JP6107659B2 - Fluorine-containing ether compound, coating liquid, and method for producing substrate having surface treatment layer - Google Patents
Fluorine-containing ether compound, coating liquid, and method for producing substrate having surface treatment layer Download PDFInfo
- Publication number
- JP6107659B2 JP6107659B2 JP2013534743A JP2013534743A JP6107659B2 JP 6107659 B2 JP6107659 B2 JP 6107659B2 JP 2013534743 A JP2013534743 A JP 2013534743A JP 2013534743 A JP2013534743 A JP 2013534743A JP 6107659 B2 JP6107659 B2 JP 6107659B2
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- JP
- Japan
- Prior art keywords
- fluorine
- compound
- group
- containing ether
- ether compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 title claims description 124
- -1 ether compound Chemical class 0.000 title claims description 120
- 229910052731 fluorine Inorganic materials 0.000 title claims description 111
- 239000011737 fluorine Substances 0.000 title claims description 109
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 title claims description 105
- 239000000758 substrate Substances 0.000 title claims description 78
- 238000000576 coating method Methods 0.000 title claims description 77
- 239000007788 liquid Substances 0.000 title claims description 75
- 239000011248 coating agent Substances 0.000 title claims description 53
- 239000002335 surface treatment layer Substances 0.000 title claims description 52
- 238000004519 manufacturing process Methods 0.000 title claims description 37
- 238000000034 method Methods 0.000 claims description 58
- 239000000463 material Substances 0.000 claims description 40
- 239000003960 organic solvent Substances 0.000 claims description 28
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 16
- 125000005010 perfluoroalkyl group Chemical group 0.000 claims description 11
- 150000001335 aliphatic alkanes Chemical class 0.000 claims description 8
- 150000001491 aromatic compounds Chemical class 0.000 claims description 7
- 239000011521 glass Substances 0.000 claims description 7
- 125000000229 (C1-C4)alkoxy group Chemical group 0.000 claims description 5
- 239000011347 resin Substances 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 5
- 238000003618 dip coating Methods 0.000 claims description 4
- 125000005647 linker group Chemical group 0.000 claims description 4
- 238000005266 casting Methods 0.000 claims description 3
- 239000000919 ceramic Substances 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 3
- 238000007607 die coating method Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 238000004528 spin coating Methods 0.000 claims description 3
- 238000005507 spraying Methods 0.000 claims description 3
- 125000001183 hydrocarbyl group Chemical group 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 description 122
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 47
- 239000002243 precursor Substances 0.000 description 44
- 239000012535 impurity Substances 0.000 description 35
- 239000002585 base Substances 0.000 description 31
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 30
- 239000003921 oil Substances 0.000 description 29
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 24
- 239000002904 solvent Substances 0.000 description 24
- 239000000047 product Substances 0.000 description 23
- 238000006243 chemical reaction Methods 0.000 description 18
- 239000010408 film Substances 0.000 description 18
- HEDRZPFGACZZDS-MICDWDOJSA-N Trichloro(2H)methane Chemical compound [2H]C(Cl)(Cl)Cl HEDRZPFGACZZDS-MICDWDOJSA-N 0.000 description 16
- 239000003054 catalyst Substances 0.000 description 16
- 239000006227 byproduct Substances 0.000 description 15
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 15
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 14
- 125000003545 alkoxy group Chemical group 0.000 description 14
- PYOKUURKVVELLB-UHFFFAOYSA-N trimethyl orthoformate Chemical compound COC(OC)OC PYOKUURKVVELLB-UHFFFAOYSA-N 0.000 description 14
- 238000006459 hydrosilylation reaction Methods 0.000 description 13
- 238000005481 NMR spectroscopy Methods 0.000 description 12
- 125000004432 carbon atom Chemical group C* 0.000 description 12
- 238000010438 heat treatment Methods 0.000 description 12
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 11
- 150000002430 hydrocarbons Chemical group 0.000 description 11
- 125000001153 fluoro group Chemical group F* 0.000 description 10
- 239000012074 organic phase Substances 0.000 description 10
- 125000005372 silanol group Chemical group 0.000 description 10
- XXZOEDQFGXTEAD-UHFFFAOYSA-N 1,2-bis(trifluoromethyl)benzene Chemical compound FC(F)(F)C1=CC=CC=C1C(F)(F)F XXZOEDQFGXTEAD-UHFFFAOYSA-N 0.000 description 9
- 238000005160 1H NMR spectroscopy Methods 0.000 description 9
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- 229910052801 chlorine Inorganic materials 0.000 description 9
- 125000001309 chloro group Chemical group Cl* 0.000 description 9
- 239000010410 layer Substances 0.000 description 9
- 239000012046 mixed solvent Substances 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- 238000004381 surface treatment Methods 0.000 description 9
- SJBBXFLOLUTGCW-UHFFFAOYSA-N 1,3-bis(trifluoromethyl)benzene Chemical compound FC(F)(F)C1=CC=CC(C(F)(F)F)=C1 SJBBXFLOLUTGCW-UHFFFAOYSA-N 0.000 description 8
- 230000007423 decrease Effects 0.000 description 8
- 239000012299 nitrogen atmosphere Substances 0.000 description 8
- 125000003258 trimethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])[*:1] 0.000 description 8
- BHELZAPQIKSEDF-UHFFFAOYSA-N allyl bromide Chemical compound BrCC=C BHELZAPQIKSEDF-UHFFFAOYSA-N 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 7
- 150000002170 ethers Chemical class 0.000 description 7
- 238000000926 separation method Methods 0.000 description 7
- 238000001771 vacuum deposition Methods 0.000 description 7
- 238000007740 vapor deposition Methods 0.000 description 7
- 125000000217 alkyl group Chemical group 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 238000000655 nuclear magnetic resonance spectrum Methods 0.000 description 6
- 229910052697 platinum Inorganic materials 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- 238000006482 condensation reaction Methods 0.000 description 5
- 150000002148 esters Chemical class 0.000 description 5
- 238000006460 hydrolysis reaction Methods 0.000 description 5
- 229910001512 metal fluoride Inorganic materials 0.000 description 5
- 125000004430 oxygen atom Chemical group O* 0.000 description 5
- 239000010702 perfluoropolyether Substances 0.000 description 5
- 238000010992 reflux Methods 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 238000000354 decomposition reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000008020 evaporation Effects 0.000 description 4
- 125000005843 halogen group Chemical group 0.000 description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- 239000000543 intermediate Substances 0.000 description 4
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- 238000000746 purification Methods 0.000 description 4
- 239000012756 surface treatment agent Substances 0.000 description 4
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 4
- ZUHZGEOKBKGPSW-UHFFFAOYSA-N tetraglyme Chemical compound COCCOCCOCCOCCOC ZUHZGEOKBKGPSW-UHFFFAOYSA-N 0.000 description 4
- 229910052723 transition metal Inorganic materials 0.000 description 4
- 150000003624 transition metals Chemical class 0.000 description 4
- ZDHXKXAHOVTTAH-UHFFFAOYSA-N trichlorosilane Chemical compound Cl[SiH](Cl)Cl ZDHXKXAHOVTTAH-UHFFFAOYSA-N 0.000 description 4
- 239000005052 trichlorosilane Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 229910052783 alkali metal Inorganic materials 0.000 description 3
- 125000002947 alkylene group Chemical group 0.000 description 3
- 238000009835 boiling Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 150000002576 ketones Chemical class 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000011148 porous material Substances 0.000 description 3
- 238000011002 quantification Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- 125000006017 1-propenyl group Chemical group 0.000 description 2
- OFWDLJKVZZRPOX-UHFFFAOYSA-N 2,2,3,3-tetrafluorooxetane Chemical compound FC1(F)COC1(F)F OFWDLJKVZZRPOX-UHFFFAOYSA-N 0.000 description 2
- GVNVAWHJIKLAGL-UHFFFAOYSA-N 2-(cyclohexen-1-yl)cyclohexan-1-one Chemical compound O=C1CCCCC1C1=CCCCC1 GVNVAWHJIKLAGL-UHFFFAOYSA-N 0.000 description 2
- ATVJXMYDOSMEPO-UHFFFAOYSA-N 3-prop-2-enoxyprop-1-ene Chemical compound C=CCOCC=C ATVJXMYDOSMEPO-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 2
- 101150065749 Churc1 gene Proteins 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- 229910003849 O-Si Inorganic materials 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- 229910003872 O—Si Inorganic materials 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 102100038239 Protein Churchill Human genes 0.000 description 2
- 229910008051 Si-OH Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910002808 Si–O–Si Inorganic materials 0.000 description 2
- 229910006358 Si—OH Inorganic materials 0.000 description 2
- WQDUMFSSJAZKTM-UHFFFAOYSA-N Sodium methoxide Chemical compound [Na+].[O-]C WQDUMFSSJAZKTM-UHFFFAOYSA-N 0.000 description 2
- 235000002597 Solanum melongena Nutrition 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 239000003377 acid catalyst Substances 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 150000003973 alkyl amines Chemical class 0.000 description 2
- 238000004440 column chromatography Methods 0.000 description 2
- 230000018044 dehydration Effects 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 238000003682 fluorination reaction Methods 0.000 description 2
- 125000003709 fluoroalkyl group Chemical group 0.000 description 2
- 238000007756 gravure coating Methods 0.000 description 2
- ZQBFAOFFOQMSGJ-UHFFFAOYSA-N hexafluorobenzene Chemical compound FC1=C(F)C(F)=C(F)C(F)=C1F ZQBFAOFFOQMSGJ-UHFFFAOYSA-N 0.000 description 2
- PGFXOWRDDHCDTE-UHFFFAOYSA-N hexafluoropropylene oxide Chemical compound FC(F)(F)C1(F)OC1(F)F PGFXOWRDDHCDTE-UHFFFAOYSA-N 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 238000009776 industrial production Methods 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 150000003961 organosilicon compounds Chemical class 0.000 description 2
- 150000002978 peroxides Chemical group 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000007151 ring opening polymerisation reaction Methods 0.000 description 2
- 229930195734 saturated hydrocarbon Natural products 0.000 description 2
- FDNAPBUWERUEDA-UHFFFAOYSA-N silicon tetrachloride Chemical group Cl[Si](Cl)(Cl)Cl FDNAPBUWERUEDA-UHFFFAOYSA-N 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 2
- 239000005341 toughened glass Substances 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- GETTZEONDQJALK-UHFFFAOYSA-N (trifluoromethyl)benzene Chemical compound FC(F)(F)C1=CC=CC=C1 GETTZEONDQJALK-UHFFFAOYSA-N 0.000 description 1
- BYEAHWXPCBROCE-UHFFFAOYSA-N 1,1,1,3,3,3-hexafluoropropan-2-ol Chemical compound FC(F)(F)C(O)C(F)(F)F BYEAHWXPCBROCE-UHFFFAOYSA-N 0.000 description 1
- CWIFAKBLLXGZIC-UHFFFAOYSA-N 1,1,2,2-tetrafluoro-1-(2,2,2-trifluoroethoxy)ethane Chemical compound FC(F)C(F)(F)OCC(F)(F)F CWIFAKBLLXGZIC-UHFFFAOYSA-N 0.000 description 1
- USPWUOFNOTUBAD-UHFFFAOYSA-N 1,2,3,4,5-pentafluoro-6-(trifluoromethyl)benzene Chemical compound FC1=C(F)C(F)=C(C(F)(F)F)C(F)=C1F USPWUOFNOTUBAD-UHFFFAOYSA-N 0.000 description 1
- NBUKAOOFKZFCGD-UHFFFAOYSA-N 2,2,3,3-tetrafluoropropan-1-ol Chemical compound OCC(F)(F)C(F)F NBUKAOOFKZFCGD-UHFFFAOYSA-N 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 229930040373 Paraformaldehyde Natural products 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RHQDFWAXVIIEBN-UHFFFAOYSA-N Trifluoroethanol Chemical compound OCC(F)(F)F RHQDFWAXVIIEBN-UHFFFAOYSA-N 0.000 description 1
- 238000000560 X-ray reflectometry Methods 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 125000002252 acyl group Chemical group 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 125000003342 alkenyl group Chemical group 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000002519 antifouling agent Substances 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 125000000753 cycloalkyl group Chemical group 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- BITPLIXHRASDQB-UHFFFAOYSA-N ethenyl-[ethenyl(dimethyl)silyl]oxy-dimethylsilane Chemical compound C=C[Si](C)(C)O[Si](C)(C)C=C BITPLIXHRASDQB-UHFFFAOYSA-N 0.000 description 1
- 125000001033 ether group Chemical group 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- AQYSYJUIMQTRMV-UHFFFAOYSA-N hypofluorous acid Chemical compound FO AQYSYJUIMQTRMV-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229940098779 methanesulfonic acid Drugs 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229920002866 paraformaldehyde Polymers 0.000 description 1
- 229950008618 perfluamine Drugs 0.000 description 1
- 125000006551 perfluoro alkylene group Chemical group 0.000 description 1
- RVZRBWKZFJCCIB-UHFFFAOYSA-N perfluorotributylamine Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)N(C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F RVZRBWKZFJCCIB-UHFFFAOYSA-N 0.000 description 1
- JAJLKEVKNDUJBG-UHFFFAOYSA-N perfluorotripropylamine Chemical compound FC(F)(F)C(F)(F)C(F)(F)N(C(F)(F)C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)F JAJLKEVKNDUJBG-UHFFFAOYSA-N 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000002940 repellent Effects 0.000 description 1
- 239000005871 repellent Substances 0.000 description 1
- 150000004819 silanols Chemical class 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 238000010898 silica gel chromatography Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 238000001577 simple distillation Methods 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 238000010896 thin film analysis Methods 0.000 description 1
- 230000002463 transducing effect Effects 0.000 description 1
- 238000006276 transfer reaction Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G65/00—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
- C08G65/002—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from unsaturated compounds
- C08G65/005—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from unsaturated compounds containing halogens
- C08G65/007—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from unsaturated compounds containing halogens containing fluorine
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Description
本発明は、基材表面に撥水撥油性を付与する表面処理に好適に用いることができる含フッ素エーテル化合物、コーティング液、該含フッ素エーテル化合物またはコーティング液を用いて、表面処理層を有する基材を製造する方法に関する。 The present invention relates to a fluorine-containing ether compound that can be suitably used for surface treatment for imparting water / oil repellency to a substrate surface, a coating liquid, a group having a surface treatment layer using the fluorine-containing ether compound or the coating liquid. The present invention relates to a method of manufacturing a material.
含フッ素化合物は、高い潤滑性、撥水撥油性等を示すため、表面処理剤に好適に用いられる。基材表面に撥水撥油性を付与すると汚れを拭き取りやすくなり、汚れの除去性が向上する。
例えばタッチパネルにあっては、指で繰り返し摩擦されても撥水撥油性が低下しにくく、拭き取りによって指紋を容易に除去できる性能が長期間維持されることが求められる。Since the fluorine-containing compound exhibits high lubricity, water / oil repellency, and the like, it is preferably used as a surface treatment agent. When water and oil repellency is imparted to the surface of the base material, it becomes easy to wipe off dirt, and the dirt removal property is improved.
For example, in a touch panel, water and oil repellency is unlikely to deteriorate even when repeatedly rubbed with a finger, and it is required that the performance of easily removing a fingerprint by wiping is maintained for a long period of time.
含フッ素化合物の中でも、ペルフルオロアルキル鎖の途中にエーテル結合(−O−)が存在するペルフルオロポリエーテル鎖を主鎖とする化合物は、柔軟性に優れる化合物であり、特に油脂汚れの除去性に優れる。
ペルフルオロポリエーテル鎖を主鎖とし、末端に加水分解性シリル基を有する含フッ素エーテル化合物を、防汚剤、潤滑剤、撥水撥油剤等の表面処理剤として用いることが知られている(特許文献1〜5)。
末端に加水分解性シリル基を有する含フッ素エーテル化合物は、該加水分解性シリル基が基材の表面と化学結合するため、良好な耐久性が得られやすい。Among the fluorine-containing compounds, a compound having a main chain of a perfluoropolyether chain having an ether bond (-O-) in the middle of the perfluoroalkyl chain is a compound having excellent flexibility, and particularly excellent in removing fat and oil stains. .
It is known that a fluorine-containing ether compound having a perfluoropolyether chain as a main chain and a hydrolyzable silyl group at the terminal is used as a surface treatment agent such as an antifouling agent, a lubricant, and a water / oil repellent (patents). Literature 1-5).
The fluorine-containing ether compound having a hydrolyzable silyl group at the end is likely to obtain good durability because the hydrolyzable silyl group chemically bonds to the surface of the substrate.
特許文献1〜3には、加水分解性シリル基にトリメチレン基が結合し、該トリメチレン基にエーテル結合を介して、フッ素原子を有さないアルキレン基が結合する、含フッ素エーテル化合物が記載されている。
特許文献4の実施例には、加水分解性シリル基にトリメチレン基が結合し、該トリメチレン基にアミド結合またはエーテル結合を介してアルキレン基が結合する、含フッ素エーテル化合物が記載されており、該含フッ素エーテル化合物の分子量は1,100程度である。
特許文献5には、式(V)で表される有機ケイ素化合物であって、塩化ケイ素基にトリメチレン基が結合し、該トリメチレン基にエーテル結合を介してペルフルオロアルキレン基が結合する有機ケイ素化合物が記載されている。該塩化ケイ素基の塩素原子をアルコキシ基に置換できることが記載されている。該式(V)で表される有機ケイ素化合物において、nが最大(n=4)で、ケイ素原子に3個のメトキシ基が結合している場合の含フッ素エーテル化合物の分子量は1,172である。Patent Documents 1 to 3 describe fluorine-containing ether compounds in which a trimethylene group is bonded to a hydrolyzable silyl group, and an alkylene group having no fluorine atom is bonded to the trimethylene group via an ether bond. Yes.
In Examples of Patent Document 4, a fluorine-containing ether compound in which a trimethylene group is bonded to a hydrolyzable silyl group and an alkylene group is bonded to the trimethylene group via an amide bond or an ether bond is described. The molecular weight of the fluorine-containing ether compound is about 1,100.
Patent Document 5 discloses an organosilicon compound represented by the formula (V), in which a trimethylene group is bonded to a silicon chloride group, and a perfluoroalkylene group is bonded to the trimethylene group via an ether bond. Have been described. It describes that the chlorine atom of the silicon chloride group can be substituted with an alkoxy group. In the organosilicon compound represented by the formula (V), the molecular weight of the fluorine-containing ether compound when n is maximum (n = 4) and three methoxy groups are bonded to the silicon atom is 1,172. is there.
本発明者らの知見によれば、特許文献1〜3に記載されているような、トリメチレン基にエーテル結合を介してアルキレン基が結合している含フッ素エーテル化合物は、高純度のものを製造することが難しく、高純度にするためには精製または分離作業が必要である。しかしながら、該精製または分離作業は以下の理由から困難である。
一般的に、分子量が高くなるにつれて常圧蒸留に必要な熱量は大きくなる。例えば、分子量が4,000の化合物では、0.1Paまで減圧しても280℃程度の加熱が必要となる。また、加水分解性シリル基を持つ化合物をシリカゲルクロマトグラフィによって分離精製しようとすると、加水分解性シリル基がシリカゲルに吸着してしまい、化合物が流出してこない。以上のように、特許文献1〜3に記載の化合物の精製や分離作業を行うのは非常に困難である。According to the knowledge of the present inventors, a fluorine-containing ether compound in which an alkylene group is bonded to a trimethylene group via an ether bond as described in Patent Documents 1 to 3 is produced with high purity. In order to achieve high purity, purification or separation work is required. However, the purification or separation operation is difficult for the following reasons.
Generally, as the molecular weight increases, the amount of heat required for atmospheric distillation increases. For example, a compound having a molecular weight of 4,000 requires heating at about 280 ° C. even if the pressure is reduced to 0.1 Pa. Further, when a compound having a hydrolyzable silyl group is to be separated and purified by silica gel chromatography, the hydrolyzable silyl group is adsorbed on the silica gel and the compound does not flow out. As described above, it is very difficult to purify and separate the compounds described in Patent Documents 1 to 3.
特許文献4に記載されているような、加水分解性シリル基の近くにアミド基等の極性基を有する含フッ素エーテル化合物では、例えばガラス基材等、表面に極性基を有する基材に適用した場合に、極性基同士の引き合いによって含フッ素エーテル化合物中の極性基が基材表面へ吸着され、その結果、基材の表面と加水分解性シリル基との反応が不充分になる場合があると考える。
また本発明者らの知見によれば、特許文献5に記載されている含フッ素エーテル化合物を用いて表面処理した基材において、長期の使用により、例えば繰り返し摩擦されることによって撥水撥油性が低下する場合があると考える。The fluorine-containing ether compound having a polar group such as an amide group near the hydrolyzable silyl group as described in Patent Document 4 is applied to a substrate having a polar group on the surface such as a glass substrate. In some cases, the polar groups in the fluorinated ether compound are adsorbed on the surface of the base material by attracting polar groups, and as a result, the reaction between the surface of the base material and the hydrolyzable silyl group may be insufficient. Think.
Further, according to the knowledge of the present inventors, the base material surface-treated with the fluorine-containing ether compound described in Patent Document 5 has water and oil repellency due to repeated friction, for example, by long-term use. We think that it may decline.
本発明は前記事情に鑑みてなされたものであり、基材表面に良好な撥水撥油性を付与できるとともに、耐摩擦性に優れ、繰り返し摩擦によっても撥水撥油性が低下しにくく、簡便に製造が可能な含フッ素エーテル化合物の提供を目的とする。
また本発明は、該含フッ素エーテル化合物を用いて、表面処理層を有する基材を製造する方法の提供を目的とする。
また本発明は該含フッ素エーテル化合物と媒体とを含むコーティング液、および該コーティング液を用いて、表面処理層を有する基材を製造する方法の提供を目的とする。The present invention has been made in view of the above circumstances, and can impart good water / oil repellency to the surface of the base material, and is excellent in friction resistance. It aims at providing the fluorine-containing ether compound which can be manufactured.
Another object of the present invention is to provide a method for producing a substrate having a surface treatment layer using the fluorine-containing ether compound.
Another object of the present invention is to provide a coating liquid containing the fluorine-containing ether compound and a medium, and a method for producing a substrate having a surface treatment layer using the coating liquid.
本発明は、下記[1]〜[11]の構成を有する含フッ素エーテル化合物、コーティング液、および表面処理層を有する基材の製造方法等である。
[1] 下式(1)で表され、数平均分子量が1,500〜10,000であり、純度が98質量%以上である、含フッ素エーテル化合物。
A−O−Rf−B ・・・(1)
式(1)中の記号は以下を示す。
A:炭素数1〜6のペルフルオロアルキル基、またはB。
Rf:下式(2)で表される連結基。
−(CF2CF2O)b(CF(CF3)CF2O)c(CF2O)d(CF2CF2CF2O)e− ・・・(2)
式(2)中の記号は以下を示す。
b、c、dおよびe:それぞれ独立して、0以上の整数であり、かつ、b+c+d+eは6〜147である。ただし、式(2)中において、(CF2CF2O)、(CF(CF3)CF2O)、(CF2O)、(CF2CF2CF2O)の繰り返し単位の結合順序は限定されず、互いにランダムに結合してもブロックに結合してもよい。
B: 下式(3)で表される基。
−(CH2)3SiLmRn ・・・(3)
式(3)中の記号は以下を示す。
L:炭素数1〜4のアルコキシ基。
R:水素原子または1価の炭化水素基。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。
The present invention includes a fluorine-containing ether compound having the following configurations [1] to [1 1 ], a coating liquid, and a method for producing a substrate having a surface treatment layer.
[1] represented by the following formula (1), a number average molecular weight of Ri der 1,500 to 10,000, a purity not less than 98 wt%, the fluorine-containing ether compound.
A-O-R f -B (1)
Symbols in the formula (1) indicate the following.
A: C1-C6 perfluoroalkyl group, or B.
R f : a linking group represented by the following formula (2).
- (CF 2 CF 2 O) b (CF (CF 3) CF 2 O) c (CF 2 O) d (CF 2 CF 2 CF 2 O) e - ··· (2)
Symbols in the formula (2) indicate the following.
b, c, d and e are each independently an integer of 0 or more, and b + c + d + e is 6 to 147. However, in the formula (2), the bonding order of repeating units of (CF 2 CF 2 O), (CF (CF 3 ) CF 2 O), (CF 2 O), and (CF 2 CF 2 CF 2 O) is It is not limited, You may couple | bond with a block at random or a block mutually.
B: Group represented by the following formula (3).
- (CH 2) 3 SiL m R n ··· (3)
The symbol in Formula (3) shows the following.
L: C1-C4 alkoxy group .
R: a hydrogen atom or a monovalent hydrocarbon group.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
[2] 下式(1−2)で表され、数平均分子量が1,500〜10,000であり、純度が98質量%以上である、[1]に記載の含フッ素エーテル化合物。
F(CF2)a11−O−(CF2CF2O)b11−(CH2)3SiLmRn・・・(1−2)
式(1−2)中の記号は以下を示す。
L:炭素数1〜4のアルコキシ基。
R:水素原子または1価の炭化水素基。
a11:1〜6の整数。
b11:8〜84の整数。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。
[2] represented by the following formula (1-2), the number-average molecular weight of Ri der 1,500 to 10,000, a purity of 98 mass% or more, the fluorine-containing ether compound as described in [1].
F (CF 2) a11 -O- ( CF 2 CF 2 O) b11 - (CH 2) 3 SiL m R n ··· (1-2)
The symbol in Formula (1-2) shows the following.
L: C1-C4 alkoxy group .
R: a hydrogen atom or a monovalent hydrocarbon group.
a11: An integer of 1 to 6.
b11: An integer of 8 to 84.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
[3] 前記mが3、nが0である、[1]または[2]に記載の含フッ素エーテル化合物。 [ 3 ] The fluorine-containing ether compound according to [1] or [ 2 ], wherein m is 3 and n is 0 .
[4] [1]〜[3]のいずれかに記載の含フッ素エーテル化合物と、液状媒体とを含む、コーティング液。
[5] 前記液状媒体が、フッ素化アルカン、フッ素化芳香族化合物およびフルオロアルキルエーテルからなる群から選択される少なくとも1種のフッ素系有機溶媒を含む、[4]に記載のコーティング液。
[ 4 ] A coating liquid comprising the fluorinated ether compound according to any one of [1] to [ 3 ] and a liquid medium.
[5] The liquid medium, fluorinated alkanes, fluorinated aromatic compound and containing at least one fluorine-based organic solvent is selected from the group consisting of fluoroalkyl ether, coating liquid according to [4].
[6] [1]〜[3]のいずれかに記載の含フッ素エーテル化合物を、基材の表面に真空蒸着する、表面処理層を有する基材の製造方法。
[7] [4]または[5]に記載のコーティング液を基材の表面に塗布した後、前記液状媒体を除去する、表面処理層を有する基材の製造方法。
[8] 前記コーティング液を、前記基材の表面に塗布する方法が、スピンコート法、ワイプコート法、スプレーコート法、スキージーコート法、ディップコート法、ダイコート法、インクジェット法、フローコート法、ロールコート法、キャスト法、ラングミュア・ブロジェット法またはグラビアコート法である、[7]に記載の表面処理層を有する基材の製造方法。
[9] 前記基材の材質が、金属、樹脂、ガラス、セラミック、またはこれらの複合材料である、[6]〜[8]のいずれかに記載の表面処理層を有する基材の製造方法。
[10] [1]〜[3]のいずれかに記載の含フッ素エーテル化合物で処理されてなる表面処理層を有する基材。
[11] [1]〜[3]のいずれかに記載の含フッ素エーテル化合物で処理されてなる表面処理層を入力面に有する、タッチパネル。
[ 6 ] A method for producing a substrate having a surface treatment layer, wherein the fluorine-containing ether compound according to any one of [1] to [ 3 ] is vacuum-deposited on the surface of the substrate.
[ 7 ] A method for producing a substrate having a surface treatment layer, wherein the liquid medium is removed after the coating liquid according to [ 4 ] or [ 5 ] is applied to the surface of the substrate.
[ 8 ] The method of applying the coating liquid to the surface of the substrate is spin coating, wipe coating, spray coating, squeegee coating, dip coating, die coating, ink jet, flow coating, or roll. The manufacturing method of the base material which has a surface treatment layer as described in [ 7 ] which is a coating method, a casting method, a Langmuir-Blodgett method, or a gravure coating method.
[ 9 ] The method for producing a substrate having a surface treatment layer according to any one of [ 6 ] to [ 8 ], wherein the material of the substrate is metal, resin, glass, ceramic, or a composite material thereof.
[ 10 ] A substrate having a surface treatment layer treated with the fluorine-containing ether compound according to any one of [1] to [ 3 ].
[ 11 ] A touch panel having a surface treatment layer treated with the fluorine-containing ether compound according to any one of [1] to [ 3 ] on an input surface.
本発明の含フッ素エーテル化合物は、簡便に製造が可能であり、基材表面に、良好な撥水撥油性を付与することができる。基材表面に、該含フッ素エーテル化合物またはコーティング液を用いて表面処理を行うことにより、耐摩擦性に優れ、繰り返し摩擦によっても撥水撥油性が低下しにくい、表面処理層を有する基材が得られる。
本発明の含フッ素エーテル化合物またはコーティング液は、基材の表面に良好な撥水撥油性を付与できる。
本発明の含フッ素エーテル化合物またはコーティング液を用いて、表面処理層を有する基材を製造することにより、表面の撥水撥油性に優れるとともに、耐摩擦性に優れ、繰り返し摩擦によっても表面の撥水撥油性が低下しにくい、表面処理層を有する基材が得られる。The fluorine-containing ether compound of the present invention can be easily produced, and can impart good water and oil repellency to the substrate surface. By performing surface treatment on the surface of the substrate using the fluorine-containing ether compound or the coating liquid, a substrate having a surface-treated layer that has excellent friction resistance and is less likely to be deteriorated in water and oil repellency even by repeated friction. can get.
The fluorine-containing ether compound or coating liquid of the present invention can impart good water and oil repellency to the surface of the substrate.
By using the fluorine-containing ether compound or the coating liquid of the present invention to produce a substrate having a surface treatment layer, the surface has excellent water and oil repellency, excellent friction resistance, and surface repellency even by repeated friction. A base material having a surface-treated layer, in which water / oil repellency is hardly lowered, is obtained.
本発明における含フッ素エーテル化合物の数平均分子量の値は、NMR分析法を用い、以下の方法で得られる値である。すなわち、1H−NMRおよび19F−NMRより、末端基を基準にして繰り返し単位の数(平均値)を求めることによって算出できる。末端基とは、式(1)中のAまたはBである。The value of the number average molecular weight of the fluorinated ether compound in the present invention is a value obtained by the following method using NMR analysis. That is, it can be calculated by determining the number of repeating units (average value) from 1 H-NMR and 19 F-NMR with reference to the terminal group. A terminal group is A or B in Formula (1).
本発明における表面処理層は、本発明の含フッ素エーテル化合物またはコーティング液で基材を表面処理することによって、基材の表面上に形成される層である。
該含フッ素エーテル化合物またはコーティング液による表面処理においては、後述するように、本発明の含フッ素エーテル化合物中の加水分解性シリル基(−SiLmRn)が加水分解反応することによってSi−OH基(シラノール基)が形成され、該シラノール基は分子間で反応してSi−O−Si結合が形成され、または該シラノール基が基材の表面の水酸基(基材−OH)と脱水縮合反応して化学結合(基材−O−Si)が形成される。
すなわち本発明における表面処理層は、本発明の含フッ素エーテル化合物が上記の反応によって相互にまた基材表面に結合して形成された、基材表面上の含フッ素エーテル残基から構成された層をいう。The surface treatment layer in this invention is a layer formed on the surface of a base material by surface-treating a base material with the fluorine-containing ether compound or coating liquid of this invention.
In the surface treatment with the fluorine-containing ether compound or the coating liquid, as described later, a hydrolyzable silyl group (—SiL m R n ) in the fluorine-containing ether compound of the present invention undergoes a hydrolysis reaction to cause Si—OH. Group (silanol group) is formed, and the silanol group reacts between molecules to form a Si—O—Si bond, or the silanol group reacts with a hydroxyl group (substrate—OH) on the surface of the substrate. Thus, a chemical bond (base material-O-Si) is formed.
That is, the surface treatment layer in the present invention is a layer composed of fluorine-containing ether residues on the substrate surface formed by bonding the fluorine-containing ether compound of the present invention to each other and to the substrate surface by the above reaction. Say.
本明細書において、式(1)で表される化合物を化合物(1)と記す。他の式で表される化合物、前駆体、中間体も同様に記す。 In the present specification, a compound represented by the formula (1) is referred to as a compound (1). The same applies to compounds, precursors and intermediates represented by other formulas.
[含フッ素エーテル化合物]
本発明の含フッ素エーテル化合物は、下式(1)で表される化合物(1)である。
A−O−Rf−B ・・・(1)
式(1)中の記号は以下を示す。
A:炭素数1〜6のペルフルオロアルキル基、またはB。
Rf:下式(2)で表される連結基。
−(CF2CF2O)b(CF(CF3)CF2O)c(CF2O)d(CF2CF2CF2O)e− ・・・(2)
式(2)中の記号は以下を示す。
b、c、dおよびe:それぞれ独立して、0以上の整数であり、かつ、b+c+d+eは6〜147である。ただし、式(2)中において、(CF2CF2O)、(CF(CF3)CF2O)、(CF2O)、(CF2CF2CF2O)の繰り返し単位の結合順序は限定されず、互いにランダムに結合してもブロックに結合してもよい。
B: 下式(3)で表される基。
−(CH2)3SiLmRn ・・・(3)
式(3)中の記号は以下を示す。
L:加水分解性基。
R:水素原子または1価の炭化水素基。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。[Fluorine-containing ether compound]
The fluorine-containing ether compound of the present invention is a compound (1) represented by the following formula (1).
A-O-R f -B (1)
Symbols in the formula (1) indicate the following.
A: C1-C6 perfluoroalkyl group, or B.
R f : a linking group represented by the following formula (2).
- (CF 2 CF 2 O) b (CF (CF 3) CF 2 O) c (CF 2 O) d (CF 2 CF 2 CF 2 O) e - ··· (2)
Symbols in the formula (2) indicate the following.
b, c, d and e are each independently an integer of 0 or more, and b + c + d + e is 6 to 147. However, in the formula (2), the bonding order of repeating units of (CF 2 CF 2 O), (CF (CF 3 ) CF 2 O), (CF 2 O), and (CF 2 CF 2 CF 2 O) is It is not limited, You may couple | bond with a block at random or a block mutually.
B: Group represented by the following formula (3).
- (CH 2) 3 SiL m R n ··· (3)
The symbol in Formula (3) shows the following.
L: Hydrolyzable group.
