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DE60328568D1 - Fünf- Volt-tolerante Eingangs-Ausgangsschaltung mit Niederspannungsbauelementen - Google Patents

Fünf- Volt-tolerante Eingangs-Ausgangsschaltung mit Niederspannungsbauelementen

Info

Publication number
DE60328568D1
DE60328568D1 DE60328568T DE60328568T DE60328568D1 DE 60328568 D1 DE60328568 D1 DE 60328568D1 DE 60328568 T DE60328568 T DE 60328568T DE 60328568 T DE60328568 T DE 60328568T DE 60328568 D1 DE60328568 D1 DE 60328568D1
Authority
DE
Germany
Prior art keywords
volt
low
output circuit
voltage components
tolerant input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60328568T
Other languages
English (en)
Inventor
Kent Oertle
Robert F Elio
Duncan Mcfarland
Darren Benzer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Broadcom Corp
Original Assignee
Broadcom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Broadcom Corp filed Critical Broadcom Corp
Application granted granted Critical
Publication of DE60328568D1 publication Critical patent/DE60328568D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
DE60328568T 2002-08-12 2003-08-11 Fünf- Volt-tolerante Eingangs-Ausgangsschaltung mit Niederspannungsbauelementen Expired - Lifetime DE60328568D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40277102P 2002-08-12 2002-08-12
US10/370,392 US6856168B2 (en) 2002-08-12 2003-02-19 5 Volt tolerant IO scheme using low-voltage devices

Publications (1)

Publication Number Publication Date
DE60328568D1 true DE60328568D1 (de) 2009-09-10

Family

ID=30772803

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60328568T Expired - Lifetime DE60328568D1 (de) 2002-08-12 2003-08-11 Fünf- Volt-tolerante Eingangs-Ausgangsschaltung mit Niederspannungsbauelementen

Country Status (3)

Country Link
US (2) US6856168B2 (de)
EP (1) EP1389832B1 (de)
DE (1) DE60328568D1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7236002B2 (en) * 2005-09-15 2007-06-26 Dialog Semiconductor Gmbh Digital CMOS-input with N-channel extended drain transistor for high-voltage protection
US8238068B2 (en) * 2009-04-24 2012-08-07 Silicon Laboratories Inc. Electrical over-stress detection circuit
US9166591B1 (en) 2012-02-03 2015-10-20 Altera Corporation High speed IO buffer
KR101993192B1 (ko) 2012-10-04 2019-06-27 삼성전자주식회사 다중 전압 입력 버퍼
US9000799B1 (en) * 2013-10-01 2015-04-07 Texas Instruments Incorporated Method to achieve true fail safe compliance and ultra low pin current during power-up sequencing for mobile interfaces
US9391618B2 (en) * 2014-08-06 2016-07-12 Broadcom Corporation High voltage fail-safe IO design using thin oxide devices
US9871373B2 (en) 2015-03-27 2018-01-16 Analog Devices Global Electrical overstress recording and/or harvesting
US10557881B2 (en) 2015-03-27 2020-02-11 Analog Devices Global Electrical overstress reporting
US10090838B2 (en) * 2015-09-30 2018-10-02 Silicon Laboratories Inc. Over voltage tolerant circuit
US10365322B2 (en) 2016-04-19 2019-07-30 Analog Devices Global Wear-out monitor device
US10338132B2 (en) 2016-04-19 2019-07-02 Analog Devices Global Wear-out monitor device
US11024525B2 (en) 2017-06-12 2021-06-01 Analog Devices International Unlimited Company Diffusion temperature shock monitor

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5406140A (en) * 1993-06-07 1995-04-11 National Semiconductor Corporation Voltage translation and overvoltage protection
US5543733A (en) * 1995-06-26 1996-08-06 Vlsi Technology, Inc. High voltage tolerant CMOS input/output circuit
US5721508A (en) * 1996-01-24 1998-02-24 Cypress Semiconductor Corporation 5 Volt tolerant 3.3 volt output buffer
US5825206A (en) * 1996-08-14 1998-10-20 Intel Corporation Five volt safe output buffer circuit that controls the substrate and gates of the pull-up devices
US5852375A (en) 1997-02-07 1998-12-22 Silicon Systems Research Limited 5v tolerant I/O circuit
US6028450A (en) * 1998-03-17 2000-02-22 Xilinx, Inc. Programmable input/output circuit with pull-up bias control
US6018257A (en) * 1998-03-23 2000-01-25 Lsi Logic Corporation Output drive circuit tolerant of higher voltage signals
US6118301A (en) * 1998-05-26 2000-09-12 Analog Devices, Inc. High voltage tolerant and compliant driver circuit
US6265926B1 (en) * 1998-05-27 2001-07-24 Altera Corporation Programmable PCI overvoltage input clamp
US6130556A (en) * 1998-06-16 2000-10-10 Lsi Logic Corporation Integrated circuit I/O buffer with 5V well and passive gate voltage
US6081412A (en) * 1998-07-20 2000-06-27 National Semiconductor Corporation Gate oxide breakdown protection circuit for deep submicron processes
US6388469B1 (en) * 1999-08-13 2002-05-14 Cypress Semiconductor Corp. Multiple power supply output driver
US6414515B1 (en) * 1999-12-20 2002-07-02 Texas Instruments Incorporated Failsafe interface circuit with extended drain devices
US6388470B1 (en) * 2000-03-30 2002-05-14 Philips Electronics North American Corporation High voltage CMOS signal driver with minimum power dissipation
US6847248B2 (en) * 2001-01-09 2005-01-25 Broadcom Corporation Sub-micron high input voltage tolerant input output (I/O) circuit which accommodates large power supply variations
US6803789B1 (en) * 2002-10-04 2004-10-12 Semiconductor Manufacturing International Corporation High voltage tolerant output buffer

Also Published As

Publication number Publication date
EP1389832B1 (de) 2009-07-29
US7521965B2 (en) 2009-04-21
US6856168B2 (en) 2005-02-15
US20040027159A1 (en) 2004-02-12
EP1389832A1 (de) 2004-02-18
US20050127953A1 (en) 2005-06-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition