JP5173940B2 - Semiconductor package manufacturing method and cutting apparatus - Google Patents

Description

  The present invention relates to a semiconductor package manufacturing method and a cutting apparatus.

  Conventionally, there is a semiconductor package on which a semiconductor element such as an LED is mounted. Such a semiconductor package is manufactured by mounting a plurality of semiconductor elements on a lead frame to form a semiconductor package substrate, and cutting the semiconductor package substrate into individual pieces. If the lead frame is cut when the semiconductor package substrate is singulated, a cutting burr (cut defect) occurs on the lower surface of the lead frame.

  This cutting failure will be described with reference to FIG. FIG. 11 is a configuration diagram of a conventional LED package. 11A is a plan view, FIG. 11B is a front view, and FIG. 11C is a side view. In the LED package of FIG. 11, the primary molding resin 500 is molded on the lead frame 400, and the secondary molding resin 600 is molded thereon. Further, when the secondary molding resin 600 is molded, the lens portion 600a is integrally formed.

  FIG. 11 shows an LED package having a defect only on one lower side of the plan view (FIG. 11A) for easy understanding. When the LED package substrate is cut by the dicer blade, first, the two vertical sides in FIG. 11A are cut, and then the dicer blade advances while rotating in a direction of cutting down from the right side to the left side. In the LED package after cutting, a peeling portion 800 is generated at the interface between the primary molding resin 500 and the secondary molding resin 600 at the right end of the plan view. Further, at the left end of the plan view, the secondary molding resin 600 is softly stretched so that an uncut portion 600b is formed, and a peeling portion 800 is generated at the interface between the primary molding resin 500 and the secondary molding resin 600. As described above, in the conventional configuration, cutting failure due to the peeling portion 800 or the uncut portion 600b occurs at the four corners of the LED package after cutting.

  On the other hand, Patent Document 1 discloses that when cutting a lead frame after resin sealing, a resin is formed on the upper and lower portions of the cutting portion of the lead frame, so that burrs at the time of cutting the lead frame after resin sealing are reduced. A method of manufacturing a semiconductor device that prevents generation is disclosed.

JP 2001-77265 A

  Conventionally, in a workpiece having a structure in which a plurality of semiconductor elements are mounted on a lead frame and a primary molding resin and a secondary molding resin are laminated, the lead frame, the primary molding resin, and the secondary molding resin are once used with a cutting blade. In addition, it was necessary to cut from the mounting surface side or the opposite side of the semiconductor element.

However, if such a workpiece is cut from the mounting surface side of the semiconductor element, burrs are generated when the lead frame is cut. When such burrs are generated in the lead frame, there is a possibility that when the separated semiconductor package is mounted on the substrate, it cannot be reliably connected by solder, which may cause a mounting failure. On the other hand, if the work is to be cut from the surface opposite to the mounting surface of the semiconductor element, the transparent resin that constitutes the secondary molding resin is soft, so that the resin extends during cutting. For this reason, when the elastic secondary molding resin is cut, the resin is stretched and peeled off from the primary molding resin, and the workpiece cannot be cut without causing problems such as elongation and peeling. Further, as in Patent Document 1 described above, if resin is to be formed at the cutting portion of the lead frame, a process for forming the resin is required, which increases the cost.

  Therefore, the present invention provides a method for manufacturing a high-quality semiconductor package. Moreover, the cutting device for manufacturing such a high quality semiconductor package is provided.

A method for manufacturing a semiconductor package as one aspect of the present invention is a method for manufacturing a semiconductor package formed by separating a workpiece in which a first resin and a second resin are sequentially laminated on a lead frame, a step of cutting a part of the first major surface from said side second resin and the first resin of the workpiece using a first cutting edge, a step of inverting the workpiece, the said workpiece the first main surface and a step of cutting from the second main surface side of the opposite side using the lead frame and the first residual Rio second cutting edge of the resin.

