JP5017766B2 - 高分子電解質材料、高分子電解質部品、膜電極複合体、および高分子電解質型燃料電池 - Google Patents
高分子電解質材料、高分子電解質部品、膜電極複合体、および高分子電解質型燃料電池 Download PDFInfo
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- JP5017766B2 JP5017766B2 JP2004121470A JP2004121470A JP5017766B2 JP 5017766 B2 JP5017766 B2 JP 5017766B2 JP 2004121470 A JP2004121470 A JP 2004121470A JP 2004121470 A JP2004121470 A JP 2004121470A JP 5017766 B2 JP5017766 B2 JP 5017766B2
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- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- HNEGQIOMVPPMNR-UHFFFAOYSA-N methylfumaric acid Natural products OC(=O)C(C)=CC(O)=O HNEGQIOMVPPMNR-UHFFFAOYSA-N 0.000 description 1
- 125000004372 methylthioethyl group Chemical group [H]C([H])([H])SC([H])([H])C([H])([H])* 0.000 description 1
- 125000004092 methylthiomethyl group Chemical group [H]C([H])([H])SC([H])([H])* 0.000 description 1
- 125000004373 methylthiopropyl group Chemical group [H]C([H])([H])SC([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000006082 mold release agent Substances 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- ZIUHHBKFKCYYJD-UHFFFAOYSA-N n,n'-methylenebisacrylamide Chemical compound C=CC(=O)NCNC(=O)C=C ZIUHHBKFKCYYJD-UHFFFAOYSA-N 0.000 description 1
- BUGISVZCMXHOHO-UHFFFAOYSA-N n-[1,3-dihydroxy-2-(hydroxymethyl)propan-2-yl]-2-[[1-[[1,3-dihydroxy-2-(hydroxymethyl)propan-2-yl]amino]-2-methyl-1-oxopropan-2-yl]diazenyl]-2-methylpropanamide Chemical compound OCC(CO)(CO)NC(=O)C(C)(C)N=NC(C)(C)C(=O)NC(CO)(CO)CO BUGISVZCMXHOHO-UHFFFAOYSA-N 0.000 description 1
- GKTNLYAAZKKMTQ-UHFFFAOYSA-N n-[bis(dimethylamino)phosphinimyl]-n-methylmethanamine Chemical group CN(C)P(=N)(N(C)C)N(C)C GKTNLYAAZKKMTQ-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- SEEYREPSKCQBBF-UHFFFAOYSA-N n-methylmaleimide Chemical compound CN1C(=O)C=CC1=O SEEYREPSKCQBBF-UHFFFAOYSA-N 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229910021382 natural graphite Inorganic materials 0.000 description 1
- 125000001971 neopentyl group Chemical group [H]C([*])([H])C(C([H])([H])[H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 235000010292 orthophenyl phenol Nutrition 0.000 description 1
- MPQXHAGKBWFSNV-UHFFFAOYSA-N oxidophosphanium Chemical class [PH3]=O MPQXHAGKBWFSNV-UHFFFAOYSA-N 0.000 description 1
- QUANRIQJNFHVEU-UHFFFAOYSA-N oxirane;propane-1,2,3-triol Chemical compound C1CO1.OCC(O)CO QUANRIQJNFHVEU-UHFFFAOYSA-N 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 125000002467 phosphate group Chemical group [H]OP(=O)(O[H])O[*] 0.000 description 1
- XYFCBTPGUUZFHI-UHFFFAOYSA-N phosphine group Chemical group P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 1
- 125000002743 phosphorus functional group Chemical group 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- JQCXWCOOWVGKMT-UHFFFAOYSA-N phthalic acid diheptyl ester Natural products CCCCCCCOC(=O)C1=CC=CC=C1C(=O)OCCCCCCC JQCXWCOOWVGKMT-UHFFFAOYSA-N 0.000 description 1
- 239000011295 pitch Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920003192 poly(bis maleimide) Polymers 0.000 description 1
- 229920001467 poly(styrenesulfonates) Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 229920001470 polyketone Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 235000015497 potassium bicarbonate Nutrition 0.000 description 1
- 229910000028 potassium bicarbonate Inorganic materials 0.000 description 1
- 239000011736 potassium bicarbonate Substances 0.000 description 1
- TYJJADVDDVDEDZ-UHFFFAOYSA-M potassium hydrogencarbonate Chemical compound [K+].OC([O-])=O TYJJADVDDVDEDZ-UHFFFAOYSA-M 0.000 description 1
- USHAGKDGDHPEEY-UHFFFAOYSA-L potassium persulfate Chemical compound [K+].[K+].[O-]S(=O)(=O)OOS([O-])(=O)=O USHAGKDGDHPEEY-UHFFFAOYSA-L 0.000 description 1
- FHCZSAVQSXETEK-UHFFFAOYSA-M potassium;2-ethenylbenzoate Chemical compound [K+].[O-]C(=O)C1=CC=CC=C1C=C FHCZSAVQSXETEK-UHFFFAOYSA-M 0.000 description 1
- HWDDJFFLFNQAFQ-UHFFFAOYSA-M potassium;4-ethenylbenzenesulfonate Chemical compound [K+].[O-]S(=O)(=O)C1=CC=C(C=C)C=C1 HWDDJFFLFNQAFQ-UHFFFAOYSA-M 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 239000002964 rayon Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 239000012312 sodium hydride Substances 0.000 description 1
- 229910000104 sodium hydride Inorganic materials 0.000 description 1
- XFTALRAZSCGSKN-UHFFFAOYSA-M sodium;4-ethenylbenzenesulfonate Chemical compound [Na+].[O-]S(=O)(=O)C1=CC=C(C=C)C=C1 XFTALRAZSCGSKN-UHFFFAOYSA-M 0.000 description 1
- 238000000807 solvent casting Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 125000005650 substituted phenylene group Chemical group 0.000 description 1
- 229940124530 sulfonamide Drugs 0.000 description 1
- 150000003456 sulfonamides Chemical class 0.000 description 1
- 125000001174 sulfone group Chemical group 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 150000003464 sulfur compounds Chemical class 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 150000003505 terpenes Chemical class 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- 239000006234 thermal black Substances 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- FIQMHBFVRAXMOP-UHFFFAOYSA-N triphenylphosphane oxide Chemical compound C=1C=CC=CC=1P(C=1C=CC=CC=1)(=O)C1=CC=CC=C1 FIQMHBFVRAXMOP-UHFFFAOYSA-N 0.000 description 1
- 238000001291 vacuum drying Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- PXXNTAGJWPJAGM-UHFFFAOYSA-N vertaline Natural products C1C2C=3C=C(OC)C(OC)=CC=3OC(C=C3)=CC=C3CCC(=O)OC1CC1N2CCCC1 PXXNTAGJWPJAGM-UHFFFAOYSA-N 0.000 description 1
- NLVXSWCKKBEXTG-UHFFFAOYSA-N vinylsulfonic acid Chemical compound OS(=O)(=O)C=C NLVXSWCKKBEXTG-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/50—Fuel cells
Landscapes
- Polyethers (AREA)
- Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
- Conductive Materials (AREA)
- Fuel Cell (AREA)
Description
また、非フッ素系の芳香族系高分子にアニオン性基を導入した高分子電解質膜は他にも種々提案されている(特許文献1,2、非特許文献1)。
[1] 含水状態において下記式(S1)で表される不凍水の分率Rw1、60〜100重量%であり、非架橋構造であり、イオン性基を有し、イオン性基がスルホン酸基であり、スルホン酸密度が1.6〜5.0mmol/gであり、下記一般式(V)で表されるポリマーを含む高分子電解質材料。
Rw1=[Wnf/(Wfc+Wnf)]×100 ……(S1)
Wnf:高分子電解質材料の乾燥重量1g当たりの不凍水量
Wfc:高分子電解質材料の乾燥重量1g当たりの低融点水量
[2] 含水状態において下記式(S2)で表される不凍水の分率Rw2が50〜100
重量%である上記[1]記載の高分子電解質材料。
Rw2=[Wnf/(Wnf+Wfc+Wf)]×100 ……(S2)
Wf :高分子電解質材料の乾燥重量1g当たりのバルク水量
[3] 含水状態においてWnfが0.05〜2である上記[1]または[2]記載の高分子電解質材料。
[4] Rw1が80重量%以上である上記[1]〜[3]のいずれか記載の高分子電解質材料。
[6] 30重量%メタノール水溶液に対する単位面積当たりのメタノール透過量が40μmol・min-1・cm-2以下であり、かつ、単位面積当たりのプロトン伝導度が4S・cm-2以上である上記[5]記載の高分子電解質材料。
[7] 30重量%メタノール水溶液に対する単位面積・単位厚み当たりのメタノール透過量が1000nmol・min-1・cm-1以下であり、かつ単位面積・単位厚み当たりのプロトン伝導度が10mS・cm-1以上である上記[5]記載の高分子電解質材料。
[8] 含水状態での全光線透過率が30%以上である上記[5]〜[7]のいずれか記載の高分子電解質材料。
[12] 芳香族リン系ポリマーが芳香族ポリエーテルホスフィンオキシドである、上記[11]記載の高分子電解質材料。
[13] 芳香族リン系ポリマーが芳香族ポリ(エーテルホスフィンオキシド/エーテルケトン)共重合体である、上記[12]記載の高分子電解質材料。
[14] Rw1が99.9重量%以下である上記[1]記載の高分子電解質材料。
[23] 前記一般式(IV−3)中において、R5〜R8のうち少なくとも2つがアルキル基である基を含む、上記[22]記載の高分子電解質材料。
[27] 上記[1]記載の高分子電解質材料を用いてなる高分子電解質部品。
[28] 上記[1]記載の高分子電解質材料を用いてなる膜電極複合体。
[29] 上記[1]記載の高分子電解質材料を用いてなる高分子電解質型燃料電池。
[31] 膜電極複合体に供給される燃料中の炭素数1〜6の有機化合物の含有量が20〜70重量%である上記[29]記載の高分子電解質型燃料電池。
バルク水:0℃以上で融点が観測される水、
低融点水:0℃未満、−30℃以上で融点が観測される水、および
不凍水:−30℃以上では融点が観測されない水、
に定義・分類し、これらの割合、特に、不凍水の割合を制御することによって高分子電解質材料の性能を大きく高めた。
すなわち本発明の高分子電解質材料は、含水状態において下記式(S1)で表される不凍水の分率Rw1が、60〜100重量%であり、非架橋構造であり、イオン性基を有し、イオン性基がスルホン酸基であり、スルホン酸密度が1.6〜5.0mmol/gであり、下記一般式(V)で表されるポリマーを含むことが重要である。
Rw1=[Wnf/(Wfc+Wnf)]×100 ……(S1)
Wnf:高分子電解質材料の乾燥重量1g当たりの不凍水量
Wfc:高分子電解質材料の乾燥重量1g当たりの低融点水量
Rw2=[Wnf/(Wnf+Wfc+Wf)]×100 ……(S2)
Wf :高分子電解質材料の乾燥重量1g当たりのバルク水量
また、本発明の高分子電解質材料は、含水状態においてWnfが0.05〜2であることが好ましい。
Wnf、WfcおよびWfで表される各数値は、示差走査熱量分析(DSC)法により求められる値である。
(一般式(A2)中、E1は芳香族環を有する2価の基を表し、E1の異なる基を2種以上含んでもよい。)
また、芳香族環Ar7およびAr8としては例えば、フェニレン、ナフチレン、アントラシレンおよびビフェニレンなどが挙げられる。
(式(C1)中、Gは、ハロゲンを表す。W、Ar5、Ar6は、それぞれ前述の基を表す。)
HO−E−OH (C2)
(式(C2)中、Eは前述の基を表す。)
また、多価フェノールについては、態様1におけるものと同様の思想を適用することができる。
本発明の高分子電解質材料(態様3)を構成する重合体としては、熱硬化性樹脂でもよいし結晶性または非晶性の熱可塑性樹脂でもよいし、また無機物や無機酸化物や有機無機複合体などが含まれていてもよいが、空隙を形成でき、また、空隙の内部にイオン性基が存在できるように構成されているものを用いる。
(式中、J1は水素、メチル基およびシアノ基から選ばれる置換基を表し、J2は水素、炭素数1〜20のアルキル基、アリール基およびこれらの誘導体から選ばれる置換基を表す。)
(式中、J4は水素、メチル基から選ばれる置換基を表し、J5は水素、水酸基、スルホン酸基、炭素数1〜20のアルキル基、およびフェニル基、シクロヘキシル基、シアノ基、アミド基、ハロゲン含有アルキル基およびこれらの誘導体から選ばれる置換基を表す。)
なお、真密度Dはユアサアイオニクス株式会社製 ポリマー密度測定装置“ULTRAPYCNOMETER 1000”にて求めることができる。
本発明の高分子電解質材料(態様3)にイオン性基を導入するにあたり、重合前の単量体があらかじめイオン性基を有していてもよいが、重合後にイオン性基を導入してもよい。原料の選択性の広さ、モノマー調整の容易性からは、重合後にイオン性基を導入するのが良い。
光開始剤としては、カルボニル化合物、過酸化物、アゾ化合物、硫黄化合物、ハロゲン化合物および金属塩などが挙げられる。
また、重合前に開孔剤を配合する場合は、重合温度よりもその沸点や分解温度が高い開孔剤が好ましい。
膜電極複合体(MEA)は、高分子電解質材料からなる膜、ならびに、電極触媒層および電極基材からなる電極からなる。
電極触媒層に含まれる電極触媒としては例えば、白金、パラジウム、ルテニウム、ロジウム、イリジウム、金などの貴金属触媒が好ましく用いられる。これらの内の1種類を単独で用いてもよいし、合金、混合物など、2種類以上を併用してもよい。
(1)スルホン酸基密度
精製、乾燥後のポリマーについて、元素分析により測定した。C、H、Nの分析は、全自動元素分析装置varioELで、また、Sの分析はフラスコ燃焼法・酢酸バリウム滴定、Pの分析についてはフラスコ燃焼法・リンバナドモリブデン酸比色法で実施した。それぞれのポリマーの組成比から単位グラムあたりのスルホン酸基密度(mmol/g)を算出した。
ポリマーの重量平均分子量をGPCにより測定した。紫外検出器と示差屈折計の一体型装置として東ソー製HLC−8022GPCを、またGPCカラムとして東ソー製TSK gel SuperHM−H(内径6.0mm、長さ15cm)2本を用い、N−メチル−2−ピロリドン溶媒(臭化リチウムを10mmol/L含有するN−メチル−2−ピロリドン溶媒にて、流量0.2mL/minで測定し、標準ポリスチレン換算により重量平均分子量を求めた。
高分子電解質材料を20℃の水に12時間浸漬した後、水中から取り出し、過剰な表面付着水をできるだけ素早くガーゼで拭き取って除去してから、あらかじめ重量Gpを測定してある密閉型試料容器に入れ、クリンプし、できるだけ素早く試料と密閉型試料容器の合計重量Gwを測定した後、直ちに示差走査熱量分析(DSC)にかけた。
DSC測定の機器および条件は下記のようにした。
データ処理装置:東レリサーチセンター製“TRC−THADAP−DSC”
測定温度範囲:−30〜5℃
走査速度:0.3℃/分
試料量:約5mg
試料パン:アルミナコートされたアルミニウム製密閉型試料容器
m=Gd−Gp
により求め、また、全水分量Wtは、
Wt=(Gw−Gd)/m
により求めた。
T0=0.0(℃)
ΔH0=79.7(cal/g)
=334(J/g)
なお、本測定は株式会社東レリサーチセンターに委託して行った。
接触式膜厚計にて測定した。
膜状の試料を25℃の純水に24時間浸漬した後、25℃、相対湿度50〜80%の雰囲気中に取り出し、できるだけ素早く定電位交流インピーダンス法でプロトン伝導度を測定した。
膜状の試料を25℃の純水に24時間浸漬した後、25℃、相対湿度50〜80%の雰囲気中に取り出し、できるだけ素早く定電位交流インピーダンス法でプロトン伝導度を測定した。
膜状の試料を25℃の純水に24時間浸漬した後、20℃において30重量%メタノール水溶液を用いて測定した。
30重量%メタノール水溶液のかわりに1Mメタノール水溶液を用いる他は、上記(7)のメタノール透過量Aと同様に行った。
日本電子製 電子線マイクロアナライザー(EPMA)JXA−8621MXにより下記条件にて膜断面方向の硫黄元素の分布として観察した。
加速電圧 15kV
元素分布分析(波長分散法)
加速電圧 15kV
照射電流 50nA
計測時間 30msec
画素数・画素長 256×256pixel・0.336μm/pixel
分析ビーム径 〜1μmφ
分析X線・分光結晶 SKα(5.373オングストローム)・PET
試料調製 ミクロトームにより断面試料作製後、カーボン蒸着。
膜電極複合体(MEA)をエレクトロケム社製セルにセットし、アノード側に30%メタノール水溶液、カソード側に空気を流してMEA評価を行った。評価はMEAに定電流を流し、その時の電圧を測定した。電流を順次増加させ電圧が10mV以下になるまで測定を行った。各測定点での電流と電圧の積が出力となるが、その最大値(MEAの単位面積あたり)を出力(mW/cm2)とした。
MEAでのMCOは、カソードからの排出ガスを捕集管でサンプリングした。これを全有機炭素計TOC-VCSH(島津製作所製測定器)、あるいはMeOH透過量測定装置Maicro GC CP-4900(ジ−エルサイエンス製ガスクロマトグラフ)を用い評価した。MCOは、サンプリングガス中のMeOHと二酸化炭素の合計を測定して算出した。
出力:最大出力密度(mW/cm2)
容積:燃料の容積(本実施例では10mLとして計算した。)
濃度:燃料のメタノール濃度(%)
MCO:MEAでのMCO(μmol・min-1・cm-2)
電流密度:最大出力密度が得られるときの電流密度(mA/cm2)
炭酸カリウム17g、 ヒドロキノン11g、 およびビス(4−フルオロフェニル)フェニルホスフィンオキシド31gを用いて、N−メチルピロリドン(NMP)中、160℃で重合を行った。
重合後、多量のメタノール水で再沈することで精製を行い、上記式(e1)にて示されるHQPEPOを定量的に得た。
室温、N2雰囲気下で、上記で得られた重合体(HQPEPO)5gをクロロホルムに溶解させた後、激しく撹拌しながらクロロスルホン酸8mLをゆっくり滴下し、30分反応させた。白色沈殿を濾別し、粉砕し、水で十分洗浄した後、乾燥し、目的のスルホン化HQPEPOを得た。
得られたスルホン化HQPEPOは、スルホン酸基密度2.1mmol/gであり、重量平均分子量20万であった。
上記のスルホン化ポリマーをN,N−ジメチルアセトアミドを溶媒とする溶液とし、当該溶液をガラス基板上に流延塗布し、100℃にて3時間乾燥して溶媒を除去した。得られた膜は、無色透明の柔軟な膜であった。
Rw1は68重量%、Wnfは0.58であった。
比較例1の“ナフィオン”117に比べ、プロトン伝導性はやや劣るものの、燃料遮断性には優れていた。
炭素繊維クロス基材に20%ポリテトラフルオロエチレン(PTFE)撥水処理を施し、その上にPTFEを20%含むカーボンブラック分散液を塗工し、焼成して電極基材を2枚作製した。
また、もう1枚の電極基材上に、Pt担持カーボンと“ナフィオン”溶液とからなるカソード電極触媒塗液を塗工し、乾燥して、カソード電極を作製した。
上記で得られた高分子固体電解質膜を、アノード電極とカソード電極とで夾持し、加熱プレスすることで膜電極複合体(MEA)を作製した。
得られた膜電極複合体(MEA)をエレクトロケム社製セルにセットし、アノード側に3%メタノール水溶液、カソード側に空気を流して高分子電解質型燃料電池とした。
比較例1の“ナフィオン”117を使用したMEAに対して、本実施例のMEAは出力で1.5倍、エネルギー容量で1.8倍の値を示した。
市販の“ナフィオン”117膜(デュポン社製(商品名))を用い、プロトン伝導度およびメタノール透過量を評価した。ナフィオン117膜は、100℃の5%過酸化水素水中にて30分、続いて100℃の5%希硫酸中にて30分浸漬した後、100℃の脱イオン水でよく洗浄した。
Rw1は49重量%、Rw2は44重量%、Wnfは0.18であった。
1260nmol・min-1・cm-1、メタノール透過量Bは113nmol・min-1・cm-1、プロトン伝導度Aは5.0S・cm-2、105mS・cm-1、プロトン伝導度Bは80mS・cm-1であった。
実施例1と同様にして得たスルホン化HQPEPOを用いて、次の手順で製膜を行った。
(製膜)
上記のスルホン化ポリマーを、飽和食塩水浸漬によりNa置換後、N,N−ジメチルアセトアミドを溶媒とする溶液とし、当該溶液をガラス基板上に流延塗布し、100℃にて4時間乾燥して溶媒を除去した。さらに、窒素ガス雰囲気下、200〜300℃まで1時間かけて昇温し、300℃で10分間加熱する条件で熱処理した後、放冷した。1N塩酸に3日間以上浸漬してプロトン置換した後に、大過剰量の純水に3日間以上浸漬して充分洗浄した。
膜は2種類の膜厚のものを得て、膜厚200μmのものについては、メタノール透過量Aは17μmol・min-1・cm-2、340nmol・min-1・cm-1、プロトン伝導度Aは5.0S・cm-2、100mS・cm-1であった。
比較例1の“ナフィオン”117に比べ、プロトン伝導性は同等で、燃料遮断性には優れていた。
また、Rw1は65重量%、Wnfは0.46であった。
“ナフィオン”117に比べ、プロトン伝導性、燃料遮断性の両方において優れていた。
スルホン化を省略し、また製膜における溶媒をN,N−ジメチルアセトアミドからクロロホルムにかえた以外は実施例3と同様にして、製膜までを行った。
Wnfは0であった。
0nmol・min-1・cm-1、プロトン伝導度Aは0S・cm-2、0mS・cm-1であった。
プロトン伝導性が全くなかった。
Rw1は63重量%、Wnfは0.50であった。
“ナフィオン”117に比べ、プロトン伝導性、燃料遮断性の両方において優れていた。
Rw1は63重量%、Wnfは0.48であった。
“ナフィオン”117に比べ、燃料遮断性に優れていた。
Rw1は65重量%、Wnfは0.45であった。
“ナフィオン”117に比べ、プロトン伝導性、燃料遮断性の両方において優れていた。
Rw1は64重量%、Wnfは0.47であった。
“ナフィオン”117に比べ、プロトン伝導性、燃料遮断性の両方において優れていた。
1,1−ビス(4−ヒドロキシフェニル)シクロヘキサン40mmol、 フェニルホスホン酸ジクロリド40mmol、 およびトリエチルアミン88mmolを用いて、1,2−ジクロロエタン中、氷冷下で重合を行った。
重合後、多量のメタノール水で再沈することで精製を行い、上記式(e8)にて示されるポリホスファートを定量的に得た。
得られたスルホン化物は、スルホン酸基密度2.3mmol/g、重量平均分子量8万であった。
Rw1は62重量%、Wnfは0.45であった。
プロトン伝導度Aは5.0S・cm-2、104mS・cm-1であった。
また膜厚110μmのものについては、メタノール透過量Bは100nmol・min-1・cm-1、プロトン伝導度Bは80mS・cm-1であった。
“ナフィオン”117に比べ、燃料遮断性において優れていた。
実施例3で得られたものと同様の高分子固体電解質膜に、エリアビーム型電子線照射装置(日新ハイボルテージ社製キュアトロンEBC300−60)を使って窒素雰囲気下、300kGyの線量を照射した。
“ナフィオン”117に比べ、燃料遮断性において特に顕著に優れていた。
ポリエーテルエーテルケトンとしてビクトレックス社製450PFを用い、Polymer, 28, 1009 (1987).に記載の方法でスルホン化ポリエーテルエーテルケトンを合成した。
得られたスルホン化物は、スルホン酸基密度2.5mmol/g、重量平均分子量18万であった。
Rw1は47重量%、Wnfは0.43であった。
この膜は水に激しく膨潤した。
“ナフィオン”117に比べ、プロトン伝導性は同等であるものの、燃料遮断性は劣っていた。
炭酸カリウム35g、 ヒドロキノン11g、 4,4'−(9H−フルオレン−9−イリデン)ビスフェノール35g、 および4,4'−ジフルオロベンゾフェノン44gを用いて、N−メチルピロリドン(NMP)中、160℃で重合を行った。
重合後、水洗し、多量のメタノールで再沈することで精製を行い、上記式(e9)で示されるFL50PEEKを定量的に得た。その重量平均分子量は11万であった。
室温、N2雰囲気下で、上記で得られた重合体(FL50PEEK)10gをクロロホルムに溶解させた後、激しく撹拌しながらクロロスルホン酸14mLをゆっくり滴下し、5分反応させた。白色沈殿を濾別し、粉砕し、水で十分洗浄した後、乾燥し、目的のスルホン化FL50PEEKを得た。
得られたスルホン化FL50PEEKは、スルホン酸基密度2.3mmol/gであった。
上記のスルホン化ポリマーを、飽和食塩水浸漬によりNa置換後、N,N−ジメチルアセトアミドを溶媒とする溶液とし、当該溶液をガラス基板上に流延塗布し、100℃にて4時間乾燥して溶媒を除去した。さらに、窒素ガス雰囲気下、200〜300℃まで1時間かけて昇温し、300℃で10分間加熱する条件で熱処理した後、放冷した。1N塩酸に3日間以上浸漬してプロトン置換した後に、大過剰量の純水に3日間以上浸漬して充分洗浄した。
得られた膜は、膜厚160μmであり、無色透明の柔軟な膜であった。
また、メタノール透過量Aは19μmol・min-1・cm-2、304nmol・min-1・cm-1、プロトン伝導度Aは6.0S・cm-2、96mS・cm-1、であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
炭素繊維クロス基材に20%ポリテトラフルオロエチレン(PTFE)懸濁液を用いて撥水処理を施し、焼成して電極基材を2枚作製した。
1枚の電極基材上に、Pt−Ru担持カーボンと“ナフィオン”溶液とからなるアノード電極触媒塗液を塗工し、乾燥して、アノード電極を作製した。
上記で得られた高分子電解質膜を、アノード電極とカソード電極とで夾持し、加熱プレスすることで膜電極複合体(MEA)を作製した。
得られたMEAをエレクトロケム社製セルに挟みアノード側に30重量%メタノール水溶液、カソード側に空気を流して高分子電解質型燃料電池とした。
実施例11の高分子電解質膜を使用したMEAの方が“ナフィオン”117膜を使用したMEA(比較例1)より出力(mW/cm2)で2.1倍、エネルギー容量(Wh)で3.1倍の値を示し、優れた特性を有していた。
実施例11と同様にして得たスルホン化FL50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して、製膜した。
得られた膜は、膜厚240μmであり、無色透明の柔軟な膜であった。
Rw1は68重量%、Rw2は53重量%、Wnfは0.56であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
得られた未スルホン化ポリマーは、重量平均分子量13万であった。
Rw1は71重量%、Rw2は64重量%、Wnfは0.52であった。
また、得られた膜は、膜厚150μmであり、淡褐色透明の柔軟な膜であった。
“ナフィオン”117に比べ、プロトン伝導性がやや大きく、燃料遮断性に優れて、また不凍水の分率が大きかった。
実施例13と同様にして得たスルホン化FL75PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚180μmであり、無色透明の柔軟な膜であった。
Rw1は63重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL25PEEKは、スルホン酸基密度2.5mmol/gであった。
Rw1は69重量%、Rw2は55重量%、Wnfは0.63であった。
また、メタノール透過量Aは35μmol・min-1・cm-2、630nmol・min-1・cm、プロトン伝導度Aは6.6S・cm-2、119mS・cm-1であった。
“ナフィオン”117に比べ、プロトン伝導性が大きく、燃料遮断性に優れ、また不凍水の分率が大きかった。
実施例15と同様にして得たスルホン化FL25PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚180μmであり、無色透明の柔軟な膜であった。
Rw1は61重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL100PEEKは、スルホン酸基密度2.5mmol/gであった。
次いで実施例11と同様にして製膜を試みたが、スルホン化FL100PEEKがN,N−ジメチルアセトアミドに溶解せず、以降の評価に堪える膜を作製することができなかった。
また、得られたスルホン化CF50PEEKは、スルホン酸基密度2.2mmol/gであった。
また、得られた膜は、膜厚180μmであり、淡褐色透明の柔軟な膜であった。
Rw1は97重量%、Rw2は75重量%、Wnfは0.37であった。
“ナフィオン”117に比べ、プロトン伝導性がやや大きく、燃料遮断性に優れて、また不凍水の分率が極めて大きかった。
実施例17と同様にして得たスルホン化CF50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚220μmであり、無色透明の柔軟な膜であった。
Rw1は73重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化TP50PEEKは、スルホン酸基密度2.2mmol/gであった。
Rw1は95重量%、Rw2は74重量%、Wnfは0.37であった。
また、メタノール透過量Aは22μmol・min-1・cm-2、440nmol・min-1・cm-1、プロトン伝導度Aは6.0S・cm-2、120mS・cm-1であった。
“ナフィオン”117に比べ、プロトン伝導性が大きく、燃料遮断性に優れて、また不凍水の分率が非常に大きかった。
実施例19と同様にして得たスルホン化TP50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚230μmであり、無色透明の柔軟な膜であった。
Rw1は68重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL50R50PEEKは、スルホン酸基密度1.9mmol/gであった。
Rw1は65重量%、Rw2は55重量%、Wnfは0.45であった。
また、得られた膜は、膜厚80μmであり、淡褐色透明の柔軟な膜であった。
“ナフィオン”117に比べ、プロトン伝導性はほぼ同等で、燃料遮断性に優れ、また不凍水の分率が大きかった。
実施例21で得たスルホン化FL50R50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚250μmであり、無色透明の柔軟な膜であった。
Rw1は60重量%であった。
“ナフィオン”117に比べ、燃料遮断性に優れ、また不凍水の分率が大きかった。
次にスルホン化反応時間を5分から3分にかえた以外は実施例11と同様にしてスルホン化、製膜、膜電極複合体の作製、高分子電解質型燃料電池の作製までを行った。
得られたスルホン化FL50BPA50PEEKは、スルホン酸基密度1.8mmol/gであった。
得られた膜は、膜厚210μmであり、淡褐色透明の柔軟な膜であった。
Rw1は62重量%、Rw2は54重量%、Wnfは0.48であった。
“ナフィオン”117膜(比較例1)に比べ燃料クロスオーバー抑制効果が大きく、不凍水の分率が大きかった。
実施例23と同様にして得たスルホン化FL50BPA50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚210μmであり、無色透明の柔軟な膜であった。
Rw1は61重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL50BF50PEEKは、スルホン酸基密度2.2mmol/gであった。
得られた膜は、膜厚180μmであり、淡褐色透明の柔軟な膜であった。
Rw1は84重量%、Rw2は68重量%、Wnfは0.40であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例25と同様にして得たスルホン化FL50BF50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚230μmであり、無色透明の柔軟な膜であった。
Rw1は65重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL50PH50PEEKは、スルホン酸基密度2.0mmol/gであった。
得られた膜は、膜厚210μmであり、淡褐色透明の柔軟な膜であった。
Rw1は80重量%、Rw2は66重量%、Wnfは0.40であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例27と同様にして得たスルホン化FL50PH50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚240μmであり、無色透明の柔軟な膜であった。
Rw1は66重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL50PHQ50PEEKは、スルホン酸基密度2.2mmol/gであった。
Rw1は86重量%、Rw2は66重量%、Wnfは0.40であった。
得られた膜は、膜厚170μmであり、淡褐色透明の柔軟な膜であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例29と同様にして得たスルホン化FL50PHQ50PEEKを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚200μmであり、無色透明の柔軟な膜であった。
Rw1は67重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
また、得られたスルホン化FL50PEPOは、スルホン酸基密度2.2mmol/gであった。
得られた膜は、膜厚170μmであり、淡褐色透明の柔軟な膜であった。
Rw1は85重量%、Rw2は65重量%、Wnfは0.48であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例33と同様にして得たスルホン化FL50PEPOを、N,N−ジメチルアセトアミド溶液としてガラス基板上に流延塗布し、100℃にて3時間乾燥し、溶媒を除去して製膜した。
得られた膜は、膜厚210μmであり、無色透明の柔軟な膜であった。
Rw1は61重量%であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が大きかった。
得られた未スルホン化ポリマーは、重量平均分子量15万であった。
得られた膜は、膜厚180μmであり、淡褐色透明の柔軟な膜であった。
Rw1は84重量%、Rw2は69重量%、Wnfは0.45であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例11と同様にして得たスルホン化FL50PEEKの膜に、架橋処理として、エリアビーム型電子線照射装置(日新ハイボルテージ社製キュアトロンEBC300−60)を使って窒素雰囲気下、300kGyの線量を照射した。
Rw1は86重量%、Rw2は68重量%、Wnfは0.42であった。
また、メタノール透過量Aは17μmol・min-1・cm-2、323nmol・min-1・cm-1、プロトン伝導度Aは4.5S・cm-2、86mS・cm-1であった。
“ナフィオン”117に比べ、燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
スルホン化を省略し、また製膜における溶媒をN,N−ジメチルアセトアミドからクロロホルムにかえた以外は実施例11と同様にして、製膜までを行った。
Rw1は0重量%であった。
膜厚は90μmであり、メタノール透過量Aは0μmol・min-1・cm-2、0nmol・min-1・cm-1、プロトン伝導度Aは0S・cm-2、0mS・cm-1であり、プロトン伝導性が全くなかった。
得られた膜は、膜厚101μmであり、無色透明の柔軟な膜であった。
Rw1は51重量%、Rw2は18重量%、Wnfは0.43であった。
“ナフィオン”117に比べ、燃料遮断性に劣り、また不凍水の分率が“ナフィオン”117とほぼ同等であった。
本比較例の高分子電解質膜は、30重量%メタノール水溶液に激しく膨潤したため、MEAの評価には至らなかった。
Rw1は98重量%、Rw2は80重量%、Wnfは0.34であった。
得られた膜の膜厚102μmであり、淡褐色透明の柔軟な膜であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
2,2−ビス(4−ヒドロキシフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン6.7gを4,4'−(9H−フルオレン−9−イリデン)ビス(2−メチルフェノール)7.6gにかえた以外は実施例37と同様にして、上記式(e25)で示されるポリマーを合成し、さらに製膜、膜電極複合体の作製、高分子電解質型燃料電池の作製までを行った。
得られた膜は、膜厚95μmであり、淡褐色透明の柔軟な膜であった。
Rw1は83重量%、Rw2は70重量%、Wnfは0.45であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
2,2−ビス(4−ヒドロキシフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン6.7gをハイドロキノン2.2gにかえた以外は実施例37と同様にして、上記式(e26)で示されるポリマーを合成し、さらに製膜、膜電極複合体の作製、高分子電解質型燃料電池の作製までを行った。
得られた膜は、膜厚95μmであり、淡褐色透明の柔軟な膜であった。
Rw1は86重量%、Rw2は67重量%、Wnfは0.43であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
得られた膜は膜厚95μmであり、淡褐色透明の柔軟な膜であった。
Rw1は98重量%、Rw2は92重量%、Wnfは0.29であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
得られた膜は膜厚95μmであり、淡褐色透明の柔軟な膜であった。
Rw1は91重量%、Rw2は80重量%、Wnfは0.55であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
得られた膜は膜厚95μmであり、淡褐色透明の柔軟な膜であった。
Rw1は88重量%、Rw2は82重量%、Wnfは0.50であった。
“ナフィオン”117に比べ、プロトン伝導性および燃料遮断性に優れ、また不凍水の分率が極めて大きかった。
実施例12と同様にして得たのスルホン化FL50PEEKの膜に、架橋処理として、エリアビーム型電子線照射装置(日新ハイボルテージ社製キュアトロンEBC300−60)を使って窒素雰囲気下、300kGyの線量を照射した。
得られた膜は、膜厚190μmであり、無色透明の柔軟な膜であった。
Rw1は68重量%であった。
“ナフィオン”117に比べ、燃料遮断性に優れ、また不凍水の分率が大きかった。
Claims (31)
- 含水状態において下記式(S1)で表される不凍水の分率Rw1が、60〜100重量%であり、非架橋構造であり、イオン性基を有し、イオン性基がスルホン酸基であり、スルホン酸基密度が1.6〜5.0mmol/gであり、下記一般式(V)で表されるポリマーを含む高分子電解質材料。
Rw1=[Wnf/(Wfc+Wnf)]×100 ……(S1)
Wnf: 高分子電解質材料の乾燥重量1g当たりの不凍水量
Wfc: 高分子電解質材料の乾燥重量1g当たりの低融点水量
- 含水状態において下記式(S2)で表される不凍水の分率Rw2が50〜100重量%である請求項1記載の高分子電解質材料。
Rw2=[Wnf/(Wnf+Wfc+Wf)]×100 ……(S2)
Wf: 高分子電解質材料の乾燥重量1g当たりのバルク水量 - 含水状態においてWnfが0.05〜2である請求項1記載の高分子電解質材料。
- Rw1が80重量%以上である請求項1記載の高分子電解質材料。
- 膜状の形態を有する請求項1記載の高分子電解質材料。
- 30重量%メタノール水溶液に対する単位面積当たりのメタノール透過量が40μmol・min-1・cm-2以下であり、かつ、単位面積当たりのプロトン伝導度が4S・cm-2以上である請求項5記載の高分子電解質材料。
- 30重量%メタノール水溶液に対する単位面積・単位厚み当たりのメタノール透過量が1000nmol・min-1・cm-1以下であり、かつ単位面積・単位厚み当たりのプロトン伝導度が10mS・cm-1以上である請求項5記載の高分子電解質材料。
- 含水状態での全光線透過率が30%以上である請求項5記載の高分子電解質材料。
- Rw1が90重量%以上である、請求項4記載の高分子電解質材料。
- 芳香族リン系ポリマーが主鎖に炭素−リン−炭素結合を有する、請求項10記載の高分子電解質材料。
- 芳香族リン系ポリマーが芳香族ポリエーテルホスフィンオキシドである、請求項11記載の高分子電解質材料。
- 芳香族リン系ポリマーが芳香族ポリ(エーテルホスフィンオキシド/エーテルケトン)共重合体である、請求項12記載の高分子電解質材料。
- Rw1が99.9重量%以下である請求項1記載の高分子電解質材料。
- 芳香族環を有する2価の基として下記一般式(III)で表される基を含む、請求項1記載の高分子電解質材料。
- 前記一般式(III)中において、Zは直接結合または−CQ1Q2−を表し、ここでQ1およびQ2は同一または異なり、水素原子、ハロ置換アルキル基またはアリール基を表し、Q1およびQ2のいずれかは水素原子、ハロ置換アルキル基から選ばれた少なくとも1種である、請求項16記載の高分子電解質材料。
- 前記一般式(IV−2)において、d〜gがd+e+f+g≧2を満たす、請求項19記載の高分子電解質材料。
- 前記一般式(IV−3)において、d〜gがd+e+f+g≧2を満たす基を含む、請求項21記載の高分子電解質材料。
- 前記一般式(IV−3)中において、R5〜R8のうち少なくとも2つがアルキル基である基を含む、請求項22記載の高分子電解質材料。
- 前記一般式(V)中において、Wが−CO−であり、かつ、Yが酸素である請求項1記載の高分子電解質材料。
- 前記一般式(VI)中において、Wが−CO−である、請求項25記載の高分子電解質材料。
- 請求項1記載の高分子電解質材料を用いてなる高分子電解質部品。
- 請求項1記載の高分子電解質材料を用いてなる膜電極複合体。
- 請求項1記載の高分子電解質材料を用いてなる高分子電解質型燃料電池。
- 炭素数1〜6の有機化合物およびこれと水との混合物から選ばれた少なくとも1種を燃料に用いる直接型燃料電池である請求項29記載の高分子電解質型燃料電池。
- 膜電極複合体に供給される燃料中の炭素数1〜6の有機化合物の含有量が20〜70重量%である請求項30記載の高分子電解質型燃料電池。
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EP1619735A4 (en) | 2003-03-06 | 2010-05-12 | Toray Industries | POLYMERIC ELECTROLYTE, POLYMERIC ELECTROLYTE ELEMENT, MEMBRANE ELECTRODE COMPOSITE, AND POLYMERIC ELECTROLYTE FUEL CELL |
KR101054145B1 (ko) | 2003-06-25 | 2011-08-03 | 도레이 카부시키가이샤 | 고분자 전해질, 그것을 사용한 고분자 전해질 막, 막 전극복합체 및 고분자 전해질형 연료 전지 |
US7504461B2 (en) * | 2004-03-12 | 2009-03-17 | Polyfuel, Inc. | Ion-conductive copolymers containing one or more ion-conducting oligomers |
JP4742664B2 (ja) * | 2004-05-07 | 2011-08-10 | 東レ株式会社 | イオン性基を有するポリマー、高分子電解質材料および高分子電解質型燃料電池 |
WO2006132207A1 (ja) * | 2005-06-09 | 2006-12-14 | Toyo Boseki Kabushiki Kaisha | スルホン酸基含有ポリマーおよびその製造方法、該スルホン酸基含有ポリマーを含有する樹脂組成物、高分子電解質膜、高分子電解質膜/電極接合体、燃料電池 |
JP5233065B2 (ja) * | 2005-09-26 | 2013-07-10 | 東レ株式会社 | イオン性基を有するポリマー、高分子電解質材料、高分子電解質部品、膜電極複合体および高分子電解質型燃料電池 |
JP2007173041A (ja) * | 2005-12-22 | 2007-07-05 | Toyota Motor Corp | 燃料電池および燃料電池用電解質層 |
JP5057691B2 (ja) * | 2006-04-25 | 2012-10-24 | Jsr株式会社 | 固体高分子型燃料電池用電極電解質、電極ペースト、電極および膜−電極接合体 |
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JP5070730B2 (ja) * | 2006-04-25 | 2012-11-14 | Jsr株式会社 | プロトン伝導膜 |
JP5319220B2 (ja) * | 2008-01-22 | 2013-10-16 | 東レ株式会社 | 高分子電解質成型体の製造方法、高分子電解質部品、膜電極複合体および高分子電解質型燃料電池 |
US8197955B2 (en) * | 2008-09-02 | 2012-06-12 | General Electric Company | Electrolyte membrane, methods of manufacture thereof and articles comprising the same |
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US20220227931A1 (en) * | 2019-06-18 | 2022-07-21 | Shpp Global Technologies B.V. | Methods for making sulfonated poly(phenylene ether) and articles made therefrom |
JP7142075B2 (ja) * | 2020-11-13 | 2022-09-26 | 株式会社リケン | Peek成形体、及びその製造方法 |
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