R: a hydrogen atom or a monovalent hydrocarbon group.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
化合物(1)は片末端または両末端にBを有する。Bは上式(3)で表される基であり、化合物(1)は、末端に−SiLmRnで表される加水分解性シリル基を有する。
式(3)において、Lは加水分解性基である。加水分解性基は、加水分解反応により水酸基となる基である。すなわち、化合物(1)の末端のSi−Lは、加水分解反応によりSi−OH基(シラノール基)となる。シラノール基は、さらに分子間で反応してSi−O−Si結合を形成する。またシラノール基は、基材の表面の水酸基(基材−OH)と脱水縮合反応して、化学結合(基材−O−Si)を形成する。化合物(1)は、末端に加水分解性シリル基を有するため、基材との密着性が良好で、かつ、繰り返し摩擦による耐久性が良好であり、基材の表面の撥水撥油性化が可能な化合物である。
Lとしては、アルコキシ基、ハロゲン原子、アシル基、イソシアネート基(−NCO)等が挙げられる。アルコキシ基としては、炭素数1〜4のアルコキシ基が好ましい。
Lとして、工業的な製造が容易な点から、炭素数1〜4のアルコキシ基またはハロゲン原子が好ましい。ハロゲン原子としては、塩素原子が特に好ましい。
塗布時のアウトガスが少なく化合物(1)の保存安定性に優れる点で、加水分解性基Lは炭素数1〜4のアルコキシ基が特に好ましい。なかでも、化合物(1)の長期の保存安定性が必要な場合にはエトキシ基が特に好ましく、塗布後の反応時間を短時間とする場合にはメトキシ基が特に好ましい。Compound (1) has B at one or both ends. B is a group represented by the above formula (3), and the compound (1) has a hydrolyzable silyl group represented by —SiL m R n at the terminal.
In the formula (3), L is a hydrolyzable group. The hydrolyzable group is a group that becomes a hydroxyl group by a hydrolysis reaction. That is, Si-L at the terminal of the compound (1) becomes a Si—OH group (silanol group) by hydrolysis reaction. The silanol group further reacts between molecules to form a Si—O—Si bond. Further, the silanol group undergoes a dehydration condensation reaction with a hydroxyl group (base material-OH) on the surface of the base material to form a chemical bond (base material-O-Si). Since the compound (1) has a hydrolyzable silyl group at the terminal, the adhesion to the substrate is good, the durability by repeated friction is good, and the water and oil repellency of the surface of the substrate is improved. It is a possible compound.
Examples of L include an alkoxy group, a halogen atom, an acyl group, and an isocyanate group (—NCO). As an alkoxy group, a C1-C4 alkoxy group is preferable.
L is preferably an alkoxy group having 1 to 4 carbon atoms or a halogen atom from the viewpoint of easy industrial production. As the halogen atom, a chlorine atom is particularly preferable.
The hydrolyzable group L is particularly preferably an alkoxy group having 1 to 4 carbon atoms in that the outgassing during coating is small and the storage stability of the compound (1) is excellent. Among these, an ethoxy group is particularly preferable when long-term storage stability of the compound (1) is required, and a methoxy group is particularly preferable when the reaction time after coating is short.
式(3)において、mは1〜3の整数であり、2または3が好ましく、特に3が好ましい。分子中にLが複数存在することにより、基材の表面との結合がより強固になる。
mが2以上である場合、1分子中に存在する複数のLは互いに同じであってもよく、異なっていてもよい。原料の入手容易性や製造が簡便な点で、互いに同じであることが好ましい。In the formula (3), m is an integer of 1 to 3, 2 or 3 is preferable, and 3 is particularly preferable. By the presence of a plurality of L in the molecule, the bond with the surface of the substrate becomes stronger.
When m is 2 or more, the plurality of L present in one molecule may be the same as or different from each other. It is preferable that the raw materials are the same from the viewpoint of easy availability and production.
式(3)において、Rは水素原子または1価の炭化水素基である。1価の炭化水素基としては、アルキル基、シクロアルキル基、アルケニル基またはアリル基等が挙げられる。
Rは1価の炭化水素基が好ましく、1価の飽和炭化水素基が特に好ましい。1価の飽和炭化水素基の炭素数は1〜6が好ましく、1〜3がより好ましく、1〜2が特に好ましい。
Rとしては、炭素数が1〜6のアルキル基が好ましく、炭素数が1〜3のアルキル基がより好ましく、炭素数が1〜2のアルキル基が特に好ましい。合成が簡便であるので好ましい。
式(3)において、nは0〜2の整数であり、m+n=3である。nは0または1が好ましく、0が特に好ましい。分子中にRが0または1であると、シラノール基と基材の表面との結合が形成されやすい。In the formula (3), R is a hydrogen atom or a monovalent hydrocarbon group. Examples of the monovalent hydrocarbon group include an alkyl group, a cycloalkyl group, an alkenyl group, and an allyl group.
R is preferably a monovalent hydrocarbon group, particularly preferably a monovalent saturated hydrocarbon group. 1-6 are preferable, as for carbon number of a monovalent saturated hydrocarbon group, 1-3 are more preferable, and 1-2 are especially preferable.
R is preferably an alkyl group having 1 to 6 carbon atoms, more preferably an alkyl group having 1 to 3 carbon atoms, and particularly preferably an alkyl group having 1 to 2 carbon atoms. This is preferable because the synthesis is simple.
In the formula (3), n is an integer of 0 to 2, and m + n = 3. n is preferably 0 or 1, particularly preferably 0. When R is 0 or 1 in the molecule, a bond between the silanol group and the surface of the substrate is likely to be formed.
加水分解性シリル基(−SiLmRn)として好ましいものは、−Si(OCH3)3、−SiCH3(OCH3)2、−Si(OCH2CH3)3、−SiCl3、−Si(OCOCH3)3、−Si(NCO)3が挙げられる。工業的な製造における取扱いやすさから、特に−Si(OCH3)3が好ましい。Preferred as the hydrolyzable silyl group (—SiL m R n ) are —Si (OCH 3 ) 3 , —SiCH 3 (OCH 3 ) 2 , —Si (OCH 2 CH 3 ) 3 , —SiCl 3 , —Si. (OCOCH 3) 3, include -Si (NCO) 3. In view of ease of handling in industrial production, —Si (OCH 3 ) 3 is particularly preferable.
式(1)において、Aは炭素数1〜6のペルフルオロアルキル基、またはBである。耐摩耗性に優れ、繰り返し摩耗によっても撥水撥油性が低下しにくい点から、Aは炭素数1〜6のペルフルオロアルキル基が好ましく、炭素数1〜3のペルフルオロアルキル基が特に好ましい。 In Formula (1), A is a C1-C6 perfluoroalkyl group or B. A is preferably a C 1-6 perfluoroalkyl group, and particularly preferably a C 1-3 perfluoroalkyl group, since it is excellent in wear resistance and water / oil repellency is less likely to be lowered by repeated wear.
式(1)において、Rfは上式(2)で表される連結基であり、ペルフルオロポリエーテル鎖からなる。
式(2)で表されるRfにおいて、b、c、dおよびeは、それぞれ独立して、0または1以上の整数であり、かつ、b+c+d+eは6〜147である。b+c+d+eは8〜80がより好ましく、10〜50が特に好ましい。b+c+d+eが上記範囲であると耐摩擦性が良好になる。
Rfは、(CF2CF2O)の繰り返し単位(以下、繰り返し単位(CF2CF2O)ともいう。)、(CF(CF3)CF2O)の繰り返し単位(以下、繰り返し単位(CF(CF3)CF2O)ともいう。)、(CF2O)の繰り返し単位(以下、繰り返し単位(CF2O)ともいう。)、および(CF2CF2CF2O)の繰り返し単位(以下、繰り返し単位(CF2CF2CF2O)ともいう。)からなる群から選ばれる少なくとも1種からなる。In the formula (1), R f is a linking group represented by the above formula (2) and consists of a perfluoropolyether chain.
In R f represented by the formula (2), b, c, d and e are each independently 0 or an integer of 1 or more, and b + c + d + e is 6 to 147. As for b + c + d + e, 8-80 are more preferable, and 10-50 are especially preferable. When b + c + d + e is within the above range, the friction resistance is good.
R f is (referred to hereinafter also as the repeating units (CF 2 CF 2 O). ) (CF 2 CF 2 O) recurring units of, (CF (CF 3) CF 2 O) recurring units (hereinafter, the repeating units of ( CF (CF 3 ) CF 2 O)), (CF 2 O) repeating units (hereinafter also referred to as repeating units (CF 2 O)), and (CF 2 CF 2 CF 2 O) repeating units (Hereinafter also referred to as a repeating unit (CF 2 CF 2 CF 2 O)).
Rfにおいて、繰り返し単位(CF2CF2O)、繰り返し単位(CF(CF3)CF2O)、繰り返し単位(CF2O)、および繰り返し単位(CF2CF2CF2O)の結合順序は限定されず、互いにランダムに結合しても、ブロックに結合してもよい。
また、化合物(1)を安定に製造しやすい点では、化合物(1)が−O−CF2−O−CH2CH2CH2Si−の構造を含まないことが好ましい。すなわち、化合物(1)において、Bのトリメチレン基に結合している繰り返し単位は、繰り返し単位(CF2CF2O)、繰り返し単位(CF(CF3)CF2O)または繰り返し単位(CF2CF2CF2O)であることが好ましい。Bonding order of repeating unit (CF 2 CF 2 O), repeating unit (CF (CF 3 ) CF 2 O), repeating unit (CF 2 O), and repeating unit (CF 2 CF 2 CF 2 O) in R f Is not limited, and may be combined with each other randomly or may be combined with a block.
The compound (1) in that the easily produced stably, it is preferable that Compound (1) does not contain a -O-CF 2 -O-CH 2 CH 2 CH 2 Si- structure. That is, in the compound (1), the repeating unit bonded to the trimethylene group of B is a repeating unit (CF 2 CF 2 O), a repeating unit (CF (CF 3 ) CF 2 O), or a repeating unit (CF 2 CF 2 CF 2 O) is preferably.
式(1)における好ましいA−O−Rf−としては、以下の式(4−1)〜(4−5)で表される基(以下、(4−1)基〜(4−5)基ということもある。)が挙げられる。
F(CF2)a1−O−(CF2CF2O)b1− ・・・(4−1)
(a1は1〜6の整数、b1は8〜84の整数)、
F(CF2)a1−O−(CF(CF3)CF2O)c1− ・・・(4−2)
(a1は1〜6の整数、c1は6〜58の整数)、
F(CF2)a1−O−(CF2CF2CF2O)e1− ・・・(4−3)
(a1は1〜6の整数、e1は6〜58の整数)、
F(CF2)a1−O−(CF2CF2O)b2−(CF2O)d1−CF2CF2O− ・・・(4−4)(a1は1〜6の整数、b2は5〜53の整数、d1は5〜53の整数)、
F(CF2)a1−O−(CF(CF3)CF2O)c2−(CF2O)d2− ・・・(4−5)(a1は1〜6の整数、c2は4〜42の整数、d2は4〜42の整数)。
なかでも、単位分子量当たりの酸素原子の割合が多く、柔軟性が良好となり、油脂汚れの除去性能が高くなる点で、(4−1)基が好ましい。(4−1)基においてa1は1〜3の整数、b1は8〜40の整数である基が特に好ましい。なお、(4−2)基においては、a1が1〜3の整数、c1が7〜28の整数である基が特に好ましい。(4−3)基においては、a1が1〜3の整数、e1が7〜28の整数である基が特に好ましい。(4−4)基においては、a1が1〜3の整数、b2が6〜26の整数、d1が6〜26の整数である基が特に好ましい。(4−5)基においては、a1が1〜3の整数、c2が5〜20の整数、d2が5〜20の整数である基が特に好ましい。Preferable AO—R f — in formula (1) is a group represented by the following formulas (4-1) to (4-5) (hereinafter referred to as (4-1) group to (4-5). Group)).
F (CF 2 ) a1 —O— (CF 2 CF 2 O) b1 − (4-1)
(A1 is an integer of 1 to 6, b1 is an integer of 8 to 84),
F (CF 2 ) a1 —O— (CF (CF 3 ) CF 2 O) c1 − (4-2)
(A1 is an integer of 1 to 6, c1 is an integer of 6 to 58),
F (CF 2 ) a1 —O— (CF 2 CF 2 CF 2 O) e1 − (4-3)
(A1 is an integer of 1 to 6, e1 is an integer of 6 to 58),
F (CF 2) a1 -O- ( CF 2 CF 2 O) b2 - (CF 2 O) d1 -CF 2 CF 2 O- ··· (4-4) (a1 is an integer from 1 to 6, b2 is An integer of 5 to 53, d1 is an integer of 5 to 53),
F (CF 2) a1 -O- ( CF (CF 3) CF 2 O) c2 - (CF 2 O) d2 - ··· (4-5) (a1 is an integer from 1 to 6, c2 is 4-42 And d2 is an integer of 4 to 42).
Among these, the (4-1) group is preferable in that the ratio of oxygen atoms per unit molecular weight is large, the flexibility is good, and the performance for removing oily and dirt is high. In the (4-1) group, a1 is particularly preferably an integer of 1 to 3, and b1 is an integer of 8 to 40. In the (4-2) group, a group in which a1 is an integer of 1 to 3 and c1 is an integer of 7 to 28 is particularly preferable. In the (4-3) group, a group in which a1 is an integer of 1 to 3 and e1 is an integer of 7 to 28 is particularly preferable. In the (4-4) group, a group in which a1 is an integer of 1 to 3, b2 is an integer of 6 to 26, and d1 is an integer of 6 to 26 is particularly preferable. In the (4-5) group, a group in which a1 is an integer of 1 to 3, c2 is an integer of 5 to 20, and d2 is an integer of 5 to 20 is particularly preferable.
化合物(1)としては、下式(1−2)で表される含フッ素エーテル化合物(1−2)が特に好ましい。
F(CF2)a11−O−(CF2CF2O)b11−(CH2)3SiLmRn ・・・(1−2)
式(1−2)中の記号は以下を示す。
L:加水分解性基。
R:水素原子または1価の炭化水素基。
a11:1〜6の整数。
b11:8〜84の整数。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。
式(1−2)中のLおよびRの好ましい範囲は、上述した化合物(1)の好ましい範囲と同様である。a11は1〜3の整数が特に好ましく、b11は8〜40の整数が特に好ましい。As the compound (1), a fluorine-containing ether compound (1-2) represented by the following formula (1-2) is particularly preferable.
F (CF 2) a11 -O- ( CF 2 CF 2 O) b11 - (CH 2) 3 SiL m R n ··· (1-2)
The symbol in Formula (1-2) shows the following.
L: Hydrolyzable group.
R: a hydrogen atom or a monovalent hydrocarbon group.
a11: An integer of 1 to 6.
b11: An integer of 8 to 84.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
The preferable range of L and R in Formula (1-2) is the same as the preferable range of the compound (1) described above. a11 is particularly preferably an integer of 1 to 3, and b11 is particularly preferably an integer of 8 to 40.
化合物(1)の数平均分子量は1,300〜10,000である。数平均分子量が上記範囲であると、繰り返し摩擦によっても性能が低下しにくい優れた耐摩擦性が得られやすい。
化合物(1)の数平均分子量は1,400〜7,000が好ましく、1,400〜5,000がより好ましく、1,500〜4,000が特に好ましい。The number average molecular weight of the compound (1) is 1,300 to 10,000. When the number average molecular weight is in the above range, excellent friction resistance that hardly deteriorates in performance due to repeated friction is easily obtained.
The number average molecular weight of the compound (1) is preferably 1,400 to 7,000, more preferably 1,400 to 5,000, and particularly preferably 1,500 to 4,000.
化合物(1)は、ペルフルオロポリエーテル鎖を有するため、フッ素原子の含有量が多く、該化合物(1)で基材の表面を処理することにより、基材の表面に良好な撥水撥油性を付与することができる。
化合物(1)の数平均分子量が上記範囲であると、優れた耐摩擦性が得られる。一般的に、含フッ素エーテル化合物において、数平均分子量が小さいほど、単位分子量当たりに存在する加水分解性シリル基の数が多いので、基材との化学結合が強固であると考えられる。しかしながら、数平均分子量が上記範囲の下限値未満であると、繰り返し摩擦によって撥水撥油性が低下しやすいことを、本発明者等は確認した。一方、化合物(1)の数平均分子量が上記範囲の上限値を超えると、単位分子量当たりに存在する加水分解性シリル基の数の減少による影響が大きくなるため、耐摩擦性が低下する。
さらに化合物(1)は極性基を有しないため、極性基を有する基材に適用した場合でも、化合物(1)の加水分解性シリル基と基材の表面との化学結合が強固になる。Since the compound (1) has a perfluoropolyether chain, the content of fluorine atoms is large. By treating the surface of the substrate with the compound (1), the surface of the substrate has good water and oil repellency. Can be granted.
When the number average molecular weight of the compound (1) is in the above range, excellent friction resistance can be obtained. In general, in a fluorine-containing ether compound, the smaller the number average molecular weight, the greater the number of hydrolyzable silyl groups present per unit molecular weight. Therefore, it is considered that the chemical bond with the substrate is stronger. However, the present inventors have confirmed that when the number average molecular weight is less than the lower limit of the above range, the water / oil repellency tends to be reduced by repeated friction. On the other hand, when the number average molecular weight of the compound (1) exceeds the upper limit of the above range, the influence of the decrease in the number of hydrolyzable silyl groups present per unit molecular weight increases, so that the friction resistance decreases.
Furthermore, since compound (1) does not have a polar group, even when applied to a substrate having a polar group, the chemical bond between the hydrolyzable silyl group of compound (1) and the surface of the substrate becomes strong.
[含フッ素エーテル化合物の製造方法]
本発明の化合物(1)は、下式(5)で表される前駆体と下記式(7)で表されるヒドロシラン化合物とをヒドロシリル化反応させて、末端に加水分解性シリル基を導入する方法で製造することができる。ヒドロシリル化反応は白金(Pt)等の遷移金属触媒を用いて行うことが好ましい。
A1−O−Rf−B1 ・・・(5)
HSiL1 mRn ・・・(7)
式(5)、(7)中の記号は以下を示す。
A1:前記式(1)におけるAと同じ炭素数1〜6のペルフルオロアルキル基、またはB1。
Rf:前記式(1)におけるRfと同じ基。
B1:アリル基。
L1:加水分解性基。
R:前記式(1)におけるRと同じ基。
mおよびn:前記式(1)におけるmおよびnとそれぞれ同じ数値。[Method for producing fluorine-containing ether compound]
The compound (1) of the present invention introduces a hydrolyzable silyl group into the terminal by hydrosilylating a precursor represented by the following formula (5) and a hydrosilane compound represented by the following formula (7). It can be manufactured by the method. The hydrosilylation reaction is preferably performed using a transition metal catalyst such as platinum (Pt).
A 1 —O—R f —B 1 (5)
HSiL 1 m R n (7)
Symbols in formulas (5) and (7) indicate the following.
A 1 : The same C 1-6 perfluoroalkyl group as A in the formula (1), or B 1 .
R f : the same group as R f in the formula (1).
B 1 : Allyl group.
L 1 : Hydrolyzable group.
R: the same group as R in the formula (1).
m and n: the same numerical values as m and n in the formula (1), respectively.
例えば、化合物(1)において、Aが炭素数1〜6のペルフルオロアルキル基である場合、下式(5−1)で表される前駆体(5−1)をヒドロシリル化して、末端に加水分解性シリル基を導入する方法で製造することができる。
A−O−Rf−CH2CH=CH2 ・・・(5−1)
式(1)においてAがBである場合には、下式(5−2)で表される前駆体(5−2)をヒドロシリル化して、末端に加水分解性シリル基を導入する方法で製造することができる。
CH2=CHCH2−O−Rf−CH2CH=CH2 ・・・(5−2)
前駆体(5−1)または(5−2)は、A−O−Rf−の構造に応じて公知の方法で製造することができる。前駆体(5−1)または(5−2)の製造方法については後述する。For example, in the compound (1), when A is a C 1-6 perfluoroalkyl group, the precursor (5-1) represented by the following formula (5-1) is hydrosilylated and hydrolyzed at the terminal. It can manufacture by the method of introduce | transducing a functional silyl group.
A—O—R f —CH 2 CH═CH 2 (5-1)
In the formula (1), when A is B, the precursor (5-2) represented by the following formula (5-2) is hydrosilylated, and a hydrolyzable silyl group is introduced into the terminal. can do.
CH 2 = CHCH 2 -O-R f -CH 2 CH = CH 2 ··· (5-2)
Precursor (5-1) or (5-2) is, A-O-R f - can be prepared by known methods depending on the structure of the. A method for producing the precursor (5-1) or (5-2) will be described later.
ヒドロシリル化反応においてはアリル基の転移が生じやすく、これにより化合物(1)以外のRfを有する化合物が副生するおそれがある。アリル基(すなわち、2−プロぺニル基)の転移により1−プロぺニル基が生じ、1−プロぺニル基の不飽和基にヒドロシラン化合物が反応して化合物(1)のBとは異なる基が生成する。前記前駆体(5−1)にL1がLであるヒドロシラン化合物(7)を反応させた場合、アリル基の転移により下式(6−2)で表される化合物(6−2)が生成し、そのヒドロシリル化反応によって下式(6−1)で表される化合物(6−1)が副生すると考えられる。
A−O−Rf−CH2CH(SiLmRn)CH3 ・・・(6−1)
A−O−Rf−CH=CHCH3 ・・・(6−2)
前記体(5−2)の場合は、2つのアリル基の一方が転移する場合と両方が転移する場合とが考えられ、この転移とヒドロシリル化反応によって生じる副生物は、2種類が考えられる。
さらに、ヒドロシリル化反応による化合物(1)の製造においては、未反応物の残存も考えられる。例えば、前記前駆体(5−1)から化合物(1)を製造した場合、得られた化合物(1)に未反応の前駆体(5−1)が残存すると、その前駆体(5−1)は不純物となる。前記前駆体(5−2)から化合物(1)を製造した場合、一方のアリル基が未反応であるとそれもまた不純物となる。また、アリル基の転移で生じる前記化合物(6−2)等もヒドロシリル化反応せずに残存すると不純物となる。なお、以下副生成物とは残存する未反応物を含めた意味で使用する。In the hydrosilylation reaction, allyl group transfer is likely to occur, and there is a risk that a compound having R f other than the compound (1) is produced as a by-product. 1-propenyl group is generated by transfer of the allyl group (that is, 2-propenyl group), and the hydrosilane compound reacts with the unsaturated group of 1-propenyl group, which is different from B of compound (1). A group is generated. When the precursor (5-1) is reacted with a hydrosilane compound (7) in which L 1 is L, a compound (6-2) represented by the following formula (6-2) is generated by transfer of the allyl group. However, it is considered that the compound (6-1) represented by the following formula (6-1) is by-produced by the hydrosilylation reaction.
A-O-R f -CH 2 CH (SiL m R n) CH 3 ··· (6-1)
A—O—R f —CH═CHCH 3 (6-2)
In the case of the body (5-2), it can be considered that one of two allyl groups is transferred or both are transferred, and two types of by-products generated by this transfer and hydrosilylation reaction are considered.
Furthermore, in the production of compound (1) by hydrosilylation reaction, unreacted substances may remain. For example, when the compound (1) is produced from the precursor (5-1) and the unreacted precursor (5-1) remains in the obtained compound (1), the precursor (5-1) Becomes an impurity. When the compound (1) is produced from the precursor (5-2), if one allyl group is unreacted, it also becomes an impurity. Further, the compound (6-2) and the like generated by the transfer of the allyl group also becomes an impurity if left without undergoing a hydrosilylation reaction. Hereinafter, the by-product is used in the meaning including the remaining unreacted product.
本発明において、含フッ素エーテル化合物中の副生成物の同定および定量は1H−NMR(300.4MHz)および19F−NMR(282.7MHz)により行う。なお、前駆体(5−1)または(5−2)をヒドロシリル化して目的の化合物(1)を製造する場合、ヒドロシリル化により生じ得る可能性のある化合物(前駆体(5−1)の場合には化合物(6−1)、化合物(6−2))に由来するスペクトルピークが検出されない場合を、副生成物の含有量がゼロであると定義する。また、これらの不純物に由来するスペクトルピークが観測された場合は、内部標準による定量により該副生成物の含有量を求める。
化合物(1)の製造工程で混入した成分の同定および定量は1H−NMR(300.4MHz)および19F−NMR(282.7MHz)により行う。In the present invention, identification and quantification of by-products in the fluorine-containing ether compound are performed by 1 H-NMR (300.4 MHz) and 19 F-NMR (282.7 MHz). In addition, when producing the target compound (1) by hydrosilylating the precursor (5-1) or (5-2), a compound that may be generated by hydrosilylation (in the case of the precursor (5-1) In the case where no spectral peak derived from the compound (6-1) or the compound (6-2)) is detected, the by-product content is defined as zero. Moreover, when the spectrum peak originating in these impurities is observed, content of this by-product is calculated | required by determination by an internal standard.
Identification and quantification of components mixed in the production process of compound (1) are performed by 1 H-NMR (300.4 MHz) and 19 F-NMR (282.7 MHz).
前駆体(5−1)または(5−2)をヒドロシリル化して得られる化合物(1)は、副生成物の生成が少なく、不純物が少ない含フッ素エーテル化合物が得られる。不純物が少ない含フッ素エーテル化合物が得られる理由は解明されていないが、本発明者らは以下のように考察している。
一般的に、末端ビニル基(−CH=CH2)へのヒドロシリル化反応は、Pt等の遷移金属触媒を用いることによって、高い反応選択率が得られることが知られている。しかし、本発明者らの知見によれば、アリル基にエーテル結合を介して−CH2−が結合しているアリルエーテル(−CH2−O−CH2CH=CH2)の場合には反応選択率は低い。特許文献3によると、反応選択率が低いことから、15モル%未満の副生成物を含有している。その原因としては、エーテル性酸素原子の非共有電子対と遷移金属触媒との何らかの相互作用によって副生成物が生成すると考えられる。
前駆体(5−1)または(5−2)は、アリル基にエーテル結合を介して−CF2−が結合しているアリルエーテルであるため、フッ素の電子吸引性によってエーテル性酸素上の非共有電子対の電荷密度が小さくなる。前述したエーテル性酸素原子と遷移金属触媒との相互作用が弱くまたは無くなることによって副生成物の生成が抑制され、該ヒドロシリル化反応の反応選択率が高いと推測される。The compound (1) obtained by hydrosilylating the precursor (5-1) or (5-2) yields a fluorine-containing ether compound with few by-products and less impurities. Although the reason why a fluorine-containing ether compound with few impurities is obtained has not been clarified, the present inventors consider as follows.
In general, it is known that a high reaction selectivity can be obtained in a hydrosilylation reaction to a terminal vinyl group (—CH═CH 2 ) by using a transition metal catalyst such as Pt. However, according to the knowledge of the present inventors, in the case of allyl ether (—CH 2 —O—CH 2 CH═CH 2 ) in which —CH 2 — is bonded to the allyl group via an ether bond, the reaction is performed. The selectivity is low. According to Patent Document 3, since the reaction selectivity is low, it contains a by-product of less than 15 mol%. The cause is considered to be that a by-product is generated by some interaction between the lone pair of etheric oxygen atoms and the transition metal catalyst.
Since the precursor (5-1) or (5-2) is an allyl ether in which —CF 2 — is bonded to an allyl group via an ether bond, non-determination on the etheric oxygen is caused by the electron withdrawing property of fluorine. The charge density of the shared electron pair is reduced. It is presumed that the interaction between the etheric oxygen atom and the transition metal catalyst described above is weakened or eliminated, whereby the formation of by-products is suppressed and the reaction selectivity of the hydrosilylation reaction is high.
さらに、ヒドロシリル化反応の反応率を高めるためには、前記ヒドロシラン化合物(7)はHSiXmRn(Xはハロゲン原子を示す。)であることが好ましい。Xとしては特に塩素原子であることが好ましい。ヒドロシラン化合物(7)のL1がX以外の加水分解性基である場合と比較してHSiXmRnの反応性が高いことより、アリル基の転移が相対的に起こりにくく、未反応物の残存も少なくなる。これにより、不純物のより少ない含フッ素エーテルが得られる。
前記のように加水分解性基Lは炭素数1〜4のアルコキシ基が好ましい。その場合は、HSiXmRnを反応させてLがXである化合物(1)を製造し、次いでXをアルコキシ基に変換して、Lがアルコキシ基である化合物(1)とすることが好ましい。これにより、純度が高くかつ加水分解性基がアルコキシ基である含フッ素エーテルを得ることができる。
Xをアルコキシ基に置換する方法としては公知の方法を使用できる。例えば、Xが塩素原子の場合、オルト蟻酸メチル等のオルト蟻酸トリアルキルエステルを反応させて塩素原子をアルコキシ基に変換する方法、ナトリウムメトキシド等のアルカリ金属アルコキシドを反応させて塩素原子をアルコキシ基に変換する方法等により、塩素原子をアルコキシ基に置換することができる。Furthermore, in order to increase the reaction rate of the hydrosilylation reaction, the hydrosilane compound (7) is preferably HSiX m R n (X represents a halogen atom). X is particularly preferably a chlorine atom. Compared with the case where L 1 of the hydrosilane compound (7) is a hydrolyzable group other than X, the reactivity of HSiX m R n is higher, so that allyl group transfer is relatively less likely to occur. Remaining is also reduced. Thereby, a fluorine-containing ether with fewer impurities is obtained.
As described above, the hydrolyzable group L is preferably an alkoxy group having 1 to 4 carbon atoms. In that case, it is preferable to react HSiX m R n to produce a compound (1) in which L is X, and then convert X to an alkoxy group to obtain a compound (1) in which L is an alkoxy group. . Thereby, the fluorine-containing ether which is high in purity and whose hydrolyzable group is an alkoxy group can be obtained.
As a method of substituting X with an alkoxy group, a known method can be used. For example, when X is a chlorine atom, a method in which a trialkyl ester of orthoformate such as methyl orthoformate is reacted to convert the chlorine atom to an alkoxy group, an alkali metal alkoxide such as sodium methoxide is reacted to convert the chlorine atom into an alkoxy group The chlorine atom can be substituted with an alkoxy group by a method of converting into an alkoxy group.
一般に、ペルフルオロポリエーテル鎖から構成される主鎖と加水分解性シリル基を有する末端基を有する含フッ素エーテル類を、アリル基等の不飽和基にヒドロシラン化合物をヒドロシリル化反応で付加させる方法で製造する場合、主鎖が同一でかつ末端が異なる構造を有する不純物が生成しやすくかつ生成した不純物の除去は困難である。そのため、そのような不純物を含んだ含フッ素エーテル類が生成されることなく、そのまま使用されている。しかし、不純物量の多い含フッ素エーテル類はその用途に要求される特性が低下するおそれがある。
前記のように、アリル基にヒドロシラン化合物をヒドロシリル化反応で付加させることにより前記Bを形成する方法で製造された化合物(1)は、少量の不純物を含有することが少なくない。目的物と不純物とは共通してRfを有する化合物であること、加水分解性シリル基を有する末端構造の相違がわずかであること等から、不純物を目的物から分離して精製することは困難である。しかし、前記した特定の構造を有する化合物(1)が前記した特定の構造を有する前駆体からのヒドロシリル化反応で製造されると、従来の類似の加水分解性シリル基を有する含フッ素エーテル類の場合に比較して、不純物量の少ない化合物(1)が得られる。
化合物(1)の製造において不純物の生成が少ないことより、簡便に高い純度の化合物(1)が得られる。反応に使用した溶媒や触媒等の簡便に除去できる成分を除去した後の不純物の大部分は前記のRfを有する副生成物またはRfを有する未反応物であると考えられ、これら不純物は精製により除去することが困難な不純物である。In general, fluorinated ethers having a main chain composed of a perfluoropolyether chain and a terminal group having a hydrolyzable silyl group are produced by adding a hydrosilane compound to an unsaturated group such as an allyl group by a hydrosilylation reaction. In this case, impurities having a structure with the same main chain and different ends are likely to be generated, and it is difficult to remove the generated impurities. Therefore, fluorine-containing ethers containing such impurities are used as they are without being generated. However, the fluorine-containing ethers having a large amount of impurities may deteriorate the properties required for their use.
As described above, the compound (1) produced by the method of forming B by adding a hydrosilane compound to an allyl group by a hydrosilylation reaction often contains a small amount of impurities. It is difficult to separate and purify the impurity from the target product because the target product and the impurity are compounds having R f in common and the difference in the terminal structure having a hydrolyzable silyl group is slight. It is. However, when the compound (1) having the specific structure described above is produced by a hydrosilylation reaction from the precursor having the specific structure described above, conventional fluorine-containing ethers having a similar hydrolyzable silyl group can be obtained. Compared to the case, the compound (1) having a small amount of impurities can be obtained.
Since the production of the compound (1) produces less impurities, the compound (1) with high purity can be easily obtained. Most of the impurities after removing the easily removed can components of the solvent and catalyst and the like used in the reaction is believed to be unreacted having a by-product or R f have the above R f, these impurities It is an impurity that is difficult to remove by purification.
本発明における前記式(1)で表される含フッ素エーテル化合物は、分離困難な不純物の含有量の少ない高純度の含フッ素エーテル化合物も意味する。すなわち、前記式(1)で表される含フッ素エーテル化合物とその製造の際に生成するRfを有する不純物とを含み、該含フッ素エーテル化合物と該不純物との合計に対する該不純物の含有量が95質量%以上である、含フッ素エーテル化合物の組成物も意味する。
式(1)で表される含フッ素エーテル化合物の純度は、特に好ましくは、98質量%以上である。すなわち不純物の含有量は2質量%以下が特に好ましい。該純度が上記下限値以上であると、基材の表面処理に用いたときの、撥水撥油性および耐摩擦性が向上する。不純物の含有量が上記範囲の上限値以下であると、基材の表面処理に用いたときの、撥水撥油性および耐摩擦性が向上する。
ドライコーティング等の純度の高い含フッ素エーテル化合物が必要とされる用途においては、純度が95質量%以上である含フッ素エーテル化合物を使用することが好ましい。また、他の用途においてもこのような純度の高い含フッ素エーテル化合物を使用することが好ましいが、用途によっては、それよりも多少純度の低い含フッ素エーテル化合物を使用することもできる。いずれの場合も本発明の含フッ素エーテル化合物は高純度であることより、上記のように特性の優れた表面処理層が得られる。The fluorine-containing ether compound represented by the formula (1) in the present invention also means a high-purity fluorine-containing ether compound having a small content of impurities that are difficult to separate. That is, the fluorine-containing ether compound represented by the formula (1) and an impurity having R f generated during the production thereof, and the content of the impurity with respect to the total of the fluorine-containing ether compound and the impurity is The composition of the fluorine-containing ether compound which is 95 mass% or more is also meant.
The purity of the fluorine-containing ether compound represented by the formula (1) is particularly preferably 98% by mass or more. That is, the content of impurities is particularly preferably 2% by mass or less. When the purity is not less than the above lower limit, the water / oil repellency and friction resistance when used for the surface treatment of the substrate are improved. When the impurity content is not more than the upper limit of the above range, the water and oil repellency and friction resistance when used for the surface treatment of the substrate are improved.
In applications that require a high-purity fluorine-containing ether compound such as dry coating, it is preferable to use a fluorine-containing ether compound having a purity of 95% by mass or more. Moreover, although it is preferable to use such a fluorine-containing ether compound with a high purity also in another use, depending on a use, a fluorine ether compound with a somewhat lower purity can also be used. In any case, since the fluorine-containing ether compound of the present invention has a high purity, a surface treatment layer having excellent properties as described above can be obtained.
(前駆体(5−1)の製造方法)
<前駆体(5−1−1)の製造方法(i)>
A−O−Rf−が前記(4−1)基である場合の前駆体(5−1−1)の製造方法を、式(4−1)におけるa1=1、b1=xである例を挙げて説明する。
下式(11)で表される化合物(11)を、金属フッ化物触媒(例えばNaF、CsF、KF、AgF等)の存在下で加熱してエステルの熱分解を行った後、臭化アリル(Br−CH2CH=CH2)を反応させることにより、前駆体(5−1−1)が得られる。(Method for producing precursor (5-1))
<Preparation method (i) of precursor (5-1-1)>
An example in which a1 = 1 and b1 = x in formula (4-1) is used as the method for producing the precursor (5-1-1) when A-O- Rf- is the (4-1) group. Will be described.
The compound (11) represented by the following formula (11) is heated in the presence of a metal fluoride catalyst (for example, NaF, CsF, KF, AgF, etc.) to thermally decompose the ester, and then allyl bromide ( The precursor (5-1-1) is obtained by reacting Br—CH 2 CH═CH 2 ).
<前駆体(5−1−1)の製造方法(ii)>
前記前駆体(5−1−1)は、以下の方法でも製造できる。
下式(12)で表される化合物(12)を、金属フッ化物触媒(例えばNaF、CsF、KF、AgF等)の存在下で臭化アリル(Br−CH2CH=CH2)と反応させることにより、前駆体(5−1−1)が得られる。<Preparation method (ii) of precursor (5-1-1)>
The precursor (5-1-1) can also be produced by the following method.
Compound represented by the following formula (12) to (12), the metal fluoride catalyst (e.g. NaF, CsF, KF, AgF, etc.) is reacted with allyl bromide (Br-CH 2 CH = CH 2) in the presence of Thereby, a precursor (5-1-1) is obtained.
<前駆体(5−1−2)の製造方法(iii)>
A−O−Rf−が前記(4−1)基である場合の前駆体(5−1−2)の製造方法を、式(4−1)におけるa1=3、c1=xである例を挙げて説明する。
下式(21)で表される化合物(21)(ヘキサフルオロプロピレンオキシド)を、グライム等のエーテル系溶媒中で、アルカリ金属フッ化触媒(例えばCsF)を用いて、開環重合させて下式(22)で表される化合物(22)を得る。
化合物(22)に前記製造方法(ii)と同様に、金属フッ化物触媒(例えばNaF、CsF、KF、AgF等)の存在下で臭化アリル(Br−CH2CH=CH2)を反応させることにより、前駆体(5−1−2)が得られる。<Precursor (5-1-2) Production Method (iii)>
A-O-R f - is the manufacturing method of (4-1) precursor is a group (5-1-2), it is a1 = 3, c1 = x in the formula (4-1) Example Will be described.
The compound (21) (hexafluoropropylene oxide) represented by the following formula (21) is subjected to ring-opening polymerization using an alkali metal fluorination catalyst (for example, CsF) in an ether solvent such as glyme. A compound (22) represented by (22) is obtained.
Like the manufacturing method to the compound (22) (ii), a metal fluoride catalyst (e.g. NaF, CsF, KF, AgF, etc.) is reacted with allyl bromide in the presence of (Br-CH 2 CH = CH 2) Thereby, a precursor (5-1-2) is obtained.
<前駆体(5−1−3)の製造方法(iv)>
A−O−Rf−が前記(4−3)基である場合の前駆体(5−1−3)の製造方法を、式(4−3)におけるa1=3、e1=xである例を挙げて説明する。
まず、テトラフルオロエチレンとパラホルムアルデヒドとを反応させて、2,2,3,3−テトラフルオロオキセタン(下式(31))を得る。この工程は、例えば無水フッ化水素中において、30〜60℃、好ましくは50℃で24時間反応させる方法で実施できる。<Preparation method (iv) of precursor (5-1-3)>
A-O-R f - precursor when it is the (4-3) based on the manufacturing method of (5-1-3), it is a1 = 3, e1 = x in the formula (4-3) Example Will be described.
First, tetrafluoroethylene and paraformaldehyde are reacted to obtain 2,2,3,3-tetrafluorooxetane (the following formula (31)). This step can be carried out, for example, in a method of reacting in anhydrous hydrogen fluoride at 30 to 60 ° C., preferably 50 ° C. for 24 hours.
次に、得られた2,2,3,3−テトラフルオロオキセタンを、ジグライム等のエーテル系溶媒中で、アルカリ金属フッ化触媒(例えばCsF)を用いて、開環重合させて下式(32)で表される中間体(32)を得る。
さらに、フッ素ガスを用いて、該中間体(32)に残っている水素原子をフッ素原子に置換することにより、下式(33)で表される化合物(33)を得る。この工程は、例えば、中間体(32)を70〜100℃まで徐々に昇温しながら、70時間、窒素で希釈したフッ素ガスで分子内の残水素をフッ素化する方法で実施できる。Next, the obtained 2,2,3,3-tetrafluorooxetane is subjected to ring-opening polymerization in an ether solvent such as diglyme using an alkali metal fluorination catalyst (for example, CsF) to obtain the following formula (32 ) Is obtained.
Further, the compound (33) represented by the following formula (33) is obtained by substituting the fluorine atom for the hydrogen atom remaining in the intermediate (32) using fluorine gas. This step can be performed, for example, by a method of fluorinating residual hydrogen in the molecule with fluorine gas diluted with nitrogen for 70 hours while gradually raising the temperature of the intermediate (32) to 70 to 100 ° C.
次に、化合物(33)に前記製造方法(ii)と同様に、金属フッ化物触媒(例えばNaF、CsF、KF、AgF等)の存在下で臭化アリル(Br−CH2CH=CH2)を反応させることにより、前駆体(5−1−3)が得られる。Next, allyl bromide (Br—CH 2 CH═CH 2 ) is added to the compound (33) in the presence of a metal fluoride catalyst (eg, NaF, CsF, KF, AgF, etc.) in the same manner as in the production method (ii). Is reacted to obtain the precursor (5-1-3).
<前駆体(5−1−4)の製造方法(v)>
A−O−Rf−が前記(4−4)基である場合の前駆体(5−1−4)の製造方法を、式(4−4)におけるa1=1、b2=x1、d1=x2である例を挙げて説明する。
まず、テトラフルオロエチレンを酸素と反応させて、下式(41)で表される化合物(41)を得る。この工程は、例えば以下の方法で実施できる。
すなわち、−60℃に冷却した光化学反応器に、ハイドロフルオロカーボンを溶媒として入れ、ある一定の速度で酸素を反応器に添加しながら紫外線を照射する。そこに特定の速度でテトラフルオロエチレンを添加すると、テトラフルオロエチレンと酸素が反応して化合物(41)が得られる。化合物(41)は分子内に不安定な過酸化物の骨格が残っている中間体である。
次いで、化合物(41)中の不安定な過酸化物部位を分解して、下式(42)で表される化合物(42)を得る。この工程は、例えば、化合物(41)を、200℃以上の窒素希釈フッ素ガスで処理することにより実施できる。<Preparation method (v) of precursor (5-1-4)>
The production method of the precursor (5-1-4) when A—O—R f — is the (4-4) group is defined as a1 = 1, b2 = x 1 , d1 in the formula (4-4). = with an example a x 2 will be described.
First, tetrafluoroethylene is reacted with oxygen to obtain a compound (41) represented by the following formula (41). This step can be performed, for example, by the following method.
That is, a photochemical reactor cooled to −60 ° C. is charged with hydrofluorocarbon as a solvent and irradiated with ultraviolet rays while oxygen is added to the reactor at a certain rate. When tetrafluoroethylene is added thereto at a specific rate, tetrafluoroethylene reacts with oxygen to obtain compound (41). Compound (41) is an intermediate in which an unstable peroxide skeleton remains in the molecule.
Next, the unstable peroxide site in the compound (41) is decomposed to obtain the compound (42) represented by the following formula (42). This step can be performed, for example, by treating the compound (41) with nitrogen-diluted fluorine gas at 200 ° C. or higher.
この後、化合物(42)に前記製造方法(ii)と同様に、金属フッ化物触媒(例えばNaF、CsF、KF、AgF等)の存在下で臭化アリル(Br−CH2CH=CH2)を反応させることにより、前駆体(5−1−4)が得られる。Thereafter, allyl bromide (Br—CH 2 CH═CH 2 ) is added to the compound (42) in the presence of a metal fluoride catalyst (eg, NaF, CsF, KF, AgF, etc.) in the same manner as in the production method (ii). Is reacted to obtain the precursor (5-1-4).
[表面処理層を有する基材の製造方法]
本発明の含フッ素エーテル化合物は、純度が高いことにより、ドライコーティング法によって基材の表面を処理して、表面処理層を有する基材を製造する方法に、そのまま用いることができる。含フッ素エーテル化合物の純度は95質量%以上が好ましく、98質量%以上が特に好ましい。本発明の含フッ素エーテル化合物は、ドライコーティング法により密着性に優れた表面処理層を形成するのに好適である。ドライコーティング法としては、真空蒸着、CVD、スパッタリング等の手法が挙げられる。含フッ素エーテル化合物の分解を抑えること、および、装置の簡便さより、真空蒸着法が好適に利用できる。真空蒸着法は、抵抗加熱法、電子ビーム加熱法、高周波誘導加熱法、反応性蒸着、分子線エピタキシー法、ホットウォール蒸着法、イオンプレーティング法、クラスターイオンビーム法等に細分することができるが、いずれの方法も適用することができる。含フッ素エーテル化合物の分解を抑制すること、および、装置の簡便さより、抵抗加熱法が好適に利用できる。真空蒸着装置は特に制限なく、公知の装置が利用できる。[Method for producing substrate having surface treatment layer]
Since the fluorine-containing ether compound of the present invention has high purity, it can be used as it is in a method for producing a substrate having a surface treatment layer by treating the surface of the substrate by a dry coating method. The purity of the fluorine-containing ether compound is preferably 95% by mass or more, particularly preferably 98% by mass or more. The fluorine-containing ether compound of the present invention is suitable for forming a surface treatment layer having excellent adhesion by a dry coating method. Examples of the dry coating method include vacuum deposition, CVD, sputtering, and the like. From the viewpoint of suppressing the decomposition of the fluorinated ether compound and the simplicity of the apparatus, the vacuum deposition method can be suitably used. The vacuum deposition method can be subdivided into resistance heating method, electron beam heating method, high frequency induction heating method, reactive deposition, molecular beam epitaxy method, hot wall deposition method, ion plating method, cluster ion beam method, etc. Any method can be applied. The resistance heating method can be suitably used from the viewpoint of suppressing the decomposition of the fluorinated ether compound and the simplicity of the apparatus. The vacuum deposition apparatus is not particularly limited, and a known apparatus can be used.
真空蒸着法を用いる場合の成膜条件は、適用する真空蒸着法の種類により異なるが、抵抗加熱法の場合、蒸着前真空度は1×10−2Pa以下が好ましく、1×10−3Pa以下が特に好ましい。蒸着源の加熱温度は、該含フッ素エーテル化合物蒸着源が充分な蒸気圧を有する温度であれば特に制限はない。具体的には30〜400℃が好ましく、50〜300℃が特に好ましい。加熱温度が上記範囲の下限値以上であると、成膜速度が良好になる。上記範囲の上限値以下であると、含フッ素エーテル化合物の分解が生じることなく、基材表面に撥水撥油性や耐摩擦性を付与できる。
真空蒸着時、基材温度は室温(20〜25℃)から200℃までの範囲であることが好ましい。基材温度が200℃以下であると、成膜速度が良好になる。基材温度の上限値は150℃以下がより好ましく、100℃以下が特に好ましい。
含フッ素エーテル化合物を用い、ドライコーティング法によって基材の表面を処理する場合、該処理によって基材の表面に形成される表面処理層は、膜厚として、1〜100nmが好ましく、1〜50nmが特に好ましい。該表面処理層の膜厚が上記範囲の下限値以上であると、表面処理による効果が充分に得られやすい。上記範囲の上限値以下であると利用効率が高い。なお、膜厚の測定は、例えば薄膜解析用X線回折計ATX−G(RIGAKU社製)を用いて、X線反射率法により反射X線の干渉パターンを得て、該干渉パターンの振動周期から算出することができる。The film forming conditions in the case of using the vacuum vapor deposition method vary depending on the type of the vacuum vapor deposition method to be applied. In the case of the resistance heating method, the vacuum degree before vapor deposition is preferably 1 × 10 −2 Pa or less, and preferably 1 × 10 −3 Pa. The following are particularly preferred: The heating temperature of the vapor deposition source is not particularly limited as long as the fluorine-containing ether compound vapor deposition source has a sufficient vapor pressure. Specifically, 30 to 400 ° C is preferable, and 50 to 300 ° C is particularly preferable. When the heating temperature is equal to or higher than the lower limit of the above range, the film formation rate is good. When the amount is not more than the upper limit of the above range, water and oil repellency and friction resistance can be imparted to the surface of the substrate without causing decomposition of the fluorine-containing ether compound.
At the time of vacuum deposition, the substrate temperature is preferably in the range from room temperature (20 to 25 ° C.) to 200 ° C. When the substrate temperature is 200 ° C. or lower, the film formation rate becomes good. The upper limit of the substrate temperature is more preferably 150 ° C. or less, and particularly preferably 100 ° C. or less.
When the surface of the substrate is treated by a dry coating method using a fluorine-containing ether compound, the surface treatment layer formed on the surface of the substrate by the treatment preferably has a thickness of 1 to 100 nm, preferably 1 to 50 nm. Particularly preferred. When the film thickness of the surface treatment layer is not less than the lower limit of the above range, the effect of the surface treatment can be sufficiently obtained. Use efficiency is high as it is below the upper limit of the said range. The film thickness is measured by, for example, using an X-ray diffractometer ATX-G for thin film analysis (manufactured by Rigaku) to obtain an interference pattern of reflected X-rays by the X-ray reflectivity method, and the vibration period of the interference pattern. It can be calculated from
特に、真空蒸着法においては、含フッ素エーテル化合物の純度が高く、不純物の含有量が少ないため、撥水撥油性および耐摩擦性の向上効果が大きい。これは、不純物である化合物(6−2)のような分子量が小さい副生成物や未反応原料が、化合物(1)よりも先に基材の表面に蒸着し、その結果、性能の発現を担う化合物(1)と基材の表面との化学結合が妨げられるのが、抑えられるためと考えられる。 In particular, in the vacuum deposition method, since the purity of the fluorine-containing ether compound is high and the content of impurities is small, the effect of improving water and oil repellency and friction resistance is great. This is because by-products and unreacted raw materials having a low molecular weight such as the compound (6-2) which is an impurity are vapor-deposited on the surface of the base material before the compound (1). It is thought that the chemical bond between the supporting compound (1) and the surface of the base material is hindered from being suppressed.
本発明の含フッ素エーテル化合物は、該化合物を含むコーティング液を基材の表面に塗布して塗布膜を形成し、該塗布膜から液状媒体を除去することにより、表面処理層を有する基材を製造することができる。
コーティング液の塗布方法は公知の手法を適宜用いることができる。
塗布方法としては、スピンコート法、ワイプコート法、スプレーコート法、スキージーコート法、ディップコート法、ダイコート法、インクジェット法、フローコート法、ロールコート法、キャスト法、ラングミュア・ブロジェット法またはグラビアコート法が好ましい。
液状媒体を除去する方法は、コーティング液の塗布膜から液状媒体を蒸発除去できる方法であればよく、公知の手法を適宜用いることができる。液状媒体を蒸発除去する温度は液状媒体の沸点以上であればよく、液状媒体の種類により適宜選択される。また、場合により減圧下で除去することもできるので液状媒体の沸点未満の温度で液状媒体を蒸発除去することもできる。具体的な液状媒体を蒸発除去する温度としては、液状媒体の種類によるが、10〜300℃が好ましく、20〜200℃が特に好ましい。
液状媒体を蒸発除去した後に、基材の表面に形成される表面処理層は、膜厚として、1〜100nmが好ましく、1〜50nmが特に好ましい。該表面処理層の膜厚が上記範囲の下限値以上であると、表面処理による効果が充分に得られやすい。上記範囲の上限値以下であると利用効率が高い。なお、膜厚の測定はドライコーティング法で形成される表面処理層の膜厚の測定方法と同様に行うことができる。The fluorine-containing ether compound of the present invention forms a coating film by coating a coating liquid containing the compound on the surface of the substrate, and removes the liquid medium from the coating film to thereby form a substrate having a surface treatment layer. Can be manufactured.
As a method for applying the coating liquid, a known method can be appropriately used.
Application methods include spin coating method, wipe coating method, spray coating method, squeegee coating method, dip coating method, die coating method, ink jet method, flow coating method, roll coating method, casting method, Langmuir-Blodgett method or gravure coating. The method is preferred.
The method for removing the liquid medium may be any method capable of evaporating and removing the liquid medium from the coating film of the coating liquid, and known methods can be appropriately used. The temperature at which the liquid medium is removed by evaporation may be at least the boiling point of the liquid medium, and is appropriately selected depending on the type of the liquid medium. In some cases, the liquid medium can be removed under reduced pressure, so that the liquid medium can be removed by evaporation at a temperature lower than the boiling point of the liquid medium. The specific temperature at which the liquid medium is removed by evaporation depends on the type of the liquid medium, but is preferably 10 to 300 ° C, particularly preferably 20 to 200 ° C.
After the liquid medium is removed by evaporation, the surface treatment layer formed on the surface of the substrate is preferably 1 to 100 nm, particularly preferably 1 to 50 nm, as a film thickness. When the film thickness of the surface treatment layer is not less than the lower limit of the above range, the effect of the surface treatment can be sufficiently obtained. Use efficiency is high as it is below the upper limit of the said range. The film thickness can be measured in the same manner as the method for measuring the film thickness of the surface treatment layer formed by the dry coating method.
上記ドライコーティング法やコーティング液を用いる方法により基材表面に表面処理層を形成した後に、該表面処理層の摩擦に対する耐久性を向上させるために、必要に応じて、含フッ素エーテル化合物と基材との反応を促進するための操作を行ってもよい。このような操作としては、加熱、加湿、光照射等が挙げられる。例えば、水分を有する大気中で表面処理層が形成された基材を加熱して、加水分解性シリル基のシラノール基への加水分解反応、基材表面の水酸基等とシラノール基との反応、シラノール基の縮合反応によるシロキサン結合の生成、等の反応を促進することができる。
表面処理後、表面処理層中の化合物であって他の化合物や基材と化学結合していない化合物は、必要に応じて除去してもよい。具体的な方法としては、例えば、表面処理層に溶剤をかけ流す方法や、溶剤をしみ込ませた布でふき取る方法が挙げられる。In order to improve the durability against friction of the surface treatment layer after forming the surface treatment layer on the surface of the substrate by the dry coating method or the method using a coating liquid, the fluorine-containing ether compound and the substrate are used as necessary. You may perform operation for promoting reaction with. Examples of such operations include heating, humidification, and light irradiation. For example, by heating a substrate on which a surface treatment layer is formed in an atmosphere having moisture, hydrolysis reaction of hydrolyzable silyl groups to silanol groups, reaction of hydroxyl groups on the substrate surface with silanol groups, silanols, Reactions such as formation of siloxane bonds by group condensation reactions can be promoted.
After the surface treatment, compounds in the surface treatment layer that are not chemically bonded to other compounds or the substrate may be removed as necessary. Specific methods include, for example, a method of pouring a solvent over the surface treatment layer and a method of wiping with a cloth soaked with a solvent.
(コーティング液)
本発明のコーティング液は、化合物(1)と液状媒体とを含む。コーティング液は液状であればよく、溶液でもよく、分散液でもよい。
コーティング液は、化合物(1)を含んでいればよく、化合物(1)の製造工程で生成した副生成物を含む不純物を含んでもよい。好ましくは、コーティング液は、前記純度95質量%以上の含フッ素エーテル化合物と液状媒体とを含む。
本発明の化合物(1)はコーティング液中に0.001〜10質量%含まれることが好ましく、0.1〜1質量%が特に好ましい。(Coating solution)
The coating liquid of the present invention contains compound (1) and a liquid medium. The coating solution may be liquid, may be a solution, or may be a dispersion.
The coating liquid should just contain the compound (1), and may contain the impurity containing the by-product produced | generated at the manufacturing process of the compound (1). Preferably, the coating liquid contains the fluorine-containing ether compound having a purity of 95% by mass or more and a liquid medium.
The compound (1) of the present invention is preferably contained in the coating solution in an amount of 0.001 to 10% by mass, particularly preferably 0.1 to 1% by mass.
<液状媒体>
本発明における液状媒体の沸点は30〜200℃が好ましく、40〜150℃が特に好ましい。液状媒体としては有機溶媒が好ましい。有機溶媒としてはフッ素系有機溶媒でもよく、非フッ素系有機溶媒でもよい。
フッ素系有機溶媒としては、フッ素化アルカン、フッ素化芳香族化合物、フルオロアルキルエーテル、フッ素化アルキルアミン、フルオロアルコール等が挙げられる。
フッ素化アルカンとしては、炭素数4〜8の化合物が好ましい。フッ素化アルカンにおけるフッ素原子と水素原子の数の合計に対するフッ素原子の数の割合は70%以上でかつ少なくとも1個の水素原子を有する化合物が好ましい。市販品としては、例えばC6F13H(AC−2000:製品名、旭硝子社製)、C6F13C2H5(AC−6000:製品名、旭硝子社製)、C2F5CHFCHFCF3(バートレル:製品名、デュポン社製)等が挙げられる。
フッ素化芳香族化合物としては、例えばヘキサフルオロベンゼン、トリフルオロメチルベンゼン、ペルフルオロトルエン、ビス(トリフルオロメチル)ベンゼン等が挙げられる。
フルオロアルキルエーテルとしては、炭素数4〜12の化合物が好ましい。本発明において、フルオロアルキルエーテルとは、ジフルオロアルキルエーテルとアルキルフルオロアルキルエーテルを意味する。これら2種のエーテルにおけるフルオロアルキル基はポリフルオロアルキル基が好ましく、ポリフルオロアルキル基はペルフルオロアルキル基であってもよい。アルキルフルオロアルキルエーテルとしてはアルキルペルフルオロアルキルエーテルが好ましい。フルオロアルキルエーテルにおけるフッ素原子と水素原子の数の合計に対するフッ素原子の数の割合は60%以上でかつ少なくとも1個の水素原子を有する化合物が好ましい。市販品としては、例えばCF3CH2OCF2CF2H(AE−3000:製品名、旭硝子社製)、C4F90CH3(ノベック−7100:製品名、3M社製)、C4F90C2H5(ノベック−7200:製品名、3M社製)、C6F130CH3(ノベック−7300:製品名、3M社製)等が挙げられる。
フッ素化アルキルアミンとしては、例えばペルフルオロトリプロピルアミン、ペルフルオロトリブチルアミン等が挙げられる。
フルオロアルコールとしては、例えば2,2,3,3−テトラフルオロプロパノール、2,2,2−トリフルオロエタノール、ヘキサフルオロイソプロパノール等が挙げられる。
フッ素系有機溶媒としては化合物(1)の溶解性の点で、フッ素化アルカン、フッ素化芳香族化合物、フルオロアルキルエーテルが好ましく、中でも、フルオロアルキルエーテルが特に好ましい。<Liquid medium>
The boiling point of the liquid medium in the present invention is preferably from 30 to 200 ° C, particularly preferably from 40 to 150 ° C. As the liquid medium, an organic solvent is preferable. The organic solvent may be a fluorinated organic solvent or a non-fluorinated organic solvent.
Examples of the fluorinated organic solvent include fluorinated alkanes, fluorinated aromatic compounds, fluoroalkyl ethers, fluorinated alkylamines, and fluoroalcohols.
As the fluorinated alkane, a compound having 4 to 8 carbon atoms is preferable. The ratio of the number of fluorine atoms to the total number of fluorine atoms and hydrogen atoms in the fluorinated alkane is preferably 70% or more and a compound having at least one hydrogen atom. Examples of commercially available products include C 6 F 13 H (AC-2000: product name, manufactured by Asahi Glass Co., Ltd.), C 6 F 13 C 2 H 5 (AC-6000: product name, manufactured by Asahi Glass Co., Ltd.), C 2 F 5 CHFCHFCCF. 3 (Bertrel: product name, manufactured by DuPont).
Examples of the fluorinated aromatic compound include hexafluorobenzene, trifluoromethylbenzene, perfluorotoluene, and bis (trifluoromethyl) benzene.
As the fluoroalkyl ether, a compound having 4 to 12 carbon atoms is preferable. In the present invention, fluoroalkyl ether means difluoroalkyl ether and alkylfluoroalkyl ether. The fluoroalkyl group in these two ethers is preferably a polyfluoroalkyl group, and the polyfluoroalkyl group may be a perfluoroalkyl group. As the alkyl fluoroalkyl ether, alkyl perfluoroalkyl ether is preferable. The ratio of the number of fluorine atoms to the total number of fluorine atoms and hydrogen atoms in the fluoroalkyl ether is preferably 60% or more and a compound having at least one hydrogen atom. As commercially available products, for example, CF 3 CH 2 OCF 2 CF 2 H (AE-3000: product name, manufactured by Asahi Glass Co., Ltd.), C 4 F 9 0CH 3 ( Novec -7100: product name, 3M Co.), C 4 F 9 0C 2 H 5 (Novec -7200: product name, manufactured by 3M Co.), C 6 F 13 0CH 3 ( Novec -7300: product name, 3M Co., Ltd.).
Examples of the fluorinated alkylamine include perfluorotripropylamine and perfluorotributylamine.
Examples of the fluoroalcohol include 2,2,3,3-tetrafluoropropanol, 2,2,2-trifluoroethanol, hexafluoroisopropanol and the like.
As the fluorine-based organic solvent, a fluorinated alkane, a fluorinated aromatic compound, and a fluoroalkyl ether are preferable from the viewpoint of solubility of the compound (1), and among them, a fluoroalkyl ether is particularly preferable.
非フッ素系有機溶媒としては、水素原子および炭素原子のみからなる化合物と水素原子、炭素原子および酸素原子のみからなる化合物が好ましく、炭化水素系有機溶媒、アルコール系有機溶媒、ケトン系有機溶媒、エーテル系有機溶媒、エステル系有機溶媒が挙げられる。
炭化水素系有機溶媒としては、ヘキサン、へプタン、シクロヘキサン等が好ましい。
アルコール系有機溶媒としては、メタノール、エタノール、プロパノール、イソプロパノール等が好ましい。
ケトン系有機溶媒としては、アセトン、メチルエチルケトン、メチルイソブチルケトン等が好ましい。
エーテル系有機溶媒としては、ジエチルエーテル、テトラヒドロフラン、テトラエチレングリコールジメチルエーテル等が好ましい。
エステル系有機溶媒としては、酢酸エチル、酢酸ブチル等が好ましい。
非フッ素系有機溶媒としては化合物(1)の溶解性の点で、ケトン系有機溶媒が特に好ましい。As the non-fluorine-based organic solvent, a compound consisting of only hydrogen atoms and carbon atoms and a compound consisting only of hydrogen atoms, carbon atoms and oxygen atoms are preferable. Hydrocarbon organic solvents, alcohol-based organic solvents, ketone-based organic solvents, ethers System organic solvents and ester organic solvents.
As the hydrocarbon organic solvent, hexane, heptane, cyclohexane and the like are preferable.
As the alcohol organic solvent, methanol, ethanol, propanol, isopropanol and the like are preferable.
As the ketone organic solvent, acetone, methyl ethyl ketone, methyl isobutyl ketone and the like are preferable.
As the ether organic solvent, diethyl ether, tetrahydrofuran, tetraethylene glycol dimethyl ether and the like are preferable.
As the ester organic solvent, ethyl acetate, butyl acetate and the like are preferable.
As the non-fluorine organic solvent, a ketone organic solvent is particularly preferable from the viewpoint of the solubility of the compound (1).
本発明における液状媒体としては、フッ素化アルカン、フッ素化芳香族化合物、フルオロアルキルエーテル、水素原子および炭素原子のみからなる化合物、ならびに、水素原子、炭素原子および酸素原子のみからなる化合物からなる群から選択される少なくとも1種の有機溶媒が好ましい。特に、フッ素化アルカン、フッ素化芳香族化合物およびフルオロアルキルエーテルから選ばれるフッ素系有機溶媒が好ましい。
液状媒体としては上記有機溶媒の2種以上の混合物であってもよく、上記有機溶媒と他の液状媒体(上記以外の有機溶媒等)との混合物であってもよい。混合物の場合、上記有機溶媒から選択される少なくとも1種の有機溶媒を、合計で液状媒体全体の90質量%以上含むことが、含フッ素エーテル化合物の溶解性を高める点で好ましい。
本発明のコーティング液は、液状媒体を90〜90.999質量%含有することが好ましく、99〜99.99質量%が特に好ましい。The liquid medium in the present invention includes a fluorinated alkane, a fluorinated aromatic compound, a fluoroalkyl ether, a compound consisting only of hydrogen atoms and carbon atoms, and a group consisting of a compound consisting only of hydrogen atoms, carbon atoms and oxygen atoms. At least one organic solvent selected is preferred. In particular, a fluorine-based organic solvent selected from a fluorinated alkane, a fluorinated aromatic compound, and a fluoroalkyl ether is preferable.
The liquid medium may be a mixture of two or more of the above organic solvents, or a mixture of the above organic solvent and another liquid medium (an organic solvent other than the above). In the case of a mixture, it is preferable that at least one organic solvent selected from the above organic solvents is contained in a total amount of 90% by mass or more of the whole liquid medium from the viewpoint of improving the solubility of the fluorinated ether compound.
The coating liquid of the present invention preferably contains 90 to 90.999% by mass of a liquid medium, particularly preferably 99 to 99.99% by mass.
コーティング液は、化合物(1)および液状媒体の他に、本発明の効果を損なわない範囲で、他の成分を含有してもよい。
また、コーティング液中では、含フッ素エーテル化合物の一部は部分加水分解縮合物となっていてもよい。部分加水分解縮合物とは、含フッ素エーテル化合物の2分子以上が加水分解縮合反応して多量体化した化合物をいう。すなわち、含フッ素エーテル化合物の加水分解性基が加水分解し、生成したシラノール基同士の脱水縮合反応によりシロキサン結合が生じて、含フッ素エーテル化合物が多量体化した化合物をいう。液状媒体に対する溶解性が低下しない程度に多量体化した部分加水分解縮合物は、含フッ素エーテル化合物と同様に、基材表面に良好な撥水撥油性を付与することができる。
コーティング液が含有していてもよいその他の成分としては、例えば、加水分解性シリル基の加水分解と縮合反応を促進する酸触媒や塩基性触媒等の公知の添加剤が挙げられる。
酸触媒としては、塩酸、硝酸、酢酸、硫酸、燐酸、スルホン酸、メタンスルホン酸、p−トルエンスルホン酸等が挙げられる。
塩基性触媒としては、水酸化ナトリウム、水酸化カリウム、アンモニア等が挙げられる。
コーティング液における、他の成分の含有量は10質量%以下が好ましく、1質量%以下が特に好ましい。The coating liquid may contain other components in addition to the compound (1) and the liquid medium as long as the effects of the present invention are not impaired.
In the coating liquid, a part of the fluorine-containing ether compound may be a partially hydrolyzed condensate. The partially hydrolyzed condensate refers to a compound in which two or more molecules of a fluorine-containing ether compound are polymerized by a hydrolytic condensation reaction. That is, it refers to a compound in which a hydrolyzable group of a fluorine-containing ether compound is hydrolyzed and a siloxane bond is generated by a dehydration condensation reaction between the generated silanol groups, and the fluorine-containing ether compound is multimerized. A partially hydrolyzed condensate that has been multimerized to such an extent that the solubility in a liquid medium does not decrease can impart good water and oil repellency to the substrate surface, like the fluorinated ether compound.
Examples of other components that may be contained in the coating liquid include known additives such as an acid catalyst and a basic catalyst that promote hydrolysis and condensation reaction of the hydrolyzable silyl group.
Examples of the acid catalyst include hydrochloric acid, nitric acid, acetic acid, sulfuric acid, phosphoric acid, sulfonic acid, methanesulfonic acid, p-toluenesulfonic acid, and the like.
Examples of the basic catalyst include sodium hydroxide, potassium hydroxide, ammonia and the like.
The content of other components in the coating liquid is preferably 10% by mass or less, and particularly preferably 1% by mass or less.
コーティング液の固形分濃度は0.001〜10質量%が好ましく、0.01〜1質量%が特に好ましい。
なお、本発明におけるコーティング液の固形分濃度とは、加熱前のコーティング液の質量と、120℃の対流式乾燥機にて4時間加熱して液状媒体を蒸発除去した後の質量とから算出する値である。The solid content concentration of the coating liquid is preferably 0.001 to 10% by mass, particularly preferably 0.01 to 1% by mass.
The solid content concentration of the coating liquid in the present invention is calculated from the mass of the coating liquid before heating and the mass after evaporating and removing the liquid medium by heating in a convection dryer at 120 ° C. for 4 hours. Value.