A cutting device according to another aspect of the present invention is a cutting device that separates a workpiece in which a first resin and a second resin are sequentially laminated on a lead frame, and the first main surface side of the workpiece a first cutting edge for cutting a part of said first resin and said second resin from a reversing unit for reversing the workpiece, the opposite side to the first major surface of the workpiece from the two main surface and a second cutting edge for remaining Rio cutting the first resin and the lead frame.

  Other objects and features of the present invention are illustrated in the following examples.

  ADVANTAGE OF THE INVENTION According to this invention, the manufacturing method of a high quality semiconductor package can be provided. Moreover, the cutting device for manufacturing such a high quality semiconductor package can be provided.

It is a schematic block diagram of the cutting device in Example 1. It is operation | movement explanatory drawing of the cutting device in Example 1. FIG. FIG. 3 is a cross-sectional view at the time of workpiece cutting in Example 1. 1 is a configuration diagram of a semiconductor package in Example 1. FIG. It is a schematic block diagram of the cutting device in Example 2. FIG. It is operation | movement explanatory drawing of the cutting device in Example 2. FIG. FIG. 6 is a cross-sectional view at the time of workpiece cutting in Example 2. 10 is a configuration diagram of a semiconductor package in Example 2. FIG. It is a schematic block diagram of the cutting device in Example 3. It is operation | movement explanatory drawing of the cutting device in Example 3. FIG. It is a block diagram of the conventional LED package.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In each figure, the same members are denoted by the same reference numerals, and redundant description is omitted.

  First, the configuration and operation of the cutting device according to the first embodiment of the present invention will be described. FIG. 1 is a schematic configuration diagram of a cutting apparatus 1 as an example of the present embodiment. FIG. 2 is an operation explanatory diagram of the cutting device 1.

  The cutting device 1 cuts a workpiece 10a in which a first resin (reflector resin) and a second resin (lens resin) are sequentially laminated on a copper-based lead frame, and a plurality of individual workpieces 11 (semiconductor packages) ). In this embodiment, the first resin is, for example, a silicone resin that is used as a reflector of light emitted from a semiconductor element (LED) mounted on a lead frame and contains a filler such as silica and titanium oxide. The second resin is a transparent silicone resin used as a lens for light emitted from the LED and protecting the semiconductor element. By using a transparent silicone resin as the second resin, the transparency can be improved as compared with the case of using an epoxy resin or the like, and deterioration with time can be suppressed. However, this embodiment is not limited to these resins, and combinations of other resins are also applicable.

  In the present embodiment, 40 individual workpieces 11 are manufactured from one workpiece 10a, but the present embodiment is not limited to this. It is also possible to manufacture a number of singulated workpieces other than 40 from a single or a plurality of workpieces 10a.

  As shown in the plan view of the cutting device 1 shown in FIG. 1, the cutting device 1 includes a supply unit 100, a cutting unit 200, and a storage unit 300. The workpiece 10a carried from the outside of the cutting apparatus 1 to the carry-in position of the supply unit 100 (upper side in the drawing) is conveyed to the tray 20 of the supply unit 100 by a conveyance unit (not shown) and placed thereon. . The workpieces 10a placed on the tray 20 in the supply unit 100 are sequentially conveyed and supplied to the cutting unit 200 by a loader 40 (work conveyance unit) that can move in the X-axis direction.

  As shown in FIG. 2A, the workpiece 10 a is conveyed by the loader 40 in the X axis direction. The loader 40 has a suction part on its lower surface, and sucks air 10 by a vacuum pump (not shown) to suck the work 10a placed on the tray 20 with the suction part. Thus, the workpiece 10 on the tray 20 is sucked up in the Z-axis direction by the suction portion of the loader 40. The workpiece 10a adsorbed by the adsorbing portion of the loader 40 is conveyed by the loader 40 as it is in the X-axis direction. The loader 40 is connected to a plastic chain (not shown) that accommodates a pipe line that is a connection member with a vacuum pump (not shown) that is a drive source for a workpiece holding operation, so that the vacuum is passed through the pipe line. Connected to the pump. Further, the loader 40 is supported by being suspended, and is configured to be movable between the supply unit 100 and the cutting unit 200 in the X-axis direction.

