DE3575016D1 - Mikrodimensionsmessapparat. - Google Patents
Mikrodimensionsmessapparat.Info
- Publication number
- DE3575016D1 DE3575016D1 DE8585301847T DE3575016T DE3575016D1 DE 3575016 D1 DE3575016 D1 DE 3575016D1 DE 8585301847 T DE8585301847 T DE 8585301847T DE 3575016 T DE3575016 T DE 3575016T DE 3575016 D1 DE3575016 D1 DE 3575016D1
- Authority
- DE
- Germany
- Prior art keywords
- microdimension
- measuring apparatus
- measuring
- microdimension measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7977284A JPS60224001A (ja) | 1984-04-20 | 1984-04-20 | 微小寸法測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3575016D1 true DE3575016D1 (de) | 1990-02-01 |
Family
ID=13699491
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585301847T Expired - Fee Related DE3575016D1 (de) | 1984-04-20 | 1985-03-15 | Mikrodimensionsmessapparat. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0159800B1 (de) |
JP (1) | JPS60224001A (de) |
DE (1) | DE3575016D1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6358826A (ja) * | 1986-08-29 | 1988-03-14 | Toshiba Corp | 位置検出方法 |
CN111189395A (zh) * | 2018-11-14 | 2020-05-22 | 苏州能讯高能半导体有限公司 | 底切结构测量系统和底切结构测量方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3907439A (en) * | 1973-08-14 | 1975-09-23 | Zygo Corp | Edge-sensing with a scanning laser beam |
FR2327513A1 (fr) * | 1974-01-10 | 1977-05-06 | Cilas | Dispositif pour determiner le profil d'une surface |
US4125317A (en) * | 1977-11-26 | 1978-11-14 | United Technologies Corporation | Optical inspection system employing dual path pickup system with single spherical mirror |
US4385837A (en) * | 1978-05-22 | 1983-05-31 | Irvine Optical Corporation | Apparatus and system for linewidth measurements |
JPS5587904A (en) * | 1978-12-29 | 1980-07-03 | Ibm | Scanning type optical apparatus for micromeasurement |
JPS5821505A (ja) * | 1981-07-31 | 1983-02-08 | Anritsu Corp | 寸法測定装置 |
JPS58106415A (ja) * | 1981-12-18 | 1983-06-24 | Mitsutoyo Mfg Co Ltd | デジタル表示型測定器 |
-
1984
- 1984-04-20 JP JP7977284A patent/JPS60224001A/ja active Granted
-
1985
- 1985-03-15 EP EP19850301847 patent/EP0159800B1/de not_active Expired
- 1985-03-15 DE DE8585301847T patent/DE3575016D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0159800A2 (de) | 1985-10-30 |
EP0159800A3 (en) | 1987-05-27 |
JPH0574762B2 (de) | 1993-10-19 |
EP0159800B1 (de) | 1989-12-27 |
JPS60224001A (ja) | 1985-11-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |