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JP6962945B2 - Power semiconductor module and power converter using it - Google Patents

Power semiconductor module and power converter using it Download PDF

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JP6962945B2
JP6962945B2 JP2019013947A JP2019013947A JP6962945B2 JP 6962945 B2 JP6962945 B2 JP 6962945B2 JP 2019013947 A JP2019013947 A JP 2019013947A JP 2019013947 A JP2019013947 A JP 2019013947A JP 6962945 B2 JP6962945 B2 JP 6962945B2
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main electrode
wiring pattern
conductor
semiconductor module
power semiconductor
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JP2020124030A (en
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大介 五十嵐
徹 増田
誠一 早川
雄治 高柳
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Hitachi Power Semiconductor Device Ltd
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Priority to PCT/JP2019/040229 priority patent/WO2020158057A1/en
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    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Description

本発明は、パワー半導体モジュールおよびそれを用いた電力変換装置に関する。 The present invention relates to a power semiconductor module and a power conversion device using the same.

電力変換装置は、電力の交流−直流変換、直流−交流変換あるいは交流電力の周波数変換や直流電力の電圧変換などの機能を備える。このような変換機能を果たすために、電力変換装置は、スイッチング機能を備えたパワー半導体モジュールのON、OFF動作により電力を変換する電力変換回路を備える。 The power conversion device has functions such as AC-DC conversion of electric power, DC-AC conversion, frequency conversion of AC power, and voltage conversion of DC power. In order to fulfill such a conversion function, the power conversion device includes a power conversion circuit that converts power by ON / OFF operation of a power semiconductor module having a switching function.

電力変換装置に用いられるパワー半導体モジュールは、一般的に、放熱用の金属ベースの上に、配線パターンを形成した絶縁基板をはんだ等で接合し、その絶縁基板の配線パターンの上に複数のスイッチング素子(半導体素子)を並列接続することで構成される。 In a power semiconductor module used in a power conversion device, generally, an insulating substrate having a wiring pattern formed on a metal base for heat dissipation is joined with solder or the like, and a plurality of switches are switched on the wiring pattern of the insulating substrate. It is configured by connecting elements (semiconductor elements) in parallel.

絶縁基板は、大型化すると熱による反りの問題が発生するためサイズに限界がある。そのため、大電力用パワー半導体モジュールでは複数のスイッチング素子(半導体素子)を搭載した絶縁基板をさらに並列接続することで、電流定格を増加させている。 There is a limit to the size of the insulating substrate because the problem of warpage due to heat occurs when the size is increased. Therefore, in the power semiconductor module for high power, the current rating is increased by further connecting the insulating substrates on which a plurality of switching elements (semiconductor elements) are mounted in parallel.

本技術分野の背景技術として、例えば、特許文献1のような技術がある。特許文献1では「1in1モジュールにおいて並列接続したスイッチング素子の容量と配線インダクタンス間のLC共振の対策として、スイッチング素子の主電極間を導体部材により電気的に接続する方法」が提案されている。ここで、1in1モジュールとは、1つのパワー本導体モジュール内に、1つのスイッチング素子もしくは逆並列接続された1つのスイッチング素子と1つのダイオードを搭載したものである。 As a background technology in this technical field, for example, there is a technology such as Patent Document 1. Patent Document 1 proposes "a method of electrically connecting the main electrodes of a switching element with a conductor member as a countermeasure against LC resonance between the capacitance of a switching element connected in parallel in a 1in1 module and the wiring inductance". Here, the 1in1 module is a module in which one switching element or one switching element connected in antiparallel and one diode are mounted in one power main conductor module.

一方、電力変換回路のさらなる小形化のために、例えば、特許文献2に開示されているような2in1モジュールの要求が高まっている。2in1モジュールは、1つのモジュールでハーフブリッジ回路を構成したもので、絶縁基板をモジュール内部で2直列接続し、一方を上アーム、他方を下アームとしたものである。 On the other hand, in order to further reduce the size of the power conversion circuit, for example, there is an increasing demand for a 2in1 module as disclosed in Patent Document 2. The 2in1 module constitutes a half-bridge circuit with one module, in which two insulating substrates are connected in series inside the module, one of which is an upper arm and the other of which is a lower arm.

特許第5637944号公報Japanese Patent No. 5637944 特開2009−278772号公報Japanese Unexamined Patent Publication No. 2009-278772

上記特許文献2のような2in1モジュールは、1in1モジュールと比較して、上下アーム間の配線距離を短縮できるため、小形化や低インダクタンス化等の利点がある。 A 2in1 module as in Patent Document 2 has advantages such as miniaturization and low inductance because the wiring distance between the upper and lower arms can be shortened as compared with the 1in1 module.

しかしながら、上下アーム間のインダクタンスが小さくなると上下アーム間のLC共振による共振電流Irが発生しやすくなり、その共振電流Irがゲート配線に通流するとゲート電圧振動が発生してしまう。このゲート電圧振動はスイッチング素子の内蔵ゲート抵抗値を高めることでダンピング抵抗の強化により抑制できるが、内蔵ゲート抵抗値を高めるとスイッチング速度が遅くなり、その結果、スイッチング損失が増加する問題がある。 However, when the inductance between the upper and lower arms becomes smaller, a resonance current Ir due to LC resonance between the upper and lower arms is likely to be generated, and when the resonance current Ir flows through the gate wiring, gate voltage vibration is generated. This gate voltage vibration can be suppressed by strengthening the damping resistance by increasing the built-in gate resistance value of the switching element, but increasing the built-in gate resistance value slows down the switching speed, and as a result, there is a problem that the switching loss increases.

そこで、本発明の目的は、ハーフブリッジ回路を構成する2in1パワー半導体モジュールにおいて、上下アーム間のLC共振によるゲート電圧振動の抑制と低損失化の両立が可能なパワー半導体モジュールおよびそれを用いた電力変換装置を提供することにある。 Therefore, an object of the present invention is a power semiconductor module capable of suppressing gate voltage vibration due to LC resonance between upper and lower arms and reducing loss in a 2in1 power semiconductor module constituting a half-bridge circuit, and a power using the power semiconductor module. The purpose is to provide a conversion device.

上記課題を解決するために、本発明は、第一の絶縁基板上に搭載され、第一の主電極と第二の主電極とゲート電極を備える第一のスイッチング素子と、第二の絶縁基板上に搭載され、第三の主電極と第四の主電極とゲート電極を備える第二のスイッチング素子と、第三の絶縁基板上に搭載され、第五の主電極と第六の主電極とゲート電極を備える第三のスイッチング素子と、第四の絶縁基板上に搭載され、第七の主電極と第八の主電極とゲート電極を備える第四のスイッチング素子と、前記第一の主電極と電気的に接続される第一の主端子と、前記第二の主電極と電気的に接続される第二の主端子と、前記第三の主電極と電気的に接続される第三の主端子と、前記第四の主電極と電気的に接続される第四の主端子と、前記第五の主電極と電気的に接続される第五の主端子と、前記第七の主電極と電気的に接続される第六の主端子と、前記第一のスイッチング素子のゲート電極と電気的に接続された第一の配線パターンと、前記第二のスイッチング素子のゲート電極に電気的に接続された第二の配線パターンと、前記第三のスイッチング素子のゲート電極と電気的に接続された第三の配線パターンと、前記第四のスイッチング素子のゲート電極に電気的に接続された第四の配線パターンと、前記第一のスイッチング素子のゲート電極と前記第一の配線パターンを電気的に接続する第一の導体と、前記第二のスイッチング素子のゲート電極と前記第二の配線パターンを電気的に接続する第二の導体と、前記第三のスイッチング素子のゲート電極と前記第三の配線パターンを電気的に接続する第三の導体と、前記第四のスイッチング素子のゲート電極に前記第四の配線パターンを電気的に接続する第四の導体と、前記第二の主電極に電気的に接続された第五の配線パターンと、前記第四の主電極に電気的に接続された第六の配線パターンと、前記第六の主電極に電気的に接続された第七の配線パターンと、前記第八の主電極に電気的に接続された第八の配線パターンと、前記第二の主電極と前記第五の配線パターンを電気的に接続する第五の導体と、前記第四の主電極と前記第六の配線パターンを電気的に接続する第六の導体と、前記第六の主電極と前記第七の配線パターンを電気的に接続する第七の導体と、
前記第八の主電極と前記第八の配線パターンを電気的に接続する第八の導体と、前記第一の配線パターンおよび前記第二の配線パターンと電気的に接続された第一の補助端子と、前記第三の配線パターンおよび前記第四の配線パターンと電気的に接続された第二の補助端子と、前記第五の配線パターンおよび前記第六の配線パターンと電気的に接続された第三の補助端子と、前記第七の配線パターンおよび前記第八の配線パターンと電気的に接続された第四の補助端子と、前記第一の主電極と前記第六の主電極を電気的に接続する第九の導体と、前記第三の主電極と前記第八の主電極を電気的に接続する第十の導体と、を備えたパワー半導体モジュールにおいて、前記第一の主電極と前記第三の主電極との間のインピーダンス値と、前記第五の主電極と前記第七の主電極との間のインピーダンス値と、前記第六の主電極と前記第八の主電極との間のインピーダンス値のうち、最小のインピーダンス値よりも、前記第二の主電極と前記第四の主電極との間のインピーダンス値が大きいこと特徴とする。
In order to solve the above problems, the present invention is mounted on a first insulating substrate, a first switching element including a first main electrode, a second main electrode and a gate electrode, and a second insulating substrate. A second switching element mounted on top and having a third main electrode, a fourth main electrode and a gate electrode, and a fifth main electrode and a sixth main electrode mounted on a third insulating substrate. A third switching element having a gate electrode, a fourth switching element mounted on a fourth insulating substrate and having a seventh main electrode, an eighth main electrode, and a gate electrode, and the first main electrode. A first main terminal electrically connected to the second main electrode, a second main terminal electrically connected to the second main electrode, and a third main terminal electrically connected to the third main electrode. The main terminal, the fourth main terminal electrically connected to the fourth main electrode, the fifth main terminal electrically connected to the fifth main electrode, and the seventh main electrode The sixth main terminal electrically connected to the first wiring pattern electrically connected to the gate electrode of the first switching element, and the gate electrode of the second switching element electrically connected to the first wiring pattern. The second wiring pattern connected, the third wiring pattern electrically connected to the gate electrode of the third switching element, and the third wiring pattern electrically connected to the gate electrode of the fourth switching element. The fourth wiring pattern, the first conductor that electrically connects the gate electrode of the first switching element and the first wiring pattern, the gate electrode of the second switching element, and the second wiring pattern. To the second conductor that electrically connects the third conductor, the gate electrode of the third switching element, the third conductor that electrically connects the third wiring pattern, and the gate electrode of the fourth switching element. A fourth conductor that electrically connects the fourth wiring pattern, a fifth wiring pattern that is electrically connected to the second main electrode, and an electrically connected fourth main electrode. A sixth wiring pattern, a seventh wiring pattern electrically connected to the sixth main electrode, an eighth wiring pattern electrically connected to the eighth main electrode, and the eighth wiring pattern. A fifth conductor that electrically connects the second main electrode and the fifth wiring pattern, a sixth conductor that electrically connects the fourth main electrode and the sixth wiring pattern, and the sixth conductor. A seventh conductor that electrically connects the sixth main electrode and the seventh wiring pattern,
An eighth conductor that electrically connects the eighth main electrode and the eighth wiring pattern, and a first auxiliary terminal that is electrically connected to the first wiring pattern and the second wiring pattern. And the second auxiliary terminal electrically connected to the third wiring pattern and the fourth wiring pattern, and the fifth wiring pattern and the sixth wiring pattern electrically connected to the fifth wiring pattern. The third auxiliary terminal, the fourth auxiliary terminal electrically connected to the seventh wiring pattern and the eighth wiring pattern, and the first main electrode and the sixth main electrode are electrically connected. In a power semiconductor module including a ninth conductor to be connected and a tenth conductor for electrically connecting the third main electrode and the eighth main electrode, the first main electrode and the ninth main electrode are provided. Between the impedance value between the three main electrodes, the impedance value between the fifth main electrode and the seventh main electrode, and the sixth main electrode and the eighth main electrode. Among the impedance values, the impedance value between the second main electrode and the fourth main electrode is larger than the minimum impedance value.

また、本発明は、上記のパワー半導体モジュールを搭載したことを特徴とする電力変換装置である。 Further, the present invention is a power conversion device characterized in that the above power semiconductor module is mounted.

本発明によれば、ハーフブリッジ回路を構成する2in1パワー半導体モジュールにおいて、上下アーム間のLC共振によるゲート電圧振動の抑制と低損失化を両立することができる。 According to the present invention, in a 2in1 power semiconductor module constituting a half-bridge circuit, it is possible to suppress gate voltage vibration due to LC resonance between upper and lower arms and reduce loss at the same time.

これにより、高効率な電力変換装置を提供することができる。 This makes it possible to provide a highly efficient power conversion device.

上記した以外の課題、構成及び効果は、以下の実施形態の説明により明らかにされる。 Issues, configurations and effects other than those described above will be clarified by the description of the following embodiments.

本発明の第一の実施形態の構成を示した平面図Top view showing the structure of the first embodiment of the present invention 本発明の第一の実施形態の等価回路図および外部回路との接続例Equivalent circuit diagram of the first embodiment of the present invention and connection example with an external circuit LC共振電流Ir経路を示した図The figure which showed the LC resonance current Ir path 従来技術の構成を示した平面図Plan view showing the configuration of the prior art 従来技術によるパワー半導体モジュールの等価回路図Equivalent circuit diagram of power semiconductor module by conventional technology 従来技術と本発明の第一の実施形態における2回目ターンオン時の波形のシミュレーション結果を比較した図The figure which compared the simulation result of the waveform at the time of the 2nd turn-on in the 1st Embodiment of this invention with a prior art 本発明の第二の実施形態の構成を示した平面図Top view showing the structure of the 2nd Embodiment of this invention 本発明の第三の実施形態の構成を示した平面図Top view showing the structure of the third embodiment of the present invention. 本発明の第三の実施形態の等価回路図とLC共振電流Ir経路を示した図The figure which showed the equivalent circuit diagram of the 3rd Embodiment of this invention and the LC resonance current Ir path. 従来技術と本発明の第三の実施形態における2回目ターンオン時の波形のシミュレーション結果を比較した図The figure which compared the simulation result of the waveform at the time of the 2nd turn-on in 3rd Embodiment of this invention with the prior art. 本発明の第四の実施形態の構成を示した平面図Top view showing the structure of the 4th Embodiment of this invention 本発明の第四の実施形態の等価回路図および外部回路との接続例Equivalent circuit diagram of the fourth embodiment of the present invention and connection example with an external circuit 本発明の第五の実施形態の構成を示した平面図Top view showing the structure of the fifth embodiment of the present invention. 本発明の第五の実施形態の等価回路図および外部回路との接続例Equivalent circuit diagram of the fifth embodiment of the present invention and connection example with an external circuit 本発明の第六の実施形態の構成を示した平面図Top view showing the structure of the sixth embodiment of the present invention.

以下、図面を用いて本発明の実施例を説明する。なお、各図面において同一の構成については同一の符号を付し、重複する部分についてはその詳細な説明は省略する。また、本発明は以下の実施形態に限定されることなく、本発明の技術的な概念の中で種々の変形例や応用例をもその範囲に含むものである。 Hereinafter, examples of the present invention will be described with reference to the drawings. In each drawing, the same components are designated by the same reference numerals, and the detailed description of overlapping portions will be omitted. Further, the present invention is not limited to the following embodiments, and various modifications and applications are included in the technical concept of the present invention.

本発明の第一の実施形態を図1から図6に基づき詳細に説明する。まず、図1で本発明の第一の実施形態の構成について説明する。次に、図2で本発明の第一の実施形態の等価回路図とその動作(作用)を説明する。そして、図3で本発明の第一の実施形態によるゲート電圧振動の抑制効果について説明する。また、図4と図5で上下アームのゲート配線に対して平等に(均等に)ゲート電圧振動の対策を講じた構成とその等価回路を説明し、図6で図4や図5で示した構成と本発明の第一の実施形態とのゲート電圧波形を比較する。 The first embodiment of the present invention will be described in detail with reference to FIGS. 1 to 6. First, the configuration of the first embodiment of the present invention will be described with reference to FIG. Next, FIG. 2 describes an equivalent circuit diagram of the first embodiment of the present invention and its operation (action). Then, FIG. 3 describes the effect of suppressing the gate voltage vibration according to the first embodiment of the present invention. Further, FIGS. 4 and 5 describe a configuration in which measures against gate voltage vibration are taken equally (evenly) with respect to the gate wiring of the upper and lower arms and an equivalent circuit thereof, and are shown in FIGS. 4 and 5 in FIG. The gate voltage waveforms of the configuration and the first embodiment of the present invention are compared.

図1は本発明の第一の実施形態の構成を示した平面図である。図1を用いて本発明の第一の実施形態の構成について説明する。第一の実施形態では、放熱用金属板100上に第一から第四の絶縁基板4枚(1,2,3,4)と、第一と第二の絶縁子基板2枚(98,99)が配置される。そして、底面の放熱用金属板部分以外を樹脂筐体101で囲っている。樹脂筐体101と放熱用金属板100で囲われたパワー半導体モジュール内は、ゲルや硬質樹脂などの絶縁材が充填され、内部の絶縁性を保っている。 FIG. 1 is a plan view showing the configuration of the first embodiment of the present invention. The configuration of the first embodiment of the present invention will be described with reference to FIG. In the first embodiment, four first to fourth insulating substrates (1, 2, 3, 4) and two first and second insulator substrates (98, 99) are placed on the heat-dissipating metal plate 100. ) Is placed. Then, the resin housing 101 surrounds the portion other than the heat-dissipating metal plate portion on the bottom surface. The inside of the power semiconductor module surrounded by the resin housing 101 and the heat-dissipating metal plate 100 is filled with an insulating material such as gel or hard resin to maintain the internal insulating property.

第一から第四の絶縁基板(1,2,3,4)には、第一から第四のスイッチング素子(5,6,7,8)と第一から第四のダイオード(72,73,74,75)が一つずつ搭載されている。スイッチング素子は2つの主電極と1つのゲート電極を備えている。ダイオードはカソード電極とアノード電極を備えている。 On the first to fourth insulating substrates (1, 2, 3, 4), the first to fourth switching elements (5, 6, 7, 8) and the first to fourth diodes (72, 73, 74, 75) are installed one by one. The switching element includes two main electrodes and one gate electrode. The diode has a cathode electrode and an anode electrode.

第一から第四のスイッチング素子(5,6,7,8)の第一の主電極、第三の主電極、第五の主電極、第七の主電極は、はんだ接合や金属焼結接合などによりそれぞれ、第一の主電極用配線パターン9、第三の主電極用配線パターン11、第五の主電極用配線パターン13、第七の主電極用配線パターン15と電気的に接続される。 The first main electrode, the third main electrode, the fifth main electrode, and the seventh main electrode of the first to fourth switching elements (5, 6, 7, 8) are solder-bonded or metal-sinter-bonded. It is electrically connected to the first main electrode wiring pattern 9, the third main electrode wiring pattern 11, the fifth main electrode wiring pattern 13, and the seventh main electrode wiring pattern 15, respectively. ..

なお、以後説明する配線パターンも含め、配線パターンの材料には銅やアルミニウムなどの導電材料を用いる。また、以後説明する「接続」とは、特に断りがなければ全て電気的な接続を意味する。 Including the wiring pattern described below, a conductive material such as copper or aluminum is used as the material of the wiring pattern. In addition, the "connection" described below means an electrical connection unless otherwise specified.

第一から第四のダイオード(72,73,74,75)のカソード電極も同様にそれぞれ、第一の主電極用配線パターン9、第三の主電極用配線パターン11、第五の主電極用配線パターン13、第七の主電極用配線パターン15と接続される。 Similarly, the cathode electrodes of the first to fourth diodes (72, 73, 74, 75) are for the first main electrode wiring pattern 9, the third main electrode wiring pattern 11, and the fifth main electrode, respectively. It is connected to the wiring pattern 13 and the wiring pattern 15 for the seventh main electrode.

第一から第四のスイッチング素子(5,6,7,8)の第二の主電極10、第四の主電極12、第六の主電極14、第八の主電極16は、第一から第四のダイオードのアノード電極(76,77,78,79)と配線(80,81,82,83)により接続される。つまり、各絶縁基板において、スイッチング素子とダイオードは並列接続される。 The second main electrode 10, the fourth main electrode 12, the sixth main electrode 14, and the eighth main electrode 16 of the first to fourth switching elements (5, 6, 7, 8) are from the first. It is connected to the anode electrode (76, 77, 78, 79) of the fourth diode by wiring (80, 81, 82, 83). That is, in each insulating substrate, the switching element and the diode are connected in parallel.

なお、以後説明する配線や導体も含め、配線や導体にはアルミニウムワイヤ、銅ワイヤ、銅リードなどを用いる。また、スイッチング素子には、Si−IGBT(Insulated Gate Bipolar Transistor)やSiC−MOSFET(Metal Oxide Semiconductor Field Effect Transistor)などを用いる。ダイオードには、Si−pnダイオードやSiC−SBD(Schottky Barrier Diode)などを用いる。 Including the wiring and conductor described below, aluminum wire, copper wire, copper lead and the like are used for the wiring and conductor. Further, as the switching element, Si-IGBT (Insulated Gate Bipolar Transistor), SiC-MOSFET (Metal Oxide Semiconductor Field Effect Transistor), or the like is used. As the diode, a Si-pn diode, a SiC-SBD (Schottky Barrier Diode) or the like is used.

第一から第四のスイッチング素子のゲート電極(17,18,19,20)は、第一から第四の導体(43,44,45,46)により、第一から第四の配線パターン(27,28,29,30)と接続される。 The gate electrodes (17, 18, 19, 20) of the first to fourth switching elements are formed by the first to fourth conductors (43, 44, 45, 46) and the first to fourth wiring patterns (27). , 28, 29, 30).

第一の配線パターン27と第二の配線パターン28は、配線56と配線57により第一の下アーム共通配線パターン35に接続される。第一の下アーム共通配線パターン35は、配線64により第一の補助端子39と接続され、樹脂筐体101の外部へと引き出される。 The first wiring pattern 27 and the second wiring pattern 28 are connected to the first lower arm common wiring pattern 35 by the wiring 56 and the wiring 57. The first lower arm common wiring pattern 35 is connected to the first auxiliary terminal 39 by the wiring 64 and is pulled out to the outside of the resin housing 101.

第三の配線パターン29と第四の配線パターン30も同様に、配線58と配線59により第一の上アーム共通配線パターン37に接続される。第一の上アーム共通配線パターン37も、配線65により第二の補助端子40と接続され、樹脂筐体101の外部へと引き出される。 Similarly, the third wiring pattern 29 and the fourth wiring pattern 30 are also connected to the first upper arm common wiring pattern 37 by the wiring 58 and the wiring 59. The first upper arm common wiring pattern 37 is also connected to the second auxiliary terminal 40 by the wiring 65 and is pulled out to the outside of the resin housing 101.

第一から第四のスイッチング素子の第二の主電極10、第四の主電極12、第六の主電極14、第八の主電極16は、第五から第八の導体(47,48,49,50)により、第五から第八の配線パターン(31,32,33,34)と電気的に接続される。 The second main electrode 10, the fourth main electrode 12, the sixth main electrode 14, and the eighth main electrode 16 of the first to fourth switching elements are the fifth to eighth conductors (47, 48, By 49,50), it is electrically connected to the fifth to eighth wiring patterns (31,32,33,34).

第五の配線パターン31と第六の配線パターン32は、配線60と配線61により第二の下アーム共通配線パターン36に電気的に接続される。第二の下アーム共通配線パターン36は、配線66により第三の補助端子41と接続され、樹脂筐体101の外部へと引き出される。 The fifth wiring pattern 31 and the sixth wiring pattern 32 are electrically connected to the second lower arm common wiring pattern 36 by the wiring 60 and the wiring 61. The second lower arm common wiring pattern 36 is connected to the third auxiliary terminal 41 by the wiring 66 and is pulled out to the outside of the resin housing 101.

第七の配線パターン33と第八の配線パターン34も同様に、配線62と配線63により第二の上アーム共通配線パターン38に電気的に接続される。第二の上アーム共通配線パターン38も、配線67により第四の補助端子42と接続され、樹脂筐体101の外部へと引き出される。 Similarly, the seventh wiring pattern 33 and the eighth wiring pattern 34 are electrically connected to the second upper arm common wiring pattern 38 by the wiring 62 and the wiring 63. The second upper arm common wiring pattern 38 is also connected to the fourth auxiliary terminal 42 by the wiring 67 and is pulled out to the outside of the resin housing 101.

第五の主電極用配線パターン13と第七の主電極用配線パターン15は、配線70と配線71により、それぞれ第五の主端子25と第六の主端子26と接続され、樹脂筐体101の外部へと引き出される。 The fifth main electrode wiring pattern 13 and the seventh main electrode wiring pattern 15 are connected to the fifth main terminal 25 and the sixth main terminal 26 by the wiring 70 and the wiring 71, respectively, and the resin housing 101. It is pulled out to the outside of.

第一の主電極用配線パターン9と第三の主電極用配線パターン11はそれぞれ接合面114と接合面115で、超音波金属接合により第一の主端子21と第三の主端子23と接続され、樹脂筐体101の外部へと引き出される。 The wiring pattern 9 for the first main electrode and the wiring pattern 11 for the third main electrode are the joint surface 114 and the joint surface 115, respectively, and are connected to the first main terminal 21 and the third main terminal 23 by ultrasonic metal bonding. And is pulled out to the outside of the resin housing 101.

第二の主電極10と第四の主電極12は配線68と配線69によりそれぞれ第二の主端子22と第四の主端子24と接続され、樹脂筐体101の外部へと引き出される。 The second main electrode 10 and the fourth main electrode 12 are connected to the second main terminal 22 and the fourth main terminal 24 by the wiring 68 and the wiring 69, respectively, and are pulled out to the outside of the resin housing 101.

原理については図3を用いて後述するが、実施例1では、スイッチング時のゲート電圧振動を抑制するために、第六の主電極14と第八の主電極16を第十二の導体54で接続する。 The principle will be described later with reference to FIG. 3, but in the first embodiment, in order to suppress the gate voltage vibration during switching, the sixth main electrode 14 and the eighth main electrode 16 are connected by the twelfth conductor 54. Connecting.

図2に本発明の第一の実施形態の等価回路図および外部回路との接続例を示す。まず、図2の回路の構成を説明して、次に図2を用いて本発明の第一の実施形態の動作例について説明する。なお、本発明はスイッチング時の高周波現象を対象にしているため、図2の等価回路図では配線、導体、配線パターンをすべてインダクタンスの回路記号で表記する。 FIG. 2 shows an equivalent circuit diagram of the first embodiment of the present invention and an example of connection with an external circuit. First, the configuration of the circuit of FIG. 2 will be described, and then an operation example of the first embodiment of the present invention will be described with reference to FIG. Since the present invention is intended for a high frequency phenomenon during switching, wiring, conductors, and wiring patterns are all represented by inductance circuit symbols in the equivalent circuit diagram of FIG.

本発明によるパワー半導体モジュールでは、第五の主端子25と第六の主端子26の間、第一の主端子21と第三の主端子23の間、第二の主端子22と第四の主端子24の間は、それぞれ外部の配線(87,88,94,95,91,92)で接続されて使用することを想定している。 In the power semiconductor module according to the present invention, between the fifth main terminal 25 and the sixth main terminal 26, between the first main terminal 21 and the third main terminal 23, and between the second main terminal 22 and the fourth main terminal 22. It is assumed that the main terminals 24 are connected by external wiring (87,88,94,95,91,92) and used.

つまり、第一の絶縁基板1に搭載された第一のスイッチング素子5および第一のダイオード72と、第二の絶縁基板2に搭載された第二のスイッチング素子6および第二のダイオード73は並列接続される。また、第三の絶縁基板3に搭載された第三のスイッチング素子7および第三のダイオード74と、第四の絶縁基板4に搭載された第四のスイッチング素子8および第四のダイオード75も並列接続される。 That is, the first switching element 5 and the first diode 72 mounted on the first insulating substrate 1 and the second switching element 6 and the second diode 73 mounted on the second insulating substrate 2 are in parallel. Be connected. Further, the third switching element 7 and the third diode 74 mounted on the third insulating substrate 3 and the fourth switching element 8 and the fourth diode 75 mounted on the fourth insulating substrate 4 are also in parallel. Be connected.

スイッチング素子とダイオードをそれぞれ複数並列接続することで、パワー半導体モジュールの定格電流容量を増加させることができる。しかし、上述したように、熱による反りの問題から絶縁基板のサイズには限界があるため、本発明では、スイッチング素子とダイオードを搭載した絶縁基板を並列接続することで定格電流容量を増加している。 By connecting a plurality of switching elements and diodes in parallel, the rated current capacity of the power semiconductor module can be increased. However, as described above, since the size of the insulating substrate is limited due to the problem of warpage due to heat, in the present invention, the rated current capacity is increased by connecting the insulating substrate on which the switching element and the diode are mounted in parallel. There is.

第一の絶縁基板1と第二の絶縁基板2に搭載されたスイッチング素子とダイオードの並列回路と、第三の絶縁基板3と第四の絶縁基板4に搭載されたスイッチング素子とダイオードの並列回路は、第九の導体51と第十の導体52によって直列接続される。 A parallel circuit of switching elements and diodes mounted on the first insulating substrate 1 and the second insulating substrate 2, and a parallel circuit of switching elements and diodes mounted on the third insulating substrate 3 and the fourth insulating substrate 4. Is connected in series by a ninth conductor 51 and a tenth conductor 52.

このように、本発明はパワー半導体モジュール内部で2つのスイッチング素子が直列接続され、その高電位端子(第五の主端子25と第六の主端子26)と中間電位端子(第一の主端子21と第三の主端子23)と低電位端子(第二の主端子22と第四の主端子24)の3つの電位の端子を設けて、ハーフブリッジ回路を構成した2in1モジュール144である。 As described above, in the present invention, two switching elements are connected in series inside the power semiconductor module, and the high potential terminal (fifth main terminal 25 and the sixth main terminal 26) and the intermediate potential terminal (first main terminal) are connected in series. It is a 2in1 module 144 in which a half-bridge circuit is formed by providing three potential terminals (21 and a third main terminal 23) and a low potential terminal (second main terminal 22 and a fourth main terminal 24).

上述したように、2in1モジュールは、1in1モジュールと比較して、上下アーム間の配線接続を短縮できるため、小形化や低インダクタンス化等の利点がある。 As described above, the 2in1 module has advantages such as miniaturization and low inductance because the wiring connection between the upper and lower arms can be shortened as compared with the 1in1 module.

また、図示していないが、通流する電流の極性が逆である高電位端子(第五の主端子25と第六の主端子26)と低電位端子(第二の主端子22と第四の主端子24)を平行、且つ近接した配置とすることで、両者の間の相互インダクタンスを増加することができる。その結果、高電位端子(第五の主端子25と第六の主端子26)と低電位端子(第二の主端子22と第四の主端子24)の配線インダクタンスを低減でき、2in1モジュールの配線インダクタンスをさらに低減することできる。 Further, although not shown, the high-potential terminals (fifth main terminal 25 and the sixth main terminal 26) and the low-potential terminals (second main terminal 22 and the fourth main terminal 22) in which the polarities of the flowing currents are opposite are reversed. By arranging the main terminals 24) of the above in parallel and close to each other, the mutual inductance between the two can be increased. As a result, the wiring inductance of the high potential terminal (fifth main terminal 25 and the sixth main terminal 26) and the low potential terminal (second main terminal 22 and the fourth main terminal 24) can be reduced, and the 2in1 module can be used. The wiring inductance can be further reduced.

高電位端子(第五の主端子25と第六の主端子26)と中間電位端子(第一の主端子21と第三の主端子23)間に接続された第三のスイッチング素子7、第四のスイッチング素子8、第三のダイオード74および第四のダイオード75を上アーム、中間電位端子(第一の主端子21と第三の主端子23)と低電位端子(第二の主端子22と第四の主端子24)間に接続された第一のスイッチング素子5、第二のスイッチング素子6、第一のダイオード72および第二のダイオード73を下アームと呼ぶ。 A third switching element 7, a third switching element 7, connected between a high potential terminal (fifth main terminal 25 and a sixth main terminal 26) and an intermediate potential terminal (first main terminal 21 and third main terminal 23). The fourth switching element 8, the third diode 74 and the fourth diode 75 are attached to the upper arm, the intermediate potential terminal (first main terminal 21 and the third main terminal 23) and the low potential terminal (second main terminal 22). The first switching element 5, the second switching element 6, the first diode 72, and the second diode 73 connected between the and the fourth main terminal 24) are referred to as lower arms.

図2では、一例として中間電位端子(第一の主端子21と第三の主端子23)と低電位端子(第二の主端子22と第四の主端子24)の間に配線(91,92,94,95)を介してインダクタンス負荷96を接続した上アーム駆動のハーフブリッジ回路の構成を示している。 In FIG. 2, as an example, wiring (91, The configuration of the upper arm drive half-bridge circuit in which the inductance load 96 is connected via 92, 94, 95) is shown.

高電位端子(第五の主端子25と第六の主端子26)と低電位端子(第二の主端子22と第四の主端子24)の間には配線(87,88,89,91,92,93)を介してコンデンサ85が接続される。また、コンデンサ85には配線86と配線90を介して、直流電源84が接続される。 Wiring (87,88,89,91) between the high-potential terminal (fifth main terminal 25 and sixth main terminal 26) and the low-potential terminal (second main terminal 22 and fourth main terminal 24). , 92, 93), and the capacitor 85 is connected. Further, a DC power supply 84 is connected to the capacitor 85 via the wiring 86 and the wiring 90.

続いて、図1および図2を用いて、本発明の第一の実施形態の動作(作用)について、電力変換回路に搭載された際に繰り返されるスイッチング動作順を例に説明する。まず、初期状態は上下アームのスイッチング素子は全てOFFの状態である。上アームの第三のスイッチング素子7と第四のスイッチング素子8は並列動作させるために、第二の補助端子40と第四の補助端子42を介して共通のゲート駆動電源102に接続される。また、下アームも同様に第一のスイッチング素子5と第二のスイッチング素子6は並列動作させるために、第一の補助端子39と第三の補助端子41を介して共通のゲート駆動電源102に接続される。 Subsequently, with reference to FIGS. 1 and 2, the operation (action) of the first embodiment of the present invention will be described by taking as an example a switching operation order that is repeated when mounted on a power conversion circuit. First, in the initial state, all the switching elements of the upper and lower arms are in the OFF state. The third switching element 7 and the fourth switching element 8 of the upper arm are connected to a common gate drive power supply 102 via the second auxiliary terminal 40 and the fourth auxiliary terminal 42 in order to operate in parallel. Similarly, in order to operate the first switching element 5 and the second switching element 6 in parallel with the lower arm, the common gate drive power supply 102 is connected to the common gate drive power supply 102 via the first auxiliary terminal 39 and the third auxiliary terminal 41. Be connected.

ゲート駆動電源102から負電圧を補助端子に印加することで、スイッチング素子をOFFの状態に制御できる。例えばスイッチング素子がIGBTの場合、OFF時に−15V程度を補助端子に印加する。図2の回路において、上下アームのスイッチング素子が全てOFFの状態の時には直流電源電圧Vccは上アームに印加され、インダクタンス負荷96には直流電源電圧Vccは印加されないため、電流は流れない。 By applying a negative voltage from the gate drive power supply 102 to the auxiliary terminal, the switching element can be controlled to the OFF state. For example, when the switching element is an IGBT, about -15V is applied to the auxiliary terminal when the switching element is OFF. In the circuit of FIG. 2, when all the switching elements of the upper and lower arms are OFF, the DC power supply voltage Vcc is applied to the upper arm, and the DC power supply voltage Vcc is not applied to the inductance load 96, so that no current flows.

次に、初期状態から上アームのスイッチング素子をON状態(1回目のターンオン)にする。ゲート駆動電源102から正電圧を補助端子に印加することで、スイッチング素子をONの状態に制御できる。例えばスイッチング素子がIGBTの場合、ON時に+15V程度のゲート電圧を補助端子に印加する。 Next, the switching element of the upper arm is turned on (first turn-on) from the initial state. By applying a positive voltage from the gate drive power supply 102 to the auxiliary terminal, the switching element can be controlled to the ON state. For example, when the switching element is an IGBT, a gate voltage of about + 15V is applied to the auxiliary terminal when it is turned on.

上アームのスイッチング素子がON状態となると、インダクタンス値がLload[H]のインダクタンス負荷96に直流電源電圧Vccが印加され、Vcc/Lloadの傾きで増加する電流が上アームのスイッチング素子を介してインダクタンス負荷96に通流する。 When the switching element of the upper arm is turned on, the DC power supply voltage Vcc is applied to the inductance load 96 having an inductance value of Lload [H], and the current increasing with the inclination of Vcc / Lload is conducted through the switching element of the upper arm. It flows through the load 96.

そして、上アームのスイッチング素子をON状態からOFF状態にすると、上アームのスイッチング素子の電流Ic_Hは遮断され、電流はインダクタンス負荷96と下アームのダイオードの間の経路に転流する。そこから、再び上アームのスイッチング素子をOFF状態からON状態(2回目のターンオン)にすると、電流は上アームのスイッチング素子とインダクタンス負荷96の間の経路に転流する。 When the switching element of the upper arm is changed from the ON state to the OFF state, the current Ic_H of the switching element of the upper arm is cut off, and the current is commutated to the path between the inductance load 96 and the diode of the lower arm. From there, when the switching element of the upper arm is changed from the OFF state to the ON state (second turn-on), the current is commutated to the path between the switching element of the upper arm and the inductance load 96.

この2回目のターンオン時を例に、ゲート電圧振動の発生原理を説明する。2回目のターンオン時に理想的には上アームの第三のスイッチング素子7と第四のスイッチング素子8には電流が均等に流れる。しかし、スイッチング素子間の特性ばらつきやゲート配線インピーダンスのばらつき等で第三のスイッチング素子7と第四のスイッチング素子8の電流が不均等になると、並列接続された絶縁基板間で電位差が生じ、電位差を減らす方向に電流が流れる。このときに下アームのスイッチング素子とダイオードの空乏層容量と回路の配線インダクタンスとの間でLC共振が発生することがある。特に、Si(シリコン)デバイスと比較して空乏層容量の大きいSiC(炭化シリコン)デバイスにおいて、当該LC共振が発生しやすい。 The principle of generating gate voltage vibration will be described by taking this second turn-on time as an example. Ideally, the current flows evenly through the third switching element 7 and the fourth switching element 8 of the upper arm at the time of the second turn-on. However, if the currents of the third switching element 7 and the fourth switching element 8 become uneven due to variations in characteristics between switching elements, variations in gate wiring impedance, etc., a potential difference occurs between the insulating substrates connected in parallel, resulting in a potential difference. Current flows in the direction of reducing. At this time, LC resonance may occur between the switching element of the lower arm, the depletion layer capacitance of the diode, and the wiring inductance of the circuit. In particular, the LC resonance is likely to occur in a SiC (silicon carbide) device having a larger depletion layer capacity than a Si (silicon) device.

図3にLC共振電流Ir経路を示す。図3に示すように、下アームのスイッチング素子とダイオードを境に逆相の共振電流Irが流れる。このとき、駆動側の上アームのゲート配線である3GL−4GL間(3GL:第三のスイッチング素子7のゲート電極19から第一の上アーム共通配線パターン37と配線65の接続点までの配線、4GL:第四のスイッチング素子8のゲート電極20から第一の上アーム共通配線パターン37と配線65の接続点までの配線)と3EL−4EL間(3EL:第六の主電極14から第二の上アーム共通配線パターン38と配線67の接続点までの配線、4EL: 第八の主電極16から第二の上アーム共通配線パターン38と配線67の接続点までの配線)に共振電流Irが流れると、上アームのゲート電圧Vge_Hが振動する。 FIG. 3 shows the LC resonance current Ir path. As shown in FIG. 3, a resonance current Ir of opposite phase flows with the switching element of the lower arm and the diode as a boundary. At this time, the wiring between 3GL-4GL, which is the gate wiring of the upper arm on the drive side (3GL: wiring from the gate electrode 19 of the third switching element 7 to the connection point between the first upper arm common wiring pattern 37 and the wiring 65, 4GL: Wiring from the gate electrode 20 of the fourth switching element 8 to the connection point of the first upper arm common wiring pattern 37 and the wiring 65) and between 3EL-4EL (3EL: sixth main electrode 14 to second Resonant current Ir flows through the wiring to the connection point between the upper arm common wiring pattern 38 and the wiring 67, 4EL: wiring from the eighth main electrode 16 to the connection point between the second upper arm common wiring pattern 38 and the wiring 67). Then, the gate voltage Vge_H of the upper arm vibrates.

ON状態の上アームスイッチング素子はゲート電圧で制御される電流源として動作するため、上アームゲート電圧Vge_Hが振動すると上アームスイッチング素子の電流もそれと同期して振動し、並列接続された絶縁基板間での電位差がさらに拡大する自励振動に至る。自励振動に至ると上アームゲート電圧Vge_H振動がさらに増加し、ゲート酸化膜が絶縁破壊に至る恐れがある。 Since the upper arm switching element in the ON state operates as a current source controlled by the gate voltage, when the upper arm gate voltage Vge_H vibrates, the current of the upper arm switching element also vibrates in synchronization with it, and between the insulating substrates connected in parallel. This leads to self-excited vibration in which the potential difference at is further expanded. When self-excited vibration is reached, the upper arm gate voltage Vge_H vibration further increases, and the gate oxide film may cause dielectric breakdown.

また、動作状態によって変動しやすい中点電位を基準電位としている上アームゲート電圧は下アームゲート電圧より振動しやすく、本課題の解決には上アームのゲート電圧振動抑制がボトルネックとなっていた。 In addition, the upper arm gate voltage whose reference potential is the midpoint potential, which tends to fluctuate depending on the operating state, is more likely to vibrate than the lower arm gate voltage. ..

そこで、本発明の第一の実施形態では、この自励振動による上アームゲート電圧振動を抑制するために、第六の主電極14と第八の主電極16を第十二の導体54で接続する。第十二の導体54の配線インダクタンスは、上アームのゲート配線である3GL−4GL間の配線インダクタンスや3EL−4EL間の配線インダクタンスより小さい。これは、後述する第十三の導体55の配線インダクタンスも同様である。そして、第十二の導体54はそれらの上アームのゲート配線と並列接続されるため、共振電流Irをバイパスし、上アームのゲート配線に流れる共振電流Irを低減する効果がある。 Therefore, in the first embodiment of the present invention, the sixth main electrode 14 and the eighth main electrode 16 are connected by the twelfth conductor 54 in order to suppress the upper arm gate voltage vibration due to the self-excited vibration. do. The wiring inductance of the twelfth conductor 54 is smaller than the wiring inductance between 3GL-4GL, which is the gate wiring of the upper arm, and the wiring inductance between 3EL-4EL. This also applies to the wiring inductance of the thirteenth conductor 55, which will be described later. Since the twelfth conductor 54 is connected in parallel with the gate wiring of the upper arm, it has the effect of bypassing the resonance current Ir and reducing the resonance current Ir flowing through the gate wiring of the upper arm.

そのため、第十二の導体54の接続により、自励振動による上アームゲート電圧振動を抑制することができる。また、第五の主電極と第七の主電極との間や実施例2で詳細は後述する第一の主電極と第三の主電極との間を導体で接続しても実施例1と同様の効果が得られる。 Therefore, by connecting the twelfth conductor 54, it is possible to suppress the upper arm gate voltage vibration due to self-excited vibration. Further, even if a conductor is connected between the fifth main electrode and the seventh main electrode or between the first main electrode and the third main electrode, which will be described in detail in Example 2, the same as in Example 1. A similar effect can be obtained.

一方、図4の平面図と図5の等価回路図に示すように、第六の主電極14と第八の主電極16を第十二の導体54で接続したことに加えて、第二の主電極10と第四の主電極12を第十四の導体105で接続して、上下アームのゲート配線に対して平等に(均等に)ゲート電圧振動の対策を講じることも考えられる。しかし、内部を低インダクタンス化した2in1モジュールでは上下アームトータルの配線インダクタンスが10nH程度と小さく、前述のLC共振による上下アーム間の共振電流Irが発生しやすい。そのため、図4や図5に示した構成ではゲート電圧振動の抑制が不十分だった。 On the other hand, as shown in the plan view of FIG. 4 and the equivalent circuit diagram of FIG. 5, in addition to connecting the sixth main electrode 14 and the eighth main electrode 16 with the twelfth conductor 54, the second It is also conceivable to connect the main electrode 10 and the fourth main electrode 12 with the fourteenth conductor 105 and take measures against the gate voltage vibration equally (evenly) with respect to the gate wiring of the upper and lower arms. However, in the 2in1 module having a low internal inductance, the total wiring inductance of the upper and lower arms is as small as about 10 nH, and the resonance current Ir between the upper and lower arms is likely to occur due to the above-mentioned LC resonance. Therefore, the configuration shown in FIGS. 4 and 5 was insufficient to suppress the gate voltage vibration.

そこで、本発明では、問題となる上アームゲート電圧振動の抑制を優先して対策する構成とした。具体的には、第十二の導体54は接続するが、第十四の導体105は接続しない構成とした。 Therefore, in the present invention, the configuration is such that the suppression of the upper arm gate voltage vibration, which is a problem, is prioritized and countermeasures are taken. Specifically, the twelfth conductor 54 is connected, but the fourteenth conductor 105 is not connected.

その理由を以下で説明する。図3に示すように、当該LC共振電流Irは下アームのスイッチング素子とダイオードを境に逆相で流れるため、第二の主電極10と第四の主電極12を第十四の導体105は上アームのゲート配線である3GL−4GLの経路と3EL−4ELの経路と並列ではない。このため、上アームのゲート配線に対して、第十四の導体105は共振電流Irをバイパスする効果はない。 The reason will be explained below. As shown in FIG. 3, since the LC resonance current Ir flows in opposite phases with the switching element of the lower arm and the diode as the boundary, the second main electrode 10 and the fourth main electrode 12 are connected to the fourteenth conductor 105. The path of 3GL-4GL, which is the gate wiring of the upper arm, and the path of 3EL-4EL are not in parallel. Therefore, the fourteenth conductor 105 has no effect of bypassing the resonance current Ir with respect to the gate wiring of the upper arm.

一方、第十四の導体105により共振経路のインピーダンスは減少し、上アームのゲート配線を流れる共振電流Irは増加してしまう。そのため、上アームゲート電圧振動抑制のためには第十四の導体105は接続しないほうがよい。 On the other hand, the impedance of the resonance path is reduced by the fourteenth conductor 105, and the resonance current Ir flowing through the gate wiring of the upper arm is increased. Therefore, it is better not to connect the fourteenth conductor 105 in order to suppress the voltage vibration of the upper arm gate.

本発明の構成を主電極間のインピーダンス値の大小関係で記述すると、第一の主電極と記第三の主電極との間のインピーダンス値と、第五の主電極と第七の主電極との間のインピーダンス値と、第六の主電極14と第八の主電極16との間のインピーダンス値のうち、最小のインピーダンス値よりも、第二の主電極10と第四の主電極12との間のインピーダンス値を大きくするとよい、と言える。 When the configuration of the present invention is described by the magnitude relationship of the impedance values between the main electrodes, the impedance values between the first main electrode and the third main electrode, and the fifth and seventh main electrodes Of the impedance value between the sixth main electrode 14 and the eighth main electrode 16, the second main electrode 10 and the fourth main electrode 12 are more than the minimum impedance value. It can be said that it is better to increase the impedance value between.

また、第二の主電極10と第四の主電極12との間のインピーダンス値は、第六の主電極14から第七の導体49、第七の配線パターン33、第七の配線パターン33と第八の配線パターン34との間の配線と前記第四の補助端子42との接続点、第八の配線パターン34、第八の導体50を通り、第八の主電極16に至る経路のインピーダンス値以上とするとよい。 Further, the impedance values between the second main electrode 10 and the fourth main electrode 12 are the sixth main electrode 14 to the seventh conductor 49, the seventh wiring pattern 33, and the seventh wiring pattern 33. The impedance of the path that passes through the connection point between the wiring between the eighth wiring pattern 34 and the fourth auxiliary terminal 42, the eighth wiring pattern 34, and the eighth conductor 50, and reaches the eighth main electrode 16. It should be greater than or equal to the value.

このとき、各インピーダンス値は、外部配線(87,88,91,92,94,95)が接続されていない状態でのインピーダンス値のことを指している。また、当該インピーダンス値は、インピーダンス絶対値つまり、実部と虚部の自乗和の平方根から計算される値のことを指している。そして、当該インピーダンス値は、LC共振周波数でのインピーダンス値を指している。 At this time, each impedance value refers to the impedance value in a state where the external wiring (87,88,91,92,94,95) is not connected. Further, the impedance value refers to an absolute impedance value, that is, a value calculated from the square root of the sum of squares of the real part and the imaginary part. The impedance value refers to the impedance value at the LC resonance frequency.

第一の主電極と第三の主電極との間のインピーダンス値は、第九の導体51、第十の導体52、第一の導体43、第二の導体44、第五の導体47、第六の導体48を切断した状態で、第一の主電極用配線パターン9と第三の主電極用配線パターン11間のインピーダンス値をインピーダンスアナライザやLCRメータなどの測定器で測定する、もしくは計算式や計算ツールで計算することで得られる。 The impedance values between the first main electrode and the third main electrode are the ninth conductor 51, the tenth conductor 52, the first conductor 43, the second conductor 44, the fifth conductor 47, and the fifth conductor. With the six conductors 48 cut, the impedance value between the first main electrode wiring pattern 9 and the third main electrode wiring pattern 11 is measured with a measuring instrument such as an impedance analyzer or LCR meter, or a calculation formula. It can be obtained by calculating with or a calculation tool.

第五の主電極と第七の主電極との間のインピーダンス値は、第九の導体51、第十の導体52、第三の導体45、第四の導体46、第七の導体49、第八の導体50を切断した状態で、第五の主電極用配線パターン13と第七の主電極用配線パターン15間のインピーダンス値をインピーダンスアナライザやLCRメータなどの測定器で測定する、もしくは計算式や計算ツールで計算することで得られる。 The impedance values between the fifth and seventh main electrodes are the ninth conductor 51, the tenth conductor 52, the third conductor 45, the fourth conductor 46, the seventh conductor 49, and the seventh conductor. With the eighth conductor 50 cut, the impedance value between the fifth main electrode wiring pattern 13 and the seventh main electrode wiring pattern 15 is measured with a measuring instrument such as an impedance analyzer or LCR meter, or a calculation formula. It can be obtained by calculating with or a calculation tool.

第六の主電極14と第八の主電極16との間のインピーダンス値は、第九の導体51、第十の導体52、第三の導体45、第四の導体46を切断した状態で、第六の主電極14と第八の主電極16間のインピーダンス値をインピーダンスアナライザやLCRメータなどの測定器で測定する、もしくは計算式や計算ツールで計算することで得られる。 The impedance value between the sixth main electrode 14 and the eighth main electrode 16 is the state in which the ninth conductor 51, the tenth conductor 52, the third conductor 45, and the fourth conductor 46 are cut. It can be obtained by measuring the impedance value between the sixth main electrode 14 and the eighth main electrode 16 with a measuring instrument such as an impedance analyzer or an LCR meter, or by calculating with a calculation formula or a calculation tool.

第二の主電極10と第四の主電極12との間のインピーダンス値は、第九の導体51、第十の導体52、第一の導体43、第二の導体44を切断した状態で、第二の主電極10と第四の主電極12間のインピーダンス値をインピーダンスアナライザやLCRメータなどの測定器で測定する、もしくは計算式や計算ツールで計算することで得られる。 The impedance value between the second main electrode 10 and the fourth main electrode 12 is the state in which the ninth conductor 51, the tenth conductor 52, the first conductor 43, and the second conductor 44 are cut. It can be obtained by measuring the impedance value between the second main electrode 10 and the fourth main electrode 12 with a measuring instrument such as an impedance analyzer or an LCR meter, or by calculating with a calculation formula or a calculation tool.

第六の主電極14から第七の導体49、第七の配線パターン33、第七の配線パターン33と第八の配線パターン34との間の配線と前記第四の補助端子42との接続点、第八の配線パターン34、第八の導体50を通り、第八の主電極16に至る経路のインピーダンス値の測定もしくは計算には、まず、第九の導体51、第十の導体52、第三の導体45、第四の導体46を切断する。次に、第六の主電極14から第七の導体49、第七の配線パターン33、第七の配線パターン33と第八の配線パターン34との間の配線と前記第四の補助端子42との接続点、第八の配線パターン34、第八の導体50を通り、第八の主電極16に至る経路以外の第六の主電極14と第八の主電極16を接続する配線を切断する。その後、第六の主電極14と第八の主電極16間のインピーダンス値をインピーダンスアナライザやLCRメータなどの測定器で測定する、もしくは計算式や計算ツールで計算することで得られる。 A connection point between the sixth main electrode 14 to the seventh conductor 49, the seventh wiring pattern 33, the wiring between the seventh wiring pattern 33 and the eighth wiring pattern 34, and the fourth auxiliary terminal 42. In the measurement or calculation of the impedance value of the path through the eighth wiring pattern 34 and the eighth conductor 50 to the eighth main electrode 16, first, the ninth conductor 51, the tenth conductor 52, and the ninth conductor The third conductor 45 and the fourth conductor 46 are cut. Next, the wiring between the sixth main electrode 14 to the seventh conductor 49, the seventh wiring pattern 33, the seventh wiring pattern 33 and the eighth wiring pattern 34, and the fourth auxiliary terminal 42 The wiring connecting the sixth main electrode 14 and the eighth main electrode 16 other than the path leading to the eighth main electrode 16 through the connection point, the eighth wiring pattern 34, and the eighth conductor 50 is cut. .. After that, the impedance value between the sixth main electrode 14 and the eighth main electrode 16 can be obtained by measuring with a measuring instrument such as an impedance analyzer or an LCR meter, or by calculating with a calculation formula or a calculation tool.

図6に図4と図5に示した構成と図1と図2に示した本発明の第一の実施形態における2回目のターンオン時の波形のシミュレーション結果を比較した図を示す。従来技術(図4と図5に示した構成)では、自励振動による上アームゲート電圧振動Vge_Hが大きく、上アームスイッチング素子電流Ic_Hや上アームスイッチング素子電圧Vce_Hも大きく振動していることがわかる。 FIG. 6 shows a diagram comparing the configuration shown in FIGS. 4 and 5 with the simulation result of the waveform at the time of the second turn-on in the first embodiment of the present invention shown in FIGS. 1 and 2. It can be seen that in the prior art (configurations shown in FIGS. 4 and 5), the upper arm gate voltage vibration Vge_H due to self-excited vibration is large, and the upper arm switching element current Ic_H and the upper arm switching element voltage Vce_H also vibrate significantly. ..

それに対して、本発明の実施形態1では自励振動による上アームゲート電圧振動Vge_Hを抑制し、上アームスイッチング素子電流Ic_Hや上アームスイッチング素子電圧Vce_Hの振動も抑制できていることがわかる。 On the other hand, in the first embodiment of the present invention, it can be seen that the upper arm gate voltage vibration Vge_H due to self-excited vibration can be suppressed, and the vibration of the upper arm switching element current Ic_H and the upper arm switching element voltage Vce_H can also be suppressed.

ここで、ゲート電圧振動の抑制とは、IGBTであればゲート電圧に振動が重畳してもゲート電圧を+20Vから−20Vの範囲内に抑えることを指す。 Here, the suppression of the gate voltage vibration means that the gate voltage is suppressed within the range of + 20V to -20V even if the vibration is superimposed on the gate voltage in the case of the IGBT.

なお、第十二の導体54は、できるだけ低インピーダンス化したほうが、より共振電流Irのバイパス効果が高いため、短距離の複数導体によって実現することが好ましい。また、第十二の導体54は、アルミニウムワイヤや銅ワイヤ、銅リード等の電極間を電気的に接続できる導体であればよい。 It should be noted that the twelfth conductor 54 is preferably realized by a plurality of short-distance conductors because the bypass effect of the resonance current Ir is higher when the impedance is lowered as much as possible. Further, the twelfth conductor 54 may be a conductor capable of electrically connecting electrodes such as an aluminum wire, a copper wire, and a copper lead.

図7を用いて本発明の第二の実施形態の構成を説明する。図7は本発明の第二の実施形態の構成を示した平面図である。図1と図7の違いは、第十二の導体54と第十三の導体55の有無のみである。本発明の第二の実施形態では、第一の主電極用配線パターン9と第三の主電極用配線パターン11間を第十三の導体55で接続する。第一の主電極用配線パターン9と第三の主電極用配線パターン11の電位は、第六の主電極14と第八の主電極16と同様に本発明の2in1モジュールの中点電位である。そのため、図7の構成でも図1の第六の主電極14と第八の主電極16を第十二の導体54で接続した構成と同等のゲート電圧振動抑制効果を得ることができる。 The configuration of the second embodiment of the present invention will be described with reference to FIG. 7. FIG. 7 is a plan view showing the configuration of the second embodiment of the present invention. The only difference between FIGS. 1 and 7 is the presence or absence of the twelfth conductor 54 and the thirteenth conductor 55. In the second embodiment of the present invention, the wiring pattern 9 for the first main electrode and the wiring pattern 11 for the third main electrode are connected by the thirteenth conductor 55. The potentials of the first main electrode wiring pattern 9 and the third main electrode wiring pattern 11 are the midpoint potentials of the 2in1 module of the present invention, similarly to the sixth main electrode 14 and the eighth main electrode 16. .. Therefore, even with the configuration of FIG. 7, it is possible to obtain the same gate voltage vibration suppression effect as the configuration in which the sixth main electrode 14 and the eighth main electrode 16 of FIG. 1 are connected by the twelfth conductor 54.

実施例1と比較して、実施例2は接続する主電極間の距離が短いため、主電極間を接続する導体の配線インダクタンスを小さくすることができる。また、接続する主電極の面積も実施例1より実施例2の方が広いため導体の並列数や太さを増加させて、より導体の配線インダクタンスを小さくし易い。前述の通り、主電極間を接続する導体はできるだけ低インピーダンス化したほうが、より共振電流Irのバイパス効果が高い。 Since the distance between the main electrodes to be connected is shorter in the second embodiment as compared with the first embodiment, the wiring inductance of the conductor connecting the main electrodes can be reduced. Further, since the area of the main electrode to be connected is also larger in the second embodiment than in the first embodiment, it is easy to increase the number of parallel conductors and the thickness of the conductors to further reduce the wiring inductance of the conductors. As described above, when the impedance of the conductor connecting the main electrodes is made as low as possible, the bypass effect of the resonance current Ir is higher.

図8から図10を用いて本発明の第三の実施形態の構成を説明する。図8は本発明の第三の実施形態の構成を示した平面図である。図1と図8の違いは、第十二の導体54と抵抗器106の有無のみである。本発明の第三の実施形態では、第二の主電極10から第五の導体47、第五の配線パターン31、第五の配線パターン31と第六の配線パターン32の間の配線と第三の補助端子41との接続点、第六の配線パターン32、第六の導体48を通り、第四の主電極12に至る経路の間に抵抗器106を接続する。抵抗器106の接続の目的は、第二の主電極10と第四の主電極12の間のインピーダンス値を高め、前記LC共振電流Irを抑制することである。 The configuration of the third embodiment of the present invention will be described with reference to FIGS. 8 to 10. FIG. 8 is a plan view showing the configuration of the third embodiment of the present invention. The only difference between FIGS. 1 and 8 is the presence or absence of the twelfth conductor 54 and the resistor 106. In the third embodiment of the present invention, the wiring between the second main electrode 10 to the fifth conductor 47, the fifth wiring pattern 31, the fifth wiring pattern 31 and the sixth wiring pattern 32, and the third. The resistor 106 is connected between the connection point with the auxiliary terminal 41, the sixth wiring pattern 32, the sixth conductor 48, and the path to the fourth main electrode 12. The purpose of connecting the resistor 106 is to increase the impedance value between the second main electrode 10 and the fourth main electrode 12 and suppress the LC resonance current Ir.

図9に本発明の第三の実施形態の等価回路図とLC共振電流Ir経路を示す。前述の図6で示したように、上アーム駆動時において、上アームのゲート配線である3GL−4GL間の経路と3EL−4EL間の経路と並列とならない第二の主電極10と第四の主電極12の間のインピーダンス値を減少させると上アームゲート電圧振動は増加してしまう。 FIG. 9 shows an equivalent circuit diagram of the third embodiment of the present invention and an LC resonance current Ir path. As shown in FIG. 6 above, when the upper arm is driven, the second main electrode 10 and the fourth main electrode 10 and the fourth main electrode are not parallel to the path between 3GL-4GL and the path between 3EL-4EL, which are the gate wirings of the upper arm. When the impedance value between the main electrodes 12 is reduced, the upper arm gate voltage vibration increases.

そこで、本実施例では、図8に示すように、逆に第二の主電極10と第四の主電極12の間に抵抗器106を接続し、インピーダンス値を増加させることで上アームゲート電圧振動を抑制する。図9に示すように抵抗器106はLC共振電流Ir経路に挿入されるため、LC共振電流Irを低減し、上アームのゲート配線に流れる共振電流Irを低減することで上アームゲート電圧振動を抑制できる。 Therefore, in this embodiment, as shown in FIG. 8, a resistor 106 is connected between the second main electrode 10 and the fourth main electrode 12, and the impedance value is increased to increase the upper arm gate voltage. Suppress vibration. As shown in FIG. 9, since the resistor 106 is inserted into the LC resonance current Ir path, the LC resonance current Ir is reduced, and the resonance current Ir flowing through the gate wiring of the upper arm is reduced to reduce the upper arm gate voltage vibration. Can be suppressed.

図10に図4と図5で示した構成と本発明の第三の実施形態における2回目ターンオン時の波形のシミュレーション結果を比較した図を示す。本発明の第三の実施形態においても、従来技術(図4と図5で示した構成)と比較して、自励振動による上アームゲート電圧振動Vge_Hを抑制し、上アームスイッチング素子電流Ic_Hや上アームスイッチング素子電圧Vce_Hの振動も抑制できていることがわかる。 FIG. 10 shows a diagram comparing the configurations shown in FIGS. 4 and 5 with the simulation results of the waveform at the time of the second turn-on in the third embodiment of the present invention. Also in the third embodiment of the present invention, as compared with the prior art (configuration shown in FIGS. 4 and 5), the upper arm gate voltage vibration Vge_H due to self-excited vibration is suppressed, and the upper arm switching element current Ic_H and It can be seen that the vibration of the upper arm switching element voltage Vce_H can also be suppressed.

なお、抵抗器106によって増加したゲート抵抗値分は、図示しないスイッチング素子の内蔵ゲート抵抗値やパワー半導体モジュールの外付けゲート抵抗値を下げることで、抵抗器106の挿入によるスイッチング損失の増加なしにゲート電圧振動を抑制できる。 The gate resistance value increased by the resistor 106 can be reduced by lowering the built-in gate resistance value of the switching element (not shown) or the external gate resistance value of the power semiconductor module without increasing the switching loss due to the insertion of the resistor 106. Gate voltage vibration can be suppressed.

また、抵抗器106の代わりにインダクタを挿入したり、第五の配線パターン31と第六の配線パターン32の間の配線長を意図的に長くするなどして第二の主電極10と第四の主電極12の間のインピーダンス値を増加させてもよい。 Further, the second main electrode 10 and the fourth are made by inserting an inductor instead of the resistor 106 or intentionally increasing the wiring length between the fifth wiring pattern 31 and the sixth wiring pattern 32. The impedance value between the main electrodes 12 of the above may be increased.

実施例3では、主電極間を接続する導体が不要なため、絶縁基板上のスイッチング素子やダイオードなどの実装レイアウトの影響を受けずに実施することができる。 In the third embodiment, since the conductor connecting the main electrodes is not required, it can be carried out without being affected by the mounting layout such as the switching element and the diode on the insulating substrate.

図11と図12を用いて本発明の第四の実施形態の構成を説明する。図11に本発明の第四の実施形態の構成を示した平面図を示す。本発明の第四の実施形態は、第一の実施形態と第二の実施形態を組み合わせた構成である。 The configuration of the fourth embodiment of the present invention will be described with reference to FIGS. 11 and 12. FIG. 11 shows a plan view showing the configuration of the fourth embodiment of the present invention. The fourth embodiment of the present invention is a combination of the first embodiment and the second embodiment.

但し、第十三の導体55の並列数を増加し、導体の配線インダクタンスの低減を図っている。図11では3本の第十三の導体55を設けた例を示している。また、第十二の導体54を用いて直接第六の主電極14と第八の主電極16との間を接続せずに、配線107、配線パターン109、配線パターン110、配線108を介して接続した。 However, the number of parallel conductors 55 is increased to reduce the wiring inductance of the conductors. FIG. 11 shows an example in which three thirteenth conductors 55 are provided. Further, the twelfth conductor 54 is used to connect the sixth main electrode 14 and the eighth main electrode 16 directly, but via the wiring 107, the wiring pattern 109, the wiring pattern 110, and the wiring 108. Connected.

これは実装上、第六の主電極14と第八の主電極16の間に構造物があり、直接第六の主電極14と第八の主電極16の間を第十二の導体54で接続することができない場合を想定した構成である。 In terms of mounting, there is a structure between the sixth main electrode 14 and the eighth main electrode 16, and a twelfth conductor 54 is directly between the sixth main electrode 14 and the eighth main electrode 16. The configuration is based on the assumption that it cannot be connected.

図12に本発明の第四の実施形態の等価回路図および外部回路との接続例を示す。本発明の第四の実施形態では、上アームのゲート配線である3GL−4GL間の経路と3EL−4EL間の経路と並列に第十二の導体54と第十三の導体55による2つの経路を追加した。それにより、それぞれの導体を単独で接続した場合と比較して、よりアームのゲート配線に流れる共振電流Irを低減し、上アームゲート電圧振動の抑制効果を高めることができる。 FIG. 12 shows an equivalent circuit diagram of a fourth embodiment of the present invention and an example of connection with an external circuit. In the fourth embodiment of the present invention, there are two paths by the twelfth conductor 54 and the thirteenth conductor 55 in parallel with the path between 3GL-4GL and the path between 3EL-4EL, which are the gate wirings of the upper arm. Was added. As a result, the resonance current Ir flowing through the gate wiring of the arm can be further reduced and the effect of suppressing the upper arm gate voltage vibration can be enhanced as compared with the case where each conductor is connected independently.

本発明によるパワー半導体モジュールの製作工数を極力減らすために、主電極間の接続導体は最小限とすることが望ましいが、図6、図10のシミュレーション条件と比較してよりゲート電圧振動が発生しやすい条件では、第四の実施形態のように主電極間の接続導体を増加させることで、対策するのが効果的である。 In order to reduce the man-hours for manufacturing the power semiconductor module according to the present invention as much as possible, it is desirable to minimize the number of connecting conductors between the main electrodes. Under easy conditions, it is effective to take measures by increasing the number of connecting conductors between the main electrodes as in the fourth embodiment.

図13と図14を用いて本発明の第五の実施形態の構成を説明する。図13に本発明の第五の実施形態の構成を示した平面図を示す。本発明の第五の実施形態は、第三の実施形態と第四の実施形態を組み合わせた構成である。図13は図11に抵抗器106を追加した図である。前述の通り、抵抗器106を追加することで、第二の主電極10と第四の主電極12の間のインピーダンス値を高めることができる。 The configuration of the fifth embodiment of the present invention will be described with reference to FIGS. 13 and 14. FIG. 13 shows a plan view showing the configuration of the fifth embodiment of the present invention. The fifth embodiment of the present invention is a combination of the third embodiment and the fourth embodiment. FIG. 13 is a diagram in which a resistor 106 is added to FIG. As described above, by adding the resistor 106, the impedance value between the second main electrode 10 and the fourth main electrode 12 can be increased.

図14に本発明の第五の実施形態の等価回路図および外部回路との接続例を示す。抵抗器106を追加することにより、第四の実施形態と比較してさらにLC共振電流Irを低減し、上アームのゲート配線に流れる共振電流Irを低減することで上アームゲート電圧振動の抑制効果を高めることができる。 FIG. 14 shows an equivalent circuit diagram of a fifth embodiment of the present invention and an example of connection with an external circuit. By adding the resistor 106, the LC resonance current Ir is further reduced as compared with the fourth embodiment, and by reducing the resonance current Ir flowing through the gate wiring of the upper arm, the effect of suppressing the voltage vibration of the upper arm gate is suppressed. Can be enhanced.

なお、導体による主電極間の接続や抵抗器の挿入についての全ての組み合わせについての説明は省略するが、第一の実施形態から第三の実施形態の3つの実施形態の中から1つ実施形態を選択した組合せ、2つ実施形態を選択した組合せ、3つ実施形態を選択した組合せの全てにおいてゲート電圧振動を抑制する効果が得られるのは言うまでもない。 Although the description of all combinations of the connection between the main electrodes by the conductor and the insertion of the resistor is omitted, one of the three embodiments from the first embodiment to the third embodiment will be omitted. Needless to say, the effect of suppressing the gate voltage vibration can be obtained in all the combinations in which the above is selected, the combination in which the two embodiments are selected, and the combination in which the three embodiments are selected.

図15に本発明の第六の実施形態の構成を示す。本発明の第六の実施形態は、本発明によるパワー半導体モジュール144を搭載した電力変換システム(電力変換装置)152である。図15では、直流電源84を電源として3台の本発明によるパワー半導体モジュール144で三相インバータを構成している。 FIG. 15 shows the configuration of the sixth embodiment of the present invention. A sixth embodiment of the present invention is a power conversion system (power conversion device) 152 equipped with the power semiconductor module 144 according to the present invention. In FIG. 15, a three-phase inverter is composed of three power semiconductor modules 144 according to the present invention, using the DC power supply 84 as a power source.

本発明によるパワー半導体モジュール144の中点電位端子は、負荷であるモータ146とそれぞれ接続させる。制御装置145は、電流センサ(147,148,149)により検出するモータ146の三相電流(Iu,Iv,Iw)と速度検出器150により検出するモータ146の回転速度(ω)の情報を元に3台のパワー半導体モジュール144に印加するゲート電圧値を演算し、各パワー半導体モジュール144の補助端子へ出力する。 The midpoint potential terminal of the power semiconductor module 144 according to the present invention is connected to the motor 146, which is a load, respectively. The control device 145 is based on the information of the three-phase current (Iu, Iv, Iw) of the motor 146 detected by the current sensor (147, 148, 149) and the rotation speed (ω) of the motor 146 detected by the speed detector 150. The gate voltage value applied to the three power semiconductor modules 144 is calculated and output to the auxiliary terminals of each power semiconductor module 144.

本発明によるパワー半導体モジュール144は、ゲート抵抗値の増加なしにゲート電圧振動を抑制できるため、従来技術と比較してパワー半導体モジュールのスイッチング損失を低減することができる。従って、本発明によるパワー半導体モジュール144を電力変換システム(電力変換装置)152の電力変換回路151に搭載することで、従来と比較してより高効率な電力変換システム(電力変換装置)を構成することができる。 Since the power semiconductor module 144 according to the present invention can suppress the gate voltage vibration without increasing the gate resistance value, the switching loss of the power semiconductor module can be reduced as compared with the prior art. Therefore, by mounting the power semiconductor module 144 according to the present invention on the power conversion circuit 151 of the power conversion system (power conversion device) 152, a more efficient power conversion system (power conversion device) can be configured as compared with the conventional one. be able to.

なお、本発明は上記した実施例に限定されるものではなく、様々な変形例が含まれる。例えば、上記の実施例は本発明に対する理解を助けるために詳細に説明したものであり、必ずしも説明した全ての構成を備えるものに限定されるものではない。また、ある実施例の構成の一部を他の実施例の構成に置き換えることが可能であり、また、ある実施例の構成に他の実施例の構成を加えることも可能である。また、各実施例の構成の一部について、他の構成の追加・削除・置換をすることが可能である。 The present invention is not limited to the above-described examples, and includes various modifications. For example, the above examples have been described in detail to aid in understanding of the present invention, and are not necessarily limited to those having all the configurations described. Further, it is possible to replace a part of the configuration of one embodiment with the configuration of another embodiment, and it is also possible to add the configuration of another embodiment to the configuration of one embodiment. Further, it is possible to add / delete / replace a part of the configuration of each embodiment with another configuration.

1…第一の絶縁基板
2…第二の絶縁基板
3…第三の絶縁基板
4…第四の絶縁基板
5…第一のスイッチング素子
6…第二のスイッチング素子
7…第三のスイッチング素子
8…第四のスイッチング素子
9…第一の主電極用配線パターン
10…第二の主電極
11…第三の主電極用配線パターン
12…第四の主電極
13…第五の主電極用配線パターン
14…第六の主電極
15…第七の主電極用配線パターン
16…第八の主電極
17…第一のスイッチング素子のゲート電極
18…第二のスイッチング素子のゲート電極
19…第三のスイッチング素子のゲート電極
20…第四のスイッチング素子のゲート電極
21…第一の主端子
22…第二の主端子
23…第三の主端子
24…第四の主端子
25…第五の主端子
26…第六の主端子
27…第一の配線パターン
28…第二の配線パターン
29…第三の配線パターン
30…第四の配線パターン
31…第五の配線パターン
32…第六の配線パターン
33…第七の配線パターン
34…第八の配線パターン
35…第一の下アーム共通配線パターン
36…第二の下アーム共通配線パターン
37…第一の上アーム共通配線パターン
38…第二の上アーム共通配線パターン
39…第一の補助端子
40…第二の補助端子
41…第三の補助端子
42…第四の補助端子
43…第一の導体
44…第二の導体
45…第三の導体
46…第四の導体
47…第五の導体
48…第六の導体
49…第七の導体
50…第八の導体
51…第九の導体
52…第十の導体
54…第十二の導体
55…第十三の導体
56…第一の配線パターン27と第一の下アーム共通配線パターン35との間の第一の配線
57…第二の配線パターン28と第一の下アーム共通配線パターン35との間の第二の配線
58…第三の配線パターン29と第一の上アーム共通配線パターン37との間の第一の配線
59…第四の配線パターン30と第一の上アーム共通配線パターン37との間の第二の配線
60…第五の配線パターン31と第二の下アーム共通配線パターン36との間の第一の配線
61…第六の配線パターン32と第二の下アーム共通配線パターン36との間の第二の配線
62…第七の配線パターン33と第二の上アーム共通配線パターン38との間の第一の配線
63…第八の配線パターン34と第二の上アーム共通配線パターン38との間の第二の配線
64…第一の下アーム共通配線パターン35と第一の補助端子39との間の配線
65…第一の上アーム共通配線パターン37と第二の補助端子40との間の配線
66…第二の下アーム共通配線パターン36と第三の補助端子41との間の配線
67…第二の上アーム共通配線パターン38と第四の補助端子42との間の配線
68…第二の主電極10と第二の主端子22との間の配線
69…第四の主電極12と第四の主端子24との間の配線
70…第五の主電極用配線パターン13と第五の主端子25との間の配線
71…第七の主電極用配線パターン15と第六の主端子26との間の配線
72…第一のダイオード
73…第二のダイオード
74…第三のダイオード
75…第四のダイオード
76…第一のダイオードのアノード電極
77…第二のダイオードのアノード電極
78…第三のダイオードのアノード電極
79…第四のダイオードのアノード電極
80…第二の主電極10と第一のダイオードのアノード電極76との間の配線
81…第四の主電極12と第二のダイオードのアノード電極77との間の配線
82…第六の主電極14と第三のダイオードのアノード電極78との間の配線
83…第八の主電極16と第四のダイオードのアノード電極79との間の配線
84…直流電源
85…コンデンサ
86…直流電源84とコンデンサ85の間の第一の配線
87…第五の主端子25と第六の主端子26の間の第一の配線
88…第五の主端子25と第六の主端子26の間の第二の配線
89…第五の主端子25と第六の主端子26の間の第一の配線87と第五の主端子25と第六の主端子26の間の第二の配線88の中点とコンデンサ85との間の配線
90…直流電源84とコンデンサ85の間の第二の配線
91…第二の主端子22と第四の主端子24の間の第一の配線
92…第二の主端子22と第四の主端子24の間の第二の配線
93…第二の主端子22と第四の主端子24の間の第一の配線91と第二の主端子22と第四の主端子24の間の第二の配線92の中点とコンデンサ85との間の配線
94…第一の主端子21と第三の主端子23の間の第一の配線
95…第一の主端子21と第三の主端子23の間の第二の配線
96…負荷インダクタンス(インダクタンス負荷)
98…第一の絶縁子基板
99…第二の絶縁子基板
100…放熱用金属板
101…樹脂筐体
102…ゲート駆動電源
103…ゲート配線インダクタンス
105…第十四の導体
106…抵抗器
107…配線
108…配線
109…配線パターン
110…配線パターン
111…第一の主電極と第二の主電極10間の静電容量
112…第一の主電極と第一のスイッチング素子のゲート電極17間の静電容量
113…第一のスイッチング素子のゲート電極17と第二の主電極10間の静電容量
114…接合面
115…接合面
121…第三の主電極と第四の主電極12間の静電容量
122…第三の主電極と第二のスイッチング素子のゲート電極18間の静電容量
123…第三のスイッチング素子のゲート電極19と第四の主電極12間の静電容量
131…第五の主電極と第六の主電極14間の静電容量
132…第五の主電極と第三のスイッチング素子のゲート電極19間の静電容量
133…第三のスイッチング素子のゲート電極19と第六の主電極14間の静電容量
141…第七の主電極と第八の主電極16間の静電容量
142…第七の主電極と第四のスイッチング素子のゲート電極20間の静電容量
143…第四のスイッチング素子のゲート電極20と第八の主電極16間の静電容量
144…本発明によるパワー半導体モジュール(2in1モジュール)
145…制御装置
146…モータ
147…電流センサ
148…電流センサ
149…電流センサ
150…速度検出器
151…電力変換回路
152…電力変換システム(電力変換装置)
1 ... 1st insulating substrate 2 ... 2nd insulating substrate 3 ... 3rd insulating substrate 4 ... 4th insulating substrate 5 ... 1st switching element 6 ... 2nd switching element 7 ... 3rd switching element 8 ... Fourth switching element 9 ... Wiring pattern for the first main conductor 10 ... Wiring pattern for the second main conductor 11 ... Wiring pattern for the third main electrode 12 ... Wiring pattern for the fourth main electrode 13 ... Wiring pattern for the fifth main electrode 14 ... 6th main conductor 15 ... Wiring pattern for 7th main conductor 16 ... 8th main conductor 17 ... Gate electrode of 1st switching element 18 ... Gate electrode of 2nd switching element 19 ... 3rd switching Element gate electrode 20 ... Fourth switching element gate electrode 21 ... First main terminal 22 ... Second main terminal 23 ... Third main terminal 24 ... Fourth main terminal 25 ... Fifth main terminal 26 ... 6th main terminal 27 ... 1st wiring pattern 28 ... 2nd wiring pattern 29 ... 3rd wiring pattern 30 ... 4th wiring pattern 31 ... 5th wiring pattern 32 ... 6th wiring pattern 33 ... Seventh wiring pattern 34 ... Eighth wiring pattern 35 ... First lower arm common wiring pattern 36 ... Second lower arm common wiring pattern 37 ... First upper arm common wiring pattern 38 ... Second upper arm common Wiring pattern 39 ... 1st auxiliary terminal 40 ... 2nd auxiliary terminal 41 ... 3rd auxiliary terminal 42 ... 4th auxiliary terminal 43 ... 1st conductor 44 ... 2nd conductor 45 ... 3rd conductor 46 ... Fourth conductor 47 ... Fifth conductor 48 ... Sixth conductor 49 ... Seventh conductor 50 ... Eighth conductor 51 ... Ninth conductor 52 ... Tenth conductor 54 ... Twelfth conductor 55 ... Ninth Thirteen conductors 56 ... First wiring between the first wiring pattern 27 and the first lower arm common wiring pattern 35 57 ... The second wiring pattern 28 and the first lower arm common wiring pattern 35 Second wiring between 58 ... First wiring between the third wiring pattern 29 and the first upper arm common wiring pattern 59 ... First wiring between the third wiring pattern 29 and the first upper arm common wiring pattern 59 ... Fourth wiring pattern 30 and the first upper arm common wiring pattern 37 Second wiring between 60 ... Fifth wiring pattern 31 and second lower arm common wiring pattern 36 First wiring 61 ... Sixth wiring pattern 32 and second lower arm common wiring Second wiring between the pattern 36 62 ... First wiring between the seventh wiring pattern 33 and the second upper arm common wiring pattern 38 63 ... Eighth wiring pattern 34 and the second upper arm Common distribution Second wiring between the wire pattern 38 64 ... Wiring between the first lower arm common wiring pattern 35 and the first auxiliary terminal 39 65 ... First upper arm common wiring pattern 37 and the second auxiliary Wiring 66 ... Wiring between the second lower arm common wiring pattern 36 and the third auxiliary terminal 41 67 ... Wiring between the second upper arm common wiring pattern 38 and the fourth auxiliary terminal 42 Wiring between 68 ... Wiring between the second main electrode 10 and the second main terminal 22 69 ... Wiring between the fourth main electrode 12 and the fourth main terminal 24 70 ... Fifth main electrode Wiring between the wiring pattern 13 and the fifth main terminal 25 71 ... Wiring between the seventh main electrode wiring pattern 15 and the sixth main terminal 26 72 ... First diode 73 ... Second Diode 74 ... Third diode 75 ... Fourth diode 76 ... First diode anode electrode 77 ... Second diode anode electrode 78 ... Third diode anode electrode 79 ... Fourth diode anode electrode 80 ... Wiring between the second main electrode 10 and the anode electrode 76 of the first diode 81 ... Wiring between the fourth main electrode 12 and the anode electrode 77 of the second diode 82 ... Sixth main electrode Wiring between 14 and the anode electrode 78 of the third diode 83 ... Wiring between the eighth main electrode 16 and the anode electrode 79 of the fourth diode 84 ... DC power supply 85 ... Condenser 86 ... DC power supply 84 First wiring between the capacitors 85 87 ... First wiring between the fifth main terminal 25 and the sixth main terminal 26 88 ... The third wiring between the fifth main terminal 25 and the sixth main terminal 26 Second wiring 89 ... In the first wiring 87 between the fifth main terminal 25 and the sixth main terminal 26 and in the second wiring 88 between the fifth main terminal 25 and the sixth main terminal 26. Wiring between the point and the capacitor 85 90 ... Second wiring between the DC power supply 84 and the capacitor 85 91 ... First wiring between the second main terminal 22 and the fourth main terminal 24 92 ... Second Second wiring 93 between the main terminal 22 and the fourth main terminal 24 ... The first wiring 91 between the second main terminal 22 and the fourth main terminal 24, the second main terminal 22, and the second Wiring between the midpoint of the second wiring 92 between the four main terminals 24 and the capacitor 85 94 ... First wiring between the first main terminal 21 and the third main terminal 23 95 ... First Second wiring between the main terminal 21 and the third main terminal 23 ... Load inductance (inductivity load)
98 ... 1st insulator board 99 ... 2nd insulator board 100 ... Metal plate for heat dissipation 101 ... Resin housing 102 ... Gate drive power supply 103 ... Gate wiring inductance 105 ... 14th conductor 106 ... Resistor 107 ... Wiring 108 ... Wiring 109 ... Wiring pattern 110 ... Wiring pattern 111 ... Capacitance between the first main electrode and the second main electrode 10 112 ... Between the first main electrode and the gate electrode 17 of the first switching element Capacitance 113 ... Capacitance between the gate electrode 17 of the first switching element and the second main electrode 10 114 ... Joint surface 115 ... Joint surface 121 ... Between the third main electrode and the fourth main electrode 12. Capacitance 122 ... Capacitance between the third main electrode and the gate electrode 18 of the second switching element 123 ... Capacitance between the gate electrode 19 of the third switching element and the fourth main electrode 12 131 ... Capacitance between the fifth main electrode and the sixth main electrode 14 132 ... Capacitance between the fifth main electrode and the gate electrode 19 of the third switching element 133 ... The gate electrode 19 of the third switching element Capacitance between the seventh main electrode 14 and the sixth main electrode 141 ... Capacitance between the seventh main electrode and the eighth main electrode 16 142 ... Between the seventh main electrode and the gate electrode 20 of the fourth switching element Capacitance 143 ... Capacitance between the gate electrode 20 of the fourth switching element and the eighth main electrode 16 144 ... Power semiconductor module (2in1 module) according to the present invention
145 ... Control device 146 ... Motor 147 ... Current sensor 148 ... Current sensor 149 ... Current sensor 150 ... Speed detector 151 ... Power conversion circuit 152 ... Power conversion system (power conversion device)

Claims (15)

第一の絶縁基板上に搭載され、第一の主電極と第二の主電極とゲート電極を備える第一のスイッチング素子と、
第二の絶縁基板上に搭載され、第三の主電極と第四の主電極とゲート電極を備える第二のスイッチング素子と、
第三の絶縁基板上に搭載され、第五の主電極と第六の主電極とゲート電極を備える第三のスイッチング素子と、
第四の絶縁基板上に搭載され、第七の主電極と第八の主電極とゲート電極を備える第四のスイッチング素子と、
前記第一の主電極と電気的に接続される第一の主端子と、
前記第二の主電極と電気的に接続される第二の主端子と、
前記第三の主電極と電気的に接続される第三の主端子と、
前記第四の主電極と電気的に接続される第四の主端子と、
前記第五の主電極と電気的に接続される第五の主端子と、
前記第七の主電極と電気的に接続される第六の主端子と、
前記第一のスイッチング素子のゲート電極と電気的に接続された第一の配線パターンと、
前記第二のスイッチング素子のゲート電極に電気的に接続された第二の配線パターンと、
前記第三のスイッチング素子のゲート電極と電気的に接続された第三の配線パターンと、
前記第四のスイッチング素子のゲート電極に電気的に接続された第四の配線パターンと、
前記第一のスイッチング素子のゲート電極と前記第一の配線パターンを電気的に接続する第一の導体と、
前記第二のスイッチング素子のゲート電極と前記第二の配線パターンを電気的に接続する第二の導体と、
前記第三のスイッチング素子のゲート電極と前記第三の配線パターンを電気的に接続する第三の導体と、
前記第四のスイッチング素子のゲート電極に前記第四の配線パターンを電気的に接続する第四の導体と、
前記第二の主電極に電気的に接続された第五の配線パターンと、
前記第四の主電極に電気的に接続された第六の配線パターンと、
前記第六の主電極に電気的に接続された第七の配線パターンと、
前記第八の主電極に電気的に接続された第八の配線パターンと、
前記第二の主電極と前記第五の配線パターンを電気的に接続する第五の導体と、
前記第四の主電極と前記第六の配線パターンを電気的に接続する第六の導体と、
前記第六の主電極と前記第七の配線パターンを電気的に接続する第七の導体と、
前記第八の主電極と前記第八の配線パターンを電気的に接続する第八の導体と、
前記第一の配線パターンおよび前記第二の配線パターンと電気的に接続された第一の補助端子と、
前記第三の配線パターンおよび前記第四の配線パターンと電気的に接続された第二の補助端子と、
前記第五の配線パターンおよび前記第六の配線パターンと電気的に接続された第三の補助端子と、
前記第七の配線パターンおよび前記第八の配線パターンと電気的に接続された第四の補助端子と、
前記第一の主電極と前記第六の主電極を電気的に接続する第九の導体と、
前記第三の主電極と前記第八の主電極を電気的に接続する第十の導体と、
を備えたパワー半導体モジュールにおいて、
前記第一の主電極と前記第三の主電極との間のインピーダンス値と、前記第五の主電極と前記第七の主電極との間のインピーダンス値と、前記第六の主電極と前記第八の主電極との間のインピーダンス値のうち、最小のインピーダンス値よりも、前記第二の主電極と前記第四の主電極との間のインピーダンス値が大きいこと特徴とするパワー半導体モジュール。
A first switching element mounted on a first insulating substrate and having a first main electrode, a second main electrode, and a gate electrode.
A second switching element mounted on a second insulating substrate and having a third main electrode, a fourth main electrode, and a gate electrode.
A third switching element mounted on a third insulating substrate and provided with a fifth main electrode, a sixth main electrode, and a gate electrode.
A fourth switching element mounted on a fourth insulating substrate and provided with a seventh main electrode, an eighth main electrode, and a gate electrode.
The first main terminal electrically connected to the first main electrode,
A second main terminal electrically connected to the second main electrode,
A third main terminal electrically connected to the third main electrode,
A fourth main terminal electrically connected to the fourth main electrode,
The fifth main terminal, which is electrically connected to the fifth main electrode,
The sixth main terminal, which is electrically connected to the seventh main electrode,
The first wiring pattern electrically connected to the gate electrode of the first switching element,
A second wiring pattern electrically connected to the gate electrode of the second switching element,
A third wiring pattern electrically connected to the gate electrode of the third switching element,
A fourth wiring pattern electrically connected to the gate electrode of the fourth switching element,
A first conductor that electrically connects the gate electrode of the first switching element and the first wiring pattern,
A second conductor that electrically connects the gate electrode of the second switching element and the second wiring pattern,
A third conductor that electrically connects the gate electrode of the third switching element and the third wiring pattern,
A fourth conductor that electrically connects the fourth wiring pattern to the gate electrode of the fourth switching element, and
A fifth wiring pattern electrically connected to the second main electrode and
A sixth wiring pattern electrically connected to the fourth main electrode and
A seventh wiring pattern electrically connected to the sixth main electrode and
The eighth wiring pattern electrically connected to the eighth main electrode and
A fifth conductor that electrically connects the second main electrode and the fifth wiring pattern,
A sixth conductor that electrically connects the fourth main electrode and the sixth wiring pattern,
A seventh conductor that electrically connects the sixth main electrode and the seventh wiring pattern,
An eighth conductor that electrically connects the eighth main electrode and the eighth wiring pattern,
The first wiring pattern and the first auxiliary terminal electrically connected to the second wiring pattern,
The third wiring pattern and the second auxiliary terminal electrically connected to the fourth wiring pattern,
The fifth wiring pattern and the third auxiliary terminal electrically connected to the sixth wiring pattern,
The seventh wiring pattern and the fourth auxiliary terminal electrically connected to the eighth wiring pattern,
A ninth conductor that electrically connects the first main electrode and the sixth main electrode,
A tenth conductor that electrically connects the third main electrode and the eighth main electrode,
In the power semiconductor module equipped with
The impedance value between the first main electrode and the third main electrode, the impedance value between the fifth main electrode and the seventh main electrode, and the sixth main electrode and the above. A power semiconductor module characterized in that the impedance value between the second main electrode and the fourth main electrode is larger than the minimum impedance value among the impedance values between the eighth main electrode.
請求項1に記載のパワー半導体モジュールにおいて、
前記第二の主電極と前記第四の主電極との間のインピーダンス値は、前記第六の主電極から前記第七の導体、前記第七の配線パターン、前記第七の配線パターンと前記第八の配線パターンとの間の配線と前記第四の補助端子との接続点、前記第八の配線パターン、前記第八の導体を通り、前記第八の主電極に至る経路のインピーダンス値以上であることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
The impedance value between the second main electrode and the fourth main electrode is from the sixth main electrode to the seventh conductor, the seventh wiring pattern, the seventh wiring pattern and the seventh. At the impedance value or higher of the connection point between the wiring between the eight wiring patterns and the fourth auxiliary terminal, the eighth wiring pattern, the eighth conductor, and the path to the eighth main electrode. A power semiconductor module characterized by being present.
請求項1に記載のパワー半導体モジュールにおいて、
前記第五の主電極と前記第七の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
A power semiconductor module characterized in that the fifth main electrode and the seventh main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項1に記載のパワー半導体モジュールにおいて、
前記第六の主電極と前記第八の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
A power semiconductor module characterized in that the sixth main electrode and the eighth main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項1に記載のパワー半導体モジュールにおいて、
前記第一の主電極と前記第三の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
A power semiconductor module characterized in that the first main electrode and the third main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項1に記載のパワー半導体モジュールにおいて、
前記第二の主電極から前記第五の導体、前記第五の配線パターン、前記第五の配線パターンと前記第六の配線パターンの間の配線と前記第三の補助端子との接続点、前記第六の配線パターン、前記第六の導体を通り、前記第四の主電極に至る経路の間に抵抗器が接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
The connection point between the second main electrode and the fifth conductor, the fifth wiring pattern, the wiring between the fifth wiring pattern and the sixth wiring pattern, and the third auxiliary terminal, the said. A power semiconductor module characterized in that a resistor is connected between a sixth wiring pattern, a path through the sixth conductor and a path to the fourth main electrode.
請求項1に記載のパワー半導体モジュールにおいて、
前記第二の主電極から前記第五の導体、前記第五の配線パターン、前記第五の配線パターンと前記第六の配線パターンの間の配線と前記第三の補助端子との接続点、前記第六の配線パターン、前記第六の導体を通り、前記第四の主電極に至る経路の間にインダクタが接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
The connection point between the second main electrode, the fifth conductor, the fifth wiring pattern, the wiring between the fifth wiring pattern and the sixth wiring pattern, and the third auxiliary terminal, the said. A power semiconductor module characterized in that an inductor is connected between a sixth wiring pattern, a path through the sixth conductor and a path to the fourth main electrode.
請求項1に記載のパワー半導体モジュールにおいて、
前記第二の主電極から前記第五の導体、前記第五の配線パターン、前記第五の配線パターンと前記第六の配線パターンの間の配線と前記第三の補助端子との接続点、前記第六の配線パターン、前記第六の導体を通り、前記第四の主電極に至る経路の配線長を、前記第六の主電極から前記第七の導体、前記第七の配線パターン、前記第七の配線パターンと前記第八の配線パターンの間の配線と前記第四の補助端子との接続点、前記第八の配線パターン、前記第八の導体を通り、前記第八の主電極に至る経路の配線長より長くしたことを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 1,
From the second main electrode to the fifth conductor, the fifth wiring pattern, the connection point between the wiring between the fifth wiring pattern and the sixth wiring pattern and the third auxiliary terminal, the said. The sixth wiring pattern, the wiring length of the path passing through the sixth conductor and reaching the fourth main electrode, is the wiring length from the sixth main electrode to the seventh conductor, the seventh wiring pattern, the seventh. It passes through the connection point between the wiring between the seventh wiring pattern and the eighth wiring pattern and the fourth auxiliary terminal, the eighth wiring pattern, the eighth conductor, and reaches the eighth main electrode. A power semiconductor module characterized by being longer than the wiring length of the path.
請求項4に記載のパワー半導体モジュールにおいて、
前記第五の主電極と前記第七の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 4,
A power semiconductor module characterized in that the fifth main electrode and the seventh main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項5に記載のパワー半導体モジュールにおいて、
前記第六の主電極と前記第八の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 5,
A power semiconductor module characterized in that the sixth main electrode and the eighth main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項6に記載のパワー半導体モジュールにおいて、
前記第一の主電極と前記第三の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 6,
A power semiconductor module characterized in that the first main electrode and the third main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項10に記載のパワー半導体モジュールにおいて、
前記第五の主電極と前記第七の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 10,
A power semiconductor module characterized in that the fifth main electrode and the seventh main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項11に記載のパワー半導体モジュールにおいて、
前記第六の主電極と前記第八の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 11,
A power semiconductor module characterized in that the sixth main electrode and the eighth main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項13に記載のパワー半導体モジュールにおいて、
前記第五の主電極と前記第七の主電極間は、前記パワー半導体モジュール内部で導体により電気的に接続されていることを特徴とするパワー半導体モジュール。
In the power semiconductor module according to claim 13,
A power semiconductor module characterized in that the fifth main electrode and the seventh main electrode are electrically connected by a conductor inside the power semiconductor module.
請求項1から14のいずれか1項に記載のパワー半導体モジュールを搭載したことを特徴とする電力変換装置。 A power conversion device including the power semiconductor module according to any one of claims 1 to 14.
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