(基材)
本発明において、表面処理の対象となる基材は、撥水撥油性の付与が求められている基材であれば特に限定されない。基材の表面の材料としては、金属、樹脂、ガラス、セラミック、これらの複合材料が挙げられる。
本発明の含フッ素エーテル化合物(化合物(1))または該化合物を含むコーティング液を用いて基材の表面を処理して表面処理層が形成されることにより、良好な撥水撥油性が付与されるとともに、該表面が繰り返し摩擦されても撥水撥油性が低下しにくい優れた耐摩擦性が得られる。したがって、このようにして得られる、表面処理層を有する基材は、良好な撥水撥油性を有するとともに、該表面が繰り返し摩擦されても撥水撥油性が低下しにくい優れた耐摩擦性を有するため、タッチパネルを構成する部材として好適である。タッチパネルとは、指等による接触によってその接触位置情報を入力する装置と表示装置とを組み合わせた入力/表示装置(タッチパネル装置)の、入力装置を意味する。タッチパネルは、基材と、入力検出方式に応じて、透明導電膜、電極、配線、IC等とから構成されている。基材の表面処理層を有する面をタッチパネルの入力面とすることにより、良好な指紋除去性を有するタッチパネルが得られる。
タッチパネル用基材の材質は透光性を有する。本明細書において、「透光性を有する」とは、JIS R 3106に準じた垂直入射型可視光透過率が25%以上であることを意味する。
タッチパネル用基材の材質としては、ガラスまたは透明樹脂基材が好ましい。ガラスとしてはソーダライムガラス、ホウ珪酸ガラス、無アルカリガラス、クリスタルガラス、石英ガラスが好ましく、化学強化ガラスが特に好ましい。透明樹脂基材としては、ポリカーボネートが好ましい。
また、本発明における基材として、液晶ディスプレイ、CRTディスプレイ、プロジェクションディスプレイ、プラズマディスプレイ、ELディスプレイ等の各種ディスプレイの最表面を構成するディスプレイ用基材も好適であり、本発明の含フッ素エーテル化合物またはコーティング液を用いた表面処理によって表面処理層を形成することにより、良好な汚れ除去性が得られる。(Base material)
In the present invention, the base material to be surface-treated is not particularly limited as long as it is a base material to which water and oil repellency is required. Examples of the material for the surface of the substrate include metals, resins, glasses, ceramics, and composite materials thereof.
By treating the surface of the substrate with the fluorine-containing ether compound (compound (1)) or the coating liquid containing the compound of the present invention to form a surface treatment layer, good water and oil repellency is imparted. In addition, even if the surface is repeatedly rubbed, excellent friction resistance is obtained in which the water and oil repellency is hardly lowered. Therefore, the substrate having the surface treatment layer obtained in this way has good water and oil repellency, and excellent friction resistance that is unlikely to decrease the water and oil repellency even when the surface is repeatedly rubbed. Since it has, it is suitable as a member which comprises a touch panel. The touch panel means an input device of an input / display device (touch panel device) that combines a display device and a device that inputs contact position information by contact with a finger or the like. The touch panel is composed of a base material and a transparent conductive film, an electrode, a wiring, an IC, and the like depending on the input detection method. By making the surface having the surface treatment layer of the base material the input surface of the touch panel, a touch panel having good fingerprint removability can be obtained.
The material of the base material for touch panels has translucency. In this specification, “having translucency” means that the normal incidence visible light transmittance according to JIS R 3106 is 25% or more.
As a material of the base material for touch panels, glass or a transparent resin base material is preferable. As the glass, soda lime glass, borosilicate glass, alkali-free glass, crystal glass, and quartz glass are preferable, and chemically tempered glass is particularly preferable. As the transparent resin substrate, polycarbonate is preferable.
Further, as the substrate in the present invention, a display substrate constituting the outermost surface of various displays such as a liquid crystal display, a CRT display, a projection display, a plasma display, and an EL display is also suitable, and the fluorine-containing ether compound of the present invention or By forming the surface treatment layer by the surface treatment using the coating liquid, good dirt removal property can be obtained.
以下に実施例を用いて本発明をさらに詳しく説明するが、本発明はこれら実施例に限定されるものではない。以下において「%」は特に断りのない限り「質量%」である。 Hereinafter, the present invention will be described in more detail using examples, but the present invention is not limited to these examples. In the following, “%” is “% by mass” unless otherwise specified.
[実施例1:含フッ素エーテル化合物(15A)の製造]
本例では前駆体の製造方法(i)を用いた。
まず、単蒸留装置を接続した50mLのナスフラスコに上式(11)で表され、式(11)におけるxの平均値が11.2である化合物(11A)の19.0g、CsFの0.352g入れ、80℃まで昇温しエステルの熱分解を行った。分解して生成した副生成物であるヘキサフルオロプロピレンオキシド誘導体を系外に除去するため、80℃に保ったまま10mmHgまで減圧し、1時間保持した。その後、テトラグライムの12mL、CsFの4.39gをナスフラスコに添加後、窒素雰囲気下、50℃で1時間攪拌した。50℃に保ったまま、臭化アリルの2.49gを滴下ロートで滴下した。温度を80℃まで昇温し、窒素雰囲気下、12時間反応させた。反応終了後、フッ素系溶媒であるCT−Solv.100E(製品名、旭硝子社製)と水により抽出、洗浄を行い、2層分離後の有機相を回収した。有機相に5%の水酸化ナトリウム水溶液を加え30分間攪拌させた後、2層分離後の有機相を回収した。回収した有機相の溶媒を減圧留去し、カラムクロマトグラフィによる精製後、0.5μmの孔径を持つメンブランフィルタに通して細かいごみを取り除き、上式(5−1−1)で表され、式(5−1−1)におけるxの平均値が11.2である前駆体(5−1−1A)を14.2g(収率70.1%)得た。前駆体(5−1−1A)は室温(20〜25℃)で液体である。[Example 1: Production of fluorinated ether compound (15A)]
In this example, the precursor production method (i) was used.
First, 19.0 g of the compound (11A) represented by the above formula (11) and having an average x value of 11.2 in the formula (11) in a 50 mL eggplant flask connected to a simple distillation apparatus, and 0.02 of CsF. 352 g was added and the temperature was raised to 80 ° C. to thermally decompose the ester. In order to remove the hexafluoropropylene oxide derivative, which is a by-product generated by decomposition, out of the system, the pressure was reduced to 10 mmHg while maintaining the temperature at 80 ° C. and maintained for 1 hour. Thereafter, 12 mL of tetraglyme and 4.39 g of CsF were added to the eggplant flask and then stirred at 50 ° C. for 1 hour in a nitrogen atmosphere. 2.49g of allyl bromide was dripped with the dropping funnel, keeping at 50 degreeC. The temperature was raised to 80 ° C. and reacted for 12 hours in a nitrogen atmosphere. After completion of the reaction, the fluorine-based solvent CT-Solv. Extraction and washing were performed with 100E (product name, manufactured by Asahi Glass Co., Ltd.) and water, and the organic phase after two-layer separation was recovered. A 5% aqueous sodium hydroxide solution was added to the organic phase and stirred for 30 minutes, and then the organic phase after separation of the two layers was recovered. The solvent of the recovered organic phase was distilled off under reduced pressure, and after purification by column chromatography, fine dust was removed by passing through a membrane filter having a pore size of 0.5 μm, and expressed by the above formula (5-1-1), 14.2 g (yield 70.1%) of a precursor (5-1-1A) having an average x value of 11.2 in 5-1-1) was obtained. The precursor (5-1-1A) is liquid at room temperature (20-25 ° C.).
得られた前駆体(5−1−1A)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重アセトン、基準:TMS、内部標準:ビス(トリフルオロメチル)ベンゼン δ(ppm):5.9、5.3、4.6。
19F−NMR(282.7MHz、溶媒:重アセトン、基準:CFCl3、内部標準:ビス(トリフルオロメチル)ベンゼン δ(ppm):−55.9、−88.3、−89.0、−90.8〜−91.0。NMR spectrum of the obtained precursor (5-1-1A);
1 H-NMR (300.4 MHz, solvent: heavy acetone, standard: TMS, internal standard: bis (trifluoromethyl) benzene δ (ppm): 5.9, 5.3, 4.6.
19 F-NMR (282.7 MHz, solvent: heavy acetone, standard: CFCl 3 , internal standard: bis (trifluoromethyl) benzene δ (ppm): −55.9, −88.3, −89.0, − 90.8 to -91.0.
次に、前駆体(5−1−1A)をヒドロシリル化した。
すなわち、環流冷却器を接続した25mLの2口フラスコに上記で得た前駆体(5−1−1A)の2.56g、ビス(トリフルオロメチル)ベンゼンの3.77g、白金(0)−1,3−ジビニル−1,1,3,3−テトラメチルジシロキサン錯体のキシレン溶液(白金含有量:2質量%)の0.0424g、トリクロロシランの0.959gを記載順に添加し、窒素雰囲気下、60℃で4時間反応させた。反応終了後、ビス(トリフルオロメチル)ベンゼンとトリクロロシランとを減圧留去し、下式(13)で表され、xの平均値が11.2である化合物(13A)を定量的に得た。化合物(13A)は室温で液体である。また副生成物として下式(14)で表され、xの平均値が11.2である化合物(14A)が生成していた。
この工程で得られた生成物における化合物(13A)の含有量は98質量%、化合物(14A)の含有量は2質量%であった。Next, the precursor (5-1-1A) was hydrosilylated.
That is, 2.56 g of the precursor (5-1-1A) obtained above, 3.77 g of bis (trifluoromethyl) benzene, platinum (0) -1 in a 25 mL two-necked flask connected with a reflux condenser. , 3-Divinyl-1,1,3,3-tetramethyldisiloxane complex in xylene solution (platinum content: 2% by mass), 0.0424 g and 0.959 g of trichlorosilane were added in the stated order, , Reacted at 60 ° C. for 4 hours. After completion of the reaction, bis (trifluoromethyl) benzene and trichlorosilane were distilled off under reduced pressure to quantitatively obtain a compound (13A) represented by the following formula (13) and having an average value of x of 11.2. . Compound (13A) is a liquid at room temperature. Further, a compound (14A) represented by the following formula (14) and having an average value of x of 11.2 was produced as a by-product.
The content of the compound (13A) in the product obtained in this step was 98% by mass, and the content of the compound (14A) was 2% by mass.
得られた化合物(13A)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:TMS、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):4.1、2.0、1.4。
19F−NMR(282.7MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:CFCl3、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):−56.2、−88.6、−89.4、−91.3、−91.8。NMR spectrum of the obtained compound (13A);
1 H-NMR (300.4 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: TMS, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): 4.1, 2. 0, 1.4.
19 F-NMR (282.7 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: CFCl 3 , internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): −56.2, -88.6, -89.4, -91.3, -91.8.
次に化合物(13A)の塩素原子をメトキシ基に置換した。
すなわち、環流冷却器と滴下ロートを接続した25mLの2口フラスコに上記で得た化合物(13A)の2.73gを入れ、オルト蟻酸トリメチルとメタノールとの混合溶液の1.49g(オルト蟻酸トリメチル:メタノール=26.7:1[mol:mol])を滴下ロートで滴下した。滴下後、窒素雰囲気下、60℃で3時間反応させた。その後、再びメタノールの0.424gを滴下ロートで滴下し、窒素雰囲気下、60℃で3時間反応させた。反応終了後、オルト蟻酸トリメチルとメタノールとを減圧留去した。系中に残存する白金触媒を除去するために、残渣に活性炭を加えて10分間攪拌した後、0.5μm孔径のメンブランフィルタに通すことで、下式(15)で表され、xの平均値が12.2である含フッ素エーテル化合物(15A)を1.72g(収率63.8%)得た。含フッ素エーテル化合物(15A)は室温で液体である。NMR分析より、含フッ素エーテル化合物(15A)の数平均分子量は1,550であった。
この工程で得られた生成物における含フッ素エーテル化合物(15A)の含有量(表には「目的化合物の含有量」と記載する。以下同様。)は98質量%であり、不純物として検出されたのは前記化合物(14A)の2質量%であった。Next, the chlorine atom of compound (13A) was substituted with a methoxy group.
That is, 2.73 g of the compound (13A) obtained above was placed in a 25 mL two-necked flask connected with a reflux condenser and a dropping funnel, and 1.49 g of a mixed solution of trimethyl orthoformate and methanol (trimethyl orthoformate: Methanol = 26.7: 1 [mol: mol]) was added dropwise using a dropping funnel. After dripping, it was made to react at 60 degreeC by nitrogen atmosphere for 3 hours. Thereafter, 0.424 g of methanol was again dropped with a dropping funnel, and the mixture was reacted at 60 ° C. for 3 hours in a nitrogen atmosphere. After completion of the reaction, trimethyl orthoformate and methanol were distilled off under reduced pressure. In order to remove the platinum catalyst remaining in the system, activated carbon was added to the residue, stirred for 10 minutes, and then passed through a membrane filter having a pore size of 0.5 μm, and expressed by the following formula (15), the average value of x As a result, 1.72 g (yield 63.8%) of a fluorine-containing ether compound (15A) having a molecular weight of 12.2. The fluorine-containing ether compound (15A) is liquid at room temperature. From the NMR analysis, the number average molecular weight of the fluorine-containing ether compound (15A) was 1,550.
The content of the fluorinated ether compound (15A) in the product obtained in this step (described as “content of target compound” in the table; the same shall apply hereinafter) was 98% by mass, and was detected as an impurity. The amount was 2% by mass of the compound (14A).
得られた含フッ素エーテル化合物(15A)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:TMS、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):4.0、1.8、0.7。
19F−NMR(282.7MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:CFCl3、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):−56.2、−88.6、−89.3、−91.3、−91.4。NMR spectrum of the resulting fluorine-containing ether compound (15A);
1 H-NMR (300.4 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: TMS, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): 4.0, 1. 8, 0.7.
19 F-NMR (282.7 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: CFCl 3, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): −56.2, − 88.6, -89.3, -91.3, -91.4.
[比較例1:含フッ素エーテル化合物(15B)の製造]
本例では、前駆体の製造方法(ii)を用いた。
まず、滴下ロートと環流冷却器を接続した300mLの3口フラスコにテトラグライムの120mL、CsFの15.4gを加え、上式(12)で表され、式(12)におけるxの平均値が8.4である化合物(12B)の48.7gを滴下ロートで滴下してから1時間攪拌した。その後、臭化アリルの11.9gを滴下ロートで滴下し、窒素雰囲気下、80℃で1日間反応させた。反応終了後、フッ素系溶媒であるCTsolv.100E(製品名、旭硝子社製)と水とにより抽出・洗浄を行い、分液ロートを用いて2層分離後の有機相を回収した。有機相に5%の水酸化ナトリウム水溶液を加え30分間攪拌した。攪拌後、分液ロートを用いて2層分離後の有機相を回収した。回収した有機相の溶媒を減圧留去し、残渣をメタノールと水の混合溶媒で洗浄した。洗浄後、分液ロートを用いて2層分離後の有機相を回収した。回収した有機相をカラムクロマトグラフィで精製して、上式(5−1−1)で表され、式(5−1−1)におけるxの平均値が8.5である前駆体(5−1−1B)を15.0g(収率29.1%)得た。前駆体(5−1−1B)は室温で液体である。[Comparative Example 1: Production of fluorinated ether compound (15B)]
In this example, the precursor production method (ii) was used.
First, 120 mL of tetraglyme and 15.4 g of CsF were added to a 300 mL three-necked flask connected with a dropping funnel and a reflux condenser, represented by the above formula (12), and the average value of x in formula (12) was 8 48.7 g of the compound (12B) of No. 4 was added dropwise using a dropping funnel, followed by stirring for 1 hour. Thereafter, 11.9 g of allyl bromide was added dropwise with a dropping funnel and reacted at 80 ° C. for 1 day in a nitrogen atmosphere. After completion of the reaction, CTsolv. Extraction and washing were performed with 100E (product name, manufactured by Asahi Glass Co., Ltd.) and water, and the organic phase after separation into two layers was recovered using a separatory funnel. A 5% aqueous sodium hydroxide solution was added to the organic phase and stirred for 30 minutes. After stirring, the organic phase after two-layer separation was recovered using a separatory funnel. The collected organic phase solvent was distilled off under reduced pressure, and the residue was washed with a mixed solvent of methanol and water. After washing, the organic phase after separation into two layers was recovered using a separatory funnel. The recovered organic phase was purified by column chromatography, represented by the above formula (5-1-1), and a precursor (5-1 that has an average x value of 8.5 in formula (5-1-1) -1B) was obtained 15.0 g (yield 29.1%). The precursor (5-1-1B) is a liquid at room temperature.
得られた前駆体(5−1−1B)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重アセトン、基準:TMS、内部標準:ビス(トリフルオロメチル)ベンゼン δ(ppm):6.0、5.4、4.7。
19F−NMR(282.7MHz、溶媒:重アセトン、基準:CFCl3、内部標準:ビス(トリフルオロメチル)ベンゼン δ(ppm):−55.2、−87.8、−88.5、−89.4〜−90.4。NMR spectrum of the obtained precursor (5-1-1B);
1 H-NMR (300.4 MHz, solvent: heavy acetone, standard: TMS, internal standard: bis (trifluoromethyl) benzene δ (ppm): 6.0, 5.4, 4.7.
19 F-NMR (282.7 MHz, solvent: heavy acetone, standard: CFCl 3 , internal standard: bis (trifluoromethyl) benzene δ (ppm): −55.2, −87.8, −88.5, − 89.4--90.4.
次に、前駆体(5−1−1B)をヒドロシリル化した。
すなわち、環流冷却器を接続した50mLの2口フラスコに、前記で得た前駆体(5−1−1B)の15.0g、ビス(トリフルオロメチル)ベンゼンの15.0g、白金(0)−1,3−ジビニル−1,1,3,3−テトラメチルジシロキサン錯体のキシレン溶液(白金含有量:2質量%)の0.0373g、トリクロロシランの7.57gを記載順に添加し、窒素雰囲気下、60℃で4時間反応させた。反応終了後、ビス(トリフルオロメチル)ベンゼンとトリクロロシランとを減圧留去し、上式(13)で表され、xの平均値が8.5である化合物(13B)を定量的に得た。化合物(13B)は室温で液体である。
この工程で得られた生成物中の不純物の測定において、縮合物らしきピークをわずかに観察したが定量は難しかったため、本工程で得られた生成物中の化合物(13B)の含有量は約99質量%、不純物の含有量は約1質量%とみなす。Next, the precursor (5-1-1B) was hydrosilylated.
That is, in a 50 mL two-necked flask connected with a reflux condenser, 15.0 g of the precursor (5-1-1B) obtained above, 15.0 g of bis (trifluoromethyl) benzene, platinum (0)- 0.0373 g of a 1,3-divinyl-1,1,3,3-tetramethyldisiloxane complex xylene solution (platinum content: 2% by mass) and 7.57 g of trichlorosilane were added in the order described, and a nitrogen atmosphere The reaction was carried out at 60 ° C. for 4 hours. After completion of the reaction, bis (trifluoromethyl) benzene and trichlorosilane were distilled off under reduced pressure to quantitatively obtain a compound (13B) represented by the above formula (13) and having an average x value of 8.5. . Compound (13B) is a liquid at room temperature.
In the measurement of impurities in the product obtained in this step, a peak that appeared to be a condensate was slightly observed, but quantification was difficult. Therefore, the content of the compound (13B) in the product obtained in this step was about 99. It is considered that the content of impurities is about 1% by mass.
得られた化合物(13B)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:TMS、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):4.0、2.0、1.5。
19F−NMR(282.7MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:CFCl3、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):−56.1、−88.7、−89.5、−90.9、−91.4、−91.7。NMR spectrum of the obtained compound (13B);
1 H-NMR (300.4 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: TMS, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): 4.0, 2. 0, 1.5.
19 F-NMR (282.7 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: CFCl 3 , internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): −56.1, -88.7, -89.5, -90.9, -91.4, -91.7.
次に化合物(13B)の塩素原子をメトキシ基に置換した。
すなわち、環流冷却器と滴下ロートを接続した50mLの2口フラスコに上記で得た化合物(13B)の16.4gを入れ、オルト蟻酸トリメチルとメタノールとの混合溶液の11.8g(オルト蟻酸トリメチル:メタノール=26.7:1[mol:mol])を滴下ロートで滴下した。滴下後、窒素雰囲気下、60℃で3時間反応させた。その後、再びメタノールの0.424gを滴下ロートで滴下し、窒素雰囲気下、60℃で3時間反応させた。反応終了後、オルト蟻酸トリメチルとメタノールとを減圧留去した。系中に残存する白金触媒を除去するために、残渣に活性炭を加えて10分間攪拌した後、0.5μm孔径のメンブランフィルタに通すことで、上式(15)で表され、xの平均値が8.5である含フッ素エーテル化合物(15B)を14.6g(収率90.3%)得た。含フッ素エーテル化合物(15B)は室温で液体である。NMR分析より、含フッ素エーテル化合物(15B)の数平均分子量は1,240であった。
この工程で得られた生成物中の不純物の測定において、不純物のピークは観察されなかった。本工程で得られた生成物中の含フッ素エーテル化合物(15B)の含有量は約99質量%、不純物の含有量は約1質量%とみなす。Next, the chlorine atom of compound (13B) was substituted with a methoxy group.
That is, 16.4 g of the compound (13B) obtained above was placed in a 50 mL two-necked flask connected with a reflux condenser and a dropping funnel, and 11.8 g of a mixed solution of trimethyl orthoformate and methanol (trimethyl orthoformate: Methanol = 26.7: 1 [mol: mol]) was added dropwise using a dropping funnel. After dripping, it was made to react at 60 degreeC by nitrogen atmosphere for 3 hours. Thereafter, 0.424 g of methanol was again dropped with a dropping funnel, and the mixture was reacted at 60 ° C. for 3 hours in a nitrogen atmosphere. After completion of the reaction, trimethyl orthoformate and methanol were distilled off under reduced pressure. In order to remove the platinum catalyst remaining in the system, activated carbon was added to the residue, stirred for 10 minutes, and then passed through a membrane filter having a pore size of 0.5 μm, and expressed by the above formula (15), the average value of x As a result, 14.6 g (yield 90.3%) of a fluorine-containing ether compound (15B) having a ratio of 8.5 was obtained. The fluorine-containing ether compound (15B) is liquid at room temperature. From the NMR analysis, the number average molecular weight of the fluorine-containing ether compound (15B) was 1,240.
In the measurement of impurities in the product obtained in this step, no impurity peak was observed. The content of the fluorine-containing ether compound (15B) in the product obtained in this step is considered to be about 99% by mass and the content of impurities is about 1% by mass.
得られた含フッ素エーテル化合物(15B)のNMRスペクトル;
1H−NMR(300.4MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:TMS、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):4.0、1.8、0.7。
19F−NMR(282.7MHz、溶媒:重クロロホルムとR−113の混合溶媒、基準:CFCl3、内部標準:1,3−ビス(トリフルオロメチル)ベンゼン δ(ppm):−56.1、−88.8、−89.5、−91.0、−91.4。NMR spectrum of the resulting fluorine-containing ether compound (15B);
1 H-NMR (300.4 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: TMS, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): 4.0, 1. 8, 0.7.
19 F-NMR (282.7 MHz, solvent: mixed solvent of deuterated chloroform and R-113, standard: CFCl 3, internal standard: 1,3-bis (trifluoromethyl) benzene δ (ppm): −56.1, − 88.8, -89.5, -91.0, -91.4.
(表面処理層を有する基材の製造)
実施例1および比較例1で得られた含フッ素エーテル化合物(不純物を含む)を用いて基材の表面処理を行った。各例について下記のドライコーティング法と塗布法をそれぞれ用いて表面処理層を有する基材を製造した。基材としては化学強化ガラスを用いた。得られた表面処理層を有する基材について、下記の方法で評価した。結果を表1に示す。
<ドライコーティング法>
ドライコーティングは、真空蒸着装置(ULVAC社製、VTR−350M)を用いて行った(真空蒸着法)。各含フッ素エーテル化合物の0.5gを真空蒸着装置内のモリブデン製ボートに充填し、真空蒸着装置内を1×10−3Pa以下に排気した。含フッ素エーテル化合物を配置したボートを昇温速度10℃/min以下の速度で加熱し、水晶発振式膜厚計による蒸着速度が1nm/秒をこえた時点でシャッターを開けて基材表面への成膜を開始させた。膜厚が約50nmとなった時点でシャッターを閉じて基材表面への成膜を終了させた。含フッ素エーテル化合物が堆積された基材を、200℃で30分間加熱処理し、その後、含フッ素溶媒であるC3HF5Cl2(AK−225:製品名、旭硝子社製)にて洗浄することにより、表面処理層を有する基材を得た。
<塗布法>
各例で得られた含フッ素エーテル化合物と、溶媒としてC4F90C2H5(ノベック−7200:製品名、3M社製)とを混合して、固形分濃度0.05質量%のコーティング液を調製した。基材を該コーティング液にディッピングし(ディップコート法)、30分間放置後、基材を引き上げた。基材を200℃で30分間乾燥させ、含フッ素溶媒であるAK−225(製品名、旭硝子社製)にて洗浄することにより、表面処理層を有する基材を得た。(Manufacture of a substrate having a surface treatment layer)
Using the fluorine-containing ether compound (including impurities) obtained in Example 1 and Comparative Example 1, the substrate was surface treated. For each example, a substrate having a surface treatment layer was produced using the following dry coating method and coating method, respectively. Chemically tempered glass was used as the substrate. About the base material which has the obtained surface treatment layer, it evaluated by the following method. The results are shown in Table 1.
<Dry coating method>
Dry coating was performed using a vacuum evaporation apparatus (VTR-350M, manufactured by ULVAC) (vacuum evaporation method). 0.5 g of each fluorine-containing ether compound was filled in a molybdenum boat in a vacuum vapor deposition apparatus, and the inside of the vacuum vapor deposition apparatus was evacuated to 1 × 10 −3 Pa or less. The boat in which the fluorine-containing ether compound is arranged is heated at a rate of temperature increase of 10 ° C./min or less, and when the deposition rate by the crystal oscillation type film thickness meter exceeds 1 nm / second, the shutter is opened and the surface of the substrate is exposed. Film formation was started. When the film thickness reached about 50 nm, the shutter was closed to finish the film formation on the substrate surface. The substrate on which the fluorine-containing ether compound is deposited is heat-treated at 200 ° C. for 30 minutes, and then washed with C 3 HF 5 Cl 2 (AK-225: product name, manufactured by Asahi Glass Co., Ltd.), which is a fluorine-containing solvent. Thereby, the base material which has a surface treatment layer was obtained.
<Coating method>
The fluorine-containing ether compound obtained in each example was mixed with C 4 F 90 C 2 H 5 (Novec-7200: product name, manufactured by 3M) as a solvent, and a coating having a solid content concentration of 0.05% by mass A liquid was prepared. The substrate was dipped in the coating solution (dip coating method), allowed to stand for 30 minutes, and then lifted. The substrate was dried at 200 ° C. for 30 minutes and washed with AK-225 (product name, manufactured by Asahi Glass Co., Ltd.), which is a fluorine-containing solvent, to obtain a substrate having a surface treatment layer.
(評価方法)
<初期の水接触角>
ドライコーティング法および塗布法でそれぞれ表面処理した基材(表面処理層を有する基材)について、水接触角(初期)を下記の測定方法で測定した。
<初期の水転落角>
塗布法でそれぞれ表面処理した基材(表面処理層を有する基材)について、水転落角(初期)を下記の測定方法で測定した。(Evaluation method)
<Initial water contact angle>
About the base material (base material which has a surface treatment layer) which each surface-treated by the dry coating method and the apply | coating method, the water contact angle (initial stage) was measured with the following measuring method.
<Initial water drop angle>
About the base material (base material which has a surface treatment layer) each surface-treated by the apply | coating method, the water fall angle (initial stage) was measured with the following measuring method.
<耐摩擦性>
表面処理層を有する基材について、JIS L 0849に準拠して下記試験機を用い、下記試験条件で耐摩擦試験を行った。摩擦回数を増大させたときの撥水性(水接触角)の低下が小さいほど摩擦による性能の低下が小さく、耐摩擦性に優れる。
試験機:往復式トラバース試験機(ケイエヌテー社製)、
試験条件:セルロース製不織布(ベンコットM−3:旭化成社製)を用い、荷重1kgで所定の摩擦回数だけ往復させた後、下記の方法により水接触角を測定した。
例えばタッチパネル用基材の場合は、摩擦回数10万回の水接触角が100°以上であることが望ましい。<Abrasion resistance>
About the base material which has a surface treatment layer, the friction test was done on the following test conditions using the following testing machine based on JISL0849. The smaller the decrease in water repellency (water contact angle) when the number of frictions is increased, the smaller the decrease in performance due to friction and the better the friction resistance.
Testing machine: Reciprocating traverse testing machine (manufactured by KT Corporation),
Test conditions: A cellulose non-woven fabric (Bencot M-3: manufactured by Asahi Kasei Co., Ltd.) was used to reciprocate a predetermined number of friction times with a load of 1 kg, and then the water contact angle was measured by the following method.
For example, in the case of a base material for a touch panel, it is desirable that the water contact angle with a friction frequency of 100,000 is 100 ° or more.
<水接触角の測定方法>
表面処理層を有する基材の、表面処理された表面に置いた、2μLの蒸留水の接触角を、接触角測定装置DM−500(協和界面科学社製)を用いて測定した。基材の表面処理された面における異なる5箇所で測定を行い、その平均値を算出した。接触角の算出には2θ法を用いた。
<水転落角の測定方法>
表面処理層を有する基材の、表面処理された表面を水平に保持し、該表面上に50μLの水滴を滴下した後、基材を徐々に傾け、水滴が転落しはじめたときの基材表面と水平面との角度(転落角)を転落角測定装置SA−11(協和界面科学社製)を用いて測定した。<Measurement method of water contact angle>
The contact angle of 2 μL of distilled water placed on the surface-treated surface of the substrate having the surface treatment layer was measured using a contact angle measuring device DM-500 (manufactured by Kyowa Interface Science Co., Ltd.). Measurement was performed at five different locations on the surface-treated surface of the substrate, and the average value was calculated. The 2θ method was used to calculate the contact angle.
<Measurement method of water drop angle>
The surface of the substrate having the surface treatment layer is maintained when the surface-treated surface is held horizontally, and after dropping 50 μL of water droplets on the surface, the substrate is gradually tilted and the substrate surface when the water droplets start to fall down And the horizontal plane (fall angle) were measured using a fall angle measuring device SA-11 (manufactured by Kyowa Interface Science Co., Ltd.).
表1の結果に示されるように、実施例1および比較例1において、ドライコーティング法であっても、塗布法であっても、初期の水接触角および水転落角は良好であり、良好な撥水性を有することが確認された。
特に、含フッ素エーテル化合物の数平均分子量が本発明の範囲内である実施例1は、該数平均分子量が小さい比較例1に比べて、10万回摩擦したときでも、摩擦による水接触角の低下が小さく、優れた耐摩擦性を有することが確認された。As shown in the results of Table 1, in Example 1 and Comparative Example 1, the initial water contact angle and water falling angle are good and good regardless of whether it is a dry coating method or a coating method. It was confirmed to have water repellency.
In particular, Example 1 in which the number average molecular weight of the fluorine-containing ether compound is within the scope of the present invention is higher than that of Comparative Example 1 in which the number average molecular weight is small. It was confirmed that the decrease was small and the film had excellent friction resistance.
本発明の含フッ素エーテル化合物は、基材表面に良好な撥水撥油性を付与することができる、表面処理剤として使用される。この表面処理剤により形成された表面処理層は、表面処理層上の汚れを拭き取りやすくなり、汚れの除去性が高い。例えば、この表面処理層を有するタッチパネルにあっては、指で繰り返し摩擦されても撥水撥油性が低下しにくく、拭き取りによって指紋を容易に除去できる性能が長期間維持される。
なお、2011年9月21日に出願された日本特許出願2011−206032号の明細書、特許請求の範囲、および要約書の全内容をここに引用し、本発明の明細書の開示として、取り入れるものである。The fluorine-containing ether compound of the present invention is used as a surface treatment agent capable of imparting good water / oil repellency to the substrate surface. The surface treatment layer formed by this surface treatment agent is easy to wipe off dirt on the surface treatment layer, and has high dirt removability. For example, in a touch panel having this surface treatment layer, the water and oil repellency is not easily lowered even when repeatedly rubbed with a finger, and the performance of easily removing a fingerprint by wiping is maintained for a long time.
The entire contents of the specification, claims, and abstract of Japanese Patent Application No. 2011-206032 filed on September 21, 2011 are incorporated herein as the disclosure of the specification of the present invention. Is.
Claims (11)
A−O−Rf−B ・・・(1)
式(1)中の記号は以下を示す。
A:炭素数1〜6のペルフルオロアルキル基、またはB。
Rf:下式(2)で表される連結基。
−(CF2CF2O)b(CF(CF3)CF2O)c(CF2O)d(CF2CF2CF2O)e− ・・・(2)
式(2)中の記号は以下を示す。
b、c、dおよびe:それぞれ独立して、0以上の整数であり、かつ、b+c+d+eは6〜147である。ただし、式(2)中において、(CF2CF2O)、(CF(CF3)CF2O)、(CF2O)、(CF2CF2CF2O)の繰り返し単位の結合順序は限定されず、互いにランダムに結合してもブロックに結合してもよい。
B: 下式(3)で表される基。
−(CH2)3SiLmRn ・・・(3)
式(3)中の記号は以下を示す。
L:炭素数1〜4のアルコキシ基。
R:水素原子または1価の炭化水素基。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。 Represented by the following formula (1), a number average molecular weight of Ri der 1,500 to 10,000, a purity not less than 98 wt%, the fluorine-containing ether compound.
A-O-R f -B (1)
Symbols in the formula (1) indicate the following.
A: C1-C6 perfluoroalkyl group, or B.
R f : a linking group represented by the following formula (2).
- (CF 2 CF 2 O) b (CF (CF 3) CF 2 O) c (CF 2 O) d (CF 2 CF 2 CF 2 O) e - ··· (2)
Symbols in the formula (2) indicate the following.
b, c, d and e are each independently an integer of 0 or more, and b + c + d + e is 6 to 147. However, in the formula (2), the bonding order of repeating units of (CF 2 CF 2 O), (CF (CF 3 ) CF 2 O), (CF 2 O), and (CF 2 CF 2 CF 2 O) is It is not limited, You may couple | bond with a block at random or a block mutually.
B: Group represented by the following formula (3).
- (CH 2) 3 SiL m R n ··· (3)
The symbol in Formula (3) shows the following.
L: C1-C4 alkoxy group .
R: a hydrogen atom or a monovalent hydrocarbon group.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
F(CF2)a11−O−(CF2CF2O)b11−(CH2)3SiLmRn・・・(1−2)
式(1−2)中の記号は以下を示す。
L:炭素数1〜4のアルコキシ基。
R:水素原子または1価の炭化水素基。
a11:1〜6の整数。
b11:8〜84の整数。
mおよびn:mは1〜3の整数であり、nは0〜2の整数であり、m+n=3である。 Represented by the following formula (1-2), the number-average molecular weight of Ri der 1,500 to 10,000, a purity not less than 98 wt%, the fluorine-containing ether compound of claim 1.
F (CF 2) a11 -O- ( CF 2 CF 2 O) b11 - (CH 2) 3 SiL m R n ··· (1-2)
The symbol in Formula (1-2) shows the following.
L: C1-C4 alkoxy group .
R: a hydrogen atom or a monovalent hydrocarbon group.
a11: An integer of 1 to 6.
b11: An integer of 8 to 84.
m and n: m is an integer of 1 to 3, n is an integer of 0 to 2, and m + n = 3.
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