CN108802797B

CN108802797B - On-orbit particle detection and single event effect monitoring system

Info

Publication number: CN108802797B
Application number: CN201810611919.2A
Authority: CN
Inventors: 肖婷; 刘金胜; 王博; 潘睿元; 郝晓云; 邵思霈
Original assignee: Shandong Institute of Space Electronic Technology
Current assignee: Shandong Institute of Space Electronic Technology
Priority date: 2018-06-14
Filing date: 2018-06-14
Publication date: 2022-06-21
Anticipated expiration: 2038-06-14
Also published as: CN108802797A

Abstract

The invention discloses an on-orbit particle detection and single event effect monitoring system, wherein a space radiation environment detection and radiation effect monitoring module is integrated into the same system, so that the single event effect can be monitored in an orbit, and meanwhile, particle information (including energy, type, LET value and the like) which is possible to induce the single event effect can be obtained, and the on-orbit particle detection and single event effect monitoring system has important significance for the research of a single event effect generation mechanism; by adopting a multifunctional integrated design, the system not only meets the detection requirements of various particles, but also can monitor the radiation effect, and is favorable for the light and small design requirements of the spacecraft.

Description

On-orbit particle detection and single event effect monitoring system

Technical Field

The invention belongs to the technical field of space radiation environment detection, and particularly relates to an on-orbit particle detection and single event effect monitoring system.

Background

The space radiation environment is a main environmental factor causing performance degradation and even failure of spacecraft materials, components and the like. The high-energy charged particles generate a large amount of charged particles in a sensitive area of the device to induce a single-particle effect, so that the phenomena of single-particle upset, single-particle transient, single-particle locking, even single-particle burnout and the like of the device are caused, and the on-orbit safe and reliable operation of the spacecraft is threatened.

The spatial environment study is the basis of the radiation effect study. Currently, the basic principle of the detection of spatially charged particles is indirect detection based on the ionization or excitation of charged particles and material atoms. The basic flow is as follows: incident charged particles interact with the detector material; the single particle effect research is mainly carried out in a ground laboratory through methods such as simulation, irradiation test and the like, and in practice, the space environment is very complex, the condition of the ground laboratory is greatly different from the space radiation environment, and the actual space environment is difficult to simulate.

Disclosure of Invention

In view of the above, an object of the present invention is to provide an in-orbit particle detection and single event effect monitoring system, which can acquire particle information that may induce a single event effect while monitoring the single event effect in the in-orbit.

The on-orbit particle detection and single event effect monitoring system sequentially comprises an aluminum film (1), a first silicon semiconductor sensor (2), a single event effect monitoring module (3), a second silicon semiconductor sensor (4) and a cesium iodide scintillator detector (5) from top to bottom.

Preferably, the sensitive region of the device to be tested in the single event effect monitoring module (3) is aligned with the sensitive region of the first silicon semiconductor sensor (2).

Preferably, the thickness of the first silicon semiconductor sensor (2) is as thin as possible.

The invention has the following beneficial effects:

1) the system integrates the space radiation environment detection and radiation effect monitoring module into the same system, can monitor the single event effect on track and simultaneously acquire particle information (including energy, type, LET value and the like) which possibly induces the single event effect, and has important significance for the research of the single event effect generation mechanism;

2) the detection objects of the traditional detector are single, even if the detection objects are multiple, multiple groups of probes are adopted, different objects are detected by different probes, and therefore the size and the weight of the detector are greatly increased. By adopting a multifunctional integrated design, the system not only meets the detection requirements of various particles, but also can monitor the radiation effect, and is favorable for the light and small design requirements of the spacecraft.

Drawings

FIG. 1 is a schematic structural diagram of an on-orbit particle detection and single event effect monitoring system according to the present invention;

the system comprises a 1-aluminum film, a 2-first silicon semiconductor detector, a 3-single event effect monitoring module, a 4-second silicon semiconductor detector and a 5-cesium iodide scintillator detector.

Detailed Description

The invention is described in detail below by way of example with reference to the accompanying drawings.

The invention provides an on-orbit particle detection and single event effect monitoring system aiming at the integrated requirement of space particle detection and single event effect monitoring. According to the invention, through the integrated design of the silicon semiconductor detector, the scintillator detector and the single event effect monitoring module, the problem that the particle information inducing the effect cannot be accurately acquired in the current in-orbit single event effect test is solved, important in-orbit actual measurement data can be provided for the single event effect research, and the method has important significance for the radiation-resistant reinforcement technology research of the spacecraft. Meanwhile, due to the multifunctional integrated design, the volume and the weight occupied by the equipment are reduced, and the design requirement of light and small spacecraft is met.

