Nothing Special   »   [go: up one dir, main page]

Silveirinha et al., 2014 - Google Patents

A graphical aid for the complex permittivity measurement at microwave and millimeter wavelengths

Silveirinha et al., 2014

View PDF
Document ID
12489305609507986286
Author
Silveirinha M
Fernandes C
Costa J
Publication year
Publication venue
IEEE microwave and wireless components letters

External Links

Snippet

We introduce a novel procedure to retrieve the complex permittivity ϵ'-jϵ''of dielectric materials. It is a variant of the well-known waveguide method, and uses as input the one-port reflection data from a vector network analyzer connected to a short-circuited rectangular …
Continue reading at web.tecnico.ulisboa.pt (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0807Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of aerials; Antenna testing in general
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G01R27/32Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2635Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2688Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the preceding groups
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Similar Documents

Publication Publication Date Title
Shete et al. Design of a coplanar sensor for RF characterization of thin dielectric samples
Hasar Determination of complex permittivity of low-loss samples from position-invariant transmission and shorted-reflection measurements
Houtz et al. An improved two-port transmission line permittivity and permeability determination method with shorted sample
Kim et al. An approximate approach to determining the permittivity and permeability near lambda/2 resonances in transmission/reflection measurements
Foudazi et al. Effect of sample preparation on microwave material characterization by loaded waveguide technique
Yang et al. A noniterative and efficient technique to extract complex permittivity of low-loss dielectric materials at terahertz frequencies
Hasar et al. An accurate complex permittivity method for thin dielectric materials
Hasar Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies
Kato et al. New uncertainty analysis for permittivity measurements using the transmission/reflection method
Silveirinha et al. A graphical aid for the complex permittivity measurement at microwave and millimeter wavelengths
Nguyen et al. Measurement of complex permittivity by rectangular waveguide method with simple specimen preparation
Tiwari et al. Partially filled substrate integrated waveguide-based microwave technique for broadband dielectric characterization
Shimaoka et al. Calibration of mm-wave power meters using a broadband calorimeter in the frequency range from 110 GHz to 170 GHz
Zhang et al. Reliable and accurate characterization of frequency dependent electrical material properites
Aleem et al. Broad-band dielectric properties of Teflon, Bakelite, and air: Simulation and experimental study
Low et al. Estimation of dielectric constant for various standard materials using microstrip ring resonator
Hasar Microwave method for thickness-independent permittivity extraction of low-loss dielectric materials from transmission measurements
Sharma et al. Dielectric Characterization for solids with an Improved NRW procedure and Uncertainty Estimation
Gao et al. Measurement considerations for accurately characterizing the constitutive material parameters
Hasar et al. Permittivity determination of liquid materials using waveguide measurements for industrial applications
Hasar A microwave method for accurate and stable retrieval of constitutive parameters of low-and medium-loss materials
JP2008241468A (en) Electromagnetic characteristics measuring method
Schultz et al. A New Handheld Sensor for Measuring Intrinsic Dielectric Properties at 100 to 1000 MHz
Sharma et al. An improved NRW procedure for dielectric characterization for solids and uncertainty estimation
Hasar et al. Error-corrected reflection and transmission scattering parameters of a two-port device