CN114207390A - Photosensitive device and related electronic device - Google Patents
Photosensitive device and related electronic device Download PDFInfo
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- CN114207390A CN114207390A CN202180004709.7A CN202180004709A CN114207390A CN 114207390 A CN114207390 A CN 114207390A CN 202180004709 A CN202180004709 A CN 202180004709A CN 114207390 A CN114207390 A CN 114207390A
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 62
- 239000003990 capacitor Substances 0.000 claims abstract description 51
- 230000010354 integration Effects 0.000 claims abstract description 37
- 238000007599 discharging Methods 0.000 claims description 14
- 238000005070 sampling Methods 0.000 abstract description 10
- 230000035945 sensitivity Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000007704 transition Effects 0.000 description 5
- 230000001276 controlling effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- 238000002834 transmittance Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4204—Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
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Abstract
The application discloses a photosensitive device and a related electronic device. The photosensitive device is sequentially operated in an initial stage, a coarse conversion stage and a fine conversion stage, and comprises: a photodiode; the integrating unit is used for performing integration operation according to the charges generated by the photodiode and correspondingly outputting an integration voltage; the switch is coupled between the integration unit and the successive approximation type analog-to-digital converter for sampling by the top plate; the successive approximation analog-to-digital converter for top plate sampling comprises: a comparator, a first input terminal coupled to a threshold voltage during the coarse conversion stage, a second input terminal selectively coupled to an integration voltage through a switch; the capacitor array comprises a plurality of capacitors which are coupled to the second input end of the comparator through the top plate; successive approximation logic.
Description
Technical Field
The present disclosure relates to sensors, and particularly to a photosensitive device and an electronic device using the same.
Background
In the field of ambient light sensors, high dynamic range has been one of the goals pursued by designers, and conventional approaches often achieve high dynamic range, but sacrifice sensor sensitivity. The difficulty is even higher if the requirement for ambient light sensing to be accomplished in a very short exposure time is also added. Therefore, there is a need in the art for a new design to replace the existing ambient light sensor to overcome all the above problems.
Disclosure of Invention
An objective of the present application is to disclose a photosensitive device and a related electronic device, so as to solve the above problems.
An embodiment of the present application discloses a photosensitive device, photosensitive device operates in order at initial stage, thick conversion stage and thin conversion stage, photosensitive device includes: a photodiode coupled to a first reference voltage; the integration unit is used for performing integration operation according to the charges generated by the photodiode and correspondingly outputting an integration voltage; the switch is coupled between the integration unit and the successive approximation type analog-to-digital converter for sampling by the top plate; the successive approximation type analog-to-digital converter for sampling the top polar plate comprises: a comparator, a first input of the comparator is coupled to a threshold voltage in the coarse conversion stage, a second input of the comparator is selectively coupled to the integration voltage through the switch, a second input of the comparator is further coupled to a capacitor array, and an output of the comparator is coupled to a successive approximation logic circuit; the capacitor array comprises a plurality of capacitors which are coupled to the second input end of the comparator through a top plate; the successive approximation logic circuit is used for respectively controlling the bottom plates of the capacitors to be selectively coupled to one of a plurality of voltages according to the output signals of the comparator; a discharge unit coupled to the integration unit; and a controller for controlling the switch to conduct to make the photosensitive device enter the coarse conversion stage and controlling the switch to not conduct to make the photosensitive device enter the fine conversion stage, wherein in the coarse conversion stage, the controller controls the first input terminal of the comparator to be coupled to the threshold voltage, and when the output signal of the comparator indicates that the integration voltage is higher than the threshold voltage, the controller accumulates a coarse conversion digital code by 1 and controls the discharging unit to perform a discharging operation on the integrating unit to reduce the integration voltage.
An embodiment of the present application discloses an electronic device, including: a display screen; and the photosensitive device is arranged below the display screen and is used for sensing the ambient light passing through the display screen.
The photosensitive device and the related electronic device can simultaneously give consideration to high dynamic range, high sensitivity and high resolution in the application of extremely short exposure time.
Drawings
FIG. 1 is a schematic diagram of an embodiment of a photosensitive device operating in a coarse conversion stage.
FIG. 2 is a schematic diagram of an embodiment of the photosensitive device operating in a fine transition stage.
FIG. 3 is a timing diagram illustrating an operation of the photosensitive device of the present application.
FIG. 4 is a timing diagram illustrating an operation of the photosensitive device of the present application at an initial stage.
FIG. 5 is a timing diagram illustrating the operation of the photosensitive device in the discharging operation.
Detailed Description
The following disclosure provides various embodiments or illustrations that can be used to implement various features of the disclosure. The embodiments of components and arrangements described below serve to simplify the present disclosure. It is to be understood that such descriptions are merely illustrative and are not intended to limit the present disclosure. For example, in the description that follows, forming a first feature on or over a second feature may include certain embodiments in which the first and second features are in direct contact with each other; and may also include embodiments in which additional elements are formed between the first and second features described above, such that the first and second features may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or characters in the various embodiments. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.
Although numerical ranges and parameters setting forth the broad scope of the application are approximations, the numerical values set forth in the specific examples are reported as precisely as possible. Any numerical value, however, inherently contains certain standard deviations found in their respective testing measurements. As used herein, "about" generally refers to actual values within plus or minus 10%, 5%, 1%, or 0.5% of a particular value or range. Alternatively, the term "about" means that the actual value falls within the acceptable standard error of the mean, subject to consideration by those of ordinary skill in the art to which this application pertains. It is understood that all ranges, amounts, values and percentages used herein (e.g., to describe amounts of materials, length of time, temperature, operating conditions, quantitative ratios, and the like) are modified by the term "about" in addition to the experimental examples or unless otherwise expressly stated. Accordingly, unless indicated to the contrary, the numerical parameters set forth in the specification and attached claims are approximations that may vary depending upon the desired properties sought to be obtained. At the very least, these numerical parameters are to be understood as meaning the number of significant digits recited and the number resulting from applying ordinary carry notation. Herein, numerical ranges are expressed from one end to the other or between the two ends; unless otherwise indicated, all numerical ranges set forth herein are inclusive of the endpoints.
Fig. 1 is a schematic view of a photosensitive device according to an embodiment of the present disclosure. The photosensitive device 100 of fig. 1 can be used as an ambient light sensor for detecting the charges accumulated in the photodiode 102 during a time period (which is positively correlated to the average illumination intensity of the time period), and outputting the charges as a coarse conversion digital code DO _ c and a fine conversion digital code DO _ f.
The light sensing device 100 may be configured to sense ambient light, for example, may be disposed in an electronic device as a proximity sensor, and the present application proposes to dispose the light sensing device 100 under a display screen of the electronic device to form the proximity sensor under the display screen, so as to sense the ambient light passing through the display screen, so as to reduce a frame width of a non-display screen range of the electronic device. In order to avoid the backlight of the display screen from interfering with the sensing of the ambient light by the photosensitive device 100, the photosensitive device 100 only senses the blanking period when the backlight of the display screen is not emitting light, however, the blanking period is very short, and the transmittance of the display screen to the ambient light is generally very low, which is only about 2% to 4% for the organic light emitting diode display screen.
In order to complete the high-sensitivity and high-dynamic-range ambient light detection in a very short time, the photosensitive device 100 of fig. 1 sequentially divides the sensing process into three stages: an initial phase, a coarse transition phase, and a fine transition phase. For the application of the under-screen proximity sensor, the coarse transition phase must be within the blanking period to avoid interference by the display backlight, but the initial phase and the fine transition phase are not interfered by the display backlight and may be performed outside the blanking period.
The photodiode 102 of fig. 1 has an anode coupled to the first reference voltage V1 and a cathode coupled to the integration unit 104. The integration unit 104 is used for performing an integration operation according to the charge generated after the photodiode 102 is irradiated by light, and correspondingly outputting an integration voltage Vo. Because the integration unit 104 cannot integrate the integrated voltage Vo all the time, and the integrated voltage Vo increases all the time and is likely to saturate, the photosensitive device 100 of the present application uses the comparator 1062 to determine whether the integrated voltage Vo is higher than the threshold voltage Vth, if the integrated voltage Vo is higher than the threshold voltage Vth, the controller 110 is notified to add 1 to the coarse conversion digital code DO _ c, and the controller 110 uses the discharging unit 108 to discharge the integration unit 104 to pull down the integrated voltage Vo, so that the integration unit 104 can continuously perform the integration operation on the charges generated after the photodiode 102 is irradiated by the light in the coarse conversion phase.
