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DE3932479A1 - Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources - Google Patents

Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources

Info

Publication number
DE3932479A1
DE3932479A1 DE19893932479 DE3932479A DE3932479A1 DE 3932479 A1 DE3932479 A1 DE 3932479A1 DE 19893932479 DE19893932479 DE 19893932479 DE 3932479 A DE3932479 A DE 3932479A DE 3932479 A1 DE3932479 A1 DE 3932479A1
Authority
DE
Germany
Prior art keywords
transfer function
measurement
signal processing
noise sources
processing arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19893932479
Other languages
German (de)
Inventor
Georg Dr Schneider
Richard Dipl Ing Wagner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Endress and Hauser SE and Co KG
Original Assignee
Endress and Hauser SE and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Endress and Hauser SE and Co KG filed Critical Endress and Hauser SE and Co KG
Priority to DE19893932479 priority Critical patent/DE3932479A1/en
Priority to JP2513117A priority patent/JP2820530B2/en
Priority to CA002042396A priority patent/CA2042396C/en
Priority to DE90914389T priority patent/DE59004430D1/en
Priority to ES90914389T priority patent/ES2048503T3/en
Priority to PCT/EP1990/001528 priority patent/WO1991005222A1/en
Priority to EP90914389A priority patent/EP0445267B1/en
Priority to DK90914389.3T priority patent/DK0445267T3/en
Priority to IE332390A priority patent/IE903323A1/en
Priority to US07/583,820 priority patent/US5257210A/en
Publication of DE3932479A1 publication Critical patent/DE3932479A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation

Landscapes

  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)

Abstract

A sensor signal processing arrangement performs analogue processing of measurement signals to produce an output parameter related to a reference parameter by a transfer function formed by the ratio of combinations of the measurement effects dependent on physical parameters and an effect dependent on physical and noise parameters. The transfer function coeffts. are adjusted to achieve the desired transfer function according to the measurement sensor characteristics. USE/ADVANTAGE - Esp. suitable for quantised charge transfer processing with charge balancing using switch-capacitor structures. The effect of several noise sources and measurement parameter to measurement effect relationship errors are corrected.
DE19893932479 1989-09-28 1989-09-28 Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources Ceased DE3932479A1 (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
DE19893932479 DE3932479A1 (en) 1989-09-28 1989-09-28 Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources
JP2513117A JP2820530B2 (en) 1989-09-28 1990-09-10 Device for processing sensor signals
CA002042396A CA2042396C (en) 1989-09-28 1990-09-10 Arrangement for processing sensor signals
DE90914389T DE59004430D1 (en) 1989-09-28 1990-09-10 ARRANGEMENT FOR PROCESSING SENSOR SIGNALS.
ES90914389T ES2048503T3 (en) 1989-09-28 1990-09-10 PROVISION FOR THE TREATMENT OF SENSOR SIGNALS.
PCT/EP1990/001528 WO1991005222A1 (en) 1989-09-28 1990-09-10 Device for processing sensor signals
EP90914389A EP0445267B1 (en) 1989-09-28 1990-09-10 Device for processing sensor signals
DK90914389.3T DK0445267T3 (en) 1989-09-28 1990-09-10 Device for processing sensor signals
IE332390A IE903323A1 (en) 1989-09-28 1990-09-12 Arrangement for processing sensor signals
US07/583,820 US5257210A (en) 1989-09-28 1990-09-17 Processor for processing sensor signals to obtain a desired transfer behavior

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893932479 DE3932479A1 (en) 1989-09-28 1989-09-28 Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources

Publications (1)

Publication Number Publication Date
DE3932479A1 true DE3932479A1 (en) 1991-04-11

Family

ID=6390433

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19893932479 Ceased DE3932479A1 (en) 1989-09-28 1989-09-28 Sensor signal processing arrangement - adjusts transfer function coefficients to match measure sensor characteristics, correct various noise sources

Country Status (1)

Country Link
DE (1) DE3932479A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4124191A1 (en) * 1991-07-20 1993-01-21 Dornier Gmbh Physical parameter, e.g. pressure, sensor system with quasi-digital calibration - uses analogue components to calibrate computer which corrects measured parameters
DE4235757A1 (en) * 1992-10-23 1994-04-28 Licentia Gmbh Radiation detector - has detector element on wall of Dewar vessel vacuum chamber with Joule-Thomson cooler
DE4309762A1 (en) * 1993-03-25 1994-09-29 Raytek Sensorik Gmbh Measuring device
DE10154495A1 (en) * 2001-11-07 2003-05-22 Infineon Technologies Ag Concept for compensating the influences of external disturbance variables on physical function parameters of integrated circuits
DE102007024436B4 (en) * 2006-06-02 2014-04-03 Denso Corporation A semiconductor device having a detection Hall element for detecting a magnetic field and a magnetic sensor
DE102020134389A1 (en) 2020-12-21 2022-06-23 Endress+Hauser SE+Co. KG Method for providing at least one disturbance variable of a first field device for the maintenance and/or diagnosis of a second field device and/or a container, and a system

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2916390A1 (en) * 1979-04-23 1980-10-30 Siemens Ag BRIDGE CIRCUIT MADE OF TWO OR MORE EXTENSION STRIPS
DE2916427A1 (en) * 1979-04-23 1980-10-30 Hottinger Messtechnik Baldwin RECEIVER WITH A SPRING AND AN EXTENSION STRIP ASSEMBLY APPLIED TO IT
DE3141016A1 (en) * 1980-10-15 1982-04-22 Westinghouse Electric Corp., 15222 Pittsburgh, Pa. "DEVICE AND METHOD FOR DIAGNOSTICING THE FUNCTIONING OF PLANTS"
DE3242967A1 (en) * 1982-11-20 1984-05-24 Hans-Jörg Dipl.-Kfm. 4400 Münster Hübner Method and measuring instrument for measuring and processing characteristic quantities of the environmental atmosphere, particularly below ground
DE3243540A1 (en) * 1982-11-25 1984-05-30 Hans-Jörg Dipl.-Kfm. 4400 Münster Hübner Method and measuring instrument for measuring and processing characteristic quantities of the environmental atmosphere, particularly below ground
DE3309802A1 (en) * 1983-03-18 1984-09-20 Audi Nsu Auto Union Ag, 7107 Neckarsulm Electronic system for motor vehicles
DE3419694A1 (en) * 1983-05-27 1984-12-20 Transamerica Delaval Inc., Lawrenceville, N.J. ELECTRONIC DEVICE
DE3408824A1 (en) * 1984-03-10 1985-09-12 Vdo Adolf Schindling Ag, 6000 Frankfurt CIRCUIT ARRANGEMENT FOR ELECTROTHERMIC, AMBIENT TEMPERATURE COMPENSATED LEVEL MEASUREMENT
DE3427743A1 (en) * 1984-07-27 1986-02-06 Keller AG für Druckmeßtechnik, Winterthur METHOD FOR TEMPERATURE COMPENSATION AND MEASURING CIRCUIT THEREFOR
DE3633791A1 (en) * 1986-10-03 1988-04-14 Endress Hauser Gmbh Co PROCEDURE AND ARRANGEMENT FOR MEASURING THE RESISTANCE RATIO ON A RESISTANCE HALF-BRIDGE

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2916390A1 (en) * 1979-04-23 1980-10-30 Siemens Ag BRIDGE CIRCUIT MADE OF TWO OR MORE EXTENSION STRIPS
DE2916427A1 (en) * 1979-04-23 1980-10-30 Hottinger Messtechnik Baldwin RECEIVER WITH A SPRING AND AN EXTENSION STRIP ASSEMBLY APPLIED TO IT
DE3141016A1 (en) * 1980-10-15 1982-04-22 Westinghouse Electric Corp., 15222 Pittsburgh, Pa. "DEVICE AND METHOD FOR DIAGNOSTICING THE FUNCTIONING OF PLANTS"
DE3242967A1 (en) * 1982-11-20 1984-05-24 Hans-Jörg Dipl.-Kfm. 4400 Münster Hübner Method and measuring instrument for measuring and processing characteristic quantities of the environmental atmosphere, particularly below ground
DE3243540A1 (en) * 1982-11-25 1984-05-30 Hans-Jörg Dipl.-Kfm. 4400 Münster Hübner Method and measuring instrument for measuring and processing characteristic quantities of the environmental atmosphere, particularly below ground
DE3309802A1 (en) * 1983-03-18 1984-09-20 Audi Nsu Auto Union Ag, 7107 Neckarsulm Electronic system for motor vehicles
DE3419694A1 (en) * 1983-05-27 1984-12-20 Transamerica Delaval Inc., Lawrenceville, N.J. ELECTRONIC DEVICE
DE3408824A1 (en) * 1984-03-10 1985-09-12 Vdo Adolf Schindling Ag, 6000 Frankfurt CIRCUIT ARRANGEMENT FOR ELECTROTHERMIC, AMBIENT TEMPERATURE COMPENSATED LEVEL MEASUREMENT
DE3427743A1 (en) * 1984-07-27 1986-02-06 Keller AG für Druckmeßtechnik, Winterthur METHOD FOR TEMPERATURE COMPENSATION AND MEASURING CIRCUIT THEREFOR
DE3633791A1 (en) * 1986-10-03 1988-04-14 Endress Hauser Gmbh Co PROCEDURE AND ARRANGEMENT FOR MEASURING THE RESISTANCE RATIO ON A RESISTANCE HALF-BRIDGE

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
DE-B.: VDI-Berichte 509, Sensoren-Technologie und Anwendung, Düsseldorf 1984, VDI-Verlag GmbH, S. 125-129,141-145,155-158,165-167,217-222 *
US-Z.: IEEE, Vol. IM-36, Dec. 1987, No. 4, S. 873-878 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4124191A1 (en) * 1991-07-20 1993-01-21 Dornier Gmbh Physical parameter, e.g. pressure, sensor system with quasi-digital calibration - uses analogue components to calibrate computer which corrects measured parameters
DE4235757A1 (en) * 1992-10-23 1994-04-28 Licentia Gmbh Radiation detector - has detector element on wall of Dewar vessel vacuum chamber with Joule-Thomson cooler
DE4309762A1 (en) * 1993-03-25 1994-09-29 Raytek Sensorik Gmbh Measuring device
DE10154495A1 (en) * 2001-11-07 2003-05-22 Infineon Technologies Ag Concept for compensating the influences of external disturbance variables on physical function parameters of integrated circuits
US6906514B2 (en) 2001-11-07 2005-06-14 Infineon Technologies Ag Concept for compensating the influences of external disturbing quantities on physical functional parameters of integrated circuits
DE10154495B4 (en) 2001-11-07 2012-04-26 Infineon Technologies Ag Concept for compensating the influence of external disturbances on physical function parameters of integrated circuits
DE10154495C5 (en) * 2001-11-07 2018-01-11 Infineon Technologies Ag Concept for compensating the influence of external disturbances on physical function parameters of integrated circuits
DE102007024436B4 (en) * 2006-06-02 2014-04-03 Denso Corporation A semiconductor device having a detection Hall element for detecting a magnetic field and a magnetic sensor
DE102020134389A1 (en) 2020-12-21 2022-06-23 Endress+Hauser SE+Co. KG Method for providing at least one disturbance variable of a first field device for the maintenance and/or diagnosis of a second field device and/or a container, and a system

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: ENDRESS + HAUSER GMBH + CO, 79689 MAULBURG, DE

8131 Rejection
8125 Change of the main classification

Ipc: G01D 3/032