EP1057859A3 - Strahlungsempfindliche Harzzusammensetzung und deren Verwendung in einem interlaminaren Isolierfilm - Google Patents
Strahlungsempfindliche Harzzusammensetzung und deren Verwendung in einem interlaminaren Isolierfilm Download PDFInfo
- Publication number
- EP1057859A3 EP1057859A3 EP00111681A EP00111681A EP1057859A3 EP 1057859 A3 EP1057859 A3 EP 1057859A3 EP 00111681 A EP00111681 A EP 00111681A EP 00111681 A EP00111681 A EP 00111681A EP 1057859 A3 EP1057859 A3 EP 1057859A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- resin composition
- sensitive resin
- radiation sensitive
- insulating film
- interlaminar insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/22—Compounds containing nitrogen bound to another nitrogen atom
- C08K5/27—Compounds containing a nitrogen atom bound to two other nitrogen atoms, e.g. diazoamino-compounds
- C08K5/28—Azides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Medicinal Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Magnetic Heads (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15746399 | 1999-06-04 | ||
JP11157463A JP2000347397A (ja) | 1999-06-04 | 1999-06-04 | 感放射線性樹脂組成物およびその層間絶縁膜への使用 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1057859A2 EP1057859A2 (de) | 2000-12-06 |
EP1057859A3 true EP1057859A3 (de) | 2000-12-20 |
EP1057859B1 EP1057859B1 (de) | 2004-05-19 |
Family
ID=15650226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00111681A Expired - Lifetime EP1057859B1 (de) | 1999-06-04 | 2000-05-31 | Strahlungsempfindliche Harzzusammensetzung und deren Verwendung in einem interlaminaren Isolierfilm |
Country Status (6)
Country | Link |
---|---|
US (1) | US6399267B1 (de) |
EP (1) | EP1057859B1 (de) |
JP (1) | JP2000347397A (de) |
KR (1) | KR100663818B1 (de) |
DE (1) | DE60010797T2 (de) |
TW (1) | TW593488B (de) |
Families Citing this family (37)
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---|---|---|---|---|
AUPQ700100A0 (en) * | 2000-04-18 | 2000-05-11 | Orbital Engine Company (Australia) Proprietary Limited | Engine speed control for internal combustion engines |
EP1312982A4 (de) * | 2000-07-27 | 2007-11-07 | Jsr Corp | Strahlungsempfindliche zusammensetzung, isolierends film und elektrolumineszenz bildschirm |
EP1235104A4 (de) * | 2000-08-29 | 2008-10-01 | Jsr Corp | Zusammensetzung deren brechungsindex durch bestrahlung variiert werden kann, sowie ein verfahren zur erzeugung eines beugungsmusters |
US7108954B2 (en) * | 2000-12-11 | 2006-09-19 | Jsr Corporation | Radiation-sensitive composition changing in refractive index and method of changing refractive index |
RU2281310C2 (ru) | 2001-02-19 | 2006-08-10 | Джей Эс Эр КОРПОРЕЙШН | Чувствительная к облучению композиция, изменяющая показатель преломления |
US7125647B2 (en) * | 2001-03-13 | 2006-10-24 | Jsr Corporation | Radiation-sensitive composition changing in refractive index and utilization thereof |
TW555822B (en) * | 2001-03-15 | 2003-10-01 | Jsr Corp | Light diffuse reflecting film-forming composition, manufacturing method thereof, light diffuse reflecting film and liquid crystal display element |
JP4524944B2 (ja) * | 2001-03-28 | 2010-08-18 | Jsr株式会社 | 感放射線性樹脂組成物、その層間絶縁膜およびマイクロレンズの形成への使用、ならびに層間絶縁膜およびマイクロレンズ |
JP4631081B2 (ja) * | 2001-07-16 | 2011-02-16 | ナガセケムテックス株式会社 | ポジ型感放射線性樹脂組成物 |
JP2003043682A (ja) | 2001-08-01 | 2003-02-13 | Jsr Corp | 感放射線性誘電率変化性組成物、誘電率変化法 |
KR100784672B1 (ko) * | 2001-08-20 | 2007-12-12 | 주식회사 동진쎄미켐 | 감광성 수지 조성물 |
KR100809544B1 (ko) * | 2001-10-24 | 2008-03-04 | 주식회사 동진쎄미켐 | 퀴논디아지드 술폰산 에스테르 화합물을 포함하는 감광성수지조성물 |
CN100468195C (zh) * | 2002-04-18 | 2009-03-11 | 日产化学工业株式会社 | 正型感光性树脂组合物及图案形成方法 |
KR20040092550A (ko) * | 2003-04-24 | 2004-11-04 | 클라리언트 인터내셔널 리미티드 | 레지스트 조성물 및 레지스트 제거용 유기용제 |
JP4099114B2 (ja) * | 2003-06-26 | 2008-06-11 | Azエレクトロニックマテリアルズ株式会社 | 感光性樹脂組成物 |
CN100535747C (zh) * | 2003-07-16 | 2009-09-02 | Az电子材料(日本)株式会社 | 光敏树脂组合物 |
KR100571721B1 (ko) * | 2004-02-10 | 2006-04-17 | 삼성전자주식회사 | 신너 조성물 및 이를 이용한 포토레지스트의 제거 방법 |
CN1898605B (zh) * | 2004-04-08 | 2010-08-18 | Jsr株式会社 | 辐射敏感性树脂组合物、层间绝缘膜和微透镜以及它们的制备方法 |
TWI386714B (zh) * | 2004-05-06 | 2013-02-21 | Dongjin Semichem Co Ltd | Tft-lcd用層間有機絕緣膜、tft-lcd用層間有機絕緣膜用丙烯酸系共聚合體樹脂及其製造方法 |
KR20050113351A (ko) * | 2004-05-27 | 2005-12-02 | 주식회사 동진쎄미켐 | 감광성 수지 조성물 |
KR101206780B1 (ko) * | 2005-03-03 | 2012-11-30 | 주식회사 동진쎄미켐 | 감광성 수지 조성물 |
KR101326595B1 (ko) * | 2005-06-04 | 2013-11-20 | 주식회사 동진쎄미켐 | 감광성 수지 조성물, 이를 이용한 박막 트랜지스터 기판의 제조방법 및 공통 전극 기판의 제조방법 |
US7799509B2 (en) * | 2005-06-04 | 2010-09-21 | Samsung Electronics Co., Ltd. | Photosensitive resin composition, method of manufacturing a thin-film transistor substrate, and method of manufacturing a common electrode substrate using the same |
JP4934353B2 (ja) * | 2005-06-10 | 2012-05-16 | ドンジン セミケム カンパニー リミテッド | ネガティブ感光性樹脂組成物 |
KR100696195B1 (ko) | 2005-09-13 | 2007-03-20 | 한국전자통신연구원 | 저온 경화형 고분자 게이트 절연막 및 이를 적용한 유기박막 트랜지스터 |
JP4654867B2 (ja) * | 2005-10-07 | 2011-03-23 | Jsr株式会社 | 感放射線性樹脂組成物、層間絶縁膜およびマイクロレンズ、ならびにそれらの製造方法 |
KR101330345B1 (ko) | 2006-04-25 | 2013-11-15 | 코오롱인더스트리 주식회사 | 절연막 형성용 조성물 |
KR100867948B1 (ko) * | 2006-12-13 | 2008-11-11 | 제일모직주식회사 | 유기 절연막 형성용 감광성 수지 조성물 및 이를 포함하는소자 |
KR101333859B1 (ko) * | 2007-09-28 | 2013-12-19 | 도오꾜오까고오교 가부시끼가이샤 | 공중합체, 수지 조성물, 표시 패널용 스페이서, 평탄화막, 열경화성 보호막, 마이크로 렌즈, 및 공중합체의 제조 방법 |
KR100922843B1 (ko) | 2007-12-13 | 2009-10-20 | 제일모직주식회사 | 절연막 형성용 감광성 수지 조성물 |
JP5343664B2 (ja) * | 2009-03-30 | 2013-11-13 | Jsr株式会社 | 感放射線性樹脂組成物、有機el表示素子用隔壁及び絶縁膜、並びにその形成方法 |
CN101955743B (zh) * | 2010-09-16 | 2012-08-22 | 明基材料有限公司 | 粘着剂的组成物及其制造方法 |
EP2850114B1 (de) * | 2012-05-18 | 2017-03-15 | Ricoh Company, Ltd. | Lichtpolymerisierbare zusammensetzung, lichtpolymerisierbare tintenstrahltinte und tintenpatrone |
KR20140015869A (ko) * | 2012-07-26 | 2014-02-07 | 삼성디스플레이 주식회사 | 포토 레지스트 조성물 및 이를 이용한 박막 트랜지스터 표시판 제조 방법 |
KR101747230B1 (ko) | 2013-02-21 | 2017-06-14 | 제일모직 주식회사 | 모노머, 상기 모노머를 포함하는 하드마스크 조성물 및 상기 하드마스크 조성물을 사용하는 패턴형성방법 |
EP3040411B1 (de) * | 2013-08-30 | 2019-07-03 | JSR Corporation | Klebeflächenwiederherstellungsverfahren und einer klebeflächenwiederherstellungsvorrichtung |
CN107383594B (zh) * | 2017-07-16 | 2019-07-26 | 常州大学 | 一种纳米无机粒子共混改性聚丙烯微孔膜的制备方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2054617A (en) * | 1979-07-16 | 1981-02-18 | Mitsubishi Rayon Co | Radiation sensitive resins comprising 2-alkylglycidyl methacrylate homopolymer or copolymer |
JPH08262709A (ja) * | 1995-03-24 | 1996-10-11 | Japan Synthetic Rubber Co Ltd | 感放射線性樹脂組成物 |
EP0845708A1 (de) * | 1996-06-17 | 1998-06-03 | Toray Industries, Inc. | Trocken flachdruckplatte |
JPH1152560A (ja) * | 1997-08-06 | 1999-02-26 | Jsr Corp | 感放射線性樹脂組成物 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU3870478A (en) | 1977-08-09 | 1980-02-14 | Somar Mfg | High energy radiation cruable resist material |
