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JP5382286B2 - Insulation resistance measurement circuit - Google Patents

Insulation resistance measurement circuit Download PDF

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JP5382286B2
JP5382286B2 JP2008001725A JP2008001725A JP5382286B2 JP 5382286 B2 JP5382286 B2 JP 5382286B2 JP 2008001725 A JP2008001725 A JP 2008001725A JP 2008001725 A JP2008001725 A JP 2008001725A JP 5382286 B2 JP5382286 B2 JP 5382286B2
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insulation resistance
measurement
current
measurement object
value
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JP2009162669A (en
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康雄 坂巻
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Yokogawa Electric Corp
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Description

本発明は、絶縁抵抗測定回路に関し、特に、コンデンサ等の容量値を持った測定対象の絶縁抵抗を測定する際に、接続不良を検知する絶縁抵抗測定回路に関する。   The present invention relates to an insulation resistance measurement circuit, and more particularly to an insulation resistance measurement circuit that detects a connection failure when measuring an insulation resistance of a measurement object having a capacitance value such as a capacitor.

一般に、コンデンサの絶縁抵抗測定は、測定電圧を測定対象であるコンデンサに印加し、十分充電された後のコンデンサの電圧又は電流を測定することにより行なう。しかし、コンデンサの絶縁抵抗値は高いため、測定端子がコンデンサの電極に十分に接触していないときでも、良品のコンデンサを測定した場合と同じように判定されてしまう場合がある。このような問題を回避するため、各種特許文献でコンデンサの絶縁抵抗測定方法が検討されている。   In general, the measurement of the insulation resistance of a capacitor is performed by applying a measurement voltage to the capacitor to be measured and measuring the voltage or current of the capacitor after being sufficiently charged. However, since the insulation resistance value of the capacitor is high, even when the measurement terminal is not sufficiently in contact with the electrode of the capacitor, the determination may be made in the same manner as when a good capacitor is measured. In order to avoid such problems, various patent literatures have examined methods for measuring the insulation resistance of capacitors.

特開平3―77073号公報Japanese Unexamined Patent Publication No. 3-77073

以下、従来の絶縁抵抗測定回路について説明する。従来の絶縁抵抗測定では、図5に示すように電圧源1の電圧を測定対象3に印加して、電流計2により電流ILを測定する。そうすると、絶縁抵抗RLは、
RL=V1/A1
で求められる。
Hereinafter, a conventional insulation resistance measuring circuit will be described. In the conventional insulation resistance measurement, as shown in FIG. 5, the voltage of the voltage source 1 is applied to the measurement object 3 and the current IL is measured by the ammeter 2. Then, the insulation resistance RL is
RL = V1 / A1
Is required.

このように、図5の絶縁抵抗測定回路では、電圧源1と電流計2を用いて絶縁抵抗を測定していた。 Thus, in the insulation resistance measurement circuit of FIG. 5, the insulation resistance is measured using the voltage source 1 and the ammeter 2.

ところで、絶縁抵抗計の測定端子と測定対象が正しく接続されない状態で絶縁抵抗を測定した場合には、一般的に測定値はオーバーレンジ、または高抵抗の測定値となる。従って、測定対象の抵抗値が十分に低いものであれば、測定抵抗値から接続不良の判別が可能である。 By the way, when the insulation resistance is measured in a state where the measurement terminal of the insulation resistance meter and the measurement target are not correctly connected, the measurement value is generally an overrange or high resistance measurement value. Therefore, if the resistance value to be measured is sufficiently low, the connection failure can be determined from the measured resistance value.

しかし、コンデンサ等の絶縁抵抗が高い測定対象を測定する場合には、測定された絶縁抵抗値からでは、接続不良の判別ができない。このため、接続不良が生じた場合、不良品が良品として判定されるおそれがある。 However, when measuring a measurement target having a high insulation resistance such as a capacitor, it is not possible to determine a connection failure from the measured insulation resistance value. For this reason, when a connection failure occurs, the defective product may be determined as a non-defective product.

特に、高速で検査される自動検査装置などでは、接続不良が発生する可能性が高いため、正しく接続された状態で絶縁抵抗が測定されたか確認する必要がある。 In particular, in an automatic inspection apparatus or the like that is inspected at high speed, there is a high possibility that a connection failure will occur. Therefore, it is necessary to check whether the insulation resistance is measured in a correctly connected state.

本発明は、これらの問題点に鑑みてなされたものであり、コンデンサなど容量値を持った測定対象の絶縁抵抗を測定する際に、接続不良を検知する絶縁抵抗測定回路を提供することを目的とする。   The present invention has been made in view of these problems, and an object of the present invention is to provide an insulation resistance measurement circuit that detects a connection failure when measuring an insulation resistance of a measurement object having a capacitance value such as a capacitor. And

このような課題を達成するために請求項1記載の発明は、
容量値をもつ測定対象の絶縁抵抗を測定する絶縁抵抗測定ブロックを備えた絶縁抵抗測定回路において、
測定対象に電流を供給する電流源と、
この電流源で所定の時間測定対象に電流を供給したときの測定対象の電圧を基準値と比較することにより接続不良がある場合にはその旨の信号を出力するコンパレータと、
前記絶縁抵抗測定ブロックと前記測定対象を接続するスイッチを備え、
このスイッチは、前記測定対象が充電された状態で絶縁抵抗値を測定するとき、若しくは容量値をもつ前記測定対象の負荷容量の絶縁抵抗測定完了後、前記測定対象に充電されている電荷を放電させるときに、前記絶縁抵抗測定ブロックと前記測定対象を接続して前記測定対象に充電されている電荷を放電させることを特徴とする。
In order to achieve such a problem, the invention described in claim 1
In an insulation resistance measurement circuit having an insulation resistance measurement block for measuring an insulation resistance of a measurement object having a capacitance value,
A current source for supplying current to the measurement object;
A comparator that outputs a signal to that effect when there is a connection failure by comparing the voltage of the measurement target when a current is supplied to the measurement target for a predetermined time with this current source,
A switch for connecting the insulation resistance measurement block and the measurement object;
This switch discharges the electric charge charged in the measurement object when measuring the insulation resistance value while the measurement object is charged, or after completing the insulation resistance measurement of the load capacity of the measurement object having a capacitance value. In this case, the insulation resistance measurement block and the measurement object are connected to discharge the charge charged in the measurement object.

また、請求項2記載の発明は、請求項1記載の絶縁抵抗測定回路において、
前記コンパレータが測定対象の電圧と比較する基準値は、
(測定対象の充電時間*前記電流源から出力される電流の電流値)/(測定対象の浮遊容量+測定対象の負荷容量)<基準値<(測定対象の充電時間*前記電流源から出力される電流の電流値)/測定対象の浮遊容量
の関係で決定されることを特徴とする。
Further, the invention according to claim 2 is the insulation resistance measuring circuit according to claim 1,
The reference value that the comparator compares with the voltage to be measured is:
(Charging time of measurement target * Current value of current output from current source) / (Floating capacitance of measurement target + Load capacity of measurement target) <Reference value <(Charging time of measurement target * Output from current source) Current value) / stray capacitance to be measured
It is determined by the relationship.

さらに、請求項3記載の発明は、
容量値をもつ測定対象の絶縁抵抗を測定する絶縁抵抗測定ブロックを備えた絶縁抵抗測定回路において、
前記測定対象に電流を供給する電流源と、
この電流源の両端電圧を測定する電圧計と、
前記絶縁抵抗測定ブロックと前記測定対象を接続するスイッチを備え、
以下の換算式により、前記測定対象を接続する前の浮遊容量CO、及び前記測定対象を接続した状態における負荷容量CLを求めることを特徴とする。
CO=(T1×IS)/(VM1−VM0)
CL={(T1×IS)/(VM1−VM0)}−CO
T1 :電流+ISの発生時間
IS :電流源40の発生電流
VM0:電流+IS発生前のときの電圧計70による測定値
VM1:電流+IS発生後の電流0のときの電圧計70による測定値
Furthermore, the invention according to claim 3
In an insulation resistance measurement circuit having an insulation resistance measurement block for measuring an insulation resistance of a measurement object having a capacitance value,
A current source for supplying current to the measurement object;
A voltmeter to measure the voltage across this current source;
A switch for connecting the insulation resistance measurement block and the measurement object;
The stray capacitance CO before the measurement object is connected and the load capacitance CL in a state where the measurement object is connected are obtained by the following conversion formula.
CO = (T1 × IS) / (VM1−VM0)
CL = {(T1 × IS) / (VM1-VM0)}-CO
T1: Current + IS generation time
IS: Current generated by current source 40
VM0: Current + value measured by voltmeter 70 before IS
VM1: Measured by voltmeter 70 when current + current after IS is 0

本発明では、次のような効果がある。請求項1によれば、測定対象に電流を供給する電流源と、この電流源で所定の時間測定対象に電流を供給したときの測定対象の電圧を基準値と比較することにより接続不良がある場合にはその旨の信号を出力するコンパレータを備えたので、コンデンサ等の容量値を持った測定対象の絶縁抵抗を測定する際に、接続不良を検知する絶縁抵抗測定回路を提供することができる。
請求項3によれば、請求項1のコンパレータ50の代わりに、電圧計70を備えているので、接続不良と同時に容量値検査が可能になる。
The present invention has the following effects. According to claim 1, there is a connection failure by comparing a current source for supplying a current to the measurement target and a voltage of the measurement target when the current is supplied to the measurement target for a predetermined time by the current source with a reference value. In some cases, a comparator that outputs a signal to that effect is provided, so that it is possible to provide an insulation resistance measurement circuit that detects a connection failure when measuring the insulation resistance of a measurement object having a capacitance value such as a capacitor. .
According to the third aspect, since the voltmeter 70 is provided instead of the comparator 50 of the first aspect, the capacitance value inspection can be performed simultaneously with the connection failure.

以下、図1を参照して本発明の絶縁抵抗測定回路の構成例を説明する。電圧源10は、測定対象60に電圧を印加し、絶縁抵抗の測定に利用される。電流計20は電圧源10に直列に接続され、絶縁抵抗の測定に利用される。スイッチ30は、オン状態でこれら電圧源10及び電流計20を測定対象60に接続する。電流源40は測定対象60の容量測定に利用される。コンパレータ50は、出力電圧Voと比較電圧源Vrefを比較する。測定対象60はコンデンサ等の容量値を持ったものである。 Hereinafter, a configuration example of the insulation resistance measurement circuit of the present invention will be described with reference to FIG. The voltage source 10 applies a voltage to the measurement object 60 and is used for measuring the insulation resistance. The ammeter 20 is connected to the voltage source 10 in series and is used for measuring the insulation resistance. The switch 30 connects the voltage source 10 and the ammeter 20 to the measurement target 60 in the on state. The current source 40 is used for measuring the capacity of the measurement target 60. The comparator 50 compares the output voltage Vo with the comparison voltage source Vref. The measurement object 60 has a capacitance value such as a capacitor.

次に、図2を参照して図1の動作を説明する。ここで、図2は図1のタイミング図であり、(A)は電流源40のタイミング図で、(B)は出力電圧Voのタイミング図である。測定対象の容量値を、絶縁抵抗測定の前又は後に次の手順で検出し、不具合があればコンパレータ50から接続不良検出信号を発生させる。まず、Vref を下記のように設定する。 Next, the operation of FIG. 1 will be described with reference to FIG. 2 is a timing chart of FIG. 1, (A) is a timing chart of the current source 40, and (B) is a timing chart of the output voltage Vo. The capacitance value to be measured is detected by the following procedure before or after the insulation resistance measurement, and if there is a defect, a connection failure detection signal is generated from the comparator 50. First, set Vref as follows.

Figure 0005382286
Figure 0005382286

ここで、COは測定対象の浮遊容量であり、CLは測定対象60の負荷容量であり、ISは電流源40から出力される電流である。つづいて、スイッチ30をオンの状態とし、電圧源10を0Vに設定し、測定対象60に充電されている電荷を十分に放電させる。なお、測定対象60に充電がされていない場合にはこの作業は不要となる。 Here, CO is a stray capacitance to be measured, CL is a load capacitance of the measurement target 60, and IS is a current output from the current source 40. Subsequently, the switch 30 is turned on, the voltage source 10 is set to 0 V, and the charge charged in the measurement target 60 is sufficiently discharged. Note that this operation is not necessary when the measurement target 60 is not charged.

スイッチ30をオフの状態とし、絶縁抵抗測定ブロック(電圧源10、及び電流計20)を切り離す。電流源40から、電流(+IS)を時間T1の期間発生する(図2(A)の符号100)。ここで、もし正しく接続していれば、出力電圧Voは、 The switch 30 is turned off, and the insulation resistance measurement block (the voltage source 10 and the ammeter 20) is disconnected. A current (+ IS) is generated from the current source 40 for a period of time T1 (reference numeral 100 in FIG. 2A). Here, if connected correctly, the output voltage Vo is

Figure 0005382286
Figure 0005382286

となり、Vrefを超えることはなく異常検出信号は出力されない(図2(B)、出力電圧Voの実線)。しかし、接続不良が発生していれば、出力電圧Voは、 Thus, Vref is not exceeded and an abnormality detection signal is not output (FIG. 2 (B), solid line of output voltage Vo). However, if a connection failure occurs, the output voltage Vo is

Figure 0005382286
Figure 0005382286

となりVrefを超えるため(図2(B)、出力電圧Voの破線)、コンパレータ50から異常検出信号が出力される。最後に、電流源40から、電流(-IS)を時間T1の期間発生し(図2Aの符号110)、測定対象60に充電された電荷を放電する。若しくは、電圧源10を0Vに設定して、スイッチ30を閉じて被測定対象60に充電された電荷を放電する。
Since Vref is exceeded ( FIG. 2B , broken line of the output voltage Vo), an abnormality detection signal is output from the comparator 50. Finally, a current (-IS) is generated from the current source 40 for a period of time T1 (reference numeral 110 in FIG. 2A), and the charge charged in the measurement target 60 is discharged. Alternatively, the voltage source 10 is set to 0 V, the switch 30 is closed, and the charge charged in the measurement target 60 is discharged.

このように、コンパレータ50から接続不良検出信号が出力された場合には、アラームを鳴らしたり、図示しないランプを点灯する等して接続不良を検出すると共に、絶縁抵抗試験を再度実行するか、測定不良として保留にする等して誤判定を防止する。 As described above, when a connection failure detection signal is output from the comparator 50, an alarm is sounded or a lamp (not shown) is turned on to detect a connection failure and the insulation resistance test is executed again. Misjudgment is prevented by putting it on hold as a defect.

次に、図3を参照して本発明の応用例を説明するが、図1と同様の構成については同一の符号を付して説明を省略する。図3の構成では、図1のコンパレータ50の代わりに、電圧計70を備える。 Next, an application example of the present invention will be described with reference to FIG. 3, but the same components as those in FIG. In the configuration of FIG. 3, a voltmeter 70 is provided instead of the comparator 50 of FIG.

