JP3196565B2 - Screening method for multilayer ceramic capacitors - Google Patents
Screening method for multilayer ceramic capacitorsInfo
- Publication number
- JP3196565B2 JP3196565B2 JP10549495A JP10549495A JP3196565B2 JP 3196565 B2 JP3196565 B2 JP 3196565B2 JP 10549495 A JP10549495 A JP 10549495A JP 10549495 A JP10549495 A JP 10549495A JP 3196565 B2 JP3196565 B2 JP 3196565B2
- Authority
- JP
- Japan
- Prior art keywords
- ceramic capacitor
- multilayer ceramic
- insulation resistance
- voltage
- screening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003985 ceramic capacitor Substances 0.000 title claims description 29
- 238000000034 method Methods 0.000 title claims description 12
- 238000012216 screening Methods 0.000 title claims description 11
- 238000009413 insulation Methods 0.000 claims description 25
- 238000010438 heat treatment Methods 0.000 claims description 4
- 230000010287 polarization Effects 0.000 claims description 3
- 230000032683 aging Effects 0.000 claims 2
- 238000007599 discharging Methods 0.000 claims 2
- 230000002950 deficient Effects 0.000 description 8
- 230000007547 defect Effects 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本発明は絶縁抵抗の信頼性を保証
する積層セラミックコンデンサのスクリーニング方法に
関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for screening a multilayer ceramic capacitor which guarantees the reliability of insulation resistance.
【０００２】[0002]
【従来の技術】従来積層セラミックコンデンサの絶縁抵
抗の信頼性を保証するためのスクリーニング方法として
は、定格電圧を超える直流電流を、電圧の極性を変える
事なく数回にわたって積層セラミックコンデンサに印加
し、誘電体の欠陥部分を破壊させ、絶縁抵抗が劣化した
ものを取り除く耐圧試験法や、直流電圧の極性を変える
事なく数回にわたって電圧を印加したのち、一定時間後
の絶縁抵抗を測定し基準値まで達しないものを取り除く
絶縁抵抗測定試験法などがあった。このようなスクリー
ニング方法で、積層セラミックコンデンサの絶縁抵抗の
信頼性を保証していた。2. Description of the Related Art Conventionally, as a screening method for guaranteeing the reliability of the insulation resistance of a multilayer ceramic capacitor, a DC current exceeding a rated voltage is applied to the multilayer ceramic capacitor several times without changing the polarity of the voltage. A withstand voltage test method that destroys defective parts of the dielectric and removes the insulation resistance that has deteriorated. There was an insulation resistance measurement test method to remove those that did not reach. With such a screening method, the reliability of the insulation resistance of the multilayer ceramic capacitor has been guaranteed.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら電子部品
のよりいっそうの絶縁抵抗の信頼性向上が求められてい
る中、このような従来のスクリーニング方法で良品判定
した積層セラミックコンデンサに、高温多湿の環境下で
定格電圧を超える電圧を印加し、加速的信頼性試験を行
った場合、長時間経過後に絶縁抵抗が劣化するものが発
生するという問題点があった。本発明は上記従来の問題
点を解決するもので、絶縁抵抗が信頼性試験後も劣化す
る事なく、長寿命で高信頼性をもつ積層セラミックコン
デンサを提供することを目的とするものである。However, while there is a demand for further improvement in the reliability of the insulation resistance of electronic components, a multilayer ceramic capacitor determined to be non-defective by such a conventional screening method is subjected to a high temperature and high humidity environment. However, when a voltage exceeding the rated voltage is applied to perform an accelerated reliability test, there is a problem that the insulation resistance is deteriorated after a long time. An object of the present invention is to solve the above-mentioned conventional problems, and an object of the present invention is to provide a multilayer ceramic capacitor having a long life and high reliability without insulation resistance deteriorating even after a reliability test.
【０００４】[0004]
【課題を解決するための手段】この目的を達成するため
に本発明の積層セラミックコンデンサのスクリーニング
方法は、積層セラミックコンデンサに一回目の直流電流
を印加し、次にこの積層セラミックコンデンサを熱処理
して分極状態を解消させ、次いで一回目とは極性を反転
させて２回目の直流電流を印加して一定時間後の漏洩電
流値を測定し、この漏洩電流値がある一定の値を超えた
ものを除去するものである。In order to achieve this object, a method for screening a multilayer ceramic capacitor according to the present invention comprises applying a first direct current to the multilayer ceramic capacitor, and then subjecting the multilayer ceramic capacitor to a heat treatment. Eliminate the polarization state, then reverse the polarity with the first time, apply a second DC current, measure the leakage current value after a certain time, and determine the leakage current value that exceeds a certain value. It is to be removed.
【０００５】[0005]
【作用】上記方法によると、積層セラミックコンデンサ
の対向する電極間の誘電体に欠陥部が存在する場合、直
流電圧を印加するとその欠陥部が分極される。次に極性
のない状態に戻してから、前回とは極性を反転させた直
流電圧を前記積層セラミックコンデンサに印加すると、
分極された欠陥部により大きな漏洩電流が流れる。その
積層セラミックコンデンサを信頼性試験すると絶縁抵抗
が劣化する。このようなことから、上記方法によると絶
縁抵抗が劣化することなく、高寿命で高信頼性を有する
積層セラミックコンデンサを提供することができる。According to the above method, when a defect exists in the dielectric between the opposing electrodes of the multilayer ceramic capacitor, the defect is polarized when a DC voltage is applied. Next, after returning to a state without polarity, when a DC voltage whose polarity is inverted from that of the previous time is applied to the multilayer ceramic capacitor,
A large leakage current flows through the polarized defect. When a reliability test is performed on the multilayer ceramic capacitor, the insulation resistance deteriorates. Thus, according to the above method, a multilayer ceramic capacitor having a long life and high reliability can be provided without deterioration of the insulation resistance.
【０００６】[0006]
【実施例】以下、本発明の一実施例を図面を参照して詳
述する。（表１）は積層セラミックコンデンサに定格の
直流電圧（５０Ｖ）を印加してから１分後の漏洩電流値
と絶縁抵抗値と、その絶縁抵抗値より判定した良否結果
と、８５℃、８５％で２００Ｖの電圧を印加して行った
信頼性試験結果を示す。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to the drawings. (Table 1) shows the leakage current value and the insulation resistance value one minute after the rated DC voltage (50 V) was applied to the multilayer ceramic capacitor, the pass / fail result determined from the insulation resistance value, and 85 ° C., 85% Shows the results of a reliability test performed by applying a voltage of 200 V.
【０００７】[0007]
【表１】 [Table 1]
【０００８】電圧印加は同一の積層セラミックコンデン
サに対して２回行い、２回目に印加する直流電圧の極性
は、１回目に印加した直流電圧の極性を反転させてい
る。また２回目の電圧を印加する前に、放電させて、１
４０℃で６０分間熱処理して無極性状態にしている。
（表２）は積層セラミックコンデンサに定格の直流電圧
（５０Ｖ）を印加してから１分後の漏洩電流値と絶縁抵
抗値と、その絶縁抵抗値より判定した良否結果と、前と
同様の信頼性試験を行った結果を示す。The voltage is applied twice to the same multilayer ceramic capacitor, and the polarity of the DC voltage applied the second time is the reverse of the polarity of the DC voltage applied the first time. Before the second voltage is applied, discharge
Heat treatment is performed at 40 ° C. for 60 minutes to make it nonpolar.
(Table 2) shows the leakage current and the insulation resistance one minute after the rated DC voltage (50 V) was applied to the multilayer ceramic capacitor, the pass / fail result determined from the insulation resistance, and the same reliability as before. 3 shows the results of a sex test.
【０００９】[0009]
【表２】 [Table 2]
【００１０】電圧印加は同一の積層セラミックコンデン
サに対して２回行い１回目と２回目の印加電圧の極性は
同一方向である。The voltage is applied twice to the same multilayer ceramic capacitor, and the polarities of the first and second applied voltages are in the same direction.
【００１１】尚絶縁抵抗の良否判定は１０10Ωをもって
行い、不良品＜１０10Ω≦良品とする。また漏洩電流に
よる良否判定は、印加電圧が５０Ｖであるのでオームの
法則より、良品≦５ｎＡ＜不良品とする。The insulation resistance is judged to be good or bad at 10 10 Ω, and a defective product is determined as <10 10 Ω ≦ good product. In the pass / fail judgment based on the leakage current, since the applied voltage is 50 V, according to Ohm's law, a non-defective product ≤5 nA <defective product.
【００１２】（表１）によると、１回目の直流電圧印加
後の漏洩電流値は、全て５．００ｎＡ以下で、絶縁抵抗
値は１×１０10Ω以上で良品と判定され、２回目の直流
電圧印加後の漏洩電流値と絶縁抵抗値を見ると、Ｎｏ７
の試料のみ不良品で、その他の９ケは良品と判定され
た。更に信頼性試験を実施したところ、１０００ｈｒ後
の絶縁抵抗は不良品Ｎｏ７の試料のみ劣化しその他の良
品９ケは劣化しなかった。According to Table 1, the leakage current values after the first DC voltage application are all 5.00 nA or less, the insulation resistance value is 1 × 10 10 Ω or more, and it is judged as good. Looking at the leakage current value and the insulation resistance value after voltage application, No. 7
Only 9 samples were determined to be defective, and the other 9 samples were determined to be good. Further, when a reliability test was performed, the insulation resistance after 1000 hours was deteriorated only in the sample of the defective product No. 7, and the other 9 non-defective products were not deteriorated.
