CN106771831A - The automatic detection mechanism of various pins connector high - Google Patents
The automatic detection mechanism of various pins connector high Download PDFInfo
- Publication number
- CN106771831A CN106771831A CN201710012757.6A CN201710012757A CN106771831A CN 106771831 A CN106771831 A CN 106771831A CN 201710012757 A CN201710012757 A CN 201710012757A CN 106771831 A CN106771831 A CN 106771831A
- Authority
- CN
- China
- Prior art keywords
- tablet
- stitch
- connector
- layer
- detection mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses the automatic detection mechanism of one kind of multiple pins connector high, for being detected to the connector on pcb board, including the drive device that upper bolster, die shoe and driving upper bolster move up and down；Pcb board is fixed on die shoe；Also include：The fixed seat of the bottom surface of upper bolster is fixed on, fixed seat is connected with the guide layer penetrated for the stitch of guide connector, and the tablet of multilayer is provided between guide layer and fixed seat；The bottom surface of every layer of tablet is coated with insulating protective layer, is connected by wired in series between adjacent two-layer tablet；Tablet is electrically connected with amplifier；Stitch is contacted through guide layer with insulating protective layer, and the stitch of different height is contacted from the insulating protective layer of the tablet of different floor heights.The automatic detection mechanism of various pins connector high can realize detecting that detection efficiency is high to the connector with various stitch height, testing result reliability.
Description
Technical field
The present invention relates to detection technique field, more particularly to one kind of multiple pins connector high automatic detection mechanism.
Background technology
Printed circuit board (Printed Circuit Board) abbreviation pcb board, in process of production, it is necessary to detect pcb board
Whether it is connected good between the connector on pcb board, either with or without short circuit problem is opened, to judge whether it is qualified.Generally use
TestJet measuring technologies are detected.TestJet is the design of (online) tests of ICT that Agilent is released, and its main purpose exists
(i.e. whether pcb board is connected the connection quality for being installed between the electronic component on pcb board and pcb board in detection with part stitch
Well, either with or without opening short circuit problem).Connector is also one of electronic component therein.The TestJet detections of existing connector
Structure is as shown in figure 1, test equipment sends small-signal to measurement jig in turn by test equipment probe 28 and wire 27
Be connected to pcb board 9 ICT test probe 26.Each stitch 51 on connector has been connected through the wiring on pcb board 9
State small-signal.When such as there is the situation of welding open circuit, the stitch 51 on connector will be unable to the above-mentioned small-signal of transmission, no
The small-signal that then the sensing chip 3' of TestJet will be sensed transfers back to test equipment again after being amplified through amplifier 6.By
In weak output signal, sensing chip 3' could must effectively complete corresponding testing requirement very close to the stitch 51 of connector.
But, the problem that existing test structure is present is：The connector of the stitch with single height can only be carried out
Detection, when the connector to the stitch with different height is detected, stitch higher has blocked sensing chip 3' so that relatively low
Stitch cannot be close to sensing chip 3', cause sensing chip 3' to sense small-signal.Therefore, it is necessary to develop one kind be directed to
The device that various pins connector high is detected.
The content of the invention
Automatic detection mechanism it is an object of the invention to propose one kind of multiple pins connector high, can realize to having
The connector of various stitch height is detected that detection efficiency is high, testing result reliability.
It is that, up to this purpose, the present invention uses following technical scheme：
The automatic detection mechanism of one kind of multiple pins connector high, for being detected to the connector on pcb board, including
The drive device that upper bolster, die shoe and the driving upper bolster move up and down；Pcb board is fixed on the die shoe；Also include：
The fixed seat of the bottom surface of the upper bolster is fixed on, the fixed seat is connected with for guiding what the stitch of the connector was penetrated
Guide layer, is provided with the tablet of multilayer between the guide layer and the fixed seat；The bottom surface of every layer of tablet applies
Insulating protective layer is covered with, is connected by wired in series between tablet described in adjacent two-layer；The tablet is electrically connected with to be put
Big device；The stitch is contacted through the guide layer with the insulating protective layer, and different height the stitch and different layers
The insulating protective layer contact of the tablet high.