  When the loader 40 that has attracted the workpiece 10a by the supply unit 100 reaches the stage 32 of the cutting unit 200, the loader 40 stops sucking the workpiece 10a by the vacuum pump and places the workpiece 10a on the stage 32. In addition, after the workpiece | work 10a is conveyed to the cutting part 200, the new workpiece | work 10a carried in from the carrying-in means is mounted on the tray 20. FIG.

  The cutting unit 200 includes a stage 32, spindles 61 and 62, and cutting blades 71 and 72 (first cutting blades). The first cutting unit includes a stage 33, spindles 63, 64, and And a second cutting portion configured to include cutting blades 73 and 74 (second cutting blades). The first cutting part cuts the second resin and at least a part of the first resin from the first main surface side of the workpiece 10a. The first cutting portion cuts the workpiece 10a along the same cutting line as the second cutting portion when viewed on a plane. The workpiece 10a conveyed from the supply unit 100 to the cutting unit 200 sequentially passes through the first cutting unit and the second cutting unit, and a predetermined cutting process is performed, whereby a plurality of individual workpieces 11 (semiconductors) Package).

  As described above, the workpiece 10 a transported from the supply unit 100 to the cutting unit 200 using the loader 40 is placed on the stage 32 in the cutting unit 200. The stage 32 is configured to be able to hold one workpiece 10a and to be movable in the Y-axis direction in FIG.

  In the first cutting part, cutting blades 71 and 72 are respectively attached to the tips of the rotating shafts of spindles 61 and 62 mainly composed of a motor. Further, the spindles 61 and 62 are arranged to face each other with the cutting blades 71 and 72 facing each other. As described above, according to the present embodiment, by providing a plurality of cutting blades, it is possible to shorten the cutting time of the workpiece 10a and improve the productivity.

  The cutting blades 71 and 72 also rotate along with the rotation of the spindles 61 and 62 (rotating shafts), and the workpiece 10a placed on the stage 32 is cut. Specifically, the second resin (lens resin) and at least a part of the first resin (reflector resin) are cut from the first main surface side (the semiconductor chip mounting surface side) of the workpiece. In the present embodiment, the same cutting blade is used as the cutting blades 71 and 72, but is not limited thereto.

  After receiving the workpiece 10a from the loader 40, the stage 32 moves in the Y-axis direction (upward in FIG. 1) in order to cut the workpiece 10a with the cutting blades 71 and 72. Further, after the cutting process, the stage 32 moves in the Y-axis direction (downward) in order to transport the workpiece 10b to the second cutting part.

  The stage 32 is configured to be rotatable in the XY plane. The spindles 61 and 62 are configured to be movable in the X-axis direction (left-right direction). By using such a stage 32 and spindles 61 and 62, the cutting direction of the workpiece 10a placed on the stage 32 can be arbitrarily set. The rotational position in the stage 32 is controlled based on position information obtained from an imaging device (not shown). The imaging device is attached to, for example, one spindle 61, and is provided to perform alignment between the workpiece 10a and the cutting blades 71 and 72 before cutting the workpiece 10a. Since the position alignment between the workpiece 10a and the cutting blades 71 and 72 is performed based on the position information of the workpiece 10a acquired by the imaging device, the workpiece 10a can be cut with high accuracy. A control unit (not shown) controls each operation of the stage 32, the spindles 61 and 62, and the imaging device (not shown) under the control of the main control unit.

  Fig.3 (a) is sectional drawing at the time of the cutting of the workpiece | work 10a in a present Example. As shown in FIG. 3A, the workpiece 10a is placed on the stage 32 with the mounting surface side (first main surface side) of the semiconductor element 60 facing up. A rubber pad 52 having suction holes is provided on the stage 32 as suction pads so as to be surrounded by a cutting line to be described later that is cut by the cutting blades 71 and 72. The vacuum pump VP sucks air from the rubber pad 52 and the pipe provided inside the stage 32, so that the workpiece 10a can be stably placed on the stage 32.

