CN110646833B - Satellite single event upset monitoring method based on monolithic array particle detector - Google Patents
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Abstract
The invention relates to a satellite single event upset monitoring method based on a monolithic array particle detector, which comprises the following steps: designing a particle detector; identifying and processing different kinds of particles; establishing a relation between the sensitive device and the number of particles in the particle detector and an LET value; establishing a relation between single particle upset digits of the sensitive device and measurement data of the particle detector; and determining the relevance of the in-orbit anomaly of the satellite sensitive device and the space energetic particles. The method realizes the on-orbit monitoring of the single event upset effect of the satellite sensitive device, can obtain the high-energy particle environment at the position of the satellite single event upset sensitive device, and determines the relevance of the satellite abnormality and the space high-energy particles.
Description
Technical Field
The invention relates to a satellite single event upset monitoring method, and belongs to the technical field of space radiation.
Background
Protons and heavy ions in the space are incident into the electronic components, and a single-particle upset effect is caused, so that logic disorder is caused, and the on-orbit reliable operation of the satellite is influenced. With the rapid development of the aerospace technology, aerospace tasks are increasingly complex and diversified, and in order to meet task requirements, high-performance devices such as commercial CPUs, high-capacity FPGAs and DSPs are largely adopted. The devices have small process size, high capacity and low single event upset threshold, and the single event upset effect problem is more serious.
Due to the lack of effective on-track high-energy particle environmental data support, when the on-track abnormality of the single machine occurs, for example, the abnormality can be recovered through resetting, power-off, starting and the like, and under the conditions that the single-event upset threshold of a device used by the single machine is low and other abnormal reasons are not found, the single-machine abnormality is generally considered to be caused by single-event upset. Therefore, the on-track abnormality is attributed to single event upset, many situations lack basis, and the on-track abnormality is difficult to distinguish from the abnormality caused by discharge, electromagnetic environment and the like in the space, which brings difficulties to subsequent analysis, processing, design improvement and the like.
At present, the environment monitoring of space high-energy particles generally adopts a professional high-energy particle detector. The detector is usually in a telescope structure consisting of a plurality of sensors, and can accurately measure parameters such as particle types, energy, flux and the like. However, such detectors are complex in design, generally form a single unit, are spatially isolated from satellite equipment, and cannot measure the high-energy particle environment at the satellite sensitive device. Because the spatial distribution of the spatial high-energy particles is random, after the detector obtains a high-energy particle signal, whether high-energy particles exist at the position of the satellite sensitive device cannot be determined, the corresponding relation does not exist between the detector data and the satellite device sensitive device abnormity, and the satellite abnormity cannot be judged to be caused by the single-particle upset effect.
For a particle detector probe formed by a plurality of detectors, in order to ensure that particles are incident on the detectors at the same time, the measurement angle of the probe to the space particles is relatively small; and because the detector structure is complicated, the shielding thickness difference experienced by the particles incident to the detector and the particles incident to the sensitive device is large, and the LET value of the same particle in the detector and the sensitive device has large difference.
An on-orbit particle detection and single particle effect monitoring system (application number: CN201810611919.2) proposes a single particle effect monitoring system based on a particle detector, but the particle detector in the patent is composed of 2 silicon semiconductor detectors and 1 scintillator detector, has a complex structure, cannot obtain the position information of incident particles, does not give the difference of the number and LET value of space particles in the detector and the device, and does not determine the relevance between single particle overturn and the incident particles of the device.
Therefore, in order to establish the exact relationship between the on-orbit abnormality of the satellite and the single-particle upset effect, a simple and highly applicable monitoring method capable of measuring the high-energy particle environment suffered by the satellite sensitive device is needed.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the invention overcomes the defects of the prior art and discloses a satellite single event upset monitoring method based on a single chip array particle detector.
The technical scheme adopted by the invention is as follows: a satellite single event upset monitoring method based on a monolithic array particle detector comprises the following steps:
(1) designing a particle detector;
(2) distinguishing different types of particles by comparing the LET values of the particles obtained by the particle detector;
(3) establishing a relation between the number of particles in the sensitive device and the particle detector and an LET value, and obtaining the number of the space particles entering the satellite sensitive device and the particle detector and the difference of the LET value of the particles in the satellite sensitive device and the particle detector;
(4) establishing the relation between the single event upset digit of the sensitive device and the measurement data of the particle detector, and calculating the single event upset digit n generated by the proton in the satellite sensitive devicepAnd the single event upset digit n generated by heavy ions in the satellite sensitive deviceh；
(5) After the satellite sensitive device is abnormal in orbit, the environmental data of the space high-energy particles are obtained through the measurement of the particle detector, and whether the abnormality of the satellite sensitive device is related to the space high-energy particles is judged.
The particle detector adopts a PIN silicon semiconductor detector, and the PIN silicon semiconductor detector obtains a particle LET value by adopting the following formula according to the thickness d of the detector:
wherein, Delta E is the deposition energy of the space particles in the PIN silicon semiconductor detector; d is the detector thickness; ρ is the density of the detector material.
The measurement data of the particle detector comprises LET value parameters, particle numbers, incidence positions and time information of particles; the number of particles is obtained by counting the current pulses of the detector; the particle detector adopts a multi-unit structure, wherein one unit is used for space proton measurement, the other units are used for space heavy ion measurement, the center of each unit is provided with a corresponding coordinate, and when the particle detector outputs a signal, the corresponding unit coordinate is searched according to the serial number of the unit to obtain the incident position of the particle; and acquiring the time information of the incidence of the high-energy particles by acquiring the time of signal generation in the particle detector.
The particle detector outputs a current pulse signal, and the current pulse signal passes through the charge sensitive preamplifier and the main amplifier to form a voltage pulse signal; the voltage pulse signal is stored and downloaded on the satellite through peak value holding and A/D conversion into digital quantity.
The size of the particle detector and the size of the satellite sensitive device keep a 1:1 proportional relation, and the particle detector and the satellite sensitive device are close to each other in space.
The specific method of the step (2) is as follows:
reject less than 0.005MeV cm2A signal of/mg, a signal of shielding electrons;
the LET value of the particles is 0.005 MeV-cm2/mg～1MeV·cm2Dividing particles in the range of/mg into protons, and obtaining corresponding proton energy E according to the measured proton LET valuep；
Mixing the particlesLET value higher than 1MeV cm2The/mg particles are divided into heavy ions and the plates are analyzed for flipping numbers according to the LET value of the heavy ions.
The specific method of the step (3) is as follows:
the particle number and LET value data of space protons and heavy ions are obtained by distinguishing different LET values in the particle detector;
the method comprises the steps of constructing a simulation model containing a satellite sensitive device, a particle detector, a PCB (printed Circuit Board) and a single-machine shell by adopting Geant4 particle transport software, and performing simulation analysis on the number of space particles entering the satellite sensitive device and the particle detector and the difference of the LET values of the particles in the satellite sensitive device and the particle detector by adopting a particle source distributed by a cosine law.
Single event upset digit n generated by proton in satellite sensitive devicep：
Wherein, eta is the probability that the particles are incident on the sensitive device after the particle signals are obtained in the particle detector; fpThe proton flux obtained by the particle detector on-track monitoring; n is the bit number of the satellite sensitive device; epThe proton energy is obtained by looking up a table according to the measured value of the on-orbit LET value of the particle detector; lambda [ alpha ]1The proton energy obtained for the particle detector is different from the proton energy in the satellite sensitive device; sigmasat_p、Eth、Wp、spThe method comprises the following steps of respectively obtaining a saturation turnover section, a turnover threshold, a Weibull function width parameter and a Weibull function shape parameter of a satellite sensitive device under proton irradiation.
Single-particle upset digit n generated by heavy ions in satellite sensitive deviceh：
Wherein, FhHeavy ions obtained for in-orbit monitoring of particle detectorsFlux; lambda [ alpha ]2The LET value of the heavy ions in the detector is different from the LET value of the heavy ions in the sensitive device, and the LET is the LET measured value of the heavy ions obtained by the particle detector in an on-track manner; sigmasat_h、LETth、Wh、shThe method comprises the following steps of respectively obtaining a saturation turnover section, an LET threshold value, a Weibull function width parameter and a Weibull function shape parameter of a satellite sensitive device under heavy ion irradiation.
In the step (5), when the following conditions are simultaneously met, it is judged that the abnormality of the satellite sensitive device is caused by space high-energy particles:
a. according to the particle incidence position obtained in the step (1), corresponding to the position of the satellite sensitive device where the abnormality occurs;
b. according to the particle incidence time obtained in the step (1), corresponding to the time when the satellite sensitive device is abnormal;
c. and (4) calculating according to the step (4) to obtain the satellite sensitive device single event upset number larger than 1.
Compared with the prior art, the invention has the advantages that:
(1) the particle detector in the invention is only composed of 1 silicon semiconductor detector, and has simple structure. Because the single event upset effect depends on the LET value of the space particles, the LET can be measured by adopting 1 silicon semiconductor detector, and input data can be provided for calculating the single event upset digit of the device.
(2) The invention can obtain the incident position information of the space particles; the particle detector adopts a multi-unit structure, and the center of each unit is provided with a corresponding coordinate. When a particle is incident on one of the cells, only that cell will produce a signal. When the particle detector outputs signals, the corresponding unit coordinates are searched according to the serial numbers of the units, and the incident positions of the particles can be obtained.
(3) The satellite sensitive device and the particle detector in the invention have high relevance to the high-energy particle environment; by adopting the design of the monolithic particle detector, the size of the detector is designed to be equal to that of the satellite sensitive device, and the particle detector and the satellite sensitive device are closely installed in space, the high-energy particle environment suffered by the satellite sensitive device and the particle detector can be ensured to have high relevance.
The single-chip detector design adopted by the invention can effectively enlarge the detection angle range of the particles, and the particle detector and the sensitive device are tightly installed, so that the shielding thicknesses of the particles incident to the detector and the particles incident to the sensitive device are basically the same, and the LET value difference of the same particle in the detector and the sensitive device is smaller. By adopting the scheme of the invention, 70% of high-energy particles obtained by the measurement of the particle detector can be incident on the satellite sensitive device; the LET values of energetic particles in particle detectors and satellite sensitive devices differ by only 27%.
(4) The method can simply distinguish the influence of different spatial particles on the single particle effect of the sensitive device; the LET values of different types of particles in the space are different, and space electrons, protons and heavy ions can be simply distinguished by setting different thresholds according to LET value measurement data of the particle detector. The electrons basically do not produce single particle effect, can be directly eliminated, and mainly consider the influence of protons and heavy ions.
(5) The method determines the relevance of the on-orbit abnormality of the satellite sensitive device and the space high-energy particles; according to the quantitative relation between the single particle upset digit of the satellite sensitive device and the data of the particle detector, the position relation between the incident position of the particle and the sensitive device, and the time relation between the incident time of the particle and the time when the sensitive device is abnormal, the relevance between the on-orbit abnormality of the satellite sensitive device and the space high-energy particle can be judged.
Drawings
FIG. 1 is a flow chart of a satellite single event upset monitoring method based on a monolithic array particle detector, which is established by the invention;
FIG. 2 is a schematic diagram of a particle detector design;
FIG. 3 is a top view of the particle detector in positional relationship to a satellite sensor;
FIG. 4 is an elevation view of the particle detector in positional relationship to a satellite sensor;
FIG. 5 is a particle detector output signal processing scheme;
fig. 6 is a schematic diagram of joint transport simulation of a particle detector and a target device by using genant 4.
Detailed Description
The method of the present invention is explained with reference to the accompanying drawings.
As shown in fig. 1, a satellite single event upset monitoring method based on a monolithic array particle detector includes the following steps:
(1) particle detector design
The particle detector adopts a PIN silicon semiconductor detector, and the thickness of the detector is 0.03 cm. The PIN silicon semiconductor detector can obtain the particle deposition energy delta E, and according to the thickness d of the detector, the particle LET value can be obtained by adopting the following formula:
wherein, Delta E is the deposition energy of the space particles in the PIN silicon semiconductor detector and the unit is MeV; d is the thickness of the detector, and the unit is cm, and d is 0.03 cm; rho is the density of the detector material in mg/cm3For si-based semiconductors ρ 2.33 × 103mg/cm3。
The size of the particle detector and the size of the satellite sensitive device are in a 1:1 proportional relation, and the particle detector is of a multi-unit structure. Because the space proton flux is higher than the heavy ion flux by more than 2 orders of magnitude, in order to avoid the heavy ion signal to be submerged in the proton signal, a mode of separately measuring the proton and the heavy ion is adopted. One of the units of the detector is used for space proton measurement, and the other units are used for space heavy ion measurement. The particle detector should be as close as possible in space to the satellite sensitive device.
Figure 2 shows a 4 x 4 detector configuration of 16 cells, each cell having a side length of 4.5mm and a cell spacing of 0.1mm, with the top left detector being used for spatial proton measurements and the remaining cells being used for spatial heavy ion measurements.
Fig. 3 and 4 respectively show a top view and a front view of the corresponding relationship between the particle detector and the satellite sensitive device in the spatial position. The particle detector and the satellite sensitive device have the same size, and the particle detector and the satellite sensitive device are completely overlapped when viewed from the top. The distance between the two is as close as possible, and the distance between the two is 3mm in the front view of fig. 4.
The particle detector outputs a current pulse signal, and the current pulse signal passes through the charge sensitive preamplifier and the main amplifier to form a voltage pulse signal. The voltage pulse signal is stored and downloaded on the satellite through peak value holding and A/D conversion into digital quantity, as shown in FIG. 5.
The measurement data of the particle detector should contain the number of particles, the incident position and the time information in addition to the LET value parameters of the particles. The number of particles is obtained by counting the current pulses of the detector; the particle detector adopts a multi-unit structure, the center of each unit is provided with corresponding coordinates, when a particle is incident on one of the units, only the unit can generate a signal, when the particle detector outputs the signal, the corresponding unit coordinates are searched according to the serial number of the unit, and the incident position of the particle can be obtained; and acquiring the time information of the incidence of the high-energy particles by acquiring the time of signal generation in the particle detector.
(2) Method for identifying and processing different kinds of particles
Various types of particles such as electrons, protons, heavy ions and the like exist in a space environment, the main trigger of the single particle effect of the device is the protons and the heavy ions, and the electrons generally do not trigger the single particle effect, so that the detector should exclude electronic signals. The particle detector in the step (1) can obtain the LET value information of the particles, and different types of particles can be distinguished by comparing the LET values of the particles.
A) Electronic device
Reject less than 0.005MeV cm2The signal of/mg can shield the electronic signal.
B) Proton(s)
LET value (0.005-1) MeV-cm2Particles in the/mg range are treated according to proton, which causes a deviation of up to 15% in the proton flux.
The proton generates single event upset in the satellite sensitive device, which is related to energy, and the corresponding relation between the LET value of the proton and the energy is calculated by adopting a Bethe-bloch formula, so that the following table is obtained. Look up underTable, the corresponding proton energy E can be obtainedp。
C) Heavy ion
LET value higher than 1MeV cm2The particles/mg, analyzed for heavy ions, are less likely to produce single event upsets in the device below the LET value.
The single event upset generated by heavy ions in a satellite sensitive device is related to LET, and the device upset digit can be analyzed directly according to the LET value of the heavy ions.
(3) Establishing the relationship between the sensitive device and the number of particles in the particle detector and the LET value
By distinguishing different LET values in the particle detector, the particle number and LET value data of space protons and heavy ions are obtained. Because the satellite sensitive device and the particle detector cannot completely overlap in spatial position, the number of spatial particles and the LET value of the satellite sensitive device and the particle detector are different. The method is used for establishing the relationship between the number of particles in the sensitive device and the particle detector and the LET value, and is important basic data for obtaining the relationship between the single-particle upset digit of the satellite sensitive device and the measurement data of the particle detector.
The simulation model comprising the satellite sensitive device, the particle detector, the PCB and the single-machine shell is constructed by adopting Geant4 particle transport software, as shown in FIG. 6. And (3) simulating and analyzing the number of the space particles entering the satellite sensitive device and the particle detector and the difference of LET values of the particles in the satellite sensitive device and the particle detector by adopting a particle source distributed by a cosine law.
The simulation is carried out by using 8 common particles of H, He, C, N, O, Ne, Si and Fe, and the total flux of the 8 particles accounts for 99.8 percent of the total flux of the particles. The simulation result obtains two parameters of invalid proportion and detection efficiency, wherein the invalid proportion is the ratio of the number of particles which are incident to the detector but are not incident to the device to the number of particles which are incident to the device, and the detection efficiency is the ratio of the number of particles which are incident to the detector and the device to the number of particles which are incident to the device at the same time. The invalid ratio indicates the portion of the measurement result of the particle detector that is not incident on the device, and the detector efficiency indicates the portion of the measurement result of the particle detector that is incident on the device, as shown in the following table.
The simulation results show that about 30% of the measurement data of the particle detector is not incident on the device, and about 70% of the measurement data of the particle detector is incident on the device. Thus, when the particle detector obtains a high energy particle signal, there is a 70% probability that it will be incident on the device.
Meanwhile, the difference between the LET values of 8 particles between the particle detector and the satellite sensitive device is simulated, and the result is shown in the following table, and the difference between the LET values and the satellite sensitive device is within +/-27%.
| Serial number | Ion type | Minimum deviation of LET value (%) | Maximum deviation of LET value (%) |
| 1 | H | -20.9 | +24.8 |
| 2 | He | -8.4 | +26.9 |
| 3 | C | -15.3 | +20.7 |
| 4 | N | -10.3 | +6.0 |
| 5 | O | -14.3 | +1.3 |
| 6 | Ne | -8.5 | +17.8 |
| 7 | Si | -16.3 | +1.2 |
| 8 | Fe | -6.7 | +2.3 |
Through the simulation analysis, the relationship between the high-energy particle environment of the satellite sensitive device and the measurement data of the particle detector is determined, wherein 70% of the measurement data of the particle detector can be incident on the satellite sensitive device, and the LET value difference between the particle detector and the satellite sensitive device is within +/-27%.
(4) Establishing the relationship between the single-particle upset digit of the sensitive device and the measurement data of the particle detector
The proton and the heavy ion have different mechanisms for generating single event upset in the satellite sensitive device, so the method for analyzing the number of the single event upset generated by the proton and the heavy ion is different.
A) Proton(s)
The single event upset generated by protons in a satellite sensitive device is related to energy, and the single event upset bit number can be determined by adopting the following formula:
wherein n ispThe single event upset digit of the proton generated in the satellite sensitive device is bit. Eta is the probability of the particle to be incident on the sensitive device after the particle signal is obtained in the particle detector, and under the conditions of the particle detector and the installation condition designed by the invention, eta is 0.7. FpProton flux in cm obtained for on-orbit monitoring of particle detector-2·s-1. And N is the bit number of the satellite sensitive device, and the unit is bit. EpThe proton energy is obtained by table look-up according to the measurement value of the on-orbit LET value of the particle detector, and the unit is MeV. Lambda [ alpha ]1For the difference between the proton energy obtained by the particle detector and the proton energy in the satellite sensitive device, the lambda can be obtained by simulation analysis under the conditions of the particle detector and the installation condition1＝0.40。σsat_p、Eth、Wp、spRespectively is a saturated turnover section (unit is cm) of the satellite sensitive device under the irradiation of protons2The device comprises a/bit), a turnover threshold (unit is MeV), a Weibull function width parameter (unit is MeV) and a Weibull function shape parameter (dimensionless), wherein the four parameters are inherent parameters of a satellite sensitive device and are obtained through a ground proton accelerator single event test.
B) Heavy ion
The single event upset generated by heavy ions in a satellite sensitive device is related to LET, and the single event upset digit can be determined by adopting the following formula:
wherein n ishThe single event upset digit of the heavy ions generated in the satellite sensitive device is bit. Eta and N have the same meanings and values as those of the formula (2). Lambda [ alpha ]2For the difference between the LET value of heavy ions in the detector and the LET value in the sensitive device, lambda can be obtained by simulation analysis2＝0.27。FhHeavy ion flux in cm obtained for on-orbit monitoring of particle detector-2·s-1. LET is the measured value of the heavy ion LET obtained by the particle detector in an on-orbit way, and the unit is MeV cm2/mg。σsat_h、LETth、Wh、shRespectively is a saturated turnover section (unit is cm) of the satellite sensitive device under the irradiation of heavy ions2Bit), LET threshold (unit is MeV cm)2In mg), the Weibull function width parameter (in MeV cm)2The parameters are inherent parameters of the satellite sensitive device and are obtained through a ground heavy ion accelerator single particle test.
(5) Determining relevance of on-orbit abnormality of satellite sensitive device and space high-energy particles
After the satellite sensitive device is abnormal in orbit, when the particle detector measures and obtains the environmental data of the space high-energy particles, the following conditions are met, the abnormal condition of the satellite sensitive device caused by the space high-energy particles can be judged:
A) the incident position of the particles obtained in the step (1) can correspond to the position of the satellite sensitive device where the abnormality occurs.
B) The particle incidence time obtained in step (1) may correspond to the time when the satellite sensor device is abnormal.
C) And (4) calculating to obtain the satellite sensitive device single event upset number more than 1.
The invention has not been described in detail in part of the common general knowledge of those skilled in the art.
Claims (8)
1. A satellite single event upset monitoring method based on a monolithic array particle detector is characterized by comprising the following steps:
(1) designing a particle detector; the size of the particle detector and the size of the satellite sensitive device keep a 1:1 proportional relation, and the particle detector and the satellite sensitive device are close to each other in space;
(2) distinguishing different types of particles by comparing the LET values of the particles obtained by the particle detector;
(3) establishing a relation between the number of particles in the sensitive device and the particle detector and an LET value, and obtaining the number of the space particles entering the satellite sensitive device and the particle detector and the difference of the LET value of the particles in the satellite sensitive device and the particle detector;
(4) establishing the relation between the single event upset digit of the sensitive device and the measurement data of the particle detector, and calculating the single event upset digit n generated by the proton in the satellite sensitive devicepAnd the single event upset digit n generated by heavy ions in the satellite sensitive deviceh；
(5) After the satellite sensitive device is abnormal in orbit, measuring by a particle detector to obtain space high-energy particle environment data and judging whether the abnormality of the satellite sensitive device is related to the space high-energy particles;
in the step (5), when the following conditions are simultaneously met, it is judged that the abnormality of the satellite sensitive device is caused by space high-energy particles:
a. according to the particle incidence position obtained in the step (1), corresponding to the position of the satellite sensitive device where the abnormality occurs;
b. according to the particle incidence time obtained in the step (1), corresponding to the time when the satellite sensitive device is abnormal;
c. and (4) calculating according to the step (4) to obtain the satellite sensitive device single event upset number larger than 1.
2. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 1, wherein the particle detector is a PIN silicon semiconductor detector, and the PIN silicon semiconductor detector obtains the LET value of the particle by the following formula according to the detector thickness d:
wherein, Delta E is the deposition energy of the space particles in the PIN silicon semiconductor detector; d is the detector thickness; ρ is the density of the detector material.
3. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 2, wherein the measurement data of the particle detector comprises LET value parameters, particle number, incidence position and time information of particles; the number of particles is obtained by counting the current pulses of the detector; the particle detector adopts a multi-unit structure, wherein one unit is used for space proton measurement, the other units are used for space heavy ion measurement, the center of each unit is provided with a corresponding coordinate, and when the particle detector outputs a signal, the corresponding unit coordinate is searched according to the serial number of the unit to obtain the incident position of the particle; and acquiring the time information of the incidence of the high-energy particles by acquiring the time of signal generation in the particle detector.
4. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 2 or 3, wherein the particle detector outputs a current pulse signal, and the current pulse signal passes through a charge sensitive preamplifier and a main amplifier to form a voltage pulse signal; the voltage pulse signal is stored and downloaded on the satellite through peak value holding and A/D conversion into digital quantity.
5. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 4, wherein the specific method in the step (2) is as follows:
abandonLess than 0.005MeV cm2A signal of/mg, a signal of shielding electrons;
the LET value of the particles is 0.005 MeV-cm2/mg～1MeV·cm2Dividing particles in the range of/mg into protons, and obtaining corresponding proton energy E according to the measured proton LET valuep；
The LET value of the particles is higher than 1 MeV-cm2The/mg particles are divided into heavy ions and the plates are analyzed for flipping numbers according to the LET value of the heavy ions.
6. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 5, wherein the specific method in step (3) is as follows:
the particle number and LET value data of space protons and heavy ions are obtained by distinguishing different LET values in the particle detector;
the method comprises the steps of constructing a simulation model containing a satellite sensitive device, a particle detector, a PCB (printed Circuit Board) and a single-machine shell by adopting Geant4 particle transport software, and performing simulation analysis on the number of space particles entering the satellite sensitive device and the particle detector and the difference of the LET values of the particles in the satellite sensitive device and the particle detector by adopting a particle source distributed by a cosine law.
7. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 6, wherein the number n of single event upset bits generated by protons in the satellite sensitive devicep：
Wherein, eta is the probability that the particles are incident on the sensitive device after the particle signals are obtained in the particle detector; fpThe proton flux obtained by the particle detector on-track monitoring; n is the bit number of the satellite sensitive device; epThe proton energy is obtained by looking up a table according to the measured value of the on-orbit LET value of the particle detector; lambda [ alpha ]1As a particle detectorThe difference between the obtained proton energy and the proton energy in the satellite sensitive device; sigmasat_p、Eth、Wp、spThe method comprises the following steps of respectively obtaining a saturation turnover section, a turnover threshold, a Weibull function width parameter and a Weibull function shape parameter of a satellite sensitive device under proton irradiation.
8. The satellite single event upset monitoring method based on the monolithic array particle detector as claimed in claim 7, wherein the single event upset bit number n generated by heavy ions in the satellite sensitive deviceh：
Wherein, FhHeavy ion flux obtained by on-orbit monitoring of a particle detector; lambda [ alpha ]2The LET value of the heavy ions in the detector is different from the LET value of the heavy ions in the sensitive device, and the LET is the LET measured value of the heavy ions obtained by the particle detector in an on-track manner; sigmasat_h、LETth、Wh、shThe method comprises the following steps of respectively obtaining a saturation turnover section, an LET threshold value, a Weibull function width parameter and a Weibull function shape parameter of a satellite sensitive device under heavy ion irradiation.
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| CN111948701B (en) * | 2020-07-08 | 2022-11-08 | 中国科学院国家空间科学中心 | Single event effect detector |
| CN113109859B (en) * | 2021-04-08 | 2024-04-30 | 西北核技术研究所 | Method for obtaining low LET value heavy ion single event upset section |
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| CN113772121A (en) * | 2021-09-01 | 2021-12-10 | 中国人民解放军63921部队 | Satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing |
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| CN101907662B (en) * | 2009-06-04 | 2012-04-25 | 中国科学院空间科学与应用研究中心 | Single-event effect detection device and method |
| US8639992B2 (en) * | 2011-05-16 | 2014-01-28 | GlobalFoundries, Inc. | Soft error rate detector |
| US8397191B1 (en) * | 2011-11-07 | 2013-03-12 | Xilinx, Inc. | Determining failure rate from circuit design layouts |
| CN103729503B (en) * | 2013-12-23 | 2017-03-15 | 中国空间技术研究院 | A kind of in-orbit single event upset rate predicting method of the device based on composite sensing volume-based model |
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