JPH0358417A - Wafer washing device - Google Patents
Wafer washing deviceInfo
- Publication number
- JPH0358417A JPH0358417A JP19261889A JP19261889A JPH0358417A JP H0358417 A JPH0358417 A JP H0358417A JP 19261889 A JP19261889 A JP 19261889A JP 19261889 A JP19261889 A JP 19261889A JP H0358417 A JPH0358417 A JP H0358417A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- machine
- cleaning
- vacuum
- washed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005406 washing Methods 0.000 title abstract 6
- 238000004140 cleaning Methods 0.000 claims abstract description 41
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 abstract description 2
- 238000001291 vacuum drying Methods 0.000 abstract 3
- 238000010981 drying operation Methods 0.000 abstract 1
- 239000012530 fluid Substances 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 65
- 238000001035 drying Methods 0.000 description 11
- 239000007788 liquid Substances 0.000 description 7
- 238000002360 preparation method Methods 0.000 description 7
- 238000005192 partition Methods 0.000 description 6
- 230000032258 transport Effects 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 2
- 244000025254 Cannabis sativa Species 0.000 description 1
- 101100460719 Mus musculus Noto gene Proteins 0.000 description 1
- 101100187345 Xenopus laevis noto gene Proteins 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野1
本発明は、ICやトランジスタの基板となる円板状のウ
ェハの洗浄装置に関する。ここで、該ウェハはインゴッ
l・と呼ばれる円柱状のシリコンなどの単結晶体を薄く
輪切りに1、て形或されている。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention relates to a cleaning apparatus for a disk-shaped wafer that serves as a substrate for an IC or a transistor. Here, the wafer is formed by thinly slicing a cylindrical single crystal body of silicon or the like called an ingot.
[従来の技術コ
従来のかかる洗浄装置は、ウオータジェット洗浄機と乾
燥機との組合せで構成されていた。例えば第2図で示す
ように、前処理施設32においてブラシ及びリンス機構
34で処理されたウェハDは、洗浄装置36においてウ
オータジェット洗浄機38、38によって洗浄され、図
示しない乾燥機により符号40で示すようにスピン乾燥
されている。[Prior Art] Such a conventional cleaning device was composed of a combination of a water jet washer and a dryer. For example, as shown in FIG. 2, the wafer D processed by the brush and rinse mechanism 34 in the pre-processing facility 32 is cleaned by water jet cleaners 38, 38 in the cleaning device 36, and then washed by the reference numeral 40 by a dryer (not shown). Spin dried as shown.
ここで、乾燥機としては、第2図で示すように遠心力に
より洗浄液を振り切る方式の遠心式乾燥機と、真空によ
り洗浄液を蒸発して除去せしめる真空乾燥機とが知られ
ている。Here, as a dryer, there are known a centrifugal dryer, which uses centrifugal force to shake off the cleaning liquid, as shown in FIG. 2, and a vacuum dryer, which uses vacuum to evaporate and remove the cleaning liquid.
[発明が解決しようとする課題]
上記遠心式乾燥機においては、振り切った洗浄液が乾燥
し、再び周囲の汚染を持ち込む形でウェハに付着するな
どの欠点があった。[Problems to be Solved by the Invention] The above-mentioned centrifugal dryer has the disadvantage that the shaken-off cleaning liquid dries and adheres to the wafer again, bringing in contamination from the surrounding environment.
これに対し、真空乾燥機では、洗浄液の蒸発及び蒸気の
強制排気という二重の効果を奏するので、理論的には、
上述の遠心式乾燥機における問題点を除去することがで
きる。そのため真空乾燥機は、回路部品などの洗浄に一
部利用されている。On the other hand, a vacuum dryer has the double effect of evaporating the cleaning liquid and forcing steam out, so theoretically,
The problems with the above-mentioned centrifugal dryers can be eliminated. For this reason, vacuum dryers are partially used for cleaning circuit parts and the like.
しかし、従来の真空乾燥機では真空機構に格別な工夫は
為されていないため、ロードロック機構等を採用する必
要があり、設備が大掛かりになってしまい、小形化及び
省スペース化という要請に応えることが出来なかった。However, since conventional vacuum dryers do not have special innovations in the vacuum mechanism, it is necessary to adopt a load lock mechanism, etc., resulting in a large-scale equipment. I couldn't do it.
また、ロードロツク機構を採用しても依然として真空引
きに時間を要してしまう等、生産性に問題があった。Further, even if a load lock mechanism is adopted, it still takes time to vacuum, which causes problems in productivity.
本発明は、上記した従来技術の問題点に鑑みて提案され
たもので、短時間に清浄な洗浄・乾燥を行うウェハ洗浄
装置の提供を目的としている。The present invention was proposed in view of the problems of the prior art described above, and an object of the present invention is to provide a wafer cleaning apparatus that performs clean cleaning and drying in a short time.
[課題を解決するための手段]
本発明のウェハ洗浄装置は、ジェット噴流によリウェハ
表面の洗浄を行うウォータジェット洗浄機と、一方が上
下動するウェハ支持台とカバーとを含み且ついずれか一
方に真空室が画成されている真空乾燥機と、該真空乾燥
機に前記ウォータジェット洗浄機で洗浄されたウェハを
自動的に搬送するウェハ搬送機とを備えている。[Means for Solving the Problems] A wafer cleaning apparatus of the present invention includes a water jet cleaning machine that cleans the surface of a rewafer with a jet stream, a wafer support stand and a cover, one of which moves up and down, and one of which moves up and down. The vacuum dryer has a vacuum chamber defined therein, and a wafer transfer machine that automatically transfers the wafer cleaned by the water jet cleaning machine to the vacuum dryer.
上記ウォータジェット洗浄機及び洗浄用ウェハ支持台と
真空乾燥機とは、クリーンルームで構成され、開閉自在
に仕切壁で画成された洗浄室と乾燥室にそれぞれ配設し
、更に、洗浄室に隣接1,て洗浄室と同様な準備室を設
け、準備室と乾燥室とに、それぞれリフトで上下動され
るウェハカセットを配設し、準備室のウェハカセットと
洗浄用ウェハ支持台との間を自動的に往復動ずる第1の
ウェハ搬送機と、洗浄用ウェハ支持台と真空乾燥機及び
乾燥室のウェハカセットとの間を自動的に巡回往復動ず
る第2のウェハ搬送機とを設けるのが好ましい。The above-mentioned water jet cleaning machine, wafer support stand for cleaning, and vacuum dryer are configured in a clean room, and are respectively installed in a cleaning room and a drying room that are separated by a partition wall that can be opened and closed, and are adjacent to the cleaning room. 1. A preparation room similar to the cleaning room is provided, and a wafer cassette that is moved up and down by a lift is installed in each of the preparation room and the drying room. A first wafer transport machine that automatically reciprocates and a second wafer transport machine that automatically reciprocates between a wafer support for cleaning and a wafer cassette in a vacuum dryer and a drying chamber are provided. is preferred.
また、前記真空乾燥機は、ウェハ支持台とカバーのいず
れか一方に画成されている真空室が真空源或いは大気へ
選択的に接続されるように構成されるのが好ましい。Preferably, the vacuum dryer is configured such that a vacuum chamber defined in either the wafer support stand or the cover is selectively connected to a vacuum source or the atmosphere.
