
Priority to JP4498579A priority Critical patent/JPS55136943A/en
Publication of JPS55136943A publication Critical patent/JPS55136943A/en
Publication of JPS6217696B2 publication Critical patent/JPS6217696B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve the inspection precision of the surface condition of a body by finding in order the difference between an original signal and a plurality of delay signals formed from the original signal in order to obtain a response signal even from a defect of a gentle change. CONSTITUTION:A light-receiving device 32 outputs a signal (a) which has a response part (A) corresponding to a sharp defect 34 and a response part (B) corresponding to a gentle defect 34'. The signal (a) is sent to an amplifier 9 and an envelope circuit 10 to obtain a signal (b), which is provided with delays in delay circuits 111, 112, and 113 to obtain signals (e), (f), and (i) respectively. The difference between the signals (e), (f), and (i) and the original signal (b) is subtracted from the signals (e), (f), and (i) in differential amplifiers 121, 122, and 123 to obtain signals (d), (g), and (j) respectively. The signal (e) having a pulse (C) corresponding to the sharp defect 34 is obtained from the signal (d), a signal (h), from the signal (g), and a signal (k) having a pulse (D) corresponding to the gentle defect 34', from the signal (j). The signals (e), (h), and (k) are transmitted to an OR circuit 16 to obtain a signal l having the pulses (C) and (D) corresponding to the defect part.
JP4498579A 1979-04-12 1979-04-12 Inspection apparatus for surface condition Granted JPS55136943A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4498579A JPS55136943A (en) 1979-04-12 1979-04-12 Inspection apparatus for surface condition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4498579A JPS55136943A (en) 1979-04-12 1979-04-12 Inspection apparatus for surface condition

Publications (2)

Publication Number Publication Date
JPS55136943A true JPS55136943A (en) 1980-10-25
JPS6217696B2 JPS6217696B2 (en) 1987-04-18

Family

ID=12706747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4498579A Granted JPS55136943A (en) 1979-04-12 1979-04-12 Inspection apparatus for surface condition

Country Status (1)

Country Link
JP (1) JPS55136943A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58200140A (en) * 1982-05-17 1983-11-21 Toyo Tire & Rubber Co Ltd Detector for ruggedness of tire side wall
JPS61217746A (en) * 1985-03-25 1986-09-27 Mitsubishi Electric Corp Optical surface inspector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58200140A (en) * 1982-05-17 1983-11-21 Toyo Tire & Rubber Co Ltd Detector for ruggedness of tire side wall
JPH0151122B2 (en) * 1982-05-17 1989-11-01 Toyo Rubber Ind Co
JPS61217746A (en) * 1985-03-25 1986-09-27 Mitsubishi Electric Corp Optical surface inspector

Also Published As

Publication number Publication date
JPS6217696B2 (en) 1987-04-18

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