JPH0358418A - Wafer vacuum drying device - Google Patents
Wafer vacuum drying deviceInfo
- Publication number
- JPH0358418A JPH0358418A JP19261989A JP19261989A JPH0358418A JP H0358418 A JPH0358418 A JP H0358418A JP 19261989 A JP19261989 A JP 19261989A JP 19261989 A JP19261989 A JP 19261989A JP H0358418 A JPH0358418 A JP H0358418A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- cover
- recessed part
- supporting stand
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001291 vacuum drying Methods 0.000 title description 12
- 238000001035 drying Methods 0.000 claims abstract description 7
- 238000000034 method Methods 0.000 abstract description 4
- 238000001704 evaporation Methods 0.000 abstract description 3
- 230000008020 evaporation Effects 0.000 abstract description 2
- 239000003566 sealing material Substances 0.000 abstract description 2
- 238000005406 washing Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 35
- 238000004140 cleaning Methods 0.000 description 10
- 239000007788 liquid Substances 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Drying Of Solid Materials (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、ICやトランジスタの基板となる円盤状のウ
ェハの真空乾燥装置に関する。ここで、該ウェハは、イ
ンゴットと呼ばれる円柱状の(シリコン等の)単結晶体
を薄く輪切りにして形成されている。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a vacuum drying apparatus for disc-shaped wafers that serve as substrates for ICs and transistors. Here, the wafer is formed by thinly slicing a cylindrical single crystal (of silicon or the like) called an ingot.
[従来の技術]
従来のかかる装置は、遠心力により洗浄液等を振り切る
ようにしていた。或いは、真空乾燥装置が知られていた
。[Prior Art] Such a conventional device uses centrifugal force to shake off cleaning liquid and the like. Alternatively, a vacuum drying device was known.
[発明が解決しようとする課題]
上記した遠心力により洗浄液等を振り切る方式の装置に
おいては、振り切った洗浄液等が飛散し、再び周囲の汚
染を持ち込む形でウェハに付着するなどの欠点があった
。[Problems to be Solved by the Invention] In the above-mentioned apparatus that uses centrifugal force to shake off cleaning liquid, etc., there is a drawback that the shaken-off cleaning liquid scatters and adheres to the wafer, bringing in contamination from the surrounding area. .
これに対し真空乾燥装置においては、理論的には、洗浄
液の蒸発及び蒸気の強制排気という二重の効果を有して
いるので、理論的には、遠心力により洗浄液等を振り切
る方式の装置における上記した欠点を防止することが可
能である。そのため、真空乾燥装置は回路部品などの洗
浄に一部実施されている。On the other hand, vacuum drying equipment theoretically has the double effect of evaporating the cleaning liquid and forcing the steam out. It is possible to prevent the above-mentioned drawbacks. For this reason, vacuum drying equipment is partially used for cleaning circuit parts and the like.
しかし、従来の真空乾燥装置では真空機構については特
に工夫はされていなかった。即ち、従来の真空乾燥装置
では、真空引きに時間を要してしまうという問題があり
、生産性を向上し難かった。However, in conventional vacuum drying apparatuses, no particular improvements have been made to the vacuum mechanism. That is, in the conventional vacuum drying apparatus, there is a problem in that it takes time to draw a vacuum, making it difficult to improve productivity.
これに対して、ロードロック機構等を併用して真空引き
に要する時間を短縮するという技術も提案されていたが
、該ロードロック機構を用いる場合においても、真空引
きに要する時間は比較的長いので乾燥時間も長くなり、
また、真空乾燥装置全体が巨大になってしまうという問
題がある。In response, a technique has been proposed in which a load lock mechanism is used in combination to shorten the time required for evacuation, but even when such a load lock mechanism is used, the time required for evacuation is relatively long. Drying time is also longer
Another problem is that the entire vacuum drying apparatus becomes huge.
本発明は、上記した従来技術の問題点に鑑みて提案され
たもので、乾燥時間を短縮することができるウェハ真空
乾燥装置を提供することを目的としている。The present invention was proposed in view of the problems of the prior art described above, and an object of the present invention is to provide a wafer vacuum drying apparatus that can shorten drying time.
[課題を解決するための手段]
本発明によるウェハ真空乾燥装置は、ウェハを支持する
昇降自在な支持台と、該支持台の上昇時に該支持台に密
着される蓋体とを備え、該蓋体の下面には前記ウェハを
覆うように小容積の凹部が形成され、該凹部は真空源に
接続されている。[Means for Solving the Problems] A wafer vacuum drying apparatus according to the present invention includes a support base that supports a wafer and is movable up and down, and a lid body that is brought into close contact with the support base when the support base is raised. A small-volume recess is formed on the lower surface of the body to cover the wafer, and the recess is connected to a vacuum source.
上記支持台及び蓋体の間に、0リングなどのシール部材
を介装するのが好ましい。It is preferable to interpose a sealing member such as an O-ring between the support base and the lid.
また、支持台の上面に、ウェハを載置する複数のコーン
状のウェハ載置用突部を突設ずるのが好ましい。Further, it is preferable that a plurality of cone-shaped wafer placement protrusions on which wafers are placed protrude from the upper surface of the support base.
また、真空源は、真空ポンプで構成し、該ポンプと凹部
とを接続する管路に、凹部を真空ポンプ側又は大気側に
選択的に切換える切換弁を介装するのが好ましい。Further, it is preferable that the vacuum source is constituted by a vacuum pump, and a switching valve for selectively switching the recess to the vacuum pump side or the atmosphere side is interposed in the pipeline connecting the pump and the recess.
また、蓋体に、加熱装置を設けて蒸発を促進し、更に乾
燥時間を短縮するのが好ましい。Further, it is preferable to provide the lid with a heating device to promote evaporation and further shorten the drying time.
なお、支持台には1個のウェハを載置するのが好ましい
が、複数のウェハを載置することも可能である。Although it is preferable to place one wafer on the support stand, it is also possible to place a plurality of wafers on the support stand.
[作用]
上記のように構成された本発明のウェハ真空乾燥装置に
おいては、乾燥に際し、先ず、洗浄工程で洗浄されたウ
ェハが搬送機により搬送され、支持台の載置用突部上に
載置される。次いで、支持台が上昇して、シール材を介
して蓋体が支持台に密着される。[Function] In the wafer vacuum drying apparatus of the present invention configured as described above, during drying, the wafer cleaned in the cleaning step is first conveyed by the conveyor and placed on the mounting protrusion of the support table. be placed. Next, the support base is raised, and the lid body is brought into close contact with the support base via the sealing material.
この状態で真空ポンプ(作動中)側に切換弁を切換える
と、小容積の凹部内が急速に真空化され、ウェハに付着
している洗浄液は急速に蒸発し、その蒸気は強制的に排
気されるので、ウェハは短時間で乾燥するのである。When the switching valve is switched to the vacuum pump (operating) side in this state, the inside of the small volume recess is rapidly evacuated, the cleaning liquid adhering to the wafer is rapidly evaporated, and the vapor is forcibly exhausted. As a result, the wafer dries in a short time.
その後、切換弁を大気(クリーンルーム内)側に切換え
て、支持台を下降し、乾燥したウェハを貯蔵し或いは次
の処理施設まで搬送すれば良い。Thereafter, the switching valve is switched to the atmosphere (inside the clean room), the support stage is lowered, and the dried wafers are stored or transported to the next processing facility.
[実施例」 以下図面を参照して本発明の実施例を説明する。[Example" Embodiments of the present invention will be described below with reference to the drawings.
第1図及び第2図において、固定部材l上には、エアシ
リンダ2がボルト結合などにより立設されている。その
ピストンロツド3の上端部には、支持部材であるディス
ク状のウェハサポート4が固設され、このサポート4の
上面には、複数(図示の例では3個)のコーン状のウェ
ハ載置用突部5が立設されている。また、周縁部付近に
はシール部材である0リング6が設けられている。In FIGS. 1 and 2, an air cylinder 2 is erected on a fixing member l by bolt connection or the like. A disk-shaped wafer support 4, which is a support member, is fixed to the upper end of the piston rod 3, and a plurality of (three in the illustrated example) cone-shaped wafer mounting protrusions are provided on the upper surface of the support 4. Section 5 is set up. Further, an O-ring 6, which is a sealing member, is provided near the peripheral edge.
他方、ウェハサポート4に対向して蓋体であるカバー7
が設けられ、その下面には四部8が形成されている。こ
こで、該凹部8は、ウェハAとカバー8との間に狭い隙
間を設けつつ該カバーを覆うように、その内容積が小さ
く設定されている。On the other hand, a cover 7 which is a lid body faces the wafer support 4.
is provided, and four parts 8 are formed on the lower surface thereof. Here, the inner volume of the recess 8 is set to be small so as to cover the cover while providing a narrow gap between the wafer A and the cover 8.
そして、この凹部8は、排気パイプ9により真空源であ
る図示しない真空ポンプ又は大気側に、切換弁10を介
して、選択的に接続されている。The recess 8 is selectively connected to a vacuum pump (not shown) serving as a vacuum source or to the atmosphere via an exhaust pipe 9 via a switching valve 10 .
