TWI726230B - Holding member, method of manufacturing holding member, holding mechanism, and product manufacturing device - Google Patents
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/021—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/42—Moulds or cores; Details thereof or accessories therefor characterised by the shape of the moulding surface, e.g. ribs or grooves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/36—Moulds for making articles of definite length, i.e. discrete articles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/54—Encapsulations having a particular shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/005—Processes relating to semiconductor body packages relating to encapsulations
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Dicing (AREA)
- Casting Or Compression Moulding Of Plastics Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
本發明不增大製造成本而製造保持製品的保持構件。本發明的保持構件的製造方法是製造保持BGA封裝的保持構件,包括下述步驟:準備成形模具,所述成形模具在主面上有具有第1寬度的多個槽部;將成形模具相向於樹脂材料而配置;將成形模具的主面按壓至樹脂材料;透過使樹脂材料硬化來形成硬化樹脂,從而使包含硬化樹脂的成形品成形;以及從成形模具拆下成形品。保持構件具備:多個壁部,透過將多個槽部轉印至硬化樹脂而形成;凹部,由多個壁部所圍繞;以及貫穿孔,形成於凹部。BGA封裝是以沿Z方向觀察時BGA封裝包含凹部的方式而受到保持。The present invention manufactures a holding member for holding a product without increasing the manufacturing cost. The manufacturing method of the holding member of the present invention is to manufacture a holding member that holds a BGA package, and includes the following steps: preparing a forming mold having a plurality of grooves having a first width on the main surface; The resin material is arranged; the main surface of the forming mold is pressed to the resin material; the resin material is cured to form a cured resin, thereby forming a molded product containing the cured resin; and the molded product is removed from the molding mold. The holding member includes a plurality of wall portions formed by transferring the plurality of groove portions to a cured resin; a recessed portion surrounded by the plurality of wall portions; and a through hole formed in the recessed portion. The BGA package is held in such a way that the BGA package includes a recess when viewed in the Z direction.
Description
本發明有關於一種保持製品的保持構件、保持構件的製造方法、保持機構以及製品的製造裝置。The present invention relates to a holding member for holding a product, a manufacturing method of the holding member, a holding mechanism, and a manufacturing device of the product.
作為對製品即保持對象品進行保持時所使用的保持構件,可列舉托盤(tray)等。有時是透過經由包含貫穿孔的吸附孔來抽吸保持對象品,從而使保持對象品暫時密接固定(吸附)於保持構件所具有的面。具有此時所使用的吸附孔的吸附夾具(jig)等也包含在保持構件中。透過使用保持構件上所設的抽吸孔來抽吸保持對象品,將保持對象品吸附至保持構件的面上。所謂吸附,是透過大氣壓來將保持對象品按壓至保持構件的面,從而使保持對象品密接於保持構件的面。As a holding member used when holding a holding object that is a product, a tray or the like can be cited. In some cases, by sucking and holding the object through the suction hole including the through hole, the object to be held is temporarily tightly fixed (adsorbed) to the surface of the holding member. A suction jig and the like having suction holes used at this time are also included in the holding member. The holding object is sucked by using the suction hole provided in the holding member, and the holding object is sucked onto the surface of the holding member. The term "suction" refers to pressing the object to be held against the surface of the holding member under atmospheric pressure, so that the object to be held is brought into close contact with the surface of the holding member.
作為製品即保持對象品的較佳例,可列舉作為半導體積體電路(semiconductor integrated circuit,簡稱作IC)的IC封裝(package)。IC封裝是透過使用旋轉刀來切斷已密封基板來使其單片化(singulation)而製造。IC封裝為最終製品,已密封基板為中間製品。由於有時會對經單片化之前的已密封基板自身進行交易,因此已密封基板也包含在製品中。As a preferable example of a product, that is, an object to be held, an IC package, which is a semiconductor integrated circuit (abbreviated as IC), can be cited. The IC package is manufactured by cutting a sealed substrate using a rotary knife to singulation. The IC package is the final product, and the sealed substrate is the intermediate product. Since the sealed substrate itself before singulation is sometimes traded, the sealed substrate is also included in the product.
已密封基板是一種複合構件,其包含基板、含有半導體晶片等的晶片(chip)以及含有硬化樹脂的密封樹脂。基板包含引線框架(lead frame)、印刷基板(printed wiring board(印刷電路板))、陶瓷基板(ceramics substrate)、半導體基板(semiconductor wafer(半導體晶片))等。半導體基板包含矽基板(silicon wafer(矽晶片))、SiC基板(SiC wafer(SiC晶片))等。基板包含:形成有包含邏輯電路、存儲電路、放大電路等的電氣電路的電路基板;以及用於支承晶片的支撐用基板。支撐用基板為支撐體(carrier(載體)),包含矽基板、玻璃基板等。The sealed substrate is a composite member including a substrate, a chip containing a semiconductor wafer, and the like, and a sealing resin containing a hardening resin. The substrate includes a lead frame (lead frame), a printed wiring board (printed wiring board), a ceramic substrate (ceramics substrate), a semiconductor substrate (semiconductor wafer (semiconductor wafer)), and the like. The semiconductor substrate includes a silicon substrate (silicon wafer (silicon wafer)), a SiC substrate (SiC wafer (SiC wafer)), and the like. The substrate includes a circuit substrate on which an electrical circuit including a logic circuit, a memory circuit, an amplifier circuit, and the like are formed; and a support substrate for supporting the wafer. The supporting substrate is a carrier (carrier), and includes a silicon substrate, a glass substrate, and the like.
作為保持構件的一種,提出有透過使用射出成形法進行樹脂成形而製造的IC用托盤(參照專利文獻1的第4頁左上欄、第1圖)。所述IC用托盤是利用縱橫正交的格子而分隔。每一個格子裝載一個半導體積體電路裝置的四面扁平封裝(Quad Flat Package,QFP)型IC用托盤是透過使用成形模具的射出成形法而製作。QFP型IC相當於IC封裝。成形模具是透過機械加工、放電加工等而製作。 [現有技術文獻] [專利文獻]As a kind of holding member, a tray for IC manufactured by resin molding using an injection molding method has been proposed (refer to the upper left column of
[專利文獻1]日本專利特開平03-037258號公報[Patent Document 1] Japanese Patent Laid-open No. 03-037258
[發明所要解決的問題][The problem to be solved by the invention]
近年來,包含IC封裝及已密封基板的製品的形狀、結構、由一片已密封基板製造的IC封裝的數量(成片數)等正多樣化。作為成片數,已出現從一片已密封基板製造1,000個單位(例如3,000個~5,000個)製品的情況。作為IC封裝的一種,存在於經單片化的電路基板中呈格子狀地形成有焊球的、被稱作球柵陣列(Ball Grid Array,BGA)封裝(以下稱作“BGA封裝”)的類型。In recent years, the shape and structure of products including IC packages and sealed substrates, and the number (number of pieces) of IC packages manufactured from a single sealed substrate have been diversified. As the number of pieces, 1,000 units (for example, 3,000 to 5,000) products have been manufactured from one sealed substrate. As a type of IC package, it is called a ball grid array (Ball Grid Array, BGA) package (hereinafter referred to as a "BGA package") in which solder balls are formed in a grid pattern on a singulated circuit board. Types of.
BGA所具有的焊球例如是具有0.1 mm~1.0 mm左右的直徑的凸部。製造BGA時的已密封基板(以下稱作“BGA用已密封基板”)具有形成於電路基板的多個焊球。透過將BGA用已密封基板單片化而製造的各個BGA也具有形成於電路基板的多個焊球。在吸附BGA用已密封基板及BGA時,在多個凸部即多個焊球的頂部與電路基板的面(相對於凸部即多個焊球的凹部的底面)之間,容易產生間隙。空氣會透過此間隙而流動,因此吸附BGA用已密封基板及BGA自身的吸附力會變弱。因此,在單片化製程、搬送製程等中,有可能產生下述問題,即,BGA用已密封基板及BGA自身在具有吸附功能的保持構件中違背意願地移動。The solder balls included in the BGA are, for example, convex portions having a diameter of approximately 0.1 mm to 1.0 mm. The sealed substrate (hereinafter referred to as "sealed substrate for BGA") when manufacturing BGA has a plurality of solder balls formed on the circuit board. Each BGA manufactured by singulating a sealed substrate for BGA also has a plurality of solder balls formed on the circuit board. When the sealed substrate for BGA and the BGA are sucked, a gap is likely to occur between the top of the plurality of bumps, that is, the top of the plurality of solder balls, and the surface of the circuit board (the bottom surface of the concave portion of the plurality of bumps, which is the bump relative to the bump). Air flows through this gap, so the adsorption force of the sealed substrate for adsorbing the BGA and the BGA itself becomes weak. Therefore, in the singulation process, the transport process, etc., a problem may occur in that the sealed substrate for BGA and the BGA itself move against the will in the holding member having the suction function.
作為用於使BGA用已密封基板及BGA充分吸附於具有吸附功能的保持構件的結構,可列舉下述結構:形成保持構件,此保持構件具有與成片數相等數量的將一個製品所具有的多個焊球全部予以收容的凹部。此時,必須在射出成形用成形模具中的與保持對象品的配置面對應的面上,形成與跟成片數相等數量的凹部對應的凸部。透過機械加工、放電加工等在成形模具上形成1,000個單位的凸部,會產生導致成形模具的製造成本增大的問題。同樣,在使用成形模具來製造不具有吸附功能的保持構件(例如托盤)的情況下,也會產生導致成形模具的製造成本增大的問題。As a structure for sufficiently adsorbing the sealed substrate for BGA and the BGA to the holding member with the adsorption function, the following structure can be cited: the holding member is formed, and the holding member has the same number of pieces as the number of pieces. A recess where all solder balls are accommodated. In this case, it is necessary to form convex portions corresponding to the number of concave portions equal to the number of sheets on the surface corresponding to the placement surface of the holding object in the injection molding mold. The formation of 1,000-unit protrusions on a forming die by machining, electrical discharge machining, etc., causes a problem that the manufacturing cost of the forming die increases. Similarly, in the case of using a forming die to manufacture a holding member (for example, a tray) that does not have an adsorption function, there is also a problem of increasing the manufacturing cost of the forming die.
本發明是為了解決所述問題而完成。本發明的目的在於,廉價地製造保持具有凹凸的保持對象品時所使用的保持構件。 [解決問題的技術手段]The present invention was completed in order to solve the above-mentioned problems. The object of the present invention is to inexpensively manufacture a holding member used when holding a holding object having unevenness. [Technical means to solve the problem]
為了解決所述問題,本發明的保持構件的製造方法製造對保持對象品進行保持的保持構件,其包括下述製程:準備成形模具,所述成形模具在主面上有具有第1寬度的多個槽部;將成形模具相向於樹脂材料而配置;將成形模具的主面按壓至樹脂材料;透過使樹脂材料硬化來形成硬化樹脂,從而使包含硬化樹脂的成形品成形;以及從成形模具拆下成形品,成形品是具備多個壁部與凹部的保持構件,所述多個壁部是透過將多個槽部轉印至硬化樹脂而形成,所述凹部由多個壁部圍繞,以從硬化樹脂的外底面觀察硬化樹脂的內底面時,保持對象品包含凹部的方式來對保持對象品進行保持。In order to solve the above-mentioned problems, the method of manufacturing a holding member of the present invention manufactures a holding member that holds an object to be held, and includes the following process: preparing a forming mold having a plurality of parts having a first width on the main surface. Arranging the molding die facing the resin material; pressing the main surface of the molding die to the resin material; hardening the resin material to form a hardened resin, thereby forming a molded product containing the hardened resin; and removing it from the molding die The lower molded product, the molded product is a holding member provided with a plurality of walls and recesses formed by transferring a plurality of grooves to a hardened resin, and the recesses are surrounded by a plurality of walls to When the inner bottom surface of the cured resin is observed from the outer bottom surface of the cured resin, the holding target product is held so that the holding target product includes a recess.
為了解決所述問題,本發明的保持構件對保持對象品進行保持,所述保持構件包括:硬化樹脂,為樹脂材料硬化而形成,具有接觸至保持對象品的接觸面;多個第1壁部,包含於硬化樹脂,沿第1方向延伸;多個第2壁部,包含於硬化樹脂,沿與第1方向相交的第2方向延伸;以及凹部,由多個第1壁部與多個第2壁部所圍繞,以從硬化樹脂的外底面觀察硬化樹脂的內底面時,保持對象品包含凹部的方式來對保持對象品進行保持,多個第1壁部所具有的形狀,是在成形模具的主面上形成且具有第1寬度的多個第1槽部的形狀轉印至硬化樹脂的形狀,多個第2壁部所具有的形狀,是在成形模具的主面上形成且具有第1寬度的多個第2槽部的形狀轉印至硬化樹脂的形狀。In order to solve the above-mentioned problems, the holding member of the present invention holds an object to be held. The holding member includes: a hardened resin, formed by curing a resin material, and having a contact surface that contacts the object to be held; and a plurality of first wall portions , Included in the hardened resin, extending in the first direction; a plurality of second wall portions included in the hardened resin, extending in a second direction intersecting the first direction; and recesses, consisting of a plurality of first wall portions and a plurality of second When the inner bottom surface of the cured resin is viewed from the outer bottom surface of the cured resin, the object to be held is surrounded by the 2 walls. The object to be held includes recesses to hold the object to be held. The shapes of the multiple first walls are formed during molding. The shape of the plurality of first grooves with the first width formed on the main surface of the mold is transferred to the shape of the cured resin, and the shape of the plurality of second wall portions is formed on the main surface of the mold and has The shape of the plurality of second grooves of the first width is transferred to the shape of the cured resin.
為了解決所述問題,本發明的保持機構具有所述保持構件。In order to solve the problem, the holding mechanism of the present invention includes the holding member.
為了解決所述問題,本發明的製品的製造裝置具有所述保持構件。 [發明的效果]In order to solve the above-mentioned problem, the manufacturing apparatus of the product of the present invention includes the holding member. [Effects of the invention]
根據本發明,能夠不增大製造成本而製造保持構件。According to the present invention, the holding member can be manufactured without increasing the manufacturing cost.
以下,參照附圖來說明本發明的實施方式。在本申請文件中的任一圖中,為了便於理解,均適當省略或誇張地示意性描繪。對於相同的構成組件,標注相同的符號並適當省略說明。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In any figure in this application, for ease of understanding, the schematic depiction is appropriately omitted or exaggerated. For the same constituent components, the same symbols are attached, and the description is appropriately omitted.
〔實施方式1〕 (BGA用已密封基板的結構) 參照圖1(a)及圖1(b)來說明BGA用已密封基板的結構。透過切斷BGA用已密封基板,從而製造作為最終製品的BGA封裝。因此,BGA用已密封基板相當於製造BGA封裝時的中間製品。相當於最終製品的BGA封裝是由保持構件予以保持的保持對象品。[Embodiment 1] (Structure of a sealed substrate for BGA) The structure of a sealed substrate for BGA will be described with reference to FIGS. 1(a) and 1(b). By cutting the sealed substrate for BGA, the BGA package as the final product is manufactured. Therefore, the sealed substrate for BGA is equivalent to an intermediate product when manufacturing BGA packages. The BGA package corresponding to the final product is a holding object held by a holding member.
如圖1(b)所示,BGA用已密封基板1所具備的基板2具有多個區域3。在基板2的其中一個面2a上,在各區域3中分別安裝晶片4。在基板2的其中一個面2a上,以覆蓋多個區域3中的晶片4的方式而使密封樹脂5成形。各晶片4是由密封樹脂5統一進行樹脂密封。BGA用已密封基板1具備基板2、晶片4及密封樹脂5。As shown in FIG. 1( b ), the
如圖1(a)及圖1(b)所示,在BGA用已密封基板1的另一個面2b上,設有多個突起狀電極6。突起狀電極6是從BGA用已密封基板1的另一個面2b突出的凸部。突起狀電極6從另一個面2b突出的長度即突出量為距離La。突起狀電極6作為將BGA封裝與BGA封裝的外部予以電連接的外部端子發揮功能。圖1(a)及圖1(b)中,作為突起狀電極6,表示了焊球。圖1(a)及圖1(b)表示在BGA用已密封基板1所具有的一整個區域3上設有突起狀電極6的情況。在BGA用已密封基板1的另一個面2b上,突起狀電極6為凸部,突起狀電極6以外的部分(換言之,另一個面2b上的突起狀電極6以外的部分)為凹部。As shown in FIG. 1( a) and FIG. 1( b ), a plurality of protruding
如圖1(a)所示,在BGA用已密封基板1上,分別假想地設定有沿X方向延伸的多條第1切斷線7、與沿Y方向延伸的多條第2切斷線8。由多條第1切斷線7與多條第2切斷線8所包圍的多個區域3分別相當於作為保持對象品的BGA封裝。圖1(a)所示的區域3的平面形狀(沿Z方向觀察的形狀,下同)是具有一邊的長度為a的四條邊的正方形。As shown in Figure 1(a), on the sealed
在圖1(a)中,沿X方向形成有三個區域3,沿Y方向形成有四個區域3。因此,在BGA用已密封基板1上,呈格子狀地形成有12個區域3。透過沿多條第1切斷線7與多條第2切斷線8來切斷BGA用已密封基板1,從而製造相當於各個區域3的12個BGA封裝。BGA用已密封基板1的大小是根據經單片化的BGA封裝的尺寸或成片數而任意設定。In FIG. 1(a), three
(BGA封裝的製造方法) 參照圖2(a)來說明由BGA用已密封基板1製造BGA封裝的方法。首先,準備切斷平臺(table)9。在切斷平臺9上,安裝有切斷用夾具10。切斷用夾具10具有金屬板(plate)11、及安裝於金屬板11上的樹脂片材12。在切斷平臺9的上表面安裝有金屬板11。在樹脂片材12的上表面,以重合於BGA用已密封基板1所具有的多條第1切斷線7(參照圖1(a)及圖1(b))與多條第2切斷線8的方式而形成有切斷槽13。(Method of Manufacturing BGA Package) A method of manufacturing a BGA package from the sealed
切斷用夾具10具有貫穿金屬板11與樹脂片材12的貫穿孔14。貫穿孔14是與BGA用已密封基板1所具有的區域3分別對應地形成。各貫穿孔14依序經由形成於切斷平臺9的空間15、配管16與閥17而連接於減壓源(未圖示)。作為減壓源,例如使用減壓泵(bump)、減壓罐(tank)等。The cutting
接下來,如圖2(a)所示,將BGA用已密封基板1配置於切斷用夾具10上。透過對閥17進行操作,經由配管16、空間15與各貫穿孔14來抽吸BGA用已密封基板1。由線段所示的寬幅的箭頭表示用於抽吸BGA用已密封基板1的進氣VT。BGA用已密封基板1透過被大氣壓按壓而密接於切斷用夾具10的上表面。換言之,BGA用已密封基板1被吸附於切斷用夾具10的上表面。由此,BGA用已密封基板1被暫時固定於切斷平臺9的切斷用夾具10。Next, as shown in FIG. 2( a ), the sealed
接下來,如圖2(a)所示,準備圓板狀的旋轉刀18。旋轉刀18是具有寬度(厚度)w1的切斷用旋轉刀。使旋轉刀18沿直徑方向進行切斷時的、旋轉刀18外緣的剖面形狀為V字狀。使用高速旋轉的旋轉刀18,沿多條第1切斷線7(參照圖1(a)及圖1(b))與多條第2切斷線8來切斷BGA用已密封基板1。由此,製造將BGA用已密封基板1以各區域3為單位而單片化的BGA封裝19。圖2(a)表示沿著第2切斷線8來切斷BGA用已密封基板1的情況。在相鄰的BGA封裝19彼此之間,形成具有寬度w1的間隙20。Next, as shown in FIG. 2(a), a disk-shaped
(BGA封裝用保持構件的製造方法) 參照圖2(a)~圖3(d)來說明本發明的實施方式1的保持構件的製造方法。首先,如圖2(b)所示,準備包含硬質板的板狀構件21。板狀構件21是為了製造保持構件而使用的成形模具的原材料。板狀構件21的平面形狀優選包含BGA用已密封基板1的平面形狀。作為板狀構件21,使用玻璃環氧(glass epoxy)基板等複合材料板、壓克力(acryl)板、氟樹脂板等硬質樹脂板、鋁板等金屬板、玻璃板等。(Manufacturing method of holding member for BGA package) The manufacturing method of the holding member of
接下來,如圖2(b)所示,將板狀構件21暫時固定於切斷平臺9的切斷用夾具10。圖2(b)中表示將板狀構件21透過吸附而暫時固定於切斷用夾具10上表面的示例。以後的製程中,能夠使用切斷BGA用已密封基板1時所使用的切斷平臺9。Next, as shown in FIG. 2( b ), the plate-shaped
接下來,準備圓板狀的旋轉刀22。旋轉刀22是具有寬度(厚度)w2的槽形成用旋轉刀。槽形成用旋轉刀22的寬度(厚度)w2大於切斷用旋轉刀18的寬度(厚度)w1。如圖2(c)所示,使旋轉刀22沿直徑方向進行切斷時的、旋轉刀22外緣的剖面形狀為長方形狀。Next, a disk-shaped
接下來,如圖2(c)所示,使用高速旋轉的旋轉刀22,在板狀構件21上形成槽部23。所形成的槽部23具有寬度w2。具體而言,沿著相當於在BGA用已密封基板1上假想地設定的多條第1切斷線7與多條第2切斷線8(參照圖1(a))的切斷線24,在板狀構件21上形成槽部23。槽部23的深度為距離Lb。距離Lb大於突起狀電極6從BGA用已密封基板1的另一個面2b突出的突出量即距離La。透過至此為止的製程,完成構成為了製造保持構件而使用的成形模具的一部分的附槽板25。在板狀構件21上形成槽部23的製程中,也可沿用切斷BGA用已密封基板1時所使用的切斷裝置。此時,只要更換切斷裝置的旋轉刀即可。因此,不需要準備新的加工裝置,因而適合。Next, as shown in FIG. 2( c ), a high-
接下來,如圖3(a)所示,在附槽板25中的形成有槽部23的面的相反面(圖3(a)中的上表面),固定加強板26。附槽板25與加強板26構成為了製造保持構件而使用的成形模具27。加強板26的材料只要從用於板狀構件21的材料中選擇即可。在將加強板26固定於附槽板25時,可使用黏合劑等。Next, as shown in FIG. 3( a ), the reinforcing
接下來,如圖3(a)所示,準備箱狀構件28。對箱狀構件28供給樹脂材料29。樹脂材料29是在常溫下具有流動性的樹脂(以下稱作“液狀樹脂”),不論黏度的程度。樹脂材料29優選為常溫硬化型樹脂。作為樹脂材料29,使用矽酮(silicone)樹脂、氟樹脂等。可對應於所要求的保持構件的硬度或形狀等,來選擇最佳的樹脂材料。由於在樹脂材料29的內部有可能包含氣泡,因此優選預先進行脫泡以去除氣泡。Next, as shown in FIG. 3(a), a box-shaped
接下來,如圖3(b)所示,將成形模具27所具有的附槽板25中的形成有槽部23的面側浸在供給至箱狀構件28的樹脂材料29中。將附槽板25浸在樹脂材料29中的深度,設定為附槽板25中的槽部23被樹脂材料29填滿的深度以上。Next, as shown in FIG. 3( b ), the surface side on which the
接下來,使樹脂材料29硬化而使硬化樹脂30成形。如圖3(c)所示,從成形模具27中拆出硬化樹脂30。由於樹脂材料29為常溫硬化型樹脂,因此在硬化樹脂30成形的過程中不會發生硬化樹脂30的收縮。因此,可獲得具有良好的尺寸精度的硬化樹脂30。Next, the
透過至此為止的製程,完成包含箱狀構件28與硬化樹脂30的成形品31。成形品31具有:多個凹部32,與圖1(a)及圖1(b)所示的多個區域3分別對應;以及壁部33,與多個區域3的邊界即多條第1切斷線7與多條第2切斷線8對應。凹部32是由壁部33所包圍的空間。成形品31的壁部33是透過轉印成形模具27的槽部23的形狀而形成。成形品31的凹部32是透過轉印成形模具27中的由槽部23所包圍的部分(換言之,由槽部23所包圍的凸部)的形狀而形成。Through the processes so far, the molded
接下來,在成形品31上形成貫穿孔34(參照圖3(d))。使用鑽機(drill)、雷射(laser)等,在各凹部32的中央部形成貫穿箱狀構件28與硬化樹脂30的貫穿孔34。貫穿孔34作為抽吸保持對象品的抽吸孔發揮功能。透過在成形品31上形成貫穿孔34的製程,如圖3(d)所示,包含箱狀構件28、硬化樹脂30及貫穿孔34的保持構件35完成。Next, a through
保持構件35所具有的壁部33的寬度是與槽形成用旋轉刀22的寬度(厚度)相等的寬度w2。圖3(c)、圖3(d)所示的壁部33的端面36(圖3(d)中為下表面)為水平面。成形模具27所具有的附槽板25的槽部23的深度即距離Lb與壁部33的高度相等。The width of the
(使用保持構件來保持BGA封裝的形態) 參照圖3(d),說明使用保持構件35來保持BGA封裝19的形態。保持構件35例如是安裝於卸載機(unloader)等搬送機構37而使用。首先,如圖3(d)所示,準備安裝有保持構件35的搬送機構37。(The holding member is used to hold the form of the BGA package) With reference to FIG. 3(d), the form of holding the
接下來,使保持構件35移動至被吸附於切斷平臺9的BGA封裝19的上方之後,使保持構件35下降。在此製程中,只要使切斷平臺9與搬送機構37相對地升降即可。在此過程中,使相鄰的BGA封裝19彼此之間的間隙20的中心與壁部33的中心對位。在對位後的狀態下沿Z方向觀察(以下稱作“俯視”)時,壁部33與BGA封裝19重合的長度(圖3(d)中表示為沿X方向重合的長度)為距離L1。Next, after the holding
接下來,如圖3(d)所示,依序經由配管38與閥(未圖示),透過進氣VJ來抽吸各BGA封裝19。由此,在壁部33的端面36上,各BGA封裝19的外周部受到吸附。Next, as shown in FIG. 3(d), each
接下來,在停止切斷平臺9中的抽吸(參照圖2(a)至圖2(c)所示的進氣VT)後,使搬送機構37上升,而將各BGA封裝19搬送至進行下個製程的機構為止。作為進行下個製程的機構,例如可列舉檢查機構、清洗機構等。Next, after stopping the suction in the cutting platform 9 (refer to the intake VT shown in Figs. 2(a) to 2(c)), the conveying
以下,對保持構件35的特徵進行說明。第一,圖3(d)所示的壁部33的端面36(圖3(d)中為下表面,下同)為水平面。Hereinafter, the characteristics of the holding
第二,壁部33具有寬度w2。壁部33的寬度w2與BGA封裝19彼此之間的間隙20的寬度w1(=切斷用旋轉刀的寬度w1)的關係為寬度w2>寬度w1。Second, the
第三,將壁部33的端部39(圖3(d)中為下部,由虛線所包圍的部分,下同)中的端面36按抵至相鄰的BGA封裝19彼此相向的外周部(以下適當地稱作“相向的外周部”)。借此,相向的外周部與壁部33的端面36密接。由此,壁部33的端部39受到壓縮而以朝X方向及Y方向展開的方式發生變形。因此,在各BGA封裝19的外周部受到吸附的狀態下,壁部33與BGA封裝19重合的長度大於圖3(d)所示的距離L1。硬化樹脂30的硬度被設定為下述程度的硬度,即,透過將壁部33的端部39按抵至BGA封裝19的相向的外周部,壁部33的端部39以被壓扁的方式發生變形。Third, press the
透過所述的三個特徵,壁部33的端面36封堵BGA封裝19彼此之間的間隙20。在此狀態下,從硬化樹脂30的外底面(圖3(d)中為上側的面)觀察硬化樹脂30的內底面(圖3(d)中為凹部32中的上側的面)時,換言之,在俯視時,各BGA封裝19完全包含各凹部32。透過使用進氣VJ來抽吸各BGA封裝19,各BGA封裝19的外周部被吸附至保持構件35所具有的各壁部33的端面36。保持構件35作為吸附夾具發揮功能。Through the above three features, the
除此以外,保持構件35所具有的凹部32的深度即距離Lb大於突起狀電極6從BGA用已密封基板1的另一個面2b突出的突出量即距離La。距離Lb優選為大至下述程度,即,即使在壁部33的端部39以被壓扁的方式發生變形的情況下,保持構件35所具有的凹部32的內底面也不會接觸到突起狀電極6的頂部。由此,第一,可避免因保持構件35所具有的凹部32的內底面接觸到突起狀電極6的頂部而導致BGA封裝19的相向的外周部與壁部33的端部39分離的情況。因此,可避免因進氣VJ洩漏而無法吸附BGA封裝19的情況。In addition, the depth Lb of the
第二,透過將距離Lb設定為適當的大小,在BGA封裝19的相向的外周部與壁部33的端面36密接的狀態下,各BGA封裝19的突起狀電極6被完全收容到保持構件35所具有的各凹部32中。因此,各BGA封裝19的外周部被吸附至環繞保持構件35所具有的各凹部32的壁部33的端面36。Second, by setting the distance Lb to an appropriate size, the protruding
在保持構件35所具有的各凹部32的內底面接觸至突起狀電極6的頂部的情況下,只要確保BGA封裝19的相向的外周部與壁部33的端面36密接的狀態即可。此時,在各BGA封裝19所具有的另一個面2b上,突起狀電極6以外的部分的空間連通。因此,在BGA封裝19的相向的外周部與壁部33的端面36密接的狀態下,各BGA封裝19被吸附至環繞保持構件35所具有的各凹部32的壁部33的端面36。When the inner bottom surface of each
(作用效果) 根據本實施方式,能夠在保持構件35中統一形成吸附保持多個BGA封裝19的壁部33與被壁部33包圍的多個凹部32。因此,能夠廉價地製造具有多個凹部32的保持構件35。(Function and Effect) According to the present embodiment, the
根據本實施方式,作為樹脂材料29,使用常溫硬化型樹脂,使保持構件35中所含的硬化樹脂30成形。由此,在使硬化樹脂30成形的過程中,不會發生硬化樹脂30的收縮。因此,能夠製造具有良好的尺寸精度的保持構件35。According to this embodiment, a room temperature curable resin is used as the
根據本實施方式,能夠統一製造包含箱狀構件28與硬化樹脂30的保持構件35。箱狀構件28作為保持構件35的加強材發揮功能。箱狀構件28也作為用於根據需要來將保持構件35固定於其他構件(例如,構成製造裝置所具有的搬送機構37(參照圖3(d))的構件)的固定板發揮功能。因此,能夠廉價地製造具備作為加強材及固定板發揮功能的構件的保持構件35。According to this embodiment, the holding
(變形例) 也可採用以下的變形例。這些變形例在其他實施方式中也能夠適當採用。(Modifications) The following modifications can also be adopted. These modifications can also be appropriately adopted in other embodiments.
第一,也可在包含硬化樹脂30的成形品成形後,從箱狀構件28拆下硬化樹脂30。此時,產生下述優點,即:能夠將箱狀構件28反覆用作成形用夾具。透過適當地將硬化樹脂30的硬度設定得較大,從而能夠將硬化樹脂30單體用作保持構件35。也可根據需要來將硬化樹脂30固定於其他構件(例如,構成製造裝置所具有的搬送機構37(參照圖3(d))的構件),從而使固定於此構件的硬化樹脂30作為保持構件發揮功能。First, after the molded product containing the cured
第二,也可不使用箱狀構件28,而向板狀構件上供給具有大黏度的樹脂材料29。此時,樹脂材料29的黏度優選為大至下述程度,即,在樹脂材料29被供給至板狀構件上的狀態下,即使將板狀構件傾斜,樹脂材料29也能保持靜止狀態。將成形模具27所具有的附槽板25中的形成有槽部23的面側浸在具有大黏度的樹脂材料29中。使具有大黏度的樹脂材料29硬化而使硬化樹脂30成形的製程以後,與至此為止所說明的製程相同。Second, instead of using the box-shaped
在此變形例中,首先,使用具有大的平面形狀的板狀構件來使硬化樹脂30成形。接下來,對包含板狀構件與硬化樹脂30的成形品設定作為保持構件所需的範圍,將所需的範圍與不需要的外周部的邊界予以切斷。由此,完成相當於作為保持構件所需的範圍的、包含板狀構件與硬化樹脂30的保持構件35。In this modification, first, a plate-shaped member having a large planar shape is used to mold the hardened
第三,作為樹脂材料29,也可取代在常溫下具有流動性的樹脂而使用如下所述的樹脂材料。所述樹脂材料是具有下述特性的樹脂材料,即:能夠變形為對成形模具27所具有的附槽板25中的槽部23的形狀進行轉印的程度;以及在轉印有槽部23的形狀的狀態下,可在常溫下硬化。例如,作為樹脂材料29,可使用凍膠(jelly)狀的樹脂材料。Thirdly, as the
第四,也可將壁部33的端面36設為具有大的曲率半徑(換言之,小的曲率)的曲面。在此情況下,透過將壁部33的端部39按抵至BGA封裝19的相向的外周部,壁部33的端部39也以被壓扁的方式發生變形。因此,壁部33的端面36能夠封堵BGA封裝19彼此之間的間隙20。Fourth, the
第五,也可將硬化樹脂30設為雙層結構。在向圖3(a)所示的箱狀構件28中供給第1樹脂材料而使第1硬化樹脂成形後,對第1硬化樹脂上供給第2樹脂材料而使第2硬化樹脂成形。第2硬化樹脂的硬度小於第1硬化樹脂的硬度。根據此變形例,柔軟易變形的第2硬化樹脂由硬的第1硬化樹脂支撐,且由第2硬化樹脂構成壁部33的端部39。Fifth, the hardening
根據此變形例,透過壁部33的端部39柔軟易變形,從而壁部33的端面36能夠更切實地封堵BGA封裝19彼此之間的間隙20。具有大硬度的第1硬化樹脂作為保持構件35中的加強板發揮功能,且也作為用於根據需要來將保持構件35固定於其他構件的固定板發揮功能。也可取代使第1樹脂材料硬化來使第1硬化樹脂成形,而將包含具有比第2硬化樹脂大的硬度的硬質樹脂的樹脂板,預先供給至箱狀構件28的內底面。According to this modification, the
〔實施方式2〕 (BGA封裝用保持構件的製造方法) 參照圖4(a)至圖4(d)來說明本發明的實施方式2的保持構件的製造方法。適當省略與至此為止所說明的實施方式中的內容相同的內容的說明。[Embodiment 2] (Method of Manufacturing Holding Member for BGA Package) A method of manufacturing a holding member according to
首先,準備板狀構件21(參照圖2(b))。準備圖4(a)所示的圓板狀的旋轉刀40。旋轉刀40是具有寬度(厚度)w3的槽形成用旋轉刀。如圖4(a)所示,使旋轉刀40沿直徑方向進行切斷時的、旋轉刀40外緣的剖面形狀為V字狀。槽形成用旋轉刀40的寬度(厚度)w3大於圖2(a)所示的切斷用旋轉刀18的寬度(厚度)w1。旋轉刀40的寬度w3優選為小於圖2(c)所示的槽形成用旋轉刀22的寬度(厚度)w2。First, the plate-shaped
接下來,使用旋轉刀40在板狀構件上形成槽部41。所形成的槽部41具有寬度w3。槽部41的底部附近的剖面形狀為V字狀。槽部41的深度為距離Lb。距離Lb大於圖2(a)所示的突起狀電極6從BGA用已密封基板1的另一個面2b突出的突出量即距離La。透過至此為止的製程,完成構成為了製造保持構件而使用的成形模具的一部分的附槽板42。Next, the
接下來,如圖4(b)所示,在附槽板42中的形成有槽部41的面的相反面(圖4(b)中為上表面),固定加強板26。附槽板42與加強板26構成為了製造保持構件而使用的成形模具43。Next, as shown in FIG. 4( b ), the reinforcing
接下來,如圖4(b)所示,準備箱狀構件28。在箱狀構件28中,對內底面預先供給樹脂板44。樹脂板44是包含硬質樹脂的樹脂材料。在樹脂板44上,供給包含液狀樹脂的樹脂材料29。在供給至箱狀構件28的樹脂材料29上,將附槽板42設為下側地配置成形模具43。Next, as shown in FIG. 4(b), a box-shaped
接下來,如圖4(c)所示,將成形模具43所具有的附槽板42中的形成有槽部41的面側浸在供給至箱狀構件28的樹脂材料29中。將附槽板42浸在樹脂材料29中的深度,設定為附槽板42中的槽部41被樹脂材料29填滿的深度以上。Next, as shown in FIG. 4( c ), the surface side on which the
接下來,使樹脂材料29硬化而使硬化樹脂30成形。在此過程中,包含硬質樹脂的樹脂板44與硬化樹脂30黏合。硬化樹脂30的硬度小於樹脂板44的硬度。Next, the
接下來,如圖4(d)所示,從成形模具43中拆出硬化樹脂30。由於樹脂材料29為常溫硬化型樹脂,因此在硬化樹脂30成形的過程中不會發生硬化樹脂30的收縮。因此,可獲得具有良好的尺寸精度的硬化樹脂30。Next, as shown in FIG. 4( d ), the cured
透過至此為止的製程,完成包含箱狀構件28、含有硬質樹脂的樹脂板44及硬化樹脂30的成形品45。樹脂板44為基礎,相當於第1層。硬化樹脂30是以覆蓋樹脂板44的方式而成形,相當於第2層。成形品45具有:多個凹部46,與圖1(a)及圖1(b)所示的多個區域3分別對應;以及壁部47,與多個區域3的邊界即多條第1切斷線7與多條第2切斷線8(參照圖1(a))對應。凹部46是由壁部47所包圍的空間。Through the processes so far, the molded
接下來,如圖5(a)所示,在成形品45上形成貫穿孔48。使用鑽機、雷射等,在各凹部46的中央部形成貫穿箱狀構件28、樹脂板44與硬化樹脂30的貫穿孔48。貫穿孔48作為抽吸保持對象品的抽吸孔發揮功能。透過在成形品45上形成貫穿孔48的製程,包含箱狀構件28、硬化樹脂30、樹脂板44及貫穿孔48的保持構件49完成。Next, as shown in FIG. 5( a ), a through
以下,參照圖5(a)及圖5(b)來說明保持構件49所具有的壁部47的尺寸形狀。壁部47的寬度是與槽形成用旋轉刀40的寬度(厚度)相等的寬度w3。壁部47的端部50(圖5(a)及圖5(b)中為下部,下同)越接近前端51(圖5(a)及圖5(b)中為下端,下同)而寬度越窄。換言之,壁部47的端部50的剖面形狀(沿圖5(a)及圖5(b)的X軸進行切斷時的剖面形狀)在圖5(a)及圖5(b)所示的狀態下(將端部50朝下的狀態下)為V字狀。壁部47的前端51是沿著圖5(a)及圖5(b)的Y軸延伸的棱線。附槽板42中的槽部41的深度即距離Lb在保持構件49中與壁部47的高度相等。也可將壁部47的側面設為曲面。也可在前端51設置具有小的曲率半徑(換言之,大的曲率)的曲面。Hereinafter, the size and shape of the
(使用保持構件來保持BGA封裝的形態) 參照圖5(a)及圖5(b),說明使用保持構件49來保持BGA封裝19的製程。首先,如圖5(a)所示,準備安裝有保持構件49的搬送機構37。(Using the holding member to hold the form of the BGA package) With reference to FIGS. 5(a) and 5(b), the process of holding the
接下來,如圖5(a)所示,使保持構件49移動至被吸附於切斷平臺9的BGA封裝19的上方。在此過程中,使相鄰的BGA封裝19彼此之間的間隙20的中心與壁部47的中心對位。Next, as shown in FIG. 5( a ), the holding
接下來,從圖5(a)所示的狀態開始,使搬送機構37下降。在此製程中,只要使切斷平臺9與搬送機構37相對地升降即可。由此,壁部47的端部50被插入相鄰的BGA封裝19彼此之間的間隙20中。壁部47的端部50具有在圖5(a)及圖5(b)所示的狀態下為V字狀的剖面形狀。壁部47的包含前端51的端部50的一部分進入間隙20的內部(圖5(a)及圖5(b)中是較間隙20的最上端為下側的部分),壁部47中的變形的兩側面密接於間隙20的最上端。因此,能夠透過壁部47來封堵間隙20。當在此狀態下俯視時,各BGA封裝19完全包含各凹部46。優選的是,距離Lb被規定為在壁部47的包含前端51的一部分進入間隙20內部的狀態下,凹部46的內底面(圖5(b)中為凹部46中的上側的面)與突起狀電極6的頂部不會接觸。Next, starting from the state shown in FIG. 5(a), the conveying
接下來,如圖5(b)所示,透過進氣VJ來抽吸各BGA封裝19。由此,在壁部47的端部50中的兩側面,各BGA封裝19受到吸附。保持構件49作為吸附夾具發揮功能。Next, as shown in FIG. 5(b), each
接下來,停止切斷平臺9中的抽吸後,使搬送機構37上升,而將各BGA封裝19搬送至進行下個製程的機構為止。Next, after the suction in the
(作用效果) 根據本實施方式,可獲得與實施方式1同樣的效果。除此以外,根據本實施方式,可獲得下述效果。柔軟易變形的壁部47的端部50具有越接近前端51而寬度越窄的剖面形狀。透過壁部47的前端51進入間隙20的內部,壁部47中的變形的兩側面封堵間隙20。另一方面,如圖3(d)所示,根據實施方式1,壁部33的端部39以被壓扁的方式發生變形而封堵間隙20。因此,根據本實施方式,俯視時,壁部47與BGA封裝19重合的長度(圖5(b)中表示為沿著X方向而重合的長度L2)小於實施方式1中的重合長度L1(參照圖3(d))。與實施方式1相比,根據本實施方式,能夠將突起狀電極6配置到相鄰的BGA封裝19彼此的外緣的更近處。因此,本實施方式能夠實現BGA封裝19中的突起狀電極6的配置的進一步的高密度化。(Functions and Effects) According to this embodiment, the same effects as in the first embodiment can be obtained. In addition to this, according to this embodiment, the following effects can be obtained. The
比較圖3(d)與圖5(b)可明確,本實施方式能夠實現BGA封裝19中的突起狀電極6的配置的進一步的高密度化。在表示實施方式1的圖3(d)中,在一個BGA封裝19中,沿X方向配置四個突起狀電極6。另一方面,在表示本實施方式的圖5(b)中,在一個BGA封裝19中,沿X方向配置五個突起狀電極6。Comparing FIG. 3( d) with FIG. 5( b ), it is clear that the present embodiment can achieve a higher density of the arrangement of the protruding
除此以外,根據本實施方式,即使在BGA封裝19的外緣、與最外側焊球的最外側邊緣之間的距離小的情況下,各BGA封裝19也可被吸附於保持構件49。這樣,第一,能夠實現BGA封裝19的小型化。第二,能夠增大由具有相同平面積的BGA用已密封基板1(參照圖1(a)及圖1(b))製造的BGA封裝19的數量,換言之,能夠增大BGA封裝19的成片數。In addition, according to the present embodiment, even when the distance between the outer edge of the
(變形例) 作為變形例,也可在對圖4(b)所示的箱狀構件28供給第1樹脂材料而使第1硬化樹脂成形後,對第1硬化樹脂上供給第2樹脂材料而使第2硬化樹脂成形。第2硬化樹脂的硬度小於第1硬化樹脂的硬度。也可使壁部47中的端部50附近由第2硬化樹脂形成,而使比端部50附近靠近箱狀構件28的部分由第1硬化樹脂形成。透過這些結構,柔軟易變形的第2硬化樹脂由硬的第1硬化樹脂支撐,且由第2硬化樹脂構成壁部47的端部50。因此,透過壁部47中的端部50柔軟易變形,從而端部50能夠更切實地封堵BGA封裝19彼此之間的間隙20。(Modification) As a modification, after the first resin material is supplied to the box-shaped
優選將前端51的角度設為銳角,更優選將前端51的角度設為15°以上且45°以下。更優選將前端51的角度設為15°以上且45°以下的理由如下。若使前端51的角度小於15°,則有可能因壁部47深深進入間隙20內部,而導致保持構件49所具有的凹部46的內底面接觸到突起狀電極6的頂部。此時,BGA封裝19的相向的外周部與壁部47的端部50有可能分離而無法進行BGA封裝19的吸附,因而不優選。若使前端51的角度大於45°,則會妨礙突起狀電極6的配置的高密度化及BGA封裝19的小型化,因而不優選。The angle of the
關於壁部47,也可採用以下的變形例。也可將端部50的剖面形狀設為越接近前端51而寬度變得越窄的非對稱形狀。例如,也可將端部50的剖面形狀設為使角符號∠逆時針旋轉90°的形狀。Regarding the
〔實施方式3〕 (使用保持構件來保持LED封裝的形態) 參照圖6(a)及圖6(b)來說明本發明的實施方式3的保持構件保持光元件的形態。圖6(a)及圖6(b)中,作為保持對象品,表示了相當於光學製品的發光二極體(Light Emitting Diode,LED)封裝52。LED封裝52具有包含印刷基板、引線框架等的基板53、LED晶片54以及相當於凸部的密封樹脂55。包含透光性樹脂的密封樹脂55作為凸透鏡發揮功能。在基板53所具有的其中一個面(圖6(a)中為下表面)上形成有外部端子(未圖示)。基板53所具有的另一個面56(圖6(a)中為上表面)為晶片安裝面。從基板53的另一個面56突出的密封樹脂55的直至頂部為止的高度(換言之,密封樹脂55的突出量)為距離La。LED封裝52是透過將LED用已密封基板(未圖示,相當於圖1(a)及圖1(b)所示的BGA用已密封基板1)單片化而製造。一個LED封裝52所具有的密封樹脂55被收容在保持構件49上所成形的多個凹部46中的一個凹部46內。[Embodiment 3] (A form in which a holding member is used to hold an LED package) A form in which a holding member according to
圖6(a)及圖6(b)所示的LED封裝52沿X方向具有兩個、沿Y方向具有兩個,合計四個LED晶片54。也可在一個LED封裝52中設置一個LED晶片54。作為光元件,也可取代LED晶片54而設置雷射二極體晶片。也可在一個封裝中設置一個發光元件與一個受光元件。此時,所述一個封裝作為光學傳感器發揮功能。There are two
圖6(a)及圖6(b)所示的保持構件49是以與圖5(a)及圖5(b)所示的保持構件49相同的形態來保持LED封裝52。在圖6(b)所示的狀態下俯視時,各LED封裝52完全包含各凹部46。此時,考慮密封樹脂55的突出量即距離La、與壁部47的包含前端51的一部分進入間隙20內部的量,來決定凹部46的深度即距離Lb。具體而言,距離Lb被規定為,在壁部47的包含前端51的一部分進入間隙20內部的狀態下,凹部46的內底面(圖6(b)中為凹部46中的上側的面)與密封樹脂55的頂部不會接觸。The holding
(作用效果) 根據本實施方式,即使在基板53中的另一個面56上,基板53的外緣與密封樹脂55的外緣之間的距離小的情況下,各LED封裝52也可被吸附於保持構件49。這樣,第一,能夠實現LED封裝52的小型化。第二,能夠增大由具有相同平面積的LED用已密封基板製造的LED封裝52的數量,換言之,能夠增大LED封裝52的成片數。(Effects) According to this embodiment, even if the distance between the outer edge of the
〔實施方式4〕 (切斷裝置的結構) 參照圖7來說明對圖1(a)及圖1(b)所示的BGA用已密封基板1進行切斷的切斷裝置的結構。圖7所示的切斷裝置57是使用圖3(d)所示的保持構件35來製造製品即BGA封裝19的、製品的製造裝置的一個形態。[Embodiment 4] (Structure of Cutting Device) The structure of a cutting device that cuts the sealed
如圖7所示,切斷裝置57具備下述模塊來作為各構成組件,即:供給模塊A,供給BGA用已密封基板1;切斷模塊B,切斷BGA用已密封基板1;以及檢查/保管模塊C,對經切斷的BGA封裝19進行檢查並保管。各構成組件(各模塊A~模塊C)能夠分別相對於其他構成組件而裝卸且更換。As shown in FIG. 7, the cutting
在供給模塊A中,設有供給BGA用已密封基板1的已密封基板供給部58。BGA用已密封基板1是由搬送機構(未圖示)將BGA用已密封基板1中的另一個面2b(形成有突起狀電極6的面,參照圖1(a)及圖1(b))朝上(+Z方向的朝向)地,從供給模塊A搬送至切斷模塊B。In the supply module A, a sealed
在切斷模塊B中,設有用於載置並切斷BGA用已密封基板1的切斷平臺9(參照圖2(a)至圖2(c))。在切斷平臺9上安裝有切斷用夾具10(參照圖2(a)至圖2(c))。切斷平臺9能夠透過移動機構59而朝圖的Y方向移動。並且,切斷平臺9能夠透過旋轉機構60而朝θ方向旋轉。在安裝於切斷平臺9上的切斷用夾具10上載置BGA用已密封基板1。In the cutting module B, a
在切斷模塊B中,設有作為切斷機構的主軸(spindle)61。主軸61能夠獨立地朝X方向及Z方向移動。在主軸61上,安裝有切斷BGA用已密封基板1的旋轉刀18。也如圖2(a)所示,旋轉刀18具有寬度(厚度)w1。In the cutting module B, a
在主軸61中,分別設有朝高速旋轉的旋轉刀18噴射切削水的切削水用噴嘴(nozzle)、噴射冷卻水的冷卻水用噴嘴(均未圖示)等。透過使切斷平臺9與主軸61相對地移動,從而切斷BGA用已密封基板1。旋轉刀18是透過在Y-Z平面的面內旋轉而切斷BGA用已密封基板1。The
切斷裝置57是設有一個主軸61的單主軸結構的切斷裝置。並不限於此,也可設為具有在切斷模塊B中設有兩個主軸的雙主軸結構的切斷裝置。進而,也可設為設置兩個切斷平臺且在各個切斷平臺中切斷BGA用已密封基板1的雙切割平臺結構。透過採用雙主軸結構及雙切割平臺結構,從而能夠提高切斷裝置的生產率。The cutting
在檢查/保管模塊C中,設有對將BGA用已密封基板1切斷而單片化的多個BGA封裝19進行吸附並予以搬送的搬送機構37(參照圖3(d))。搬送機構37能夠朝X方向及Z方向移動。在搬送機構37中,安裝有圖3(d)所示的保持構件35。搬送機構37使用保持構件35來將經單片化的多個BGA封裝19統一吸附至保持構件35並予以搬送。The inspection/storage module C is provided with a transport mechanism 37 (see FIG. 3(d)) that sucks and transports the plurality of BGA packages 19 that have been cut and singulated by the sealed
在檢查/保管模塊C中,設有用於對經單片化的多個BGA封裝19進行載置並檢查的檢查平臺62。在檢查平臺62上安裝有檢查用夾具63。檢查平臺62能夠以Y軸為軸而旋轉,能夠朝X方向及Z方向移動。透過搬送機構37,多個BGA封裝19被統一載置到檢查用夾具63上。多個BGA封裝19透過檢查用攝影機(camera)64,對圖5(a)所示的密封樹脂5的表面(圖5(a)中為下表面)及突起狀電極6側的面即另一個面2b分別進行檢查。In the inspection/storage module C, an
在檢查/保管模塊C中,設有用於暫時保管經檢查的多個BGA封裝19的保管平臺65。保管平臺65能夠朝Y方向移動。在保管平臺65中,安裝有實施方式2所示的BGA封裝用保持構件35。保管平臺65相當於保持機構。經檢查的BGA封裝19從檢查平臺62被統一移載至安裝於保管平臺65的保持構件35。由保管平臺65保管的BGA封裝19被區分為良品與不良品,透過移送機構(未圖示),良品被移送收納至良品用托盤66,不良品被移送收納至不良品用托盤67。In the inspection/storage module C, a
在供給模塊A中設有控制部CTL。控制部CTL控制切斷裝置57的動作、BGA用已密封基板1的搬送、BGA用已密封基板1的切斷、經單片化的BGA封裝19的搬送、BGA封裝19的檢查、BGA封裝19的收納等。本實施方式中,將控制部CTL設於供給模塊A中。但並不限於此,也可將控制部CTL設於其他模塊中。而且,也可將控制部CTL分割為多個部分,並將經分割的部分分別設於供給模塊A、切斷模塊B及檢查/保管模塊C中的至少兩個模塊中。A control unit CTL is provided in the supply module A. The control unit CTL controls the operation of the cutting
在製造圖6(a)及圖6(b)所示的LED封裝52的情況下,使用安裝有保持構件49的搬送機構37。在製造光學製品的情況下,例如,在製造微透鏡陣列(micro lens array)的情況下,保持構件所保持的保持對象品為微透鏡陣列。此時,準備與微透鏡陣列的尺寸形狀對應的保持構件。將所準備的保持構件安裝於搬送機構,使微透鏡陣列吸附於所述保持構件。隨後,使用搬送機構來搬送微透鏡陣列。In the case of manufacturing the
本實施方式中,保持構件35(參照圖3(d)、圖7)及保持構件49(參照圖5(a)及圖5(b)、圖6(a)及圖6(b))代表性地是在下個製程中使用。此製程是:將透過切斷而單片化的BGA封裝19及LED封裝52從切斷平臺搬送至檢查平臺。作為除此以外的製程,在將BGA封裝19及LED封裝52各自具有的凹凸中的凸部(突起狀電極6及密封樹脂55)朝向上方來吸附BGA封裝19及LED封裝52的製程中,使用保持構件35、保持構件49。In this embodiment, the holding member 35 (refer to FIGS. 3(d) and 7) and the holding member 49 (refer to FIGS. 5(a) and 5(b), 6(a) and 6(b)) represent Sexually, it is used in the next process. In this manufacturing process, the
(作用效果) 根據本實施方式,在切斷裝置57中,對搬送機構37及保管平臺65適用實施方式2所示的BGA封裝用保持構件35。一個BGA封裝19的多個突起狀電極6被收容到保持構件35上成形的多個凹部32中的一個凹部32內。因此,在多個BGA封裝19中,能夠將圖5(a)所示的突起狀電極6側的面即另一個面2b穩定地吸附至搬送機構37及保管平臺65。透過將此保持構件35適用於搬送機構37及保管平臺65,從而能夠抑制切斷裝置57的製造成本。(Function and Effect) According to the present embodiment, in the
在至此為止所說明的實施方式中,作為本發明的保持構件所保持的保持對象品,例示了BGA封裝19與LED封裝52進行了說明。但並不限於這些,可對被吸附的面具有凹凸的保持對象品適用本發明。第一,可列舉焊盤柵陣列(Land Grid Array,LGA)用已密封基板,所述LGA用已密封基板在被吸附的面上形成有包含銅箔的端子、與包含絕緣性樹脂的阻焊劑(solder resist)。由於端子的厚度與阻焊劑的厚度通常不同,因此在LGA用已密封基板中的被吸附的面上,形成有凹凸(換言之為階差)。第二,可列舉在被吸附的面上形成有透鏡的光學製品。作為凸部的示例,可列舉凸透鏡,作為凹部的示例,可列舉凹透鏡,作為凹凸的示例,可列舉菲涅耳透鏡(Fresnel lens)。光學製品包含微透鏡陣列。In the embodiment described so far, the
在至此為止所說明的實施方式中,當製造保持構件時,使用圖3(a)至圖3(c)所示的成形模具27及圖4(b)至圖4(d)所示的成形模具43。成形模具27具有附槽板25(參照圖3(a)至圖3(c))。成形模具43具有附槽板42(參照圖4(a)至圖4(d))。在製造附槽板25、附槽板42時,使用具有寬度(厚度)w2的圓板狀的旋轉刀22,在包含硬質樹脂板等的板狀構件21上形成槽。也可取代板狀構件21而對經單片化之前的中間製品使用旋轉刀22、旋轉刀40來形成槽部。作為經單片化之前的中間製品,第一,可列舉BGA用已密封基板1自身(參照圖1(a)及圖1(b))。第二,可列舉被單片化為LED封裝52(參照圖6(a)及圖6(b))之前的LED封裝用已密封基板自身(未圖示)。第三,可列舉製造微透鏡陣列等光學製品的過程中的、被單片化為微透鏡陣列等之前的中間製品即成形品。In the embodiment described so far, when manufacturing the holding member, the forming
也可對具有與所述已密封基板相同的尺寸形狀的代替品使用旋轉刀22、旋轉刀40來形成槽部。作為代替品,例如可列舉成為圖1(a)及圖1(b)所示的BGA用已密封基板1的代替品的成形品。為了製造此成形品,使用與BGA用已密封基板1所使用的基板2相同的基板,例如不安裝晶片4,而使具有與密封樹脂5相同的尺寸形狀的虛設(dummy)樹脂成形。使用旋轉刀22、旋轉刀40,對包含此虛設樹脂的成形品形成槽部,由此來製作取代附槽板25、附槽板42的附槽成形品。可使用附槽成形品來作為圖3(a)至圖3(c)所示的成形模具27及圖4(b)至圖4(d)所示的成形模具43的替代。It is also possible to use the
在至此為止所說明的實施方式中,使用旋轉刀22、旋轉刀40來形成槽部23、槽部41。在形成槽部23、槽部41的製程中,也可取代旋轉刀22、旋轉刀40而使用線鋸(wire saw)、帶鋸(band saw)等來進行加工。進而,在形成槽部23、槽部41的製程中,也可使用雷射加工、噴砂(blast)加工、水噴射(water Jet)加工等。在使用借助線鋸的加工、雷射加工、噴砂加工、水噴射加工時,能夠製造平面形狀中包含曲線或折線的製品。作為平面形狀中包含曲線或折線的製品的示例,可列舉記憶卡(memory card)。In the embodiment described so far, the
在至此為止所說明的實施方式中,將保持構件49用作吸附夾具。作為變形例,可將未形成貫穿孔48的構件即成形品45(參照圖4(d))用作托盤。換言之,成形品45可被用作不需要抽吸孔的保持構件。對圖4(d)所示的成形品45被用作托盤的形態進行說明。在圖4(d)所示的狀態(凹部46的開口朝上的狀態)下,使用成形品45。參照圖5(b)經上下反轉的狀態來進行說明。以在此狀態下,BGA封裝19所具有的外緣接觸至包圍凹部46的壁部47的端部50中的內側面的方式,將BGA封裝19收容至凹部46中。BGA封裝19所具有的突起狀電極6不會接觸到凹部46的內底面。由此,可防止汙物附著於突起狀電極6。因此,可穩定地進行突起狀電極6所參與的電連接。除此以外,可抑制搬送BGA封裝19時的晃動。In the embodiment described so far, the holding
作為另一變形例,參照圖6(b)經上下反轉的狀態來進行說明。此時,LED封裝52所具有的密封樹脂55不會接觸到凹部46的內底面。由此,可防止汙物附著於作為凸透鏡發揮功能的密封樹脂55。因此,不會產生LED封裝52的光學特性的下降。除此以外,可抑制搬送LED封裝52時的晃動。As another modified example, description will be made with reference to FIG. At this time, the sealing
作為又一變形例,可將圖3(c)所示的成形品31的變形例用作托盤。在圖3(a)所示的槽部23的中心,使用具有寬度(厚度)w4的槽形成用旋轉刀來形成淺的槽部。旋轉刀的寬度w4小於切斷用旋轉刀18的寬度w1(參照圖2(a))。透過圖3(a)至圖3(c)所示的製程,來製造代替圖3(c)所示的成形品31的成形品。此成形品具有在圖3(c)所示的壁33的上部的兩側角部所形成的階差。BGA封裝19、LED封裝52等保持對象品的外緣被置於此階差中的水平面上。此變形例中,也可獲得與至此為止所說明的兩個變形例同樣的效果。As another modification, the modification of the molded
在至此為止所說明的三個變形例中,也可在成形品31的變形例即成形品以及成形品45上形成抽吸孔。在這些情況下,保持構件35的變形例即保持構件以及保持構件49相當於具有吸附保持對象品的功能的托盤。In the three modified examples described so far, the suction holes may be formed in the molded product as a modified example of the molded
各實施方式中,作為製品的製造裝置的一個形態,對切斷裝置進行了說明。並不限於此,在製品的製造裝置中所使用的、搬送製品的搬送裝置、收納製品的收納裝置、檢查製品的檢查裝置等中,也能夠分別適用本發明的保持構件。In each embodiment, the cutting device has been described as one form of the product manufacturing device. The present invention is not limited to this, and the holding member of the present invention can also be applied to a conveying device for conveying a product, a storage device for storing a product, an inspection device for inspecting a product, etc. used in a product manufacturing device.
本發明並不限定於所述的各實施方式,在不脫離本發明主旨的範圍內,能夠根據需要來任意且適當地組合、變更或選擇採用。The present invention is not limited to the respective embodiments described above, and can be combined, changed, or selected arbitrarily and appropriately as needed within the scope not departing from the gist of the present invention.
1‧‧‧BGA用已密封基板(中間製品)2、53‧‧‧基板2a‧‧‧其中一個面2b、56‧‧‧另一個面(第1面)3‧‧‧區域4‧‧‧晶片5、55‧‧‧密封樹脂6‧‧‧突起狀電極7‧‧‧第1切斷線8‧‧‧第2切斷線9‧‧‧切斷平臺10‧‧‧切斷用夾具11‧‧‧金屬板12‧‧‧樹脂片材13‧‧‧切斷槽14、34、48‧‧‧貫穿孔15‧‧‧空間16、38‧‧‧配管17‧‧‧閥18、22、40‧‧‧旋轉刀19‧‧‧BGA封裝(製品、保持對象品、電子器件)20‧‧‧間隙21‧‧‧板狀構件(硬質板)23、41‧‧‧槽部24‧‧‧切斷線25、42‧‧‧附槽板26‧‧‧加強板27、43‧‧‧成形模具28‧‧‧箱狀構件29‧‧‧樹脂材料30‧‧‧硬化樹脂31、45‧‧‧成形品32、46‧‧‧凹部33、47‧‧‧壁部35、49‧‧‧保持構件36‧‧‧端面37‧‧‧搬送機構39、50‧‧‧端部44‧‧‧樹脂板(第1層)51‧‧‧前端52‧‧‧LED封裝(製品、保持對象品、電子器件)54‧‧‧LED晶片57‧‧‧切斷裝置58‧‧‧已密封基板供給部59‧‧‧移動機構60‧‧‧旋轉機構61‧‧‧主軸62‧‧‧檢查平臺63‧‧‧檢查用夾具64‧‧‧檢查用攝影機65‧‧‧保管平臺66‧‧‧良品用托盤67‧‧‧不良品用托盤a‧‧‧一邊的長度A‧‧‧供給模塊B‧‧‧切斷模塊C‧‧‧檢查/保管模塊CTL‧‧‧控制部L1、L2‧‧‧重合長度La、Lb‧‧‧距離VJ、VT‧‧‧進氣w1‧‧‧寬度(第2寬度)w2、w3‧‧‧寬度(第1寬度)θ、X、Y、Z‧‧‧方向1‧‧‧Sealed substrate (intermediate product) for BGA 2,53‧‧‧Substrate 2a‧‧One side 2b, 56‧‧‧The other side (the first side) 3‧‧‧Area 4‧‧‧ Wafer 5, 55‧‧‧Sealing resin 6‧‧‧Protruding electrode 7‧‧‧First cutting line 8‧‧‧Second cutting line 9‧‧‧Cut platform 10‧‧‧Cut jig 11 ‧‧‧Metal plate 12‧‧‧Resin sheet 13‧‧‧Cutting grooves 14, 34, 48‧‧‧ Through holes 15‧‧‧Space 16, 38‧‧‧Piping 17‧‧‧Valves 18, 22, 40‧‧‧Rotary knife 19‧‧‧BGA package (product, holding object, electronic device) 20‧‧‧Gap 21‧‧‧Plate member (hard board) 23,41‧‧‧Groove 24‧‧‧ Cutting line 25, 42‧‧‧with groove plate 26‧‧‧reinforcement plate 27,43‧‧‧forming mold 28‧‧‧box-shaped member 29‧‧‧resin material 30‧‧‧curing resin 31,45‧‧ ‧Molded product 32, 46‧‧‧Concavity 33,47‧‧‧Wall 35,49‧‧‧Retaining member 36‧‧‧End surface 37‧‧‧Transport mechanism 39,50‧‧‧End 44‧‧‧Resin Board (1st layer) 51‧‧‧Front end 52‧‧‧LED package (products, holding objects, electronic devices) 54‧‧‧LED chip 57‧‧‧cutting device 58‧‧‧Sealed substrate supply part 59 ‧‧‧Moving mechanism 60‧‧‧Rotating mechanism 61‧‧‧Spindle 62‧‧‧Inspection platform 63‧‧‧Inspection jig 64‧‧‧Inspection camera 65‧‧‧Storage platform 66‧‧‧Good product tray 67 ‧‧‧Tray for defective products a‧‧‧One side length A‧‧‧Supply module B‧‧‧Cutting module C‧‧‧Inspection/storage module CTL‧‧‧Control unit L1, L2‧‧‧Coincidence length La , Lb‧‧‧Distance VJ, VT‧‧‧Inlet w1‧‧‧Width (2nd width) w2, w3‧‧‧Width (1st width) θ, X, Y, Z‧‧‧ Direction
圖1(a)是從基板側觀察BGA用已密封基板的平面圖,圖1(b)是BGA用已密封基板的正面圖。 圖2(a)是表示由圖1(a)及圖1(b)所示的BGA用已密封基板製造BGA封裝的製程的概略剖面圖,圖2(b)及圖2(c)是表示製造BGA封裝用保持構件的製程的一部分的概略剖面圖。 圖3(a)至圖3(c)是表示製造BGA封裝用保持構件的製程中的緊跟著圖2(c)的部分的概略剖面圖,圖3(d)是表示使用所製造的BGA封裝用保持構件來吸附BGA封裝的製程的概略剖面圖。 圖4(a)至圖4(d)是表示用於製造BGA封裝用保持構件的另一製程的一部分的概略剖面圖。 圖5(a)及圖5(b)是表示使用所製造的另一BGA封裝用保持構件來吸附BGA封裝的製程的概略剖面圖。 圖6(a)及圖6(b)是表示使用所製造的發光二極體(Light Emitting Diode,LED)封裝用保持構件來吸附LED封裝的製程的概略剖面圖。 圖7是表示適用圖3(d)所示的BGA封裝用保持構件的切斷裝置的概略平面圖。Fig. 1(a) is a plan view of the sealed substrate for BGA viewed from the substrate side, and Fig. 1(b) is a front view of the sealed substrate for BGA. Figure 2 (a) is a schematic cross-sectional view showing the process of manufacturing a BGA package from the BGA sealed substrate shown in Figure 1 (a) and Figure 1 (b), and Figure 2 (b) and Figure 2 (c) are showing A schematic cross-sectional view of a part of the process of manufacturing the holding member for the BGA package. Figures 3(a) to 3(c) are schematic cross-sectional views of the part following Figure 2(c) in the process of manufacturing the holding member for the BGA package, and Figure 3(d) shows the use of the manufactured BGA A schematic cross-sectional view of the process of holding the package holding member to adsorb the BGA package. 4(a) to 4(d) are schematic cross-sectional views showing a part of another process for manufacturing the holding member for a BGA package. 5(a) and 5(b) are schematic cross-sectional views showing a process of sucking a BGA package using another holding member for a BGA package manufactured. 6(a) and 6(b) are schematic cross-sectional views showing a process of sucking the LED package using the manufactured light emitting diode (Light Emitting Diode, LED) package holding member. Fig. 7 is a schematic plan view showing a cutting device to which the holding member for a BGA package shown in Fig. 3(d) is applied.
4‧‧‧晶片 4‧‧‧Chip
5‧‧‧密封樹脂 5‧‧‧Sealing resin
9‧‧‧切斷平臺 9‧‧‧Cut off the platform
19‧‧‧BGA封裝(製品、保持對象品、電子器件) 19‧‧‧BGA package (products, holding objects, electronic devices)
20‧‧‧間隙 20‧‧‧Gap
30‧‧‧硬化樹脂 30‧‧‧hardened resin
32‧‧‧凹部 32‧‧‧Concave
33‧‧‧壁部 33‧‧‧Wall
34‧‧‧貫穿孔 34‧‧‧Through hole
35‧‧‧保持構件 35‧‧‧Retaining member
36‧‧‧端面 36‧‧‧End face
37‧‧‧搬送機構 37‧‧‧Transportation Organization
38‧‧‧配管 38‧‧‧Piping
39‧‧‧端部 39‧‧‧End
L1‧‧‧重合長度 L1‧‧‧Coincidence length
Lb‧‧‧距離 Lb‧‧‧Distance
VJ‧‧‧進氣 VJ‧‧‧Air intake
w1‧‧‧寬度(第2寬度) w1‧‧‧Width (2nd width)
w2‧‧‧寬度(第1寬度) w2‧‧‧Width (1st width)
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