JP7497490B2 - 液体循環冷却パッケージ基板及びその製造方法 - Google Patents
液体循環冷却パッケージ基板及びその製造方法 Download PDFInfo
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- JP7497490B2 JP7497490B2 JP2023072072A JP2023072072A JP7497490B2 JP 7497490 B2 JP7497490 B2 JP 7497490B2 JP 2023072072 A JP2023072072 A JP 2023072072A JP 2023072072 A JP2023072072 A JP 2023072072A JP 7497490 B2 JP7497490 B2 JP 7497490B2
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- layer
- heat dissipation
- support frame
- cooling
- pattern
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Classifications
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Description
支持フレームに囲まれた少なくとも1つの貫通キャビティ内に組み込まれた能動面と放熱面とを有するデバイスであって、前記支持フレームは高さ方向に沿って前記支持フレームを穿通する導通ピラーを含むデバイスと、
前記支持フレームの第1面における第1誘電体層及び前記支持フレームの第2面における第2誘電体層であって、第1誘電体層は前記デバイスと前記支持フレームとの間のギャップを完全に充填する第1誘電体層及び第2誘電体層と、
前記第1誘電体層内に形成されて前記放熱面を露出させた冷却キャビティと、前記冷却キャビティの内面に形成された金属放熱層と、前記金属放熱層に形成された直立した支持ピラーと、前記支持ピラーに支持されて前記冷却キャビティの周辺に沿って前記冷却キャビティを密閉する冷却カバーとを含む循環冷却構造であって、前記金属放熱層は前記放熱面と前記冷却キャビティの内側面とを完全に覆い、前記冷却カバーに給液口と排液口とが形成される循環冷却構造と、
前記第1誘電体層に形成された第1配線層及び第2誘電体層に形成された第2配線層であって、前記第2配線層は前記デバイスの能動面における端子に電気的に接続され、前記第1配線層と前記第2配線層とは前記導通ピラーにより電気的に接続される第1配線層及び第2配線層と、を含む。
(a)支持フレームを予め製作し、前記支持フレームは高さ方向に沿って前記支持フレームを穿通する導通ピラーと前記支持フレームに囲まれた少なくとも1つの貫通キャビティとを含むステップと、
(b)前記貫通キャビティに能動面と放熱面とを有するデバイスを取り付け、前記支持フレームの第1面に第1誘電体層を印加し、前記第1誘電体層が前記デバイスと前記支持フレームとの間のギャップを完全に充填するようにするステップと、
(c)前記第1誘電体層に孔を開けて第1パターンを形成し、前記第1パターンはデバイスの放熱面を露出させた冷却キャビティを含み、前記第1パターンを充填して第1配線層と前記放熱面における金属放熱層とを形成し、ここで、前記金属放熱層は前記放熱面と前記冷却キャビティの内側面とを完全に覆うステップと、
(d)前記支持フレームの第2面に第2誘電体層を印加し、前記第2誘電体層に孔を開けて第2パターンを形成し、前記第2パターンは前記デバイスの能動面における端子を露出させ、前記第2パターンを充填して第2回路層を形成し、ここで、前記第1配線層と前記第2配線層は前記導通ピラーにより電気的に接続されるステップと、
(e)前記デバイスの放熱面における前記金属放熱層に支持ピラーを形成し、前記支持ピラーに冷却カバーを印加し、前記冷却カバーは前記冷却キャビティの周辺に沿って前記冷却キャビティを密閉し、ここで、前記冷却カバーに給液口と排液口とが形成されるステップと、を含む。
(b1)前記支持フレームの第2面に一時的なキャリアを印加するステップと、
(b2)前記デバイスを前記貫通キャビティ内に配置し、前記デバイスの能動面が前記一時的なキャリアに付着するようにするステップと、
(b3)前記支持フレームの第1面に前記第1誘電体層を形成するステップと、
(b4)前記一時的なキャリアを取り除くステップと、を含む。
(c1)前記第1誘電体層に第1金属シード層を形成するステップと、
(c2)前記第1金属シード層に第1フォトレジスト層を印加し、露光現像して前記第1パターンを形成するステップと、
(c3)前記第1パターンに前記第1配線層と前記放熱面における金属放熱層とを電気めっきして形成するステップと、
(c4)前記第1フォトレジスト層と前記第1金属シード層とを取り除くステップと、を含む。
(d1)前記第2誘電体層に第2金属シード層を形成するステップと、
(d2)前記第2金属シード層に第2フォトレジスト層を印加し、露光現像して前記第2パターンを形成するステップと、
(d3)前記第2パターンに前記第2配線層を電気めっきして形成するステップと、
(d4)前記第2フォトレジスト層と前記第2金属シード層とを取り除くステップと、を含む。
(e1)前記冷却キャビティ内に誘電体材料を充填して第3誘電体層を形成するステップと、
(e2)前記第3誘電体層に対してレーザによる穴開けを行い、前記金属放熱層を露出させた第3パターンを形成するステップと、
(e3)前記第3パターンを電気めっきして充填して前記支持ピラーを形成するステップと、
(e4)前記第3誘電体層を取り除くステップと、を含む。
(e1')前記冷却キャビティにフォトレジスト材料を充填して第3フォトレジスト層を形成するステップと、
(e2')前記第3フォトレジスト層に対して露光現像を行い、前記金属放熱層を露出させた第3パターンを形成するステップと、
(e3')前記第3パターンを電気めっきして充填して前記支持ピラーを形成するステップと、
(e4')前記第3フォトレジスト層を取り除くステップと、をさらに含む。
(f)ステップ(e)の後、前記第1配線層と前記第2配線層にソルダーレジスト材料をそれぞれ印加し、ソルダーレジスト層を形成するステップをさらに含む。
支持フレーム1に囲まれた少なくとも1つの貫通キャビティ12内に組み込まれた能動面21と放熱面22とを有するデバイス2であって、前記支持フレーム1は高さ方向に沿って前記支持フレーム1を穿通する導通ピラー11を含むデバイス2と、
前記支持フレーム1の第1面における第1誘電体層及び前記支持フレーム1の第2面における第2誘電体層5であって、第1誘電体層は前記デバイス2と前記支持フレーム1との間のギャップを完全に充填する第1誘電体層及び第2誘電体層5と、
前記第1誘電体層内に形成されて前記放熱面22を露出させる冷却キャビティ32と、前記冷却キャビティ32の内面に形成された金属放熱層31と、前記金属放熱層31に形成された直立した支持ピラー33と、前記支持ピラー33に支持されて前記冷却キャビティ32の周辺に沿って前記冷却キャビティ32を密閉する冷却カバー34とを含む循環冷却構造3であって、前記金属放熱層31は前記放熱面22と前記冷却キャビティ32の内側面とを完全に覆い、前記冷却カバー34に給液口341と排液口342とが形成される循環冷却構造3と、
前記第1誘電体層に形成された第1配線層6及び第2誘電体層5に形成された第2配線層7であって、前記第2配線層7は前記デバイス2の能動面21における端子に電気的に接続され、前記第1配線層6と前記第2配線層7とは前記導通ピラー11により電気的に接続される第1配線層6及び第2配線層7と、を含む。
Claims (14)
- 支持フレームに囲まれた少なくとも1つの貫通キャビティ内に組み込まれた能動面と放熱面とを有するデバイスであって、前記支持フレームは高さ方向に沿って前記支持フレームを穿通する導通ピラーを含むデバイスと、
前記支持フレームの第1面における第1誘電体層及び前記支持フレームの第2面における第2誘電体層であって、第1誘電体層は前記デバイスと前記支持フレームとの間のギャップを完全に充填する第1誘電体層及び第2誘電体層と、
前記第1誘電体層内に形成されて前記放熱面を露出させた冷却キャビティと、前記冷却キャビティの内面に形成された金属放熱層と、前記金属放熱層に形成された直立した支持ピラーと、前記支持ピラーに支持されて前記冷却キャビティの周辺に沿って前記冷却キャビティを密閉する冷却カバーとを含む循環冷却構造であって、前記金属放熱層は前記放熱面と前記冷却キャビティの内側面とを完全に覆い、前記冷却カバーに給液口と排液口とが形成される循環冷却構造と、
前記第1誘電体層に形成された第1配線層及び第2誘電体層に形成された第2配線層であって、前記第2配線層は前記デバイスの能動面における端子に電気的に接続され、前記第1配線層と前記第2配線層とは前記導通ピラーにより電気的に接続される第1配線層及び第2配線層と、を含む、
ことを特徴とする液体循環冷却パッケージ基板。 - 前記冷却カバーは半田又は耐腐食性接着剤で前記支持ピラーと前記金属放熱層の外周に接続され、それにより前記冷却キャビティを密閉することを特徴とする請求項1に記載の液体循環冷却パッケージ基板。
- 前記給液口と前記排液口とは前記支持ピラーの両側に設けられることを特徴とする請求項1に記載の液体循環冷却パッケージ基板。
- 前記金属放熱層は銅層を含むことを特徴とする請求項1に記載の液体循環冷却パッケージ基板。
- 前記第1配線層と前記第2配線層の外面に設けられたソルダーレジスト層をさらに含むことを特徴とする請求項1に記載の液体循環冷却パッケージ基板。
- (a)支持フレームを予め製作し、前記支持フレームは高さ方向に沿って前記支持フレームを穿通する導通ピラーと前記支持フレームに囲まれた少なくとも1つの貫通キャビティとを含むステップと、
(b)前記貫通キャビティに能動面と放熱面とを有するデバイスを取り付け、前記支持フレームの第1面に第1誘電体層を印加し、前記第1誘電体層が前記デバイスと前記支持フレームとの間のギャップを完全に充填するようにするステップと、
(c)前記第1誘電体層に孔を開けて第1パターンを形成し、前記第1パターンはデバイスの放熱面を露出させた冷却キャビティを含み、前記第1パターンを充填して第1配線層と前記放熱面における金属放熱層とを形成し、ここで、前記金属放熱層は前記放熱面と前記冷却キャビティの内側面とを完全に覆うステップと、
(d)前記支持フレームの第2面に第2誘電体層を印加し、前記第2誘電体層に孔を開けて第2パターンを形成し、前記第2パターンは前記デバイスの能動面における端子を露出させ、前記第2パターンを充填して第2回路層を形成し、ここで、前記第1配線層と前記第2配線層は前記導通ピラーにより電気的に接続されるステップと、
(e)前記デバイスの放熱面における前記金属放熱層に支持ピラーを形成し、前記支持ピラーに冷却カバーを印加し、前記冷却カバーは前記冷却キャビティの周辺に沿って前記冷却キャビティを密閉し、ここで、前記冷却カバーに給液口と排液口とが形成されるステップと、を含む、
ことを特徴とする液体循環冷却パッケージ基板の製造方法。 - 前記ステップ(b)は、
(b1)前記支持フレームの第2面に一時的なキャリアを印加するステップと、
(b2)前記デバイスを前記貫通キャビティ内に配置し、前記デバイスの能動面が前記一時的なキャリアに付着するようにするステップと、
(b3)前記支持フレームの第1面に前記第1誘電体層を形成するステップと、
(b4)前記一時的なキャリアを取り除くステップと、を含む、
ことを特徴とする請求項6に記載の製造方法。 - 前記ステップ(c)は、
(c1)前記第1誘電体層に第1金属シード層を形成するステップと、
(c2)前記第1金属シード層に第1フォトレジスト層を印加し、露光現像して前記第1パターンを形成するステップと、
(c3)前記第1パターンに前記第1配線層と前記放熱面における金属放熱層とを電気めっきして形成するステップと、
(c4)前記第1フォトレジスト層と前記第1金属シード層とを取り除くステップと、を含む、
ことを特徴とする請求項7に記載の製造方法。 - 前記ステップ(c)において、前記金属放熱層は銅層を含むことを特徴とする請求項6に記載の製造方法。
- 前記ステップ(d)は、
(d1)前記第2誘電体層に第2金属シード層を形成するステップと、
(d2)前記第2金属シード層に第2フォトレジスト層を印加し、露光現像して前記第2パターンを形成するステップと、
(d3)前記第2パターンに前記第2配線層を電気めっきして形成するステップと、
(d4)前記第2フォトレジスト層と前記第2金属シード層とを取り除くステップと、を含む、
ことを特徴とする請求項6に記載の製造方法。 - 前記ステップ(e)は、
(e1)前記冷却キャビティ内に誘電体材料を充填して第3誘電体層を形成するステップと、
(e2)前記第3誘電体層に対してレーザによる穴開けを行い、前記金属放熱層を露出させた第3パターンを形成するステップと、
(e3)前記第3パターンを電気めっきして充填して前記支持ピラーを形成するステップと、
(e4)前記第3誘電体層を取り除くステップと、を含む、
ことを特徴とする請求項6に記載の製造方法。 - 前記ステップ(e)は、
(e1')前記冷却キャビティにフォトレジスト材料を充填して第3フォトレジスト層を形成するステップと、
(e2')前記第3フォトレジスト層に対して露光現像を行い、前記金属放熱層を露出させた第3パターンを形成するステップと、
(e3')前記第3パターンを電気めっきして充填して前記支持ピラーを形成するステップと、
(e4')前記第3フォトレジスト層を取り除くステップと、をさらに含む、
ことを特徴とする請求項6に記載の製造方法。 - 前記ステップ(e)において、前記冷却カバーは半田又は耐腐食性接着剤で前記支持ピラーと前記金属放熱層の外周に接続され、それにより前記冷却キャビティを密閉することを特徴とする請求項6に記載の製造方法。
- (f)ステップ(e)の後、前記第1配線層と前記第2配線層にソルダーレジスト材料をそれぞれ印加し、ソルダーレジスト層を形成するステップをさらに含む、
ことを特徴とする請求項6に記載の製造方法。
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005243824A (ja) | 2004-02-25 | 2005-09-08 | Ngk Spark Plug Co Ltd | 冷却装置付き配線基板及びその製造方法、並びにそれを用いた部品実装済み冷却装置付き配線基板 |
JP2007266418A (ja) | 2006-03-29 | 2007-10-11 | Sanyo Electric Co Ltd | 半導体装置およびその製造方法 |
US20120043127A1 (en) | 2010-08-20 | 2012-02-23 | Nan Ya Pcb Corp. | Printed circuit board and method for fabricating the same |
US9883579B1 (en) | 2016-10-07 | 2018-01-30 | Unimicron Technology Corp. | Package structure and manufacturing method thereof |
WO2019107400A1 (ja) | 2017-11-28 | 2019-06-06 | 京セラ株式会社 | 電子素子実装用基板、電子装置および電子モジュール |
US20200098668A1 (en) | 2018-09-25 | 2020-03-26 | Intel Corporation | Thermal management solutions for embedded integrated circuit devices |
JP2021027348A (ja) | 2019-08-08 | 2021-02-22 | 住友ベークライト株式会社 | 半導体装置 |
CN113675158A (zh) | 2021-07-06 | 2021-11-19 | 珠海越亚半导体股份有限公司 | 循环冷却嵌埋封装基板及其制作方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US11282825B2 (en) * | 2020-05-19 | 2022-03-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structure |
CN111463178B (zh) * | 2020-06-22 | 2020-10-09 | 珠海越亚半导体股份有限公司 | 一种散热嵌埋封装方法 |
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Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005243824A (ja) | 2004-02-25 | 2005-09-08 | Ngk Spark Plug Co Ltd | 冷却装置付き配線基板及びその製造方法、並びにそれを用いた部品実装済み冷却装置付き配線基板 |
JP2007266418A (ja) | 2006-03-29 | 2007-10-11 | Sanyo Electric Co Ltd | 半導体装置およびその製造方法 |
US20120043127A1 (en) | 2010-08-20 | 2012-02-23 | Nan Ya Pcb Corp. | Printed circuit board and method for fabricating the same |
US9883579B1 (en) | 2016-10-07 | 2018-01-30 | Unimicron Technology Corp. | Package structure and manufacturing method thereof |
WO2019107400A1 (ja) | 2017-11-28 | 2019-06-06 | 京セラ株式会社 | 電子素子実装用基板、電子装置および電子モジュール |
US20200402873A1 (en) | 2017-11-28 | 2020-12-24 | Kyocera Corporation | Electronic device mounting board, electronic package, and electronic module |
US20200098668A1 (en) | 2018-09-25 | 2020-03-26 | Intel Corporation | Thermal management solutions for embedded integrated circuit devices |
JP2021027348A (ja) | 2019-08-08 | 2021-02-22 | 住友ベークライト株式会社 | 半導体装置 |
CN113675158A (zh) | 2021-07-06 | 2021-11-19 | 珠海越亚半导体股份有限公司 | 循环冷却嵌埋封装基板及其制作方法 |
US20230010115A1 (en) | 2021-07-06 | 2023-01-12 | Zhuhai Access Semiconductor Co., Ltd. | Cyclic cooling embedded packaging substrate and manufacturing method thereof |
JP2023008819A (ja) | 2021-07-06 | 2023-01-19 | 珠海越亜半導体股▲分▼有限公司 | 循環冷却可能な埋め込み型パッケージ基板及びその作製方法 |
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