JP6454299B2 - 弾性波デバイス - Google Patents
弾性波デバイス Download PDFInfo
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- JP6454299B2 JP6454299B2 JP2016097206A JP2016097206A JP6454299B2 JP 6454299 B2 JP6454299 B2 JP 6454299B2 JP 2016097206 A JP2016097206 A JP 2016097206A JP 2016097206 A JP2016097206 A JP 2016097206A JP 6454299 B2 JP6454299 B2 JP 6454299B2
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- 239000000758 substrate Substances 0.000 claims description 221
- 230000005540 biological transmission Effects 0.000 claims description 69
- 238000007789 sealing Methods 0.000 claims description 28
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 239000010408 film Substances 0.000 description 30
- 229910052751 metal Inorganic materials 0.000 description 30
- 239000002184 metal Substances 0.000 description 30
- 238000000034 method Methods 0.000 description 19
- 230000004048 modification Effects 0.000 description 19
- 238000012986 modification Methods 0.000 description 19
- 238000002955 isolation Methods 0.000 description 18
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 12
- 229910052802 copper Inorganic materials 0.000 description 12
- 239000010949 copper Substances 0.000 description 12
- 229910000679 solder Inorganic materials 0.000 description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 10
- 239000010931 gold Substances 0.000 description 10
- 229910052737 gold Inorganic materials 0.000 description 10
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 238000007747 plating Methods 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 238000010897 surface acoustic wave method Methods 0.000 description 4
- 229910052759 nickel Inorganic materials 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
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- H—ELECTRICITY
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- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
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- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/0504—Holders or supports for bulk acoustic wave devices
- H03H9/0514—Holders or supports for bulk acoustic wave devices consisting of mounting pads or bumps
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- H—ELECTRICITY
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- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
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- H03H9/0547—Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a vertical arrangement
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- H03H9/059—Holders or supports for surface acoustic wave devices consisting of mounting pads or bumps
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- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
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- H03H9/14544—Transducers of particular shape or position
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- H—ELECTRICITY
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- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/173—Air-gaps
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- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
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- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
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- Geometry (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Description
10a 支持基板
10b、10c 圧電基板
12、22 弾性波共振器
26 空隙
27、34 配線
28、35 パッド
30 端子
32、84、94、95 ビア配線
36 バンプ
37 グランドパターン
38、40 環状封止部
60 送信フィルタ
62 受信フィルタ
70 第1面
72 第2面
74 第3面
Claims (12)
- 第1基板と、
前記第1基板の第1面に設けられた第1弾性波フィルタと、
前記第1面に設けられ、前記第1面において前記第1弾性波フィルタと電気的に分離されたパッドと、
前記第1面に設けられ、前記第1面において前記パッドと前記第1弾性波フィルタとの間に設けられたグランドパターンと、
前記パッドと電気的に接続され、平面視において前記第1弾性波フィルタと少なくとも一部領域で重なる第2弾性波フィルタと、
を具備する弾性波デバイス。 - 前記第1基板の前記第1面と反対の面である第3面に設けられ、前記第1弾性波フィルタと電気的に接続された第1信号端子と、
前記第3面に設けられ、前記パッドを介して前記第2弾性波フィルタに電気的に接続された第2信号端子と、
前記第3面に設けられ、前記グランドパターンと電気的に接続されたグランド端子と、
前記第1基板の前記第1面上に搭載された第2基板を具備し、
前記第2弾性波フィルタは前記第2基板の第2面に設けられている請求項1記載の弾性波デバイス。 - 前記第2基板は、前記第2面が空隙を介し前記第1面と対向するように前記第1面上に搭載され、
前記第2弾性波フィルタと前記パッドとはバンプを介し電気的に接続されている請求項2記載の弾性波デバイス。 - 前記第1基板上に前記第1弾性波フィルタ、前記パッドおよび前記グランドパターンを囲むように設けられ、前記第1弾性波フィルタと前記第2弾性波フィルタとを前記空隙に封止する封止部を具備する請求項3記載の弾性波デバイス。
- 前記第2基板は、前記第2面の反対の面が前記第1面と対向するように前記第1面上に搭載されている請求項2記載の弾性波デバイス。
- 前記第1基板を貫通し、前記第1弾性波フィルタと前記第1信号端子とを電気的に接続する第1貫通配線と、
前記第1基板を貫通し、前記パッドと前記第2信号端子とを電気的に接続する第2貫通配線と、
を具備する請求項2から5のいずれか一項記載の弾性波デバイス。 - 第3面を有する第2基板と、
前記第3面に設けられ、前記第1弾性波フィルタと電気的に接続された第1信号端子と、
前記第3面に設けられ、前記パッドを介して前記第2弾性波フィルタに電気的に接続された第2信号端子と、
前記第3面に設けられ、前記グランドパターンと電気的に接続されたグランド端子と、
を具備し、
前記第1基板は、前記第2基板上に搭載され、
前記第2弾性波フィルタは、前記第1基板の前記第1面の反対の面である第2面に設けられている請求項1記載の弾性波デバイス。 - 前記第1基板は、前記第1面が前記第3面の反対の面に対向するように前記第2基板上に搭載されている請求項7記載の弾性波デバイス。
- 前記グランドパターンは、前記第1面において前記パッドを囲む請求項1から8のいずれか一項記載の弾性波デバイス。
- 前記グランドパターンは前記第1面において前記第1弾性波フィルタと電気的に分離している請求項1から9のいずれか一項記載の弾性波デバイス。
- 前記第1弾性波フィルタおよび前記第2弾性波フィルタのいずれか一方は共通端子と送信端子との間に接続された送信フィルタであり、
前記第1弾性波フィルタおよび前記第2弾性波フィルタの他方は前記共通端子と受信端子との間に接続され受信フィルタであり、
前記第1信号端子は前記送信端子および前記受信端子のいずれか一方であり、
前記第2信号端子は前記送信端子および前記受信端子の他方である請求項2から8のいずれか一項記載の弾性波デバイス。 - 前記第1弾性波フィルタと前記第2弾性波フィルタとの通過帯域は異なる請求項1から10のいずれか一項記載の弾性波デバイス。
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Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6661521B2 (ja) * | 2016-12-05 | 2020-03-11 | 太陽誘電株式会社 | フィルタおよびマルチプレクサ |
US10944379B2 (en) * | 2016-12-14 | 2021-03-09 | Qualcomm Incorporated | Hybrid passive-on-glass (POG) acoustic filter |
CN110114975B (zh) | 2016-12-26 | 2023-02-24 | 株式会社村田制作所 | 弹性波装置、高频前端模块以及通信装置 |
CN110771035B (zh) | 2017-06-21 | 2023-08-08 | 株式会社村田制作所 | 弹性波装置 |
JP7084739B2 (ja) | 2018-02-21 | 2022-06-15 | 太陽誘電株式会社 | マルチプレクサ |
JP7068902B2 (ja) | 2018-04-09 | 2022-05-17 | 太陽誘電株式会社 | マルチプレクサ |
JP7231368B2 (ja) | 2018-09-26 | 2023-03-01 | 太陽誘電株式会社 | 弾性波デバイス |
TWI677951B (zh) * | 2018-11-09 | 2019-11-21 | 恆勁科技股份有限公司 | 表面聲波濾波器封裝結構及其製作方法 |
US11368137B2 (en) | 2018-12-28 | 2022-06-21 | Skyworks Solutions, Inc. | Acoustic wave device with transverse mode suppression |
JP7426196B2 (ja) * | 2019-03-15 | 2024-02-01 | 太陽誘電株式会社 | 弾性波デバイスおよびその製造方法、フィルタ及びマルチプレクサ |
US12136910B2 (en) | 2019-06-07 | 2024-11-05 | Skyworks Solutions, Inc. | Acoustic wave resonator with patterned conductive layer for transverse mode suppression |
US11606078B2 (en) | 2019-07-18 | 2023-03-14 | Skyworks Solutions, Inc. | Acoustic wave resonator with rotated and tilted interdigital transducer electrode |
DE102019119677B4 (de) * | 2019-07-19 | 2025-01-23 | Rf360 Singapore Pte. Ltd. | HF-Empfangsfilter, HF-Duplexer und HF-Multiplexer |
JP7347989B2 (ja) * | 2019-08-13 | 2023-09-20 | 太陽誘電株式会社 | マルチプレクサ |
US11581870B2 (en) | 2019-09-27 | 2023-02-14 | Skyworks Solutions, Inc. | Stacked acoustic wave resonator package with laser-drilled VIAS |
US11936367B2 (en) | 2019-10-31 | 2024-03-19 | Skyworks Solutions, Inc. | Acoustic wave device with velocity reduction cover |
US12081189B2 (en) | 2019-11-21 | 2024-09-03 | Skyworks Solutions, Inc. | Packaged bulk acoustic wave resonator on acoustic wave device |
CN111030626A (zh) * | 2019-12-31 | 2020-04-17 | 武汉衍熙微器件有限公司 | 声波器件的制作方法及声波器件 |
CN111030629B (zh) * | 2019-12-31 | 2024-04-05 | 武汉衍熙微器件有限公司 | 声波器件的制作方法及声波器件 |
CN111030627A (zh) * | 2019-12-31 | 2020-04-17 | 武汉衍熙微器件有限公司 | 声波器件的制作方法及声波器件 |
US11689181B2 (en) * | 2020-05-27 | 2023-06-27 | Qualcomm Incorporated | Package comprising stacked filters with a shared substrate cap |
JP7527873B2 (ja) | 2020-07-15 | 2024-08-05 | 太陽誘電株式会社 | 弾性波デバイス |
CN111917394A (zh) * | 2020-08-20 | 2020-11-10 | 武汉衍熙微器件有限公司 | 声波器件、声波器件的制造方法及相关器件 |
JP7606306B2 (ja) | 2020-09-28 | 2024-12-25 | 太陽誘電株式会社 | マルチプレクサ |
WO2023026990A1 (ja) * | 2021-08-24 | 2023-03-02 | 株式会社村田製作所 | フィルタ装置及び複合フィルタ装置 |
US20230062981A1 (en) * | 2021-08-27 | 2023-03-02 | Skyworks Solutions, Inc. | Packaged multilayer piezoelectric surface acoustic wave device with conductive pillar |
CN113824421A (zh) * | 2021-09-08 | 2021-12-21 | 常州承芯半导体有限公司 | 一种声表面波谐振装置的封装方法 |
US20240213958A1 (en) * | 2022-12-21 | 2024-06-27 | RF360 Europe GmbH | Vertically coupled saw resonators |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000040939A (ja) * | 1998-07-24 | 2000-02-08 | Mitsubishi Electric Corp | 弾性表面波装置 |
TW488044B (en) * | 2001-02-09 | 2002-05-21 | Asia Pacific Microsystems Inc | Bulk acoustic filter and its package |
US7038559B2 (en) * | 2004-02-23 | 2006-05-02 | Ruby Richard C | Vertically separated acoustic filters and resonators |
ATE427582T1 (de) * | 2004-07-20 | 2009-04-15 | Murata Manufacturing Co | Piezoelektrisches filter |
JP4692024B2 (ja) | 2005-03-04 | 2011-06-01 | パナソニック株式会社 | 弾性表面波デバイス |
JP2006287782A (ja) * | 2005-04-04 | 2006-10-19 | Epson Toyocom Corp | トランスバーサル型sawフィルタ |
DE102005026243B4 (de) | 2005-06-07 | 2018-04-05 | Snaptrack, Inc. | Elektrisches Bauelement und Herstellungsverfahren |
KR101206030B1 (ko) * | 2006-01-25 | 2012-11-28 | 삼성전자주식회사 | 알에프 모듈, 멀티 알에프 모듈 및 그 제조방법 |
CN102763327B (zh) * | 2010-02-17 | 2015-07-29 | 株式会社村田制作所 | 弹性波设备 |
US8283835B2 (en) * | 2010-04-30 | 2012-10-09 | Epcos Ag | Guided bulk acoustic wave device having reduced height and method for manufacturing |
US8836449B2 (en) * | 2010-08-27 | 2014-09-16 | Wei Pang | Vertically integrated module in a wafer level package |
JP5472557B1 (ja) * | 2012-07-26 | 2014-04-16 | 株式会社村田製作所 | 複合電子部品及びそれを備える電子装置 |
JP2015070489A (ja) * | 2013-09-30 | 2015-04-13 | 日本電波工業株式会社 | デュプレクサ及び電子部品 |
US9634641B2 (en) * | 2013-11-06 | 2017-04-25 | Taiyo Yuden Co., Ltd. | Electronic module having an interconnection substrate with a buried electronic device therein |
JP6335476B2 (ja) * | 2013-11-06 | 2018-05-30 | 太陽誘電株式会社 | モジュール |
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