Further, the guide layer offers the pilot hole of arrangement corresponding with the stitch, and the stitch is described in
The insulating protective layer after pilot hole with the corresponding tablet is contacted.
Further, the underlying tablet offers through hole corresponding with the pilot hole, the stitch
Sequentially pass through after the pilot hole and the through hole with another tablet being adjacent to above the tablet it is described absolutely
Edge protective layer is contacted.
Further, internal diameter of the internal diameter of the through hole slightly larger than the pilot hole.
Further, it is provided with cushion between the fixed seat and the tablet of top layer.
Further, the thickness of the insulating barrier is 1 μm~2 μm.
Beneficial effects of the present invention are：The automatic detection mechanism of one kind of multiple pins proposed by the present invention connector high, gram
Having taken existing TestJet detection tool can only test the puzzlement of connector of the stitch with single height, by allowing difference
The stitch of height is contacted with the insulating protective layer of corresponding tablet, makes only alternating floor insulation between each stitch and tablet
Overcoat, it is ensured that tablet can sense the small-signal of each stitch transmission, the connector high so as to realize various pins
Detection, detection efficiency is high, testing result reliability.
Brief description of the drawings
Fig. 1 is the schematic diagram of the TestJet detection structures of existing connector；
Fig. 2 is the schematic diagram of the automatic detection mechanism of the various pins for providing of the invention connector high；
Fig. 3 is the signal of one of the various pins for the providing of the invention implementation method of automatic detection mechanism of connector high
Figure.
In figure：1- fixed seats；2- guide layers；21- pilot holes；3- tablets；3'- sensing chips；31- through holes；3a- bottom senses
Answer plate；3b- middle levels tablet；3c- high level tablets；4- cushions；5- connectors；51- stitch；The low stitch of 51a-；In 51b-
Stitch；51c- stitch high；6- amplifiers；7- probes；8- insulating protective layers；9-PCB plates；91- signal transmssion lines；10- signals come
Source；26-ICT tests probe, 27- wires；28- test equipment probes.
Specific embodiment
Further illustrate technical scheme below in conjunction with the accompanying drawings and by specific embodiment.
As shown in Fig. 2 to 3, the automatic detection mechanism of one kind of multiple pins connector high, for the connection on pcb board 9
Device 5 is detected, including the drive device that upper bolster, die shoe and driving upper bolster move up and down；Pcb board is fixed on lower mould
Seat；Also include：The bottom surface for being fixed on the upper bolster includes：Fixed seat 1, fixed seat 1 is connected with for guide connector 5
The guide layer 2 that stitch 51 is penetrated, is provided with the tablet 3 of multilayer between guide layer 2 and fixed seat 1；Every layer of bottom surface of tablet 3
Insulating protective layer 8 is coated with, is connected by wired in series between adjacent two-layer tablet 3；Tablet 3 is electrically connected with amplification
Device 6；Stitch 51 is contacted through guide layer 2 with insulating protective layer 8, and stitch 51 and the different floor heights of different height tablet 3
Insulating protective layer 8 contact.
By the automatic detection mechanism of various pins connector high, the stitch 51 and corresponding tablet of different height are allowed
3 insulating protective layer 8 is contacted, and makes between each stitch 51 and tablet 3 only alternating floor insulating protective layer, it is ensured that tablet 3
The small-signal of each stitch 51 transmission can be sensed, so as to the TestJet for realizing various pins connector 5 high is detected,
Detection efficiency is high, testing result reliability.
In the automatic detection mechanism of various pins connector high, guide layer 2 offers leading for arrangement corresponding with stitch 51
To hole 21, stitch 51 is contacted after passing through pilot hole 21 with the insulating protective layer 8 of corresponding tablet 3, enables stitch to be measured 51 most
It is big possible close to tablet 3, to reach the optimum efficiency of test.
In the automatic detection mechanism of various pins connector high, underlying tablet 3 is offered and pilot hole 21
Corresponding through hole 31, stitch 51 sequentially pass through after pilot hole 21 and through hole 31 with another sense for being adjacent to the top of tablet 3
The bottom surface of the insulating protective layer 8 of plate 3 is answered to contact.Wherein, the internal diameter of pilot hole 21 is adapted with the external diameter of stitch 51, through hole 31
Internal diameter is damaged, while avoiding and lower floor slightly larger than the internal diameter of pilot hole 21 with avoiding stitch 51 that bending occurs when inserting through hole 31
Tablet 3 contact and cause short circuit.
In the automatic detection mechanism of various pins connector high, it is provided between the tablet 3 of fixed seat 1 and top layer slow
Layer 4 is rushed, cushion 4 can be the buffer component such as sponge, modeling rubber or spring, to slow down buffering when being connected with connector 5
Power.
In the automatic detection mechanism of various pins connector high, the thickness of insulating barrier 8 is 1 μm~2 μm.Preferably, should
Insulating protective layer 8 is insulating cement.
As one embodiment of this programme, as shown in figure 3, stitch 51 is divided three classes by height：Low stitch 51a, middle pin
Pin 51b and stitch 51c high, tablet 3 sets and haves three layers, respectively bottom tablet 3a, middle level tablet 3b and high-rise tablet
3c, high-rise tablet 3c is fitted and connected with cushion 4, and bottom tablet 3a is fitted and connected with guide layer 2.Bottom tablet 3a and
Middle level tablet 3b is offered and pilot hole corresponding through hole 31 about 21.Low stitch 51a passes through pilot hole 21 and bottom sense
The bottom surface of the insulating protective layer 8a of plate 3a is answered to contact, middle stitch 51b sequentially passes through the through hole of pilot hole 21 and bottom tablet 3a
31 contact with the bottom surface of the insulating protective layer 8b of middle level tablet 3b, and stitch 51c long sequentially passes through the sensing of pilot hole 21, bottom
The through hole 31 of the through hole 31 of plate 3a and middle level tablet 3b is contacted with the bottom surface of the insulating protective layer 8c of high-rise tablet 3c.
During detection, drive mechanism drives upper bolster to move down, so that the testing agency connects with the connector 5 on pcb board 9
Connect, the stitch 51 of connector 5 is contacted through guide layer 2 with the insulating protective layer 8 of corresponding tablet 3.Signal source 10 produces
Test signal, the stitch 51 of connector 5 is delivered to through the signal transmssion line 91 on pcb board 9, and it is right with it to be sensed by tablet 3
The signal of the stitch 51 answered, and treatment is amplified by amplifier 6, then the probe 7 that warp is connected with amplifier 6 is transmitted to test
System, so as to judge whether the connector 5 is qualified.
Know-why of the invention is described above in association with specific embodiment.These descriptions are intended merely to explain of the invention
Principle, and can not by any way be construed to limiting the scope of the invention.Based on explanation herein, the technology of this area
Personnel associate other specific embodiments of the invention by would not require any inventive effort, these modes fall within
Within protection scope of the present invention.
Claims (6)
1. the automatic detection mechanism of one kind of multiple pins connector high, for being detected to the connector (5) on pcb board (9),
Including the drive device that upper bolster, die shoe and the driving upper bolster move up and down；Pcb board (9) is fixed on the die shoe；
Characterized in that, also including：The fixed seat (1) of the bottom surface of the upper bolster is fixed on, the fixed seat (1) is connected with for leading
Draw the guide layer (2) that the stitch (51) of the connector (5) is penetrated, set between the guide layer (2) and the fixed seat (1)
There is the tablet (3) of multilayer；The bottom surface of every layer of tablet (3) is coated with insulating protective layer (8), described in adjacent two-layer
Connected by wired in series between tablet (3)；The tablet (3) is electrically connected with amplifier (6)；The stitch (51) passes through
The guide layer (2) contacts with the insulating protective layer (8), and the stitch (51) of different height from described in different floor heights
The insulating protective layer (8) contact of tablet (3).
2. the automatic detection mechanism of various pins according to claim 1 connector high, it is characterised in that the guide layer
(2) pilot hole (21) of arrangement corresponding with the stitch (51) is offered, the stitch (51) is through after the pilot hole (21)
Contacted with the insulating protective layer (8) of the corresponding tablet (3).
3. the automatic detection mechanism of various pins according to claim 2 connector high, it is characterised in that underlying
The tablet (3) offers through hole (31) corresponding with the pilot hole (21), and the stitch (51) sequentially passes through described leading
It is described with another tablet (3) of the top for being adjacent to the tablet (3) afterwards to hole (21) and the through hole (31)
Insulating protective layer (8) is contacted.
4. the automatic detection mechanism of various pins according to claim 3 connector high, it is characterised in that the through hole
(31) internal diameter of the internal diameter slightly larger than the pilot hole (21).
5. the automatic detection mechanism of various pins according to claim 1 connector high, it is characterised in that the fixed seat
(1) cushion (4) is provided with and the tablet (3) of top layer between.
6. the automatic detection mechanism of various pins according to claim 1 connector high, it is characterised in that the insulating barrier
(8) thickness is 1 μm~2 μm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710012757.6A CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710012757.6A CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106771831A true CN106771831A (en) | 2017-05-31 |
| CN106771831B CN106771831B (en) | 2023-09-01 |
Family
ID=58950595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710012757.6A Active CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106771831B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107656171A (en) * | 2017-09-08 | 2018-02-02 | 上海锡明光电科技有限公司 | Fuse inserting state detection method and equipment |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5136238A (en) * | 1990-11-26 | 1992-08-04 | Electro-Fix, Inc. | Test fixture with diaphragm board with one or more internal grounded layers |
| US5174765A (en) * | 1986-05-14 | 1992-12-29 | Barvid Technology Inc. | Electrical connector having electrically conductive elastomer covered by insulating elastomer |
| US6426637B1 (en) * | 1999-12-21 | 2002-07-30 | Cerprobe Corporation | Alignment guide and signal transmission apparatus and method for spring contact probe needles |
| CN2800511Y (en) * | 2005-04-08 | 2006-07-26 | 富士康(昆山)电脑接插件有限公司 | Electronic card connector |
| CN101093991A (en) * | 2006-06-22 | 2007-12-26 | 深圳正盟电子有限公司 | Capacitive induction switch device |
| CN101261302A (en) * | 2007-03-08 | 2008-09-10 | 德律科技股份有限公司 | Open circuit detection system and its method |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| CN101769979A (en) * | 2009-01-05 | 2010-07-07 | 昆山意力电路世界有限公司 | Connector test fixture |
| CN102272612A (en) * | 2009-01-08 | 2011-12-07 | 爱德万测试株式会社 | Testing apparatus |
| US20120244753A1 (en) * | 2009-12-08 | 2012-09-27 | Erni Electronics Gmbh | Relief plug-in connector and multilayer circuit board |
| CN102726125A (en) * | 2009-08-31 | 2012-10-10 | 厄尼电子有限公司 | Plug connector and multi-layer circuit board |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN206369778U (en) * | 2017-01-09 | 2017-08-01 | 昆山艾伯格机器人科技有限公司 | The automatic detection mechanism of the high connector of a variety of pins |
-
2017
- 2017-01-09 CN CN201710012757.6A patent/CN106771831B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5174765A (en) * | 1986-05-14 | 1992-12-29 | Barvid Technology Inc. | Electrical connector having electrically conductive elastomer covered by insulating elastomer |
| US5136238A (en) * | 1990-11-26 | 1992-08-04 | Electro-Fix, Inc. | Test fixture with diaphragm board with one or more internal grounded layers |
| US6426637B1 (en) * | 1999-12-21 | 2002-07-30 | Cerprobe Corporation | Alignment guide and signal transmission apparatus and method for spring contact probe needles |
| CN2800511Y (en) * | 2005-04-08 | 2006-07-26 | 富士康(昆山)电脑接插件有限公司 | Electronic card connector |
| CN101093991A (en) * | 2006-06-22 | 2007-12-26 | 深圳正盟电子有限公司 | Capacitive induction switch device |
| CN101261302A (en) * | 2007-03-08 | 2008-09-10 | 德律科技股份有限公司 | Open circuit detection system and its method |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| CN101769979A (en) * | 2009-01-05 | 2010-07-07 | 昆山意力电路世界有限公司 | Connector test fixture |
| CN102272612A (en) * | 2009-01-08 | 2011-12-07 | 爱德万测试株式会社 | Testing apparatus |
| CN102726125A (en) * | 2009-08-31 | 2012-10-10 | 厄尼电子有限公司 | Plug connector and multi-layer circuit board |
| US20120244753A1 (en) * | 2009-12-08 | 2012-09-27 | Erni Electronics Gmbh | Relief plug-in connector and multilayer circuit board |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN206369778U (en) * | 2017-01-09 | 2017-08-01 | 昆山艾伯格机器人科技有限公司 | The automatic detection mechanism of the high connector of a variety of pins |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107656171A (en) * | 2017-09-08 | 2018-02-02 | 上海锡明光电科技有限公司 | Fuse inserting state detection method and equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106771831B (en) | 2023-09-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2014108048A1 (en) | Apparatus for testing touchscreen module and touchscreen module | |
| CN110383443A (en) | Inspection system and the accident analysis and prediction method for checking system | |
| CN206369778U (en) | The automatic detection mechanism of the high connector of a variety of pins | |
| WO2021051647A1 (en) | Back-drilling nondestructive testing method for pcb | |
| CN106771831A (en) | The automatic detection mechanism of various pins connector high | |
| KR100897982B1 (en) | Miss align preventing pattern and method thereof between probe card niddle and pad | |
| KR101625951B1 (en) | In circuit tester inspection System for Flexible PCB assembly for earjack assembly | |
| TW201925809A (en) | Continuous automatic inspection apparatus that includes a plurality of carrying devices, a plurality of inspection fixtures, a support frame, an inspection device, a reading device, and a driving member | |
| TW202414208A (en) | System for inspecting test probe board of boundary scan interconnect equipment | |
| CN207571268U (en) | A kind of circuit board test platform | |
| CN107643324A (en) | A kind of non-copper facing hole detection means of pcb board | |
| KR101733076B1 (en) | Optical inspection system | |
| JP3717241B2 (en) | Substrate inspection method and apparatus | |
| US6815972B2 (en) | Method of determining disconnection location in a circuit | |
| CN112782438A (en) | Magnetic suction type probe card device | |
| KR100765490B1 (en) | PCB electrode plate | |
| KR200417528Y1 (en) | PCB electrode plate | |
| CN202949645U (en) | Circuit board | |
| JPH1164428A (en) | Component inspection device | |
| TWI824686B (en) | Detection circuit | |
| JPH10197559A (en) | Test head with switch probe | |
| TW202015498A (en) | Back drilling method of circuit board | |
| JP2924820B2 (en) | Electronic circuit connection inspection method and connection inspection device | |
| TWI783549B (en) | Improving test coverage rate system for pin of tested circuit board and method thereof | |
| CN206388876U (en) | A kind of ground connection redundancy structure for detector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |