CN106326059B - A kind of embedded device automatization test system - Google Patents
A kind of embedded device automatization test system Download PDFInfo
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- CN106326059B CN106326059B CN201610828476.3A CN201610828476A CN106326059B CN 106326059 B CN106326059 B CN 106326059B CN 201610828476 A CN201610828476 A CN 201610828476A CN 106326059 B CN106326059 B CN 106326059B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
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Abstract
A kind of embedded device automatization test system, comprising: data-source device, the data-source device generate data；USB interface, the USB interface are mounted in the data-source device, the test command that the USB interface is used to transmit the data of data-source device generation and automatization test system issues data-source device；SD card storage system, including SD storage card, RTC clock controller；Automatization test system, the automatization test system are connect with the SD card storage system both-way communication, and the SD card storage system gives received data transmission to the automatization test system in real time；The automatization test system is for sending test command to data-source device.The present invention is convenient, easy to operate, realizes the two-way communication transmission of data, can automatically save data, and be automatically performed the test to data-source device.Keep data more time-efficient, inquiry when data analysis can be simplified, and substantially increase testing efficiency.
Description
Technical field
The present invention relates to automatic field more particularly to a kind of embedded device automatization test systems.
Background technique
Embedded system is one of IT application field most promising at present, is widely used in industrial control at present
The various aspects such as system, home appliance, intellectual product.Compared with general purpose type computer system, embedded system has following excellent: a. function
Consume low, high reliablity；B. powerful, the ratio of performance to price is high；C. strong real-time supports multitask；D. it occupies little space, efficiency
It is high；It e., can flexible customization as needed towards specific application.
Serial ports (RS232/RS485 etc.) data logger or usb data recorder of commercial type at present, typically
It is transferred data in SD or Flash and is saved by serial ports, the data of collection can be managed and be analyzed on PC.But exist with
Lower shortcoming: 1, data transmission belongs to one-way transmission, sends data in SD card from data source by serial ports to save.It protects
Depositing is clear data, and without time identifier, time-consuming query information is needed when being analyzed data export；Especially data are in spy
It fixes time for information about, the timeliness of data cannot be judged by data.2, data one-way communication, user can not be to data
Source device operation need to interrupt data acquisition to operation, cause data to save imperfect, be not carried out automatic test effect.
When testing product, sometimes can only transmitting order to lower levels tested to equipment crawl log, such as mobile unit,
PC inconvenient to use carries out test operation, existing some test method complex steps and can only cause from individual event functional test
Efficiency test is very low.
Summary of the invention
The present invention provides a kind of embedded device automatization test system, can data during collecting test in real time,
And multiple function test is carried out simultaneously, realize the two-way communication transmission of data in test process.
The present invention is achieved by the following technical solutions:
A kind of embedded device automatization test system, comprising:
Data-source device, the data-source device generates data, and transfers data to SD card storage system；
USB interface, the USB interface are mounted in the data-source device, and the USB interface is set for transmitting data source
The test command that the standby data generated and automatization test system issue data-source device；
SD card storage system, including SD storage card, RTC clock controller, the SD storage card are set in source for storing data
The data of standby transmission, when the SD card storage system receives data, the RTC clock controller to receive time of data into
Row calibration, when the SD card storage system saves data, the RTC clock controller adds time-tagging to data；
Automatization test system, the automatization test system is connect with the SD card storage system both-way communication, described
SD card storage system gives received data transmission to the automatization test system in real time；The automatization test system is for sending out
Send test command to data-source device.
A kind of above-mentioned embedded device automatization test system, wherein the SD card storage system further include battery and
Switch, the battery is for being powered SD card storage system, and the switch is for controlling battery.
A kind of above-mentioned embedded device automatization test system, wherein the SD card storage system further includes LED light,
When data transmission is to the SD card storage system, the LED light flashing.
Above-mentioned a kind of embedded device automatization test system, wherein the automatization test system is using script text
Part configuration.
Above-mentioned a kind of embedded device automatization test system, wherein be arranged one in the automatization test system
Clock chip, the RTC clock controller real time calibration clock chip, by the clock chip in the automatic test system
Setting sends the time of test command in system, and the automatization test system is according to the time timing for sending test command or every
Test command is sent to data-source device every certain time.
Above-mentioned a kind of embedded device automatization test system, wherein set and return in the automatization test system
Value and the corresponding test command of return value are returned, the automatization test system is determined according to the data that SD card storage system transmits
Return value, and test command is issued to data-source device according to return value.
Above-mentioned a kind of embedded device automatization test system, wherein in the automatic test module, also set up
One data memory module, the data memory module are used to store the return value and the corresponding test command of return value of setting.
In conclusion by adopting the above-described technical solution, compared with prior art, the present invention having the advantage that and beneficial
Effect:
The present invention is convenient, easy to operate, can automatically save data, and be automatically performed the test to data-source device.Pass through RTC
The time calibration function of clock controller keeps data more time-efficient, can simplify so that the data saved have time tag
Inquiry when data are analyzed.
Present invention timing sends test command to data-source device at interval of certain time, meanwhile, it is set according to data source
Standby related data issues test command, and the two combines, and individual event functional test is changed into multiple function test, is substantially increased
Testing efficiency.
Automatization test system of the invention is configured using script file, writes issuing for test command by configuration script
Time and mode, function setting of the invention can be adjusted by programming, therefore can be widely used in different product
In test, automatic multifunctional test is realized.By issue test command, it can be achieved that data-source device and SD card storage system,
The two-way communication of automatization test system is transmitted, in system testing, make test scope more comprehensively, it is more system, more efficient.
Detailed description of the invention
Fig. 1 is a kind of schematic diagram of embedded device automatization test system of the present invention.
Specific embodiment
A specific embodiment of the invention is described in detail with reference to the accompanying drawing.
Referring to Figure 1, the present embodiment provides a kind of embedded device automatization test system, the test macro includes:
Data-source device and the USB interface being mounted in data-source device, SD card storage system and automatization test system.
The data-source device is used for the related data of generating device, and transfers data to SD card storage system.
The data and automatization test system that the USB interface is used to transmit data-source device generation are under data-source device
The test command of hair.
The SD card storage system includes SD storage card, RTC clock controller, SD storage card source for storing data
The data of equipment transmission, SD storage card is small in size and memory capacity is big, easy to use.Data are received in the SD card storage system
When, the RTC clock controller calibrates the time for receiving data, when the SD card storage system saves data, institute
It states RTC clock controller and time-tagging is added to data.
The data of data-source device are saved in SD storage card by the present invention in real time by USB interface, and the data of preservation are
Data leading portion can be added time tag, simplify data analysis by transparent data, the present invention by setting RTC clock controller
When inquiry.
Further, the SD card storage system further includes battery, switch and LED light, and the switch control battery is to SD card
Storage system is powered, when data transmission is to the SD card storage system, the LED light flashing, indicate data receiver at
Function, and stored with file mode.
The present invention realizes data transmission and the number between data-source device and SD card storage system using USB2.0 wiring
According to the transmission of the test command between source device and automatization test system.USB2.0 wiring is a kind of high speed for supporting hot plug
Serial transmission bus carries out transmission data using differential signal.
The automatization test system is connect with the SD card storage system both-way communication, and the SD card storage system is real-time
Give received data transmission to the automatization test system；The automatization test system is for sending test command to data
Source device.
Clock chip, the RTC clock controller real time calibration clock core are set in the automatization test system
Piece, the clock chip set the time for sending test command, the automatic test system in the automatization test system
System sends test command to data-source device according to the time timing for sending test command or at interval of certain time.
Test command is sent to data-source device using the above method, timing or at interval of certain time, is set without interrupting
Standby operation and data collection, data-source device when real-time testing that can be simple and convenient is run are a kind of very convenient
Automated testing method.
The automatization test system using script file configure, in the automatization test system set return value with
And the corresponding test command of return value, return value and the corresponding test command of return value are stored in a data memory module.
The data of the automatization test system real-time statistic analysis SD card storage system transmission, and return value is determined according to data, under
The corresponding test command of return value is sent out to data-source device.
Using the above method, the related data of data-source device can be analyzed in real time, and test is issued according to related data
Order, can effectively prevent data-source device to break down.It can also be issued according to the fixed return value of related data according to return value
Test command controls the operation of equipment, presets testing process automatically, automatic jumps to default testing process in equipment operation,
The test of completion system is a kind of very convenient automated testing method without interrupting operation and the data collection of equipment.
By the above method, present invention timing or at interval of certain time to data-source device transmission test command, meanwhile,
Test command is issued according to the related data of data-source device, the two combines, and individual event functional test is changed into multiple function and is surveyed
Examination, high optimizes testing efficiency.
In conclusion the present invention embedded is set based on USB interface, SD storage card, the portable of RTC clock controller
Standby automatization test system, the present invention is convenient, easy to operate, can automatically save data, and be automatically performed the survey to data-source device
Examination.
By the time calibration function of RTC clock controller, so that the data saved have time tag, have more data
Time-effectiveness can simplify inquiry when data analysis.
Automatization test system of the invention is configured using script file, writes issuing for test command by configuration script
Time and mode, function setting of the invention can be adjusted by programming, therefore can be widely used in different product
In test, automatic multifunctional test is realized.By issue test command, it can be achieved that data-source device and SD card storage system,
The two-way communication of automatization test system is transmitted, in system testing, make test scope more comprehensively, it is more system, more efficient.
SD card storage system of the invention is powered using battery, is had portability, can be used in different environments, and make
PC is not depended on process.After the completion of test, SD storage card can be taken out, the data in SD storage card are read by card reader,
And the timeliness and function accuracy that can be analyzed on PC with detection data.
Embodiment described above is merely to illustrate technical idea and feature of the invention, in the art its object is to make
Technical staff can understand the content of the present invention and implement it accordingly, patent model of the invention only cannot be limited with the present embodiment
It encloses, i.e., it is all according to same changes or modifications made by disclosed spirit, it still falls in the scope of the patents of the invention.
Claims (7)
1. a kind of embedded device automatization test system characterized by comprising
Data-source device, the data-source device generates data, and transfers data to SD card storage system；
USB interface, the USB interface are mounted in the data-source device, and the USB interface is raw for transmitting data-source device
At data and automatization test system test command that data-source device is issued；
SD card storage system, including SD storage card, RTC clock controller, source device passes the SD storage card for storing data
The data sent, when the SD card storage system receives data, the RTC clock controller carries out school to the time for receiving data
Standard, when the SD card storage system saves data, the RTC clock controller adds time-tagging to data；
Automatization test system, the automatization test system are connect with the SD card storage system both-way communication, the SD card
Storage system gives received data transmission to the automatization test system in real time；The automatization test system is surveyed for sending
Examination order is to data-source device.
2. a kind of embedded device automatization test system according to claim 1, which is characterized in that the SD card storage
System further includes battery and switch, and the battery is for being powered SD card storage system, and the switch is for controlling battery.
3. a kind of embedded device automatization test system according to claim 2, which is characterized in that the SD card storage
System further includes LED light, when data transmission is to the SD card storage system, the LED light flashing.
4. a kind of embedded device automatization test system according to claim 1, which is characterized in that the automation is surveyed
Test system is configured using script file.
5. a kind of embedded device automatization test system according to claim 4, which is characterized in that in the automation
Clock chip is set in test macro, and the RTC clock controller real time calibration clock chip is existed by the clock chip
Setting sends the time of test command in the automatization test system, and the automatization test system is according to transmission test command
Time timing or at interval of certain time to data-source device send test command.
6. a kind of embedded device automatization test system according to claim 4, which is characterized in that in the automation
Return value and the corresponding test command of return value are set in test macro, the automatization test system is stored according to SD card is
The data of system transmission determine return value, and issue test command to data-source device according to return value.
7. a kind of embedded device automatization test system according to claim 6, which is characterized in that in the automation
In test macro, a data memory module is also set up, the data memory module is used to store the return value and return of setting
It is worth corresponding test command.
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| CN201610828476.3A CN106326059B (en) | 2016-09-18 | 2016-09-18 | A kind of embedded device automatization test system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106685767A (en) * | 2017-03-22 | 2017-05-17 | 百通赫思曼工业（苏州）有限公司 | Multi-pair-data automatic testing system |
| CN110379149A (en) * | 2019-08-15 | 2019-10-25 | 珠海格力智能装备有限公司 | Equipment detection method and device |
| CN113156855A (en) * | 2021-04-07 | 2021-07-23 | 杭州永谐科技有限公司成都分公司 | Miniature data acquisition and processing system |
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