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JPS54113384A - Multi-wave spectroscopic photometer - Google Patents

Multi-wave spectroscopic photometer

Info

Publication number
JPS54113384A
JPS54113384A JP1965878A JP1965878A JPS54113384A JP S54113384 A JPS54113384 A JP S54113384A JP 1965878 A JP1965878 A JP 1965878A JP 1965878 A JP1965878 A JP 1965878A JP S54113384 A JPS54113384 A JP S54113384A
Authority
JP
Japan
Prior art keywords
detectors
lambdax
lambdan
lambda1
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1965878A
Other languages
Japanese (ja)
Inventor
Shigeru Sonobe
Iwao Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1965878A priority Critical patent/JPS54113384A/en
Priority to US06/014,277 priority patent/US4253765A/en
Publication of JPS54113384A publication Critical patent/JPS54113384A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To enlarge the wavelength range to be measured and to reduce the cost by operating a plurality of self-scanning type detectors in a charge stored mode and by integrally processing the outputs of the detectors. CONSTITUTION:The light emanating from its source 4 passes through an incident slit 5 and is diffrated by detectors 6a and 6b the resultant lights enter self-scanning type detectors 7 and 8. More specifically, the detector 7 receives a shorter wave light of lambda1 to lambdax, whereas the detector 8 receives a longer wave light of lambdax+1 to lambdan such that the storate time Ts is obtained to have proper quantity of incident light and that the scanning operations are carried out in the order lambda1 lambdax, lambdax+1 lambdan by the scanning circuits of the detectors 7 and 8. The output signals of the detectors 7 and 8 are integrated as if the wavelength ranges of lambda1 lambdan are continuously scanned. Thus, it is possible to enlarge the wavelength range and to reduce the cost.
JP1965878A 1978-02-22 1978-02-24 Multi-wave spectroscopic photometer Pending JPS54113384A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1965878A JPS54113384A (en) 1978-02-24 1978-02-24 Multi-wave spectroscopic photometer
US06/014,277 US4253765A (en) 1978-02-22 1979-02-22 Multi-wavelength spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1965878A JPS54113384A (en) 1978-02-24 1978-02-24 Multi-wave spectroscopic photometer

Publications (1)

Publication Number Publication Date
JPS54113384A true JPS54113384A (en) 1979-09-04

Family

ID=12005339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1965878A Pending JPS54113384A (en) 1978-02-22 1978-02-24 Multi-wave spectroscopic photometer

Country Status (1)

Country Link
JP (1) JPS54113384A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924221A (en) * 1982-07-30 1984-02-07 Shimadzu Corp Spectrophotometer
JPS63250534A (en) * 1987-04-08 1988-10-18 Matsushita Electric Ind Co Ltd Spectrophotometric device
US5173748A (en) * 1991-12-05 1992-12-22 Eastman Kodak Company Scanning multichannel spectrometry using a charge-coupled device (CCD) in time-delay integration (TDI) mode
DE4223211A1 (en) * 1992-07-15 1994-01-20 Bodenseewerk Perkin Elmer Co Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating
WO2002007227A1 (en) * 2000-07-18 2002-01-24 Nippon Sheet Glass Co., Ltd. Light-receiving device and photodetector comprising light-receiving device
JP2007132934A (en) * 2005-11-07 2007-05-31 Wafermasters Inc Spectroscopy system
JP2012026730A (en) * 2010-07-20 2012-02-09 Hitachi High-Technologies Corp Spectrophotometer and absorbance measuring method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924221A (en) * 1982-07-30 1984-02-07 Shimadzu Corp Spectrophotometer
JPS63250534A (en) * 1987-04-08 1988-10-18 Matsushita Electric Ind Co Ltd Spectrophotometric device
US5173748A (en) * 1991-12-05 1992-12-22 Eastman Kodak Company Scanning multichannel spectrometry using a charge-coupled device (CCD) in time-delay integration (TDI) mode
DE4223211A1 (en) * 1992-07-15 1994-01-20 Bodenseewerk Perkin Elmer Co Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating
DE4223211C2 (en) * 1992-07-15 1999-03-04 Bodenseewerk Perkin Elmer Co Double-beam lattice polychromator
WO2002007227A1 (en) * 2000-07-18 2002-01-24 Nippon Sheet Glass Co., Ltd. Light-receiving device and photodetector comprising light-receiving device
US7372124B2 (en) 2000-07-18 2008-05-13 Nippon Sheet Glass Company, Limited Light-receiving element and photodetector using the same
JP2007132934A (en) * 2005-11-07 2007-05-31 Wafermasters Inc Spectroscopy system
JP2012026730A (en) * 2010-07-20 2012-02-09 Hitachi High-Technologies Corp Spectrophotometer and absorbance measuring method

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