CN107566061A - Microwave second level time delay calibration system - Google Patents
Microwave second level time delay calibration system Download PDFInfo
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Abstract
A kind of microwave second level time delay calibration system disclosed by the invention, it is desirable to provide a kind of measurement range is big, the high time delay calibration system of calibration accuracy, the technical scheme is that：Signal generator connects BPSK modulators, standard time interval pulse generator launches time delay reference signal and delay criteria signal, delay sinusoidal signal is tested by caused by and is sent into BPSK modulators, with standard time interval pulse generator caused by time delay reference signal carry out binary phase shift keying BPSK modulation, then time delay range is produced to the time delay T of second level by delayed time system, gathered again by channel of digital oscilloscope 2, envelope is solved as delay envelope signal, finally measure delay inequality Δ t of the delay envelope signal relative to delay criteria signal caused by standard time interval pulse generator, delay criteria signal produces standard value time delay Ts and delay inequality Δ t relative to time delay reference signal, calibration value using Ts+m+ Δs t as T, so as to complete microwave second level time delay T calibration.
Description
Technical field
The present invention relates to a kind of calibration of Radio Measurements field microwave second level delay parameter, more specifically, the present invention
Be related to a kind of time delay range from ten milliseconds to tens of seconds, the time delay degree of accuracy be hundred psecs, frequency range radio frequency band microwave
Second level time delay calibration system.
Background technology
The development of e measurement technology is premise and the basis of all scientific and technological developments, and the level of its technology development determines
The human knowledge world and the level of reforming world.Wide range, high-precision ranging/velocity measuring technique can improve Aeronautics and Astronautics
The manufacture of field instrument and equipment, the level of assembling, the level for promoting technological progress, improving scientific research have important meaning
Justice.In the national defence such as manned space flight, lunar exploration, survey of deep space, satellite communication/communications applications field, for (300,000 kilometers of overlength distance
More than) engineer applied scene, in order to realize the checking to key indexs such as precise distance measurement/test the speed and real-time communications, be related to
Substantial amounts of microwave large range high precision time delay simulation, the accurate simulation of time delay determine the reliability of key index checking, this
Just need to calibrate it.
Traditional time-delay calibration uses the direct method of measurement, Excavation Cluster Based on Network Analysis instrument, digital oscilloscope, time interval measurement
Instrument or the devices such as the microwave group delay calibration device of instrument, VSA and precision.Network Analyzer by survey mutually come
Complete the measurement of time delay, due to when signal be in radio frequency band exist the cycle it is fuzzy the problem of, measurement range only up to arrive in the least
Second；Oscillograph will realize large range high precision latency measurement, it is desirable to when base precision is high, sample rate is high, memory capacity is big, and oscillography
The memory capacity of device is smaller, it is impossible to completes the high-acruracy survey of range time delay, for the time delay of second level range, measurement accuracy can only
To Microsecond grade；Time interval measuring instrucment can only measure the time delay of pulse signal, and be needed in foregoing application field, majority of case
To be calibrated when sinusoidal signal time delay；VSA is used to swear the latency measurement to measuring modulated signal, by defeated
Go out the correlation demodulation of signal, compare the time delay of input and output, latency measurement scope very little, Microsecond grade can only be measured；Accurate is micro-
Group delay calibrating installation uses microwave signal source and the respective independent frequency-stabilizing source binary channels frequency mixing technique of microwave local oscillator two,
Using wideband microwave amplifier as isolator, low frequency digital phasometer is measured to signal time delay as measurement standard device,
In 2GHz~18GHz frequency range, uncertainty of measurement is (0.1~0.2) ns+0.2 τ g%.Due to the microwave group delay school
Standard apparatus mutually realizes latency measurement indirectly by surveying, and measurement blind area occurs when phase is 360 °, and when signal time delay is big
When the signal period, the problem of cycle obscures also occurs more than 360 ° in phase.Due to the pumping signal of radio channel simulator
For sine wave or modulating wave, therefore direct measurement can not be carried out to the time delay of radio channel simulator.To sum up based on above-mentioned general
The time delay calibrating method of instrument or device can not support the calibration of large range high precision time delay, and can not solve microwave frequency band load
The multicycle problem of the big delay of ripple.
The content of the invention
The purpose of the present invention in view of the shortcomings of the prior art part, there is provided a kind of method is simple, and measurement range is big, school
The high microwave second level time delay calibration system of the quasi- degree of accuracy, with solve metering field high accuracy long time delay standard set-up and aviation,
Space flight, satellite communication field radio channel emulator calibration problem.
The above-mentioned purpose of the present invention can be achieved by following technical proposals：A kind of microwave second level time-delay calibration system
System, including：Produce the signal generator of tested delay sinusoidal signal, binary phase shift keying is applied to tested delay sinusoidal signal
The BPSK modulators of BPSK modulation, during by producing time delay reference signal and delay criteria signal to produce the standard of standard time delay
Between interval pulse generator and collection signal, to delay BPSK modulated signals carry out solve envelope and measure delay inequality digital oscillography
Device, it is characterised in that：Signal generator output end connection BPSK modulator RFin ends, standard time interval pulse generator pass through
The transmitting time delay reference signal of output 1, by the transmitting delay criteria signal of output 2, delay criteria signal is believed relative to time delay reference
The scope for number producing standard value time delay Ts, Ts be 10ms~1s, 1 end of output connection BPSK modulator Modin ends, passes through and exports 1
Time delay reference signal is supplied to BPSK modulators；Signal generator is tested delay sinusoidal signal by caused by and is sent into BPSK modulation
Device carries out binary phase shift keying BPSK modulation, and tested delay sinusoidal signal is modulated to tested delay BPSK modulated signals, so
Afterwards, it is 10ms~50s to produce time delay range by delayed time system, and the delay BPSK that accuracy range is 0.5ns~10ns is modulated
Signal, delay BPSK modulated signals are exported to the passage 2 of digital oscilloscope by the out ends of delayed time system；Digital oscilloscope pair
The delay BPSK modulated signals that passage 2 collects solve envelope as delay envelope signal, and delay envelope signal is relative to tested
Be delayed time delay T caused by BPSK modulated signal envelopes, meanwhile, standard time interval pulse generator is gathered by passage 1 and produced
Delay criteria signal, measurement delay envelope signal relative to standard delay time signal delay inequality Δ t, by measuring delay inequality Δ
T is the error that can determine that time delay T, and then the calibration value using Ts+ Δs t+m as time delay T, completes the calibration to time delay T, wherein, m
It is the integer that scope is 0~50.
The present invention has the advantages that compared to prior art：
Method is simple.Added first before sinusoidal signal is delayed by caused by signal generator and enters delayed time system using the present invention
BPSK is modulated, and the time delay reference signal (cycle 1s) that modulated signal is exported by standard time interval pulse generator passage 1 carries
For signal generator output end is connected to BPSK modulator RFin ends, and standard time interval pulse generator exports 1 end and is connected to
BPSK modulator Modin ends.It is delayed by after sinusoidal signal is modulated to, the time delay that time delay value is " T " is produced by delayed time system, then
Input to channel oscilloscope 1 to be acquired, carry out solution envelope after collection to signal, envelope is the undershoot pulse of a cycle
Signal, envelope cycle are equal to the cycle in the cycle, i.e. time delay reference signal of modulated signal, and method is simply easy.Using existing
The error of common oscilloscope measurement microwave second level time delay completes long time delay calibration, avoids directly calibrating second level time delay, so as to light
The calibration problem of the existing microwave second level time delay of pine nut, is not required to special Development Techniques and realizes the high instrument of difficulty.
Measurement range is big, and accuracy of measurement is high.The present invention uses what is exported by standard time interval pulse generator passage 1
Time delay reference signal (cycle 1s) provides modulated signal, and modulated signals envelope is synchronous with " time delay reference signal ".During standard
Between interval generator also produce one it is identical with " time delay reference signal " with wave characteristics, and relative " delay criteria signal " produces
" the delay criteria signal " of a raw time delay, the time delay is standard time delay, standard caused by standard time interval pulse generator
Time delay is high as standard value, the degree of accuracy.Because tested delay BPSK modulated signals envelope is synchronous with time delay reference signal, time delay mark
Calibration signal in theory also should be synchronous with delay BPSK modulated signals, has error because delayed time system produces time delay, is then delayed
BPSK modulated signals have delay inequality relative to delay criteria signal, and the delay inequality is exactly the error that time-delay system produces time delay,
Actual is exactly delay inequality of the measurement delay BPSK modulated signals relative to delay criteria signal when carrying out time-delay calibration, this when
Prolong poor very little, long time delay measurement is just converted into the measurement of small time delay by this, and determine latency measurement scope by this method is
The size of standard time delay caused by standard time interval generator, standard time delay are generally all more than second level；Determine that measurement is accurate
What is spent is the degree of accuracy of standard time delay caused by standard time interval generator, and standard time delay is 0.1ns in the degree of accuracy of second level.
Therefore, big using this method measurement range, accuracy of measurement is high.
In high band, solves cycle fuzzy problem.Long time delay is being converted into small latency measurement by the present invention, uses oscillograph
Enter before measurement of the line delay BPSK modulated signals relative to delay criteria signal time delay difference, also done a signal transacting, it is right
Delay BPSK modulated signals carry out understanding envelope, and what is actually measured is that delay BPSK modulated signal envelopes are believed relative to delay criteria
Number delay inequality, delay BPSK modulated signals envelope for a cycle undershoot pulse signal (in the rising of pulse signal
Edge and trailing edge produce spike), the cycle of delay BPSK modulated signal envelopes is equal to the cycle of modulated pulse signal, modulates pulse
Signal period is 1s, and microwave high-frequency signals latency measurement will just be converted low frequency signal latency measurement by this, evade the multicycle
Problem, cycle fuzzy problem are thoroughly solved.
Calibration is accurate high.The delay criteria signal warp that the present invention is exported using standard time interval pulse generator passage 2
Channel of digital oscilloscope 1 is gathered, the trigger signal as digital oscilloscope in collection, and the mark of time delay difference measurements is used as after collection
Quasi- comparison signal.Delay criteria signal caused by standard time interval pulse generator has one relative to time delay reference signal
Time delay, standard time delay " Ts " caused by the instant standard time interval pulse generator of the time delay.Due to " time delay reference signal " with
The envelope of " tested delay BPSK modulated signals " is synchronous to be produced without time delay, " delay criteria signal " relative to " time delay reference signal "
Time delay Ts, " delay BPSK modulated signals " produce time delay T relative to " tested delay BPSK modulated signals ", i.e. " delay envelope letter
Number " relative to " tested delay BPSK modulated signals " envelope produce the time delay T that scope is 10ms~50s, and Ts=T- Δ t-m, m
For integer, the Ts degree of accuracy is up to 0.1ns, and the accuracy compared to T improves 100 times, and Δ t is that a time delay range is up to 10ns
Small time delay.Therefore the delay inequality Δ t between " delay envelope signal " and " delay criteria signal " is time delay T produced by delayed time system
Error, the calibration value using Ts+ Δs t+m as T, the degree of accuracy of calibration value influenceed by Ts and Δ t the value degree of accuracy, Δ t amounts
Be worth very little, be far above the Ts value degrees of accuracy with the degree of accuracy of the oscilloscope measurement Δ t values obtained, the degree of accuracy of calibration value finally by
Ts determines that accuracy of the Ts degrees of accuracy compared to T improves 100 times, and calibration accuracy is high, (accuracy range be 0.001ns~
0.1ns), it is this that small latency measurement is converted into and by adding modulatedemodulate envelope to reduce measured signal frequency using long time delay measurement
Technology, solves the problem of microwave second level time delay high accuracy calibration.
Present invention can apply to the calibration of the Key Performance Indicator propagation delay time of radio channel emulator, solves its index
In range second level, the propagation delay time of precision nanosecond, domestic prior art can not be to the problem of its accurate alignment at present.Frequency model
Enclose radio frequency, time delay range maximum can reach 50s, calibration accuracy may be up to 0.1ns.Can be applied to metering field 100MHz~
10GHz, time delay range：10ms~50s, time delay precision:The calibration of 0.5ns~10ns high-precision long time delay standard set-up, also
Can be applied to Aeronautics and Astronautics, satellite communication field radio channel emulator calibration.
Brief description of the drawings
This method is further illustrated with reference to the accompanying drawings and examples.
Fig. 1 microwave second level time delay calibration system principle schematics of the present invention.
Fig. 2 is Fig. 1 to when delayed time system produces time delay T≤1s, the waveform diagram of latency measurement signal.
Fig. 3 is Fig. 1 to when delayed time system produces time delay T>During 1s, the waveform diagram of latency measurement.
Embodiment
Refering to Fig. 1.In a most preferred embodiment described below, a kind of system of microwave second level time-delay calibration, including：
Produce the signal generator of tested delay sinusoidal signal, binary phase shift keying BPSK modulation is applied to tested delay sinusoidal signal
BPSK modulators, produce the standard time interval arteries and veins of standard time delay by producing time delay reference signal and delay criteria signal
Rush generator and gather signal, delay BPSK modulated signals are carried out solving envelope and measure the digital oscilloscope of delay inequality, it is special
Sign is：Signal generator output end connection BPSK modulator RFin ends, standard time interval pulse generator pass through the hair of output 1
Time delay reference signal is penetrated, delay criteria signal is launched by output 2, when delay criteria signal produces relative to time delay reference signal
Prolong Ts, Ts scope is 10ms~1s, and Ts=T- Δs t-m, m are 0~50 integer, and it is small that Δ t is that a time delay range is up to 10ns
Time delay, the Ts degree of accuracy are up to 0.1ns, and the accuracy compared to T improves 100 times, and Δ t is time delay T error, and 1 end of output connects
BPSK modulator Modin ends are connect, time delay reference signal is supplied to by BPSK modulators by output 1；Signal generator will produce
Tested delay sinusoidal signal be sent into BPSK modulators and carry out binary phase shift keying BPSK modulation, be tested delay sinusoidal signal quilt
It is changed into tested delay BPSK modulated signals after modulation, tested delay BPSK modulated signals become by producing time delay T delayed time system
For the BPSK modulated signals that are delayed, delay BPSK modulated signals produce time delay T relative to tested delay BPSK modulated signals, that is, are delayed
Envelope signal produces time delay T relative to tested delay BPSK modulated signals envelope, and delay BPSK modulated signals pass through delayed time system
Out ends export to the passage 2 of digital oscilloscope, delay BPSK modulated signals that digital oscilloscope collects to passage 2 are carried out
Envelope is solved, solution envelope turns into delay envelope signal, and delay envelope signal produces relative to tested delay BPSK modulated signals envelope
Time delay T；Meanwhile delay criteria signal caused by standard time interval pulse generator, measurement delay envelope are gathered by passage 1
For signal relative to the delay inequality of standard delay time signal, the delay inequality is exactly Δ t --- time delay T error, determined by measuring Δ t
Time delay T error, the calibration value using Ts+ Δs t+m as T, completes the calibration to time delay T.Δ t value very littles, the standard of calibration value
Exactness is influenceed by Ts and Δ t the value degree of accuracy, it is accurate far above Ts values with the degree of accuracy of the oscilloscope measurement Δ t values obtained
Exactness, the degree of accuracy of calibration value are finally determined that the Ts degrees of accuracy are higher than T by Ts, and calibration accuracy is high.Standard time interval pulse
Generator produces standard value time delay Ts, regard time delay reference signal input BPSK modulators as modulated signal by output 1, passes through
Tested delay sinusoidal signal is changed into tested delay BPSK modulated signals by BPSK modulators, and tested delay BPSK modulated signals pass through
Delayed time system produce time delay T；Delay criteria signal enters digital oscilloscope by standard time interval pulse generator output 2
Passage 1, at the same by delayed time system out ends enter channel of digital oscilloscope 2 delay BPSK modulated signals be depacketized network be when
Prolong envelope signal, delay inequality Δ t, Δ t acquisition of the delay envelope signal relative to standard delay time signal is measured with digital oscilloscope
The degree of accuracy is far above the standard value Ts value degrees of accuracy.
To tested delay sinusoidal signal, before delayed time system is entered, standard time interval pulse generator is by time delay mark
Calibration signal is added to BPSK modulator Modin ends, and delay sinusoidal signal is tested caused by signal generator and passes through signal generator
Sigout is exported to BPSK modulator RFin ends, and be delayed by sinusoidal signal turns into by BPSK modulators through BPSK modulators modulates
The tested delay BPSK modulated signals of RFout ends output.It is delayed by BPSK modulated signals and is prolonged by producing the delayed time system for the T that is delayed
System is changed into the BPSK modulated signals that are delayed, and delay BPSK modulated signals produce time delay T relative to tested delay BPSK modulated signals,
The envelope signal that is delayed produces time delay T relative to tested delay BPSK modulated signals envelope.Standard time interval pulse generator
Exported with two-way, respectively export 1 and output 2, wherein exporting 1 end is connected to BPSK modulator Modin ends, modulated for BPSK
Device provides modulated signal, and 2 ends of output are connected to channel oscilloscope 1, trigger collection signal and delay inequality are provided for digital oscilloscope
The standard comparing signal of measurement.The transmitting time delay reference signal of standard time interval pulse generator output 1, the transmitting time delay of output 2
Standard signal, time delay reference signal and delay criteria signal waveform feature are just the same, be all the cycle for 1 second, edge it is precipitous
Pulse signal.Delay criteria signal produces a time delay, the instant standard time interval arteries and veins of the time delay relative to time delay reference signal
The scope for rushing standard time delay Ts, Ts caused by generator is 10ms~1s, out of the delay BPSK modulated signals by delayed time system
End output is to the passage 2 of digital oscilloscope, and through oscillograph solution envelope as delay envelope signal, this prolongs delay BPSK modulated signals
When envelope signal be a cycle be equal to the modulated signal cycle undershoot impulse waveform.Digital oscilloscope is sequentially completed function
For：The delay criteria signal of digital oscilloscope collection standard time interval pulse generator output and the delay of delayed time system output
BPSK modulated signals, solution envelope delay BPSK modulated signals, the time delay between measurement delay envelope signal and delay criteria signal
Poor Δ t.The time delay reference signal of standard time interval pulse generator output and the tested delay BPSK of BPSK modulators output
Modulated signal envelope is synchronously no-delay, and delay criteria signal produces time delay Ts, delay BPSK modulation relative to time delay reference signal
Signal produces time delay T relative to tested delay BPSK modulated signals envelope, that is, the envelope signal that is delayed is relative to tested delay BPSK
Modulated signal envelope produces time delay T, and Ts=T- Δs t-m, m are 0~50 integer, therefore, delay envelope signal and time delay mark
Delay inequality between calibration signal is exactly Δ t=T-Ts-m, time delay T high accuracy produced by realizing delayed time system by measuring Δ t
Calibration.
Refering to Fig. 2.When delayed time system produces time delay T<During 1s, delay envelope signal is relative to tested caused by delayed time system
BPSK modulated signals envelope produces time delay T；The delay criteria signal of standard time interval pulse generator is relative to time delay reference
Signal produces time delay Ts；Time delay reference signal no time delay synchronous with tested BPSK modulated signals envelope, Ts=T- Δs t-m, m 0,
T-Ts=Δs t.When caused by standard time interval pulse generator caused by the n-th rising edge of standard signal and delayed time system
The 2N-1 undershoot difference Δ t of delay envelope signal, the calibration value that delayed time system produces time delay T is Ts+ Δs t.
Refering to Fig. 3.When delayed time system produces time delay T >=1s, delay envelope signal is relative to quilt caused by delayed time system
Survey BPSK modulated signals envelope and produce time delay T；The delay criteria signal of standard time interval pulse generator is joined relative to time delay
It is T divided by 1s remainder to examine signal and produce time delay Ts, Ts=T- Δ t-m, Ts, m is T divided by 1s business, for more than or equal to 1
Integer.The N+m rising edge of standard time delayed signal caused by standard time interval pulse generator and " delay envelope signal "
The 2N-1 undershoot difference Δ t.The calibration value that delayed time system produces time delay T is Ts+ Δs t+m.It should be noted that time delay
Standard signal be oscillograph trigger signal, while in order to avoid measurement when by spike corresponding to rising edge with trailing edge pair
The spike answered is obscured, and the width of pulse per second (PPS) should try one's best width.
Claims (10)
1. a kind of microwave second level time delay calibration system, including：Produce the signal generator of tested delay sinusoidal signal, prolong to tested
When sinusoidal signal apply the BPSK modulators of binary phase shift keying BPSK modulation, by producing time delay reference signal and time delay mark
Calibration signal is to produce the standard time interval pulse generator of standard time delay and collection signal, to being delayed, BPSK modulated signals are carried out
Solve envelope and measure the digital oscilloscope of delay inequality, it is characterised in that：Signal generator output end connection BPSK modulators RFin
End, standard time interval pulse generator launch time delay reference signal by output 1, launch delay criteria signals by output 2,
The scope that delay criteria signal produces standard value time delay Ts, Ts relative to time delay reference signal is 10ms~1s, the connection of 1 end of output
BPSK modulator Modin ends, time delay reference signal is supplied to by BPSK modulators by output 1；Signal generator is by caused by
Tested delay sinusoidal signal is sent into BPSK modulators and carries out binary phase shift keying BPSK modulation, and tested delay sinusoidal signal is adjusted
Tested delay BPSK modulated signals are made as, then, it is 10ms~50s to produce time delay range by delayed time system, accuracy range
For 0.5ns~10ns delay BPSK modulated signals, delay BPSK modulated signals are exported to numeral by the out ends of delayed time system
The passage 2 of oscillograph；The delay BPSK modulated signals that digital oscilloscope collects to passage 2 solve envelope as delay envelope letter
Number, delay envelope signal relative to time delay T caused by tested delay BPSK modulated signal envelopes, meanwhile, pass through passage 1 collection mark
Delay criteria signal caused by interval pulse generator between punctual, measurement delay envelope signal relative to standard delay time signal when
Prolong poor Δ t, time delay T error can determine that by measuring delay inequality Δ t, then the calibration value using Ts+ Δs t+m as time delay T,
The calibration to time delay T is completed, wherein, m is the integer that scope is 0~50.
2. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：Standard time interval pulse generator
Standard value time delay Ts is produced, modulated signal is regard time delay reference signal input BPSK modulators as by output 1, adjusted by BPSK
Tested delay sinusoidal signal is changed into tested delay BPSK modulated signals, the delay that tested delay BPSK modulated signals pass through by device processed
System produces time delay T；Delay criteria signal enters channel of digital oscilloscope 1 by standard time interval pulse generator output 2,
It is time delay envelope to be depacketized network into the delay BPSK modulated signals of channel of digital oscilloscope 2 by delayed time system out ends simultaneously
Signal, measure delay envelope signal with digital oscilloscope and obtain the degree of accuracy relative to delay inequality the Δ t, Δ t of standard delay time signal
Far above the standard value Ts value degrees of accuracy.
3. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：Exist to tested delay sinusoidal signal
Into before delayed time system, time delay reference signal is added to BPSK modulator Modin ends by standard time interval pulse generator,
Delay sinusoidal signal is tested caused by signal generator to export to BPSK modulator RFin ends, quilt by signal generator Sigout
Survey delay sinusoidal signal turns into the tested delay BPSK modulation letters exported by BPSK modulator RFout ends through BPSK modulators modulates
Number.
4. microwave second level time delay calibration system as claimed in claim 2, it is characterised in that：BPSK modulated signals are delayed by pass through
Time delay T delayed time system is produced, turns into delay BPSK modulated signals.
5. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：Standard time interval pulse generator
With output 1 and output 2 two-way output, wherein, 1 end of output is connected to BPSK modulator Modin ends, is provided for BPSK modulators
Modulated signal, 2 ends of output are connected to channel oscilloscope 1, and trigger collection signal and time delay difference measurements are provided for digital oscilloscope
Standard comparing signal.
6. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：Standard time interval pulse generator
The delay criteria signal of the transmitting of output 2 and the delay criteria signal waveform feature of the transmitting of output 1 are just the same, and it is 1 in the cycle to be all
The precipitous pulse signal in second, edge.
7. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：Digital oscilloscope gathers the standard time
The delay criteria signal of interval pulse generator output and the delay BPSK modulated signals of delayed time system output, solution envelope delay
BPSK modulated signals, the delay inequality Δ t between measurement delay envelope signal and delay criteria signal.
8. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：When delayed time system produces time delay T<1s
When, the n-th rising edge of standard signal and delay package caused by delayed time system when caused by standard time interval pulse generator
The 2N-1 undershoot difference Δ t of network signal, the calibration value that delayed time system produces time delay T are Ts+ Δs t+m, m 0, calibration value
Actual is Ts+ Δs t.
9. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：When delayed time system produce time delay T >=
During 1s, delay envelope signal produces time delay T relative to tested BPSK modulated signals envelope caused by delayed time system；Between standard time
It is T to produce time delay Ts, Ts=T- Δ t-m, wherein Ts relative to time delay reference signal every the delay criteria signal of impulse generator
Divided by 1s remainder, m is T divided by 1s business, for the integer more than or equal to 1.
10. microwave second level time delay calibration system as claimed in claim 1, it is characterised in that：When delayed time system produce time delay T >=
During 1s, the N+m rising edge of standard time delayed signal caused by standard time interval pulse generator and " delay envelope signal "
The 2N-1 undershoot difference Δ t, the calibration value that delayed time system produces time delay T is Ts+ Δs t+m.
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