JPS56122031A (en) | 1980-03-01 | 1981-09-25 | Japan Synthetic Rubber Co Ltd | Positive type photosensitive resin composition |
JPS57204032A (en) | 1981-06-10 | 1982-12-14 | Somar Corp | Photosensitive material |
US4377631A (en) | 1981-06-22 | 1983-03-22 | Philip A. Hunt Chemical Corporation | Positive novolak photoresist compositions |
JPS58203433A (ja) | 1982-05-21 | 1983-11-26 | Fuji Photo Film Co Ltd | 感光性組成物 |
US4550069A (en) | 1984-06-11 | 1985-10-29 | American Hoechst Corporation | Positive photoresist compositions with o-quinone diazide, novolak, and propylene glycol alkyl ether acetate |
JPS61141441A (ja) | 1984-12-14 | 1986-06-28 | Tokyo Ohka Kogyo Co Ltd | ポジ型ホトレジスト組成物 |
US4929536A (en) | 1985-08-12 | 1990-05-29 | Hoechst Celanese Corporation | Image reversal negative working O-napthoquinone diazide and cross-linking compound containing photoresist process with thermal curing |
GB8529958D0 (en) | 1985-12-05 | 1986-01-15 | Vickers Plc | Radiation sensitive devices |
JP2593305B2 (ja) | 1987-02-02 | 1997-03-26 | 日本ペイント株式会社 | ポジ型感光性樹脂組成物 |
DE3731439A1 (de) | 1987-09-18 | 1989-03-30 | Hoechst Ag | Strahlungsempfindliches gemisch und hieraus hergestelltes kopiermaterial |
JPH03155554A (ja) | 1989-11-14 | 1991-07-03 | Japan Synthetic Rubber Co Ltd | 放射線感応性樹脂組成物 |
JP2571136B2 (ja) | 1989-11-17 | 1997-01-16 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
JPH061377B2 (ja) | 1989-12-28 | 1994-01-05 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
US5362597A (en) | 1991-05-30 | 1994-11-08 | Japan Synthetic Rubber Co., Ltd. | Radiation-sensitive resin composition comprising an epoxy-containing alkali-soluble resin and a naphthoquinone diazide sulfonic acid ester |
JP3650985B2 (ja) | 1997-05-22 | 2005-05-25 | Jsr株式会社 | ネガ型感放射線性樹脂組成物およびパターン製造法 |
-
1999
- 1999-06-04 JP JP11157463A patent/JP2000347397A/ja not_active Withdrawn
-
2000
- 2000-05-31 DE DE60010797T patent/DE60010797T2/de not_active Expired - Lifetime
- 2000-05-31 EP EP00111681A patent/EP1057859B1/de not_active Expired - Lifetime
- 2000-06-01 US US09/584,776 patent/US6399267B1/en not_active Expired - Lifetime
- 2000-06-03 KR KR1020000030565A patent/KR100663818B1/ko not_active IP Right Cessation
- 2000-06-03 TW TW089110893A patent/TW593488B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2054617A (en) * | 1979-07-16 | 1981-02-18 | Mitsubishi Rayon Co | Radiation sensitive resins comprising 2-alkylglycidyl methacrylate homopolymer or copolymer |
JPH08262709A (ja) * | 1995-03-24 | 1996-10-11 | Japan Synthetic Rubber Co Ltd | 感放射線性樹脂組成物 |
EP0845708A1 (de) * | 1996-06-17 | 1998-06-03 | Toray Industries, Inc. | Trocken flachdruckplatte |
JPH1152560A (ja) * | 1997-08-06 | 1999-02-26 | Jsr Corp | 感放射線性樹脂組成物 |
Non-Patent Citations (2)
Title |
---|
CHEMICAL ABSTRACTS, vol. 126, no. 5, 3 February 1997, Columbus, Ohio, US; abstract no. 67519, SHIMADA ET AL.: "Radiation-sensitive resin composition" XP002149934 * |
PATENT ABSTRACTS OF JAPAN vol. 1999, no. 05 31 May 1999 (1999-05-31) * |
Also Published As
Publication number | Publication date |
---|---|
EP1057859A2 (de) | 2000-12-06 |
JP2000347397A (ja) | 2000-12-15 |
DE60010797D1 (de) | 2004-06-24 |
KR100663818B1 (ko) | 2007-01-03 |
DE60010797T2 (de) | 2005-06-02 |
EP1057859B1 (de) | 2004-05-19 |
TW593488B (en) | 2004-06-21 |
US6399267B1 (en) | 2002-06-04 |
KR20010007222A (ko) | 2001-01-26 |
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