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JPH0961319A - Suction type sample base - Google Patents

Suction type sample base

Info

Publication number
JPH0961319A
JPH0961319A JP7220096A JP22009695A JPH0961319A JP H0961319 A JPH0961319 A JP H0961319A JP 7220096 A JP7220096 A JP 7220096A JP 22009695 A JP22009695 A JP 22009695A JP H0961319 A JPH0961319 A JP H0961319A
Authority
JP
Japan
Prior art keywords
sample
suction
mesh
support
suction type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7220096A
Other languages
Japanese (ja)
Inventor
Kasumi Yokota
佳澄 横田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP7220096A priority Critical patent/JPH0961319A/en
Publication of JPH0961319A publication Critical patent/JPH0961319A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PROBLEM TO BE SOLVED: To flatly support a thin sample on a sample base used when measuring optical characteristics of a thin sample such as paper or a fabric. SOLUTION: An opening section 18 formed with a sample base frame 11 is covered with a meshy support body 12, support members supporting the support body 12 are arranged in the opening section 18, and the opening section 18 is sucked via a suction port 14 provided on the sample base frame 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、紙や布など平面
状で薄い試料表面の光学特性を測定する装置、あるいは
薄層クロマトグラフィの薄層プレートや電気泳動ゲルな
どの試料プレート上で分離された試料スポットを光学的
に定量するデンシトメータ等で使用される試料台に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for measuring the optical characteristics of a flat and thin sample surface such as paper or cloth, or a thin plate for thin layer chromatography or a sample plate such as an electrophoresis gel. The present invention relates to a sample stand used in a densitometer or the like for optically quantifying a sample spot.

【0002】[0002]

【従来の技術】上記のような薄い試料、特に紙や布など
の表面を測定するには、試料を平坦な状態で保持する必
要があり、そのためクランプ機構等のように試料の周囲
を試料台に固定する方法や、試料そのものを試料台に接
着する方法、さらには試料の表面をガラスのような透明
な板で押さえつける等の方法が一般的に採られている。
しかし、上記のクランプ機構での固定方法では、大面積
の試料の固定が難しく試料の中央部分の平坦性の維持も
困難であり、試料を試料台に接着する方法では目の粗い
布などの試料の場合、固定している接着剤も一緒に測定
してしまう場合があるとともに一番の難点は接着剤が試
料に付着して試料自体がだめになってしまったり、また
測定できたとしても準破壊測定になってしまう可能性が
あった。最後にガラス板のような透明なもので押さえつ
ける方法にあっては試料表面を直接に観測できないう
え、ガラス板による反射や、透過光学特性のため測定に
悪影響を与え、またこの従来の方法にあっては、試料を
ガラスの大きさに切断したり、ガラス板に張りつける等
の加工の必要も発生していた。
2. Description of the Related Art In order to measure the surface of thin samples such as those mentioned above, especially paper and cloth, it is necessary to hold the sample in a flat state. Generally, a method of fixing the sample to the sample table, a method of adhering the sample itself to the sample table, and a method of pressing the surface of the sample with a transparent plate such as glass are generally adopted.
However, it is difficult to fix a large area of the sample by the above-mentioned clamp mechanism, and it is difficult to maintain the flatness of the central part of the sample. In this case, the fixed adhesive may be measured together, and the biggest difficulty is that the adhesive adheres to the sample and the sample itself is damaged, or even if it can be measured There was a possibility that it would be a destructive measurement. Finally, in the method of pressing with a transparent material such as a glass plate, the surface of the sample cannot be directly observed, and the reflection and transmission optical characteristics of the glass plate adversely affect the measurement. In some cases, it was necessary to cut the sample into the size of glass or to attach it to a glass plate.

【0003】[0003]

【発明が解決しようとする課題】この発明は、従来の技
術がもっている大面積の試料の固定が難しく、中央部分
の平坦性の保持が困難なこと、また接着せねばならない
場合があること、透明なガラス板を使用した場合のよう
に直接観測が不可能であること、のごとき欠点のない試
料台を提供せんとするものである。
SUMMARY OF THE INVENTION According to the present invention, it is difficult to fix a large-area sample, which is required by the conventional technique, it is difficult to maintain the flatness of the central portion, and sometimes it is necessary to bond the sample. The objective is to provide a sample stand that does not have defects such as direct observation that is impossible when using a transparent glass plate.

【0004】[0004]

【課題を解決するための手段】そのためにこの発明は、
吸引方式を採用し、平坦に維持されたメッシュ状支持体
に試料を吸引支持させるようにしたものである。
To this end, the present invention provides
The suction method is adopted, and the sample is suction-supported on the mesh-shaped support body which is maintained flat.

【0005】[0005]

【発明の実施の形態】この発明は試料台枠で形成される
開口部を、試料を載置するメッシュ状支持体で被い、こ
の開口部内にメッシュ支持体の撓みを支える支持部材を
配置し、かつ試料台枠に設けた吸引口を介して、試料を
メッシュ状支持体に吸着又は、吸引保持しようとするも
のである。
BEST MODE FOR CARRYING OUT THE INVENTION According to the present invention, an opening formed by a sample underframe is covered with a mesh-shaped support on which a sample is placed, and a support member for supporting the bending of the mesh support is arranged in the opening. In addition, the sample is to be adsorbed on or held by the mesh-shaped support through the suction port provided in the sample frame.

【0006】[0006]

【実施例】図1は、この発明の吸引式試料台を含む試料
ステージの概略を説明するもので1は吸引式試料台で、
11はこの試料台の骨格を形成する試料台枠、12はこ
の試料台枠の開口部をカバーするメッシュ状支持体(例
えば金網)、13は試料台の開口部と吸引ポンプ(図示
せず)と間を接続する吸引パイプで、試料台枠に設けら
れた吸引口に接続されており、これらで試料台1が構成
されている。一方2は、この吸引式試料台1をセットす
る試料ステージで、上記吸引式試料台1は、この試料ス
テージ2のステージ台21上に適宜な機構を介してセッ
トされる。なお、22はステージ台21の両端に設けら
れたクリップで、このクリップ22は平坦な試料、例え
ば紙、布等の試料が吸引式試料台1より大きい場合、こ
の試料を吸引式試料台1を被った状態で、このステージ
に固定するために利用されるものである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic view of a sample stage including a suction type sample table according to the present invention.
Reference numeral 11 is a sample underframe that forms the skeleton of the sample table, 12 is a mesh-like support (for example, a wire mesh) that covers the opening of the sample underframe, and 13 is the sample table opening and a suction pump (not shown). The sample pipe 1 is connected to the suction port provided in the sample frame by a suction pipe that connects the sample frame 1 and the sample pipe 1. On the other hand, 2 is a sample stage on which the suction type sample table 1 is set, and the suction type sample table 1 is set on the stage table 21 of the sample stage 2 via an appropriate mechanism. Reference numeral 22 is a clip provided at each end of the stage table 21. When a flat sample, for example, a sample such as paper or cloth, is larger than the suction type sample table 1, this clip 22 is attached to the suction type sample table 1. It is used for fixing to this stage in the covered state.

【0007】図2は、上記に説明した吸引式試料台の詳
細を説明するもので、図1と同一符号は、図1と同一の
ものを示す。
FIG. 2 illustrates the details of the suction type sample table described above, and the same reference numerals as those in FIG. 1 denote the same parts as those in FIG.

【0008】この図において、メッシュ状支持体12、
例えば金網等でそのメッシュの大きさは適宜なものでよ
いが、あまり大きすぎるとこの上に載置された試料が平
面にならず、全体として凹凸面が生じるので注意を要す
る。
In this figure, the mesh-like support 12,
For example, a wire mesh or the like may have an appropriate size, but if it is too large, the sample placed on it will not be a flat surface, and an uneven surface will be generated as a whole, so care must be taken.

【0009】このメッシュ状支持体12は試料台枠11
で形成される升状の箱の開口部18を被い適当な手段で
固定される。14は、この試料台枠11に設けられた吸
引口で吸引パイプ13が接続され、升状箱内部(開口
部)18が吸引され、結果的に布、紙等の試料は吸引ポ
ンプの働きによって、メッシュ状支持体に吸引され、吸
着されて平面が維持される。
The mesh-like support 12 is a sample underframe 11
The cover 18 is covered with the opening 18 of the box-shaped box and fixed by a suitable means. Reference numeral 14 is a suction port provided on the sample underframe 11 to which a suction pipe 13 is connected, and the inside (opening) 18 of the box is sucked, and as a result, a sample such as cloth or paper is operated by a suction pump. , The mesh-like support is sucked and adsorbed, and the flat surface is maintained.

【0010】つぎに図3(1)(2)(3)は、この吸
引式試料台1の開口部18に設置されるメッシュ状支持
体12の撓みを支えるためのいろいろの形状の支持部材
を示すもので、図3(1)(3)のごとく矩形状の枠の
複数個を長方形状に、あるいは交互に接合したもの、あ
るいは図3(2)のように六角形状の枠体をハニカム形
状に接合したものであるが、この図から明らかなように
矩形状の枠16には全て孔17が開孔している。
Next, FIGS. 3 (1), 2 (3) and 3 (3) show support members of various shapes for supporting the bending of the mesh-shaped support 12 installed in the opening 18 of the suction type sample table 1. 3 (1) (3), a plurality of rectangular frames are joined in a rectangular shape or alternately, or a hexagonal frame is formed in a honeycomb shape as shown in FIG. 3 (2). However, as is clear from this figure, the rectangular frame 16 has all holes 17 formed therein.

【0011】これらの支持部材は試料台1の開口部18
内にセットされ、ついでメッシュ状支持体12がこの開
口部18を被うように張りわたされ固定される。このと
き支持部材の存在によってメッシュ状支持体12の撓み
は防止される。
These supporting members are provided in the opening 18 of the sample table 1.
Then, the mesh-shaped support 12 is stretched and fixed so as to cover the opening 18. At this time, the presence of the support member prevents the mesh-shaped support 12 from bending.

【0012】ついでこのメッシュ状支持体12上に紙、
布等の薄い試料が載置されても試料台1の開口部18が
吸引パイプ13を介して吸引されているので、試料はメ
ッシュ状支持体に吸着されて平坦に維持される。一方、
このメッシュ状支持体12は下方において支持部材15
で支持されているのでメッシュ状支持体12は撓わむこ
とはなく、結果として試料は平坦に保持される。
Then, paper is placed on the mesh-shaped support 12,
Even when a thin sample such as cloth is placed, the opening 18 of the sample table 1 is sucked through the suction pipe 13, so that the sample is adsorbed by the mesh-shaped support and kept flat. on the other hand,
This mesh-like support 12 is provided with a support member 15 at the bottom.
Since the mesh-shaped support 12 is not bent, the sample is held flat as a result.

【0013】また、このとき支持部材の各枠16の孔1
7によって吸引パイプでの吸引力は試料台1の開口部1
8の全域に作用し、試料は開口部全域で同じように吸引
されメッシュ状支持体の表面に沿って吸引され、つまり
吸着され位置決めがなされるのである。
At this time, the holes 1 of each frame 16 of the support member
The suction force of the suction pipe by 7 is the opening 1 of the sample table 1.
8 acts on the entire area of the sample 8, and the sample is similarly aspirated over the entire area of the opening and aspirated along the surface of the mesh-shaped support, that is, adsorbed and positioned.

【0014】なお、試料自体が大きい場合は試料台より
はみ出した部分(端部)は、図1のように試料ステージ
のクリップで固定される。
When the sample itself is large, the part (edge) protruding from the sample table is fixed by the clip of the sample stage as shown in FIG.

【0015】図4はこの吸引式試料台の使用態様を説明
するもので、例えばクロマトスキャナに使用した状況を
説明する。
FIG. 4 illustrates the usage of this suction type sample table, for example, the situation when it is used in a chromatographic scanner.

【0016】図において22、23は光源で、広い測定
波長域をカバーするために2種類の光源が用意されてい
る。(例えば光源22はキセノンランプ又はタングステ
ンランプ、光源23は重水素ランプ) 24は光源選択用の球面鏡であり、光源22又は23か
らの光束を分光器25に入射させる。29は分光器25
の出口スリットであり、分光された光束が出射する。こ
の分光器の出口スリット29上には、スリット円板30
が設置されており、例えば中心からの距離の増分が回転
角に比例するようなスリット31が形成されている。
In the figure, reference numerals 22 and 23 denote light sources, and two types of light sources are prepared to cover a wide measurement wavelength range. (For example, the light source 22 is a xenon lamp or a tungsten lamp, the light source 23 is a deuterium lamp) 24 is a spherical mirror for selecting a light source, and makes the light flux from the light source 22 or 23 enter the spectroscope 25. 29 is a spectroscope 25
Is an exit slit, and the dispersed light flux is emitted. On the exit slit 29 of this spectroscope, a slit disc 30
Is installed, for example, a slit 31 is formed such that the increment of the distance from the center is proportional to the rotation angle.

【0017】このスリット円板30の中心はパルスモー
タ32の回転軸に固定されて直軸駆動される。
The center of the slit disk 30 is fixed to the rotating shaft of the pulse motor 32 and driven straight.

【0018】この場合、図5に示すように出口スリット
29の長手方向がスリット円板30の半径方向になるよ
うにスリット円板が位置決めされている。
In this case, as shown in FIG. 5, the slit disk is positioned so that the longitudinal direction of the exit slit 29 is the radial direction of the slit disk 30.

【0019】つぎに32は球面鏡、33は平面鏡であ
り、出口スリット29とスリット31の交差位置の孔を
通過した測定光束34を反射させて試料ステージ35上
の吸引式試料台1上の試料S上を照射する。
Next, 32 is a spherical mirror and 33 is a plane mirror, which reflects the measurement light beam 34 passing through the hole at the intersection of the exit slit 29 and the slit 31 to reflect the sample S on the sample stage 35 on the suction-type sample table 1. Irradiate the top.

【0020】この試料ステージ35はX、Y方向に移動
し、X方向に対してはパルスモータ36によってベルト
37を介して駆動され、Y方向に対してはパルスモータ
38によってベルト39を駆動して移動させる。
The sample stage 35 moves in the X and Y directions, is driven by a pulse motor 36 via a belt 37 in the X direction, and drives a belt 39 by a pulse motor 38 in the Y direction. To move.

【0021】なお、Y方向移動用のパルスモータ38は
光束照射点の変更時に使用され、X方向移動用のパルス
モータ36は、試料S上での走査レーンの変更時に使用
される。
The pulse motor 38 for moving in the Y direction is used when changing the irradiation point of the light beam, and the pulse motor 36 for moving in the X direction is used when changing the scanning lane on the sample S.

【0022】測定光束34が試料Sに入射し、この試料
からの反射光は反射測定用光電子像倍管40で測定され
る。
The measuring light beam 34 is incident on the sample S, and the reflected light from this sample is measured by the reflection measuring photomultiplier tube 40.

【0023】これらの測定方式の詳細な説明は省略する
が、試料S上をスリット円板の回転により光束がジグザ
グに走査し、かつ試料S自体がX、Y方向に移動させら
れるので、試料全面を光束で走査でき、例えば試料の光
学特性を検知することができるのである。
Although detailed description of these measuring methods is omitted, since the light beam scans the sample S in a zigzag manner by the rotation of the slit disk and the sample S itself is moved in the X and Y directions, Can be scanned with a light beam, and for example, the optical characteristics of the sample can be detected.

【0024】この場合においても、試料Sは吸引式試料
台1上に吸引パイプ13を介して吸着されているので
X、Y方向への移動においても試料台から脱落すること
はなく、かつ試料面は、支持部材によってメッシュ状支
持体が撓わむことなく保持されているので、平坦になり
精度高く測定することができる。
In this case as well, since the sample S is adsorbed on the suction type sample table 1 through the suction pipe 13, it does not fall off from the sample table even when it is moved in the X and Y directions, and the sample surface Since the mesh-shaped support is held by the support member without being bent, it becomes flat and can be measured with high accuracy.

【0025】以上の説明においては、吸引式試料台を試
料ステージ上に載置するようにして使用されるように説
明したが、測定装置によっては、吸引式試料台のみを単
独で使用することは可能である。
In the above description, the suction type sample table is used by mounting it on the sample stage. However, depending on the measuring device, the suction type sample table alone may not be used. It is possible.

【0026】また開口部内に配置される支持部材として
枠体を組み合わせたハニカム形状のものなどを説明した
が、これに限らず複数本の柱状のものなどいろいろの形
状のものが利用できることは明らかである。
Further, although the honeycomb shape in which the frame members are combined is explained as the supporting member arranged in the opening, it is not limited to this, and it is obvious that various shapes such as a plurality of columnar shapes can be used. is there.

【0027】[0027]

【発明の効果】以上に説明した試料台を利用することに
より紙、布などの薄い試料を平面に支持することがで
き、2次元的な測光、測色を理想的な状況で実施するこ
とができるとともに各種の光学測定機器を簡単に組み合
わせて使用することもでき、簡便ではあるが、試料を正
確に支持する試料台としてもその利用価値は高いもので
ある。
By using the sample table described above, a thin sample such as paper or cloth can be supported on a flat surface, and two-dimensional photometry and color measurement can be performed under ideal conditions. It is possible and easy to use by combining various optical measuring instruments, which is convenient, but it is also highly useful as a sample stand for accurately supporting a sample.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の吸引式試料台を試料ステージに載置
した状況を説明する図。
FIG. 1 is a diagram illustrating a situation in which a suction-type sample table of the present invention is placed on a sample stage.

【図2】この発明の吸引式試料台の構造(構成)を説明
する図。
FIG. 2 is a view for explaining the structure (configuration) of the suction type sample table of the present invention.

【図3】この発明の吸引式試料台の開口部内に配置され
る支持部材の形状を説明する図。
FIG. 3 is a diagram illustrating the shape of a support member arranged in the opening of the suction-type sample table of the present invention.

【図4】この発明の吸引式試料台の利用状況を説明する
図。
FIG. 4 is a diagram for explaining the usage of the suction type sample table of the present invention.

【図5】第4図におけるスリット、スリット円板等の位
置関係を説明する図。
5 is a diagram for explaining the positional relationship of slits, slit discs, etc. in FIG.

【符号の説明】[Explanation of symbols]

1…吸引式試料台 11…試料台枠 12…メッシュ状支持体 13…吸引パイプ 14…吸引口 15…支持部材 18…開口部 DESCRIPTION OF SYMBOLS 1 ... Suction-type sample stand 11 ... Sample stand frame 12 ... Mesh support 13 ... Suction pipe 14 ... Suction port 15 ... Support member 18 ... Opening part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 試料台枠と、この試料台枠の開口部を被
い、かつその上に試料を載置し得るメッシュ状支持体
と、試料台枠で形成される開口部内に配置され上記メッ
シュ状支持体の撓みを支える支持部材と、この試料台枠
に設けられた吸引口とを有する吸引式試料台。
1. A sample underframe, a mesh-like support that covers the opening of the sample underframe, and on which a sample can be placed, and the sample underframe that is arranged in the opening defined by the sample underframe. A suction-type sample table having a support member for supporting the bending of the mesh-shaped support and a suction port provided in the sample frame.
JP7220096A 1995-08-29 1995-08-29 Suction type sample base Pending JPH0961319A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7220096A JPH0961319A (en) 1995-08-29 1995-08-29 Suction type sample base

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7220096A JPH0961319A (en) 1995-08-29 1995-08-29 Suction type sample base

Publications (1)

Publication Number Publication Date
JPH0961319A true JPH0961319A (en) 1997-03-07

Family

ID=16745868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7220096A Pending JPH0961319A (en) 1995-08-29 1995-08-29 Suction type sample base

Country Status (1)

Country Link
JP (1) JPH0961319A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19943443A1 (en) * 1999-09-11 2001-04-12 Inst Mikrotechnik Mainz Gmbh Device and method for the planarization of titer plates in screening and synthesis systems
JP2002039910A (en) * 2000-07-19 2002-02-06 Dainippon Printing Co Ltd Hologram evaluating device
JP2006503309A (en) * 2002-10-16 2006-01-26 ハインズ インスツルメンツ インコーポレイテッド Measurement of birefringence of large format samples
JP2007163181A (en) * 2005-12-09 2007-06-28 Advantest Corp Structure for measurement, measuring instrument, method and program
JP2008116470A (en) * 2007-12-25 2008-05-22 Olympus Corp Substrate-inspecting device
JP2020016645A (en) * 2018-07-12 2020-01-30 住友化学株式会社 Stage, and physical property measurement device and measurement method
JP2023127101A (en) * 2022-03-01 2023-09-13 スガ試験機株式会社 Optical characteristic measuring instrument
JP2023127100A (en) * 2022-03-01 2023-09-13 スガ試験機株式会社 Optical characteristic measuring instrument

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19943443A1 (en) * 1999-09-11 2001-04-12 Inst Mikrotechnik Mainz Gmbh Device and method for the planarization of titer plates in screening and synthesis systems
JP2002039910A (en) * 2000-07-19 2002-02-06 Dainippon Printing Co Ltd Hologram evaluating device
JP2006503309A (en) * 2002-10-16 2006-01-26 ハインズ インスツルメンツ インコーポレイテッド Measurement of birefringence of large format samples
JP4778314B2 (en) * 2002-10-16 2011-09-21 ハインズ インスツルメンツ インコーポレイテッド Measurement of birefringence of large format samples
JP2007163181A (en) * 2005-12-09 2007-06-28 Advantest Corp Structure for measurement, measuring instrument, method and program
JP2008116470A (en) * 2007-12-25 2008-05-22 Olympus Corp Substrate-inspecting device
JP2020016645A (en) * 2018-07-12 2020-01-30 住友化学株式会社 Stage, and physical property measurement device and measurement method
JP2023127101A (en) * 2022-03-01 2023-09-13 スガ試験機株式会社 Optical characteristic measuring instrument
JP2023127100A (en) * 2022-03-01 2023-09-13 スガ試験機株式会社 Optical characteristic measuring instrument

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