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DE602004032073D1 - Verfahren und Gerät zur Röntgenanalyse - Google Patents

Verfahren und Gerät zur Röntgenanalyse

Info

Publication number
DE602004032073D1
DE602004032073D1 DE602004032073T DE602004032073T DE602004032073D1 DE 602004032073 D1 DE602004032073 D1 DE 602004032073D1 DE 602004032073 T DE602004032073 T DE 602004032073T DE 602004032073 T DE602004032073 T DE 602004032073T DE 602004032073 D1 DE602004032073 D1 DE 602004032073D1
Authority
DE
Germany
Prior art keywords
ray analysis
ray
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004032073T
Other languages
English (en)
Inventor
Masataka Sakata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of DE602004032073D1 publication Critical patent/DE602004032073D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602004032073T 2003-02-07 2004-02-03 Verfahren und Gerät zur Röntgenanalyse Expired - Lifetime DE602004032073D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003030431A JP3706110B2 (ja) 2003-02-07 2003-02-07 Ｘ線分析装置及びｘ線分析方法

Publications (1)

Publication Number Publication Date
DE602004032073D1 true DE602004032073D1 (de) 2011-05-19

Family

ID=32653006

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004032073T Expired - Lifetime DE602004032073D1 (de) 2003-02-07 2004-02-03 Verfahren und Gerät zur Röntgenanalyse

Country Status (4)

Country Link
US (1) US7123686B2 (de)
EP (1) EP1445604B1 (de)
JP (1) JP3706110B2 (de)
DE (1) DE602004032073D1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7901630B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Diffraction grating-based encoded microparticle assay stick
US7900836B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Optical reader system for substrates having an optically readable code
US7923260B2 (en) * 2002-08-20 2011-04-12 Illumina, Inc. Method of reading encoded particles
US7872804B2 (en) 2002-08-20 2011-01-18 Illumina, Inc. Encoded particle having a grating with variations in the refractive index
US7164533B2 (en) 2003-01-22 2007-01-16 Cyvera Corporation Hybrid random bead/chip based microarray
US7508608B2 (en) 2004-11-17 2009-03-24 Illumina, Inc. Lithographically fabricated holographic optical identification element
US20100255603A9 (en) 2002-09-12 2010-10-07 Putnam Martin A Method and apparatus for aligning microbeads in order to interrogate the same
US7092160B2 (en) 2002-09-12 2006-08-15 Illumina, Inc. Method of manufacturing of diffraction grating-based optical identification element
US8081792B2 (en) 2003-08-20 2011-12-20 Illumina, Inc. Fourier scattering methods for encoding microbeads and methods and apparatus for reading the same
WO2006020363A2 (en) 2004-07-21 2006-02-23 Illumina, Inc. Method and apparatus for drug product tracking using encoded optical identification elements
US20060134324A1 (en) * 2004-11-17 2006-06-22 Illumina, Inc. Filament with easily removed protective coating and methods for stripping the same
KR20070002726A (ko) * 2005-06-30 2007-01-05 주식회사 에이엘티 피측정물의 결정방향 측정장치 및 그 측정방법
US7623624B2 (en) * 2005-11-22 2009-11-24 Illumina, Inc. Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction
US7830575B2 (en) 2006-04-10 2010-11-09 Illumina, Inc. Optical scanner with improved scan time
JP5324735B2 (ja) * 2006-04-20 2013-10-23 株式会社リガク 結晶方位測定方法及びその装置
JP5081556B2 (ja) * 2007-09-28 2012-11-28 株式会社リガク デバイシェラー光学系を備えたｘ線回折測定装置とそのためのｘ線回折測定方法
US8111807B2 (en) * 2009-09-16 2012-02-07 Rigaku Corporation Crystallite size analysis method and apparatus using powder X-ray diffraction
US8548123B2 (en) * 2010-04-29 2013-10-01 Bruker Axs, Inc. Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer
EP2634566B1 (de) * 2012-02-28 2019-03-27 Malvern Panalytical B.V. Mikrobeugung
JP5944369B2 (ja) * 2013-11-26 2016-07-05 株式会社リガク Ｘ線回折装置およびｘ線回折測定方法
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP6472069B2 (ja) * 2018-03-22 2019-02-20 国立大学法人金沢大学 回折環計測装置
CN111558406B (zh) * 2020-04-28 2022-07-12 中国人民解放军海军军医大学 遥控式大批量样本点源辐照架及辐照实验室

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04161843A (ja) * 1990-10-25 1992-06-05 Rigaku Corp Ｘ線測定装置
EP0553911A1 (de) * 1992-01-27 1993-08-04 Koninklijke Philips Electronics N.V. Ortsempfindliche Röntgenanalyse
JPH0682305A (ja) * 1992-08-31 1994-03-22 Shimadzu Corp ２次元検出器
JP3519203B2 (ja) * 1996-02-20 2004-04-12 理学電機株式会社 Ｘ線装置
JP3519292B2 (ja) * 1998-11-13 2004-04-12 理学電機株式会社 微小部ｘ線回折測定方法及び微小部ｘ線回折装置
JP2000146872A (ja) * 1998-11-17 2000-05-26 Rigaku Corp Ｘ線回折装置

Also Published As

Publication number Publication date
US7123686B2 (en) 2006-10-17
JP2004239802A (ja) 2004-08-26
EP1445604B1 (de) 2011-04-06
EP1445604A1 (de) 2004-08-11
US20040156471A1 (en) 2004-08-12
JP3706110B2 (ja) 2005-10-12

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