As shown in fig. 1, the on-orbit particle detection and single event effect monitoring system of the present invention sequentially comprises an aluminum film 1, a first silicon semiconductor sensor 2, a single event effect monitoring module 3, a second silicon semiconductor sensor 4, and a cesium iodide scintillator detector 5 from top to bottom.

When charged particles are incident into a substance, due to coulomb interaction with orbital electrons of substance atoms, partial energy of the charged particles is lost, so that the substance atoms are excited or ionized, and the energy of the particles is lost, which can be expressed as follows:

where M is the mass number of the incident particle, Z is the atomic number of the absorbing material, and k' is a constant, so that at a selected energyIn this range, when a specific charged particle is incident on the detector, Δ E · E ∞ MZ thereof²That is, as long as the total energy E and Δ E of the charged particles are detected, the MZ can be calculated². High-energy particle identification methods generally employ a telescopic detection system, i.e., a Δ E-E detector, and generally employ a measurement system formed by combining two or more detectors, which utilizes the difference in energy loss rate of different charged particles in the detectors to identify the components of the particles. The semiconductor detector and the cesium iodide scintillator detector 5 are combined to carry out space charged particle detection, and the single event effect monitoring module 3 is integrated in the detection system, so that the integrated design of space charged particle detection and single event effect monitoring is realized. The aluminum film 1 is used for blocking low-energy electrons and protons with high flux in the space, the first silicon semiconductor sensor 2 is used for measuring the deposition energy delta E of particles, and in order to better monitor the single-particle effect, the thickness of the first silicon sensor is as thin as possible, so that the energy loss of the particles in the first silicon semiconductor sensor is reduced. The second silicon semiconductor detector 4 and the cesium iodide scintillator detector 5 are used for measuring total incident particle energy E, and the single event effect monitoring module 3 is used for monitoring whether a single event effect occurs in real time. The single event effect monitoring module is arranged behind the first silicon semiconductor sensor 2, wherein the single event effect sensitive area is aligned with the silicon semiconductor sensitive area as much as possible.

The working principle of the whole system is as follows: when the energy of the particles incident in the field range of the detector is large enough, the particles sequentially pass through the aluminum film 1, the first silicon sensor 2, the single event effect monitoring module 3, the second silicon sensor 4 and the cesium iodide scintillator detector 5. The incident particles deposit a part of energy in the aluminum film; then, delta E measurement is carried out according to the trigger signal in the first silicon sensor 2; after penetrating through the first silicon sensor, the particles are incident to a single event effect monitoring module 3, the single event effect is possibly induced, and the module carries out real-time monitoring and recording of the single event effect; if the particle energy is large enough, the incident particle energy is incident to the second silicon semiconductor sensor after penetrating through the single event effect monitoring module, the second silicon semiconductor sensor 4 and the cesium iodide scintillator detector 5 enable the incident particle energy to be finally and completely deposited, and the single event effect monitoring module 3 is used for monitoring whether the incident particle induces the single event effect. The energy loss of the particles in the single event effect monitoring module 3 can be estimated through simulation, and the total energy E of the incident particles can be estimated according to the deposition energy measured values of the particles in the

silicon sensors

2 and 4 and the cesium iodide detector 5. Further, information such as the type of particles and the LET value can be obtained by the Δ E-E method. In the process, the single event effect module 3 in the detector monitors and records whether the single event effect occurs, and meanwhile, the detector records information (energy, components and the like) of incident particles, so that on-orbit data has important significance for researching the characteristics of the single event effect induced by the space charged particles.

According to the above description, the charged particles in different energy ranges and the radiation environment thereof can be detected and researched by changing the thicknesses of the semiconductor detector and the scintillator detector. In addition, the single-particle effect monitoring module is replaced by other radiation effect modules (such as charge and discharge effects), and the on-orbit test research on the charge and discharge effects can be carried out. Other related variations are not specifically enumerated herein, and obvious variations or modifications derived therefrom are intended to fall within the scope of the present invention.

Claims

1. The on-orbit particle detection and single event effect monitoring system is characterized by sequentially comprising an aluminum film (1), a first silicon semiconductor sensor (2), a single event effect monitoring module (3), a second silicon semiconductor sensor (4) and a cesium iodide scintillator detector (5) from top to bottom.

2. An on-orbit particle detection and single event effect monitoring system as claimed in claim 1, wherein the sensitive region of the device under test in the single event effect monitoring module (3) is aligned with the sensitive region of the first silicon semiconductor sensor (2).

3. An in-orbit particle detection and single event effect monitoring system according to claim 1, wherein the thickness of the first silicon semiconductor sensor (2) is as thin as possible.