  In the first cutting portion, the second resin 85 (lens resin) and at least a part of the first resin 88 (reflector resin) of the workpiece 10a are cut using the cutting blade 71 (or the cutting blade 72). . The cutting blades 71 and 72 are made of metal or electroforming, and a relatively thin blade having a thickness t1 of, for example, 0.08 to 0.15 mm is used. When cutting the workpiece 10a with the cutting blades 71 and 72, the stage 32 moves at a relatively high feed rate, for example, 35 mm / sec. The feed speed of the stage 32 of the first cutting part is set faster than the feed speed of the stage 33 of the second cutting part.

  Thus, the workpiece 10a becomes the workpiece 10b cut on the first main surface side by cutting the second resin and at least a part of the first resin at the first cutting portion. As shown in FIG. 2B, the workpiece 10 b is sucked by the loader 40 and conveyed onto the reversing unit 35 after being cut by the first cutting portion. Thus, the loader 40 is configured to be movable in the X-axis direction in a range R1 (see FIG. 1) between a predetermined position of the supply unit 100 and the reversing unit 35 in the cutting unit 200, and the workpiece 10a ( The workpiece 10b) is conveyed with the first main surface facing upward.

  The reversing unit 35 reverses the workpiece 10b. Specifically, as shown in FIG. 2C, the reversing unit 35 transports the workpiece 10b in the X-axis direction with the cut first main surface placed on the top. Then, by rotating the rotating part after reaching the position of the stage 33, the work 10b is placed on the stage 33 with the second main surface opposite to the first main surface facing upward. Note that the second main surface may face upward before reaching the position of the stage 33 by rotating the work 10b while transporting it. As shown in FIG. 2D, after the work unit 10b is placed on the stage 33, the reversing unit 35 rotates the rotating unit again and returns to the original position. As described above, the reversing unit 35 is configured to be movable in the X-axis direction in the range R2 (between the first cutting part and the second cutting part) in the cutting part 200. At this time, the loader 40 conveys the next workpiece 10a to be cut to the stage 32.

  As shown in FIG. 1, in the cutting part 200, a second cutting part is arranged on the right side of the first cutting part. The second cutting unit includes a stage 33, spindles 63 and 64, and cutting blades 73 and 74. The configuration other than the type of the attached cutting blade and the structure of the stage 33 is the same as that of the first cutting unit. It is the same. The second cutting part cuts the lead frame 70 and at least the remaining part of the first resin (the part not cut by the first cutting part) from the second main surface side of the workpiece 10b. The workpiece 10b is separated (cut) by the second cutting portion, and a plurality of separated workpieces 11 (semiconductor packages) are manufactured. Note that the individualized workpiece 11 in the present embodiment may be a workpiece that is completed by individualization, such as a memory card, or a semi-finished product such as a semiconductor chip that is further processed in a later process. Good.

FIG. 3B is a cross-sectional view at the time of cutting the workpiece 10b in the present embodiment. As shown in FIG. 3B, the workpiece 10 b is placed on the stage 33 with the second main surface side opposite to the mounting surface side (first main surface side) of the semiconductor element 60 facing up. ing. On the stage 33, a conductive plastic pad 53 having a suction hole of a size capable of accommodating a convex lens-shaped protrusion of the second resin 85 is provided as a suction pad. As in the case of the stage 32, the vacuum pump VP sucks air from the plastic pad 53 and the pipe provided inside the stage 33, so that the workpiece 10b can be stably placed on the stage 33. Since the second resin 85 is placed on the stage 33, the processing accuracy of the workpiece 10b can be increased by using the plastic pad 53 as the suction pad of the stage 33. This is because the transparent silicone resin used for the second resin 85 is highly elastic and rubbery, and can be sealed to a degree that can be sufficiently adsorbed without using rubber for the suction pad. . In this case, it is possible to suppress the displacement of the workpiece 10b during processing by using the plastic pad 53 with less deformation as the suction pad.
In the second cutting portion, the lead frame 70 and the remaining part of the first resin 88 (reflector resin) are cut using the cutting blade 73 (or cutting blade 74). The cutting blades 73 and 74 are made of resin or metal, and a relatively thick blade having a thickness t2 of, for example, 0.3 to 0.5 mm is used. When cutting the workpiece 10b with the cutting blades 73 and 74, the stage 33 moves at a feed rate of, for example, about 5 mm / sec.

  As described above, the thickness t1 of the cutting blades 71 and 72 in the first cutting part is thinner than the thickness t2 of the cutting blades 73 and 74 in the second cutting part. FIG. 4 is a configuration diagram of the individualized workpiece 11 (semiconductor package) in the present embodiment. 4A shows a cross-sectional view of the individualized workpiece 11, and FIG. 4B is a side view of the individualized workpiece 11 when viewed from the direction of arrow B in FIG. 4A.

  As shown in FIGS. 4A and 4B, a step S <b> 1 is formed between the first resin 88 and the second resin 85 in the cut portion of the individualized workpiece 11. The part where the step S1 is formed is a part cut by the first cutting part. However, while the first resin 88 is cut by the thickness t1 of the cutting blade, the second resin 85 is melted and cut by frictional heat while being stretched in the rotation direction of the cutting blade by being crushed by the cutting blade. . For this reason, the second resin 85 spreads compared to the first resin 88, and a step S1 is formed at the boundary between the first resin 88 and the second resin 85. In order to reduce the step S1, it is preferable to make the thickness t1 of the cutting blade in the first cutting portion thinner.

  Further, a step S <b> 2 is formed in the first resin 88. The portion where the step S2 is formed corresponds to the boundary between the portion cut by the first cutting portion and the second cutting portion. The step S2 is formed when the thickness t1 of the cutting blades 71 and 72 of the first cutting part is different from the thickness t2 of the cutting blades 73 and 74 of the second cutting part. The horizontal distance D of the step S2 is represented by D = (t2-t1) / 2.

  In the second cutting part, the workpiece 10b is cut into, for example, 40 pieces of workpieces 11. Specifically, by cutting the workpiece 10b with the cutting blades 73 and 74 in the second cutting portion, the workpiece 10b is divided into the individual workpieces 11 in 8 rows and 5 columns. As described above, since the stage 33 needs to hold a plurality of individualized workpieces 11, each of the individualized workpieces 11 can be sucked and held individually.

  After cutting the workpiece 10b, the stage 33 on which the plurality of individualized workpieces 11 are placed moves in the Y-axis direction in FIG. 1 (downward in the drawing). Next, as shown in FIG. 2 (e), the offloader 41 (individualized workpiece conveying means) adsorbs the 40 individualized workpieces 11 placed on the stage 33 and moves in the X-axis direction. And the 40 pieces 11 are transported to the storage unit 300. At this time, the loader 40 conveys the next workpiece 10b from the stage 32 to the reversing unit 35. As shown in FIG. 1, the offloader 41 is configured to be movable in the X-axis direction in a range R <b> 3 between the position of the stage 33 in the cutting unit 200 and a predetermined position in the storage unit 300.

  The offloader 41 has a suction portion (not shown) for sucking each of the plurality of individualized workpieces 11. The suction part is made of, for example, an elastic body such as rubber so that the individualized workpiece 11 can be sucked and held. Further, the suction part is provided with as many suction holes (not shown) as the number of the individual workpieces 11 (40 in this embodiment).

  The offloader 41 places a plurality of individualized workpieces 11 (semiconductor packages) on a cleaning / inspection unit 90 (cleaning / inspection stage) provided in the storage unit 300. The cleaning / inspection unit 90 provided in the storage unit 300 includes a cleaning unit and an inspection unit. The cleaning unit cleans the cut surfaces and the like of the plurality of individualized workpieces 11. In addition, the inspection unit performs inspections such as an appearance inspection and a continuity inspection on each individual workpiece 11 and determines whether the individual workpiece 11 is a non-defective product. The individualized workpieces 11 that have passed the inspection are stored in the tray 24.

  In this embodiment, the second main surface side opposite to the first main surface side on which the semiconductor element (LED) is mounted is cut. This is because if the second main surface side is cut first, the lead frame with high strength is cut, and the area corresponding to each package is connected with resin only, making it difficult to stably transport the workpiece. Because it becomes. However, the present embodiment is not limited to this, and if there is no problem in workpiece transfer even when the lead frame is cut first, the first main surface is cut after cutting the second main surface side. The side may be cut.

  In this embodiment, an LED package on which an LED (light emitting diode) is mounted has been described as a semiconductor package. However, the present embodiment is not limited to this, and for example, a CCD package on which a CCD (charge coupled device) is mounted. It is also applicable to.

  Thus, according to the present embodiment, a method for manufacturing a high-quality semiconductor package can be provided. Further, it is possible to provide a cutting device capable of manufacturing a high-quality semiconductor package.

  Next, the configuration and operation of the cutting device according to the second embodiment of the present invention will be described. FIG. 5 is a schematic configuration diagram of a cutting device 2 as an example of the present embodiment. FIG. 6 is an operation explanatory diagram of the cutting device 2.

  The cutting apparatus 2 of the present embodiment is transported by the offloader 41 in that the plurality of individualized workpieces 11 cut by the second cutting section are transported to the storage section 300 by the reversing unit. This is different from the cutting apparatus 1 of FIG. That is, the reversing unit of this embodiment also has a function as an offloader. In addition, since it is the same as that of the cutting device 1 about the other structure and operation | movement of the cutting device 2, description about those structures and operation | movement is abbreviate | omitted.

  As described above, the reversing unit 36 is provided in the cutting unit 201 of the cutting device 2. As shown in FIG. 6A, the workpiece 10 a is conveyed onto the stage 32 by the loader 40. Thereafter, as shown in FIG. 6B, the workpiece 10 a is cut by the first cutting portion to become the workpiece 10 b and is conveyed onto the reversing unit 36 by the loader 40.

  As shown in FIG. 6C, the reversing unit 36 rotates the rotating part and conveys the workpiece 10 b to the stage 33. At this time, the workpiece 10b is placed on the stage 33 with the second main surface opposite to the first main surface, which is the mounting surface of the semiconductor element 60, facing upward. Next, the workpiece | work 10b is cut | disconnected by the 2nd cutting part, and the several piece workpiece | work 11 (several semiconductor packages) is formed. At this time, as shown in FIG. 6D, the next workpiece 10 a to be cut is conveyed onto the stage 32 by the loader 40.

  As shown in FIG. 6E, the plurality of individualized workpieces 11 placed on the stage 33 are sucked by the reversing unit 36 and conveyed to the storage unit 300. The reversing unit 36 returns to the initial position in the opposite direction (−X direction) when the conveyance of the individualized workpiece 11 is completed. Thereafter, the next workpiece 10 b cut by the first cutting unit is conveyed by the loader 40 and placed on the reversing unit 36.

  As shown in FIG. 5, the loader 40 of the present embodiment is configured to be movable in a range R <b> 4 between the supply unit 100 and the initial position of the reversing unit 36 in the cutting unit 201. In addition, the reversing unit 36 of the present embodiment is configured to be movable in a range R5 between the initial position of the reversing unit 36 in the cutting unit 201 and a predetermined position in the storage unit 300.

  As described above, the cutting apparatus 2 according to the present embodiment is configured to convey the plurality of individualized workpieces 11 by the reversing unit 36. For this reason, it is not necessary to provide the offloader 41 as in the first embodiment, and the cutting device can be realized with a simpler configuration than in the first embodiment. On the other hand, the reversing unit 36 of the present embodiment has a suction portion (not shown) for sucking each of the plurality of individualized workpieces 11, similarly to the offloader 41 of the first embodiment. The suction part is made of, for example, an elastic body such as rubber so that the individualized workpiece 11 can be sucked and held. In addition, suction holes (not shown) are provided in the suction portion independently by the number of the individual workpieces 11.

  Next, for example, a cutting method different from the above-described embodiment using the cutting device 2 of this embodiment and a semiconductor package manufactured by the cutting method will be described. FIG. 7 is a cross-sectional view at the time of workpiece cutting in the present embodiment. FIG. 8 is a configuration diagram of a semiconductor package in the present embodiment.

  FIG. 7A shows the workpiece 10a when the second resin 88 (reflector resin) and at least a part of the first resin 85 (lens resin) of the workpiece 10a are cut by the first cutting portion. A cross-sectional view is shown. As shown in FIG. 7A, in the first cutting portion, the workpiece 10a is cut using a cutting blade 71 (or cutting blade 72) having a thickness t1. In the present embodiment, two neighboring lines are cut using the cutting blades 71 and 72. The overall width of the two cutting lines is equal to the thickness t2 of the cutting blade 73 of the second cutting part. That is, the first cutting part cuts the workpiece 10a so that the total cutting width of the two cutting lines is equal to the cutting width (thickness t2) by the second cutting part. When the thickness t1 of the cutting blades 71 and 72 and the thickness t2 of the cutting blades 73 and 74 are used, the distance d1 between the two cutting lines is set to satisfy d1 = t2-2 × t1.

  FIG. 7B shows the case where the lead frame 70 of the workpiece 10b and the remaining part of the first resin 88 (the portion not cut by the first cutting portion) are cut by the second cutting portion. A cross-sectional view of the workpiece 10b is shown. As shown in FIG. 7B, in the second cutting portion, the workpiece 10b is cut using a cutting blade 73 having a thickness t2. Here, the second resin 88 and the first resin 85 cut by the first cutting part have a width equal to the thickness t2 of the cutting blade 73 as a whole.

  As shown in FIGS. 8A and 8B, a step S <b> 1 is formed between the first resin 88 and the second resin 85 in the cut portion of the singulated workpiece 11. The reason why the step S1 is formed is as described in the first embodiment. On the other hand, in this embodiment, the cut surface P of the first resin 88 is flat and no step is formed. This is because the cutting thicknesses in the first cutting portion and the second cutting portion are the same as shown in FIG. As a result, for example, when handling for transportation or mounting, the hand is caught in the step S2 and a force is applied, and a situation in which separation occurs between the first resin 88 and the lead frame 70 is ensured. Can be prevented.

  As described above, according to the present embodiment, no step is formed on the cut surface P of the first resin 88. Therefore, according to the cutting method of the present embodiment, the cut surface of the semiconductor package can be made cleaner and easier to handle than the cutting method of the first embodiment.

  Next, the configuration and operation of the cutting device according to Embodiment 3 of the present invention will be described. FIG. 9 is a schematic configuration diagram of a cutting device 3 as an example of the present embodiment. FIG. 10 is an explanatory diagram of the operation of the cutting device 3.

  The cutting device 3 according to the present embodiment includes two separate stages 32 and 33 in that the first cutting portion and the second cutting portion share one stage 34. 2 is different. In addition, since it is the same as that of the cutting devices 1 and 2 about the structure and operation | movement other than that of the cutting device 3, description about those structures and operation | movement is abbreviate | omitted.

  As shown in FIG. 9A, in the cutting unit 202 of the cutting device 3, the first cutting unit includes a spindle 65, a cutting blade 75 having a thickness t <b> 1, and a stage 34. The second cutting section includes a spindle 66, a cutting blade 76 having a thickness t2, and a stage 34. As described above, in the cutting device 3, the cutting blades 75 and 76 arranged to face each other constitute the cutting blades of the first cutting portion and the second cutting portion, respectively, and the first cutting portion and the second cutting portion. Both departments share one stage 34. Since the stage 34 of this embodiment must adsorb the lead frame 70 and the second resin 85, the stage 34 includes an adsorption pad made of an elastic body such as rubber in order to reliably adsorb them.

  As shown in FIG. 10A, the workpiece 10 a is conveyed onto the stage 34 by the loader 40. Thereafter, as shown in FIG. 10B, the workpiece 10 a is cut by the first cutting portion to become the workpiece 10 b and is conveyed onto the reversing unit 37 by the loader 40. In this case, similarly to the reversing unit 36, the reversing unit 37 includes a suction portion made of an elastic body such as rubber.

  As shown in FIG. 10C, the reversing unit 37 rotates its rotating part and moves in the reverse direction (−X direction), and conveys the workpiece 10 b to the stage 34. The workpiece 10b is placed on the stage 34 with the second main surface opposite to the first main surface, which is the mounting surface of the semiconductor element 60, facing upward. At this time, the loader 40 moves in the reverse direction (−X direction) and returns to the initial position in order to convey the next workpiece 10a to be cut. After the workpiece 10b is placed on the stage 34 by the reversing unit 37, the reversing unit 37 moves in the X direction and returns to the initial position.

  Next, as shown in FIG. 10 (e), the workpiece 10b placed on the stage 34 is cut by the second cutting portion, and a plurality of individualized workpieces 11 (a plurality of semiconductor packages) are formed. The Further, the reversing unit 37 moves in the −X direction to suck the plurality of individualized workpieces 11 placed on the stage 34 and moves in the X direction to convey the individualized workpieces 11 to the storage unit 300. . Thus, in the cutting device 3 of the present embodiment, as shown in FIG. 9B, the workpiece 10a is cut on one stage 34 to form the workpiece 10b, and further, the workpiece 10b is cut. A plurality of individualized workpieces 11 are formed.

  As shown in FIG. 9A, the loader 40 of this embodiment is configured to be movable in a range R <b> 6 between the supply unit 100 and the initial position of the reversing unit 37 in the cutting unit 201. Further, the reversing unit 37 of the present embodiment is configured to be movable in a range R7 between the stage 34 in the cutting unit 201 and a predetermined position in the storage unit 300.

  Thus, in the cutting device 3 of the present embodiment, the first cutting part and the second cutting part share one stage 34. The workpiece 10b and the plurality of individualized workpieces 11 are configured to be conveyed by the reversing unit 37. For this reason, it is not necessary to provide a plurality of cutting parts configured by arranging two cutting blades to face each other as in the first and second embodiments. Further, it is not necessary to provide the offloader 41 as in the first embodiment. For this reason, according to the present Example, a small cutting device can be realized with a simpler configuration than those of Examples 1 and 2.

  According to each of the above embodiments, a method for manufacturing a high-quality semiconductor package can be provided. Moreover, the cutting device for manufacturing such a high quality semiconductor package can be provided.

  The embodiment of the present invention has been specifically described above. However, the present invention is not limited to the matters described as the above-described embodiments, and can be appropriately changed without departing from the technical idea of the present invention.

1, 2, 3 Cutting device 10a, 10b Work piece 11 Piece work (semiconductor package)
32, 33, 34 Stages 35, 36, 37 Reversing units 71, 72, 73, 74 Cutting blade 100 Supply unit 200, 201, 202 Cutting unit 300 Storage unit

Claims (5)

A manufacturing method of a semiconductor package formed by separating a workpiece in which a first resin and a second resin are sequentially laminated on a lead frame,
A step of cutting by using a first major surface said first and said second resin from the side of the part and the first cutting edge of the resin of the workpiece,
Reversing the workpiece;
To have a step of cutting with the said first main surface and opposite second from said main surface and said lead frame first residual Rio second cutting edge of the resin of the workpiece A method for manufacturing a semiconductor package. The first resin is used as a reflector of light emitted from the LED mounted on the lead frame, and is a silicone resin containing silica and titanium oxide,
2. The method of manufacturing a semiconductor package according to claim 1, wherein the second resin is a transparent silicone resin used as a lens of light emitted from the LED.   3. The method of manufacturing a semiconductor package according to claim 1, wherein the thickness of the first cutting blade is thinner than that of the second cutting blade. A cutting device for separating a workpiece in which a first resin and a second resin are sequentially laminated on a lead frame,
A first cutting edge for cutting a part of the first resin and the second resin from the first main surface side of the workpiece,
A reversing unit for reversing the workpiece;
Wherein the said first major surface of the workpiece, characterized in that the second main surface side of the opposite having a second cutting edge for remaining Rio cutting of the lead frame and the first resin Cutting device.   The cutting apparatus according to claim 4, further comprising an offloader configured to convey a plurality of semiconductor packages separated by the first cutting blade and the second cutting blade.