CN116337607A - Material performance testing device and method - Google Patents
Material performance testing device and method Download PDFInfo
- Publication number
- CN116337607A CN116337607A CN202310359936.2A CN202310359936A CN116337607A CN 116337607 A CN116337607 A CN 116337607A CN 202310359936 A CN202310359936 A CN 202310359936A CN 116337607 A CN116337607 A CN 116337607A
- Authority
- CN
- China
- Prior art keywords
- electron microscope
- test
- sample
- transmission shaft
- transmission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 204
- 239000000463 material Substances 0.000 title claims abstract description 85
- 238000000034 method Methods 0.000 title abstract description 13
- 230000005540 biological transmission Effects 0.000 claims abstract description 147
- 230000007246 mechanism Effects 0.000 claims description 37
- 238000007789 sealing Methods 0.000 claims description 13
- 239000000498 cooling water Substances 0.000 claims description 12
- 239000011553 magnetic fluid Substances 0.000 claims description 5
- 230000008569 process Effects 0.000 abstract description 5
- 230000009931 harmful effect Effects 0.000 abstract description 2
- 108010066114 cabin-2 Proteins 0.000 description 25
- 230000033001 locomotion Effects 0.000 description 8
- 230000008859 change Effects 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 238000012512 characterization method Methods 0.000 description 5
- 230000006835 compression Effects 0.000 description 5
- 238000007906 compression Methods 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 4
- 238000011065 in-situ storage Methods 0.000 description 4
- 238000011056 performance test Methods 0.000 description 4
- 238000004626 scanning electron microscopy Methods 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000009661 fatigue test Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000001808 coupling effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- -1 heat Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/04—Chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a material performance testing device which comprises an observation unit, a testing unit and a testing unit. When the microstructure of the sample is observed by using the scanning electron microscope, the test cavity is communicated with the electron microscope observation cabin, and the transmission assembly is utilized to drive the clamp and the sample to move into the electron microscope observation cabin from the test cavity, so as to observe the microstructure of the sample. Meanwhile, the invention also provides a material performance testing method, which simulates the real service environment of the material, can simulate the real service environment of the material, so that the tested material performance has reality and referential property, and in the performance testing process, the environment between the testing cavity and the electron microscope observation cabin can be completely isolated, and no harmful effect is generated on the scanning electron microscope.
Description
Technical Field
The invention relates to the technical field of material performance research, in particular to a device and a method for testing material performance.
Background
At present, the research on the material performance is still mainly carried out by a traditional method, namely, the performance test and the microstructure characterization of the material are respectively and independently carried out, and then the data of the performance test and the microstructure characterization of the material are combined to infer the internal relation between the mechanical property of the material and the microstructure of the material. Scanning Electron Microscopy (SEM) is one of the main tools for testing the microstructure of a material, and SEM can perform cross-scale characterization on macroscopic (centimeter-level) samples from millimeter to nanometer resolution level, and is an important means for revealing microscopic multi-level structure characteristics (such as grain size, phase distribution, interface characteristics, crystal orientation, composition, impurity distribution and the like) of the material.
The existing instruments integrated with the SEM are placed in the SEM cavity or introduced through a flange, the pressure atmosphere of an Environmental Scanning Electron Microscope (ESEM) can only be realized by using water vapor, and the existing instruments are still limited in material research, so that long-time continuous testing cannot be realized, and the service environment of the material cannot be simulated.
Therefore, how to change the current situation that in the prior art, an instrument integrated with a scanning electron microscope is placed in a cavity of the scanning electron microscope, so that long-time observation of materials and simulation of the service environment of the materials cannot be realized, and performance analysis of the materials is affected becomes a problem to be solved urgently by the person skilled in the art.
Disclosure of Invention
The invention aims to provide a material performance testing device and method, which are used for solving the problems in the prior art, so that the testing device can simulate the real service environment of a material and complete long-time observation, and provides convenience for researching the dynamic evolution relationship of the mechanical behavior of the material and the microstructure of the material.
In order to achieve the above object, the present invention provides the following solutions: the invention provides a material performance testing device, comprising:
the observation unit comprises a scanning electron microscope, and the scanning electron microscope is provided with an electron microscope observation cabin;
the test unit comprises a test mechanism, the test mechanism is connected with the scanning electron microscope, the test mechanism is provided with a test cavity, and the electron microscope observation cabin can be communicated with the test cavity;
the test unit comprises a transmission assembly and a clamp capable of fixing a sample to be tested, the electron microscope observation cabin and the test cavity can both contain the clamp and the sample, the transmission assembly is connected with the clamp, and the transmission assembly can drive the clamp to reciprocate between the electron microscope observation cabin and the test cavity.
Preferably, the material performance testing device further comprises a scanning base and a mounting base, wherein the scanning electron microscope is arranged on the scanning base; the test unit is arranged on the mounting base, and the transmission assembly is slidably arranged on the mounting base.
Preferably, the test unit further comprises a transmission support, a first driver and a second driver, the transmission assembly is slidably arranged on the transmission support, the first driver is in transmission connection with the transmission assembly, the transmission support is slidably arranged on the mounting base, the second driver is in transmission connection with the transmission support, the sliding direction of the transmission assembly is parallel to the connection line direction of the electron microscope observation cabin and the test cavity, and the sliding direction of the transmission assembly is perpendicular to the sliding direction of the transmission support.
Preferably, the clamp comprises a first clamping block and a second clamping block, and the first clamping block and the second clamping block are matched to fix the sample;
the transmission assembly comprises a fixed support, an inner transmission shaft and an outer transmission shaft, wherein the fixed support is connected with the outer transmission shaft, the outer transmission shaft is of a hollow structure, the outer transmission shaft is sleeved outside the inner transmission shaft in a sliding mode, one end of the inner transmission shaft, which is far away from the fixed support, is connected with the first clamping block, one end of the outer transmission shaft, which is far away from the fixed support, is connected with the second clamping block, and the relative sliding direction of the inner transmission shaft and the outer transmission shaft is parallel to the connecting line direction of the first clamping block and the second clamping block.
Preferably, a force sensor is arranged between the first clamping block and the second clamping block, the second clamping block is connected with the outer transmission shaft by using a sensor bracket, and the force sensor is arranged on the sensor bracket.
Preferably, the transmission assembly further comprises a third driver, the third driver is fixed on the fixed support, the third driver is in transmission connection with the inner transmission shaft, and a magnetic fluid sealing element is arranged between the inner transmission shaft and the fixed support.
Preferably, the transmission assembly further comprises a corrugated pipe, the outer transmission shaft is connected with the testing mechanism in a sliding mode through the corrugated pipe, and a sealing ring is arranged between the outer transmission shaft and the corrugated pipe.
Preferably, the testing mechanism is of a split type structure, and an observation window is arranged on the testing mechanism;
the test mechanism is also connected with a cooling water pipe, and the test cavity is communicated with an external cooling water source by using the cooling water pipe.
Preferably, the testing mechanism is detachably connected with the scanning electron microscope, and a gate valve is arranged between the electron microscope observation cabin and the testing cavity; the electronic microscope observation cabin is internally provided with a support bracket, and the height of the support bracket can be adjusted and props against the clamp.
The invention also provides a material performance testing method, which comprises the following steps of:
in the testing cavity, fixing a sample to be tested by using the clamp, simulating the service environment of the sample, and carrying out mechanical testing on the sample;
and driving the clamp and the sample to move into the electron microscope observation cabin by using the transmission assembly to observe the microstructure of the sample.
Compared with the prior art, the invention has the following technical effects:
when the material performance testing device works, a sample to be tested is fixed in the testing cavity by using the clamp, at the moment, the testing cavity is not communicated with the electron microscope observation cabin, and the atmosphere of nitrogen, oxygen, hydrogen and the like can be introduced into the testing cavity so as to simulate the real service environment of the material and perform mechanical tests such as stretching, compression, creep deformation, fatigue and the like on the sample. Because the material does not need to observe the microstructure all the time when performance test is carried out, the structural change of the material is staged and has no obvious change for a long time, if the instrument is always placed in the scanning electron microscope to observe the microstructure change, the utilization rate of the scanning electron microscope can be greatly reduced, and unnecessary resource waste is caused. When the mechanical property test of the sample in the test cavity reaches a certain stage or cycle, and the microscopic structure of the sample is required to be observed by using the scanning electron microscope, the test cavity is communicated with the electron microscope observation cabin, and the transmission assembly is utilized to drive the clamp and the sample to move from the test cavity to the electron microscope observation cabin so as to observe the microscopic structure of the sample. The material performance testing device provided by the invention can simulate the real service environment of the material, so that the tested material performance has reality and referential property, and in the performance testing process, the environment between the testing cavity and the electron microscope observation cabin can be completely isolated, and no harmful effect is generated on the scanning electron microscope.
Meanwhile, the invention also provides a material performance testing method, which is used for simulating the real service environment of the material by using the material performance testing device, completing long-time observation, providing convenience for researching the dynamic evolution relation of the mechanical behavior and the microstructure of the material, and having important significance for revealing the damage mechanisms such as dynamic evolution of the real-time mechanical behavior and the microstructure, initiation and expansion of microcracks, oxidation corrosion and the like in the service process of the material.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a front view of a material property testing apparatus of the present invention;
FIG. 2 is a top view of a material property testing apparatus of the present invention;
FIG. 3 is a schematic diagram of a test unit and a structure of the test unit of the material property testing apparatus according to the present invention;
FIG. 4 is a top view of a test cell and a test cell of the material property test apparatus of the present invention;
FIG. 5 is a schematic diagram of the structure of a sample entering an electron microscope observation cabin when the material performance testing device of the invention works;
FIG. 6 is a schematic diagram of a test unit and a part of the test unit of the material property testing apparatus according to the present invention.
Wherein 100 is an observation unit, 200 is a test unit, and 300 is a test unit;
1 is a scanning electron microscope, 2 is an electron microscope observation cabin, 3 is a test mechanism, 4 is a test cavity, 5 is a transmission component, 501 is a fixed bracket, 502 is an inner transmission shaft, 503 is an outer transmission shaft, 6 is a clamp, 601 is a first clamping block, 602 is a second clamping block, 603 is a force sensor, 604 is a sensor bracket, 605 is a sensor bottom plate, 7 is a scanning base, 8 is a mounting base, 801 is a mounting bracket, 802 is a mounting platform, 803 is a vibration isolator, 9 is a transmission bracket, 10 is a first driver, 11 is a second driver, 12 is a transmission ground stand, 13 is a third driver, 14 is a magnetic fluid sealing element, 15 is a corrugated pipe, 16 is an observation window, 17 is a cooling water pipe, 18 is a support bracket, 19 is a controller, 20 is a gate valve, 21 is a sample, 22 is a support base, 23 is a fixed plate, and 24 is an elastic piece.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention aims to provide a material performance testing device and method, which are used for solving the problems in the prior art, so that the testing device can simulate the real service environment of a material and complete long-time observation, and provides convenience for researching the dynamic evolution relationship of the mechanical behavior of the material and the microstructure of the material.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
The invention provides a material performance testing device, which comprises an observation unit 100, a testing unit 200 and a testing unit 300, wherein the observation unit 100 comprises a scanning electron microscope 1, and the scanning electron microscope 1 is provided with an electron microscope observation cabin 2; the test unit 200 comprises a test mechanism 3, the test mechanism 3 is connected with the scanning electron microscope 1, the test mechanism 3 is provided with a test cavity 4, and the electron microscope observation cabin 2 can be communicated with the test cavity 4; the test unit 300 comprises a transmission assembly 5 and a clamp 6 capable of fixing a sample 21 to be tested, wherein the clamp 6 and the sample 21 can be contained in both the electron microscope observation cabin 2 and the test cavity 4, the transmission assembly 5 is connected with the clamp 6, and the transmission assembly 5 can drive the clamp 6 to reciprocate between the electron microscope observation cabin 2 and the test cavity 4.
When the material performance testing device disclosed by the invention works, a sample 21 to be tested is fixed in the testing cavity 4 by using the clamp 6, and at the moment, the testing cavity 4 is not communicated with the electron microscope observation cabin 2, and the atmosphere such as nitrogen, oxygen, hydrogen and the like can be introduced into the testing cavity 4 so as to simulate the real service environment of the material and perform mechanical tests such as stretching, compression, creep, fatigue and the like on the sample 21. Because the material does not need to observe the microstructure all the time when performance test is carried out, the structural change of the material is staged and does not have obvious change for a long time, if the instrument is always placed in the scanning electron microscope 1 to observe the microstructure change, the utilization rate of the scanning electron microscope 1 can be greatly reduced, and unnecessary resource waste is caused. When the mechanical property test of the sample 21 in the test cavity 4 reaches a certain stage or cycle and the microstructure of the sample is observed by using the scanning electron microscope 1, the test cavity 4 is communicated with the electron microscope observation cabin 2, and the transmission assembly 5 is utilized to drive the clamp 6 and the sample 21 to move into the electron microscope observation cabin 2 from the test cavity 4, so as to observe the microstructure of the sample 21. The material performance testing device provided by the invention can simulate the real service environment of the material, so that the tested material performance has reality and referential property, and in the performance testing process, the environment between the testing cavity 4 and the electron microscope observation cabin 2 can be completely isolated, and the scanning electron microscope 1 is not affected.
The material performance testing device also comprises a scanning base 7 and an installation base 8, wherein the scanning electron microscope 1 is arranged on the scanning base 7, and the scanning base 7 can provide stable support for the scanning electron microscope 1; correspondingly, the test unit 200 is arranged on the mounting base 8, the transmission assembly 5 is slidably arranged on the mounting base 8, and the independent scanning base 7 and the mounting base 8 are arranged, so that the height of the scanning electron microscope 1 can be conveniently adjusted, and the smooth test and observation can be ensured. In practical application, the mounting base 8 comprises a mounting bracket 801 and a mounting platform 802, the mounting platform 802 is arranged at the top of the mounting bracket 801, and a vibration isolator 803 is arranged between the mounting bracket 801 and the mounting platform to eliminate vibration, ensure the stability of the mounting platform 802, and eliminate the imaging influence of the test unit 200 and the test unit 300 on the scanning electron microscope 1. In addition, the mounting platform 802 can be made of an orifice plate, so that the test unit 200 and the transmission assembly 5 can be conveniently adjusted in mounting position, and the flexibility and adaptability of the device are improved. In practical application, the bottoms of the scanning base 7 and the installation base 8 are provided with foundation bolts, so that the heights of the scanning base 7 and the installation base 8 can be conveniently adjusted and leveled.
For the convenience of controlling the movement of the transmission assembly 5, the test unit 300 further includes a transmission bracket 9, a first driver 10 and a second driver 11, the transmission assembly 5 is slidably disposed on the transmission bracket 9, the first driver 10 is in transmission connection with the transmission assembly 5, the transmission bracket 9 is slidably disposed on the mounting base 8, the second driver 11 is in transmission connection with the transmission bracket 9, the sliding direction of the transmission assembly 5 is parallel to the connection line direction of the electron microscope observation cabin 2 and the test cavity 4, and the sliding direction of the transmission assembly 5 is perpendicular to the sliding direction of the transmission bracket 9. The first driver 10 can drive the transmission support 9 to slide reciprocally, the second driver 11 can drive the transmission assembly 5 to slide reciprocally, so that the transmission assembly 5 slides in a plane parallel to the mounting platform 802, the clamp 6 and the sample 21 are driven to move between the electron microscope observation cabin 2 and the test cavity 4, the positions of the clamp 6 and the sample 21 are adjusted, and the scanning electron microscope 1 is ensured to observe the microstructure of the sample 21 normally. It should be further explained that, in this embodiment, the transmission ground stand 12 is fixed on the mounting platform 802, and the transmission bracket 9 is slidably disposed on the transmission ground stand 12; the first driver 10 and the second driver 11 can be motors, and in order to further ensure the motion reliability of the transmission assembly 5, ball screw transmission mechanisms are arranged between the transmission support 9 and the transmission ground stand 12 and between the transmission support 9 and the transmission assembly 5, so that the motion stability of the device is improved.
The clamp 6 includes a first clamping block 601 and a second clamping block 602, where the first clamping block 601 and the second clamping block 602 cooperate to fix the sample 21, and simultaneously, the first clamping block 601 and the second clamping block 602 can apply an acting force to the sample 21 to perform mechanical tests such as stretching, compression, creep, fatigue, and the like.
Specifically, the transmission assembly 5 includes a fixing bracket 501, an inner transmission shaft 502 and an outer transmission shaft 503, where the fixing bracket 501 is connected with the outer transmission shaft 503, the outer transmission shaft 503 is of a hollow structure, the outer transmission shaft 503 is slidably sleeved outside the inner transmission shaft 502, one end of the inner transmission shaft 502 away from the fixing bracket 501 is connected with the first clamping block 601, one end of the outer transmission shaft 503 away from the fixing bracket 501 is connected with the second clamping block 602, the relative sliding direction of the inner transmission shaft 502 and the outer transmission shaft 503 is parallel to the connecting line direction of the first clamping block 601 and the second clamping block 602, the inner transmission shaft 502 and the outer transmission shaft 503 slide relatively along the axis, so that the distance between the first clamping block 601 and the second clamping block 602 can be adjusted, and the transmission assembly 5 can be used to drive the first clamping block 601 to apply force to the sample 21 to perform mechanical test while adapting to various types of samples 21.
In order to improve the test accuracy and the controllable degree of mechanical test, a force sensor 603 is arranged between a first clamping block 601 and a second clamping block 602, the second clamping block 602 is connected with an outer transmission shaft 503 by using a sensor bracket 604 and a sensor bottom plate 605, the force sensor 603 is arranged in a space surrounded by the sensor bracket 604 and the sensor bottom plate 605, the force sensor 603 can monitor the acting force applied by a clamp 6 to a sample 21, the sensor bracket 604 is connected with the outer transmission shaft 503, the movement of the force sensor 603 in the monitoring process is avoided, and the accuracy of a monitoring result is ensured.
Correspondingly, the transmission assembly 5 further comprises a third driver 13, the third driver 13 is fixed on the fixed support 501, the third driver 13 is in transmission connection with the inner transmission shaft 502, a magnetic fluid sealing element 14 is arranged between the inner transmission shaft 502 and the fixed support 501, the third driver 13 can select a direct current servo motor and an electric cylinder, the direct current servo motor and the electric cylinder drive the inner transmission shaft 502 to move, the movement accuracy of the inner transmission shaft 502 is improved, the electric cylinder is used for driving, the load output is large, the operation is stable, the function tests of stretching, compression, creep, fatigue and the like can be realized, the fatigue test frequency is adjustable, the adjusting range is 0.5 Hz-1000 Hz, and the fatigue test of low cycle, high cycle and ultra-high cycle can be completed. The magnetic fluid sealing element 14 is arranged at the same time so as to ensure the tightness between the inner transmission shaft 502 and the outer transmission shaft 503, further ensure the air tightness in the test cavity 4 and avoid leakage when simulating the real service environment of the material.
In this embodiment, the transmission assembly 5 further includes a bellows 15, the outer transmission shaft 503 is slidably connected to the testing mechanism 3 by using the bellows 15, a sealing ring is disposed between the outer transmission shaft 503 and the bellows 15, the bellows 15 can stretch to adapt to the depth of the transmission assembly 5 extending into the testing cavity 4, the sealing ring ensures the tightness between the outer transmission shaft 503 and the testing mechanism 3, and the sealing ring can be a lip-shaped sealing ring, so that the tightness is further enhanced. Referring to fig. 6 in detail, one end of the bellows 15 is connected with the testing mechanism 3, one end of the bellows 15 far away from the testing mechanism 3 and the sealing ring are fixed by the supporting base 22, the outer transmission shaft 503 slidably passes through the sealing ring and the bellows 15 and then stretches into the testing cavity 4, the supporting base 22 is fixed on the transmission bracket 9, in addition, the testing mechanism 3 is connected with the fixing plates 23, the two fixing plates 23 are arranged on two sides of the supporting base 22, and the elastic pieces 24 are arranged between the fixing plates 23 and the supporting base 22, in the process of reciprocating movement of the transmission assembly 5, the bellows 15, the supporting base 22 and the fixing plates 23 are matched while ensuring air tightness, vibration caused by reciprocating movement of the transmission assembly 5 can be adapted, a certain movement buffer space is provided for the testing mechanism 3, and the working reliability of the device is further improved.
More specifically, the testing mechanism 3 is of a split structure, so that the sample 21 is conveniently placed in the testing mechanism 3, and the observation window 16 is arranged on the testing mechanism 3, so that convenience is brought to operators in observing the state of the sample 21.
In addition, an in-situ heating element can be arranged in the test cavity 4, and the in-situ heating element can be used for heating the sample 21 in the test cavity 4 during testing, so that the coupling effect of applying force to the material, namely heat, atmosphere and time is realized, and the simulation of the real service environment of the material is facilitated. In order to eliminate the temperature rise brought by high-temperature test, the test mechanism 3 is also connected with a cooling water pipe 17, the test cavity 4 is communicated with an external cooling water source by using the cooling water pipe 17, and in practical application, cooling is realized by introducing cooling water into the test cavity 4 by using the cooling water pipe 17, and at the moment, the test cavity 4 is isolated from the electron microscope observation cabin 2, so that damage to the scanning electron microscope 1 is avoided.
In addition, the testing mechanism 3 can be detachably connected with the scanning electron microscope 1, so that the scanning electron microscope 1 can be used independently, the utilization rate of the scanning electron microscope 1 is improved, in practical application, the flange of the scanning electron microscope 1 and the testing mechanism 3 can be connected by using a connecting pipe, and the flange is fixed by using a clamp, so that the connection and the disassembly are convenient. In order to control the communication state between the electron microscope observation cabin 2 and the test cavity 4 conveniently, a gate valve 20 is arranged between the electron microscope observation cabin 2 and the test cavity 4. It should be further noted that, the support bracket 18 is disposed in the electron microscope observation cabin 2, the height of the support bracket 18 can be adjusted and offset with the clamp 6, when the transmission component 5 drives the clamp 6 and the sample 21 to enter the electron microscope observation cabin 2, the support bracket 18 is adjusted to rise so as to support the clamp 6 and the sample 21, so that vibration of the clamp 6 and the sample 21 caused by the cantilever structure of the transmission component 5 is avoided, stability of the sample 21 is improved, and guarantee is provided for subsequent observation.
In order to improve the automation degree of the device, the controller 19 may be provided in practical application to control the working states of the test unit 200 and the test unit 300, thereby reducing the labor burden of operators.
Further, the invention also provides a material performance testing method, which comprises the following steps of:
in the test cavity 4, fixing the sample 21 to be tested by using the clamp 6, simulating the service environment of the sample 21, and carrying out mechanical test on the sample 21;
the transmission assembly 5 is utilized to drive the clamp 6 and the sample 21 to move into the electron microscope observation cabin 2, so as to observe the microstructure of the sample 21.
It should be noted that, the material performance testing method may be different according to specific testing requirements, after the sample 21 is observed, the sample 21 may be driven by the transmission component 5 to return to the testing cavity 4 again, and after the sample to be tested reaches a certain period or cycle, the sample enters the electron microscope observation cabin 2 again to observe the microscopic morphology of the material.
The method for testing the properties of materials according to the invention is further illustrated by the following examples.
Example 1
When the material performance testing device is used for testing the material performance, the device comprises the following steps:
step one, isolating an electron microscope observation cabin 2 of a scanning electron microscope 1 from a test cavity 4 of a test mechanism 3.
And secondly, placing the sample 21 into the test cavity 4, fixing the sample 21 by using the clamp 6, and vacuumizing the test cavity 4 by using a vacuum pump.
And thirdly, carrying out mechanical tests on the sample 21, such as one of stretching, compression, creep and fatigue, wherein different test items can be realized by controlling different running states of the electric cylinder. In the vacuum state test cavity 4, an in-situ heating element can be installed, and meanwhile, a high temperature condition is applied to the sample 21, and certain gas such as oxygen, nitrogen, hydrogen and the like can be introduced into the cavity through a flow meter, so that the service environment of the material can be simulated more truly.
And fourthly, when the mechanical property test of the sample 21 reaches a certain stage or cycle and the microstructure of the surface of the sample 21 is required to be observed by using the scanning electron microscope 1, firstly, the electron microscope observation cabin 2 and the test cavity 4 are both in a vacuum state, then the gate valve 20 is opened, the electron microscope observation cabin 2 is communicated with the test cavity 4, the transmission assembly 5 is utilized to drive the clamp 6 and the sample 21 to enter the electron microscope observation cabin 2, the height of the support bracket 18 is adjusted so as to support the clamp 6 and the sample 21, and the microstructure of the surface of the sample 21 is observed by using the scanning electron microscope 1, and at the moment, the positions of the sample 21 can be adjusted by using the first driver 10 and the second driver 11, so that the characterization analysis of different areas of the sample 21 is realized.
And fifthly, after the microstructure of the sample 21 is represented, the support bracket 18 is lowered to be separated from the clamp 6, the clamp 6 and the sample 21 are driven to retract back to the test cavity 4 by the transmission assembly 5, the gate valve 20 is closed, the electron microscope observation cabin 2 is isolated from the test cavity 4, and the mechanical property test of the sample 21 is continued.
And step six, after the scanning electron microscope 1 is isolated from the environment of the testing mechanism 3, the scanning electron microscope 1 can be used independently.
And step seven, repeating the contents of the step two to the step five, so that the in-situ test of the mechanical property and microstructure characterization of the material for a long time can be completed, and the data can be saved.
And step eight, after the test is finished, disassembling the sample 21.
In the present embodiment, when the test sample 21 is not required, the test chamber 4 is evacuated to 5.0X10 -3 And (5) maintaining pressure after Pa.
According to the material performance testing device, the sample 21 to be tested is fixed in the testing cavity 4 by the clamp 6, the testing cavity 4 is not communicated with the electron microscope observation cabin 2, the real service environment of the material is simulated, and the sample 21 is subjected to mechanical testing. When the mechanical property test of the sample 21 in the test cavity 4 reaches a certain stage or cycle and the microstructure of the sample is observed by using the scanning electron microscope 1, the test cavity 4 is communicated with the electron microscope observation cabin 2, and the transmission assembly 5 is utilized to drive the clamp 6 and the sample 21 to move into the electron microscope observation cabin 2 from the test cavity 4, so as to observe the microstructure of the sample 21. According to the material performance testing device, the scanning electron microscope 1 is connected with the testing mechanism 3 to simulate the real service environment of a material, long-time observation is completed, and meanwhile, the utilization rate of the scanning electron microscope 1 can be improved.
The principles and embodiments of the present invention have been described in detail with reference to specific examples, which are provided to facilitate understanding of the method and core ideas of the present invention; also, it is within the scope of the present invention to be modified by those of ordinary skill in the art in light of the present teachings. In view of the foregoing, this description should not be construed as limiting the invention.
Claims (10)
1. A material property testing apparatus, comprising:
the observation unit comprises a scanning electron microscope, and the scanning electron microscope is provided with an electron microscope observation cabin;
the test unit comprises a test mechanism, the test mechanism is connected with the scanning electron microscope, the test mechanism is provided with a test cavity, and the electron microscope observation cabin can be communicated with the test cavity;
the test unit comprises a transmission assembly and a clamp capable of fixing a sample to be tested, the electron microscope observation cabin and the test cavity can both contain the clamp and the sample, the transmission assembly is connected with the clamp, and the transmission assembly can drive the clamp to reciprocate between the electron microscope observation cabin and the test cavity.
2. The material property testing device of claim 1, wherein: the scanning electron microscope comprises a scanning base and a mounting base, wherein the scanning electron microscope is arranged on the scanning base; the test unit is arranged on the mounting base, and the transmission assembly is slidably arranged on the mounting base.
3. The material property testing device of claim 2, wherein: the test unit further comprises a transmission support, a first driver and a second driver, the transmission assembly is slidably arranged on the transmission support, the first driver is in transmission connection with the transmission assembly, the transmission support is slidably arranged on the mounting base, the second driver is in transmission connection with the transmission support, the sliding direction of the transmission assembly is parallel to the connection line direction of the electron microscope observation cabin and the test cavity, and the sliding direction of the transmission assembly is perpendicular to the sliding direction of the transmission support.
4. The material property testing device of claim 1, wherein: the clamp comprises a first clamping block and a second clamping block, and the first clamping block and the second clamping block are matched to fix the sample;
the transmission assembly comprises a fixed support, an inner transmission shaft and an outer transmission shaft, wherein the fixed support is connected with the outer transmission shaft, the outer transmission shaft is of a hollow structure, the outer transmission shaft is sleeved outside the inner transmission shaft in a sliding mode, one end of the inner transmission shaft, which is far away from the fixed support, is connected with the first clamping block, one end of the outer transmission shaft, which is far away from the fixed support, is connected with the second clamping block, and the relative sliding direction of the inner transmission shaft and the outer transmission shaft is parallel to the connecting line direction of the first clamping block and the second clamping block.
5. The material property testing device of claim 4, wherein: the force sensor is arranged between the first clamping block and the second clamping block, the second clamping block is connected with the outer transmission shaft by utilizing a sensor support, and the force sensor is arranged on the sensor support.
6. The material property testing device of claim 4, wherein: the transmission assembly further comprises a third driver, the third driver is fixed on the fixed support, the third driver is in transmission connection with the inner transmission shaft, and a magnetic fluid sealing element is arranged between the inner transmission shaft and the fixed support.
7. The material property testing device of claim 4, wherein: the transmission assembly further comprises a corrugated pipe, the outer transmission shaft is connected with the testing mechanism in a sliding mode through the corrugated pipe, and a sealing ring is arranged between the outer transmission shaft and the corrugated pipe.
8. The material property testing device of claim 1, wherein: the test mechanism is of a split type structure, and an observation window is arranged on the test mechanism;
the test mechanism is also connected with a cooling water pipe, and the test cavity is communicated with an external cooling water source by using the cooling water pipe.
9. The material property testing device of claim 1, wherein: the test mechanism is detachably connected with the scanning electron microscope, and a gate valve is arranged between the electron microscope observation cabin and the test cavity; the electronic microscope observation cabin is internally provided with a support bracket, and the height of the support bracket can be adjusted and props against the clamp.
10. A material property testing method using the material property testing apparatus according to any one of claims 1 to 9, comprising the steps of:
in the testing cavity, fixing a sample to be tested by using the clamp, simulating the service environment of the sample, and carrying out mechanical testing on the sample;
and driving the clamp and the sample to move into the electron microscope observation cabin by using the transmission assembly to observe the microstructure of the sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310359936.2A CN116337607A (en) | 2023-04-06 | 2023-04-06 | Material performance testing device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310359936.2A CN116337607A (en) | 2023-04-06 | 2023-04-06 | Material performance testing device and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116337607A true CN116337607A (en) | 2023-06-27 |
Family
ID=86877232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310359936.2A Pending CN116337607A (en) | 2023-04-06 | 2023-04-06 | Material performance testing device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116337607A (en) |
-
2023
- 2023-04-06 CN CN202310359936.2A patent/CN116337607A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110441163B (en) | High-temperature ultrasonic fatigue in-situ test instrument and test method | |
| US11635359B2 (en) | Instrument and method for mechanical properties in situ testing of materials under high temperature and complex mechanical loads | |
| CN110044752B (en) | In-situ high/low temperature indentation testing device for cone beam CT imaging | |
| CN107703012B (en) | Variable-temperature indexable micro-nano indentation testing device | |
| CN108519291B (en) | High-temperature stretching-fatigue mechanical property tester and method based on electric cylinder driving | |
| CN108535129B (en) | Low-temperature micro-nano indentation testing system with large stroke and low temperature drift under microscopic assembly | |
| CN106289962B (en) | In-situ test system capable of observing deformation and damage of sample gauge length section in high-low power on-line manner | |
| CN116337607A (en) | Material performance testing device and method | |
| CN115078082A (en) | In-situ fatigue testing system used with scanning electron microscope | |
| CN210154960U (en) | In-situ high/low temperature indentation testing device for cone beam CT imaging | |
| CN210665328U (en) | High-temperature ultrasonic fatigue in-situ test instrument | |
| CN110618038A (en) | Testing device and testing method for concrete stress deformation in extreme temperature environment | |
| CN118090042B (en) | Air conditioner pressure switch air pressure testing machine | |
| CN109444013A (en) | A kind of pavement seepage dynamic test equipment and its test method | |
| CN112212911A (en) | Micro-pressure alternating testing machine and testing method | |
| CN206974629U (en) | Air compressor cylinder cover air-tightness detection device | |
| CN211577021U (en) | Scanning electron microscope temperature-adjustable in-situ mechanical test sample stage | |
| CN214489525U (en) | Pressing device capable of accurately controlling temperature and pressure | |
| CN115615843A (en) | High-temperature pressure-bearing hydrogen-mixed in-situ creep fatigue test system based on digital twinning | |
| CN115078120A (en) | High-temperature tension and compression test system capable of achieving in-situ observation | |
| CN114325283A (en) | Semiconductor performance test system under vacuum light irradiation condition and control method thereof | |
| CN112881215A (en) | Synchronous high-frequency mechanical loading test method for hydrodynamic pressure environment | |
| CN113376038A (en) | GIL corrugated pipe compensator detection testing machine for high-voltage combined electrical equipment | |
| CN113176163A (en) | Static contact component high-low temperature surface micro-abrasion dynamic testing machine | |
| CN211043071U (en) | Ozone aging test box |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |