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JPS54141149A - Interference filter - Google Patents

Interference filter

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Publication number
JPS54141149A
JPS54141149A JP4907978A JP4907978A JPS54141149A JP S54141149 A JPS54141149 A JP S54141149A JP 4907978 A JP4907978 A JP 4907978A JP 4907978 A JP4907978 A JP 4907978A JP S54141149 A JPS54141149 A JP S54141149A
Authority
JP
Japan
Prior art keywords
refractive index
thru
materials
film thicknesses
index materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4907978A
Other languages
Japanese (ja)
Inventor
Tei Takaoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4907978A priority Critical patent/JPS54141149A/en
Publication of JPS54141149A publication Critical patent/JPS54141149A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To achieve the improvement in performance by specifying the film thickness relations of materials of high and low refractive indices to be laminated on a transparent substrate.
CONSTITUTION: High refractive index materials 5a thru 5d such as cerium oxide or other of about 2.35 in refractive index and low refractive index materials 6a thru 6c such as magnesium fluoride or other of about 1.38 in refractive index and laminated on a transparent glass substrate 4 by continuously varying film thicknesses in the direction perpendicular to the advancing direction of light while maintaining the relations of nHdH∝nLdL where the film thicknesses of the high refractive index materials 5a thru 5a are let to be dH, their refractive indices to be nH, the film thicknesses of the low refractive index materials 5a thru 6c to be dL and their refractive indices to be nL. Then, wavelength light of about 0.7μm transmits through one end part Ta of the glass substrate 4 and wavelength light of about 1.1μm at the other end part Tb, whereby the characteristics of difference spectral spectra may be continuously obtained depending upon the places used.
COPYRIGHT: (C)1979,JPO&Japio
JP4907978A 1978-04-24 1978-04-24 Interference filter Pending JPS54141149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4907978A JPS54141149A (en) 1978-04-24 1978-04-24 Interference filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4907978A JPS54141149A (en) 1978-04-24 1978-04-24 Interference filter

Publications (1)

Publication Number Publication Date
JPS54141149A true JPS54141149A (en) 1979-11-02

Family

ID=12821075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4907978A Pending JPS54141149A (en) 1978-04-24 1978-04-24 Interference filter

Country Status (1)

Country Link
JP (1) JPS54141149A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56137308A (en) * 1980-03-03 1981-10-27 Siemens Ag Composite optical branch element
JPS57108766A (en) * 1980-12-26 1982-07-06 Shimadzu Corp Multi-wavelength spectroscope
JPS5945406A (en) * 1982-09-08 1984-03-14 Ulvac Corp Optical filter
JPS5945407A (en) * 1982-09-08 1984-03-14 Ulvac Corp Production of optical filter
JPH0370330U (en) * 1990-11-01 1991-07-15
US5283692A (en) * 1989-07-21 1994-02-01 Spectra Physics Lasers, Inc. Multi-layer graded reflectivity mirror
JPH06265722A (en) * 1993-01-20 1994-09-22 Sun Tec Kk Wavelength variable type interference optical filter and its production and wavelength variable type interference optical filter device
JP2011059318A (en) * 2009-09-09 2011-03-24 Nikon Corp Transmission wavelength variable filter and spectrophotometry device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56137308A (en) * 1980-03-03 1981-10-27 Siemens Ag Composite optical branch element
JPS57108766A (en) * 1980-12-26 1982-07-06 Shimadzu Corp Multi-wavelength spectroscope
JPS6341411B2 (en) * 1980-12-26 1988-08-17 Shimadzu Corp
JPS5945406A (en) * 1982-09-08 1984-03-14 Ulvac Corp Optical filter
JPS5945407A (en) * 1982-09-08 1984-03-14 Ulvac Corp Production of optical filter
US5283692A (en) * 1989-07-21 1994-02-01 Spectra Physics Lasers, Inc. Multi-layer graded reflectivity mirror
JPH0370330U (en) * 1990-11-01 1991-07-15
JPH06265722A (en) * 1993-01-20 1994-09-22 Sun Tec Kk Wavelength variable type interference optical filter and its production and wavelength variable type interference optical filter device
JP2011059318A (en) * 2009-09-09 2011-03-24 Nikon Corp Transmission wavelength variable filter and spectrophotometry device

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