[作用]
上記のように構成された本発明のウェハ洗浄装置によれ
ば、先ず第1のウェハ搬送機により準備室のウェハカセ
ットからウェハを取り出し、洗浄用ウェハ支持台に自動
的にセットする。次いで、ウォータジェット洗浄機の純
水などのジェット噴流でウェハ表面を洗浄する。そして
、第2のウ工ハ搬送機でウェハ支持台から洗浄済みのウ
ェハを取り出し、真空乾燥機のウ゛エハ支持台に自動的
にセットする。次いで、上下動自在な例えばウェハ支持
台を上昇してカバーに密着し、切換弁を作動している真
空ポンプに接続し、真空室を急速に真空化し、ウェハに
付着している洗浄液を急速に蒸発し、その上記を強制排
気し、ウェハ表面を短時間で乾燥する。[Operation] According to the wafer cleaning apparatus of the present invention configured as described above, first, a wafer is taken out from a wafer cassette in the preparation room by the first wafer transfer machine and automatically set on a wafer support for cleaning. Next, the wafer surface is cleaned with a jet stream of pure water or the like from a water jet cleaning machine. Then, the cleaned wafer is taken out from the wafer support by the second wafer transfer machine and automatically set on the wafer support of the vacuum dryer. Next, a vertically movable wafer support table, for example, is raised and brought into close contact with the cover, and the switching valve is connected to an operating vacuum pump to rapidly evacuate the vacuum chamber and quickly remove the cleaning liquid adhering to the wafer. The wafer surface is dried in a short time by evaporating and forcibly evacuating the above.
その後、切換弁を乾燥室大気側に切換えて支持台を下降
し、第2の搬送機でウェハを取り出し、乾燥室内のウェ
ハカセットに自動的に搬送して収納する。Thereafter, the switching valve is switched to the atmospheric side of the drying chamber, the support base is lowered, the wafer is taken out by the second conveyor, and the wafer is automatically conveyed and stored in a wafer cassette in the drying chamber.
[実施例] 以下図面を参照して本発明の実施例を説明する。[Example] Embodiments of the present invention will be described below with reference to the drawings.
第1図において、全体を符号1で示すウェハ洗浄装置に
は、公知技術によるクリーンルームで構成された準備室
A1洗浄室B及び乾燥室Cが隔壁2、3により画成され
、これら隔壁2、3に形或された開口部2a,3aは、
昇降自在な仕切壁4、5により開閉されるようになって
いる。In FIG. 1, the wafer cleaning apparatus, which is designated as a whole by reference numeral 1, includes a preparation room A, a cleaning room B, and a drying room C, which are configured as clean rooms according to known technology, and are defined by partition walls 2 and 3. The openings 2a and 3a are shaped like
It is opened and closed by partition walls 4 and 5 that can be raised and lowered.
準備室A1乾燥室Cの一方の壁側には、図示(,ないリ
フトにより上下動されるウェハDを収納したウェハカセ
ット6、7がそれぞれ設けられている。On one wall of the preparation chamber A1 and the drying chamber C, there are provided wafer cassettes 6 and 7, each housing a wafer D that is moved up and down by a lift (not shown).
洗浄室Bの中央部には、洗浄用ウェハ支持台8が設けら
れ、一方の壁側には、既存のウォータジェット洗浄機9
が設けられている。A cleaning wafer support 8 is provided in the center of the cleaning chamber B, and an existing water jet cleaning machine 9 is installed on one wall.
is provided.
乾燥室Cの仕切壁5に対向する壁側には、真空乾燥機1
0が設けられている。その乾燥機10には、図示しない
昇降自在なウェハ支持台と、この支持台に対向するカバ
ー11とにより支持台が上昇しカバー1.1に密着して
画成される小容積の真空室12が設けられ、その真空室
12は排気バイプ13により切換弁14を介して真空ポ
ンプ15又は室内大気側に選択的に接続されるようにな
っている。A vacuum dryer 1 is installed on the wall opposite to the partition wall 5 of the drying chamber C.
0 is set. The dryer 10 includes a wafer support stand (not shown) that can be raised and lowered, and a cover 11 facing the support stand. The vacuum chamber 12 is selectively connected to a vacuum pump 15 or to the indoor atmosphere via an exhaust pipe 13 and a switching valve 14.
そして、ウェハカセット6とウェハ支持台8との間には
、両者6、8間を鎖線Eで示すように往復動ずる第1の
ウェハ搬送機16が設けられ、ウェハ支持台8と真空乾
燥機10及びウェハヵセット7との間には、二者8、1
、0、7間を鎖線Fで示すように自動的に巡回往復動す
る第2のウエ/\搬送機17が設けられている。A first wafer transfer device 16 is provided between the wafer cassette 6 and the wafer support 8, and the first wafer transfer device 16 reciprocates between the wafer cassette 6 and the wafer support 8 as shown by a chain line E. 10 and the wafer cassette 7, there are two
, 0, and 7, as shown by a chain line F, is provided with a second wafer/\\conveying machine 17 that automatically reciprocates in a circular motion between 0 and 7.
洗浄に際し、リフ1・により準備室Aの定位置にヒッl
・されたウェハカセット6から第1の搬送機16で自動
的に}シェハ1)を取り出し、仕切壁4を開いτ洗浄室
)1に搬送(、、該リ工I\をl′7:Lノへ芝持台8
上ニセット16 (r′7 .ハD 1 ),次いで、
ウォ、−9ジェット洗浄機9を作動し、純水等のジ五ソ
1・噴流Jでウくハ1) 1の表面を洗浄する.,次い
で、仕切壁5を1川き、第2の搬送.機17に上リウ1
ハD1を自動的に取り出(9て乾燥室C(ご搬送し、真
空乾燥機1,00カー・ハ支持台{二に該ウエノ1をセ
・・)1・する(ウェハI)2)。次いで、該支持台を
上uiuLでカバ−11−に密着させ、切換弁13を作
動し,でいる真空ボンブl4に接続する5,、:れによ
り真空室12を急激に真空化し、ウエ’\1)2に付着
L=−(いる洗浄液を急速に蒸発させ、その蒸気を強制
的に排気し、ウェハD2を短時間で乾燥する。When cleaning, hit the fixed position in the preparation room A with Riff 1.
・The first transfer machine 16 automatically takes out the }Shefer 1) from the processed wafer cassette 6, opens the partition wall 4, and transports it to the τ cleaning chamber) 1 (..., the rework I\) Nohe grass holding stand 8
Upper first set 16 (r′7.HaD 1 ), then
1) Activate the jet cleaning machine 9 and wash the surface of 1) with a jet of water such as pure water. , then the partition wall 5 is passed one river, and the second conveyance is carried out. Kamiriu 1 on machine 17
Automatically take out the wafer D1 (transport it to the drying chamber C (wafer I) and transfer it to the vacuum dryer 1,00 car and the support stand {second, then set the wafer 1) (wafer I) 2) . Next, the support base is brought into close contact with the cover 11- by the upper uiuL, the switching valve 13 is operated, and the vacuum bomb 14 is connected to the vacuum bomb 14. 1) Rapidly evaporate the cleaning liquid L=-(attached to the wafer D2, forcefully exhaust the vapor, and dry the wafer D2 in a short time.
次いで、切換弁14を室内大気側に切換え、ウ工ハ支持
台を下降し、第2のウェハ搬送機17でr1動的にウェ
ハD2を取り出してウェハカセット7に搬送し、該ウェ
ハをウェハカセッ1・7に収納する(ウェハD3)。以
下同様の手順を繰り返し、ウェハD(Di、D2、D3
)の洗浄、乾燥を行い、ウェハカセット6が空になり、
ウ,rハカセ・・ノト7が一杯になったら、それぞれリ
フトを作動して交換を行う。したがって、バ′+.,.
−・ムブレーク時極めて清浄なガス空気を用いることも
できる。Next, the switching valve 14 is switched to the indoor atmosphere side, the wafer support is lowered, and the second wafer transfer device 17 dynamically takes out the wafer D2 and transfers it to the wafer cassette 7. - Store in wafer 7 (wafer D3). Thereafter, the same procedure is repeated and wafers D (Di, D2, D3
) are cleaned and dried, and the wafer cassette 6 becomes empty.
C, r Hakase... When Noto 7 is full, operate the lift and replace them. Therefore, B′+. 、.
- Extremely clean gas air can also be used during the break.
なお、図示の実施例ではウェハ支持台が上下動可能に構
成されているが、カバーを上下動可能に構威しても良い
。In the illustrated embodiment, the wafer support is configured to be movable up and down, but the cover may be configured to be movable up and down.
[発明の効果]
本発明は、以上説明したように構成されているので、ク
リーンな環境で洗浄液を飛散5\せることなく急速に蒸
発1,て蒸気を強制排気し、つエハ表面を清浄に短時間
で洗浄、乾燥することができろ。[Effects of the Invention] Since the present invention is configured as described above, the cleaning liquid can be rapidly evaporated in a clean environment without scattering, and the steam can be forcibly exhausted to clean the surface of the wafer. It can be washed and dried in a short time.
また、洗浄装置が大掛かりになることもなく、小形化及
び軽景化の要請にも応えることができる。Furthermore, the cleaning device does not need to be large-scale, and can meet the demands for smaller size and lighter weight.
第1図は本発明の一実施例を示す平面図、第2図は従来
の洗浄装置の1例を示す平面図である。
A・・・準備室 B・・・洗浄室 C・・―乾燥室
1)、D1、D2、D3壽・・ウェハ〕・・φンエ
ッ1・噴流 9◆滲・ウォータジェット洗浄機 】
0・・・真空乾燥機 11・・・カバー 12・・
・真空室 l4・・・切換弁 15・・・真空ボン
ブ 16・・・第lのウェハ搬送機 17・・・第
2のウェハ搬送機
32
第2図
36FIG. 1 is a plan view showing an embodiment of the present invention, and FIG. 2 is a plan view showing an example of a conventional cleaning device. A...Preparation room B...Cleaning room C...Drying room 1), D1, D2, D3...Wafer]...φ1 Jet 9◆Water jet cleaning machine]
0...Vacuum dryer 11...Cover 12...
・Vacuum chamber 14...Switching valve 15...Vacuum bomb 16...1th wafer carrier 17...2nd wafer carrier 32 Fig. 2 36
Claims (1)
ェット洗浄機と、一方が上下動するウェハ支持台とカバ
ーとを含み且ついずれか一方に真空室が画成されている
真空乾燥機と、該真空乾燥機に前記ウォータジェット洗
浄機で洗浄されたウェハを自動的に搬送するウェハ搬送
機とを備えたことを特徴とするウェハ洗浄装置。A water jet cleaning machine that cleans the surface of a wafer with a jet stream, a vacuum dryer that includes a wafer support stand and a cover, one of which moves up and down, and a vacuum chamber defined on either side, and the vacuum dryer. 1. A wafer cleaning apparatus comprising: a wafer conveying machine that automatically conveys a wafer cleaned by the water jet cleaning machine;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19261889A JPH0358417A (en) | 1989-07-27 | 1989-07-27 | Wafer washing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19261889A JPH0358417A (en) | 1989-07-27 | 1989-07-27 | Wafer washing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0358417A true JPH0358417A (en) | 1991-03-13 |
Family
ID=16294257
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19261889A Pending JPH0358417A (en) | 1989-07-27 | 1989-07-27 | Wafer washing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0358417A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006337169A (en) * | 2005-06-01 | 2006-12-14 | Taiheiyo Cement Corp | Corrosion sensor, sheath tube, sheath tube jointing member, and corrosion sensor unit |
JP2007163324A (en) * | 2005-12-14 | 2007-06-28 | Taiheiyo Cement Corp | Corrosion detecting member and corrosion sensor |
US7282098B2 (en) * | 2002-03-15 | 2007-10-16 | Seiko Epson Corporation | Processing-subject cleaning method and apparatus, and device manufacturing method and device |
-
1989
- 1989-07-27 JP JP19261889A patent/JPH0358417A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7282098B2 (en) * | 2002-03-15 | 2007-10-16 | Seiko Epson Corporation | Processing-subject cleaning method and apparatus, and device manufacturing method and device |
US7695570B2 (en) | 2002-03-15 | 2010-04-13 | Seiko Epson Corporation | Processing-subject cleaning method and apparatus, and device manufacturing method and device |
JP2006337169A (en) * | 2005-06-01 | 2006-12-14 | Taiheiyo Cement Corp | Corrosion sensor, sheath tube, sheath tube jointing member, and corrosion sensor unit |
JP2007163324A (en) * | 2005-12-14 | 2007-06-28 | Taiheiyo Cement Corp | Corrosion detecting member and corrosion sensor |
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