JPS54113384A - Multi-wave spectroscopic photometer - Google Patents
Multi-wave spectroscopic photometerInfo
- Publication number
- JPS54113384A JPS54113384A JP1965878A JP1965878A JPS54113384A JP S54113384 A JPS54113384 A JP S54113384A JP 1965878 A JP1965878 A JP 1965878A JP 1965878 A JP1965878 A JP 1965878A JP S54113384 A JPS54113384 A JP S54113384A
- Authority
- JP
- Japan
- Prior art keywords
- detectors
- lambdax
- lambdan
- lambda1
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To enlarge the wavelength range to be measured and to reduce the cost by operating a plurality of self-scanning type detectors in a charge stored mode and by integrally processing the outputs of the detectors. CONSTITUTION:The light emanating from its source 4 passes through an incident slit 5 and is diffrated by detectors 6a and 6b the resultant lights enter self-scanning type detectors 7 and 8. More specifically, the detector 7 receives a shorter wave light of lambda1 to lambdax, whereas the detector 8 receives a longer wave light of lambdax+1 to lambdan such that the storate time Ts is obtained to have proper quantity of incident light and that the scanning operations are carried out in the order lambda1 lambdax, lambdax+1 lambdan by the scanning circuits of the detectors 7 and 8. The output signals of the detectors 7 and 8 are integrated as if the wavelength ranges of lambda1 lambdan are continuously scanned. Thus, it is possible to enlarge the wavelength range and to reduce the cost.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1965878A JPS54113384A (en) | 1978-02-24 | 1978-02-24 | Multi-wave spectroscopic photometer |
US06/014,277 US4253765A (en) | 1978-02-22 | 1979-02-22 | Multi-wavelength spectrophotometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1965878A JPS54113384A (en) | 1978-02-24 | 1978-02-24 | Multi-wave spectroscopic photometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54113384A true JPS54113384A (en) | 1979-09-04 |
Family
ID=12005339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1965878A Pending JPS54113384A (en) | 1978-02-22 | 1978-02-24 | Multi-wave spectroscopic photometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54113384A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5924221A (en) * | 1982-07-30 | 1984-02-07 | Shimadzu Corp | Spectrophotometer |
JPS63250534A (en) * | 1987-04-08 | 1988-10-18 | Matsushita Electric Ind Co Ltd | Spectrophotometric device |
US5173748A (en) * | 1991-12-05 | 1992-12-22 | Eastman Kodak Company | Scanning multichannel spectrometry using a charge-coupled device (CCD) in time-delay integration (TDI) mode |
DE4223211A1 (en) * | 1992-07-15 | 1994-01-20 | Bodenseewerk Perkin Elmer Co | Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating |
WO2002007227A1 (en) * | 2000-07-18 | 2002-01-24 | Nippon Sheet Glass Co., Ltd. | Light-receiving device and photodetector comprising light-receiving device |
JP2007132934A (en) * | 2005-11-07 | 2007-05-31 | Wafermasters Inc | Spectroscopy system |
JP2012026730A (en) * | 2010-07-20 | 2012-02-09 | Hitachi High-Technologies Corp | Spectrophotometer and absorbance measuring method |
-
1978
- 1978-02-24 JP JP1965878A patent/JPS54113384A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5924221A (en) * | 1982-07-30 | 1984-02-07 | Shimadzu Corp | Spectrophotometer |
JPS63250534A (en) * | 1987-04-08 | 1988-10-18 | Matsushita Electric Ind Co Ltd | Spectrophotometric device |
US5173748A (en) * | 1991-12-05 | 1992-12-22 | Eastman Kodak Company | Scanning multichannel spectrometry using a charge-coupled device (CCD) in time-delay integration (TDI) mode |
DE4223211A1 (en) * | 1992-07-15 | 1994-01-20 | Bodenseewerk Perkin Elmer Co | Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating |
DE4223211C2 (en) * | 1992-07-15 | 1999-03-04 | Bodenseewerk Perkin Elmer Co | Double-beam lattice polychromator |
WO2002007227A1 (en) * | 2000-07-18 | 2002-01-24 | Nippon Sheet Glass Co., Ltd. | Light-receiving device and photodetector comprising light-receiving device |
US7372124B2 (en) | 2000-07-18 | 2008-05-13 | Nippon Sheet Glass Company, Limited | Light-receiving element and photodetector using the same |
JP2007132934A (en) * | 2005-11-07 | 2007-05-31 | Wafermasters Inc | Spectroscopy system |
JP2012026730A (en) * | 2010-07-20 | 2012-02-09 | Hitachi High-Technologies Corp | Spectrophotometer and absorbance measuring method |
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