Nothing Special   »   [go: up one dir, main page]

Cabanas-Holmen et al., 2011 - Google Patents

Predicting the single-event error rate of a radiation hardened by design microprocessor

Cabanas-Holmen et al., 2011

Document ID
13590380541225930623
Author
Cabanas-Holmen M
Cannon E
Amort T
Ballast J
Brees R
Fischer S
Kleinosowski A
Meaker B
Swann T
Wert J
Publication year
Publication venue
IEEE Transactions on Nuclear Science

External Links

Snippet

Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor Page 1 2726 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 58, NO. 6, DECEMBER 2011 Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Error detection; Error correction; Monitoring responding to the occurence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Error detection; Error correction; Monitoring responding to the occurence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation
    • G06F11/1402—Saving, restoring, recovering or retrying
    • G06F11/1405—Saving, restoring, recovering or retrying at machine instruction level
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3466—Performance evaluation by tracing or monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G06F11/3632—Software debugging of specific synchronisation aspects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power Management, i.e. event-based initiation of power-saving mode
    • G06F1/3234—Action, measure or step performed to reduce power consumption
    • G06F1/3237—Power saving by disabling clock generation or distribution
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for programme control, e.g. control unit
    • G06F9/06—Arrangements for programme control, e.g. control unit using stored programme, i.e. using internal store of processing equipment to receive and retain programme
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70—Fault tolerant, i.e. transient fault suppression
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled

Similar Documents

Publication Publication Date Title
Nguyen et al. Chip-level soft error estimation method
Cheng et al. Clear: C ross-l ayer e xploration for a rchitecting r esilience-combining hardware and software techniques to tolerate soft errors in processor cores
de Oliveira et al. Evaluation and mitigation of radiation-induced soft errors in graphics processing units
Mitra et al. Robust system design to overcome CMOS reliability challenges
Austin et al. Making typical silicon matter with razor
Cabanas-Holmen et al. Predicting the single-event error rate of a radiation hardened by design microprocessor
Mitra et al. The resilience wall: Cross-layer solution strategies
Cho et al. System-level effects of soft errors in uncore components
Ottavi et al. Dependable multicore architectures at nanoscale: The view from europe
Di Mascio et al. Open-source IP cores for space: A processor-level perspective on soft errors in the RISC-V era
Reddi et al. Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues
Agiakatsikas et al. Impact of voltage scaling on soft errors susceptibility of multicore server cpus
US8892967B2 (en) Measurement device and measurement method
Tsiokanos et al. Boosting microprocessor efficiency: Circuit-and workload-aware assessment of timing errors
Gupta et al. Cross-layer system resilience at affordable power
Maniatakos et al. Investigating the limits of AVF analysis in the presence of multiple bit errors
Constantinescu Dependability evaluation of a fault-tolerant processor by GSPN modeling
Yuan et al. InTimeFix: A low-cost and scalable technique for in-situ timing error masking in logic circuits
Keller et al. The impact of terrestrial radiation on FPGAs in data centers
Anghel et al. Multi-level fault effects evaluation
Cannon et al. Multiscale system modeling of single-event-induced faults in advanced node processors
Gnawali et al. Developing benchmarks for radiation testing of microcontroller arithmetic units using atpg
Pérez et al. Performance analysis of see mitigation techniques on zynq ultrascale+ hardened processing fabrics
Ebrahimi et al. Cross-layer approaches for soft error modeling and mitigation
Vigli et al. A RISC-V Fault-Tolerant Soft-Processor Based on Full/Partial Heterogeneous Dual-Core Protection