【００１３】（表２）によると、１回目および２回目の
直流電圧印加後の漏洩電流値は、全て５．００ｎＡ以下
で、絶縁抵抗値が１×１０10Ω以上で良品と判定された
が、信頼性試験を実施したところ、１０００ｈｒ後の絶
縁抵抗はＮｏ５の試料のみ劣化しその他の９ケは劣化し
なかった。According to Table 2, the leakage current values after the first and second DC voltage applications were all 5.00 nA or less, and the insulation resistance value was 1 × 10 10 Ω or more. When a reliability test was performed, the insulation resistance after 1000 hours was deteriorated only in the sample of No. 5, and the other nine were not deteriorated.
【００１４】従って本実施例においては、２回目に印加
する直流電圧の極性を、１回目に印加する直流電圧の極
性と反転させ選別した場合、積層セラミックコンデンサ
は信頼性試験１０００時間後でも絶縁抵抗が劣化するこ
とはない。Therefore, in this embodiment, when the polarity of the DC voltage applied the second time is selected by reversing the polarity of the DC voltage applied the first time, the laminated ceramic capacitor has an insulation resistance even after 1000 hours of the reliability test. Does not deteriorate.
【００１５】即ち長寿命で、高信頼性の絶縁抵抗を保証
することが可能である。また１回目の電圧印加を行う前
に、積層セラミックコンデンサを放電させ、エージング
して電荷のない状態にすることにより、さらにスクリー
ニングの精度が向上する。That is, it is possible to guarantee a long life and highly reliable insulation resistance. In addition, before the first voltage application, the multilayer ceramic capacitor is discharged and aged to have no charge, thereby further improving the screening accuracy.
【００１６】[0016]
【発明の効果】以上本発明によれば、信頼性試験でも絶
縁抵抗が劣化せず、長寿命で高信頼性をもつ積層セラミ
ックコンデンサを提供することができる。As described above, according to the present invention, it is possible to provide a multilayer ceramic capacitor having a long service life and high reliability without insulation resistance deterioration even in a reliability test.
Claims (4)
流電流を印加し、次にこの積層セラミックコンデンサを
熱処理して分極状態を解消させ、次いで一回目とは極性
を反転させて２回目の直流電流を印加して一定時間後の
漏洩電流値を測定し、この漏洩電流値がある一定の値を
超えたものを除去する積層セラミックコンデンサのスク
リーニング方法。1. A first direct current is applied to a laminated ceramic capacitor, and then the laminated ceramic capacitor is subjected to a heat treatment to eliminate the polarization state. A method for screening a multilayer ceramic capacitor in which a leakage current value after a certain period of time after application is measured and a leakage current value exceeding a certain value is removed.
の直流電流を印加する請求項１に記載の積層セラミック
コンデンサのスクリーニング方法。2. The method for screening a multilayer ceramic capacitor according to claim 1, wherein a first direct current is applied after discharging and aging.
流電流を印加し、次にこの積層セラミックコンデンサを
熱処理して分極状態を解消させ、次いで一回目とは極性
を反転させて２回目の直流電流を印加して一定時間後の
絶縁抵抗を測定し、この絶縁抵抗がある一定の値に達し
ないものを除去する積層セラミックコンデンサのスクリ
ーニング方法。3. A first direct current is applied to the monolithic ceramic capacitor, and then the monolithic ceramic capacitor is subjected to a heat treatment to eliminate the polarization state. A method for screening a multilayer ceramic capacitor in which the insulation resistance after a certain period of time after application is measured and the insulation resistance that does not reach a certain value is removed.
の直流電流を印加する請求項３に記載の積層セラミック
コンデンサのスクリーニング方法。4. The method for screening a multilayer ceramic capacitor according to claim 3, wherein a first direct current is applied after discharging and aging.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10549495A JP3196565B2 (en) | 1995-04-28 | 1995-04-28 | Screening method for multilayer ceramic capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10549495A JP3196565B2 (en) | 1995-04-28 | 1995-04-28 | Screening method for multilayer ceramic capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08306574A JPH08306574A (en) | 1996-11-22 |
| JP3196565B2 true JP3196565B2 (en) | 2001-08-06 |
Family
ID=14409159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10549495A Expired - Lifetime JP3196565B2 (en) | 1995-04-28 | 1995-04-28 | Screening method for multilayer ceramic capacitors |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3196565B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3603640B2 (en) * | 1999-02-04 | 2004-12-22 | 松下電器産業株式会社 | Screening method of multilayer ceramic capacitor |
| JP4266586B2 (en) | 2001-08-22 | 2009-05-20 | 株式会社村田製作所 | Post-test processing method for porcelain capacitors |
-
1995
- 1995-04-28 JP JP10549495A patent/JP3196565B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08306574A (en) | 1996-11-22 |
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