JP2833809B2 - 静電防護された電子部品検査コネクター - Google Patents

静電防護された電子部品検査コネクター

Info

Publication number: JP2833809B2
Authority: JP; Japan
Prior art keywords: component; contact; housing; connector; combination
Prior art date: 1988-04-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

JP1505917A

Other languages

English (en)

Japanese (ja)

Other versions

JPH03504058A (ja

Inventor

ロークス，イマンツ，アール．

ゼリン，マイケル，ピー．

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

AI SUTATSUTO CORP

Original Assignee

AI SUTATSUTO CORP

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-04-27

Filing date

1989-04-26

Publication date

1998-12-09

1989-04-26 Application filed by AI SUTATSUTO CORP filed Critical AI SUTATSUTO CORP

1991-09-05 Publication of JPH03504058A publication Critical patent/JPH03504058A/ja

1998-12-09 Application granted granted Critical

1998-12-09 Publication of JP2833809B2 publication Critical patent/JP2833809B2/ja

2013-12-09 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/66—Structural association with built-in electrical component
- H01R13/70—Structural association with built-in electrical component with built-in switch
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/08—Short-circuiting members for bridging contacts in a counterpart

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Details Of Connecting Devices For Male And Female Coupling (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Connector Housings Or Holding Contact Members (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Manufacturing Of Electrical Connectors (AREA)

JP1505917A 1988-04-27 1989-04-26 静電防護された電子部品検査コネクター Expired - Lifetime JP2833809B2 (ja)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US18766588A	1988-04-27	1988-04-27
US187,665		1988-04-27

Publications (2)

Publication Number	Publication Date
JPH03504058A JPH03504058A (ja)	1991-09-05
JP2833809B2 true JP2833809B2 (ja)	1998-12-09

Family

ID=22689935

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1505917A Expired - Lifetime JP2833809B2 (ja)	1988-04-27	1989-04-26	静電防護された電子部品検査コネクター

Country Status (7)

Country	Link
EP (1)	EP0412119B1 (de)
JP (1)	JP2833809B2 (de)
KR (1)	KR0165665B1 (de)
AT (1)	ATE125396T1 (de)
CA (1)	CA1303175C (de)
DE (1)	DE68923554T2 (de)
WO (1)	WO1989010639A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH07109780B2 (ja) *	1991-02-19	1995-11-22	山一電機株式会社	電気部品用ソケットにおけるコンタクト
JPH074780Y2 (ja) *	1991-10-30	1995-02-01	モレックスインコーポレーテッド	静電気防止コネクタ
ES2150100T3 (es) *	1995-03-16	2000-11-16	Whitaker Corp	Sistema de conexion para telefono portatil.

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3903385A (en)	1973-10-25	1975-09-02	E Advanced Packaging Inc Sa	Shorting bar switch in electrical connector biasing assembly

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4070557A (en) *	1976-07-26	1978-01-24	Northern Telecom Limited	Apparatus for providing closed loop conditions in vacant module positions
US4358173A (en) *	1980-08-08	1982-11-09	Teledyne Industries, Inc.	Electrical connector for leadless integrated circuit packages
US4359252A (en) *	1980-09-08	1982-11-16	Amp Incorporated	Socket for a bubble memory package
JPS628154A (ja) *	1985-07-05	1987-01-16	Konishiroku Photo Ind Co Ltd	感光材料処理装置
US4708659A (en) *	1986-08-25	1987-11-24	Zenith Electronics Corporation	PC board connector with shorting bus bar

1989
- 1989-04-25 CA CA000597720A patent/CA1303175C/en not_active Expired - Lifetime
- 1989-04-26 EP EP89905956A patent/EP0412119B1/de not_active Expired - Lifetime
- 1989-04-26 AT AT89905956T patent/ATE125396T1/de not_active IP Right Cessation
- 1989-04-26 KR KR1019890702402A patent/KR0165665B1/ko not_active IP Right Cessation
- 1989-04-26 JP JP1505917A patent/JP2833809B2/ja not_active Expired - Lifetime
- 1989-04-26 WO PCT/US1989/001796 patent/WO1989010639A1/en active IP Right Grant
- 1989-04-26 DE DE68923554T patent/DE68923554T2/de not_active Expired - Lifetime

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3903385A (en)	1973-10-25	1975-09-02	E Advanced Packaging Inc Sa	Shorting bar switch in electrical connector biasing assembly

Also Published As

Publication number	Publication date
WO1989010639A1 (en)	1989-11-02
EP0412119A1 (de)	1991-02-13
KR900701062A (ko)	1990-08-17
ATE125396T1 (de)	1995-08-15
DE68923554T2 (de)	1996-01-04
EP0412119A4 (en)	1992-06-24
EP0412119B1 (de)	1995-07-19
DE68923554D1 (de)	1995-08-24
KR0165665B1 (ko)	1999-01-15
CA1303175C (en)	1992-06-09
JPH03504058A (ja)	1991-09-05

Publication	Publication Date	Title
US4954087A (en)	1990-09-04	Static-free interrogating connector for electric components
US4924179A (en)	1990-05-08	Method and apparatus for testing electronic devices
KR100248640B1 (ko)	2000-03-15	소자테스트방법 및 시스템
US5909124A (en)	1999-06-01	Apparatus and method for testing a circuit board
KR100316144B1 (ko)	2002-07-02	전기화학 가스 분석기
KR970018873A (ko)	1997-04-30	전기 회로 부재를 위치시키는 방법 및 장치
US7307427B2 (en)	2007-12-11	Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards
US3996514A (en)	1976-12-07	Circuit board contact resistance probe
US4055806A (en)	1977-10-25	Integrated circuit substitution device
JP2833809B2 (ja)	1998-12-09	静電防護された電子部品検査コネクター
TWI405981B (zh)	2013-08-21	Circuit board, circuit board assembly and mistaken insertion detection device
US5350308A (en)	1994-09-27	Elastomeric electrical connector
CN1973412B (zh)	2011-07-06	用于半导体器件测试夹具和测试组件的电连接器
US4218653A (en)	1980-08-19	Connector contact contamination probe
JPH1164385A (ja)	1999-03-05	検査用基板のプローブ
US7034558B2 (en)	2006-04-25	Test system for device and method thereof
JP2973821B2 (ja)	1999-11-08	導通検査用コンタクトプローブおよびこれを含む導通検査器
TW202445148A (zh)	2024-11-16	指紋感應晶片之檢測治具及其壓頭
US6271659B1 (en)	2001-08-07	Integrated circuit sample package for checking electrical functionality and alignment of checking devices and corresponding checking method
EP0406192B1 (de)	1994-03-16	Anschlussvorrichtung für Koaxialkabel
JP2759451B2 (ja)	1998-05-28	プリント基板検査治具
JP2848281B2 (ja)	1999-01-20	半導体装置の試験装置
KR20000049651A (ko)	2000-08-05	피씨비 테스트 장치
JPH04232475A (ja)	1992-08-20	プリント回路基板試験装置
JPH067138B2 (ja)	1994-01-26	プローブ装置

Legal Events

Date	Code	Title	Description
2004-11-30	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2005-10-04	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2006-10-10	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2007-10-09	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20081002 Year of fee payment: 10
2008-09-25	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20081002 Year of fee payment: 10
2008-09-30	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20091002 Year of fee payment: 11
2009-04-26	EXPY	Cancellation because of completion of term
2009-07-01	FPAY	Renewal fee payment (event date is renewal date of database)	Free format text: PAYMENT UNTIL: 20091002 Year of fee payment: 11