図3に示すように、電流源40にその両端電圧を測定する電圧計70を並列に接続する。絶縁抵抗測定の前又は後に次の手順で測定対象60の浮遊容量CO及び負荷容量CLを測定する。まず、電流源40の発生電流を0Aにしてこのときの出力電圧Voを電圧計70で測定し、VM0とする。   As shown in FIG. 3, a voltmeter 70 that measures the voltage across the current source 40 is connected in parallel. Before or after the insulation resistance measurement, the stray capacitance CO and the load capacitance CL of the measurement object 60 are measured by the following procedure. First, the current generated by the current source 40 is set to 0 A, and the output voltage Vo at this time is measured by the voltmeter 70 to be VM0.

電流源40から、電流(+IS)を時間T1の期間発生する(図4(A)の符号120)。
電流源40の発生電流ISを0Aにしてこのときの出力電圧Voを電圧計70で測定し、VM1とする(図4(B)の符号140)。次の換算式により、浮遊容量CO、及び負荷容量CLを求める。なお、浮遊容量COは測定対象60を接続する前に求め、負荷容量CLは測定対象60を接続した状態で求める。

A current (+ IS) is generated from the current source 40 for a period of time T1 (reference numeral 120 in FIG. 4A).
The generated voltage IS of the current source 40 is set to 0A, and the output voltage Vo at this time is measured by the voltmeter 70 and is set as VM1 (reference numeral 140 in FIG. 4B). The stray capacitance CO and the load capacitance CL are obtained by the following conversion formula. The stray capacitance CO is obtained before connecting the measuring object 60, and the load capacitance CL is obtained with the measuring object 60 connected.

Figure 0005382286

・・・(4)
Figure 0005382286

... (4)

Figure 0005382286

・・・(5)
Figure 0005382286

... (5)

最後に、電流源40から、電流(-IS)を時間T1の期間発生し(図4Aの符号130)、測定対象60に充電された電荷を放電する。若しくは、電圧源10を0Vに設定して、スイッチ30を閉じて被測定対象60に充電された電荷を放電する。このようにして、負荷容量CLの容量値を測定する。接続不良が発生した場合には、Hi-Lo間の容量がCOのみとなり、CLの測定値から接続不良が検出できる。 Finally, a current (-IS) is generated from the current source 40 for a period of time T1 (reference numeral 130 in FIG. 4A), and the charge charged in the measurement target 60 is discharged. Alternatively, the voltage source 10 is set to 0 V, the switch 30 is closed, and the charge charged in the measurement target 60 is discharged. In this way, the capacitance value of the load capacitance CL is measured. When a connection failure occurs, the capacitance between Hi and Lo becomes only CO, and the connection failure can be detected from the measured value of CL.

このように、コンパレータ50の代わりに、電圧計70を備えたので、接続不良と同時に容量値検査が可能になる。   Thus, since the voltmeter 70 is provided instead of the comparator 50, the capacitance value inspection can be performed simultaneously with the connection failure.

本発明の絶縁抵抗測定回路の構成例である。It is an example of a structure of the insulation resistance measuring circuit of this invention. 図1のタイミング図である。FIG. 2 is a timing diagram of FIG. 1. 本発明の応用例の構成図である。It is a block diagram of the application example of this invention. 図3のタイミング図である。FIG. 4 is a timing diagram of FIG. 3. 従来技術による絶縁抵抗測定回路の構成例である。It is an example of a structure of the insulation resistance measuring circuit by a prior art.

符号の説明Explanation of symbols

10 絶縁抵抗測定電圧源
20 絶縁抵抗電流計
30 スイッチ
40 容量測定電流源
50 コンパレータ
60 測定対象物
70 電圧計


10 Insulation Resistance Measurement Voltage Source 20 Insulation Resistance Ammeter 30 Switch 40 Capacity Measurement Current Source 50 Comparator 60 Measurement Object 70 Voltmeter


Claims (3)

容量値をもつ測定対象の絶縁抵抗を測定する絶縁抵抗測定ブロックを備えた絶縁抵抗測定回路において、
測定対象に電流を供給する電流源と、
この電流源で所定の時間測定対象に電流を供給したときの測定対象の電圧を基準値と比較することにより接続不良がある場合にはその旨の信号を出力するコンパレータと、
前記絶縁抵抗測定ブロックと前記測定対象を接続するスイッチを備え、
このスイッチは、前記測定対象が充電された状態で絶縁抵抗値を測定するとき、若しくは容量値をもつ前記測定対象の負荷容量の絶縁抵抗測定完了後、前記測定対象に充電されている電荷を放電させるときに、前記絶縁抵抗測定ブロックと前記測定対象を接続して前記測定対象に充電されている電荷を放電させることを特徴とする絶縁抵抗測定回路。
In an insulation resistance measurement circuit having an insulation resistance measurement block for measuring an insulation resistance of a measurement object having a capacitance value,
A current source for supplying current to the measurement object;
A comparator that outputs a signal to that effect when there is a connection failure by comparing the voltage of the measurement target when a current is supplied to the measurement target for a predetermined time with this current source,
A switch for connecting the insulation resistance measurement block and the measurement object;
This switch discharges the electric charge charged in the measurement object when measuring the insulation resistance value while the measurement object is charged, or after completing the insulation resistance measurement of the load capacity of the measurement object having a capacitance value. An insulation resistance measurement circuit , wherein the insulation resistance measurement block and the measurement object are connected to discharge the charge charged in the measurement object.
前記コンパレータが測定対象の電圧と比較する基準値は、
(測定対象の充電時間*前記電流源から出力される電流の電流値)/(測定対象の浮遊容量+測定対象の負荷容量)<基準値<(測定対象の充電時間*前記電流源から出力される電流の電流値)/測定対象の浮遊容量
の関係で決定されることを特徴とする請求項1に記載の絶縁抵抗測定回路。
The reference value that the comparator compares with the voltage to be measured is:
(Charging time of measurement target * Current value of current output from current source) / (Floating capacitance of measurement target + Load capacity of measurement target) <Reference value <(Charging time of measurement target * Output from current source) 2. The insulation resistance measuring circuit according to claim 1, wherein the insulating resistance measuring circuit is determined by a relationship of current value of current to be measured) / stray capacitance to be measured.
容量値をもつ測定対象の絶縁抵抗を測定する絶縁抵抗測定ブロックを備えた絶縁抵抗測定回路において、
前記測定対象に電流を供給する電流源と、
この電流源の両端電圧を測定する電圧計と、
前記絶縁抵抗測定ブロックと前記測定対象を接続するスイッチを備え、
以下の換算式により、前記測定対象を接続する前の浮遊容量CO、及び前記測定対象を接続した状態における負荷容量CLを求めることを特徴とする絶縁抵抗測定回路。
CO=(T1×IS)/(VM1−VM0)
CL={(T1×IS)/(VM1−VM0)}−CO
T1 :電流+ISの発生時間
IS :電流源40の発生電流
VM0:電流+IS発生前のときの電圧計70による測定値
VM1:電流+IS発生後の電流0のときの電圧計70による測定値
In an insulation resistance measurement circuit having an insulation resistance measurement block for measuring an insulation resistance of a measurement object having a capacitance value,
A current source for supplying current to the measurement object;
A voltmeter to measure the voltage across this current source;
A switch for connecting the insulation resistance measurement block and the measurement object;
An insulation resistance measurement circuit, wherein a stray capacitance CO before connecting the measurement object and a load capacitance CL in a state where the measurement object is connected are obtained by the following conversion formula.
CO = (T1 × IS) / (VM1−VM0)
CL = {(T1 × IS) / (VM1-VM0)}-CO
T1: Current + IS generation time
IS: Current generated by current source 40
VM0: Current + value measured by voltmeter 70 before IS
VM1: Measured by voltmeter 70 when current + current after IS is 0
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