CN106771831B - Automatic detection mechanism for connectors with multiple pin heights - Google Patents
Automatic detection mechanism for connectors with multiple pin heights Download PDFInfo
- Publication number
- CN106771831B CN106771831B CN201710012757.6A CN201710012757A CN106771831B CN 106771831 B CN106771831 B CN 106771831B CN 201710012757 A CN201710012757 A CN 201710012757A CN 106771831 B CN106771831 B CN 106771831B
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- layer
- pins
- induction plate
- heights
- connectors
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses an automatic detection mechanism of connectors with various pin heights, which is used for detecting connectors on a PCB (printed circuit board), and comprises an upper die holder, a lower die holder and a driving device for driving the upper die holder to move up and down; the PCB is fixed on the lower die holder; further comprises: the fixing seat is fixed on the bottom surface of the upper die seat, the fixing seat is connected with a guide layer for guiding pins of the connector to penetrate, and a plurality of layers of induction plates are arranged between the guide layer and the fixing seat; the bottom surface of each layer of induction plate is coated with an insulating protection layer, and two adjacent layers of induction plates are connected in series through a wire; the induction plate is electrically connected with an amplifier; pins penetrate through the guide layer to be in contact with the insulating protection layer, and pins with different heights are in contact with the insulating protection layers of the induction plates with different layer heights. The automatic detection mechanism of the connectors with the plurality of pin heights can detect the connectors with the plurality of pin heights, and has high detection efficiency and reliable detection result.
Description
Technical Field
The invention relates to the technical field of detection, in particular to an automatic detection mechanism of a connector with multiple pin heights.
Background
The printed circuit board (Printed Circuit Board) is called as PCB for short, and in the production process, whether the connection between the PCB and the connector on the PCB is good or not must be detected, and whether the connection is open or not is judged to be qualified or not. The test is typically performed using TestJet test techniques. TestJet is a design of an ICT (on-line) test pushed out by agilent, and is mainly aimed at detecting connection quality between an electronic part mounted on a PCB board and the PCB board (i.e. whether the PCB board is well connected with a pin of the part, and whether there is an open-short problem). The connector is also one of the electronic parts therein. The TestJet test structure of the existing connector is shown in fig. 1, and the test equipment sends weak signals to the ICT test probes 26 connected to the PCB 9 on the test fixture through the test equipment probes 28 and the wires 27 in turn. The weak signal is routed through the wiring on the PCB 9 by the individual pins 51 on the connector. If the soldering open circuit occurs, the pin 51 on the connector cannot transmit the weak signal, otherwise the sensing piece 3' of TestJet amplifies the sensed weak signal through the amplifier 6 and then transmits the amplified signal back to the testing device. Because of the weak signal, the sensing strip 3' must be very close to the pins 51 of the connector to effectively fulfill the corresponding test requirements.
However, the existing test structure has the following problems: only the connector with the pins with single height can be detected, and when the connector with the pins with different heights is detected, the higher pins block the sensing piece 3', so that the lower pins cannot approach the sensing piece 3', and the sensing piece 3' cannot sense weak signals. Therefore, it is necessary to develop a device for detecting a connector having a plurality of pin heights.
Disclosure of Invention
The invention aims to provide an automatic detection mechanism for connectors with various pin heights, which can realize the detection of connectors with various pin heights, and has the advantages of high detection efficiency and reliable detection result.
To achieve the purpose, the invention adopts the following technical scheme:
an automatic detection mechanism of connectors with multiple pin heights is used for detecting connectors on a PCB and comprises an upper die holder, a lower die holder and a driving device for driving the upper die holder to move up and down; the PCB is fixed on the lower die holder; further comprises: the fixing seat is fixed on the bottom surface of the upper die seat, the fixing seat is connected with a guide layer used for guiding pins of the connector to penetrate, and a plurality of layers of induction plates are arranged between the guide layer and the fixing seat; the bottom surface of each layer of induction plate is coated with an insulating protection layer, and two adjacent layers of induction plates are connected in series through a wire; the induction plate is electrically connected with an amplifier; the pins penetrate through the guide layer to be in contact with the insulating protection layer, and the pins with different heights are in contact with the insulating protection layer of the induction plate with different layer heights.
Further, the guiding layer is provided with guiding holes which are arranged corresponding to the pins, and the pins pass through the guiding holes and then contact with the corresponding insulating protection layers of the induction plate.
Further, the induction plate located below is provided with a through hole corresponding to the guide hole, and the pins sequentially pass through the guide hole and the through hole and then contact with the insulating protection layer of the other induction plate adjacent to the upper part of the induction plate.
Further, the inner diameter of the through hole is slightly larger than the inner diameter of the guide hole.
Further, a buffer layer is arranged between the fixing seat and the sensing plate on the top layer.
Further, the thickness of the insulating protective layer is 1 μm to 2 μm.
The beneficial effects of the invention are as follows: the automatic detection mechanism for the connectors with multiple pin heights provided by the invention overcomes the defect that the existing TestJet detection jig can only test connectors with pins with single height, and ensures that the induction plate can sense weak signals transmitted by each pin by only separating one insulating protective layer between each pin and the induction plate by enabling pins with different heights to contact the insulating protective layers of the corresponding induction plate, thereby realizing the detection of the connectors with multiple pin heights, and having high detection efficiency and reliable detection result.
Drawings
Fig. 1 is a schematic diagram of a TestJet detection structure of a prior art connector;
FIG. 2 is a schematic illustration of an automatic detection mechanism for multiple pin connectors provided by the present invention;
fig. 3 is a schematic diagram of one embodiment of an automatic detection mechanism for multiple pin connectors provided by the present invention.
In the figure: 1-a fixed seat; 2-a guiding layer; 21-a guide hole; 3-a sensing plate; a 3' -sensor sheet; 31-through holes; 3 a-a bottom layer induction plate; 3 b-middle layer induction plate; 3 c-a high-rise induction plate; 4-a buffer layer; a 5-connector; 51-stitch; 51 a-low pin; 51 b-middle stitch; 51 c-high stitch; a 6-amplifier; 7-probe; 8-an insulating protective layer; 9-a PCB board; 91-signal transmission lines; 10-signal source; 26-ICT test probes, 27-leads; 28-test equipment probes.
Detailed Description
The technical scheme of the invention is further described below by the specific embodiments with reference to the accompanying drawings.
As shown in fig. 2 to 3, an automatic detection mechanism for connectors with multiple pin heights is used for detecting a connector 5 on a PCB 9, and comprises an upper die holder, a lower die holder and a driving device for driving the upper die holder to move up and down; the PCB is fixed on the lower die holder; further comprises: the bottom surface that is fixed in the upper die base includes: the fixing base 1, the fixing base 1 is connected with a guiding layer 2 for guiding the pins 51 of the connector 5 to penetrate, and a plurality of layers of induction plates 3 are arranged between the guiding layer 2 and the fixing base 1; the bottom surface of each layer of induction plate 3 is coated with an insulating protection layer 8, and two adjacent layers of induction plates 3 are connected in series through a wire; the induction plate 3 is electrically connected with an amplifier 6; the pins 51 pass through the guiding layer 2 to be in contact with the insulating protection layer 8, and the pins 51 with different heights are in contact with the insulating protection layer 8 of the sensing plate 3 with different layer heights.
Through the automatic detection mechanism of the connector with various pin heights, pins 51 with different heights are contacted with the insulating protection layers 8 of the corresponding induction plates 3, only one insulating protection layer is arranged between each pin 51 and each induction plate 3, the induction plates 3 are ensured to sense weak signals transmitted by each pin 51, and accordingly, the TestJet detection of the connector 5 with various pin heights is realized, the detection efficiency is high, and the detection result is reliable.
In the automatic detection mechanism of the connector with multiple pin heights, the guide layer 2 is provided with the guide holes 21 which are correspondingly arranged with the pins 51, and the pins 51 pass through the guide holes 21 and then contact with the insulating protection layers 8 of the corresponding induction plates 3, so that the pins 51 to be detected can be maximally close to the induction plates 3, and the optimal effect of the test is achieved.
In the automatic detection mechanism of the connector with multiple pin heights, the induction plate 3 positioned below is provided with the through hole 31 corresponding to the guide hole 21, and the pins 51 sequentially pass through the guide hole 21 and the through hole 31 and then contact with the bottom surface of the insulating protection layer 8 of the other induction plate 3 adjacent to the upper part of the induction plate 3. The inner diameter of the guide hole 21 is adapted to the outer diameter of the pin 51, and the inner diameter of the through hole 31 is slightly larger than the inner diameter of the guide hole 21, so as to avoid bending damage when the pin 51 is inserted into the through hole 31, and avoid short circuit caused by contact with the lower sensing plate 3.
In the automatic detection mechanism of the connector with various pin heights, a buffer layer 4 is arranged between the fixing seat 1 and the sensing plate 3 on the top layer, and the buffer layer 4 can be a buffer member such as a sponge, a plastic rubber product or a spring, so as to slow down the buffer force when being connected with the connector 5.
In the automatic detection mechanism of the connector with multiple pin heights, the thickness of the insulating protection layer 8 is 1-2 μm. Preferably, the insulating protective layer 8 is an insulating paste.
As an example of this solution, as shown in fig. 3, the pins 51 are classified into three types by height: the induction plate 3 is provided with 3 layers, namely a bottom induction plate 3a, a middle induction plate 3b and a high induction plate 3c, wherein the high induction plate 3c is in fit connection with the buffer layer 4, and the bottom induction plate 3a is in fit connection with the guide layer 2. The bottom layer induction plate 3a and the middle layer induction plate 3b are respectively provided with a through hole 31 vertically corresponding to the guide hole 21. The low pins 51a pass through the guide holes 21 to contact the bottom surface of the insulating protection layer 8a of the bottom induction plate 3a, the middle pins 51b pass through the guide holes 21 and the through holes 31 of the bottom induction plate 3a in sequence to contact the bottom surface of the insulating protection layer 8b of the middle induction plate 3b, and the long pins 51c pass through the guide holes 21, the through holes 31 of the bottom induction plate 3a and the through holes 31 of the middle induction plate 3b in sequence to contact the bottom surface of the insulating protection layer 8c of the high induction plate 3 c.
During detection, the driving mechanism drives the upper die holder to move downwards so that the detection mechanism is connected with the connector 5 on the PCB 9, and pins 51 of the connector 5 penetrate through the guide layer 2 to be in contact with the insulating protection layer 8 of the corresponding induction plate 3. The signal source 10 generates a test signal, the test signal is transmitted to the pins 51 of the connector 5 through the signal transmission line 91 on the PCB 9, the signal of the corresponding pins 51 is sensed through the sensing board 3, the signal is amplified through the amplifier 6, and the amplified signal is transmitted to the test system through the probe 7 connected with the amplifier 6, so that whether the connector 5 is qualified or not is judged.
The technical principle of the present invention is described above in connection with the specific embodiments. The description is made for the purpose of illustrating the general principles of the invention and should not be taken in any way as limiting the scope of the invention. Other embodiments of the invention will be apparent to those skilled in the art from consideration of this specification without undue burden.
Claims (3)
1. An automatic detection mechanism of connectors with multiple pin heights is used for detecting connectors (5) on a PCB (9), and comprises an upper die holder, a lower die holder and a driving device for driving the upper die holder to move up and down; the PCB (9) is fixed on the lower die holder; characterized by further comprising: the fixing seat (1) is fixed on the bottom surface of the upper die seat, the fixing seat (1) is connected with a guide layer (2) used for guiding pins (51) of the connector (5) to penetrate, and a plurality of layers of induction plates (3) are arranged between the guide layer (2) and the fixing seat (1); the bottom surface of each layer of induction plate (3) is coated with an insulating protection layer (8), and two adjacent layers of induction plates (3) are connected in series through wires; the induction plate (3) is electrically connected with an amplifier (6); the pins (51) penetrate through the guide layer (2) to be in contact with the insulating protection layer (8), and the pins (51) with different heights are in contact with the insulating protection layer (8) of the induction plate (3) with different layer heights;
the guide layer (2) is provided with guide holes (21) which are arranged corresponding to the pins (51), and the pins (51) pass through the guide holes (21) and then are contacted with the corresponding insulating protection layers (8) of the induction plate (3);
the induction plate (3) positioned below is provided with a through hole (31) corresponding to the guide hole (21), and the pins (51) sequentially pass through the guide hole (21) and the through hole (31) and then contact with the insulating protection layer (8) of the other induction plate (3) adjacent to the upper part of the induction plate (3);
a buffer layer (4) is arranged between the fixing seat (1) and the sensing plate (3) on the top layer.
2. The automatic detection mechanism of a connector of various pin heights according to claim 1, wherein the inner diameter of the through hole (31) is slightly larger than the inner diameter of the guide hole (21).
3. The automatic detection mechanism of a connector of various pin heights according to claim 1, characterized in that the thickness of the insulating protective layer (8) is 1 μm to 2 μm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710012757.6A CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710012757.6A CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106771831A CN106771831A (en) | 2017-05-31 |
| CN106771831B true CN106771831B (en) | 2023-09-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201710012757.6A Active CN106771831B (en) | 2017-01-09 | 2017-01-09 | Automatic detection mechanism for connectors with multiple pin heights |
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| CN (1) | CN106771831B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107656171B (en) * | 2017-09-08 | 2020-06-02 | 上海锡明光电科技有限公司 | Fuse plugging state detection method and equipment |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5136238A (en) * | 1990-11-26 | 1992-08-04 | Electro-Fix, Inc. | Test fixture with diaphragm board with one or more internal grounded layers |
| US5174765A (en) * | 1986-05-14 | 1992-12-29 | Barvid Technology Inc. | Electrical connector having electrically conductive elastomer covered by insulating elastomer |
| US6426637B1 (en) * | 1999-12-21 | 2002-07-30 | Cerprobe Corporation | Alignment guide and signal transmission apparatus and method for spring contact probe needles |
| CN2800511Y (en) * | 2005-04-08 | 2006-07-26 | 富士康(昆山)电脑接插件有限公司 | Electronic card connector |
| CN101093991A (en) * | 2006-06-22 | 2007-12-26 | 深圳正盟电子有限公司 | Capacitive induction switch device |
| CN101261302A (en) * | 2007-03-08 | 2008-09-10 | 德律科技股份有限公司 | Open circuit detection system and its method |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| CN101769979A (en) * | 2009-01-05 | 2010-07-07 | 昆山意力电路世界有限公司 | Connector test fixture |
| CN102272612A (en) * | 2009-01-08 | 2011-12-07 | 爱德万测试株式会社 | Testing apparatus |
| CN102726125A (en) * | 2009-08-31 | 2012-10-10 | 厄尼电子有限公司 | Plug connector and multi-layer circuit board |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN206369778U (en) * | 2017-01-09 | 2017-08-01 | 昆山艾伯格机器人科技有限公司 | The automatic detection mechanism of the high connector of a variety of pins |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009057260A1 (en) * | 2009-12-08 | 2011-08-04 | ERNI Electronics GmbH, 73099 | Relief connector and multilayer board |
-
2017
- 2017-01-09 CN CN201710012757.6A patent/CN106771831B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5174765A (en) * | 1986-05-14 | 1992-12-29 | Barvid Technology Inc. | Electrical connector having electrically conductive elastomer covered by insulating elastomer |
| US5136238A (en) * | 1990-11-26 | 1992-08-04 | Electro-Fix, Inc. | Test fixture with diaphragm board with one or more internal grounded layers |
| US6426637B1 (en) * | 1999-12-21 | 2002-07-30 | Cerprobe Corporation | Alignment guide and signal transmission apparatus and method for spring contact probe needles |
| CN2800511Y (en) * | 2005-04-08 | 2006-07-26 | 富士康(昆山)电脑接插件有限公司 | Electronic card connector |
| CN101093991A (en) * | 2006-06-22 | 2007-12-26 | 深圳正盟电子有限公司 | Capacitive induction switch device |
| CN101261302A (en) * | 2007-03-08 | 2008-09-10 | 德律科技股份有限公司 | Open circuit detection system and its method |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| CN101769979A (en) * | 2009-01-05 | 2010-07-07 | 昆山意力电路世界有限公司 | Connector test fixture |
| CN102272612A (en) * | 2009-01-08 | 2011-12-07 | 爱德万测试株式会社 | Testing apparatus |
| CN102726125A (en) * | 2009-08-31 | 2012-10-10 | 厄尼电子有限公司 | Plug connector and multi-layer circuit board |
| CN103837817A (en) * | 2012-11-26 | 2014-06-04 | 昆山威典电子有限公司 | Double-section test structure of PCB ejector pad |
| CN206369778U (en) * | 2017-01-09 | 2017-08-01 | 昆山艾伯格机器人科技有限公司 | The automatic detection mechanism of the high connector of a variety of pins |
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| CN106771831A (en) | 2017-05-31 |
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