The stronger the light, the faster the integrated voltage Vo rises, so that the number of times the threshold voltage Vth is exceeded is also greater for a fixed time length of the coarse conversion phase, and naturally the coarse conversion digital code DO _ c is also greater when the coarse conversion phase ends. But, correspondingly, the weaker the light, the smaller the coarsely converted digital code DO _ c when the coarse conversion phase ends.
It will be appreciated that the integrated voltage Vo must exceed the threshold voltage Vth to trigger the controller 110 to add 1 to the coarse conversion digital code DO _ c. When the ambient light is low, the integrated voltage Vo may not exceed the threshold voltage Vth due to the charge generated by the photodiode 102 in the whole coarse conversion stage, and the sensitivity may be limited by the threshold voltage Vth. However, the lower the threshold voltage Vth is set, the higher the probability of occurrence of the discharging operation, and the discharging operation may affect the accuracy of the integration operation, so that the too frequent discharging operation is disadvantageous for maintaining the accuracy of the photosensitive device 100. Therefore, the successive approximation analog-to-digital converter 106 is further utilized to convert the integrated voltage Vo of the incomplete threshold voltage Vth remaining at the end of the coarse conversion stage into the fine conversion digital code DO _ f in the fine conversion stage, so as to improve the sensitivity and resolution of the photosensitive device 100.
Specifically, the successive approximation analog-to-digital converter 106 of the present application is a top plate sampling architecture as shown in fig. 1 and fig. 2, that is, an input voltage to be sampled of the successive approximation analog-to-digital converter 106 is directly coupled to a second input terminal of the comparator 1062, and a plurality of capacitors (with capacitance values of C, C, 2C, …, 2N-1C, where C is a unit capacitance value and N is an integer greater than 1) included in the capacitor array 1066 are all coupled to the second input terminal of the comparator 1062 through the top plate. This has the advantage that when the switch 108 is turned on during the rough conversion phase of the photosensitive device 100, the integrated voltage Vo and the threshold voltage Vth are directly coupled to the two input ends of the comparator 1062, respectively, so that the successive approximation analog-to-digital converter 106 becomes a simple comparator, and actually the capacitor array 1068 continuously performs sampling; therefore, when the photosensitive device 100 enters the fine conversion stage from the coarse conversion stage, the switch 108 is turned off, the successive approximation type analog-to-digital converter 106 can perform successive approximation type analog-to-digital conversion on the integrated voltage Vo sampled by the capacitor array 1068 when the photosensitive device enters the fine conversion stage from the coarse conversion stage, and the controller 110 converts the output signal Ss output by the successive approximation type analog-to-digital converter 106 in the fine conversion stage into the fine conversion digital code DO _ f.
The following details are also included with respect to the operation of successive approximation analog to digital converter 106. After entering the fine conversion phase, the first input terminal of the comparator 1062 of the successive approximation analog-to-digital converter 106 for top plate sampling can be switched from being originally coupled to the threshold voltage Vth to being coupled to the second reference voltage V2 by the control signal Sm generated by the controller 110. The successive approximation logic 1064 controls the bottom plates of the capacitors of the capacitor array 1066 to be selectively coupled to one of a plurality of voltages (e.g., a first reference voltage V1, a second reference voltage V2, a third reference voltage V3) according to the output signal Ss of the comparator 1062, wherein the second reference voltage may be between the first reference voltage V1 and the third reference voltage V3.
In some embodiments, a successive approximation analog-to-digital converter of a non-top plate sampling architecture, such as a successive approximation analog-to-digital converter of a bottom plate sampling architecture, may also be used as the successive approximation analog-to-digital converter 106. However, since the input terminal of the comparator of the successive approximation analog-to-digital converter 106 adopting the bottom plate sampling architecture is not directly coupled to the integration voltage Vo through the switch 108, another comparator is additionally required to be added for the coarse conversion stage.
The details of the integration unit 104 are explained next. The integrating unit 104 includes an operational amplifier 1042, an integrating capacitor Cint, a switch 1044, a switch 1046, and a switch 1048. The operational amplifier 1042 includes a positive input terminal, a negative input terminal, and an output terminal, wherein the negative input terminal is coupled to the photodiode 102; the positive input is coupled to a fourth reference voltage V4. One end of the integrating capacitor Cint is coupled to the negative input terminal of the operational amplifier 1042. The switch 1044 is coupled between the negative terminal and the output terminal of the operational amplifier 1042; the switch 1046 is coupled between the other end of the integrating capacitor Cint and the output terminal of the operational amplifier 1042; the switch 1048 is coupled between the other end of the integrating capacitor Cint and a reset voltage Vrst.
Referring to fig. 4, at time T0 of the initial stage before the coarse conversion stage, the controller 110 controls the switches 1044, 1046 and 1048 through the control signals Srst1, Srst2 and Srst3, respectively, so that the switch 1044 is turned off, the switch 1046 is turned on and the switch 1048 is turned off. The controller 110 then turns off the switch 1046 at time T01 and turns on the switch 1044 and the switch 1048 at time T02 so that the integration voltage Vo is reset to the reset voltage Vrst, and then the controller 110 turns off the switch 1044 and the switch 1048 at time T03 and turns back the switch 1044 at time T04 to complete the reset of the integration unit 104.
Referring to fig. 3, it can be seen that the integrated voltage Vo is reset to the reset voltage Vrst during the initial phase, then enters the coarse conversion phase at time T1, enters the fine conversion phase from the coarse conversion phase at time T8, and ends the fine conversion phase at time T9. In the embodiment, the length of the time T1 to T8 is a preset time length, and as mentioned above, it is required to be less than the blanking period of the associated display screen. It can be observed from fig. 3 that when the integration voltage Vo is higher than the threshold voltage Vth, the output signal Ss of the comparator 1062 is triggered, so that the controller 110 controls the discharging unit 108 to discharge the integrating unit 104 to move the charges accumulated by the integrating capacitor Cint to the discharging unit 108 to decrease the integration voltage Vo. In the present embodiment, the time length of the discharging operation is a preset time length, that is, the time length of the time T2 to T3 is the same as the time length of the time T4 to T5 and the time length of the time T6 to T7. Details regarding the discharge cell 108 will be described below.
Referring back to fig. 1, the discharge unit 108 includes a discharge capacitor Cd, a first terminal of the discharge capacitor Cd is coupled to the photodiode 102, a second terminal of the discharge capacitor Cd is selectively coupled to the discharge reference voltage Vrp through a switch 1082, and the second terminal of the discharge capacitor Cd is also selectively coupled to the first terminal of the discharge capacitor Cd through a switch 1084.
Referring to fig. 5, during the non-discharge operation, the controller 110 controls the switches 1084 and 1082 correspondingly by the control signals Sd1 and Sd2, so that the switch 1084 is turned on and the switch 1082 is turned off. When the discharging operation is performed, for example, between time T2 and time T3, the controller 110 turns off the switch 1084 at time T21 and turns on the switch 1082 at time T22 to absorb the charges accumulated in the integrating capacitor Cint to the discharging capacitor Cd, which is equivalent to discharging the integrating capacitor Cint, so as to decrease the integrating voltage Vo. The controller 110 then turns off the switch 1082 at time T23 and turns the switch 1084 back on at time T24 to complete the discharge operation.
It should be noted that the specific implementation of the discharge unit 108 of the present application is not limited to the embodiments of fig. 1 and 2, and any manner may be applied to the photosensitive device 100 as long as the integrated voltage Vo of the integration unit 104 can be reduced by the control of the controller 110. In addition, the present application also does not limit how the controller 110 is implemented. For example, the controller 110 may be implemented using a processor in conjunction with software or firmware, or using specific circuitry to implement in pure hardware.
The integrating capacitor Cint in the integrating unit 104 of the photosensitive device 100 of the present application can have a smaller value to increase the gain of the integrating unit 104, so that the efficiency of the coarse conversion is increased to increase the sensitivity of the photosensitive device 100. At the same time, the capacitor array 1066 of the top plate sampled successive approximation analog-to-digital converter 106 may be expanded to improve the resolution of the fine conversion. Thus, even if the photosensitive device 100 is disposed under a display screen, a high dynamic range, a high sensitivity, and a high resolution can be achieved at the same time with an extremely short exposure time.
The foregoing description has set forth briefly the features of certain embodiments of the present application so that those skilled in the art may more fully appreciate the various aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should understand that they can still make various changes, substitutions and alterations herein without departing from the spirit and scope of the present disclosure.
Claims (15)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2021/112749 WO2023019394A1 (en) | 2021-08-16 | 2021-08-16 | Photosensitive apparatus and related electronic apparatus |
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| CN114207390A true CN114207390A (en) | 2022-03-18 |
| CN114207390B CN114207390B (en) | 2024-12-06 |
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| CN114207390B (en) | 2024-12-06 |
| WO2023019394A1 (en) | 2023-02-23 |
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