JP4609092B2 - Physical information acquisition method and physical information acquisition device - Google Patents

Description

  The present invention relates to a physical information acquisition method and a physical information acquisition device. More specifically, for example, a plurality of unit components that are sensitive to electromagnetic waves input from the outside such as light and radiation are arranged, and the physical quantity distribution converted into an electric signal by the unit components is converted into an electric signal. For example, a solid-state imaging device that can be read as a semiconductor device suitable for physical quantity distribution detection, and a driving method for driving a unit component and a moving device such as a driving device, an image signal processing method, and an image signal processing device The present invention relates to signal processing technology.

  2. Description of the Related Art Physical quantity distribution detection semiconductor devices in which a plurality of unit components (for example, pixels) that are sensitive to electromagnetic waves input from the outside such as light and radiation are arranged in a line or matrix form are used in various fields. ing.

  For example, in the field of video equipment, a CCD (Charge Coupled Device) type, a MOS (Metal Oxide Semiconductor) type, or a CMOS (Complementary Metal-oxide Semiconductor) type solid-state imaging device that detects light (an example of an electromagnetic wave) of a physical quantity. It is used. These read out, as an electrical signal, a physical quantity distribution converted into an electrical signal by a unit component (a pixel in a solid-state imaging device).

  Further, in some solid-state imaging devices, an amplifying solid-state imaging device (APS; Active Pixel Sensor) that has a driving transistor for amplification in a pixel signal generation unit that generates a pixel signal corresponding to the signal charge generated in the charge generation unit. There is an amplification type solid-state imaging device including a pixel having a configuration (also called a gain cell). For example, many CMOS solid-state imaging devices have such a configuration.

  In such an amplification type solid-state imaging device, in order to read out a pixel signal to the outside, address control is performed on a pixel unit in which a plurality of unit pixels are arranged, and signals from individual unit pixels are arbitrarily selected. I am trying to read it out. That is, the amplification type solid-state imaging device is an example of an address control type solid-state imaging device.

  For example, an amplification type solid-state imaging device which is a kind of XY address type solid-state imaging device in which unit pixels are arranged in a matrix form an active element (MOS transistor) such as a MOS structure in order to give the pixel itself an amplification function. ) To form a pixel. That is, signal charges (photoelectrons) accumulated in a photodiode which is a photoelectric conversion element are amplified by the active element and read out as image information.

  In this type of XY address type solid-state imaging device, for example, a plurality of pixel transistors are arranged in a two-dimensional matrix to form a pixel unit, and a signal charge corresponding to incident light for each line (row) or each pixel. Accumulation is started, and a current or voltage signal based on the accumulated signal charge is sequentially read out from each pixel by addressing. Here, in the MOS (including CMOS) type, as an example of address control, a system in which one row is accessed simultaneously and a pixel signal is read from the pixel unit in units of rows is often used.

  On the other hand, various arithmetic processes are performed on the pixel signals output from the pixels in order to generate high-quality images and use special applications. For example, in recent years, a solid-state imaging device has been proposed in which an image sensor is provided with various image information calculation functions to achieve high-speed image processing. As one of such image sensors, a sensor having a normal real image acquisition and a moving object detection function has been proposed (see, for example, Patent Documents 1 and 2).

  Each of these conventional techniques has a function of detecting temporal change in light intensity in addition to an image acquisition circuit similar to that of a normal image sensor. Moving object detection is performed based on the difference in pixel signals at the time (imaging timing).

JP 2003-162723 A Japanese Patent Laid-Open No. 08-294057

  For example, in the mechanism described in Patent Document 1, in order to determine whether or not a moving object is included in an image captured by an imaging device, first, different imaging regions are sequentially captured multiple times during an imaging period. The entire image is separated into a plurality of partial images corresponding to each of a plurality of times of imaging. After this, if the subject is only a stationary object, all the partial images will have substantially the same data, but if the subject includes moving objects in addition to the stationary object, differences will occur in the partial images with different imaging timings. Based on the comparison of the partial images, it is determined whether or not a moving object is included in the entire image obtained by synthesizing the plurality of partial images. It is determined whether or not it is a moving object by signal processing between partial images in a plurality of images detected by so-called pixel shift.

  Further, in the mechanism described in Patent Document 2, a signal charge storage element such as a plurality of storage capacitors for storing the signal charge of the electric signal from the photoelectric conversion element unit for each photoelectric conversion element unit of the plurality of pixels. And storing signal charges from the photoelectric conversion element read out in different frame control periods in each of the signal charge storage element parts, and this signal charge and a signal in the frame control period currently being read out By detecting the difference from the electric charge, an image of a moving body or the like is detected in real time. In short, it is determined whether or not it is a moving object by performing a difference calculation on a plurality of frames.

  However, the mechanism described in Patent Document 1 requires a special imaging device for obtaining image data in which imaging areas for a plurality of times are shifted.

  Further, in the mechanism described in Patent Document 2, in order to acquire information of different imaging timings, a signal charge storage element unit such as a plurality of storage capacitors for storing the signal charge of the electric signal from the photoelectric conversion element unit is provided. A special pixel structure is required.

  Further, the conventional moving body signal processing mechanisms including the above-mentioned Patent Documents 1 and 2 were obtained by many times of imaging in order to specify the movement state including the moving speed of the moving object. A large number of frame images are required, and complicated calculation processing is required between the large number of frame images, so that the state of the moving object cannot be determined in a short time.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to propose a mechanism that can specify the state of movement of a moving object in a short time without using a special pixel structure or imaging device. To do.

According to the present invention, the plurality of unit pixels that generate electrical signals according to the amount of incident light are two-dimensionally arranged at the intersections of the plurality of vertical control lines and the plurality of vertical signal lines. The imaging unit has a function of independently controlling a plurality of rows in a vertical scanning direction by dividing them into a plurality of systems, and is configured to be able to scan in a direction opposite to the vertical signal line for each row in one frame. The vertical scanning unit that scans the corresponding vertical control line according to the vertical address, the horizontal address setting unit that defines the address in the horizontal direction, and the plurality of the plurality according to the read address defined by the horizontal address setting unit A horizontal scanning unit having a horizontal driving unit for guiding the signals of the plurality of unit pixels extracted from the vertical signal line to a horizontal signal line for extracting an imaging signal; and a frame connected to the horizontal signal line. Memory,
The vertical scanning unit, the scanning in the opposite direction to the vertical signal line for each row in one frame, the detection signals of a plurality of unit pixels of the detection signal and the even lines of the plurality of unit pixels in the odd rows and the reads out alternately, be stored before Symbol frame memory,
A solid-state imaging device is provided.

Preferably, the solid-state imaging device further includes a signal processing unit connected to the frame memory, and the signal processing unit includes a unit pixel from the frame memory so that the scanning order of the even-numbered rows is reversed. Adjust signal readout .

Preferably, the solid-state imaging device further includes an electronic shutter, and the electronic shutter is driven to detect the plurality of unit pixels with a sufficiently short exposure time, and is stored in the frame memory via the horizontal signal line. Let
The signal processing means detects the movement of the subject from the detection signal of the odd-numbered unit pixels and the detection signal of the even-numbered unit pixels in one frame stored in the frame memory.

According to the present invention, it is arranged two-dimensionally a plurality of unit pixels for generating an electrical signal corresponding to the amount of incident light is at each intersection of the vertical control lines and multiple vertical signal lines of multiple that the imaging section has a function of controlling independently divided into a plurality of systems multiple lines in the vertical scanning direction, the scanning can be configured in the opposite direction to the vertical signal line for each row in one frame wherein the vertical scanning unit, in accordance with the read address defined by the horizontal address setting unit and those horizontal address setting unit that defines a horizontal address for scanning the vertical control line corresponding in response to has been our Rishide straight address a horizontal scanning unit that have a an electrically rather horizontal driving unit to the horizontal signal line a signal of the plurality of unit pixels taken from a plurality of vertical signal lines taken out imaging signal, which is connected to the horizontal signal line Yes and a frame memory A control method for a solid-state imaging device,
The vertical scanning unit, the scanning in the opposite direction to the vertical signal line for each row in one frame, the detection signals of a plurality of unit pixels of the detection signal and the even lines of the plurality of unit pixels in the odd rows and the reads out alternately, be stored before Symbol frame memory,
A method for controlling a solid-state imaging device is provided.

  According to the present invention, the physical information for the detection area represented by the information with different scanning directions is acquired by scanning the substantially entire surface of the detection area in order from different directions with respect to the arrangement order of the plurality of detection units. As a result, it is possible to specify the state of movement including the moving speed of the object moving in the detection area only by the information for one detection area represented by the different information in the scanning direction. In addition, it is possible to perform simple arithmetic processing within the one frame image, and the state of the moving object can be determined in a short time.

  In addition, the mechanism for this can be realized by a simple process of alternately scanning from different scanning directions. As in the mechanism described in Patent Document 1, a special method for obtaining image data in which the imaging areas are shifted a plurality of times is provided. A simple imaging device is not necessary.

  Further, like the mechanism described in Patent Document 2, a special pixel structure provided with a signal charge storage element unit such as a plurality of storage capacitors for storing the signal charge of the electric signal from the photoelectric conversion element unit is also required. Become.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the following, a case where a CMOS image sensor, which is an example of an XY address type solid-state imaging device, is used as a device will be described as an example.

  However, this is merely an example, and the target device is not limited to a MOS imaging device. A unit configuration including a detection unit that is sensitive to a physical quantity input from the outside, such as light or radiation, and a unit signal generation unit that generates and outputs a unit signal based on a change in the physical quantity detected by the detection unit The embodiment described later can be similarly applied to all of the semiconductor device for detecting a physical quantity distribution in which a plurality of elements are arranged in a line or a matrix so that the reading position can be arbitrarily controlled by address control. .

<Schematic configuration of imaging device>
FIG. 1 is a schematic configuration diagram of a CMOS solid-state imaging device which is an embodiment of a physical information acquisition device according to the present invention. The solid-state imaging device 1 is applied as, for example, an electronic still camera or an FA (Factory Automation) camera that can capture a color image. The solid-state imaging device 1 is an example of a physical quantity distribution detection device.

  The solid-state imaging device 1 has an image pickup in which unit pixels including light receiving elements as detection units that output signals corresponding to the amount of incident light are arranged in a square lattice of rows and columns (that is, a two-dimensional matrix). A column-type signal output from each unit pixel is a voltage signal, and a CDS (Correlated Double Sampling) processing function section and other function sections are provided for each vertical column It is.

  That is, as shown in FIG. 1A, the solid-state imaging device 1 includes an imaging unit (pixels) in which a plurality of unit pixels 3 (an example of unit constituent elements) are arranged in rows and columns (in a two-dimensional matrix). Section) 10 a column processing section 20 having a so-called area sensor section, a drive control section 7 provided outside the imaging section 10, and a column signal processing section (referred to as a column circuit in the figure) 22 arranged in each vertical column. And a horizontal selection switch section 60. The external circuit 100 is provided on a circuit board different from the semiconductor region in which the imaging unit 10 is provided.

  The read current source unit 27 is provided on a signal path (vertical signal line 18) between the imaging unit 10 and the column processing unit 20, and a drain terminal is connected to each vertical signal line 18. A load transistor unit including a load MOS transistor to be omitted is arranged, and a load control unit (load MOS controller) for driving and controlling each load MOS transistor is provided.

  As the drive control unit 7, for example, a horizontal scanning unit 12 and a vertical scanning unit 14 are provided. Further, as another component of the drive control unit 7, a drive signal scan that supplies a control pulse at a predetermined timing to each functional unit of the solid-state imaging device 1 such as the horizontal scanning unit 12, the vertical scanning unit 14, or the column processing unit 20. A unit (an example of a read address control device) 16 is provided.

  Each element of the drive control unit 7 is integrally formed in a semiconductor region such as single crystal silicon together with the imaging unit 10 using a technique similar to the semiconductor integrated circuit manufacturing technique, and is a solid-state imaging that is an example of a semiconductor system. It is configured as an element (imaging device).

  In FIG. 1A, some of the rows and columns are omitted for the sake of simplicity, but in reality, there are tens to thousands of unit pixels 3 in each row and each column of the imaging unit 10. Be placed. Although not shown, the imaging unit 10 is formed with a color separation filter and an on-chip lens having a predetermined color coding for each pixel. Although not shown, each unit pixel 3 of the imaging unit 10 is configured by a photoelectric conversion element such as a photodiode or a photogate and a transistor circuit (see FIG. 2 described later).

  The unit pixel 3 is output from the unit pixel 3 after being amplified by the vertical scanning unit 14 via the vertical control line 15 for selecting a vertical column and the unit signal generation unit having an amplification element detected by the detection unit. The column processing unit 20 is connected to each other through a vertical signal line 18 as a transmission line for transmitting a plurality of pixel signals S0 (_1 to h; pixel numbers in one row).

  The horizontal scanning unit 12 and the vertical scanning unit 14 start a reading position selection operation (typically a shift operation) in response to a driving pulse given from the driving signal scanning unit 16. The vertical control line 15 includes various pulse signals for driving the unit pixel 3.

  The horizontal scanning unit 12 defines a horizontal readout column (horizontal address) (selects each column signal processing unit 22 in the column processing unit 20), a horizontal address setting unit 12x, and a horizontal address setting unit 12x. The horizontal drive unit 12y guides each signal of the column processing unit 20 to the horizontal signal line 86 in accordance with the read address defined in FIG.

  Although not shown, the horizontal address setting unit 12x includes a shift register or a decoder, selects pixel information from the column signal processing unit 22 in a predetermined order, and selects the selected pixel information as a horizontal signal. It functions as a selection means for outputting to the line 86.

  The vertical scanning unit 14 defines a vertical readout row (vertical address) (selects a row of the imaging unit 10), and a readout row defined by the vertical address setup unit 14x. And a vertical drive unit 14y for driving the unit pixel 3 by supplying a pulse to the row control line 15 for the unit pixel 3.

  Although not shown in the drawing, the vertical address setting unit 14x has a shutter shift register for controlling the row for the electronic shutter in addition to the vertical shift register or the decoder for performing the basic control of the row from which the signal is read.

  The vertical shift register is for selecting each unit pixel 3 in units of rows when reading pixel information from the imaging unit 10, and constitutes a signal output row selection means together with the vertical drive unit 14y of each row. The shutter shift register is for selecting each pixel in units of row when performing the electronic shutter operation, and constitutes an electronic shutter row selection means together with the vertical drive unit 14y of each row.

  Here, as a configuration unique to the present embodiment, at least one of the horizontal scanning unit 12 (particularly the horizontal address setting unit 12x) and the vertical scanning unit 14 (particularly the vertical address setting unit 14x) has a plurality of scanning directions (typically As an example, it has a function of controlling separately in two systems), and signals of different scanning systems are obtained in one frame.

  For example, although the details will be described later, the vertical scanning unit 14 has a function of independently controlling a plurality of rows of the imaging unit 10 by dividing them into a plurality of systems in the vertical scanning direction, and scanning systems in different directions in one frame. To get the signal. Specifically, although details will be described later, as a typical example, it is divided into two systems of scanning from top to bottom and scanning from bottom to top, and the directions opposite to each other with respect to the vertical signal line 18 for each row. Scan to.

  Although not shown in the figure, the drive signal scanning unit 16 includes a functional block of a timing generator TG (an example of a read address control device) that supplies a clock necessary for the operation of each unit and a pulse signal of a predetermined timing, and a terminal 1a. A communication interface functional block that receives data instructing an input clock CLK0, an operation mode, and the like and outputs data DATA including information of the solid-state imaging device 1 via a terminal 1b. Also, the horizontal address signal is output to the horizontal address setting unit 12x and the vertical address signal is output to the vertical address setting unit 14x, and each address setting unit 12x, 14x receives it and selects a corresponding row or column.

  The drive signal scanning unit 16 may be provided as a separate semiconductor integrated circuit independently of other functional elements such as the imaging unit 10 and the horizontal scanning unit 12. In this case, an imaging device which is an example of a semiconductor system is constructed by the imaging device including the imaging unit 10 and the horizontal scanning unit 12 and the drive signal scanning unit 16. This imaging device may be provided as an imaging module in which peripheral signal processing circuits, power supply circuits, and the like are also incorporated.

  The column processing unit 20 is configured to include a column signal processing unit 22 for each vertical column (column), and each column signal processing unit 22 receives a pixel signal for one row, and each column signal processing unit 22 outputs a pixel signal of the corresponding column. S0 (_1 to h; pixel number in one row) is processed to output a processed pixel signal S1 (_1 to h; pixel number in one row).

  For example, although not shown, the column signal processing unit 22 has a storage unit having a storage capacity, and is based on a pixel signal (unit signal) S0 read from the unit pixel 3 via the vertical signal line 18. A signal holding function of a line memory structure for storing a potential signal Vm representing physical information for a predetermined purpose can be provided. Similarly, it may have a storage capacity and be provided with a function of a noise removing means using a CDS (Correlated Double Sampling) process.

  When performing the CDS process, the pixel information for the voltage mode pixel information input through the vertical signal line 18 based on two sample pulses such as the sample pulse SHP and the sample pulse SHD given from the drive signal scanning unit 16 is obtained. By taking the difference between the signal level immediately after reset (noise level: 0 level) and the true signal level, fixed pattern noise (FPN) due to fixed variation for each pixel and noise called reset noise Remove signal components.

  The column signal processing unit 22 may be provided with an AGC (Auto Gain Control) circuit having a signal amplification function, other processing function circuits, or the like as required after the CDS processing function unit.

  At the subsequent stage of the column processing unit 20, a horizontal selection switch unit 60 including a horizontal reading switch (selection switch) (not shown) is provided. The output terminal of the column signal processing unit 22 in each vertical column is connected to the input terminal i of the selection switch of the horizontal selection switch unit 60 corresponding to each vertical column for sequentially reading the pixel signal S2 from the column signal processing unit 22. ing.

  The control gate terminal c of each vertical column of the horizontal selection switch unit 60 is connected to the horizontal drive unit 12y of the horizontal scanning unit 12 that controls and drives the readout address in the horizontal direction. On the other hand, a horizontal signal line 86 for sequentially transferring and outputting pixel signals in the row direction is commonly connected to the output terminals o of the selection switches in the vertical columns of the horizontal selection switch unit 60. An output unit 88 is provided at the rear end of the horizontal signal line 86.

  The horizontal signal line 86 transmits individual pixel signals S0 (specifically, pixel signals S2 based thereon) transmitted from the unit pixels 3 via the vertical signal lines 18 in the horizontal direction that is the arrangement direction of the vertical signal lines 18. It functions as a readout line for outputting in a predetermined order. From the column signal processing unit 22, a signal selected by a selection switch that is omitted for each vertical column is taken out and passed to the output unit 88.

  That is, the voltage signal of each vertical column corresponding to the signal charge representing the pixel information processed by the column signal processing unit 22 is generated by the horizontal read pulses φg1 to φgh corresponding to the horizontal selection signals φH1 to φHh from the horizontal scanning unit 12. A selection switch provided for each vertical column to be driven is selected at a predetermined timing and read out to the horizontal signal line 86. Then, the signal is input to the output unit 88 provided at the rear end of the horizontal signal line 86.

  The output unit 88 amplifies the pixel signals S2_1 to h (h = n) of each unit pixel 3 output from the imaging unit 10 through the horizontal signal line 86 with an appropriate gain, and then outputs the amplified signal to the external circuit 100 as the imaging signal S3. It is supplied via a terminal 88a. For example, the output unit 88 may only perform buffering, or may perform black level adjustment, column variation correction, color-related processing, or the like before that.

  That is, in the column-type solid-state imaging device 1 of the present embodiment, the output signal (voltage signal) from the unit pixel 3 is the vertical signal line 18 → the column processing unit 20 (column signal processing unit 22) → the horizontal signal line 86. → Transmitted in the order of the output unit 88. The drive is such that the pixel output signals for one row are sent in parallel to the column processing unit 20 via the vertical signal line 18, and the processed signals are serially output via the horizontal signal line 86. The transfer operation of the pixel signal to the column processing unit 20 is simultaneously performed on the unit pixels 3 for one row.

  In addition, as long as driving in each vertical row or horizontal row is possible, each pulse signal is supplied to the unit pixel 3 from either the horizontal direction or the vertical row direction, that is, driving for applying the pulse signal. The physical wiring method of the clock line is free.

  In the solid-state imaging device 1 having such a configuration, the horizontal scanning unit 12 and the vertical scanning unit 14 and the drive signal scanning unit 16 that controls them are sequentially selected for each pixel of the imaging unit 10 in a horizontal parallel unit. A CMOS image sensor of a type that simultaneously reads out information of one horizontal parallel pixel is configured.

  The external circuit 100 provided in the subsequent stage of the output unit 88 is on a substrate (printed substrate or semiconductor substrate) different from the solid-state imaging device in which the imaging unit 10 and the drive control unit 7 are integrally formed in the same semiconductor region. The circuit configuration corresponding to each photographing mode is adopted.

  A solid-state imaging device 1 is configured by a solid-state imaging device (an example of a semiconductor device or a physical information acquisition device according to the present invention) including an imaging unit 10 and a drive control unit 7 and an external circuit 100. The drive control unit 7 is separated from the imaging unit 10 and the column processing unit 20, and the imaging unit 10 and the column processing unit 20 constitute a solid-state imaging device (an example of a semiconductor device). You may comprise with the control part 7 as an imaging device (an example of the physical information acquisition apparatus which concerns on this invention).

  For example, as shown in FIG. 1B, the external circuit 100 includes an A / D (Analog to Digital) conversion unit 110 that converts an analog imaging signal S3 output from the output unit 88 into digital imaging data D3, A digital signal processor (DSP) 130 that performs digital signal processing based on the imaging data D3 digitized by the A / D converter 110.

  The digital signal processing unit 130 has a function of a digital amplifier unit that appropriately amplifies and outputs a digital signal output from the A / D conversion unit 110, for example. Further, for example, color separation processing is performed to generate image data RGB representing each image of R (red), G (green), and B (blue), and other signal processing is performed on the image data RGB for monitoring. Output image data D4 is generated. In addition, the digital signal processing unit 130 includes a functional unit that performs signal compression processing for storing imaging data in a recording medium.

  The external circuit 100 also includes a D / A (Digital to Analog) converter 136 that converts the image data D4 digitally processed by the digital signal processor 130 into an analog image signal S4. The image signal S4 output from the D / A converter 136 is sent to a display device such as a liquid crystal monitor (not shown). The scanner can perform various types of scanning such as switching the imaging mode while viewing the menu and images displayed on the display device.

  Here, as a configuration unique to the present embodiment, the digital signal processing unit 130 of the external circuit 100 includes at least the horizontal scanning unit 12 (particularly the horizontal address setting unit 12x) and the vertical scanning unit 14 (particularly the vertical address setting unit 14x). Based on each pixel signal S0 (specifically, pixel signal S2 from the column signal processing unit 22) output from each unit pixel 3 of the imaging unit 10 by the scanning control divided into a plurality of systems, the moving object detection processing and the detection result A mobile signal processing unit 132 is provided for performing predetermined signal processing based thereon.

  For example, the signals scanned in the directions opposite to each other with respect to the vertical signal line 18 are output from the imaging unit 10 in units of rows and supplied to the mobile signal processing unit 132 for each row. The unit 132 sets the scanning order of one of the image information in the two vertical directions of the image information obtained from the imaging unit 10 in order to reproduce the original image with the image information being the same as the arrangement of the rows in the vertical direction. Invert. For the process of reversing the scanning order, the moving body signal processing unit 132 is provided with a frame memory 133 that stores pixel signals for one frame.

  Although an example in which the external circuit in charge of signal processing in the subsequent stage of the solid-state image sensor is performed outside the solid-state image sensor (imaging chip) is shown here, all or part of the external circuit (for example, an A / D converter or digital The functional element of the amplifier unit or the like may be built in the chip of the solid-state imaging device. In other words, an external circuit is configured on the same semiconductor substrate as the solid-state image pickup element in which the image pickup unit 10 and the drive control unit 7 are integrally formed in the same semiconductor region, and is substantially the same as the solid-state image pickup device 1 physically. The information acquisition apparatus may be the same.

  Further, in the figure, the solid-state imaging device 1 is configured by including the horizontal selection switch unit 60 and the drive control unit 7 together with the imaging unit 10, and the solid-state imaging device 1 substantially functions as a physical information acquisition device. However, the physical information acquisition apparatus is not necessarily limited to such a configuration. It is not a requirement that the entire horizontal selection switch unit 60 and the drive control unit 7 or one functional part be integrally formed in the same semiconductor region as the imaging unit 10. The horizontal selection switch unit 60 and the drive control unit 7 are formed on a circuit board different from the imaging unit 10 (which means not only another semiconductor substrate but also a general circuit board), for example, a circuit board on which an external circuit is provided. May be.

<Pixel structure>
FIG. 2 is a diagram illustrating a configuration example of the unit pixel 3 used in the solid-state imaging device 1 illustrated in FIG. The configuration of the unit pixel (pixel cell) 3 in the imaging unit 10 is the same as that of a normal CMOS image sensor. In this embodiment, a general-purpose 4TR configuration can be used as the CMOS sensor. For example, as described in Japanese Patent No. 2708455, a 3TR configuration including three transistors can be used. Of course, these pixel configurations are merely examples, and any CMOS image sensor array configuration can be used.

  As the intra-pixel amplifier, for example, a floating diffusion amplifier configuration is used. As an example, with respect to the charge generation unit, a read selection transistor that is an example of a charge readout unit (transfer gate unit / read gate unit), a reset transistor that is an example of a reset gate unit, a vertical selection transistor, and a floating diffusion It is possible to use a configuration having an amplification transistor having a source follower configuration, which is an example of a detection element that detects a change in potential of the source follower.

  For example, the unit pixel 3 having a 4TR configuration shown in FIG. 2 is configured by a photodiode or a photogate having both a photoelectric conversion function for receiving light and converting it into a charge, and a charge storage function for storing the charge. The charge generation unit 32, the charge generation unit 32, a read selection transistor (transfer transistor) 34 which is an example of a charge readout unit (transfer gate unit / read gate unit), and a reset which is an example of a reset gate unit The transistor 36, the vertical selection transistor 40, and the amplification transistor 42 having a source follower configuration which is an example of a detection element that detects a potential change of the floating diffusion 38.

  The unit pixel 3 includes a pixel signal generation unit 5 having an FDA (Floating Diffusion Amp) configuration including a floating diffusion 38 which is an example of a charge injection unit having a function of a charge storage unit. The floating diffusion 38 is a diffusion layer having parasitic capacitance. The pixel signal generation unit 5 functions as a unit that generates a potential corresponding to the amount of charge transferred from the charge generation unit 32 to the floating diffusion 38 and transmits the potential to the vertical signal line 53.

  The amplifying transistor 42 is connected to each vertical signal line 53 (corresponding to the vertical signal line 18 in FIG. 1), and the vertical signal line 53 is a part of the constant current source In of the read current source unit 27 for each vertical column. A load control signal SFLACT from a load control unit (not shown) is commonly input to the gate terminal of each load MOS transistor 27z. The load MOS transistor 27z connected to the amplifying transistor 42 continues to pass a predetermined constant current. That is, the load MOS transistor 27z causes the signal output to the vertical signal line 53 by assembling the amplifying transistor 42 and the source follower in the selected row.

  The horizontal wiring is common to the pixels in the same row, and is driven and controlled by the vertical drive unit 14y of the vertical scanning unit 14 (not shown). For example, a transfer drive buffer 250, a reset drive buffer 252, and a selection drive buffer 254 are accommodated in the vertical drive unit 14y.

  The read selection transistor 34 is driven by a transfer signal TRG from the transfer drive buffer 250 via a transfer wiring (read selection line TRF) 55. The reset transistor 36 is driven by a reset signal φRST from the reset drive buffer 252 via a reset wiring (RST) 56. The vertical selection transistor 40 is driven by a vertical selection signal φSEL from the selection drive buffer 254 via a vertical selection line (SEL) 52. Each drive buffer can be driven by the vertical scanning unit 14.

  The reset transistor 36 in the pixel signal generation unit 5 has a source connected to the floating diffusion 38 and a drain connected to the power supply VDD, and a reset pulse RST is input to the gate (reset gate RG) from the reset drive buffer. The reset transistor 36 has a function of resetting the potential of the floating diffusion 38.

  Here, the unit pixel 3 is a type in which the vertical selection transistor 40 is on the vertical signal line 53 side of the amplification transistor 42 and the vertical selection transistor 40. That is, in the vertical selection transistor 40, for example, the drain is connected to the source of the amplifying transistor 42, the source is connected to the pixel line 51, and the gate (in particular, the vertical selection gate SELV) is connected to the vertical selection line 52. Yes.

  A vertical selection signal SEL is applied to the vertical selection line 52. The amplification transistor 42 has a gate connected to the floating diffusion 38, a drain connected to the power supply VDD, a source connected to the pixel line 51 via the drain of the vertical selection transistor 40, and further connected to the vertical signal line 53 (18). It has come to be.

  The vertical selection transistor 40 is not limited to such a connection configuration, and the drain is connected to the power supply VDD, the source is connected to the drain of the amplification transistor 42, and the gate is connected to the vertical selection line 52. Good.

  In such a 4TR configuration, since the floating diffusion 38 is connected to the gate of the amplifying transistor 42, the amplifying transistor 42 outputs a signal corresponding to the potential of the floating diffusion 38 (hereinafter referred to as FD potential) in the voltage mode. The signal is output to the vertical signal line 53 (18) via the line 51.

  The reset transistor 36 resets the floating diffusion 38. The read selection transistor (transfer transistor) 34 transfers the signal charge generated by the charge generator 32 to the floating diffusion 38. A large number of pixels are connected to the vertical signal line 18. To select a pixel, the vertical selection transistor 40 is turned on only for the selected pixel. Then, only the selected pixel is connected to the vertical signal line 18, and the signal of the selected pixel is output to the vertical signal line 18.

<Driving method of unit pixel>
FIG. 3 is a timing chart for explaining a method of acquiring the pixel signal (unit signal output from the unit pixel 3) by driving the unit pixel 3 shown in FIG. In the 4TR configuration shown in FIG. 2, the reset transistor 36 resets the floating diffusion 38. Specifically, the floating diffusion 38 is reset by discarding the signal charges (here, electrons) of the floating diffusion to the power supply wiring.

  The read selection transistor (transfer transistor) 34 transfers the signal charge generated by the charge generation unit 32 to a floating diffusion 38 which is an example of a charge storage unit.

  Since the floating diffusion 38 is connected to the gate of the amplifying transistor 42 which is an example of the unit signal generation unit, the amplifying transistor 42 is a signal corresponding to the potential of the floating diffusion 38 (hereinafter also referred to as FD potential) (in this example). Voltage signal) is output to the vertical signal line 53, which is an example of an output signal line, via the pixel line 51 when the vertical selection transistor 40 is on. That is, a large number of pixels are connected to the vertical signal line 53. To select a pixel, the vertical selection transistor 40 is turned on only for the selected pixel. Then, only the selected pixel is connected to the vertical signal line 53, and the signal of the selected pixel is output to the vertical signal line 53.

  Specifically, as shown in the timing chart of FIG. 3, the read pulse (transfer gate pulse) TRG becomes active (high level in this example), drives the read selection transistor 34, and enters the charge generation unit 32. Signal charges generated by photoelectric conversion of light are transferred to a floating diffusion 38 that functions as an accumulation node and read out.

  Here, the signal charge generated by photoelectric conversion of the light incident on the charge generation unit 32 is accumulated in the charge generation unit 32 until the read selection transistor 34 is turned on.

  In the horizontal scanning line blanking period (blanking period), the vertical selection pulse SEL is activated (high level in this example) to turn on the vertical selection transistor 40 (t10). The output of the amplifying transistor 42 in the readout row and the vertical signal line 53 are connected so that the charge of the floating diffusion 38 can be detected, and the vertical signal line 53, the current source In (load MOS transistor 27), and the amplifying transistor are connected. 42 constitutes a source follower circuit. The potential of the vertical signal line 53 follows the potential fluctuation of the floating diffusion 38. As a result, only the potential determined by the gate potential of the amplifying transistor 42 corresponding to the charge amount of the floating diffusion 38 is transmitted to the vertical signal line 53.

  Further, with the start of the horizontal scanning line blanking period, the signal signal Qsig is accumulated in the charge generation unit 32, and the pixel signal generation unit 5 is first reset to the reference voltage, that is, the reset gate pulse RG is activated (main). In the example, the level is set to high level (t11), and the reset transistor 36 is turned on to discharge the dark current integrated value accumulated in the floating diffusion 38. As a result, the floating diffusion 38 is set to the power supply voltage value (Vdd). When the reset gate pulse RG is inactive (low level in this example) (t12), the potential of the floating diffusion 38 slightly drops due to coupling.

  At this time, a sample pulse SHP is output from the drive signal operation unit 16 and supplied to the gate of the shift transistor forming the CDS function unit in the column processing unit 20, and each shift transistor is turned on. That is, the clamp pulse SHP is supplied from the drive signal operation unit 16 and is supplied to the gate of the clamp transistor forming the CDS function unit in the column processing unit 20, and each clamp transistor is turned on, and the reset level Srst is detected ( t14).

  Next, the read selection transistor 34 for the charge generation unit 32 is driven to read the signal component So corresponding to the signal charge Qsig from the charge generation unit 32. That is, the transfer gate pulse TRG is set to the high level (t16), the read selection transistor 34 is turned on, and the signal charge Qsig accumulated in the charge generation unit 32 is transferred to the floating diffusion 38. The amount of signal charge Qsig transferred to the floating diffusion 38 is detected by the amplifying transistor 42, and a potential corresponding to the amount of charge is generated and transmitted to the vertical signal line 53.

  Thereafter, the clamp pulse SHD is supplied from the drive signal operation unit 16 (t18), the clamp transistor is turned on, and the pixel signal level Ssig corresponding to the signal charge Qsig detected by the charge generation unit 32 is detected.

  Here, in the column processing unit 20, the CDS processing function unit performs the CDS processing in the reset phase and the data phase. That is, by taking the difference between the reset level Srst and the pixel signal level Ssig acquired as described above, the offset component is removed and the true signal component So can be detected. It is possible to remove fixed pattern noise for each pixel.

  After the signal charge transfer is completed and a sufficient time has passed, the vertical selection pulse SEL is made inactive (low level in this example) (t20).

<Vertical scanning control function>
FIG. 4 is a diagram for explaining the vertical scanning control function when the CMOS image sensor 12 is used. Here, for the sake of simplification of explanation, it is assumed that the imaging unit 10 is for monochrome imaging without a color filter.

  As shown in FIG. 4, the vertical address setting unit 14x of the vertical scanning unit 14 captures an image as a functional element that generates address information (specifically, a transfer gate pulse TRG as a drive pulse) that specifies a read pixel position. The odd-numbered row vertical address setting unit 414o that specifies the row address φTRGo to be read of the odd-numbered row (2v-1; v is a positive integer) in the unit 10, and the row-address to be read of the even-numbered row (2v) in the imaging unit 10 and an even-numbered row vertical address setting unit 414e for designating φTRGe.

  Here, the odd-numbered row vertical address setting unit 414o and the even-numbered row vertical address setting unit 414e set the corresponding row addresses φTRGo and φTRGe to 1 in the opposite direction from the lower side to the upper side and from the upper side to the lower side, respectively. By alternately designating each row sequentially, the same exposure condition as the same detection condition, that is, the shutter speed is set in each of the odd-numbered row region 410o and the even-numbered row region 410e.

  The vertical address setting unit 14x is divided into a functional unit in charge of reading address designation of the odd-numbered row area 410o and a function unit in charge of reading address designation of the even-numbered row area 410e, thereby using a simple counter or shift register. It becomes possible to adopt a configuration in which the address value is sequentially changed by two (one is raised and the other is lowered), and the circuit configuration can be made compact. Of course, it is possible to provide a random access function without providing a function unit in charge of reading address designation for each area.

  When the odd-numbered row area 410o and the even-numbered row area 410e of the imaging unit 410 are divided into two vertical scanning systems and independent pixel signals are read out, the respective vertical scanning start points STo and STe have a degree of freedom. is there. As an example, as shown in FIG. 4, the odd row region 410 o is set to the lowermost end of the imaging unit 10, and the even row region 410 e is set to the uppermost end of the imaging unit 10.

  In the case of such a relationship between the scanning starting points STo and STe, the vertical signal line 18 is vertically scanned in a direction opposite to each other for each row, so that the mobile signal processing unit 132 is connected via the vertical signal line 18. The pixel signals are supplied in the order of the first row, the second row, the third row, the second row, the second row,..., The second row, the fourth row, the second row, the first row, and the second row. Is done. For example, if there are 200 lines per frame, the data are read out in the order of 1,200, 3,198, 5,196,..., 99, 102, 101, 100, 103,. The moving body signal processing unit 132 stores the supplied pixel signal in the frame memory 133.

  In such a pixel signal reading method, an image for one frame on the frame memory 133 is represented by a combination of a plurality of pieces of image information for one frame in which the vertical scanning directions are opposite to each other and one line is thinned out. Will be.

  The image information for the imaging unit 10 (one frame) represented by the information with different scanning directions is changed to the image information for the imaging unit 10 (one frame) represented by the same scanning direction, that is, In order to reproduce the original image on the frame memory 133 in the same manner as the arrangement of the rows in the vertical direction, the mobile signal processing unit 132 reverses the scanning order of one of the image information in the two vertical directions. That's fine.

  For example, by adjusting the reading of the pixel signal from the frame memory 133 so that the scanning order of the even-numbered rows is reversed, the image information regarding the even-numbered row region 410e is inverted in the vertical direction. Thus, the order returns to the first row, the second row, the third row, the fourth row,..., 2v-3 row, 2v-2 row, 2v-1 row, 2v row. For example, if there are 200 rows per frame, the order is returned in the order 1, 2, 3, 4, 5,.

  When rearranging pixel rows by using the frame memory 133 as described above, the frame memory 133 stores the image information before rearrangement and the image information after rearrangement. A total of 2 frames are required.

  On the other hand, when image data is taken into the mobile signal processing unit 132, if the writing lines are controlled so that the original line order is maintained on the frame memory 133, the frame memory 133 can be used as a pre-reordering unit. The amount of storing image information is not required, and only one frame for storing rearranged image information is required. Of course, here, the number of frame memories necessary for processing relating to rearrangement of pixel rows is described.

  The reason for reproducing the original line order on the frame memory 133 is that the line order of the image information on the frame memory 133 is imaged when performing a moving body detection process or other signal processing related to a moving body, which will be described later. This is to make it possible to use and modify a known processing algorithm based on the premise that the state of the image on the unit 10 is the same. If the processing algorithm is uniquely developed, it is possible to perform the moving body detection process and other signal processing related to the moving body without rearranging the row order.

<Mobile signal processing>
FIG. 5 is a diagram for explaining an example of mobile signal processing. Here, there are 200 rows per frame, and the image after the pixel rows are returned in the order of 1, 2, 3, 4, 5,..., 199, 200 by the mobile signal processing unit 132 is shown.

  For simplicity, let us consider a case where an image is captured with an electronic shutter with a sufficiently short exposure time. Since the exposure control in the present embodiment is a focal plane shutter with different exposure start times for each row, a square image at the position indicated by the thin solid line Lst at the start time of the frame is at the end time of this frame. Move to the position indicated by the thick solid line Led. Then, a parallelogram image indicated by a thin one-dot chain line Gst is obtained from the pixel signal based on the odd-numbered rows that are vertically scanned from the bottom to the top of the imaging unit 10, and is based on the even-numbered rows that are vertically scanned from the top to the bottom. From the pixel signal, an image indicated by a thick alternate long and short dash line Ged is obtained.

  As described above, the pixel signals are read in the opposite vertical directions for the odd-numbered row area 410o and the even-numbered row area 410e, so that the time to reach the upper side and the lower side of the quadrilateral is different. In the figure, the time at which the upper side and the lower side of the rectangle are reached in each reading direction is indicated by arrows.

  In order to specify whether such an image is an image of a stationary object or an image of a moving object, as a general technique, two images with different imaging time points (imaging timings) are used. In this embodiment as well, it is specified whether or not it is a moving object by comparing a plurality of frame images.

  As will be described later, the moving object detection is performed within one frame by using an image of one frame obtained by reading out pixel signals in the opposite vertical directions for the odd-numbered row region 410o and the even-numbered row region 410e as in the present embodiment. It is also possible to perform.

  If the moving object is imaged, the moving object signal processing unit 132 then uses the image information for one frame shown in FIG. 5 acquired by one imaging as described above to determine which moving object is Analyze whether it was working.

  For example, if 200t is one frame, the difference in exposure time is small in the vicinity of the 100th row as seen in the reading order, and the difference in exposure time increases as it approaches the upper and lower ends of the screen. The closer to the top and bottom of the screen, the greater the misalignment between the odd and even lines.

  Thereby, the moving speed of the moving object and the original shape at a certain time of the frame can be obtained by calculation from the shift of the corresponding vertex position. For example, the upper side of the figure has moved from the 73rd line to the 84 = (200-116) line in the time from the time 73t to the time 116t. Since the moving speed F is a value obtained by dividing the moving distance by the moving time, (84-73) / (116t-73t) becomes the moving speed Fv in the vertical direction. If the same processing is performed with the coordinates in the column direction, the moving speed Fh in the horizontal direction can be obtained.

  If the moving speeds Fv and Fh in the vertical direction and the horizontal direction can be obtained, the original shape at a certain time of the same frame can be obtained from the moving speeds Fv and Fh.

  Here, in this example, as shown in FIG. 4, the scanning start point STo is set at the lowermost end of the imaging unit 10 with respect to the odd-numbered region 410o, and the scanning starting point is set at the uppermost end of the imaging unit 10 with respect to the even-numbered region 410e. STe is set. In this case, the scanning start point STo for the odd-numbered row region 410o is equal to the vertical scanning end point EDe for the even-numbered row region 410e, and the temporal shift is equal to one frame. Therefore, it is possible to specify the state of the moving body over one frame at the maximum.

  As described above, according to the moving body signal processing of the above embodiment, the state of movement of the moving body can be specified using an image for one frame obtained by one imaging, in a short time. The state of the moving object can be determined. It is not necessary to specify the state of movement of the moving body by performing signal processing between a plurality of frames, and a signal processing circuit for specifying the state of movement of the moving body may have a memory for one frame. Arithmetic processing is simple and requires only four arithmetic operations.

  The mechanism for that can be realized by a simple process of alternately scanning from different scanning directions, and as described in Japanese Patent Application Laid-Open No. 2003-162723, a special method for obtaining image data in which imaging regions are shifted a plurality of times. An imaging device is not required.

  In addition, as described in Japanese Patent Application Laid-Open No. 08-294057, signal charges such as a plurality of storage capacitors for accumulating signal charges of electrical signals from the photoelectric conversion element unit in order to acquire information on different imaging timings. A special pixel structure provided with a storage element portion is necessary.

  Furthermore, by using such a feature, it is possible to eliminate the disadvantages of so-called line exposure (or focal plane shutter), which has a different exposure accumulation period depending on the row, which is peculiar to the CMOS sensor. In other words, even if a special pixel configuration that realizes a function of a global shutter that makes the exposure accumulation period of each pixel constant when performing an electronic shutter operation (exposure at the same time for all rows) is performed by an arithmetic process. A global shutter function can be substantially realized.

  FIG. 6 is a diagram illustrating a process for detecting a moving object with an image for one frame. This figure is an enlarged view of the moving part shown in FIG. Note that the figure (Gst) originally obtained by scanning from bottom to top (left axis) is 25 (73-23) / 2, and the figure (Ged) obtained by scanning from top to bottom (right axis) is obtained. The area for 16 (148-116) / 2 lines is omitted.

  When pixel signals are read out for each row from different scanning directions, very close image information appears for each row as an image of one frame. Since it is an image of the accumulation start time having a time difference for each row, the image information of the moving object is an area having a very large specific spatial frequency component compared to other areas.

  For example, in the moving body portion shown in FIG. 5, the accumulation start time of two consecutive rows is greatly different from the center portion in the vertical direction of the screen as it approaches the screen edge. An image having a large amount of horizontal stripe components for each row. More specifically, there is a difference of 43t (116t-73t) in time between the odd-numbered row O_h and the even-numbered row E_a, and there is a spatial difference in position on this screen. Further, there is a difference of 125t (128t-23t) in time between the odd-numbered row O_a and the even-numbered row E_e, and there is a difference in position on the screen spatially.

  Focusing on such properties, if a spatial frequency component is extracted by performing arithmetic processing based on two-dimensional information that is an image for one frame, a moving object can be detected in one frame. For example, it is possible to cut out an area with a high specific spatial frequency and extract time information from the shapes of the even and odd rows (for example, “Video signal basics and operation method”, Chapter 5, p147 to 156, Imamura). (See Genichi, CQ Publisher, published 2003.5,1).

  Thereby, for example, there is an advantage that a frame memory for holding images for a plurality of frames becomes unnecessary. In addition, the result can be applied to the focal plane phenomenon correction process.

  As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. Various changes or improvements can be added to the above-described embodiment without departing from the gist of the invention, and embodiments to which such changes or improvements are added are also included in the technical scope of the present invention.

  Further, the above embodiments do not limit the invention according to the claims (claims), and all combinations of features described in the embodiments are not necessarily essential to the solution means of the invention. Absent. The embodiments described above include inventions at various stages, and various inventions can be extracted by appropriately combining a plurality of disclosed constituent elements. Even if some constituent requirements are deleted from all the constituent requirements shown in the embodiment, as long as an effect is obtained, a configuration from which these some constituent requirements are deleted can be extracted as an invention.

  For example, in the above-described embodiment, the vertical scanning direction is divided into a plurality of systems and controlled independently (typically divided into two systems and scanned in the reverse direction). However, the horizontal scanning direction is divided into a plurality of systems. It is also possible to control them independently (typically, they are divided into two lines and scanned in the reverse direction). Further, each of the vertical scanning direction and the horizontal scanning direction can be divided into a plurality of systems and controlled independently. Since horizontal scanning is faster than vertical scanning, in this example, it is possible to detect the movement of a subject that moves quickly in the horizontal direction and to specify the original shape of the high-speed moving body. it can.

  In the description of the mobile signal processing shown in FIG. 5, only the luminance signal is taken into account for monochrome imaging. However, in the case of a single color image sensor for color, the arrangement of the color separation filters is shown. The scanning direction may be controlled on the basis of the combination of colors constituting the repeating unit. For example, in the case of a Bayer array, a set of two rows, such as the first and second rows, the 200th and 199th rows, the fifth and sixth rows, the 196th and 195th rows, etc. The same processing is possible if handled as above.

  In the vertical scanning control operation of the above-described embodiment, the vertical scanning of the odd-numbered row area 410o and the even-numbered row area 410e obtained by dividing the area is set at the lowermost end and the uppermost end of the imaging unit 10. Regardless of where the scanning starting point is, the scanning directions may be different from each other, and other scanning directions may be set.

  For example, the scanning start point STe of the even-numbered row area 410e can be set to the uppermost end of the imaging unit 410 while setting the scanning start point STo of the odd-numbered row area 410o to the boundary between the odd-numbered row area 410o and the even-numbered row area 410e. . In this case, the scanning start point STo for the odd-numbered row region 410o is equal to the intermediate position of the vertical scanning for the even-numbered row region 410e, and the temporal shift is equal to one half frame. Therefore, it is possible to specify the state of the moving body for a maximum of 1/2 frame.

  In the above embodiment, the CMOS type solid-state imaging device that is sensitive to electromagnetic waves input from the outside such as light and radiation is exemplified. However, in any of the above embodiments, any device that detects a change in physical quantity can be used. The described mechanism can be applied, and is not limited to light or the like. For example, a fingerprint authentication device that detects fingerprint images based on changes in electrical characteristics or optical characteristics based on pressure for information related to fingerprints (Japanese Patent Application Laid-Open No. 2002-7984). In the mechanism for detecting other physical changes, such as JP-A-2001-125734 and the like, the mechanism of the above embodiment can be similarly applied when a mechanism for detecting a moving object is required.

It is a schematic block diagram of the CMOS solid-state imaging device which is one Embodiment of the physical information acquisition apparatus which concerns on this invention. It is a figure explaining the structural example of the unit pixel used for the solid-state imaging device shown in FIG. 3 is a timing chart for explaining a method for driving a unit pixel shown in FIG. 2 to acquire a pixel signal. It is a figure explaining the vertical scanning control function in the case of using a CMOS image sensor. It is a figure explaining an example of mobile body signal processing. It is a figure explaining the process which performs a mobile body detection with the image for 1 frame.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Solid-state imaging device, 3 ... Unit pixel, 7 ... Drive control part, 10 ... Imaging part, 12 ... Horizontal scanning part, 12x ... Horizontal address setting part, 14 ... Vertical scanning part, 14x ... Vertical address setting part, 16 ... Drive signal operation unit, 18 ... vertical signal line, 20 ... column processing unit, 22 ... column signal processing unit, 86 ... horizontal signal line, 88 ... output unit, 100 ... external circuit, 130 ... digital signal processing unit, 132 ... movement Body signal processing unit, 133 ... frame memory, 410e ... even row area, 410o ... odd row area, 414e ... even row vertical address setting section, 414o ... odd row vertical address setting section

Claims (4)

An imaging unit in which a plurality of unit pixels that generate electrical signals according to the amount of incident light are two-dimensionally arranged at intersections of a plurality of vertical control lines and a plurality of vertical signal lines;
A plurality of rows are divided into a plurality of systems in the vertical scanning direction and controlled independently, and are configured to be able to scan in a direction opposite to the vertical signal line for each row in one frame. A vertical scanning unit that scans a corresponding vertical control line according to
A horizontal address setting unit for defining a horizontal address, and a horizontal signal for extracting imaging signals from the plurality of unit pixels extracted from the plurality of vertical signal lines in accordance with a read address defined by the horizontal address setting unit A horizontal scanning unit having a horizontal driving unit that leads to a line;
A frame memory connected to the horizontal signal line;
Have
The vertical scanning unit, the scanning in the opposite direction to the vertical signal line for each row in one frame, the detection signals of a plurality of unit pixels of the detection signal and the even lines of the plurality of unit pixels in the odd rows and the reads out alternately, be stored before Symbol frame memory,
Solid-state imaging device. The solid-state imaging device further includes signal processing means connected to the frame memory,
The signal processing means adjusts the reading of the unit pixel signal from the frame memory so that the scanning order of the even-numbered rows is reversed;
The solid-state imaging device according to claim 1. The solid-state imaging device further includes an electronic shutter, and the electronic shutter is driven to detect the plurality of unit pixels with a sufficiently short exposure time, and is stored in the frame memory via the horizontal signal line,
The signal processing means detects the motion of the subject from the detection signal of the odd-numbered unit pixels and the detection signal of the even-numbered unit pixels in one frame stored in the frame memory;
The solid-state imaging device according to claim 1 or 2. And not that imaging section is disposed two-dimensionally in each of the intersections of a plurality of unit pixels for generating an electrical signal corresponding to the incident light quantity and the vertical control lines and multiple vertical signal lines of multiple, more has a line function of controlling independently divided into a plurality of systems in the vertical scanning direction, it is scannable configured in opposite directions to the vertical signal line for each row in one frame Contact Rishide straight address taken corresponds a vertical scanning unit which scans the vertical control lines, from the plurality of vertical signal lines according to a prescribed read address in the horizontal address setting unit and those horizontal address setting unit that defines a horizontal address in accordance with the a solid-state imaging having a horizontal scanning unit that have a an electrically rather horizontal driving unit to the horizontal signal lines, and a frame memory connected to said horizontal signal line for taking out an image signal a signal of the plurality of unit pixels Equipment control It ’s your way,
The vertical scanning unit, the scanning in the opposite direction to the vertical signal line for each row in one frame, the detection signals of a plurality of unit pixels of the detection signal and the even lines of the plurality of unit pixels in the odd rows and the reads out alternately, be stored before Symbol frame memory,
Control method of solid-state imaging device.

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