ウェハAの乾燥に際し、洗浄工程において洗浄の完了し
たウェハAを図示しないウェハ搬送機により搬送し、ウ
ェハ載置用突部5・・・上に載置する。When drying the wafer A, the wafer A, which has been completely cleaned in the cleaning process, is transported by a wafer transport machine (not shown) and placed on the wafer mounting projections 5 .
次いで、エアシリンダ2を伸長作動して、ピストンロツ
ド3を介してウェハサポート4を上昇させ、0リング6
を介してカバー7とウェハサポート4とを密着させる。Next, the air cylinder 2 is extended and the wafer support 4 is raised via the piston rod 3, and the O-ring 6 is raised.
The cover 7 and the wafer support 4 are brought into close contact with each other via.
そして、切換弁10を作動して真空ポンプ側に切換え、
小容積の四部8内の空気を排気する。これにより、凹部
8内を急速に真空化し、ウェハAに付着している洗浄液
を急激に蒸発させ、その蒸気を真空ポンプで強制的に排
気し、ウェハAを短時間で乾燥する。Then, operate the switching valve 10 to switch to the vacuum pump side,
The air in the small volume four parts 8 is evacuated. As a result, the inside of the recess 8 is rapidly evacuated, the cleaning liquid adhering to the wafer A is rapidly evaporated, the vapor is forcibly evacuated by the vacuum pump, and the wafer A is dried in a short time.
最後に、切換弁10を大気側(クリーンルーム内側)に
切換え、凹部8内の真空状態を解除する。Finally, the switching valve 10 is switched to the atmosphere side (inside the clean room) to release the vacuum state within the recess 8.
そして、エアシリンダ2を収縮作動してウェハサポート
4を下降し、乾燥の終了したウェハAをウェハ搬送機に
より次工程に搬送する。したがって、バキュームブレー
ク時極めて清浄なガス空気を用いることもできる。Then, the air cylinder 2 is contracted to lower the wafer support 4, and the dried wafer A is transported to the next process by the wafer transport machine. Therefore, extremely clean gas air can be used during the vacuum break.
[発明の効果]
本発明は、以上説明したように構成されているので、真
空ポンプにより小容積の凹部内を急激に真空化し、ウェ
ハに付着している洗浄液を急激に蒸発し、その蒸気を強
制排気することができる。[Effects of the Invention] Since the present invention is configured as described above, the inside of the small volume recess is rapidly evacuated using a vacuum pump, the cleaning liquid adhering to the wafer is rapidly evaporated, and the vapor is released. Forced exhaust can be performed.
これにより、ウェハを短時間で乾燥し、生産性を向上す
ることができる。それと共に、従来の真空乾燥装置に比
較して、小形化及び軽量化が達成できるのである。Thereby, the wafer can be dried in a short time and productivity can be improved. At the same time, it is possible to achieve a reduction in size and weight compared to conventional vacuum drying equipment.
第I図は本発明の一実施例を示す一部を断面で示した側
面図、第2図はウェハサポートの上面図である。
2●・・エアシリンダ 4●●●ウェハサポート
7・●・カバー 8●・・四部′J
第
図FIG. I is a partially sectional side view showing one embodiment of the present invention, and FIG. 2 is a top view of a wafer support. 2●...Air cylinder 4●●●Wafer support
7・●・Cover 8●・・Part 4'J Diagram
Claims (1)
時に該支持台に密着される蓋体とを備え、該蓋体の下面
には前記ウェハを覆うように小容積の凹部が形成されて
おり、該凹部は真空源に接続されていることを特徴とす
るウェハ乾燥装置。The device includes a support stand that supports a wafer and is movable up and down, and a lid that comes into close contact with the support when the support is raised, and a small-volume recess is formed on the lower surface of the lid so as to cover the wafer. A wafer drying apparatus characterized in that the recess is connected to a vacuum source.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1192619A JP2657954B2 (en) | 1989-07-27 | 1989-07-27 | Wafer vacuum drying equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1192619A JP2657954B2 (en) | 1989-07-27 | 1989-07-27 | Wafer vacuum drying equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0358418A true JPH0358418A (en) | 1991-03-13 |
JP2657954B2 JP2657954B2 (en) | 1997-09-30 |
Family
ID=16294273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1192619A Expired - Lifetime JP2657954B2 (en) | 1989-07-27 | 1989-07-27 | Wafer vacuum drying equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2657954B2 (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63102234A (en) * | 1986-10-17 | 1988-05-07 | Mitsubishi Electric Corp | Method of drying wafer |
-
1989
- 1989-07-27 JP JP1192619A patent/JP2657954B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63102234A (en) * | 1986-10-17 | 1988-05-07 | Mitsubishi Electric Corp | Method of drying wafer |
Also Published As
Publication number | Publication date |
---|---|
JP2657954B2 (en) | 1997-09-30 |
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